Control method and device for double-probe measurement of double-spindle machine tool and electronic equipment

Abstract

The invention provides a control method and device for double-probe measurement of a double-spindle machine tool and electronic equipment. The method comprises the steps that initial coordinate information of a first probe and initial coordinate information of a second probe are obtained; the first probe and the second probe are controlled to move in the preset machining coordinate system, so that the coordinate information of the first probe is first coordinate information, the coordinate information of the second probe is second coordinate information, and the clamp is controlled to move to the first position in the preset machining coordinate system in the third direction; the first probe is controlled to move by a first preset distance in the direction opposite to the second direction with the first coordinate information as the starting point, and meanwhile the second probe is controlled to move by the first preset distance in the direction opposite to the second direction with the second coordinate information as the starting point; in the moving process, whether the first probe and the second probe make contact with the preset workpiece or not is judged, under the condition that it is determined that the first probe and the second probe make contact with the preset workpiece, measurement execution is completed, and the problem that in the prior art, a double-spindle machine tool is difficult to efficiently measure the workpiece is solved.

Description

Technical Field

[0001] This application relates to the field of automated measurement technology for machine tools, and more specifically, to a control method for dual-probe measurement of a dual-spindle machine tool, a control device for dual-probe measurement of a dual-spindle machine tool, a computer-readable storage medium, and an electronic device. Background Technology

[0002] With the continuous advancement of manufacturing technology, twin-spindle machine tools have gained widespread popularity due to their ability to significantly improve machining efficiency. However, these machine tools face new challenges when processing workpieces with long travel distances. Specifically, when a twin-spindle machine tool is equipped with a single Y-axis, travel interference may occur between the two spindles in their XZ-axis movement paths, making it impossible to safely perform continuous, collision-free inspection using dual probes on the same workpiece. Furthermore, even if two probes can be arranged to perform measurements separately, the independent offset jump function of the dual probes cannot be fully utilized due to the lack of an effective synchronization control mechanism. This not only affects inspection efficiency but may also reduce inspection accuracy. Summary of the Invention

[0003] The main objective of this application is to provide a control method, a control device, a computer-readable storage medium, and an electronic device for dual-spindle machine tool measurement using dual probes, in order to at least solve the problem that dual-spindle machine tools in the prior art are difficult to measure workpieces efficiently.

[0004] To achieve the above objectives, according to one aspect of this application, a control method for dual-probe measurement in a dual-spindle machine tool is provided. The dual-spindle machine tool includes a first channel, a second channel, a first probe, a second probe, and a fixture. A preset workpiece is clamped in the fixture. The first probe is located in the first channel, and the second probe is located in the second channel. The control method includes: acquiring initial coordinate information of the first probe and the second probe, the initial coordinate information including, in a preset machining coordinate system, the abscissa of the first probe and the ordinate of the second probe in a first direction and the ordinate of the second probe in a second direction, the preset machining coordinate system having a first preset relationship with the preset workpiece; controlling the first probe and the second probe to move within the preset machining coordinate system, so that the coordinate information of the first probe is the first coordinate information, and the coordinate information of the second probe is... The second coordinate information is the same as the first coordinate information in the second direction. The control fixture moves to the first position in the third direction in the preset machining coordinate system. The first coordinate information and the second coordinate information have a second preset relationship with the preset workpiece. The third direction is perpendicular to the first direction and the second direction, respectively. The control fixture moves the first probe from the first coordinate information to the opposite direction of the second direction by a first preset distance. At the same time, the control fixture moves the second probe from the second coordinate information to the opposite direction of the second direction by a first preset distance. During the movement of the first probe and the second probe in the opposite direction of the second direction, it is determined whether the first probe and the second probe are in contact with the preset workpiece. If it is determined that they are in contact with the preset workpiece, the measurement is completed.

[0005] Optionally, obtaining the initial coordinate information of the first probe and the second probe includes: obtaining the tool number in the first channel and the tool number in the second channel, and determining whether the tool in the first channel is the first probe and whether the tool in the second channel is the second probe based on the tool number in the first channel, the tool number in the second channel and the preset probe number; and obtaining the initial coordinate information of the first probe and the second probe if it is determined that the tool in the first channel is the first probe and the tool in the second channel is the second probe.

[0006] Optionally, the control method further includes: acquiring a first variable in the first channel, determining whether the first variable meets a preset threshold, and if the preset threshold is met, determining that the preset machining coordinate system corresponding to the preset workpiece has been activated.

[0007] Optionally, controlling the first probe and the second probe to move in a preset machining coordinate system, so that the coordinate information of the first probe is the first coordinate information and the coordinate information of the second probe is the second coordinate information, includes: controlling the first probe and the second probe to move along a second direction, and if the first probe and the second probe do not collide during the movement, determining the ordinate of the first probe and the second probe as the standard ordinate, the standard ordinate being the maximum value of the preset machining coordinate system in the second direction; controlling the first probe to move to a first preset position in the preset machining coordinate system, and controlling the second probe to move to a second preset position in the preset machining coordinate system; controlling the first probe and the second probe to move simultaneously in the opposite direction of the second direction by a target preset distance, so that the first probe and the second probe are located at a theoretical preset distance from the preset workpiece, thereby obtaining the first coordinate information of the first probe and the second coordinate information of the second probe.

[0008] Optionally, controlling the first probe to move to a first preset position in a preset machining coordinate system and controlling the second probe to move to a second preset position in the preset machining coordinate system includes: controlling the first probe to move a first preset distance in a first direction, determining the abscissa of the first probe as the first abscissa, and controlling the second probe to move a second preset distance in a first opposite direction, determining the abscissa of the second probe as the second abscissa, wherein the first opposite direction is opposite to the first direction, the first abscissa is the abscissa of the first preset position, and the second abscissa is the abscissa of the second preset position; controlling the fixture to move a third preset distance in a third direction, determining the coordinate of the fixture in the third direction as the third preset coordinate; and controlling the first probe and the second probe to move simultaneously in a second direction a fourth preset distance, determining the ordinate of the first probe and the second probe as the fourth preset ordinate, wherein the fourth preset ordinate is the ordinate of the first preset position and the first preset position.

[0009] Optionally, the control method further includes: during the process of controlling the first probe to move a first preset distance in the opposite direction to the second direction from the first coordinate information, and simultaneously controlling the second probe to move a first preset distance in the opposite direction to the second direction from the second coordinate information, when the first probe and the second probe come into contact with the workpiece on the dual-spindle machine tool, acquiring the first target coordinate information of the first probe and the second target coordinate information of the second probe; determining at least one first offset of the first target coordinate information relative to the standard coordinate information and at least one second offset of the second target coordinate information relative to the standard coordinate information based on the first target coordinate information, the second target coordinate information, and the standard coordinate information; and outputting an alarm signal when the first offset and the second offset exceed the standard range, wherein the alarm signal is used to characterize the preset workpiece as unqualified and / or to characterize the preset workpiece as misplaced.

[0010] Optionally, the control method further includes: determining whether a collision occurs between the first probe and the second probe when a first preset condition is met; and issuing a warning when a collision occurs between the first probe and the second probe. The first preset condition includes at least one of the following: the first probe moves and / or the second probe moves.

