Spectrometer operation monitoring method and system

Abstract

The invention relates to the technical field of spectrograph monitoring, and provides a spectrograph operation monitoring method and system, and the method comprises the steps: periodically guiding a built-in spectrum-stabilized light source optical signal to enter a light path at a conventional measurement interval, and obtaining background reference spectrum data; extracting a feature monitoring interval corresponding to the specific optical component, and calculating an interval form feature value; comparing the reference value to generate a component state deviation quantization parameter, and combining a fault tree model to diagnose the running state. And through standard sample verification, a differential spectrum error distribution mode can be analyzed to assist in fault judgment. The system comprises an optical guide, an interval analysis engine, a component state mapping library and a diagnosis output and standard sample verification module. According to the monitoring method, measurement does not need to be interrupted, fault components can be accurately positioned, the problems that traditional monitoring is high in cost and low in efficiency are solved, the measurement accuracy of the spectrograph is improved, and the service life of the spectrograph is prolonged.

Description

Technical Field

[0001] This invention relates to the field of spectrometer monitoring technology, specifically to a method and system for monitoring the operation of a spectrometer. Background Technology

[0002] As a precision analytical instrument, the spectrometer is widely used in fields such as chemistry, biology, and environment. Its measurement accuracy depends on the stable operation of its internal optical components, such as gratings, collimating lenses, and circuit systems. With the increase of usage time, optical components are prone to degradation problems such as diffraction efficiency decay and aberration shift, and the circuit system may experience faults such as increased noise. Effective monitoring methods are needed to detect these faults in a timely manner to ensure the reliability of the analytical results.

[0003] Traditional spectrometer monitoring often relies on additional calibration light sources or offline detection by interrupting measurements, which increases hardware costs and system complexity, and also disrupts measurement continuity. Furthermore, it often involves general analysis of the overall spectrum, making it impossible to accurately correlate the status of individual optical components. This makes it difficult to locate faulty components, and maintenance requires comprehensive troubleshooting, which is time-consuming and labor-intensive, making it difficult to adapt to the needs of real-time online monitoring. Summary of the Invention

[0004] To address the shortcomings of existing technologies, this invention provides a method and system for monitoring the operation of a spectrometer, which solves the problems of traditional spectrometer monitoring requiring additional equipment or interrupting measurements, and being unable to accurately locate faulty components.

[0005] To achieve the above objectives, the present invention provides the following technical solution: a method for monitoring the operation of a spectrometer, comprising the following steps:

[0006] S1: During the regular measurement intervals of the spectrometer, the light signal from its built-in stable light source is periodically guided into the optical path to obtain the background reference spectral data for the current period;

[0007] S2: Extract multiple pre-calibrated feature monitoring intervals from the background reference spectral data. Each feature monitoring interval corresponds to a key performance indicator of a specific optical component inside the spectrometer. The key performance indicators include the diffraction efficiency attenuation of the grating, the aberration shift of the collimating lens, or the pixel response non-uniformity change of the detector array.

[0008] S3: Calculate the interval morphological feature value for each feature monitoring interval. The interval morphological feature value includes, but is not limited to, the full width at half maximum (FWHM) of a specific spectral peak within the interval and the intensity ratio of adjacent double peaks. Or the standard deviation σ of the continuous spectrum;

[0009] S4: Compare the interval morphological feature values ​​with the baseline morphological feature values ​​of the corresponding optical components after factory calibration or the last maintenance, and generate the state deviation quantization parameter D for each optical component. kFor the k-th optical component, its state deviates from the quantization parameter D. k The calculation formula is:

[0010]

[0011] Among them, X i,current and X i,base w represents the morphological feature value of the i-th current interval and the baseline interval, respectively. i The preset weighting factor for this feature value, and n is the number of feature values ​​corresponding to this component;

[0012] S5: Quantization parameter D based on the state deviation of each optical component k Combined with a pre-set fault tree model, it diagnoses and outputs the overall operating status level of the spectrometer and the identification of specific potentially degraded components.

