On-line detection device and detection method for layering thickness and defects of copper-aluminum composite board

Abstract

The invention discloses a device and a method for online detection of layering thickness and defects of a copper-aluminum composite board, and the device comprises a plurality of groups of X-ray tubes, a detector array and a data processing system, and the X-ray tubes and the detector array are electrically connected with the data processing system; the X-ray tubes and the detector arrays are arranged on the two sides of the copper-aluminum composite board at different angles, X-ray penetration detection is conducted on the copper-aluminum composite board, and the radiation intensity, received by the detector arrays, penetrating through the copper-aluminum composite board is measured; according to the radiation intensity received by the plurality of detector arrays, listing an attenuation equation set of X-rays penetrating through the copper-aluminum composite board, solving the attenuation equation set, calculating the thickness of a copper plate, an interface layer and an aluminum plate of a certain section in the copper-aluminum composite board, and completing scanning detection of the whole board surface of the aluminum composite board along with movement of the copper-aluminum composite board. Therefore, the technical problem that the thicknesses of the copper plate, the interface layer and the aluminum plate in the copper-aluminum composite board cannot be accurately detected on line at the same time in the existing nondestructive detection technology is solved.

Description

Technical Field

[0001] This invention relates to the field of online testing equipment for copper-aluminum composite sheet production, specifically to an online detection device and method for the layer thickness and defects of copper-aluminum composite sheets. Background Technology

[0002] Copper-aluminum composite plates are a new type of material that combines copper plates and aluminum through a specific process. This material combines some of the characteristics of copper and aluminum, such as good conductivity, low cost, and low specific gravity. In industrial applications, it can replace pure copper in the manufacture of components such as busbars, parallel channel clamps, heat dissipation substrates, and composite gaskets. It is widely used in electric vehicles, energy storage power stations, photovoltaic power generation, substations, and other fields to reduce costs and weight. Especially in the case of my country's lack of copper ore resources, the use of copper-aluminum composite plates to replace pure copper plates has important strategic significance.

[0003] However, during the composite manufacturing process, copper-aluminum composite sheets are prone to uneven material thickness, uneven thickness of the interface layer (also known as the bonding layer), and interface layer defects such as pores, inclusions, and cracks. Among these, interface layer defects such as pores, inclusions, and cracks are mainly found in the interface layer. These defects can easily cause serious quality problems in copper-aluminum composite sheets, such as local stress concentration, reduced bonding strength, reduced material strength, and reduced electrical or thermal conductivity.

[0004] Currently, the detection of the aforementioned defects in copper-aluminum composite panels can only be performed after product manufacturing is completed. This can be done through destructive testing of the cross-section of the copper-aluminum composite panels by laboratory sampling. This allows for accurate measurement of the thickness of the copper plate, interface layer, and aluminum plate in the copper-aluminum composite panel, as well as the presence of interface layer defects such as porosity, inclusions, and cracks. Furthermore, the probability of product quality defects can be predicted based on the sampling test results. However, because the above testing method is destructive sampling testing, it cannot be applied to the production line for dynamic monitoring of the product manufacturing process. At the same time, it cannot completely avoid the presence of defects in the manufactured products, making the products unsuitable for applications with high reliability requirements. Consequently, this affects the market competitiveness of copper-aluminum composite panels and the economic benefits of enterprises.

[0005] To address the aforementioned issues, some enterprises and universities are currently researching online non-destructive testing (NDT) technology for copper-aluminum composite panels. National invention patent application number 202510446740.6 discloses a NDT device for internal defects in copper-aluminum composite panels. This device utilizes X-ray principles to irradiate the copper-aluminum composite panel, reflecting internal density differences through X-ray imaging. An algorithm automatically identifies internal defects. Since X-rays penetrate the panel without causing any damage, this non-contact testing method solves the problem of product damage during inspection, enabling online testing. However, this invention does not address the issue of detecting the thickness of delamination within the copper-aluminum composite panel.

[0006] In the article "Research on Laser Ultrasonic Testing Method for Composite Quality of Metal Laminates," Ji Baoping confirmed the effectiveness of ultrasonic body waves and guided waves in detecting delamination in copper-aluminum laminates by studying the propagation law of ultrasonic body waves and Lamb waves induced by the thermoelastic mechanism of pulsed lasers. However, the article did not explain whether the above methods are effective for detecting the thickness of delamination in copper-aluminum laminates. In addition, the author also studied the measurement of the thickness of copper and aluminum layers in copper-aluminum laminates using the longitudinal wave pulse reflection method and the pulse projection method. Based on experimental data and corresponding thickness calculation formulas, the calculated thickness of copper layer, aluminum layer, and total thickness of the experimental sample were basically consistent with the true values. However, the article also did not explain whether the above methods are effective for calculating the thickness of the interface layer in copper-aluminum laminates.

