Automatic neutral section passing host testing device for XGZD-C type motor train unit

Abstract

An automatic neutral section passing host testing device for an XGZD-C type motor train unit relates to the technical field of automatic neutral section passing host testing and comprises an upper computer, a control system, a single-chip microcomputer module, a pulse output board, a relay module and a programmable power supply, and the single-chip microcomputer module is connected with the upper computer, the control system, the control power supply, the pulse output board and the relay module. The pulse output board is connected with the relay module, the relay module is connected with the tested automatic passing phase-section host through the digital multimeter, the reading display module and the power supply module, the tested automatic passing phase-section host is connected with the single chip microcomputer module, the power supply module is connected with the tested automatic passing phase-section host, the digital multimeter is connected with the tested automatic passing phase-section host, and the digital multimeter is connected with the tested automatic passing phase-section host. The programmable power supply is connected with the control system and the single-chip microcomputer module. According to the invention, automatic testing of the automatic neutral section passing host of the motor train unit can be realized, and the testing efficiency and accuracy are improved.

Description

Technical Field

[0001] This invention relates to the field of automatic phase-crossing main engine testing technology, and in particular to an automatic phase-crossing main engine testing device for XGZD-C type EMU. Background Technology

[0002] On electrically powered railway lines, the national power system provides three-phase alternating current. To ensure a basic balance of current drawn from the three-phase AC power system by the overhead contact system, the contact system supplies power to the locomotive in segments and phases. This means that when the locomotive passes through a phase-splitting section, the driver needs to perform a complex phase-splitting operation. To meet the demands of rapid railway development and ensure the safe operation of electrified railways, the XGZD-C type automatic phase-splitting main unit for EMUs was developed, replacing the historical practice of manual operation for phase-splitting sections.

[0003] However, the automatic phase-crossing host of the XGZD-C type EMU needs to pass the performance test before it can leave the factory. The testing of the automatic phase-crossing host of the XGZD-C type EMU includes inspection of appearance, insulation performance, and functional testing. Currently, the testing is carried out manually by observing and connecting test circuits, which is inefficient and cannot meet the requirements. Summary of the Invention

[0004] In view of the above-mentioned shortcomings and deficiencies of the prior art, the present invention provides an automatic phase-crossing host test device for XGZD-C type EMU, which realizes automatic testing of the automatic phase-crossing host of EMU, and improves testing efficiency and accuracy.

[0005] To achieve the above objectives, the main technical solutions adopted by the present invention include: An automatic phase-crossing host test device for XGZD-C type EMU includes a host computer, a control system, a microcontroller module, a pulse output board, a relay module, and a programmable power supply. The host computer is connected to the control system. The microcontroller module is connected to the host computer, the control system, the control power supply, the pulse output board, and the relay module. The pulse output board is connected to the relay module. The relay module is connected to the automatic phase-crossing host under test via a digital multimeter, a reading and display module, and a power supply module. The automatic phase-crossing host under test is connected to the microcontroller module, the power supply module, and the digital multimeter. The programmable power supply is connected to the control system and the microcontroller module. The host computer controls the pulse output board to send test signals to the automatic phase-crossing host under test through the control system, and controls the relay module to switch to the corresponding test circuit, so that the signal of the automatic phase-crossing host under test is transmitted to the digital multimeter and the reading and display circuit. The host computer acquires the collected data through the control system, the microcontroller module, and the digital multimeter.

[0006] Furthermore, it also includes an isolation conversion module, which is located between the relay module and the digital multimeter and is connected to the power supply module.

[0007] Furthermore, it also includes a pulse generator, a power conversion switch, and a multimeter. The pulse generator is connected to the pulse output board, the control power supply, and the multimeter. The control power supply is connected to the multimeter through the power conversion module, and the multimeter is connected to the pulse generator and the relay module.

[0008] Furthermore, the microcontroller is connected to the control power supply via a power conversion switch.

[0009] Furthermore, the automatic phase-crossing host test device performs tests on the automatic phase-crossing host under test, including host receiver sensitivity test, host response time, host pulse width test, and drive capability test.