[0011] According to another aspect of this application, a control device for dual-probe measurement of a dual-spindle machine tool is provided. The dual-spindle machine tool includes a first channel, a second channel, a first probe, a second probe, and a fixture. A preset workpiece is clamped in the fixture. The first probe is located in the first channel, and the second probe is located in the second channel. The device includes: a first acquisition module for acquiring initial coordinate information of the first probe and the second probe, the initial coordinate information including, in a preset machining coordinate system, the abscissa of the first probe and the ordinate of the second probe in a first direction and the ordinate of the second probe in a second direction, the preset machining coordinate system having a first preset relationship with the preset workpiece; and a first control module for controlling the movement of the first probe and the second probe in the preset machining coordinate system, so that the coordinate information of the first probe is the first coordinate information, and the coordinate information of the second probe is the second coordinate information. The first and second coordinate information have the same vertical coordinate in the second direction. The control fixture moves to the first position along the third direction. The first and second coordinate information have a second preset relationship with the preset workpiece. The third direction is perpendicular to the first and second directions, respectively. The second control module is used to control the first probe to move a first preset distance in the opposite direction to the second direction, starting from the first coordinate information. At the same time, it controls the second probe to move a first preset distance in the opposite direction to the second direction, starting from the second coordinate information. The first judgment module is used to determine whether the first and second probes are in contact with the workpiece on the dual-spindle machine tool during the process of controlling the first and second probes to move in the opposite direction to the second direction. If they are in contact with the workpiece on the dual-spindle machine tool, the measurement is completed.

[0012] According to another aspect of this application, a computer-readable storage medium is provided, the computer-readable storage medium including a stored program, wherein, when the program is executed, a control method for dual-probe measurement of a dual-spindle machine tool is controlled to be performed by the device where the computer-readable storage medium is located.

[0013] According to another aspect of this application, an electronic device is provided, comprising: one or more processors, a memory, and one or more programs, wherein the one or more programs are stored in the memory and configured to be executed by the one or more processors, and the one or more programs include a control method for performing dual-probe measurements of a dual-spindle machine tool.

[0014] Applying the technical solution of this application, the initial coordinate information of the first probe and the second probe is first obtained. The first probe and the second probe are then controlled to move within a preset machining coordinate system, so that the coordinate information of the first probe is the first coordinate information, and the coordinate information of the second probe is the second coordinate information. The first coordinate information and the second coordinate information have the same vertical coordinate in the second direction. The fixture is then controlled to move along the third direction to the first position. The aforementioned first coordinate information, second coordinate information, and first position correspond to the type of preset workpiece clamped in the fixture. Moving the two probes to the preset measurement position while ensuring safety allows for better subsequent measurement of the preset workpiece. The first probe is controlled to move a first preset distance in the opposite direction to the second direction, starting from the first coordinate information. Simultaneously, the second probe is controlled to move a first preset distance in the opposite direction to the second direction, starting from the second coordinate information. During the movement of the first probe and the second probe in the opposite direction to the second direction, it is determined whether the first probe and the second probe are in contact with the workpiece on the dual-spindle machine tool. If they are in contact with the workpiece on the dual-spindle machine tool, the measurement is completed. In the above steps, the system continuously monitors whether the probe is in contact with the workpiece. Once contact is established, it indicates that the workpiece is properly positioned and its deformation is within a controllable range, completing the measurement and allowing subsequent processing to proceed normally. Employing two probes, each with its own dedicated channel, overcomes the inefficiency of traditional twin-spindle machine tools when inspecting long-stroke workpieces. This improves inspection speed and accuracy, thus resolving the problem of inefficient workpiece measurement in existing twin-spindle machine tools. It also avoids the risks of clamping errors or collisions during subsequent processing caused by inaccurate workpiece placement or significant workpiece deformation, ensuring machine tool safety and workpiece quality. Attached Figure Description

[0015] The accompanying drawings, which form part of this application, are used to provide a further understanding of this application. The illustrative embodiments and descriptions of this application are used to explain this application and do not constitute an undue limitation of this application. In the drawings:

[0016] Figure 1 A hardware block diagram of a mobile terminal for performing a control method for dual-probe measurement of a dual-spindle machine tool, according to an embodiment of this application, is shown.

[0017] Figure 2 A schematic diagram of the structure of a first type of dual-spindle machine tool provided according to an embodiment of this application is shown;

[0018] Figure 3 A schematic diagram of the structure of a second type of dual-spindle machine tool provided according to an embodiment of this application is shown;

[0019] Figure 4A schematic diagram of the structure of a third type of dual-spindle machine tool provided according to an embodiment of this application is shown;

[0020] Figure 5 A flowchart illustrating a control method for dual-probe measurement in a dual-spindle machine tool according to an embodiment of this application is shown.

[0021] Figure 6 A flowchart illustrating another control method for dual-probe measurement of a dual-spindle machine tool according to an embodiment of this application is shown.

[0022] Figure 7 A structural block diagram of a control device for dual-probe measurement of a dual-spindle machine tool according to an embodiment of this application is shown.

[0023] The above figures include the following reference numerals:

[0024] 102. Processor; 104. Memory; 106. Transmission device; 108. Input / output device; 10. First channel; 20. Second channel; 30. First probe; 40. Second probe; 50. Fixture; 60. Turntable; 70. Tool magazine. Detailed Implementation

[0025] It should be noted that, unless otherwise specified, the embodiments and features described in this application can be combined with each other. This application will now be described in detail with reference to the accompanying drawings and embodiments.

[0026] To enable those skilled in the art to better understand the present application, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present application, and not all embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative effort should fall within the scope of protection of the present application.

[0027] It should be noted that the terms "first," "second," etc., in the specification, claims, and accompanying drawings of this application are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate for the embodiments of this application described herein. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover non-exclusive inclusion; for example, a process, method, system, product, or apparatus that comprises a series of steps or units is not necessarily limited to those steps or units explicitly listed, but may include other steps or units not explicitly listed or inherent to such processes, methods, products, or apparatus.

[0028] As described in the background section, in the prior art, the two probes of a dual-spindle machine tool perform measurements separately, lacking an effective synchronous control mechanism, which affects the detection efficiency. To solve the problem that dual-spindle machine tools are difficult to measure workpieces efficiently, embodiments of this application provide a control method for dual-probe measurement of a dual-spindle machine tool, a control device for dual-probe measurement of a dual-spindle machine tool, a computer-readable storage medium, and an electronic device.

[0029] The technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention.

[0030] The methods and embodiments provided in this application can be executed on a mobile terminal, computer terminal, or similar computing device. Taking running on a mobile terminal as an example, Figure 1 This is a hardware structure block diagram of a mobile terminal for a control method of dual-probe measurement in a dual-spindle machine tool according to an embodiment of the present invention. (See diagram for example.) Figure 1 As shown, a mobile terminal may include one or more ( Figure 1 Only one is shown in the diagram. A processor 102 (which may include, but is not limited to, a microprocessor MCU or a programmable logic device FPGA, etc.) and a memory 104 for storing data are also shown. The mobile terminal may further include a transmission device 106 for communication functions and an input / output device 108. Those skilled in the art will understand that... Figure 1 The structure shown is for illustrative purposes only and does not limit the structure of the mobile terminal described above. For example, the mobile terminal may also include components that are more... Figure 1 The more or fewer components shown, or having the same Figure 1 The different configurations shown.

[0031] The memory 104 can be used to store computer programs, such as application software programs and modules, like the computer program corresponding to the control method for dual-probe measurement of a dual-spindle machine tool in this embodiment of the invention. The processor 102 executes various functional applications and data processing by running the computer program stored in the memory 104, thereby implementing the above-described method. The memory 104 may include high-speed random access memory and non-volatile memory, such as one or more magnetic storage devices, flash memory, or other non-volatile solid-state memory. In some instances, the memory 104 may further include memory remotely located relative to the processor 102, and these remote memories can be connected to the mobile terminal via a network. Examples of the aforementioned networks include, but are not limited to, the Internet, corporate intranets, local area networks, mobile communication networks, and combinations thereof. The transmission device 106 is used to receive or send data via a network. Specific examples of the aforementioned networks may include wireless networks provided by the mobile terminal's communication provider. In one example, the transmission device 106 includes a network interface controller (NIC), which can be connected to other network devices via a base station to communicate with the Internet. In one example, the transmission device 106 may be a radio frequency (RF) module, which is used to communicate with the Internet wirelessly.