[0007] Based on the above, current online non-destructive testing of copper-aluminum composite panels can only qualitatively determine internal defects and detect the thickness of copper and aluminum plates using X-rays and pulsed lasers. It is not yet possible to accurately detect the thickness of copper, interface layer, and aluminum plates simultaneously in copper-aluminum composite panels. Therefore, this is a technical problem that urgently needs to be solved in the copper-aluminum composite panel processing industry. Summary of the Invention

[0008] To overcome the shortcomings of the prior art, this invention discloses an online detection device and method for the layer thickness and defects of copper-aluminum composite plates, which solves the technical problem that existing non-destructive testing technologies cannot simultaneously and accurately detect the thickness of copper plates, interface layers, and aluminum plates in copper-aluminum composite plates during the production process.

[0009] To achieve the aforementioned objective, the present invention employs the following technical solution: an online detection device for the layer thickness and defects of copper-aluminum composite plates, comprising several sets of X-ray tubes, detector arrays, and a data processing system; several X-ray tubes with different wavelengths are arranged on one side of the copper-aluminum composite plate, and corresponding several detector arrays are arranged on the other side of the copper-aluminum composite plate; the lines connecting each set of X-ray tubes and detector arrays have unequal angles with the direction of movement of the copper-aluminum composite plate, and the lines connecting several sets of X-ray tubes and detector arrays intersect at the same point in the thickness direction of the copper-aluminum composite plate; the X-ray tubes, detector arrays, and data processing system are electrically connected.

[0010] Furthermore, among the several sets of X-ray tube and detector arrays, the line connecting one set of X-ray tube and detector arrays is perpendicular to the direction of movement of the copper-aluminum composite plate, and the included angle between the lines connecting two adjacent sets of X-ray tube and detector arrays is between 1.0° and 10.0°.

[0011] Furthermore, it also includes a thickness measuring device, which is located at the front end of several sets of X-ray tubes and detector arrays; the thickness measuring device is electrically connected to the data processing system.

[0012] Furthermore, the thickness measuring device can be either contact or non-contact.

[0013] Furthermore, the X-ray beam emitted from the X-ray tube is fan-shaped; the detector array is a linear array or an arc-shaped linear array.

[0014] The detection method of the online detection device for delamination thickness and defects of copper-aluminum composite plates involves the following steps: During detection, the copper-aluminum composite plate passes through several sets of X-ray tubes and detector arrays at a set speed; X-rays emitted from the X-ray tubes penetrate the copper-aluminum composite plate at different incident angles; some of the X-rays are absorbed as they penetrate the plate, and the remaining X-rays are received by the corresponding detector array, measuring the intensity of the X-rays after penetration; the data processing system establishes a set of attenuation equations for X-ray penetration of the plate based on the measurement results, solves the equations, and calculates the thickness of the copper plate, interface layer, and aluminum plate at a certain cross-section; as the plate passes through the X-ray tubes and detector arrays at the set speed, the delamination thickness of the plate is scanned and detected, and the results are converted into a thickness distribution map of the copper plate, interface layer, and aluminum plate.

[0015] Furthermore, the specific form of the attenuation equations for X-ray penetration of copper-aluminum composite plates is as follows:

[0016] (1)

[0017] (2)

[0018] (3)

[0019] In formula (1): The radiation intensity of the X-ray tube in the first group of X-ray tubes and detector arrays; The intensity of X-rays received by a certain detector in the detector array of the first group of X-ray tubes and detector arrays; is the attenuation coefficient of the copper plate in the copper-aluminum composite material for X-rays; This represents the actual thickness of the copper plate corresponding to the measurement point on the copper-aluminum composite plate. is the attenuation coefficient of X-rays in the interface layer of the copper-aluminum composite plate; This represents the actual thickness of the interface layer corresponding to the measurement point on the copper-aluminum composite plate. is the attenuation coefficient of the aluminum plate in the copper-aluminum composite material for X-rays; This represents the actual thickness of the aluminum plate corresponding to the measurement point on the copper-aluminum composite sheet.

[0020] In formula (2): The radiation intensity of the X-ray tube in the second group of X-ray tubes and detector arrays; The intensity of X-rays received by a certain detector in the detector array of the second group of X-ray tubes and detector arrays; , , These are the thicknesses of the copper plate, interface layer, and aluminum plate in the copper-aluminum composite material, respectively, penetrated by X-rays in the second group of X-ray tubes and detector arrays. These thicknesses are related to the angle between the line connecting the second group of X-ray tubes and detector arrays and the copper-aluminum composite material, as well as the actual thicknesses of the copper plate, interface layer, and aluminum plate corresponding to the measurement points on the copper-aluminum composite material. The attenuation coefficient of copper plate 1.1 in copper-aluminum composite material 1 for X-rays; The attenuation coefficient of X-rays for the interface layer 1.2 in the copper-aluminum composite plate 1; The attenuation coefficient of aluminum plate 1.3 in copper-aluminum composite material 1 for X-rays;

[0021] In formula (n): Let be the radiation intensity of the X-ray tube in the nth group of X-ray tubes and detector arrays; Let X be the intensity of X-rays received by a certain detector in the detector array of the nth X-ray tube and detector array group. , , These represent the thicknesses of the copper plate, interface layer, and aluminum plate in the copper-aluminum composite material, respectively, penetrated by X-rays in the nth group of X-ray tubes and detector arrays. These thicknesses are related to the angle between the line connecting the nth group of X-ray tubes and detector arrays and the copper-aluminum composite material, as well as the actual thicknesses of the copper plate, interface layer, and aluminum plate corresponding to the measurement points on the copper-aluminum composite material. The attenuation coefficient of copper plate 1.1 in copper-aluminum composite material 1 for X-rays; The attenuation coefficient of X-rays for the interface layer 1.2 in the copper-aluminum composite plate 1; The attenuation coefficient of aluminum plate 1.3 in copper-aluminum composite material 1 for X-rays.