[0013] Preferably, the calibration method for the feature monitoring interval in step S2 includes: applying a known, minute physical perturbation ΔP under the initial healthy state of the spectrometer. j For a single target optical component j, a background reference spectrum is simultaneously acquired, and one or more continuous bands in the spectral data that are most sensitive to disturbances to the target optical component are identified and calibrated as the characteristic monitoring range of the component; the quantification index S of the sensitivity is... j (λ) is calculated using the following formula:

[0014]

[0015] Where ΔI(λ) is the applied perturbation ΔP j The change in light intensity at wavelength λ before and after, where I0(λ) is the initial light intensity, and P is the change in light intensity at wavelength λ before and after. j,0 Let S be the initial reference physical parameters for component j; select S j The continuous bands whose (λ) values ​​exceed the preset threshold are used as the characteristic monitoring range of this component.

[0016] Preferably, the method further includes a standard sample verification step: after a preset period or upon receiving an abnormal status warning, the automatic sample stage is driven to load a solid standard sample with stable physicochemical properties, and a measurement is performed; the measured standard sample spectrum S is then displayed. meas (λ) and the original standard spectrum S of the standard sample stored in the system std Perform full-spectrum difference operations on (λ) to obtain the difference spectrum ΔS(λ)=S meas (λ)-S std (λ); Analyze the error distribution pattern in the differential spectrum. If the error exhibits a systematic drift with wavelength, it is determined that the optical path is misaligned; if the error exhibits irregular spike noise, it is determined that the detector or circuit system is faulty.

[0017] Preferably, the analysis error distribution mode specifically involves: performing a Fourier transform on the difference spectrum ΔS(λ) and analyzing its frequency domain component F(ω); if ω < ω c Low-frequency component energy Exceeding the threshold corresponds to optical path misalignment or slow degradation of optical components; if ω>ω c High-frequency component energy Exceeding the threshold corresponds to increased random noise or poor circuit contact; where ω c This is the preset frequency boundary point.

[0018] Preferably, a spectrometer operation monitoring system includes:

[0019] An optical guidance module, integrated inside the spectrometer, is used to selectively couple the light from the built-in stable light source to the main measurement optical path under the control of monitoring commands.

[0020] The interval analysis engine is used to perform the acquisition of the background reference spectral data, the extraction of feature monitoring intervals, and the calculation of interval morphological feature values;

[0021] The component state mapping library stores each optical component along with its feature monitoring range, baseline morphological feature value, and corresponding weighting factor w. i The mapping relationship, and the fault tree model;

[0022] The diagnostic output module is used to generate a status report based on the output of the interval analysis engine and the component status mapping library.

[0023] Preferably, the optical guidance module includes a miniature rotating mirror driven by a stepper motor, the miniature rotating mirror having two stable positions: a first position that allows the light signal from the sample to enter the optical path; and a second position that allows the light signal from the built-in stable light source to be reflected into the optical path.

[0024] Preferably, it also includes a standard sample verification module, the module comprising:

[0025] A solid standard sample placed inside a sealed chamber;

[0026] An automated sample stage controlled by the system is used to move the solid standard sample to the measurement spot position when needed;

[0027] A verification analysis unit is used to perform the comparison, difference operation and error distribution pattern analysis of the standard sample spectrum.

[0028] Preferably, the fault tree model stored in the component state mapping library defines the state deviation quantization parameter D for different optical components. kThe logical combination relationship between them, and the corresponding rules with the final overall operating state level L; the overall operating state level L is determined by the decision function f(D1,D2,...,D...). m ) is determined, where m is the total number of optical components monitored.

[0029] This invention provides a method and system for monitoring the operation of a spectrometer. It has the following beneficial effects:

[0030] 1. This invention utilizes the built-in stable light source of the spectrometer to periodically acquire background reference spectral data at regular measurement intervals. This eliminates the need for additional equipment and measurement interruptions, simplifying the system structure, controlling hardware costs, ensuring measurement continuity, and enabling real-time online monitoring. This significantly improves the practicality and adaptability of the technical solution to various scenarios.