[0032] This embodiment provides a control method for dual-probe measurement of a dual-spindle machine tool running on a mobile terminal, computer terminal, or similar computing device. It should be noted that the steps shown in the flowchart in the accompanying drawings can be executed in a computer system such as a set of computer-executable instructions. Furthermore, although a logical order is shown in the flowchart, in some cases, the steps shown or described may be executed in a different order than that shown here.

[0033] like Figures 2 to 4 As shown, the dual-spindle machine tool of this application includes a first channel 10, a second channel 20, a first probe 30, a second probe 40, a fixture 50, a rotary table 60, and a tool magazine 70. A preset workpiece is clamped in the fixture 50. The first probe 30 is located in the first channel 10, and the second probe 40 is located in the second channel 20. Figures 3 to 4 The machine tool model does not have any fixtures; the rotary table 60 is a structure with a fixed fixture 50.

[0034] Figure 5 This is a flowchart of a control method for dual-probe measurement in a dual-spindle machine tool according to an embodiment of this application. Figure 5 As shown, the method includes the following steps:

[0035] Step S1: Obtain the initial coordinate information of the first probe and the second probe. The initial coordinate information includes the horizontal coordinate of the first probe and the vertical coordinate of the second probe in the first direction and the second direction in the preset machining coordinate system. The preset machining coordinate system has a first preset relationship with the preset workpiece.

[0036] Specifically, before starting the measurement, the precise positions of the two probes are needed for accurate positioning in subsequent operations. Initial coordinate information includes the probe positions on the X-axis (horizontal coordinate) and Z-axis (vertical coordinate), which together form part of the preset machining coordinate system. The initial preset relationship between the preset workpiece and the preset machining coordinate system ensures that all measurement and machining activities are based on the precise position and orientation of the preset workpiece on the machine tool. Each preset workpiece has slight differences in size and machining method; therefore, each preset workpiece has its own corresponding preset machining coordinate system. For example, in the Siemens system, this is achieved through internal system variables. P_GG[8] (represents the active G code in G code group 8, indicating the active workpiece coordinate system; the value is 1 when no workpiece coordinate system is active, and 2 when the workpiece coordinate system is active) obtains the information of the currently active machining coordinate system, ensuring that the two probes are in the same reference coordinate system before starting the measurement work. By obtaining the precise initial coordinates of the probes and establishing a preset machining coordinate system related to the preset workpiece, the accuracy and reliability of subsequent measurements are ensured, and measurement errors caused by inaccurate positioning are reduced.

[0037] Step S2: Control the first probe and the second probe to move in the preset machining coordinate system so that the coordinate information of the first probe is the first coordinate information and the coordinate information of the second probe is the second coordinate information. The first coordinate information and the second coordinate information have the same vertical coordinate in the second direction. Control the fixture to move to the first position in the preset machining coordinate system along the third direction in the preset machining coordinate system. The first coordinate information and the second coordinate information have a second preset relationship with the preset workpiece. The third direction is perpendicular to the first direction and the second direction, respectively.

[0038] Specifically, the above steps involve the synchronous positioning of the dual probes and the movement of the fixture. By controlling the movement of the first and second probes in the X and Z axes of the preset machining coordinate system, the first and second probes can be moved to the standard position of the preset workpiece before measurement. This ensures that the fixture will not collide with the first and second probes during movement. Maintaining consistency in the Z-axis position of the two probes allows them to be executed through the same step, unifying the structural position, facilitating subsequent control of movement, and simplifying the control steps. Furthermore, the fixture needs to move to a suitable position along the Y-axis (third axis) to facilitate the inspection of the preset workpiece. Through this coordinated action, the dual probes can effectively complete the inspection of the workpiece. Synchronous positioning of the dual probes requires precise coordination, especially in the X and Z axes. To avoid collisions during inspection, it is essential to ensure that the positions of the two probes in the Z-axis direction remain consistent, and the Y-axis position of the fixture must be adjusted to a region that will not interfere with the probe movement before measurement. This process can be achieved by adding the WAITM (Wait for the marker in the specified channel to stop the previous program segment) instruction in the program, ensuring that the actions of the two channels are synchronized, avoiding potential collision risks, and ensuring the precise consistency of the measurement actions by calculating and transmitting the offset.

[0039] Step S3: Control the first probe to move a first preset distance in the opposite direction to the second direction, starting from the first coordinate information; at the same time, control the second probe to move a first preset distance in the opposite direction to the second direction, starting from the second coordinate information.

[0040] Specifically, the first probe moves downwards along the negative Z-axis based on the first coordinate information, and the second probe moves downwards based on the second coordinate information, until they contact the workpiece surface. The selection of this preset distance needs to consider the possible deformation of the workpiece. Typically, this preset distance can be set to 10mm, 15mm, or 20mm to accommodate the deformation range of most workpieces while ensuring safe contact between the probes and the workpiece surface. By precisely controlling the movement distance of the first and second probes, the degree of workpiece deformation can be effectively detected, further improving the accuracy and efficiency of pre-processing workpiece inspection.

[0041] Step S4: During the process of controlling the first probe and the second probe to move in the opposite direction to the second direction, determine whether the first probe and the second probe are in contact with the preset workpiece. If it is determined that they are in contact with the preset workpiece, the measurement is completed.

[0042] Specifically, during the downward movement of the probe, the contact between the probe and the preset workpiece is continuously monitored. Once contact is detected, it indicates that the probe can reach the preset workpiece within the aforementioned first preset distance, the workpiece is properly clamped, or the deformation is within a controllable range, and the measurement ends. The probe is then quickly raised to avoid further contact that could cause damage. By monitoring the contact state between the probe and the workpiece in real time, the movement of the probe during the measurement process can be stopped immediately, effectively protecting the probe from damage and providing accurate information for subsequent workpiece processing.

[0043] In this embodiment, the initial coordinate information of the first and second probes can be obtained firstly. The first and second probes are then controlled to move within a preset machining coordinate system, so that the coordinate information of the first probe is the first coordinate information, and the coordinate information of the second probe is the second coordinate information. The vertical coordinates of the first and second probes are the same in the second direction. The fixture is then controlled to move along the third direction to a first position. The aforementioned first coordinate information, second coordinate information, and first position correspond to the type of preset workpiece clamped in the fixture. Moving the two probes to the preset measurement position while ensuring safety allows for better subsequent measurement of the preset workpiece. The first probe is controlled to move a first preset distance in the opposite direction to the second direction, starting from the first coordinate information. Simultaneously, the second probe is controlled to move a first preset distance in the opposite direction to the second direction, starting from the second coordinate information. During the movement of the first and second probes in the opposite direction to the second direction, it is determined whether the first and second probes are in contact with the workpiece on the dual-spindle machine tool. If they are in contact with the workpiece on the dual-spindle machine tool, the measurement is completed. In the above steps, the system continuously monitors whether the probe is in contact with the workpiece. Once contact is established, it indicates that the workpiece is properly positioned and its deformation is within a controllable range, completing the measurement and allowing subsequent processing to proceed normally. Employing two probes, each with its own dedicated channel, overcomes the inefficiency of traditional twin-spindle machine tools when inspecting long-stroke workpieces. This improves inspection speed and accuracy, thus resolving the problem of inefficient workpiece measurement in existing twin-spindle machine tools. It also avoids the risks of clamping errors or collisions during subsequent processing caused by inaccurate workpiece placement or significant workpiece deformation, ensuring machine tool safety and workpiece quality.