[0022] Preferably, the attenuation equations for X-ray penetration of the copper-aluminum composite plate also include an equation for calculating the thickness of the copper-aluminum composite plate, the specific form of which is as follows:

[0023]

[0024] in: This refers to the total thickness of the copper-aluminum composite sheet. , , This refers to the actual thickness of the copper plate, interface layer, and aluminum plate in the copper-aluminum composite sheet. The thickness of the interface layer defect.

[0025] Furthermore, the X-ray intensity measured by any detector array after penetrating the copper-aluminum composite plate is converted into a grayscale image to obtain a perspective view of the defects in the copper-aluminum composite plate. The thickness distribution map of the copper plate, interface layer, and aluminum plate of the copper-aluminum composite plate is superimposed on the perspective view of the defects. If the abnormal distribution area of ​​the thickness distribution map of the copper plate, interface layer, and aluminum plate of the copper-aluminum composite plate coincides with the abnormal distribution area of ​​the perspective view of the defects, it is determined that there are abnormal defects in the interface layer of the copper-aluminum composite plate.

[0026] Preferably, the X-ray intensity measured by the detector array, which is perpendicular to the line connecting the X-ray tube and the detector array, after penetrating the copper-aluminum composite plate, is converted into a grayscale image to obtain a perspective view of the defects in the copper-aluminum composite plate. The thickness distribution map of the copper plate, interface layer, and aluminum plate of the copper-aluminum composite plate is superimposed on the perspective view of the defects. If the abnormal distribution area of ​​the thickness distribution map of the copper plate, interface layer, and aluminum plate of the copper-aluminum composite plate coincides with the abnormal distribution area of ​​the perspective view of the defects, it is determined that there are abnormal defects in the interface layer of the copper-aluminum composite plate.

[0027] Due to the adoption of the technical solution described above, the present invention has the following beneficial effects: The copper-aluminum composite plate layer thickness and defect detection device and method disclosed in the present invention, by setting several sets of X-ray tubes and detector arrays at different angles on both sides of the copper-aluminum composite plate, performs X-ray penetration detection on the copper-aluminum composite plate, and measures the radiation intensity received by the detector arrays penetrating the copper-aluminum composite plate; based on the radiation intensity received by the detector arrays, a set of attenuation equations for X-ray penetration of the copper-aluminum composite plate is listed, the attenuation equations are solved, and the thickness of the copper plate, interface layer and aluminum plate at a certain cross section of the copper-aluminum composite plate is calculated, thereby solving the technical problem that existing non-destructive testing technology cannot simultaneously and accurately detect the thickness and defects of the copper plate, interface layer, and aluminum plate in the copper-aluminum composite plate online. Attached Figure Description

[0028] Figure 1 A schematic diagram of a system for detecting the layer thickness and defects of copper-aluminum composite panels.

[0029] Figure 2 This is a schematic diagram of the principle of the copper-aluminum composite plate layer thickness and defect detection device in Example 1.

[0030] Figure 3 A schematic diagram of a linear detector array arrangement;

[0031] Figure 4 A schematic diagram of the arrangement structure of an arc-shaped linear detector array;

[0032] Figure 5 This is a schematic diagram of the principle of the copper-aluminum composite plate layer thickness and defect detection device in Example 2;

[0033] Figure 6 This is a schematic diagram of the principle of the copper-aluminum composite plate layer thickness and defect detection device in Example 3;

[0034] Figure 7 Schematic diagram of the impact of the intersection of the X-ray tube and detector array lines on detection accuracy. Figure 1 ;

[0035] Figure 8 Schematic diagram of the impact of the intersection of the X-ray tube and detector array lines on detection accuracy. Figure 2 .

[0036] In the figure: 1. Copper-aluminum composite plate; 1.1. Copper plate; 1.2. Interface layer; 1.3. Aluminum plate; 2. Data processing system; 3. X-ray tube A; 4. Detector array A; 5. X-ray tube B; 6. Detector array B; 7. X-ray tube C; 8. Detector array C; 9. Displacement sensor; 10. Clamping roller; 11. Protective cover; 12. Lifting roller; 13. Interface layer defect. Detailed Implementation

[0037] The present invention will be explained in detail through the following embodiments. The purpose of disclosing the present invention is to protect all technical improvements within the scope of the present invention.