[0010] Furthermore, the host receiver sensitivity test involves inputting pulse voltages of different ranges to the automatic phase-crossing host of the tested EMU through the power supply and pulse output board, causing the phase-crossing host to output a forced signal, which is then controlled and locked by a microcontroller and recorded with a multimeter.

[0011] Furthermore, the host response time is determined by inputting a 5V voltage to the automatic phase-splitting host under test, causing the phase-splitting host to output a forced signal, and then the microcontroller calculates the time from the application of the 5V voltage to the generation of the forced signal.

[0012] Furthermore, the host pulse width test is performed by inputting a 5V voltage to the automatic phase-splitting host under test, causing the phase-splitting host to output a forced signal, a warning signal, and a recovery signal respectively, and then using a microcontroller to calculate the duration of the forced signal, warning signal, and recovery signal.

[0013] Furthermore, the host output drive capability test involves inputting a 5V voltage to the automatic phase-splitting host under test, causing the phase-splitting host to output a forced signal, a warning signal, and a recovery signal respectively. The microcontroller then calculates the current generated during the duration of the forced signal, warning signal, and recovery signal output.

[0014] Furthermore, the host computer issues instructions to the control system to store, display, and generate display reports of the test results from the microcontroller.

[0015] The beneficial effects of this invention are as follows: This invention enables fully automated intelligent testing of the main unit of the automatic phase-crossing control system for XGZD-C type EMUs. Through the control system's interface board, connections between devices are automatically switched, eliminating the need for repeated circuit rewiring, thus replacing manual testing, reducing manpower, and shortening testing time from 66.5 minutes to approximately 30 minutes per unit. The device controls the power supply through the control system, inputting pulse voltages of different ranges to terminals T1 to T4, causing the main unit to output a forced signal. Finally, the microcontroller locks the pulse voltage and records it with a multimeter, greatly improving the accuracy of the test data. All test data are automatically read, recorded, and stored by the system, replacing manual labor and further improving the accuracy of the test data. Attached Figure Description

[0016] Figure 1 This is a schematic diagram of the automatic phase-crossing host test device for the XGZD-C type EMU of the present invention; Figure 2 This is a schematic diagram of the test principle of the automatic phase-crossing host test device for XGZD-C type EMU of the present invention; Figure 3 This is a schematic diagram of the circuit principle of the STM32F microcontroller of the present invention; Figure 4 This is a schematic diagram of the pulse output circuit of the present invention; Figure 5 This is a schematic diagram illustrating the working principle of the relay group of the present invention. Detailed Implementation

[0017] To better explain and facilitate understanding of the present invention, the present invention will be described in detail below with reference to the accompanying drawings and specific embodiments.

[0018] like Figure 1-5As shown, this invention provides an automatic phase-crossing host test device for XGZD-C type EMU trains, including a host computer, a control system, a microcontroller module, a pulse output board, a relay module, and a programmable power supply. The host computer is connected to the control system, and the microcontroller module is connected to the host computer, the control system, the control power supply, the pulse output board, and the relay module. Specifically, the control system is located in the slave computer, which executes commands from the host computer. The host computer issues instructions and records, displays, and generates test reports from the collected data. The microcontroller can be an STM32F. The host computer is directly connected to the USART1 / USB pin of the STM32F microcontroller via a serial / USB cable to achieve data interaction. The power pin of the STM32F microcontroller is connected to the power supply module through a display module, a digital multimeter, and an isolation conversion module. The pulse output board is connected to the relay module. The relay module is connected to the automatic phase-crossing host under test via a digital multimeter, a reading and display module, and a power supply module. The automatic phase-crossing host under test is connected to a microcontroller module, the power supply module, and the digital multimeter. The programmable power supply is connected to the control system and the microcontroller module. The host computer controls the pulse output board to send test signals to the automatic phase-crossing host under test through the control system, and controls the relay module to switch to the corresponding test circuit, so that the signal from the automatic phase-crossing host under test is transmitted to the digital multimeter and the reading and display circuit. The host computer acquires the collected data through the control system, the microcontroller module, and the digital multimeter.