[0044] In the above embodiments, such as Figures 2 to 4As shown, the dual-spindle machine tool of this application has two spindles, corresponding to the first channel 10 and the second channel 20 respectively (the figure shows only approximate areas; the first channel 10 is the moving area of ​​the first probe 30, and the second channel 20 is the moving area of ​​the second probe 40). Each channel is equipped with its own X-axis and Z-axis control system, as well as a shared Y-axis system (the Y-axis is the channel for the movement of the fixture 50). This design allows the machine tool to operate on two workpieces simultaneously.

[0045] In the above embodiments, different preset workpieces may be clamped at different positions on the machine tool table. Therefore, the origin (i.e., the reference point of the coordinate system) of the preset machining coordinate system for each preset workpiece may be set at different locations on the workpiece. For example, for a preset workpiece with a symmetrical structure, the origin may be set on the center line of the workpiece; while for an asymmetrical workpiece, the origin may be set at a specific corner or edge of the workpiece to facilitate more precise positioning and control during programming and machining. Depending on the machining requirements and shape characteristics of the preset workpiece, the direction and angle of the X, Y, and Z axes in the preset machining coordinate system may be adjusted. For example, for some workpieces that need to be machined at a specific angle, the Z-axis may need to be redefined so that it is perpendicular to the surface to be machined on the preset workpiece, rather than the original vertical direction of the machine tool. This helps improve machining accuracy and efficiency, ensuring that the tool or probe can move accurately along the required path. The positioning and clamping method of the preset workpiece in the fixture also affects the setting of the machining coordinate system.

[0046] In the specific implementation process, step S1 above, obtaining the initial coordinate information of the first probe and the second probe, includes:

[0047] Obtain the tool label in the first channel and the tool label in the second channel. Based on the tool label in the first channel, the tool label in the second channel, and the preset probe label, determine whether the tool in the first channel is the first probe and whether the tool in the second channel is the second probe. If the tool in the first channel is the first probe and the tool in the second channel is the second probe, obtain the initial coordinate information of the first probe and the second probe.

[0048] Specifically, in system programming, a macro program named LR_PROBE_Z can be defined using the PROC (a pseudo-instruction in assembly language) instruction, and then the spindle tool number variable can be defined as SpTool, through internal system variables. TC_MPP6[9998, 1] reads the tool number on the current spindle, and then uses the system's internal variable... TC_DP1[Sptool, 1] retrieves the current tool type and determines whether the tool is a probe. If so, it stores the required X-axis and Z-axis positioning values ​​for that probe. This process ensures that the correct probe is used in subsequent measurement steps, avoiding measurement failures caused by using the wrong tool. After identifying the first and second probes, their initial position information on the X-axis and Z-axis is stored, laying the foundation for subsequent movement and positioning.

[0049] After obtaining the initial coordinate information of the two probes, the control method also includes:

[0050] Obtain the first variable in the first channel and determine whether the first variable meets the preset threshold. If the preset threshold is met, determine that the preset machining coordinate system corresponding to the preset workpiece has been activated.

[0051] Specifically, the zero-bias variable information is obtained (zero-bias variable information refers to the machining coordinate system number set in the machine tool; a machine tool can have multiple machining coordinate systems, such as 100. If, before the program moves two probes, it finds that the preset machining coordinate system in the machine tool is not activated, it will stop and alarm; continuing to run will result in a collision). If the value of the zero-bias variable information meets the preset threshold (usually 2, representing that the coordinate system is activated), it can be determined that the preset machining coordinate system corresponding to the preset workpiece has been activated, and measurement can continue. After specifying the preset machining coordinate system corresponding to the preset workpiece, the programs for channel one and channel two are run simultaneously, with each channel's program executing independently.

[0052] Step S2 of this application, which controls the first probe and the second probe to move in a preset machining coordinate system so that the coordinate information of the first probe is the first coordinate information and the coordinate information of the second probe is the second coordinate information, can be achieved through the following steps:

[0053] Control the first and second probes to move along the second direction. If the first and second probes do not collide during the movement, determine their ordinates as standard ordinates, which are the maximum values ​​in the second direction of the preset machining coordinate system. First, control the Z-axis of both probes to rise to their highest point. For example, in a Siemens system, this can be done by using internal system variables. AC_MEA[1] (Measurement Task Status) determines whether a collision has occurred during the ascent (a collision refers to the probe stylus deflecting, and the internal signals of the system being affected). AC_MEA[1] will become 1). It is necessary to determine that the ordinates of both probes have reached the standard ordinates before proceeding with the subsequent operation. The main purpose here is to ensure that both axes return to a safe position (e.g., rise to the highest point) before moving to avoid collision.

[0054] The first probe is controlled to move to a first preset position in the preset machining coordinate system, and the second probe is controlled to move to a second preset position in the preset machining coordinate system. After both probes are at their highest Z-axis, the X-axis of both probes is moved to the target position (which corresponds to the preset workpiece). Since the two probes only move on the X and Z axes, the Y-axis information is zero.

[0055] The first and second probes are simultaneously moved a preset distance in the opposite direction of the second direction to position them at a theoretically preset distance from the workpiece. This yields the first coordinate information of the first probe and the second coordinate information of the second probe. The Z-axis of the first and second probes after simultaneous movement in the opposite direction of the second direction is the final fixed value of the workpiece being measured. The first coordinate information is obtained based on the X, Y, and Z-axis coordinates of the first probe, and the second coordinate information is obtained based on the X, Y, and Z-axis coordinates of the second probe. These first and second coordinate information are used as the starting point for the measurements taken by the first and second probes.

[0056] The above-mentioned control of the first probe to move to a first preset position in the preset machining coordinate system, and control of the second probe to move to a second preset position in the preset machining coordinate system, includes:

[0057] The first probe is controlled to move a first preset distance in a first direction, and its abscissa is determined as the first abscissa. The second probe is controlled to move a second preset distance in the opposite first direction, and its abscissa is determined as the second abscissa. The first opposite direction is the opposite of the first direction. The first abscissa is the abscissa of the first preset position, and the second abscissa is the abscissa of the second preset position. To ensure the measurement accuracy of the dual probes, the first probe is controlled to move a first preset distance along the X-axis (first direction), and the second probe is controlled to move a second preset distance along the opposite X-axis to reach their respective preset abscissa positions. The purpose of this operation is to align the two probes in the X-axis direction, ensuring that they can begin measurement from the same height or cross-section.

[0058] The control fixture moves a third preset distance in the third direction, and the coordinates of the fixture in the third direction are determined as the third preset coordinates. After the probe is positioned, the control fixture (the platform carrying the workpiece) moves a third preset distance along the Y-axis (third direction) to reach the specified third preset coordinates. This action is to adjust the workpiece to an optimal position for measurement and processing, avoiding limitations in the measurement range or collisions during processing due to improper workpiece positioning.

[0059] The first and second probes are simultaneously moved a fourth preset distance in the second direction. The ordinates of the first and second probes are then determined as the fourth preset ordinate, which is the ordinate of the first preset position and the position above the first preset position. The first and second probes simultaneously move downwards along the Z-axis (second direction) a fourth preset distance, reaching a target distance above the preset workpiece surface (theoretically, 10mm above the preset workpiece surface). This synchronous operation ensures the consistency of the two probes' positions in the Z-axis direction, enabling simultaneous and accurate measurement of the workpiece's features in that direction, improving measurement efficiency and accuracy. Since the probes operate slowly during measurement, pre-lowering them to the preset distance can save inspection time.

