Chip test probe adjusting and fast retreating device
By designing a quick-return lever and a cross-rail structure, the test probe can be quickly adjusted and accurately positioned, solving the problem of long maintenance time in existing equipment and improving the maintenance and testing efficiency of chip testing equipment.
Patent Information
- Application Number
- CN202511884754.2
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-12-15
- Publication Date
- 2026-03-10
AI Technical Summary
Existing chip testing equipment lacks a rapid retraction mechanism, resulting in a lengthy process for repairing and replacing test probes, which reduces the efficiency of equipment maintenance and chip testing.
It adopts a quick-return lever and cross rail structure, and the test probe can be quickly adjusted by rotating the knob and moving the quick-return lever. Combined with multiple adjustment components, it can achieve precise positioning and rapid retraction.
This improves the maintenance efficiency of test probes, thereby increasing the overall efficiency of chip testing, simplifying the equipment structure, and reducing maintenance difficulty and cost.
Smart Images
Figure CN121633791A_ABST
Abstract
Description
Technical Field
[0001] This invention relates to the field of chip testing device technology, and in particular to a chip test probe adjustment and fast retraction device. Background Technology
[0002] In the industrial production of LEDs, chip testing is a crucial step, providing data support for subsequent sorting. Automated testing is essential for chip positioning, photoelectric parameter detection, and grading to ensure consistent photoelectric characteristics in packaged products, thus guaranteeing LED product quality. LED chip testing involves applying pressure to electrodes to excite the crystal to emit light, then measuring optical and electrical parameters to classify quality levels. The application of voltage and current acquisition rely on probe contact with the electrodes; the stability and accuracy of this probe contact directly affect the accuracy of the test data, which in turn relates to chip grading and packaging quality. Therefore, the test probes need to be flexibly adjusted to accurately position and contact the chip's pins.
[0003] Existing chip pin testing equipment typically incorporates adjustment mechanisms, enabling horizontal and vertical movement and rotation around a horizontal axis. However, these devices lack a rapid retraction mechanism. When repair or replacement of test probes is required, the probes can only be moved away from the testing station by slowly reversing the existing adjustment mechanism. This inability to quickly adjust the probe positions leads to lengthy repair processes, reducing both equipment maintenance efficiency and chip testing efficiency. Furthermore, such equipment relies on multiple independent drive mechanisms and associated guide and limit components, resulting in a complex overall structure and increased manufacturing costs and maintenance difficulty. Summary of the Invention
[0004] The purpose of this invention is to provide a chip test probe adjustment and quick retraction device, which can quickly adjust the position of the test probe and improve maintenance efficiency.
[0005] To achieve this objective, the present invention adopts the following technical solution:
[0006] A chip test probe adjustment and fast retraction device, comprising:
[0007] A fixing component includes a base and a fixing plate, the base being fixedly connected to a chip testing device, and the fixing plate being fixedly connected to the base;
[0008] The first adjustment assembly includes a first knob, a first movable plate, a first return spring, and a push block. The first movable plate is movably connected to the fixed plate along a first direction, and the push block is fixedly connected to the fixed plate. The first knob is screwed to the first movable plate, and during the screwing process, it can push against the push block to move the first movable plate along the first direction. The two ends of the first return spring are respectively fixedly connected to the first movable plate and the fixed plate.
[0009] The quick-return assembly includes a quick-return lever, a swing arm, and a connector. The connector is fixed to the first moving plate and has a limiting groove. The quick-return lever is fixedly connected to one end of the swing arm, and the other end of the swing arm is rotatably connected to the push block. The quick-return lever slides in the limiting groove and can push against the groove wall of the limiting groove so that the first moving plate moves along the first direction.
[0010] The test probe is positioned on the first movable plate and can move along the first direction following the first movable plate.
[0011] The aforementioned chip test probe adjustment and quick retraction device includes a connector comprising a connecting part, a limiting part, and a first screwed part. The connecting part is fixedly connected to the first movable plate, the first screwed part is fixedly connected to the connecting part and extends above the fixed plate, the first knob is screwed to the first screwed part and can push against the pushing block, the limiting part is fixedly connected to the connecting part and extends along the first direction, and the limiting part has a limiting groove.
