Scintillation measurement device and measurement method

Abstract

The present invention is provided with: a detection means (13) for detecting candidates for the light quantity variation frequency of an object to be measured (100); a frequency determination means (14) for determining the light quantity variation frequency on the basis of the detected candidate for the light quantity variation frequency; a resolution determination means (15) that determines the frequency resolution to be measured by the scintillator on the basis of the determined light amount variation frequency; and a scintillation measurement means (16) that performs scintillation measurement at the determined frequency resolution. The resolution determination means (15) determines, as the frequency resolution, one of the integer fractions of the light amount variation frequency determined by the frequency determination means (14).

Description

[0001] This application is a divisional application of the invention patent application filed on October 21, 2020, with application number 202080074485.2 and entitled "Scintillation Measurement Device and Measurement Method". Technical Field

[0002] This invention relates to a flicker measuring device and a method for measuring flicker in objects such as displays. Background Technology

[0003] Generally, monitors such as personal computers update images according to the period of the vertical sync signal (Vsync), so the screen has brightness fluctuations with the period of the vertical sync signal. In addition, when the monitor is a liquid crystal display (LCD), an inverted drive that switches the polarity between odd and even frames is used, so the brightness fluctuation period of the screen becomes twice as low frequency.

[0004] Such changes in brightness in the image are perceived as flickering.

[0005] As a light meter used to measure the basic performance of a display, a known display color analyzer is an example (such as the CA-410 manufactured by Konica Minolta Corporation). Such a display color analyzer has an internal light sensor that can measure not only color or brightness, but also light waveform or flicker.

[0006] Scintillation measurement methods are standardized based on standards such as JEITA, VESA, and IEC. To accurately reflect the frequency response characteristics of the human eye (TCSF (temporal contrast sensitivity function)), each standard derives its method through the following processing.

[0007] That is, the obtained light waveform is decomposed into intensity for each frequency component by digital Fourier transform. The intensity of each frequency component is multiplied by TCSF to transform it into an intensity that reflects the frequency response of the eye. Then, the flicker value is derived using calculation methods that follow various standards.

[0008] In the case of a display, the emission cycle has characteristics, so the frequency of light quantity variation that is the object of measurement is generally limited to the following.

[0009] • The frequency (fv) of the vertical synchronization signal Vsync and its harmonics (fv*n)

[0010] In the case of an LCD, the 1 / 2*Vsync frequency (fv / 2) and its harmonics (fv / 2*n)

[0011] In the case of a display with backlight modulation, the modulation frequency (fmo) and its harmonics (fmo*n) are...

[0012] In addition, Patent Document 1 discloses the following technology: In a photometer (splitter) equipped with an array detector, the measurement time value is determined by high-speed scanning, which enables the synchronization of lighting sources that are discontinuous in time.

[0013] Existing technical documents

[0014] Patent documents

[0015] Patent Document 1: U.S. Patent Publication No. 2005-0103979 Summary of the Invention

[0016] The problem that the invention aims to solve

[0017] In conventional scintillation measurement devices, scintillation measurements are performed at a predetermined frequency resolution (fres), such as 1 Hz. As a result, the frequency spectrum data obtained through conventional measurements becomes a collection of discrete intensity data in terms of frequency resolution (fres).

[0018] However, because the measurable frequencies are discrete, when the frequency for which flicker measurement is desired is not an integer multiple of the frequency resolution (in the case of mismatch), the intensity disperses at the two points sandwiching the frequency of the object being measured, leading to measurement errors. In particular, the frequency of the vertical synchronization signal fluctuates individually for each display, making measurements at a pre-determined frequency resolution insufficient.

[0019] As a method to suppress this error, scintillation measurement can be performed under conditions that allow for fine frequency resolution. However, as will be described later, the frequency resolution is equivalent to the reciprocal of the measurement time, and this correspondence will prolong the measurement time.

[0020] Furthermore, Patent Document 1 does not describe scintillation measurement or the aforementioned issues related to scintillation measurement, so even if Patent Document 1 is consulted, the aforementioned issues cannot be resolved.

[0021] The present invention was made in view of the following technical background, and its object is to provide a flicker measuring device and a measuring method capable of measuring the flicker of a measuring object such as a display in a short time and with high accuracy.