[0019] It also includes an isolation conversion module, which is positioned between the relay module and the digital multimeter. This module isolates the voltage and current data collected by the digital multimeter to prevent interference before transmitting it to the power supply module and subsequent circuits. Simultaneously, it isolates and converts control signals from the power supply module before transmitting them to the display module, ensuring the stability and safety of signal transmission. The isolation conversion module is connected to the power supply module.

[0020] To prevent the automatic phase-splitting host under test from receiving excessive voltage and current, which could damage it, the testing device of this invention also includes a pulse generator, a power conversion switch, and a multimeter. The pulse generator is connected to the pulse output board, the control power supply, and the multimeter. The control power supply is connected to the multimeter via a power conversion module, and the multimeter is connected to the pulse generator and a relay module. The microcontroller is connected to the control power supply via the power conversion switch. By setting the pulse generator, the voltage and current are divided, ensuring the safety of the automatic phase-splitting host under test during the testing process.

[0021] The testing process is as follows: 1. Preparation stage The host computer sends system initialization commands to the control system, enabling the control system, control power supply, and components such as the pulse output board, relay module, reading and display module, and digital multimeter to perform self-tests and parameter resets via the microcontroller.

[0022] 2. Test parameter configuration The host computer issues pulse parameter commands, and the control system and microcontroller set parameters such as pulse frequency, amplitude, and duration of the pulse output board.

[0023] The host computer sends relay logic commands to control the system and configure the on / off state of the relay module through the microcontroller, ensuring that the signal path of the host under test is correct.

[0024] The host computer issues multimeter parameter commands, and the control system and microcontroller set the measurement range, sampling frequency, etc. of the digital multimeter to prepare for data acquisition.

[0025] 3. Start the test The host computer sends a test start command, and the control system, through the microcontroller, issues a "output pulse" command to the pulse output board. The pulse output board then sends a test signal to the automatic phase-splitting host under test via a relay connection circuit. Simultaneously, the control system, through the microcontroller, controls the relay module to switch to the corresponding test circuit, allowing the signal from the host under test to be transmitted to the reading and display circuit.

[0026] 4. Data Collection and Feedback The host computer issues a data acquisition command, and the control system triggers a digital multimeter through a microcontroller to obtain the response data (such as voltage, current, etc.) of the automatic phase-splitter under test from the reading and display circuit.

[0027] The digital multimeter collects data and transmits it back to the control system via a microcontroller. The control system then uploads the data to the host computer for display and analysis.

[0028] 5. End and Conclusion of the Test The host computer sends a test stop command, and the control system uses the microcontroller to stop the pulse output board from outputting pulses, and the relay module returns to its initial state.

[0029] The host computer issues a power-off command, and the control system controls the power supply to cut off the power supply to the test equipment, completing the entire process.

[0030] The test items include: host receiver sensitivity test, host response time, host pulse width test, and drive capability test. The test details are as follows: The receiver sensitivity test of the host under test is divided into high threshold and low threshold. Different ranges of pulse voltage are continuously input to the T1 ~ T4 terminals of the automatic phase-crossing host of the EMU under test through the power supply and pulse output board, so that the phase-crossing host outputs a forced signal. Finally, the pulse voltage is locked by the microcontroller and recorded by a multimeter.

[0031] The host response time is determined by inputting a 5V voltage to the T1~T4 terminals of the automatic phase-splitting host under test, causing the phase-splitting host to output a forced signal, and then the microcontroller calculates the time from the application of the 5V voltage to the generation of the forced signal.

[0032] The host pulse width test is performed by inputting a 5V voltage to the T1 terminal of the automatic phase-splitting host under test, causing the phase-splitting host to output a forced signal, a warning signal, and a recovery signal respectively. Then, the microcontroller calculates the duration of the forced signal, the warning signal, and the recovery signal.

[0033] The host output drive capability test measures the current generated during the duration of the forced signal / preview signal / recovery signal output in the host pulse width test, which is recorded using a multimeter; all the above test data are finally transmitted to the computer for storage via communication.