[0012] In the aforementioned chip test probe adjustment and quick retraction device, the push block is an L-shaped block, the horizontal section of the push block is fixedly connected to the fixing plate, the first screw connection is located above the horizontal section of the push block, and the first knob tightening the first screw connection can push the vertical section of the push block.
[0013] The aforementioned chip test probe adjustment and fast retraction device further includes a cross rail, through which the first moving plate is slidably connected to the fixed plate, and the cross rail extends along the first direction.
[0014] The aforementioned chip test probe adjustment and fast retraction device further includes a second adjustment component, which comprises a second knob, a second movable plate, and a second reset spring. The second movable plate is movably connected to the first movable plate along a second direction. The second knob is screwed onto the second movable plate and, during the screwing process, can push against the first movable plate to move the second movable plate along the second direction, where the first direction is perpendicular to the second direction. The two ends of the second reset spring are respectively fixedly connected to the first movable plate and the second movable plate.
[0015] The aforementioned chip test probe adjustment and fast retraction device includes a second adjustment component that further includes a fixing block. The fixing block includes a second screwed portion and a mounting portion arranged at an angle. The mounting portion is fixedly connected to the second movable plate. The second screwed portion is fixedly connected to the mounting portion and extends above the first movable plate. The second knob is screwed to the second screwed portion.
[0016] The aforementioned chip test probe adjustment and quick retraction device further includes a third adjustment component, which comprises a third knob, a swing member, a third reset spring, and a clamping member. The third knob is screwed to the second moving plate along the second direction. The two ends of the third reset spring are respectively fixedly connected to the second moving plate and the swing member. The clamping member is detachably connected to the swing member. The third knob can push against the swing member to make the swing member drive the clamping member to swing. The clamping member is used to fix the test probe.
[0017] In the aforementioned chip test probe adjustment and quick retraction device, the swing member is provided with a pushing surface, which is an inclined surface, and the third knob can push the pushing surface to make the swing member swing.
[0018] In the aforementioned chip test probe adjustment and fast retraction device, the first moving plate is provided with a receiving groove along the first direction, and the first reset spring is disposed in the receiving groove.
[0019] The aforementioned chip test probe adjustment and fast retraction device includes a base with multiple mounting holes spaced apart circumferentially along the base.
[0020] The beneficial effects of this invention are:
[0021] The chip test probe adjustment and quick-return device provided by this invention, in use, has a push block fixedly connected to a fixed plate, a first moving plate movably connected to the fixed plate along a first direction, and a first knob screwed onto the first moving plate. Therefore, rotating the first knob causes it to push against the push block, resulting in the first moving plate moving along the first direction. The first moving plate then moves the test probe, allowing for fine-tuning of the test probe. During retraction, moving the quick-return lever causes a limiting groove to be formed in the connecting member, which is fixedly connected to the first moving plate. This allows the quick-return lever to push against the groove wall, moving the first moving plate. The first moving plate then moves the first knob to avoid interference between the first knob and the push block, eliminating the need for slow, reverse rotation of the first knob for repositioning. This allows the test probe to be quickly moved away from its working position, facilitating maintenance and replacement, improving repair efficiency, and ultimately increasing chip testing efficiency. Attached Figure Description
[0022] Figure 1 This is a schematic diagram of the chip test probe adjustment and fast retraction device provided in an embodiment of the present invention from a first-view perspective;
[0023] Figure 2 yes Figure 1 Enlarged view of point A in the middle;
[0024] Figure 3 yes Figure 1 Enlarged view of point B in the middle;
[0025] Figure 4 This is a schematic diagram of the chip test probe adjustment and fast retraction device provided in an embodiment of the present invention from a second perspective.
[0026] Figure 5 Figure 4 Enlarged view of point C in the middle;
[0027] Figure 6 This is a schematic diagram of the chip test probe adjustment and fast retraction device provided in an embodiment of the present invention from a third-person perspective;
[0028] Figure 7 This is a schematic diagram of the chip test probe adjustment and fast retraction device provided in an embodiment of the present invention from a fourth-view perspective.