[0022] Methods for solving problems

[0023] The above objectives are achieved through the following means.

[0024] (1) A scintillation measurement device, characterized in that it comprises: a detection component for detecting candidates of light intensity variation frequency of a measurement object; a frequency determination component for determining a light intensity variation frequency based on the candidates of light intensity variation frequency detected by the detection component; a resolution determination component for determining the frequency resolution of scintillation measurement based on the light intensity variation frequency determined by the frequency determination component; and a scintillation measurement component for performing scintillation measurement at the frequency resolution determined by the resolution determination component; wherein the resolution determination component determines the frequency resolution as an integer fraction of the light intensity variation frequency determined by the frequency determination component.

[0025] (2) As described in Scheme 1 above, the detection component obtains waveform data of light intensity variation through pre-measurement before scintillation measurement, obtains frequency spectrum data by performing Fourier transform on the waveform data, and detects candidates of light intensity variation frequency based on the frequency of the singular point that becomes the intensity of the adjacent frequency in the frequency spectrum data.

[0026] (3) In the scintillation measuring device described in Scheme 1 or Scheme 2 above, the frequency determining component determines the candidate with the smallest frequency as the light quantity change frequency from among the candidates of light quantity change frequency.

[0027] (4) The scintillation measuring device as described in Scheme 1 or Scheme 2 above includes: a selection component that allows a user to select one of the candidates for light intensity variation frequency detected by the detection component, and the frequency determination component determines the candidate selected by the user through the selection component as the light intensity variation frequency.

[0028] (5) The scintillation measuring device as described in Scheme 1 or Scheme 2 above includes: an input component for a user to input a light intensity variation frequency, wherein the frequency determining component determines the light intensity variation frequency as the candidate among the candidates of light intensity variation frequencies detected by the detection component that is closest to the light intensity variation frequency input by the input component.

[0029] (6) The scintillation measuring device as described in Scheme 2 above, wherein the detection component completes the frequency spectrum data by using the intensity of the frequency adjacent to the frequency of the singular point that is larger than the adjacent frequency, thereby detecting the candidate frequency of light quantity variation.

[0030] (7) As described in Scheme 1 above, the detection component obtains waveform data of light intensity variation through pre-measurement before scintillation measurement, and detects candidates of light intensity variation frequency by autocorrelation method on the waveform data.

[0031] (8) The scintillation measuring device as described in any one of the aforementioned schemes 1 to 7, wherein the frequency resolution is 1 Hz or higher.

[0032] (9) The scintillation measuring device according to any one of the above-mentioned schemes 1 to 8, comprising: a recording component that records the frequency resolution determined by the resolution determining component.

[0033] (10) A scintillation measurement method, characterized in that it comprises: a detection step in which a detection component detects candidates for the light intensity variation frequency of a measurement object; a frequency determination step in which the frequency determination component determines the light intensity variation frequency based on the candidates for the light intensity variation frequency detected in the detection step; a resolution determination step in which the resolution determination component determines the frequency resolution of the scintillation measurement based on the light intensity variation frequency determined by the frequency determination step; and a measurement step in which the scintillation measurement component performs scintillation measurement at the frequency resolution determined by the resolution determination step; wherein in the resolution determination step, one integer fraction of the light intensity variation frequency determined by the frequency determination step is determined as the frequency resolution.

[0034] (11) In the scintillation measurement method described in the aforementioned scheme 10, in the detection step, waveform data of light intensity variation is obtained by pre-measurement before scintillation measurement, and frequency spectrum data is obtained by performing Fourier transform processing on the waveform data. In the frequency spectrum data, candidates of light intensity variation frequency are detected based on the frequency of the singular point that becomes the intensity of the adjacent frequency.

[0035] (12) In the scintillation measurement method described in Scheme 10 or Scheme 11 above, in the frequency determination step, the candidate with the smallest frequency among the candidates of light quantity variation frequency is determined as the light quantity variation frequency.

[0036] (13) In the scintillation measurement method described in Scheme 10 or Scheme 11 above, in the frequency determination step, the candidate selected by the user through the selection component is determined as the light quantity variation frequency from the candidates of light quantity variation frequencies detected by the detection step.

[0037] (14) In the scintillation measurement method described in Scheme 10 or Scheme 11 above, in the frequency determination step, the candidate among the candidates of light quantity change frequency detected by the detection step that is closest to the light quantity change frequency input by the user through the input component is determined as the light quantity change frequency.