[0031] 2. This invention extracts pre-calibrated feature monitoring intervals from background reference spectral data, so that each interval accurately corresponds to the key performance indicators of specific optical components. It can independently monitor the status of each component and accurately trace the source of degraded components, avoiding blind troubleshooting, significantly reducing maintenance and time costs, and improving fault diagnosis efficiency. Attached Figure Description

[0032] Figure 1 This is a perspective view of the present invention;

[0033] Figure 2 This is a schematic diagram of the present invention. Detailed Implementation

[0034] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0035] Example:

[0036] Please see the appendix Figure 1-2 This invention provides a method and system for monitoring the operation of a spectrometer. Using a commonly used laboratory ultraviolet-visible spectrophotometer, model UV-1000, with a measurement wavelength range of 190-1100 nm, as the application, the method for monitoring the operation of the spectrometer comprises the following steps:

[0037] Execute step S1 to obtain background reference spectral data for the current period: Set the normal measurement interval of the spectrometer to 1 hour, that is, after each sample measurement is completed, the next sample measurement is performed after an interval of 1 hour; during the interval between two adjacent normal sample measurements, the system will periodically guide the light signal of the built-in stable light source of the spectrometer into the main measurement optical path. The built-in stable light source uses a deuterium lamp-tungsten lamp combination light source, where the deuterium lamp covers the 190-400nm ultraviolet band and the tungsten lamp covers the 400-1100nm visible-near infrared band. The miniature rotating mirror in the optical guidance module is driven by a stepper motor with a step angle of 0.001°. The miniature rotating mirror is made of aluminum-coated material and has a size of 5mm×5mm. It has two stable positions: the first position is the measurement position, where the angle between the mirror and the main optical path is 45°, allowing the light signal from the sample in the sample chamber to smoothly enter the main measurement optical path; the second position is the monitoring position, where the angle between the mirror and the main optical path is adjusted to 30°, reflecting the light signal emitted by the built-in stable light source into the main measurement optical path. The system is set to switch the miniature rotating mirror from the first position to the second position 0.5 seconds after each routine sample measurement. At the same time, the built-in stabilized light source is turned on and maintains a stable output. Then, the detector array is started to collect light signals. The collection integration time is set to 100ms. Three light signal data are collected continuously. The arithmetic mean of the three collected data is calculated to obtain the background reference spectrum data for the current period. 0.3 seconds after the collection is completed, the miniature rotating mirror switches back to the first position, the built-in stabilized light source is turned off, and it waits for the next routine measurement or monitoring period.

[0038] Step S2 is executed to extract multiple pre-calibrated feature monitoring intervals. Each feature monitoring interval corresponds to a key performance indicator of a specific optical component within the spectrometer. These key performance indicators include the diffraction efficiency attenuation of the grating, the aberration shift of the collimating lens, and the pixel response non-uniformity variation of the detector array. The calibration method for the feature monitoring intervals is as follows: Under the initial healthy state of the spectrometer before it leaves the factory, a known, minute physical perturbation ΔP is applied to a single target optical component. j Simultaneously acquire background reference spectra, identify one or more continuous bands in the spectral data that are most sensitive to disturbances to the target optical component, and define them as the characteristic monitoring range of the component. The specific process is as follows: For the target optical component, the grating model is 1200 lines / mm, the material is fused silica, and the initial reference physical parameter P... j,0 A small physical perturbation ΔP is applied to the grating with a diffraction angle θ0 = 23°. jThe offset of the grating diffraction angle is Δθ = 0.01°, meaning the grating drive mechanism is controlled to adjust the grating angle from 23° to 23.01°. Simultaneously, the built-in stable light source and detector array are activated to acquire the background reference spectrum under this perturbation state. This spectrum is compared with the initial background reference spectrum without perturbation, with the light intensity denoted as I0(λ). The change in light intensity at different wavelengths λ is calculated as ΔI(λ), which is the light intensity after perturbation minus the initial light intensity. The sensitivity quantification index S of the grating at wavelength λ is then calculated using the formula. j (λ), the formula is:

[0039]