[0029] In the picture:
[0030] 1. Fixing components; 11. Base; 12. Fixing plate;
[0031] 2. First adjusting component; 21. First knob; 22. First moving plate; 23. First return spring; 24. Push block; 25. First fixed shaft; 251. First annular groove;
[0032] 3. Quick retraction assembly; 31. Quick retraction lever; 32. Sway bar; 33. Connector; 331. Connecting part; 332. Limiting part; 3321. Limiting groove; 333. First screw connection part; 34. Rotating shaft;
[0033] 4. Cross rails;
[0034] 5. Second adjusting component; 51. Second knob; 52. Second moving plate; 53. Second return spring; 54. Fixing block; 541. Second screw connection; 542. Mounting part; 55. Second fixing shaft; 551. Second annular groove;
[0035] 6. Third adjustment component; 61. Third knob; 62. Swing component; 621. Pushing surface; 63. Third return spring; 64. Clamping component. Detailed Implementation
[0036] Embodiments of the present invention are described in detail below. Examples of these embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar components or components having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and intended to explain the present invention, and should not be construed as limiting the present invention.
[0037] In the description of this invention, unless otherwise explicitly specified and limited, the terms "connected," "linked," and "fixed" should be interpreted broadly. For example, they can refer to a fixed connection or a detachable connection; a mechanical connection or an electrical connection; a direct connection or an indirect connection through an intermediate medium; or the internal communication of two components or the interaction between two components. Those skilled in the art can understand the specific meaning of the above terms in this invention according to the specific circumstances.
[0038] In the description of this invention, unless otherwise expressly specified and limited, "above" or "below" the second feature can include direct contact between the first and second features, or contact between the first and second features through another feature between them. Furthermore, "above," "over," and "on top" of the second feature includes the first feature being directly above or diagonally above the second feature, or simply indicates that the first feature is at a higher horizontal level than the second feature. "Below," "below," and "under" the second feature includes the first feature being directly below or diagonally below the second feature, or simply indicates that the first feature is at a lower horizontal level than the second feature.
[0039] The technical solution of the present invention will be further described below with reference to the accompanying drawings and specific embodiments.
[0040] The chip test probe adjustment and quick-return device provided by the present invention can finely adjust the position of the test probe by rotating the first knob and quickly adjust the position of the test probe by moving the quick-return lever, which facilitates the maintenance and replacement of the test probe, improves the maintenance efficiency, and thus improves the chip testing efficiency.
[0041] like Figures 1-7As shown, the chip test probe adjustment and quick retraction device includes a fixing component 1, a first adjustment component 2, a quick retraction component 3, and a test probe. The fixing component 1 includes a base 11 and a fixing plate 12. The base 11 can be fixedly connected to the chip test equipment, and the fixing plate 12 is fixedly connected to the base 11. The first adjustment component 2 includes a first knob 21, a first moving plate 22, a first reset spring 23, and a push block 24. The first moving plate 22 is movably connected to the fixing plate 12 along a first direction, and the push block 24 is fixedly connected to the fixing plate 12. The first knob 21 is screwed to the first moving plate 22, and during the screwing process, it can push against the push block 24 so that the first moving plate 22 moves along a first direction. The first return spring 23 is fixedly connected at both ends to the first moving plate 22 and the fixed plate 12, respectively, in one direction. The quick-return assembly 3 includes a quick-return lever 31, a swing arm 32, and a connecting member 33. The connecting member 33 is fixed to the first moving plate 22 and has a limiting groove 3321. The quick-return lever 31 is fixedly connected to one end of the swing arm 32, and the other end of the swing arm 32 is rotatably connected to the push block 24. The quick-return lever 31 slides in the limiting groove 3321 and can push against the groove wall of the limiting groove 3321 so that the first moving plate 22 moves in the first direction. The test probe is set on the first moving plate 22 and can follow the first moving plate 22 to move in the first direction. Figure 1 As shown in the X direction.