[0038] (15) In the scintillation measurement method described in Scheme 11 above, in the detection step, candidates for light intensity variation frequency are detected by using the intensity of the frequency adjacent to the frequency of the singular point that is larger than the adjacent frequency to complete the frequency spectrum data.

[0039] (16) In the scintillation measurement method described in the aforementioned scheme 10, in the detection step, waveform data of light intensity variation is obtained through pre-measurement before scintillation measurement, and candidates for light intensity variation frequency are detected by autocorrelation method on the waveform data.

[0040] (17) The scintillation measurement method of any one of the aforementioned schemes 10 to 16, wherein the frequency resolution is 1 Hz or higher.

[0041] (18) The scintillation measurement method according to any one of the above-mentioned schemes 10 to 17 includes a step of recording and saving the frequency resolution determined by the resolution determination step to the recording unit.

[0042] Invention Effects

[0043] According to the invention described in the aforementioned schemes (1) and (10), candidates for the light intensity variation frequency of the object to be measured are detected, and the light intensity variation frequency is determined based on the detected candidates. One-in-one fraction of the determined light intensity variation frequency is then determined as the frequency resolution. Thus, an appropriate frequency resolution can be determined based on the actual light intensity variation frequency of the object to be measured. Furthermore, since scintillation measurement is performed with the determined appropriate frequency resolution, high-precision scintillation measurement can be performed without error. Moreover, since the light intensity variation frequency is the actual light intensity variation frequency, there is no need to set the frequency resolution too finely, thus enabling high-precision scintillation measurement in a short time.

[0044] According to the invention described in the aforementioned schemes (2) and (11), waveform data of light quantity variation is obtained through pre-measurement before scintillation measurement. Frequency spectrum data is obtained by performing Fourier transform on the waveform data. In the frequency spectrum data, candidates for light quantity variation frequency are detected based on the frequency of the singular point with a greater intensity than the adjacent frequency. Therefore, it is possible to detect candidates corresponding to the actual light quantity variation frequency of the measured object, and thus determine the high-precision light quantity variation frequency.

[0045] According to the invention described in the aforementioned schemes (3) and (12), the candidate with the smallest frequency among the candidates of light intensity variation frequency is determined as the light intensity variation frequency, so that even for harmonics, the error can be minimized.

[0046] According to the invention described in the aforementioned schemes (4) and (13), the candidate selected by the user is determined as the light intensity variation frequency from among the candidates of detected light intensity variation frequency, thus enabling high-precision detection of the flicker of the frequency that the user is looking at.

[0047] According to the invention described in the aforementioned schemes (5) and (14), the candidate that is closest to the light intensity variation frequency input by the user among the detected light intensity variation frequency candidates is determined as the light intensity variation frequency, so that flickering near the frequency that the user is looking at can be detected with high precision.

[0048] According to the invention described in the aforementioned schemes (6) and (15), by using the intensity of the frequency adjacent to the frequency of the singular point that is stronger than the adjacent frequency to complete the frequency spectrum data, the candidate of the light intensity variation frequency is detected, and thus the light intensity variation frequency with high precision can be determined.

[0049] According to the invention described in the aforementioned schemes (7) and (16), waveform data of light intensity variation is obtained through pre-measurement before scintillation measurement, and candidates for the frequency of light intensity variation are detected by autocorrelation method of the waveform data, thus shortening the pre-measurement time.

[0050] According to the invention described in the aforementioned schemes (8) and (17), the measurement time during scintillation measurement can be shortened.

[0051] According to the invention described in the aforementioned schemes (9) and (18), the determined frequency resolution can be recorded and saved to the recording unit. Therefore, when scintillation measurement is required again, the processes of detecting candidates of light intensity variation frequency, determining light intensity variation frequency, and determining frequency resolution can be omitted, and the time required for scintillation measurement can be shortened. Attached Figure Description

[0052] Figure 1 This is a block diagram illustrating the functional structure of a scintillation measuring device according to an embodiment of the present invention.

[0053] Figure 2 This is a flowchart representing the detection of candidates for light intensity variation frequency and the process for determining the light intensity variation frequency.