[0040] ΔP j =Δθ=0.01°, P j,0 Substituting θ0 = 23° into the equation, we get... Setting the sensitivity threshold to 0.8, the calculated S... j (λ) Wavelength scanning analysis revealed that within the wavelength range of 265-285nm, all wavelengths corresponded to S j (λ) is greater than 0.8 in all wavelengths, indicating that this band is most sensitive to angular perturbations of the grating. Therefore, 265-285nm is designated as the characteristic monitoring range for the grating, corresponding to monitoring the key performance indicator of grating diffraction efficiency attenuation. For the collimating lens of the target optical component, made of quartz, the initial reference physical parameter P... j,0 A small physical perturbation ΔP is applied to the collimating lens with a coaxial distance d0 = 15 mm between its central axis and the principal optical path. j The coaxial distance offset of the collimator is Δd = 0.02 mm, meaning the collimator adjustment mechanism is controlled to adjust the coaxial distance of the collimator from 15 mm to 15.02 mm. Similarly, the background reference spectrum before and after the disturbance is collected, and ΔI(λ) and I0(λ) are calculated. Through the above S... j (λ) Formula (at this time ΔP) j =Δd=0.02mm, P j,0 Sensitivity was calculated using the formula (d0 = 15mm). After setting a threshold of 0.8, an S-wave intensity was found in the 420-435nm band. j (λ) all exceed the threshold, so this band is designated as the characteristic monitoring range of the collimator, corresponding to the monitoring of the collimator's aberration shift, a key performance indicator. For the target optical component detector array, the model is a CCD detector with 2048 pixels, and the initial reference physical parameter P... j,0 A small physical disturbance ΔP is applied to the detector's operating voltage V0 = 5V. j The detector's operating voltage offset ΔV = 0.05V is set, meaning the detector power supply module is controlled to adjust the operating voltage from 5V to 5.05V; background reference spectra before and after the disturbance are acquired, and ΔI(λ) and I0(λ) are calculated. This is then processed via S...j (λ) formula (ΔP) j =ΔV=0.05V, P j,0 Sensitivity was calculated using the formula (V0 = 5V). After setting a threshold of 0.8, an St value was found in the 565-580nm band. j If (λ) exceeds the threshold, this band is designated as the characteristic monitoring range of the detector array, corresponding to the key performance indicator of monitoring the non-uniformity of pixel response of the detector array.

[0041] After extracting the feature monitoring intervals, step S3 is executed to calculate the interval morphological feature value for each feature monitoring interval. The interval morphological feature value includes the full width at half maximum (F) of a specific spectral peak within the interval, the intensity ratio of adjacent double peaks (R), and the standard deviation σ of the continuous spectral band. For the grating's feature monitoring interval of 265-285nm, this band contains the characteristic emission peak of the built-in deuterium lamp (center wavelength λ = 275nm). Peak shape analysis is performed on this characteristic peak: first, the peak apex intensity I is determined. peak =12000 (grayscale value), then scan from the peak to both sides of the wavelength direction to find the light intensity I. peak The two wavelength points at / 2 (i.e., 6000) are λ left =274.8nm and λ right =275.2nm, obtained through the formula F=λ right -λ left The full width at half maximum (FWHM) of the characteristic peak was calculated to be F = 275.2 nm - 274.8 nm = 0.4 nm. This F value was used as the morphological characteristic value of the grating feature monitoring range. For the collimating lens's feature monitoring range of 420-435 nm, this band contains two adjacent characteristic emission peaks of the built-in tungsten lamp, corresponding to wavelengths λ1 = 425 nm and λ2 = 430 nm, respectively. The light intensities of the two peaks were collected by the detector array. (grayscale value) and (Grayscale value), obtained through the formula The intensity ratio of adjacent double peaks was calculated to be R = 8500 / 9200 ≈ 0.924. This R value was used as the morphological characteristic value of the collimating lens's feature monitoring interval. For the feature monitoring interval of the detector array, 565-580nm, this band is a continuous spectrum (without obvious sharp characteristic peaks). The light intensity data corresponding to all pixels in this interval were collected, totaling 150 pixels. The light intensity values ​​were recorded as I1, I2, ..., I... 150 The standard deviation σ of the continuous spectrum is calculated using the standard deviation formula, which is:

[0042]

[0043] in The arithmetic mean of 150 light intensity values ​​(calculated) N = 150 is the number of pixels. Substituting this into the calculation, we get σ ≈ 32. This σ value is used as the interval morphological feature value of the detector array feature monitoring interval.