[0038] Example 1, see appendix to the instruction manual. Figure 1 , 2 :

[0039] A device for detecting the layer thickness and defects of copper-aluminum composite plates is disclosed for use during the production of copper-aluminum composite plates 1. It is used to detect online the thickness of the copper plate 1.1, interface layer 1.2, and aluminum plate 1.3, as well as interface layer defects such as porosity, inclusions, and cracks in the interface layer 1.2. The device includes three sets of X-ray tubes, a detector array, and a data processing system 2. Three X-ray tubes, A3, B5, and C7, are fixedly installed on the upper side of the copper-aluminum composite plate 1. Each X-ray tube has a different operating voltage; for example, the operating voltage of X-ray tube A3 is set to 40KV. The operating voltage of X-ray tube B5 is set to 80KV. The operating voltage of X-ray tube C7 is set to 150KV. To adjust the X-rays emitted from the three X-ray tubes to have different penetrating abilities, corresponding detector arrays A4, B6, and C8 are fixedly installed on the underside of the copper-aluminum composite plate 1. Each of detector arrays A4, B6, and C8 contains 100 detectors. Viewed from the side of the copper-aluminum composite plate 1, the line connecting the first group of X-ray tubes A3 and detector array A4 is perpendicular to the direction of movement of the copper-aluminum composite plate 1 (i.e., perpendicular to the surface of the copper-aluminum composite plate 1), and the angle between the line connecting the X-ray tubes A3 and detector array A4 and the surface of the copper-aluminum composite plate 1 is... (90°); the line connecting the second X-ray tube B5 and the detector array B6 is at an angle to the direction of movement of the copper-aluminum composite plate 1. (That is, the angle between the line connecting X-ray tube B5 and detector array B6 and the surface of copper-aluminum composite plate 1). Take 85°; the line connecting the third X-ray tube C7 and the detector array C8 forms an angle with the moving direction of the copper-aluminum composite plate 1. (That is, the angle between the line connecting X-ray tube B5 and detector array B6 and the surface of copper-aluminum composite plate 1). The angle is set to 75°. In this embodiment, the maximum angle between the line connecting the X-ray tube and detector array groups and the moving direction of the copper-aluminum composite plate 1 is set to 75°. This is to prevent the angle between the lines connecting the first and third X-ray tube and detector array groups from differing too much (in this embodiment, the angle between the lines connecting the first and third X-ray tube and detector array groups is 15°), which would result in an excessively large detection width and thus excessive detection error. When setting up the three X-ray tube and detector array groups, the lines connecting the X-ray tubes and detector arrays intersect at a single point, and this point should be located as close as possible to the interface layer 1.2 in the copper-aluminum composite plate 1. All three X-ray tube and detector array groups are electrically connected to the data processing system 2. See the appendix to the instruction manual. Figure 3 , 4 The X-ray tube used in this invention emits a fan-shaped X-ray beam that covers the width of the copper-aluminum composite plate 1. During the detection process, as the copper-aluminum composite plate 1 moves, the fan-shaped X-ray beam scans the plate, allowing for full-width detection. The detector array can be a linear array, which has the advantage of simple structure, or an arc-shaped linear array, ensuring that each detector in the array is at the same distance from the X-ray tube. This guarantees the uniformity of X-ray intensity received by each detector before penetrating the copper-aluminum composite plate 1, simplifying the data processing complexity of the data processing system 2. A protective cover 11 is fixedly installed on the outside of the copper-aluminum composite plate layer thickness and defect detection device to prevent X-rays from escaping into the external space and causing radiation hazards to nearby workers.

[0040] In this embodiment, the detection of the copper-aluminum composite plate layer thickness and defect online detection device is divided into layer thickness scanning detection and interface layer abnormal defect scanning detection.

[0041] The layer thickness scanning detection method is as follows: A copper-aluminum composite plate 1 passes through three sets of X-ray tubes and detector arrays at a set velocity V. X-rays emitted from the three X-ray tubes penetrate the copper-aluminum composite plate 1 at incident angles of 90°, 85°, and 75°, respectively. A portion of the X-rays is absorbed upon penetration, and the remaining X-rays are received by the corresponding detector arrays. The intensity of the X-rays after penetration is measured. Taking a specific detector in the three detector arrays as an example, the data processing system 2 establishes a set of attenuation equations for X-ray penetration of the copper-aluminum composite plate 1 based on the measured radiation intensity. System 2 solves the attenuation equations to calculate the thickness of the copper plate 1.1, interface layer 1.2, and aluminum plate 1.3 at a certain point on a certain cross section of the copper-aluminum composite plate 1. All corresponding detectors in the three detector arrays establish and solve the equations in the same way to calculate the thickness of the copper plate 1.1, interface layer 1.2, and aluminum plate 1.3 at a certain cross section of the copper-aluminum composite plate 1. As the copper-aluminum composite plate 1 passes through the three sets of X-ray tubes and detector arrays at a set speed V, the layer thickness scanning detection of the entire surface of the copper-aluminum composite plate 1 is completed, and the thickness distribution map of the copper plate, interface layer, and aluminum plate of the copper-aluminum composite plate 1 is obtained.