[0054] Figure 3 This is a graph representing an example of spectral data as a result of spectral analysis of the obtained waveform data.

[0055] Figure 4 This is a graph showing a comparison of measurement accuracy when scintillation measurement is performed at the frequency resolution determined in the implementation method versus when scintillation measurement is performed at a pre-prepared frequency resolution as in the past.

[0056] Figure 5 This is a diagram showing a display screen where a candidate list of light intensity variation frequencies is displayed on the display unit, allowing the user to select one.

[0057] Figure 6It is a diagram showing the display screen when the user inputs the designed value of the frequency of light intensity variation.

[0058] Figure 7 This is a structural diagram illustrating other embodiments of the present invention.

[0059] Label Explanation

[0060] 1 Scintillation measuring device

[0061] 11 Light-receiving section

[0062] 13 Candidate Detection Department

[0063] 14 Frequency Determination Unit

[0064] 15 Resolution Determination Department

[0065] 16 Scintillation Measurement Department

[0066] 17 Display Section

[0067] 100 Measured Object

[0068] 200 personal computers. Detailed Implementation

[0069] The following describes embodiments of the present invention based on the accompanying drawings.

[0070] Figure 1 This is a block diagram illustrating the functional structure of a scintillation measuring device 1 according to an embodiment of the present invention.

[0071] like Figure 1 As shown, the scintillation measuring device 1 includes a light receiving unit 11, a data processing unit 12, a candidate detection unit 13, a frequency determination unit 14, a resolution determination unit 15, a scintillation measuring unit 16, and a display unit 17.

[0072] The light-receiving unit 11 receives light from the object being measured, such as a display, and is equipped with a light-receiving sensor. The data processing unit 12 performs prescribed processing, such as amplification, on the light-receiving data obtained by the light-receiving unit 11. The candidate detection unit 13 detects candidates for light intensity variation frequency based on the light-receiving data processed by the data processing unit 12, and the frequency determination unit 14 determines the light intensity variation frequency from the detected candidates.

[0073] The resolution determination unit 15 determines the frequency resolution based on the light quantity variation frequency determined by the frequency determination unit 14. The flicker measurement unit 16 measures flicker at the frequency resolution determined by the resolution determination unit 15, and the display unit 17 displays the flicker measurement results, etc.

[0074] Next, the operation of the scintillation measuring device 1 will be explained.

[0075] If the user places the flicker measuring device 1 in the measuring position and indicates the start of the measurement by pressing the measurement start button or the like displayed on the display unit 17, the light receiving unit 11 receives the measuring light from the object being measured 100. After the received light undergoes prescribed data processing such as amplification by the data processing unit 12, it is input to the candidate detection unit 13.

[0076] The candidate detection unit 13 detects candidates (hereinafter also referred to as candidate frequencies) of the light intensity variation frequency of the object to be measured 100, and the frequency determination unit 14 determines the light intensity variation frequency from the detected candidate frequencies.

[0077] Figure 2 The flowchart illustrates an example of candidate frequency detection and the determination process for the frequency of light intensity variation. In this embodiment, as an example of a candidate frequency detection method, a method is used to detect candidate frequencies based on waveform data of light intensity variation obtained through preliminary measurements. Frequencies above a certain threshold can also be used as candidate frequencies.

[0078] exist Figure 2 In the flowchart, if processing begins in step S01, light from the object to be measured 100 is received through a pre-measurement (predicted quantity), and waveform data of light intensity variation is obtained (step S02). Next, candidate frequencies are extracted (detected) (step S03). Specifically, spectral analysis is first performed on the obtained waveform data (step S31). To shorten the pre-measurement time, the frequency resolution can be roughly set in the spectral analysis during the pre-measurement.

[0079] Figure 3 This represents an example of spectral data presented as a result of spectral analysis. Figure 3 The example illustrates the case where the frequency resolution is set to 2Hz. Furthermore, in... Figure 3 In the example, 14Hz and 16Hz, 30Hz and 32Hz, 46Hz and 48Hz, and 60Hz and 62Hz of the spectral data are frequencies with greater intensity than the adjacent frequencies, i.e., singularities. It can be assumed that there are actual candidate frequencies with peak intensity near these singularities.