[0042] The chip test probe adjustment and quick-return device provided by this invention, in use, since the push block 24 is fixedly connected to the fixed plate 12, and the first moving plate 22 is movably connected to the fixed plate 12 along the first direction, and the first knob 21 is screwed to the first moving plate 22, rotating the first knob 21 causes the first knob 21 to push the push block 24, which in turn causes the first moving plate 22 to move along the first direction. The first moving plate 22 drives the test probe to move, allowing for fine adjustment of the test probe. During retraction, moving the quick-return lever 31 causes the limiting groove 3321 to be opened on the connecting member 33, which is fixedly connected to the first moving plate 22. Therefore, the quick-return lever 31 pushes against the groove wall of the limiting groove 3321, which drives the first moving plate 22 to move. Furthermore, the first moving plate 22 drives the first knob 21 to move, avoiding interference between the first knob 21 and the push block 24. This eliminates the need for slow resetting by rotating the first knob 21 in the opposite direction, allowing the test probe to be quickly moved away from its working position, facilitating maintenance and replacement, improving maintenance efficiency, and ultimately improving chip testing efficiency.
[0043] In this embodiment, the test probe is made of metal to facilitate conductivity and test the chip. Specifically, beryllium copper can be used due to its good conductivity.
[0044] For example, the base 11 is plate-shaped and has multiple mounting holes. The mounting holes are spaced apart along the circumference of the base 11. The mounting holes are used to pass through existing bolts. Multiple sets of bolts can improve the connection strength and ensure that the chip test probe adjustment and fast retraction device is stably connected to the chip test equipment.
[0045] Optionally, see Figure 1 There are four mounting holes, which are located at the four corners of the rectangle.
[0046] In other embodiments, there may be eight mounting holes; however, this embodiment does not specifically limit the number of mounting holes.
[0047] The first knob 21 can be directly connected to the first movable plate 22 or indirectly connected to the first movable plate 22. Optionally, the first knob 21 can be directly connected to the first movable plate 22. The first movable plate 22 needs to be set into a bent shape to ensure that the first knob 21 can push against the push block 24 during the process of screwing the first movable plate 22.
[0048] Preferably, see Figure 1 and Figure 3 The connector 33 includes a connecting part 331, a limiting part 332, and a first screwed part 333. The connecting part 331 is fixedly connected to the first movable plate 22. The first screwed part 333 is fixedly connected to the connecting part 331 and extends above the fixed plate 12. The first knob 21 is screwed to the first screwed part 333 and can push the push block 24. The limiting part 332 is fixedly connected to the connecting part 331 and extends along the first direction. The limiting part 332 has a limiting groove 3321. The connector 33 is fixedly connected to the first movable plate 22. The first knob 21 is screwed to the screwed part of the connector 33. When replacing or repairing, only the connector 33 needs to be replaced, and the first movable plate 22 does not need to be replaced, thus reducing maintenance costs.
[0049] The limiting groove 3321 extends along the first direction, which can ensure that the quick return lever 31 pushes against the limiting groove 3321 along the first direction, thereby ensuring that the first moving plate 22 moves along the first direction and improving the accuracy of adjustment.
[0050] Furthermore, the push block 24 is an L-shaped block. The horizontal section of the push block 24 is fixedly connected to the fixed plate 12. The first screw connection 333 is located above the horizontal section of the push block 24. When the first knob 21 is tightened, the first screw connection 333 can push the vertical section of the push block 24. The L-shaped push block 24 can provide clearance space to avoid interference between the push block 24 and the first moving plate 22 during the movement of the first moving plate 22.
[0051] Optionally, a roller can be provided between the first movable plate 22 and the fixed plate 12 to achieve a rolling connection. One of the first movable plate 22 and the fixed plate 12 is provided with a roller, and the other is provided with a groove. The roller slides inside the groove to achieve a rolling connection between the first movable plate 22 and the fixed plate 12. At the same time, the groove can limit the roller to ensure that the first movable plate 22 moves along the first direction.
[0052] In this embodiment, the chip test probe adjustment and fast retraction device also includes a cross rail 4. The first moving plate 22 is slidably connected to the fixed plate 12 through the cross rail 4. The cross rail 4 extends along the first direction. The cross rail 4 has high guiding accuracy and can realize the smooth movement of the first moving plate 22 in the first direction, thereby realizing the precise adjustment of the test probe in the first direction.