[0060] Move the fixture to the designated position on the Y-axis and simultaneously determine whether a collision has occurred during the movement. After the Y-axis is in position, move the two probes 10mm above the designated position on the Z-axis and simultaneously determine whether a collision has occurred during the ascent. Then, using this as the starting point, move the probe downwards to detect the target, moving a maximum of 15mm, and determine whether it has touched the workpiece. If no jump signal is received, an alarm will sound for measurement error.

[0061] The above steps control the movement of the first and second probes along the X-axis (the first direction and its opposite) and the fixture along the Y-axis (the third direction), while ensuring synchronization of the two probes along the Z-axis (the second direction). The movement distance in each direction (first preset distance / second preset distance / third preset distance / fourth preset distance) must be preset according to the workpiece characteristics and measurement requirements. For example, the movement distances of the first and second probes along the X-axis are 50mm and -50mm respectively (assuming a machine tool width of 100mm, -50mm means a movement of 50mm along the negative X-axis), ensuring that the two probes approach the workpiece from both sides (or move from a certain point on the workpiece to both sides), while the movement distance of the fixture along the Y-axis is 30mm, ensuring the workpiece is in the optimal detection position. Subsequently, the two probes move synchronously along the Z-axis, a preset distance of -15mm, until they contact the workpiece surface. This series of operations ensures comprehensiveness and accuracy of the measurement, avoids the problems of occlusion and long measurement times that may occur with a single probe, and reduces measurement time through synchronized actions.

[0062] The control method further includes: during the process of controlling the first probe to move a first preset distance in the opposite direction to the second direction, starting from the first coordinate information, and simultaneously controlling the second probe to move a first preset distance in the opposite direction to the second direction, when the first probe and the second probe come into contact with the workpiece on the dual-spindle machine tool, acquiring the first target coordinate information of the first probe and the second target coordinate information of the second probe; determining at least one first offset of the first target coordinate information relative to the standard coordinate information and at least one second offset of the second target coordinate information relative to the standard coordinate information based on the first target coordinate information, the second target coordinate information, and the standard coordinate information; and outputting an alarm signal when the first offset and the second offset exceed the standard range, wherein the alarm signal is used to characterize the preset workpiece as unqualified and / or to characterize the preset workpiece as misplaced.

[0063] Specifically, as the first and second probes move downwards to perform measurements, they continuously monitor whether they come into contact with the workpiece. Once contact occurs, a jump signal is generated, and the position of the probe at that moment is recorded. The offset is calculated and stored for use in subsequent programs, providing basic data for subsequent offset calculations.

[0064] When calculating the offset, the target coordinate information of the first and second probes is compared with the standard coordinate information to determine the offset between their actual and theoretical positions. The first and second offsets of the first and second probes relative to the standard coordinate system are calculated separately. These offsets reflect the actual positional deviation of the workpiece and are crucial for determining the workpiece's qualification. If the first and second offsets exceed a preset standard range (e.g., ±1mm), an alarm signal is issued. This mechanism can promptly detect workpiece clamping errors or deformation exceeding tolerances, allowing corrective measures to be taken before subsequent processing, thus avoiding potential quality problems and equipment damage.

[0065] To ensure the safety of both the probe and the workpiece during the multiple movements of the probe, the control method also includes:

[0066] If a collision occurs between the first and second probes under the condition that a first preset condition is met, a warning is issued. The first preset condition includes at least one of the following: movement of the first probe and / or movement of the second probe. During the measurement task, a constant check is performed to detect any risk of collision between the first and second probes. This check is performed at any stage of probe movement (i.e., when the aforementioned first preset condition is met) to prevent any form of collision, as even a slight collision can damage the probe or result in inaccurate measurements. Once a potential collision is detected, a warning is immediately issued, and further operation is stopped until the user confirms safety. This additional collision prevention measure enhances the reliability and safety of the twin-spindle machine tool.

[0067] For example, in Siemens systems, during the movement of the control probe and fixture described above, a WAITM (1, 1, 2) waiting instruction is added at certain critical positions. (1, 1, 2) is a waiting marker point. The program will only continue running after both axes have reached this line. The axis that reaches (1, 1, 2) first will wait for the other axis to reach this position before continuing the program. This is mainly to ensure that the fixture or probe will not collide after both axes have returned to a safe position (e.g., risen to the highest point). In addition to the steps in the control method above that explicitly state that the two control steps are performed simultaneously, during the movement of the two probes, the first probe can move first for positioning. After positioning, the first probe remains unchanged and executes the waiting instruction, while the second probe then positions itself. After the second probe positions itself, the first probe continues with the next movement.

[0068] To enable those skilled in the art to better understand the technical solution of this application, the implementation process of the control method for dual-probe measurement of a dual-spindle machine tool of this application will be described in detail below with reference to specific embodiments.

[0069] This embodiment relates to a specific control method for dual-probe measurement in a dual-spindle machine tool, such as... Figure 6 As shown, it includes the following steps:

[0070] Step S1: First, determine whether the cutting head in the first channel and the cutting head in the second channel are probes. If they are, obtain the initial coordinate information of the first probe and the second probe. The initial coordinate information includes the horizontal coordinate of the first probe and the vertical coordinate of the second probe in the X-axis and the vertical coordinate of the first probe in the Z-axis in the preset machining coordinate system. The coordinate of the first probe in the Y-axis is zero. Store the horizontal and vertical coordinates of the first probe and the second probe.

[0071] Step S2: Obtain the first variable in the first channel and determine whether the first variable meets the preset threshold. If the preset threshold is met, determine that the preset processing coordinate system of the first channel has been activated.

[0072] Step S3: With the preset machining coordinate system corresponding to the preset workpiece activated, begin controlling the first and second probes to move within the preset machining coordinate system. First, control the first probe to move along the Z-axis to its highest point (return to zero) within the preset machining coordinate system. During this movement, determine if the first probe will collide. If no collision occurs, position the probe along the Z-axis and wait for the second probe to be positioned. Then, select the coordinate system for the second channel, ensuring it is the same as the first channel's coordinate system (activating the preset machining coordinate system of the first channel). Control the second probe to move along the Z-axis to its highest point (return to zero) within the preset machining coordinate system. During this movement, determine if the second probe will collide. If no collision occurs, position the probe along the Z-axis.

[0073] Step S4: Control the first probe to move a first preset distance on the X-axis, and determine whether the first probe collides during this process. If no collision occurs, determine the X-axis positioning of the first probe and wait for the X-axis positioning of the second probe; Control the second probe to move a second preset distance in the first opposite direction, and determine whether the second probe collides during this process. If no collision occurs, determine the X-axis positioning of the second probe.

[0074] Step S5: Control the fixture to move along the third direction in the preset machining coordinate system. During this process, determine whether the fixture collides. If no collision occurs, perform Y-axis positioning.

[0075] Step S6: The first and second probes are moved to a position 10mm above the theoretically preset workpiece surface. During this process, it is determined whether the probes collide. If no collision occurs, the first probe is controlled to move a first preset distance in the opposite direction to the second direction, starting from the first coordinate information. At the same time, the second probe is controlled to move a first preset distance (which can be 15mm) in the opposite direction to the second direction, starting from the second coordinate information. During this process, it is determined whether the probes collide. If no collision occurs, it indicates that there is a problem with the preset workpiece. The first and second probes are then controlled to lift the blades and an alarm is issued.

[0076] Step S7: If a collision occurs, indicating that the preset workpiece is within a controllable range, calculate the offset value based on the coordinate information of the first and second probes when they contact the preset workpiece, store the offset value, control the first and second probes to lift the tool, and the measurement is completed.

[0077] This application also provides a control device for dual-probe measurement of a dual-spindle machine tool. It should be noted that the control device for dual-probe measurement of a dual-spindle machine tool in this application can be used to execute the control method for dual-probe measurement of a dual-spindle machine tool provided in this application. This device is used to implement the above embodiments and preferred embodiments; details already described will not be repeated. As used below, the term "module" can refer to a combination of software and / or hardware that performs a predetermined function. Although the device described in the following embodiments is preferably implemented in software, hardware implementation, or a combination of software and hardware, is also possible and contemplated.