[0042] The specific form of the attenuation equations for X-ray penetration of copper-aluminum composite plate 1 is as follows:

[0043] (1)

[0044] (2)

[0045] (3)

[0046] Formula 1 is the attenuation equation for the first group of X-ray tubes A3 and detector array A4. In this equation: The radiation intensity of X-ray tube 3; The intensity of X-rays received by a detector in detector array 4; The attenuation coefficient of copper plate 1.1 in copper-aluminum composite material 1 for X-rays; This represents the actual thickness of the copper plate 1.1 at the corresponding measurement point in the copper-aluminum composite sheet 1. The attenuation coefficient of X-rays for the interface layer 1.2 in the copper-aluminum composite plate 1; The actual thickness of the interface layer 1.2 at the corresponding measurement point in copper-aluminum composite plate 1; The attenuation coefficient of aluminum plate 1.3 in copper-aluminum composite material 1 for X-rays; This represents the actual thickness of the aluminum plate 1.3 at the corresponding measurement point in the copper-aluminum composite sheet 1.

[0047] Formula 2 is the attenuation equation for the second group of X-ray tubes B5 and detector array B6. In this equation: The radiation intensity of X-ray tube B5; The intensity of X-rays received by a detector in detector array B6; , , The X-rays emitted from X-ray tube B5, with an incident angle of 85°, penetrate the thicknesses of copper plate 1.1, interface layer 1.2, and aluminum plate 1.3 near the corresponding measurement points in copper-aluminum composite plate 1. These thicknesses are related to the 85° incident angle of the second set of X-rays and the actual thicknesses of copper plate 1.1, interface layer 1.2, and aluminum plate 1.3 at the corresponding measurement points in copper-aluminum composite plate 1. The specific conversion formula is as follows: , , ;in The attenuation coefficient of copper plate 1.1 in copper-aluminum composite material 1 for X-rays; The attenuation coefficient of X-rays for the interface layer 1.2 in the copper-aluminum composite plate 1; The attenuation coefficient of aluminum plate 1.3 in copper-aluminum composite plate 1 for X-rays; it should be noted that the above conversion formula is valid under the condition that, under normal circumstances, the thickness of copper plate 1.1, interface layer 1.2, and aluminum plate 1.3 in copper-aluminum composite plate 1 will not change significantly within a narrow measurement range.

[0048] Formula 3 is the attenuation equation for the third group of X-ray tubes C7 and detector array C8. In this equation: The radiation intensity of X-ray tube C7; The intensity of X-rays received by a detector in detector array C8; , , The X-rays emitted from X-ray tube C7, with an incident angle of 75°, penetrate the thicknesses of copper plate 1.1, interface layer 1.2, and aluminum plate 1.3 near the corresponding measurement points of copper-aluminum composite plate 1. These thicknesses are related to the 75° incident angle of the third set of X-rays and the actual thicknesses of copper plate 1.1, interface layer 1.2, and aluminum plate 1.3 near the measurement points of copper-aluminum composite plate 1. The specific conversion formula is as follows: , , ;in The attenuation coefficient of copper plate 1.1 in copper-aluminum composite material 1 for X-rays; The attenuation coefficient of X-rays for the interface layer 1.2 in the copper-aluminum composite plate 1; The attenuation coefficient of aluminum plate 1.3 in copper-aluminum composite plate 1 for X-rays; it should be noted that, similarly, the above conversion formula holds true under the condition that, under normal circumstances, the thickness of copper plate 1.1, interface layer 1.2, and aluminum plate 1.3 in copper-aluminum composite plate 1 will not change significantly within a narrow measurement range.

[0049] Substituting the above thickness conversion formula into the attenuation equations for X-ray penetration of copper-aluminum composite plate 1, we obtain the following transformation of the attenuation equations:

[0050] (4)

[0051] (5)

[0052] (6)

[0053] In the transformed system of equations, , , , , , , , , , , , , , , All are known (of which) , , This is determined by setting the operating parameters of the X-ray tube, among which , , Determined by the measurement results of the detector array, where , , , , , , , , (Calibration needs to be performed through actual measurements in the laboratory, the specific method of which will be detailed later). Data processing system 2 can calculate the actual thickness of copper plate 1.1, interface layer 1.2, and aluminum plate 1.3 at the detection point in copper-aluminum composite plate 1 by calculating the above-mentioned deformed equations. If there are actually 100 detectors in the detector array, then the above 100 equations need to be solved at any cross-section during the detection of copper-aluminum composite plate 1. As copper-aluminum composite plate 1 passes through three sets of X-ray tubes and detector arrays at a set speed V, the layer thickness scanning detection of the entire surface of copper-aluminum composite plate 1 is completed. Data processing system 2 repeats the above calculation process to obtain the thickness distribution map of copper plate 1.1, interface layer 1.2, and aluminum plate 1.3 of copper-aluminum composite plate 1, thereby completing the online detection of the layer thickness of copper-aluminum composite plate 1.

[0054] The method for detecting abnormal defects in the interface layer is as follows: The copper-aluminum composite plate 1 passes through the three sets of X-ray tubes and detector arrays at a set speed V. The X-ray intensity detected by detector array A4, detector array B6, or detector array C8 is converted into a grayscale image to obtain a perspective view of the defects in the copper-aluminum composite plate 1. The thickness distribution map of the copper plate, interface layer, and aluminum plate of the copper-aluminum composite plate 1 is superimposed on the perspective view of the defects. If the abnormal distribution area of ​​the thickness distribution map of the copper plate, interface layer, and aluminum plate of the copper-aluminum composite plate 1 coincides with the abnormal distribution area of ​​the perspective view of the defects, it is determined that there are abnormal defects in the interface layer 1.2 of the copper-aluminum composite plate 1.