[0053] Specifically, four sets of cross guide rails 4 are provided between the first moving plate 22 and the fixed plate 12, see [reference]. Figure 1 The four sets of cross rails 4 are arranged from top to bottom. The fixed part of the first set of cross rails 4 is fixed to the fixed plate 12, and the movable part is connected to the first moving plate 22. The fixed part of the second set of cross rails 4 is fixed to the first moving plate 22, and the movable part is connected to the fixed plate 12. The fixed part of the third set of cross rails 4 is fixed to the fixed plate 12, and the movable part is connected to the first moving plate 22. The fixed part of the fourth set of cross rails 4 is fixed to the first moving plate 22, and the movable part is connected to the fixed plate 12. This can effectively mitigate the swaying and tilting of the first moving plate 22 during movement and improve the stability of the movement.
[0054] It should be noted that during the rotation of the first knob 21, the first knob 21 pushes against the push block 24. Since the push block 24 is fixedly connected to the fixed plate 12, and the fixed plate 12 remains stationary, the first moving plate 22 will move in the opposite direction. That is, when the first knob 21 is rotated in the positive direction of the first direction, the first moving plate 22 moves in the negative direction of the first direction, and when the first knob 21 is rotated in the negative direction of the first direction, the first moving plate 22 moves in the positive direction of the first direction.
[0055] At the same time, when the first knob 21 is rotated in the positive direction of the first direction, the first moving plate 22 moves in the negative direction of the first direction, thereby driving the first return spring 23 to extend. After the first knob 21 is rotated in the negative direction of the first direction, the first return spring 23 resets and drives the first moving plate 22 to move in the positive direction of the first direction. The threaded connection has high adjustment accuracy.
[0056] In this embodiment, see Figure 2The first movable plate 22 has a receiving groove along the first direction, and the first return spring 23 is disposed in the receiving groove. The first return spring 23 is disposed in the receiving groove, which can limit its lateral displacement and avoid deformation disorder when the first return spring 23 is extended, and guide the first return spring 23 to accurately rebound along the path of the receiving groove when resetting, so as to ensure that the extension and resetting process is stable and controllable.
[0057] Further, see Figure 1 and Figure 2 The first adjusting assembly 2 also includes a first fixed shaft 25, which is fixedly connected to the first moving plate 22. A first annular groove 251 is formed at the end of the first fixed shaft 25 away from the first moving plate 22. One end of the first return spring 23 is sleeved in the first annular groove 251, and the other end is fixedly connected to the fixed plate 12. The first return spring 23 is fixed to the first fixed shaft 25 through the first annular groove 251, effectively preventing the first return spring 23 from falling off the first fixed shaft 25 during extension or reset, ensuring stable force transmission between the first return spring 23 and the first moving plate 22, and providing stable assistance for the movement of the first moving plate 22.
[0058] Fast rewind component 3 is used to improve adjustment speed. In this embodiment, see [link to documentation]. Figure 1 and Figure 3 The quick-return assembly 3 also includes a rotating shaft 34, which passes through and is fixedly connected to the vertical section of the push block 24. A swing arm 32 is rotatably connected to the other end of the rotating shaft 34. In use, the quick-return lever 31 is moved, causing the swing arm 32 to swing and rotate around the rotating shaft 34. The rotating shaft 34 is fixed to the push block 24, which is fixed to the fixing plate 12. Therefore, the quick-return lever 31 can push against the wall of the limiting groove 3321 of the connecting member 33, causing the first moving plate 22 to move, allowing the test probe to quickly leave the working position and improving maintenance efficiency.