[0080] return Figure 2 The flowchart, in extracting Figure 3 After identifying the singularity as shown in the spectral data (step S32), the frequency is refined by performing a completion process using the intensity of the frequency adjacent to the frequency that became the singularity (step S33). There are no limitations on how the frequency is refined through completion; for example, it can be done by centroid detection.

[0081] By refining the frequency, the frequencies that actually have peak intensity are determined, and these frequencies are listed as candidate frequencies. The candidate frequencies include the fundamental frequency and its harmonics.

[0082] Next, the light intensity variation frequency is determined from the candidates that have become a list of light intensity variation frequencies (step S04). As an example of a specific determination method, the minimum frequency among the candidates is determined as the light intensity variation frequency (step S41), and the detection of candidate frequencies and the determination process of light intensity variation frequency are completed (step S05).

[0083] The resolution determination unit 15 determines the frequency resolution based on the light intensity variation frequency determined in this way. In this embodiment, the frequency resolution is determined as an integer fraction of the determined light intensity variation frequency. That is, it becomes the following formula:

[0084] Frequency resolution fres = frequency of light intensity variation / n (where n is an integer) ... Equation 1.

[0085] Based on the frequency resolution fres obtained from Equation 1, the sampling frequency and the number of data points (number of samples) are adjusted. For example, if the number of data points is fixed at 1024, the sampling frequency is adjusted. The frequency resolution fres can also be expressed using Equation 2 below.

[0086] Frequency resolution fres = sampling frequency / number of data points = 1 / measurement time ... Equation 2

[0087] According to Equation 2, if the frequency resolution is too fine, the measurement time will be longer. Therefore, in order to shorten the measurement time, the frequency resolution of the scintillation meter should preferably be set to 1 Hz or higher.

[0088] After determining the frequency resolution, the scintillation measurement unit 16 performs scintillation measurement (formal measurement) using the determined frequency resolution. The scintillation measurement can be performed either by the light receiving unit 11 receiving light from the object to be measured 100 again, or by using the light receiving data obtained during the preliminary measurement. The scintillation measurement results are displayed on the display unit 17.

[0089] In this embodiment, candidate frequencies (candidate frequencies) of light intensity variation of the object being measured are detected, and the light intensity variation frequency is determined from the detected candidate frequencies. The frequency resolution is then determined as an integer fraction of the determined light intensity variation frequency. Therefore, compared to conventional scintillation measurements performed with a pre-set frequency resolution, an appropriate frequency resolution can be determined based on the actual light intensity variation frequency of the object being measured, allowing for scintillation measurements to be performed with an appropriate frequency resolution and thus enabling error-free, high-precision scintillation measurements. Furthermore, since the light intensity variation frequency is the actual light intensity variation frequency, there is no need to set the frequency resolution too finely, enabling high-precision scintillation measurements in a short time.

[0090] Furthermore, in this embodiment, waveform data of light intensity variation is obtained through pre-measurement before scintillation measurement. Frequency spectrum data is obtained by performing Fourier transform on the waveform data. In the frequency spectrum data, candidate frequencies are detected based on the frequencies that are singular points with a greater intensity than adjacent frequencies. Therefore, it is possible to detect candidate frequencies that correspond to the actual light intensity variation frequency of the measured object, and thus determine the light intensity variation frequency with high precision.

[0091] Furthermore, by using the intensity of frequencies adjacent to the frequencies that become singularities with a higher intensity than the adjacent frequencies to complete the frequency spectrum data, candidate frequencies are detected, thus enabling the determination of highly accurate candidate frequencies. In addition, the candidate with the smallest frequency among the candidate frequencies is determined as the frequency of light intensity variation, thus minimizing the error even for harmonics.

[0092] Figure 4 This refers to a comparison of measurement accuracy when scintillation measurement is performed at the frequency resolution determined in the above embodiment versus when scintillation measurement is performed at a pre-prepared frequency resolution as in the conventional case.

[0093] Figure 4 The upper graph is a conventional example, showing the measurement performed at a pre-prepared frequency resolution of 1 Hz. The middle graph is a measurement performed at the frequency resolution determined in this embodiment. In this embodiment, the light intensity variation frequency of the measured object, 15.36 Hz (fres×n), and frequencies that are harmonic components at 2, 3, and 4 times that frequency were determined with high precision, thereby obtaining each intensity at an appropriate frequency resolution. In contrast, in the conventional example above, two peaks were measured at 15 Hz (f'×n) and 16 Hz (f'×n+1), and two peaks also appeared in the frequency domain of the harmonic components.