[0055] Preferably, the copper-aluminum composite plate 1 passes through the three sets of X-ray tubes and the detector array at a set speed V. The X-ray intensity detected by the detector array A4 is converted into a grayscale image to obtain a defect perspective view of the copper-aluminum composite plate 1. The thickness distribution map of the copper plate, interface layer and aluminum plate of the copper-aluminum composite plate 1 is superimposed on the defect perspective view. If the abnormal distribution area of ​​the thickness distribution map of the copper plate, interface layer and aluminum plate of the copper-aluminum composite plate 1 coincides with the defect perspective view, it is determined that there is an abnormal defect in the interface layer 1.2 of the copper-aluminum composite plate 1.

[0056] The specific defect type needs to be judged based on experience. Combining the results with the online detection of the layer thickness of the copper plate 1.1, interface layer 1.2, and aluminum plate 1.3 of the copper-aluminum composite plate 1 can improve the accuracy of the specific defect type judgment.

[0057] Example 2, see appendix to the instruction manual. Figure 5 :

[0058] In this embodiment, the online detection device for layer thickness and defects of copper-aluminum composite sheet also includes a thickness measuring device for measuring the total thickness of copper-aluminum composite sheet 1. The thickness measuring device can be a displacement sensor 9 (contact measuring device) or a gamma-ray thickness gauge (non-contact measuring device). When the displacement sensor 9 is used, a clamping roller 10 should be provided on the side of the copper-aluminum composite sheet 1 opposite to the side where the displacement sensor 9 is located to support the pressure applied to the copper-aluminum composite sheet 1 by the displacement sensor 9 during measurement. The thickness measuring device is located at the front end of the three sets of X-ray tubes and detector arrays, and the distance between the thickness measuring device and the three sets of X-ray tubes and detector arrays is S. The thickness measuring device is electrically connected to the data processing system 2. When the thickness measuring device is provided in the online detection device for layer thickness and defects of copper-aluminum composite sheet, the attenuation equation set also includes the thickness calculation equation of copper-aluminum composite sheet 1, the specific form of which is as follows:

[0059]

[0060] in: The total thickness of the copper-aluminum composite sheet is 1. , , The actual thicknesses of copper plate 1.1, interface layer 1.2, and aluminum plate 1.3 in copper-aluminum composite sheet 1 are given. This refers to the thickness of interface layer defects 13, or the thickness of inclusions, etc.

[0061] The purpose of introducing the copper-aluminum composite plate thickness calculation equation into the attenuation equation set is to solve the problem in Example 1, where the sum of the thicknesses of copper plate 1.1, interface layer 1.2, and aluminum plate 1.3 calculated according to the attenuation equation set is less than the total thickness of the copper-aluminum composite plate when there are pore defects in the interface layer. The calculation results of Example 2 are closer to the actual situation when defects occur in the copper-aluminum composite plate.

[0062] After adding a thickness measuring device to the online detection system for layer thickness and defects in copper-aluminum composite sheets, the measurement results of the thickness measuring device lead the measurement results of the three sets of X-ray tubes and detector arrays. Therefore, time shift correction is required. The formula for calculating the time shift correction is as follows: , where S is the distance between the thickness measuring device and the intersection of the lines connecting the three sets of X-ray tubes and detector arrays; and V is the moving speed of the copper-aluminum composite plate 1.

[0063] Example 3, see appendix to the instruction manual. Figure 6 , 7 8:

[0064] In this embodiment, five sets of X-ray tube and detector arrays are arranged, four of which are symmetrically arranged about the line connecting the first set of X-ray tube and detector arrays. This aims to improve detection accuracy by introducing redundant measurement results. Additionally, in this embodiment, lifting rollers 12 are installed at the front and rear ends of each of the five sets of X-ray tube and detector arrays. The lifting rollers 12 hold the copper-aluminum composite plate 1, and their horizontal height is adjusted to change the plate's height. Before production, based on the theoretical design thickness of the copper plate 1.1, interface layer 1.2, and aluminum plate 1.3 within the copper-aluminum composite plate 1, the horizontal position of the plate is adjusted by the lifting rollers 12, ensuring that the intersection of the lines connecting the X-ray tubes and detector arrays is located within the interface layer 1.2 of the copper-aluminum composite plate 1. (See attached specification). Figure 7 , 8 The image vividly illustrates the detection status when the intersection of the line connecting the X-ray tube and the detector array is located in or deviates from the interface layer 1.2 in the copper-aluminum composite plate 1. Since interface layer defects such as pores, inclusions, and cracks usually appear in the interface layer 1.2, the detection accuracy can be improved when the intersection of the line connecting the X-ray tube and the detector array is located in the interface layer 1.2 in the copper-aluminum composite plate 1.