[0044] Then, step S4 is performed to generate the state deviation quantization parameter D for each optical component. k First, retrieve the reference morphological characteristic values ​​of each optical component at the time of factory calibration from the component state mapping library: the reference half-height and full width at half-maximum F of the grating. base =0.38nm, the reference intensity ratio R of adjacent double peaks of the collimating lens base =0.950, the standard deviation σ of the reference continuous spectrum of the detector array base =28; Simultaneously retrieve the preset weighting factor w corresponding to each morphological feature value. i Since each optical component in this embodiment corresponds to only one interval morphological feature value, the weighting factor w for each component is... i =1 (satisfies) The condition is that n=1 represents the number of eigenvalues ​​corresponding to the component. For the k-th optical component (where k=1 represents the grating, k=2 represents the collimating lens, and k=3 represents the detector array), its state deviation quantization parameter D is calculated using the formula. k The formula is:

[0045]

[0046] For the grating (k=1), X i,current =F=0.4nm, X i,base =F base =0.38nm, n=1, i=1, substituting into the formula, we get:

[0047]

[0048] For a collimating lens (k=2), X i,current =R≈0.924, X i,base =R base =0.950, n=1, w i =1, substituting into the formula, we get:

[0049]

[0050] For the detector array (k=3), X i,current =σ≈32,X i,base =σ base =28, n=1, w i =1, substituting into the formula, we get:

[0051]

[0052] Finally, step S5 is executed to diagnose and output the overall operating status level of the spectrometer and the identification of specific potential degraded components. The preset fault tree model is retrieved from the component status mapping library, and this fault tree model defines the logical combination relationship between the state deviation quantization parameters D of different optical components and the corresponding rules for the final overall operating status level L: when D1 > 0.1 or D2 > 0.05 or D3 > 0.2, the overall operating status level L = 2 (judged as an abnormal state, immediate shutdown for maintenance is required); when D1 ≤ 0.1 and D2 ≤ 0.05 and D3 ≤ 0.1, the overall operating status level L = 0 (judged as a normal state, normal use can continue); when neither of the above two conditions is met, the overall operating status level L = 1 (judged as a warning state, component inspection is required within 72 hours). Substitute the calculated D1 ≈ 0.0526, D2 ≈ 0.0274, and D3 ≈ 0.1429 into the logical judgment of the fault tree model. Since D1 ≤ 0.1, D2 ≤ 0.05, and 0.1 < D3 ≤ 0.2, the conditions for L = 0 and L = 2 are not met. Therefore, it is determined that the overall operating status level of the spectrometer L = 1 (warning state); further compare the differences between each D k and the corresponding thresholds, and it is found that only D3 (0.1429) of the detector array exceeds the upper limit of the normal range (0.1). Therefore, the detector array is identified as a potential degraded component.

[0053] The spectrometer operation monitoring method in this embodiment further includes a standard sample verification step, which is executed at a preset period (set to 24 hours in this embodiment) or after receiving a status abnormal warning, such as when the overall operating status level L = 1. The specific process of the standard sample verification step is as follows: The system first controls the automatic sample stage in the standard sample verification module to move. This automatic sample stage is driven by a stepper motor with a moving accuracy of 0.01 mm and a travel of 50 mm, and can move the solid standard sample placed in the sealed chamber to the measurement spot position (the measurement spot diameter is 2 mm); the solid standard sample is a holmium glass standard sheet, which has stable physical and chemical properties and has known characteristic absorption peaks at wavelengths of 536 nm, 585 nm, and 640 nm. This standard sheet is stored in the sealed chamber, and the sealed chamber is filled with an inert gas (nitrogen) and内置干燥剂 (internally placed desiccant), so that the humidity in the chamber is maintained at < 30%, to prevent the standard sample from being affected by moisture or contamination; after the automatic sample stage moves the holmium glass standard sheet in place, the system controls the spectrometer to perform standard sample measurement, sets the measurement integration time to 150 ms, continuously acquires 5 sets of spectral data, and takes the arithmetic mean to obtain the measured spectrum S meas (λ).