[0094] Figure 4The lower part of the figure shows the case where the two figures are combined. In the lower figure, the black dots represent the values ​​of this embodiment, and the □ represents the values ​​of conventional examples. It can be understood from this figure that errors occurred in the past; in contrast, these errors are suppressed in this embodiment, resulting in high measurement accuracy.

[0095] In the above embodiments, an example was shown where the smallest candidate frequency from a plurality of candidate frequencies was selected as the light intensity variation frequency; however, the method for determining the light intensity variation frequency is not limited to this. In particular, in cases where users such as display designers perform flicker measurements for verification, it is assumed that the user is aware of the light intensity variation frequency.

[0096] Therefore, as Figure 5 As shown, the list of detected candidate frequencies can also be displayed on display unit 17 along with messages such as "Please select a frequency," allowing the user to select the desired candidate. Figure 5 The example shows: four candidate frequencies are displayed, and the candidate frequency of 15.36Hz with an additional checkmark is selected. If one of the candidate frequencies is selected, the selected candidate frequency is determined as the light intensity variation frequency, and one integer fraction of it is determined as the frequency resolution.

[0097] In this way, by having the user select candidates and determining the frequency of the candidate selected by the user as the frequency of light intensity variation, it is possible to detect the flicker of the frequency that the user is looking at with high precision.

[0098] Alternatively, the result can be obtained as a result of spectral analysis in the preliminary measurement. Figure 3 The singularities shown in the spectral data are displayed as candidate frequencies, which the user can select. In this case, the frequency of light intensity variation closest to the selected singularity is determined as the frequency of light intensity variation that determines the frequency resolution. However, it is preferable if the displayed candidate list is a list of candidate frequencies refined by completion, which allows for the display of more accurate candidate frequencies.

[0099] Alternatively, it can be configured as a list that does not display candidate frequencies, but rather as... Figure 6 As shown, input field 17a is displayed along with a message such as "Please enter frequency," allowing the user to directly input the designed value for the light intensity variation frequency. In this case, the candidate frequency closest to the input frequency is selected as the light intensity variation frequency from among the candidate frequencies. Thus, even when the user inputs the light intensity variation frequency and the candidate frequency closest to the input light intensity variation frequency is selected as the light intensity variation frequency, it is also possible to detect flicker near the frequency the user is focusing on with high accuracy.

[0100] Furthermore, in the above embodiments, an example was described in which “waveform data of light intensity variation is obtained through pre-measurement before scintillation measurement, frequency spectrum data is obtained by performing Fourier transform processing on the obtained waveform data, and candidate frequencies are detected based on the frequencies that become singular points with greater intensity than adjacent frequencies in the frequency spectrum data”, but the detection of candidate frequencies can also be done by other methods.

[0101] For example, waveform data of light intensity variations can be obtained through preliminary measurements before scintillation measurement. The variation period (frequency) can then be directly determined by analyzing this waveform data. One example is the autocorrelation method for waveform data. This method extracts the periodicity of the data and detects candidate frequencies by calculating the correlation coefficient between the waveform data of light intensity variations and data separated from it by a time interval. Other methods include period extraction methods, which utilize feature points of the waveform data obtained through image analysis.

[0102] While analyzing waveform data to detect the frequency of light intensity variations can shorten the preparation measurement time, it increases the computational load.

[0103] The above describes one embodiment of the present invention, but the present invention is not limited to the above embodiment. For example, the candidate detection unit 13 can be configured using the function of a conventional scintillation measurement device that obtains frequency spectrum data by performing Fourier transform processing on waveform data of light intensity variation, or it can be configured by separately providing a dedicated circuit for detecting candidates.

[0104] In addition, it can also be like Figure 7 As shown, a scintillation measurement device is constructed using a personal computer 200. In this case, the personal computer 200 obtains the light received data of the object 100 to be measured from a conventional scintillation measurement device 300, thereby detecting candidate frequencies, determining the frequency of light intensity variation, and determining the frequency resolution.