[0065] , , , , , , , , The specific calibration method for actual measurement in the laboratory is as follows:

[0066] S1: Prepare standard thickness samples of copper plates, aluminum plates, and copper-aluminum composite plates; the cross-section of the standard thickness sample of copper-aluminum composite plate must be mirror polished.

[0067] S2: The attenuation coefficients of standard thickness copper and aluminum plates were measured using X-ray tubes A3, B5, and C7, respectively, to obtain the attenuation coefficients. , , , , , ;

[0068] S3: Using SEM (Scanning Electron Microscopy) + EDS (Energy Dispersive Spectroscopy) line scanning, the cross-section of the copper-aluminum composite plate was scanned along the direction perpendicular to the interface layer with a step size of 0.05 μm to obtain the thicknesses of the copper plate (1.1), interface layer (1.2), and aluminum plate (1.3). , , and the total thickness of the copper-aluminum composite plate The thickness of the interface layer 1.2 is defined as the width of the metal A content in the range of 95%-5% (or the width of the metal B content in the range of 5%-95%).

[0069] S4: The attenuation of standard thickness samples of copper-aluminum composite panels was measured using X-ray tubes A3, B5, and C7, respectively. , , ;

[0070] S5: Substitute the results obtained in steps S2, S3, and S5 into formulas (1), (2), and (3) to calculate the attenuation coefficients of X-ray tubes A3, B5, and C7 at interface layer 1.2. , , .

[0071] The parts of this invention not described in detail are prior art.

[0072] Those skilled in the art should understand that variations can be implemented by combining existing technology and the above embodiments. Such variations do not affect the substantive content of this solution and will not be elaborated here.

[0073] It should be understood that this solution is not limited to the specific embodiments described above. Structures and construction methods not described in detail should be understood as being implemented using common methods in the art. Any person skilled in the art can make many possible variations and modifications to this solution, or modify it into equivalent embodiments, without departing from the scope of this solution, using the disclosed methods and techniques. This does not affect the substantive content of this solution. Therefore, any simple modifications, equivalent changes, and alterations made to the above embodiments based on the technical essence of this solution, without departing from its scope, still fall within the protection scope of this solution.

Claims

1. An online detection device for delamination thickness and defects in copper-aluminum composite panels, characterized by: The application relates to a copper-aluminum composite plate thickness scanning detection device, which comprises a plurality of groups of X-ray tubes, detector arrays and a data processing system; a plurality of X-ray tubes are arranged on one side of a copper-aluminum composite plate, and a plurality of corresponding detector arrays are arranged on the other side of the copper-aluminum composite plate; the connecting lines of each group of X-ray tubes and detector arrays are arranged at different angles with the moving direction of the copper-aluminum composite plate, and the connecting lines of the plurality of groups of X-ray tubes and detector arrays intersect at the same point in the thickness direction of the copper-aluminum composite plate; the X-ray tubes, the detector arrays and the data processing system are electrically connected.

2. The copper-aluminum composite sheet delamination thickness and defect detection device according to claim 1, characterized in that: In the plurality of groups of X-ray tubes and detector arrays, the connecting line of one group of X-ray tubes and detector arrays is perpendicular to the moving direction of the copper-aluminum composite plate, and the included angle between the connecting lines of two adjacent groups of X-ray tubes and detector arrays is between 1.0 and 10.0 degrees.

3. The copper-aluminum composite sheet delamination thickness and defect detection device according to claim 1, characterized in that: The application further comprises a thickness measuring device arranged at the front end of the plurality of groups of X-ray tubes and detector arrays. The thickness measuring device is electrically connected with the data processing system.

4. The copper-aluminum composite plate layered thickness and defect detection device according to claim 2, characterized in that: The thickness measuring device is a contact type or a non-contact type.

5. The copper-aluminum composite sheet delamination thickness and defect detection device according to claim 1, characterized in that: The X-ray beams emitted by the X-ray tubes are fan-shaped; and the detector arrays are linear arrays or arc-shaped linear arrays.

6. A detection method based on the layered thickness and defect detection device of the copper-aluminum composite sheet material of claim 1 or 3, characterized by: During detection, the copper-aluminum composite plate passes through the plurality of groups of X-ray tubes and detector arrays at a set speed; the X-rays emitted by the plurality of X-ray tubes penetrate the copper-aluminum composite plate at different incident angles; the X-rays are partially absorbed when penetrating the copper-aluminum composite plate, and the remaining X-rays are received by the corresponding detector arrays, so that the X-ray intensity after penetrating the copper-aluminum composite plate is measured; the data processing system establishes an attenuation equation group of the X-rays penetrating the copper-aluminum composite plate according to the measurement results, solves the attenuation equation group, and calculates the thickness of the copper plate, the interface layer and the aluminum plate at a certain cross section of the copper-aluminum composite plate; as the copper-aluminum composite plate passes through the plurality of groups of X-ray tubes and detector arrays at the set speed, the layered thickness scanning detection of the copper-aluminum composite plate is completed, and the detection results are converted into a copper plate, interface layer and aluminum plate thickness distribution diagram of the copper-aluminum composite plate.