[0054] Subsequently, the original standard spectrum S of the holmium glass standard sheet is retrieved from the system storage unit std ​​(λ), the original standard spectrum was obtained by calibrating the spectrometer at the factory using the same holmium glass standard slide in a standard laboratory environment (temperature 25℃±1℃, humidity 50%±5%) to ensure accuracy. The difference spectrum ΔS(λ) was obtained through full-spectrum difference calculation, and the difference calculation formula is as follows:

[0055] ΔS(λ)=S meas (λ)-S std (λ),

[0056] Error distribution pattern analysis is performed on the obtained ΔS(λ). Specifically, a Fourier transform is performed on ΔS(λ) to convert the time-domain spectral error signal into a frequency-domain component F(ω) (where ω is the angular frequency in rad / nm), and a preset frequency boundary point ω is set. c =0.02rad / nm, calculate ω<ω c Low-frequency component energy E low and high-frequency component energy E high The energy calculation is achieved through an integral formula:

[0057]

[0058] Where ω max In this embodiment, ω represents the maximum angular frequency after Fourier transform. max =0.1 rad / nm. Simultaneously set E low The threshold for judgment is 500, E high The threshold for judgment is 300: if E low Exceeding the threshold corresponds to optical path misalignment or slow degradation of optical components; if E high Exceeding the threshold corresponds to increased random noise or poor circuit contact. In the 24-hour cycle verification of this embodiment, E was calculated. low =280, E high =150, all below the corresponding judgment threshold, therefore the optical path of the spectrometer is inaccurate, and the detector and circuit system are fault-free; if E is calculated in a certain verification... low =620, exceeding the threshold of 500, indicates an optical path misalignment, requiring inspection of the collimating lens or grating for positional shifts; if E is calculated... high =350, exceeding the threshold of 300, indicates increased random noise in the detector or poor contact in the circuit, requiring inspection of the detector's power supply module or signal transmission line.

[0059] The spectrometer operation monitoring system in this embodiment includes an optical guidance module, an interval analysis engine, a component status mapping library, a diagnostic output module, and a standard sample verification module. The specific structure and function of each module are as follows: The optical guidance module is integrated inside the spectrometer and is electrically connected to the main control unit of the spectrometer. It receives monitoring commands sent by the main control unit and realizes selective coupling of the light signal from the built-in stable spectrum light source. In addition to the built-in stable spectrum light source (deuterium lamp-tungsten lamp combination) and the miniature rotating mirror mentioned above, this module also includes a light source driving circuit and a mirror control circuit. The light source driving circuit can stably output the light source operating current, with a deuterium lamp current of 150mA and a tungsten lamp current of 200mA, to ensure stable light intensity. The mirror control circuit receives timing commands from the main control unit and precisely controls the rotation angle of the stepper motor, enabling the miniature rotating mirror to accurately switch between two stable positions with a switching response time of <0.1 seconds.

[0060] The interval analysis engine uses an embedded processor, specifically an ARM Cortex-A9 with a main frequency of 1GHz, and is equipped with a dedicated spectral data processing chip. This engine is connected to the detector array of the spectrometer via a data bus, and can receive background reference spectral data collected by the detector in real time. It also has built-in feature interval extraction algorithms and morphological feature value calculation algorithms, which can automatically identify and extract pre-calibrated feature monitoring intervals. Furthermore, it can automatically complete the calculation of the full width at half maximum (F), the ratio of adjacent double peak intensity (R), and the standard deviation of the continuous spectral band (σ) according to the set calculation rules. The calculation accuracy reaches 0.001nm (for F), 0.001 (for R), and 1 (for σ), which meets the monitoring accuracy requirements.

[0061] The component status mapping library uses an EEPROM storage chip with a storage capacity of 16MB. This storage chip communicates with the interval analysis engine via an I2C bus, enabling fast data reading and writing. In addition to storing the mapping relationship between each optical component (grating, collimating lens, detector array) and its characteristic monitoring interval, reference morphological characteristic value, and weighting factor, the library also stores the aforementioned pre-set fault tree model, including a logical combination relationship table and a status level correspondence table. Furthermore, it supports updating the stored reference data via an external computer. For example, after the spectrometer is maintained, the reference morphological characteristic value can be recalibrated and written back to the mapping library.