[0078] In the above embodiments, steps S1 to S3 can also be as follows: First, determine whether the tool head in the first channel is a probe. If it is, obtain the initial coordinate information of the first probe and store the horizontal and vertical coordinates of the first probe. Obtain the first variable in the first channel and determine whether the first variable meets a preset threshold. If the preset threshold is met, determine that the preset machining coordinate system of the first channel has been activated. Then, determine whether the tool head in the second channel is a probe and use the preset machining coordinate system of the first channel as the coordinate system of the second channel. Simultaneously, control the first probe to move along the Z-axis to the highest point in the preset machining coordinate system. During the movement, determine whether the first probe will collide. If no collision occurs, determine the Z-axis positioning of the first probe. Wait for the Z-axis positioning of the second probe, control the second probe to move along the Z-axis to the highest point in the preset machining coordinate system, and determine whether the second probe will collide during the movement. If no collision occurs, position the Z-axis. Then, proceed according to steps S4, S5, S6, and S7.

[0079] The control device for dual-probe measurement of a dual-spindle machine tool provided in the embodiments of this application is described below.

[0080] Figure 7 This is a schematic diagram of a control device for dual-probe measurement on a dual-spindle machine tool according to an embodiment of this application. Figure 7As shown, the device includes: a first acquisition module 100, used to acquire initial coordinate information of a first probe and a second probe, the initial coordinate information including, in a preset machining coordinate system, the horizontal coordinates of the first probe and the vertical coordinates of the second probe in a first direction and in a second direction, the preset machining coordinate system having a first preset relationship with a preset workpiece; and a first control module 200, used to control the movement of the first probe and the second probe in the preset machining coordinate system, such that the coordinate information of the first probe is the first coordinate information, the coordinate information of the second probe is the second coordinate information, the vertical coordinates of the first coordinate information and the second coordinate information are the same in the second direction, and to control the fixture to move along a third direction in the preset machining coordinate system. The probe moves to a first position, where the first and second coordinate information have a second preset relationship with the preset workpiece, and the third direction is perpendicular to the first and second directions respectively. The second control module 300 controls the first probe to move a first preset distance in the opposite direction to the second direction, starting from the first coordinate information, and simultaneously controls the second probe to move a first preset distance in the opposite direction to the second direction, starting from the second coordinate information. The first judgment module 400 determines whether the first and second probes are in contact with the preset workpiece during the process of controlling the first and second probes to move in the opposite direction to the second direction. If it is determined that they are in contact with the preset workpiece, the measurement is completed.

[0081] As an optional solution, the first acquisition module includes a first acquisition submodule, which is used to acquire the tool number in the first channel and the tool number in the second channel, and determine whether the tool in the first channel is the first probe and whether the tool in the second channel is the second probe based on the tool number in the first channel, the tool number in the second channel and the preset probe number. If the tool in the first channel is the first probe and the tool in the second channel is the second probe, the initial coordinate information of the first probe and the second probe is acquired.

[0082] In one optional scheme, the control module further includes a second judgment module, which is used to obtain the first variable in the first channel and determine whether the first variable meets the preset threshold. If the preset threshold is met, it is determined that the preset machining coordinate system corresponding to the preset workpiece has been activated.

[0083] In one optional scheme, the first control module includes a first sub-control module, a second sub-control module, and a third sub-control module. The first sub-control module controls the first probe and the second probe to move simultaneously along a second direction. If the first probe and the second probe do not collide during the movement, the ordinates of the first probe and the second probe are determined as standard ordinates, which are the maximum values ​​of a preset machining coordinate system in the second direction. The second sub-control module controls the first probe to move to a first preset position in the preset machining coordinate system and controls the second probe to move to a second preset position in the preset machining coordinate system. The third sub-control module controls the first probe and the second probe to move simultaneously along the opposite direction of the second direction by a target preset distance, so that the first probe and the second probe are located at a theoretical preset distance from the preset workpiece, thereby obtaining the first coordinate information of the first probe and the second coordinate information of the second probe.

[0084] In one optional scheme, the second sub-control module includes a first sub-control unit, a second sub-control unit, and a third sub-control unit. The first sub-control unit controls the first probe to move a first preset distance in a first direction, determining the abscissa of the first probe as the first abscissa, and controls the second probe to move a second preset distance in a first opposite direction, determining the abscissa of the second probe as the second abscissa. The first opposite direction is opposite to the first direction. The first abscissa is the abscissa of a first preset position, and the second abscissa is the abscissa of the second preset position. The second sub-control unit controls the clamp to move a third preset distance in a third direction, determining the coordinate of the clamp in the third direction as the third preset coordinate. The third sub-control unit controls the first probe and the second probe to move simultaneously in a second direction a fourth preset distance, determining the ordinates of the first probe and the second probe as the fourth preset ordinate. The fourth preset ordinate is the ordinate of the first preset position and the ordinate of the first preset position.

[0085] In one optional scheme, the second control module includes a second acquisition submodule, a first determination submodule, and a second determination submodule. The second acquisition submodule is used to acquire the first target coordinate information of the first probe and the second target coordinate information of the second probe when, during the process of controlling the first probe to move a first preset distance in the opposite direction to the second direction from the first coordinate information, and simultaneously controlling the second probe to move a first preset distance in the opposite direction to the second direction from the second coordinate information, the acquisition submodule acquires the first target coordinate information of the first probe and the second target coordinate information of the second probe when they come into contact with the workpiece on the dual-spindle machine tool. The first determination submodule is used to determine at least one first offset of the first target coordinate information relative to the standard coordinate information, and at least one second offset of the second target coordinate information relative to the standard coordinate information, based on the first target coordinate information, the second target coordinate information, and the standard coordinate information. The second determination submodule is used to output an alarm signal when the first offset and the second offset exceed the standard range. The alarm signal is used to indicate that the preset workpiece is unqualified and / or that the preset workpiece is misplaced.

[0086] In one optional embodiment, the control device further includes a third control module, which is used to determine whether a collision occurs between the first probe and the second probe when a first preset condition is met, and to issue a warning when a collision occurs between the first probe and the second probe. The first preset condition includes at least one of the following: the first probe moves and / or the second probe moves.

[0087] The control device for dual-probe measurement in a dual-spindle machine tool includes a processor and a memory. The aforementioned first acquisition module, etc., are all stored as program units in the memory, and the processor executes these program units to achieve the corresponding functions. All of the above modules reside in the same processor; alternatively, the modules may be located in different processors in any combination.

[0088] The processor contains a kernel, which retrieves the corresponding program units from memory. One or more kernels can be configured, and adjusting kernel parameters can address the problem of inefficient workpiece measurement in existing dual-spindle machine tools.

[0089] The memory may include non-permanent memory in computer-readable media, such as random access memory (RAM) and / or non-volatile memory, such as read-only memory (ROM) or flash RAM, and the memory includes at least one memory chip.

[0090] This invention provides a computer-readable storage medium including a stored program, wherein, when the program is running, a control method is provided to control the device where the computer-readable storage medium is located to perform dual-probe measurements on a dual-spindle machine tool.

[0091] Specifically, the control method for dual-probe measurement in a dual-spindle machine tool includes:

[0092] Step S1: Obtain the initial coordinate information of the first probe and the second probe. The initial coordinate information includes the horizontal coordinate of the first probe and the vertical coordinate of the second probe in the first direction and the second direction in the preset machining coordinate system. The preset machining coordinate system has a first preset relationship with the preset workpiece.