[0034] The host computer stores, displays, and generates test reports on the microcontroller's test results.

[0035] Although embodiments of the present invention have been shown and described above, it is understood that the above embodiments are exemplary and should not be construed as limiting the present invention. Any modifications, alterations, substitutions, and variations made by those skilled in the art to the above embodiments are within the scope of the present invention.

Claims

1. An XGZD-C type motor train unit automatic neutral section crossing host computer testing device, characterized in that, The application relates to an automatic over-phase host computer testing device, which comprises a host computer, a control system, a single-chip microcomputer module, a pulse output board, a relay module, a program-controlled power supply, the host computer is connected with the control system, the single-chip microcomputer module is connected with the host computer, the control system, the control power supply, the pulse output board and the relay module, the pulse output board is connected with the relay module, the relay module is connected with a digital multimeter, a reading display module and a power module, the digital multimeter is connected with the automatic over-phase host computer, the power module is connected with the automatic over-phase host computer, the program-controlled power supply is connected with the control system and the single-chip microcomputer module; the host computer controls the pulse output board to send a test signal to the automatic over-phase host computer through the control system, and controls the relay module to switch to a corresponding test loop, so that the signal of the automatic over-phase host computer is transmitted to the digital multimeter and a reading display circuit; the host computer obtains the collected data through the control system, the single-chip microcomputer module and the digital multimeter.

2. The XGZD-C type motor train unit automatic neutral section crossing main machine test device according to claim 1, characterized in that: The application further comprises an isolation conversion module, which is arranged between the relay module and the digital multimeter and is connected with the power module.

3. The XGZD-C type motor train unit automatic neutral section crossing main machine test device according to claim 1, characterized in that: The application further comprises a pulse host computer, a power conversion switch and a multimeter, the pulse host computer is connected with the pulse output board, the control power supply and the multimeter, the control power supply is connected with the multimeter through the power conversion module, and the multimeter is connected with the pulse host computer and the relay module.

4. The XGZD-C type motor train unit automatic neutral section crossing main machine test device according to claim 3, characterized in that: The single-chip microcomputer is connected with the control power supply through the power conversion switch.

5. The XGZD-C type motor train unit automatic neutral section crossing main machine test device according to claim 1, characterized in that: The automatic over-phase host computer testing device tests the automatic over-phase host computer in the following aspects: host computer receiving sensitivity, host computer response time, host computer pulse width and driving capacity.

6. The XGZD-C type motor train unit automatic neutral section passing host computer testing device according to claim 5, characterized in that: The host computer receiving sensitivity test is that different range pulse voltages are input to the automatic over-phase host computer through the power supply and the pulse output board, the over-phase host computer outputs a forced signal, the pulse voltage is locked through the single-chip microcomputer, and the multimeter is used for recording.

7. The XGZD-C type motor train unit automatic neutral section passing main machine test device according to claim 5, characterized in that: The host computer response time is that 5V voltage is input to the automatic over-phase host computer, the over-phase host computer outputs a forced signal, and the time from the application of the 5V voltage to the generation of the forced signal is calculated through the single-chip microcomputer.

8. The XGZD-C type motor train unit automatic neutral section passing host computer testing device according to claim 5, characterized in that: The host computer pulse width test is that 5V voltage is input to the automatic over-phase host computer, the over-phase host computer outputs a forced signal, a warning signal and a recovery signal respectively, and the duration of the forced signal, the warning signal and the recovery signal is calculated through the single-chip microcomputer.

9. The XGZD-C type motor train unit automatic neutral section passing host computer testing device according to claim 5, characterized in that: The host computer output driving capacity test is that 5V voltage is input to the automatic over-phase host computer, the over-phase host computer outputs a forced signal, a warning signal and a recovery signal respectively, the current generated during the output of the forced signal, the warning signal and the recovery signal is calculated through the single-chip microcomputer.

10. The XGZD-C type motor train unit automatic neutral section passing host computer testing device according to claim 1, characterized in that: The host computer issues instructions to the control system, and the test results of the single-chip microcomputer are stored, displayed and reported.

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