[0062] The diagnostic output module includes a visual status dashboard, a maintenance suggestion list generation unit, and an instant alarm unit: the visual status dashboard is a 5-inch LCD display built into the spectrometer, with a resolution of 800×480, which can display the status deviation quantization parameter D of each optical component in real time. k(Displayed in numerical and bar chart form), overall operating status level L, distinguished by color: green represents L=0, yellow represents L=1, red represents L=2, and real-time spectral graph of characteristic monitoring range, allowing operators to intuitively understand the equipment status; the maintenance suggestion list generation unit has a built-in maintenance knowledge base, which automatically generates corresponding maintenance suggestions based on the diagnosed status level and potentially degraded components. For example, when L=1 and the detector array is identified as a potentially degraded component, the suggestion is generated to "check the operating voltage and cooling system of the detector array within 72 hours and clean the dust on the detector surface," and displayed on the LCD screen; the instant alarm unit includes an audible and visual alarm and a communication interface. When a critical component (such as a grating or collimator) is diagnosed to be rapidly degraded (e.g., D1>0.15 or D2>0.08), the audible and visual alarm emits a flashing red light and a buzzer, and simultaneously sends an instant alarm signal to a remote monitoring center, such as a laboratory management computer, via the RS485 communication interface. The alarm signal includes the equipment number, faulty component identifier, D... k Numerical data and other information facilitate remote monitoring and timely processing by management personnel.

[0063] In addition to the aforementioned sealed chamber, solid standard samples such as holmium glass standard slides, and automated sample stage, the standard sample verification module also includes a verification analysis unit. This unit is integrated with the interval analysis engine and incorporates Fourier transform and error energy calculation algorithms, enabling it to automatically perform calculations of ΔS(λ), Fourier transform, and E. low E high The system performs calculations and outputs error judgment conclusions based on the calculation results. At the same time, the verification results are stored in the system log for easy traceability later.

[0064] The spectrometer in this embodiment integrates the aforementioned spectrometer operation monitoring system. In addition to having conventional sample measurement functions, the system enables real-time monitoring of its own operating status, fault diagnosis, and periodic verification, effectively avoiding measurement errors caused by the degradation of optical components and improving the measurement accuracy and service life of the spectrometer. The spectrometer also supports connection to an external computer via a USB or Ethernet interface to export, store, and remotely control monitoring data, meeting the needs of laboratory automation management.

[0065] Although embodiments of the invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the invention, the scope of which is defined by the appended claims and their equivalents.

Claims

1. A method for monitoring the operation of a spectrometer, characterized in that, Includes the following steps: S1: During the regular measurement intervals of the spectrometer, the light signal from its built-in stable light source is periodically guided into the optical path to obtain the background reference spectral data for the current period; S2: Extract multiple pre-calibrated feature monitoring intervals from the background reference spectral data. Each feature monitoring interval corresponds to a key performance indicator of a specific optical component inside the spectrometer. The key performance indicators include the diffraction efficiency attenuation of the grating, the aberration shift of the collimating lens, or the pixel response non-uniformity change of the detector array. S3: Calculate the interval morphological feature value for each feature monitoring interval. The interval morphological feature value includes, but is not limited to, the full width at half maximum (FWHM) of a specific spectral peak within the interval and the intensity ratio of adjacent double peaks. Or the standard deviation σ of the continuous spectrum; S4: Compare the interval morphological feature values ​​with the baseline morphological feature values ​​of the corresponding optical components after factory calibration or the last maintenance, and generate the state deviation quantization parameter D for each optical component. k For the k-th optical component, its state deviates from the quantization parameter D. k The calculation formula is: Among them, X i,current and X i,base w represents the morphological feature value of the i-th current interval and the baseline interval, respectively. i The preset weighting factor for this feature value, and n is the number of feature values ​​corresponding to this component; S5: Quantization parameter D based on the state deviation of each optical component k Combined with a pre-set fault tree model, it diagnoses and outputs the overall operating status level of the spectrometer and the identification of specific potentially degraded components.