7. The method of claim 6, wherein the method further comprises: determining the thickness of the copper-aluminum composite sheet based on the first and second signals; and determining the defect of the copper-aluminum composite sheet based on the third signal. The specific form of the attenuation equation group of the X-rays penetrating the copper-aluminum composite plate is as follows: （1） （2） （3） Wherein formula (1) in: is the radiation intensity of the X-ray tube in the first group of X-ray tubes, the detector array group; is the X-ray intensity received by a certain detector in the detector array in the first group of X-ray tubes, the detector array group; is the attenuation coefficient of the copper plate in the copper-aluminum composite plate to X-rays; is the actual thickness of the copper plate corresponding to the measurement point on the copper-aluminum composite plate; is the attenuation coefficient of the interface layer in the copper-aluminum composite plate to X-rays; is the actual thickness of the interface layer corresponding to the measurement point on the copper-aluminum composite plate; is the attenuation coefficient of the aluminum plate in the copper-aluminum composite plate to X-rays; is the actual thickness of the aluminum plate corresponding to the measurement point on the copper-aluminum composite plate; Wherein formula (2) in: is the radiation intensity of the X-ray tube in the second group of X-ray tubes and detector array groups; is the X-ray intensity received by a certain detector in the detector array in the second group of X-ray tubes and detector array groups; , , respectively, the thickness of the copper plate, the interface layer, and the aluminum plate in the copper-aluminum composite plate material through which the X-rays penetrate respectively in the second group of X-ray tubes and detector array groups; the above thicknesses are related to the angle between the connecting line of the second group of X-ray tubes and the detector array and the copper-aluminum composite plate material, and the actual thicknesses of the copper plate, the interface layer, and the aluminum plate corresponding to the measurement points on the copper-aluminum composite plate material; wherein is the attenuation coefficient of the copper plate 1.1 in the copper-aluminum composite plate 1 to X-rays; is the attenuation coefficient of the interface layer 1.2 in the copper-aluminum composite plate 1 to X-rays; is the attenuation coefficient of the aluminum plate 1.3 in the copper-aluminum composite plate 1 to X-rays; Wherein formula (n) in: is the radiation intensity of the X-ray tube in the nth group of X-ray tubes and detector array groups; is the X-ray intensity received by a certain detector in the detector array in the nth group of X-ray tubes and detector array groups; , , respectively, the thickness of the copper plate, the interface layer, and the aluminum plate in the copper-aluminum composite plate material through which the X-rays penetrate in the nth group of X-ray tubes and detector array groups; the above thicknesses are related to the angle between the connecting line of the nth group of X-ray tubes and the detector array and the copper-aluminum composite plate material, and the actual thicknesses of the copper plate, the interface layer, and the aluminum plate corresponding to the measurement points on the copper-aluminum composite plate material; wherein is the attenuation coefficient of the copper plate 1.1 in the copper-aluminum composite plate material 1 to X-rays; is the attenuation coefficient of the interface layer 1.2 in the copper-aluminum composite plate material 1 to X-rays; is the attenuation coefficient of the aluminum plate 1.3 in the copper-aluminum composite plate material 1 to X-rays.

8. The method of claim 7, wherein the method further comprises: determining the thickness of the copper-aluminum composite sheet based on the first and second signals; and determining the defect of the copper-aluminum composite sheet based on the third signal. The attenuation equation group of the X-rays penetrating the copper-aluminum composite plate further comprises a copper-aluminum composite plate thickness calculation equation, and the specific form is as follows: ； Wherein: is the total thickness of the copper-aluminum composite plate; , , is the actual thickness of the copper plate, the interface layer and the aluminum plate in the copper-aluminum composite plate, is the interface layer defect thickness.

9. The method of claim 6, wherein the method further comprises: determining the thickness of the copper-aluminum composite sheet based on the first and second signals; and determining the defect of the copper-aluminum composite sheet based on the third signal. The X-ray intensity measured by any detector array after penetrating the copper-aluminum composite plate is converted into a gray-scale image to obtain a copper-aluminum composite plate defect perspective view; the copper plate, interface layer and aluminum plate thickness distribution diagram of the copper-aluminum composite plate is superimposed with the defect perspective view, and if the abnormal distribution areas of the copper plate, interface layer and aluminum plate thickness distribution diagram of the copper-aluminum composite plate and the defect perspective view coincide, it is determined that the interface layer of the copper-aluminum composite plate has an abnormal defect.

10. The method of claim 6, wherein the method further comprises: determining the thickness of the copper-aluminum composite sheet based on the first and second signals; and determining the defect of the copper-aluminum composite sheet based on the third signal. The X-ray intensity measured by the detector array of the copper-aluminum composite plate group whose connecting line of the X-ray tube and the detector array is perpendicular to the copper-aluminum composite plate after penetrating the copper-aluminum composite plate is converted into a gray-scale image to obtain a copper-aluminum composite plate defect perspective view; the copper plate, interface layer and aluminum plate thickness distribution diagram of the copper-aluminum composite plate is superimposed with the defect perspective view, and if the abnormal distribution areas of the copper plate, interface layer and aluminum plate thickness distribution diagram of the copper-aluminum composite plate and the defect perspective view coincide, it is determined that the interface layer of the copper-aluminum composite plate has an abnormal defect.

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