[0105] Furthermore, the flicker measurement step does not need to be performed consecutively with the frequency detection step, frequency determination step, and resolution determination step. For example, the frequency detection step, frequency determination step, and resolution determination step can be performed first to obtain frequency resolution data, and then flicker measurement can be performed only using the obtained frequency resolution. Such a control flow is suitable for applications such as Vcom adjustment in a measurement object 100, where flicker measurement is performed continuously while changing the control conditions of the display.

[0106] Furthermore, the determined frequency resolution can be recorded and saved to the scintillation meter or an external recording device (such as a personal computer) connected to the scintillation meter. By recording and saving the frequency resolution, when scintillation measurement is needed again, the processes of detecting candidates for light intensity variation frequencies, determining light intensity variation frequencies, and determining frequency resolution can be omitted, thus shortening the time required for scintillation measurement.

[0107] Industrial availability

[0108] This invention can be used when measuring the flicker of objects such as displays.

Claims

1. A scintillation measuring apparatus comprising: a detection section that detects a candidate of a light amount variation frequency of a measurement target; a frequency determination section that determines a light amount variation frequency based on the candidate of the light amount variation frequency detected by the detection section; a resolution determination section that determines a frequency resolution of scintillation measurement based on the light amount variation frequency determined by the frequency determination section; a scintillation measurement section that performs scintillation measurement at the frequency resolution determined by the resolution determination section; and a display section that displays a result of the scintillation measurement, wherein the resolution determination section determines, as the frequency resolution, one divided by an integer of the light amount variation frequency determined by the frequency determination section.

2. The scintillation measuring apparatus according to claim 1, wherein the display section displays the candidate of the light amount variation frequency.

3. The scintillation measuring apparatus according to claim 1, wherein the detection section acquires waveform data of the light amount variation through a preliminary measurement before the scintillation measurement, acquires frequency spectrum data by performing Fourier transform processing on the waveform data, and detects the candidate of the light amount variation frequency based on a frequency that is a singular point in the frequency spectrum data, wherein the frequency that is the singular point has a larger intensity than adjacent frequencies.

4. The scintillation measuring apparatus according to claim 1, wherein the frequency determination section determines, as the light amount variation frequency, a candidate of the smallest frequency among the candidates of the light amount variation frequency.

5. The scintillation measuring apparatus according to claim 2, comprising: a selection section through which a user can select one of the candidates of the light amount variation frequency detected by the detection section, wherein the frequency determination section determines, as the light amount variation frequency, the candidate selected by the user through the selection section.

6. The scintillation measuring apparatus according to claim 1, comprising: an input section through which a user can input a light amount variation frequency, wherein the display section displays an input field, the frequency determination section determines, as the light amount variation frequency, a candidate that is closest to the light amount variation frequency input through the input section among the candidates of the light amount variation frequency detected by the detection section.

7. The scintillation measuring apparatus according to claim 3, wherein the detection section detects the candidate of the light amount variation frequency by interpolating intensities of frequencies adjacent to the frequency that is the singular point in the frequency spectrum data, wherein the frequency that is the singular point has a larger intensity than adjacent frequencies.

8. The scintillation measuring apparatus according to claim 1, wherein the detection section acquires waveform data of the light amount variation through a preliminary measurement before the scintillation measurement, and detects the candidate of the light amount variation frequency by performing an autocorrelation method on the waveform data.

9. The scintillation measuring apparatus according to any one of claims 1 to 8, wherein the frequency resolution is 1 Hz or more.

10. The scintillation measuring apparatus according to any one of claims 1 to 8, comprising: a recording section that records the frequency resolution determined by the resolution determination section.

11. A scintillation measuring method comprising: a detection step in which a detection section detects a candidate of a light amount variation frequency of a measurement target. ​ ​ ​ ​ ​ ​ ​ ​ ​ ​ ​ ​ ​ ​ ​ ​ ​ ​ ​ ​ ​ ​ ​ ​ ​ a frequency decision step of deciding a light amount variation frequency on the basis of a candidate of the light amount variation frequency detected in the detection step; a resolution decision step of deciding a frequency resolution of flicker measurement on the basis of the light amount variation frequency decided by the frequency decision step; a measurement step of performing flicker measurement at the frequency resolution decided by the resolution decision step; and a display step of displaying a result of the flicker measurement, in the resolution decision, 1 divided by an integer of the light amount variation frequency decided by the frequency decision step is decided as the frequency resolution.

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