2. The spectrometer operation monitoring method according to claim 1, characterized in that, The calibration method for the feature monitoring interval in step S2 includes: under the initial healthy state of the spectrometer, applying a known, minute physical perturbation ΔP. j For a single target optical component j, a background reference spectrum is simultaneously acquired, and one or more continuous bands in the spectral data that are most sensitive to disturbances to the target optical component are identified and calibrated as the characteristic monitoring range of the component; the quantification index S of the sensitivity is... j (λ) is calculated using the following formula: Where ΔI(λ) is the applied perturbation ΔP j The change in light intensity at wavelength λ before and after, where I0(λ) is the initial light intensity, and P is the change in light intensity at wavelength λ before and after. j,0 Let S be the initial reference physical parameters for component j; select S j The continuous bands whose (λ) values ​​exceed the preset threshold are used as the characteristic monitoring range of this component.

3. The spectrometer operation monitoring method according to claim 1, characterized in that, It also includes a standard sample verification step: after a preset period or upon receiving an abnormal status warning, the automatic sample stage is driven to load a physicochemically stable solid standard sample and perform a measurement; the measured standard sample spectrum S... meas (λ) and the original standard spectrum S of the standard sample stored in the system std Perform full-spectrum difference operations on (λ) to obtain the difference spectrum ΔS(λ)=S meas (λ)-S std (λ); Analyze the error distribution pattern in the differential spectrum. If the error exhibits a systematic drift with wavelength, it is determined that there is misalignment in the optical path. If the error exhibits irregular spike noise, it indicates a fault in the detector or circuit system.

4. The spectrometer operation monitoring method according to claim 3, characterized in that, The specific error distribution pattern is as follows: Fourier transform the differential spectrum ΔS(λ) and analyze its frequency domain component F(ω); if ω < ω c Low-frequency component energy Exceeding the threshold corresponds to optical path misalignment or slow degradation of optical components; if ω>ω c High-frequency component energy Exceeding the threshold corresponds to increased random noise or poor circuit contact; where ω c This is the preset frequency boundary point.

5. A spectrometer operation monitoring system, using the spectrometer operation monitoring method as described in claims 1-4, characterized in that, include: An optical guidance module, integrated inside the spectrometer, is used to selectively couple the light from the built-in stable light source to the main measurement optical path under the control of monitoring commands. The interval analysis engine is used to perform the acquisition of the background reference spectral data, the extraction of feature monitoring intervals, and the calculation of interval morphological feature values; The component state mapping library stores each optical component along with its feature monitoring range, baseline morphological feature value, and corresponding weighting factor w. i The mapping relationship, and the fault tree model; The diagnostic output module is used to generate a status report based on the output of the interval analysis engine and the component status mapping library.

6. The spectrometer operation monitoring system according to claim 5, characterized in that, The optical guidance module includes a miniature rotating mirror driven by a stepper motor. The miniature rotating mirror has two stable positions: a first position that allows light signals from the sample to enter the optical path; and a second position that allows light signals from the built-in stable light source to be reflected into the optical path.

7. The spectrometer operation monitoring system according to claim 5, characterized in that, It also includes a standard sample validation module, which includes: A solid standard sample placed inside a sealed chamber; An automated sample stage controlled by the system is used to move the solid standard sample to the measurement spot position when needed; A verification analysis unit is used to perform the comparison, difference operation and error distribution pattern analysis of the standard sample spectrum.

8. The spectrometer operation monitoring system according to claim 5, characterized in that, The fault tree model stored in the component state mapping library defines the state deviation quantization parameter D for different optical components. k The logical combination relationship between them, and the corresponding rules with the final overall operating state level L; the overall operating state level L is determined by the decision function f(D1,D2,...,D...). m ) is determined, where m is the total number of optical components monitored.

9. A spectrometer operation monitoring system according to claim 5, characterized in that, The output of the diagnostic output module includes: a visual status dashboard, a maintenance suggestion list, and an immediate alarm signal sent to the monitoring center when a critical component is diagnosed to be rapidly deteriorating.

10. A spectrometer, characterized in that, It integrates a spectrometer operation status monitoring system as described in any one of claims 5 to 9.

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