[0093] Step S2: Control the first probe and the second probe to move in the preset machining coordinate system so that the coordinate information of the first probe is the first coordinate information and the coordinate information of the second probe is the second coordinate information. The first coordinate information and the second coordinate information have the same vertical coordinate in the second direction. Control the fixture to move to the first position along the third direction in the preset machining coordinate system. The first coordinate information and the second coordinate information have a second preset relationship with the preset workpiece. The third direction is perpendicular to the first direction and the second direction, respectively.

[0094] Step S3: Control the first probe to move a first preset distance in the opposite direction to the second direction, starting from the first coordinate information; at the same time, control the second probe to move a first preset distance in the opposite direction to the second direction, starting from the second coordinate information.

[0095] Step S4: During the process of controlling the first probe and the second probe to move in the opposite direction to the second direction, determine whether the first probe and the second probe are in contact with the workpiece on the dual-spindle machine tool. If it is determined that they are in contact with the workpiece on the dual-spindle machine tool, the measurement is completed.

[0096] This invention provides a processor for running a program, wherein the program executes a control method for dual-probe measurement of a dual-spindle machine tool.

[0097] Specifically, the control method for dual-probe measurement in a dual-spindle machine tool includes:

[0098] Step S1: Obtain the initial coordinate information of the first probe and the second probe. The initial coordinate information includes the horizontal coordinate of the first probe and the vertical coordinate of the second probe in the first direction and the second direction in the preset machining coordinate system. The preset machining coordinate system has a first preset relationship with the preset workpiece.

[0099] Step S2: Control the first probe and the second probe to move in the preset machining coordinate system so that the coordinate information of the first probe is the first coordinate information and the coordinate information of the second probe is the second coordinate information. The first coordinate information and the second coordinate information have the same vertical coordinate in the second direction. Control the fixture to move to the first position along the third direction in the preset machining coordinate system. The first coordinate information and the second coordinate information have a second preset relationship with the preset workpiece. The third direction is perpendicular to the first direction and the second direction, respectively.

[0100] Step S3: Control the first probe to move a first preset distance in the opposite direction to the second direction, starting from the first coordinate information; at the same time, control the second probe to move a first preset distance in the opposite direction to the second direction, starting from the second coordinate information.

[0101] Step S4: During the process of controlling the first probe and the second probe to move in the opposite direction to the second direction, determine whether the first probe and the second probe are in contact with the workpiece on the dual-spindle machine tool. If it is determined that they are in contact with the workpiece on the dual-spindle machine tool, the measurement is completed.

[0102] This invention provides a device including a processor, a memory, and a program stored in the memory and executable on the processor. When the processor executes the program, it performs at least the following steps: acquiring initial coordinate information of a first probe and a second probe, the initial coordinate information including, in a preset machining coordinate system, the abscissa of the first probe in a first direction and the ordinate of the second probe in a second direction, the preset machining coordinate system having a first preset relationship with a preset workpiece; controlling the first probe and the second probe to move within the preset machining coordinate system, such that the coordinate information of the first probe is the first coordinate information, the coordinate information of the second probe is the second coordinate information, and the first coordinate information and the second coordinate information are... The vertical coordinates are the same in the direction. The control fixture moves along a third direction to a first position. The first coordinate information and the second coordinate information have a second preset relationship with the preset workpiece. The third direction is perpendicular to the first direction and the second direction, respectively. The control fixture moves the first probe from the first coordinate information as the starting point in the opposite direction to the second direction by a first preset distance. At the same time, the control fixture moves the second probe from the second coordinate information as the starting point in the opposite direction to the second direction by a first preset distance. During the movement of the first probe and the second probe in the opposite direction to the second direction, it is determined whether the first probe and the second probe are in contact with the workpiece on the dual-spindle machine tool. If they are in contact with the workpiece on the dual-spindle machine tool, the measurement is completed. The device in this article can be a server, PC, PAD, mobile phone, etc.

[0103] This application also provides a computer program product, which, when executed on a data processing device, is suitable for executing an initialization program having at least the following method steps: acquiring initial coordinate information of a first probe and a second probe, the initial coordinate information including, in a preset machining coordinate system, the abscissa of the first probe and the ordinate of the second probe in a first direction and the ordinate of the second probe in a second direction, the preset machining coordinate system having a first preset relationship with a preset workpiece; controlling the first probe and the second probe to move within the preset machining coordinate system, such that the coordinate information of the first probe is the first coordinate information, the coordinate information of the second probe is the second coordinate information, and the ordinate of the first coordinate information and the second coordinate information in the second direction are... Simultaneously, the control fixture moves along a third direction to a first position, and the first coordinate information and the second coordinate information have a second preset relationship with the preset workpiece. The third direction is perpendicular to the first direction and the second direction, respectively. The control fixture moves the first probe from the first coordinate information as the starting point in the opposite direction to the second direction by a first preset distance, and simultaneously controls the second probe from the second coordinate information as the starting point in the opposite direction to the second direction by a first preset distance. During the process of controlling the first probe and the second probe to move in the opposite direction to the second direction, it is determined whether the first probe and the second probe are in contact with the workpiece on the dual-spindle machine tool. If it is determined that they are in contact with the workpiece on the dual-spindle machine tool, the measurement is completed.

[0104] It is obvious to those skilled in the art that the modules or steps of the present invention described above can be implemented using general-purpose computing devices. They can be centralized on a single computing device or distributed across a network of multiple computing devices. They can be implemented using computer-executable program code, and thus can be stored in a storage device for execution by a computing device. In some cases, the steps shown or described can be performed in a different order than those described herein, or they can be fabricated as separate integrated circuit modules, or multiple modules or steps can be fabricated as a single integrated circuit module. Thus, the present invention is not limited to any particular combination of hardware and software.

[0105] Those skilled in the art will understand that embodiments of this application can be provided as methods, systems, or computer program products. Therefore, this application can take the form of a completely hardware embodiment, a completely software embodiment, or an embodiment combining software and hardware aspects. Furthermore, this application can take the form of a computer program product embodied on one or more computer-usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.

[0106] This application is described with reference to flowchart illustrations and / or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of this application. It will be understood that each block of the flowchart illustrations and / or block diagrams, and combinations of blocks in the flowchart illustrations and / or block diagrams, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, special-purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, generate instructions for implementing the flowchart... Figure 1 One or more processes and / or boxes Figure 1 A device that provides the functions specified in one or more boxes.

[0107] These computer program instructions may also be stored in a computer-readable storage medium that can direct a computer or other programmable data processing device to function in a particular manner, such that the instructions stored in the computer-readable storage medium produce an article of manufacture including instruction means, which are implemented in a process Figure 1 One or more processes and / or boxes Figure 1 The function specified in one or more boxes.

[0108] These computer program instructions may also be loaded onto a computer or other programmable data processing equipment to cause a series of operational steps to be performed on the computer or other programmable equipment to produce a computer-implemented process, thereby providing instructions that execute on the computer or other programmable equipment for implementing the process. Figure 1 One or more processes and / or boxes Figure 1 The steps of the function specified in one or more boxes.

[0109] In a typical configuration, a computing device includes one or more processors (CPU), input / output interfaces, network interfaces, and memory.

[0110] Memory may include non-persistent memory in computer-readable media, such as random access memory (RAM) and / or non-volatile memory, like read-only memory (ROM) or flash RAM. Memory is an example of computer-readable media.

[0111] Computer-readable media include both permanent and non-permanent, removable and non-removable media that can store information by any method or technology. Information can be computer-readable instructions, data structures, modules of programs, or other data. Examples of computer storage media include, but are not limited to, phase-change memory (PRAM), static random access memory (SRAM), dynamic random access memory (DRAM), other types of random access memory (RAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), flash memory or other memory technologies, CD-ROM, digital versatile optical disc (DVD) or other optical storage, magnetic tape, disk storage or other magnetic storage devices, or any other non-transferable medium that can be used to store information accessible by a computing device. As defined herein, computer-readable media does not include transient computer-readable media, such as modulated data signals and carrier waves.

[0112] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0113] It should also be noted that the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such process, method, article, or apparatus. Unless otherwise specified, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes that element.

[0114] The above description is merely a preferred embodiment of this application and is not intended to limit this application. Various modifications and variations can be made to this application by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this application should be included within the protection scope of this application.

Claims

1. A control method for dual-probe measurement in a dual-spindle machine tool, characterized in that, The dual-spindle machine tool includes a first channel, a second channel, a first probe, a second probe, and a fixture. A preset workpiece is clamped in the fixture. The first probe is located in the first channel, and the second probe is located in the second channel. The control method includes: The initial coordinate information of the first probe and the second probe is obtained. The initial coordinate information includes the horizontal coordinate of the first probe and the vertical coordinate of the second probe in a first direction and the second direction in a preset machining coordinate system. The preset machining coordinate system has a first preset relationship with the preset workpiece. The first probe and the second probe are controlled to move in the preset machining coordinate system so that the coordinate information of the first probe is the first coordinate information and the coordinate information of the second probe is the second coordinate information. The first coordinate information and the second coordinate information have the same vertical coordinate in the second direction. The fixture is controlled to move to the first position along the third direction in the preset machining coordinate system. The first coordinate information and the second coordinate information have a second preset relationship with the preset workpiece. The third direction is perpendicular to the first direction and the second direction, respectively. The first probe is controlled to move a first preset distance in the opposite direction to the second direction, starting from the first coordinate information; at the same time, the second probe is controlled to move the first preset distance in the opposite direction to the second direction, starting from the second coordinate information. During the process of controlling the first probe and the second probe to move in the opposite direction to the second direction, it is determined whether the first probe and the second probe are in contact with the preset workpiece. If it is determined that they are in contact with the preset workpiece, the measurement is completed.

2. The method according to claim 1, characterized in that, Obtain the initial coordinate information of the first probe and the second probe, including: Obtain the tool label in the first channel and the tool label in the second channel, and determine whether the tool in the first channel is the first probe and the tool in the second channel is the second probe based on the tool label in the first channel, the tool label in the second channel and the preset probe label. If the tool in the first channel is the first probe and the tool in the second channel is the second probe, obtain the initial coordinate information of the first probe and the second probe.

3. The method according to claim 1, characterized in that, The control method further includes: Obtain the first variable in the first channel and determine whether the first variable meets a preset threshold. If the preset threshold is met, determine that the preset machining coordinate system corresponding to the preset workpiece has been activated.

4. The method according to claim 1, characterized in that, The control of the first probe and the second probe to move within the preset machining coordinate system, such that the coordinate information of the first probe is the first coordinate information and the coordinate information of the second probe is the second coordinate information, includes: Control the first probe and the second probe to move along the second direction. If the first probe and the second probe do not collide during the movement, the ordinate of the first probe and the second probe is determined as the standard ordinate, which is the maximum value of the preset processing coordinate system in the second direction. The first probe is controlled to move to a first preset position in the preset machining coordinate system, and the second probe is controlled to move to a second preset position in the preset machining coordinate system; The first probe and the second probe are controlled to move simultaneously in the opposite direction of the second direction by a predetermined distance, so that the first probe and the second probe are located at a theoretically predetermined distance from the predetermined workpiece, thereby obtaining the first coordinate information of the first probe and the second coordinate information of the second probe.

5. The method according to claim 4, characterized in that, The step of controlling the first probe to move to a first preset position in the preset machining coordinate system and controlling the second probe to move to a second preset position in the preset machining coordinate system includes: The first probe is controlled to move a first preset distance in the first direction, and the abscissa of the first probe is determined as the first abscissa. The second probe is controlled to move a second preset distance in the first opposite direction, and the abscissa of the second probe is determined as the second abscissa. The first opposite direction is opposite to the first direction. The first abscissa is the abscissa of the first preset position, and the second abscissa is the abscissa of the second preset position. The clamp is controlled to move upwards by a third preset distance on the third side, and the coordinates of the clamp on the third side are determined as the third preset coordinates. The first probe and the second probe are controlled to move simultaneously in the second direction by a fourth preset distance, and the ordinates of the first probe and the second probe are determined as the fourth preset ordinates, which are the ordinates of the first preset position and the first preset position.

6. The method according to claim 1, characterized in that, The control method further includes: During the process of controlling the first probe to move a first preset distance in the opposite direction to the second direction, starting from the first coordinate information, and simultaneously controlling the second probe to move a first preset distance in the opposite direction to the second direction, when the first probe and the second probe come into contact with the workpiece on the dual-spindle machine tool, the first target coordinate information of the first probe and the second target coordinate information of the second probe are obtained. Based on the first target coordinate information, the second target coordinate information, and the standard coordinate information, at least one first offset of the first target coordinate information relative to the standard coordinate information is determined, and at least one second offset of the second target coordinate information relative to the standard coordinate information is determined. If the first offset and the second offset exceed the standard range, an alarm signal is output. The alarm signal is used to indicate that the preset workpiece is unqualified and / or that the placement of the preset workpiece is unqualified.

7. The method according to claim 5, characterized in that, The control method further includes: If a first preset condition is met, it is determined whether a collision occurs between the first probe and the second probe. If a collision occurs between the first probe and the second probe, a warning is issued. The first preset condition includes at least one of the following: the first probe moves and / or the second probe moves.

8. A control device for dual-probe measurement on a dual-spindle machine tool, characterized in that, The dual-spindle machine tool includes a first channel, a second channel, a first probe, a second probe, and a fixture. A preset workpiece is clamped in the fixture. The first probe is located in the first channel, and the second probe is located in the second channel. The first acquisition module is used to acquire the initial coordinate information of the first probe and the second probe. The initial coordinate information includes the horizontal coordinate of the first probe and the vertical coordinate of the second probe in a first direction and in a second direction in a preset machining coordinate system. The preset machining coordinate system has a first preset relationship with the preset workpiece. A first control module is used to control the first probe and the second probe to move in the preset machining coordinate system, so that the coordinate information of the first probe is the first coordinate information, the coordinate information of the second probe is the second coordinate information, the first coordinate information and the second coordinate information have the same vertical coordinate in the second direction, and control the fixture to move to a first position along a third direction in the preset machining coordinate system, the first coordinate information and the second coordinate information have a second preset relationship with the preset workpiece, and the third direction is perpendicular to the first direction and the second direction respectively; The second control module is used to control the first probe to move a first preset distance in the opposite direction to the second direction, starting from the first coordinate information, and at the same time control the second probe to move the first preset distance in the opposite direction to the second direction, starting from the second coordinate information. The first judgment module is used to determine whether the first probe and the second probe are in contact with the preset workpiece during the process of controlling the first probe and the second probe to move in the opposite direction to the second direction. If it is determined that they are in contact with the preset workpiece, the measurement is completed.

9. A computer-readable storage medium, characterized in that, The computer-readable storage medium includes a stored program, wherein, when the program is executed, it controls the device containing the computer-readable storage medium to perform the control method for dual-probe measurement of a dual-spindle machine tool as described in any one of claims 1 to 7.

10. An electronic device, characterized in that, include: One or more processors, a memory, and one or more programs, wherein the one or more programs are stored in the memory and configured to be executed by the one or more processors, the one or more programs including a control method for performing dual-probe measurements of a dual-spindle machine tool according to any one of claims 1 to 7.

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