[0059] To improve the adjustment range of the test probe, see [link / reference]. Figure 1 , Figure 4 and Figure 5 In this embodiment, the chip test probe adjustment and fast retraction device further includes a second adjustment component 5. The second adjustment component 5 includes a second knob 51, a second moving plate 52, and a second reset spring 53. The second moving plate 52 is movably connected to the first moving plate 22 along a second direction. The second knob 51 is screwed onto the second moving plate 52, and during the screwing process, it can push against the first moving plate 22 to move the second moving plate 52 along the second direction. The first direction is perpendicular to the second direction. The two ends of the second reset spring 53 are respectively fixedly connected to the first moving plate 22 and the second moving plate 52. The second direction is as follows: Figure 1As shown in the Y direction. The second moving plate 52 can move along the second direction, driving the test probe to move along the second direction, which can further improve the adjustment range of the test probe and ensure that the test probe contacts the chip pins.
[0060] During use, as the second knob 51 is turned in, it pushes against the first movable plate 22. Since the first movable plate 22 is connected to the fixed plate 12, the fixed plate 12 restricts the movement of the first movable plate 22 in the second direction. Therefore, the second movable plate 52 will move in the opposite direction. That is, when the second knob 51 is turned in the positive direction of the second direction, the second movable plate 52 moves in the negative direction of the second direction, and when the second knob 51 is turned in the negative direction of the second direction, the second movable plate 52 moves in the positive direction of the second direction.
[0061] At the same time, when the second knob 51 is rotated in the positive direction of the second direction, the second moving plate 52 moves in the negative direction of the second direction, thereby causing the second return spring 53 to extend. After the second knob 51 is rotated in the negative direction of the second direction, the second return spring 53 returns to its original position, causing the second moving plate 52 to move in the positive direction of the second direction.
[0062] It should be noted that the test probe is set on the first moving plate 22 but is not fixedly connected to the first moving plate 22. When the second moving plate 52 is movably connected to the first moving plate 22, the test probe can be set on the second moving plate 52. When the first moving plate 22 moves along the first direction, the second moving plate 52 moves with the first moving plate 22, thereby causing the test probe to move along the first direction. When the second moving plate 52 moves along the second direction, the test probe moves with the second moving plate 52 along the second direction.
[0063] Optionally, a roller can be provided between the second movable plate 52 and the first movable plate 22 to achieve a rolling connection. One of the second movable plate 52 and the first movable plate 22 is provided with a roller, and the other is provided with a sliding groove. The roller slides inside the sliding groove to achieve a rolling connection between the first movable plate 22 and the second movable plate 52. At the same time, the sliding groove can limit the roller to ensure that the second movable plate 52 moves in the second direction.
[0064] Specifically, see Figure 1 and Figure 4Four sets of cross guide rails 4 are arranged between the second moving plate 52 and the first moving plate 22, from right to left. The fixed part of the first set of cross guide rails 4 is fixed to the first moving plate 22, and the movable part is connected to the second moving plate 52. The fixed part of the second set of cross guide rails 4 is fixed to the second moving plate 52, and the movable part is connected to the first moving plate 22. The fixed part of the third set of cross guide rails 4 is fixed to the first moving plate 22, and the movable part is connected to the second moving plate 52. The fixed part of the fourth set of cross guide rails 4 is fixed to the second moving plate 52, and the movable part is connected to the first moving plate 22. This arrangement can effectively mitigate the swaying and tilting of the second moving plate 52 during movement and improve the stability of the motion.
[0065] In other embodiments, six sets of cross rails 4 may also be provided between the second moving plate 52 and the first moving plate 22, and six sets of cross rails 4 may also be provided between the first moving plate 22 and the fixed plate 12. The number of cross rails 4 is not specifically limited here.
[0066] Further, see Figure 1 The second adjustment component 5 also includes a fixing block 54, which includes a second screwed portion 541 and a mounting portion 542 arranged at an angle. The mounting portion 542 is fixedly connected to the second movable plate 52, and the second screwed portion 541 is fixedly connected to the mounting portion 542 and extends above the first movable plate 22. The second knob 51 is screwed to the second screwed portion 541. The angled arrangement of the second screwed portion 541 and the mounting portion 542 provides clearance space to avoid interference between the fixing block 54 and the first movable plate 22 during the movement of the second movable plate 52.
[0067] Specifically, the second screw connection 541 and the mounting part 542 are arranged at a 90° angle.
[0068] In this embodiment, see Figure 1 , Figure 4 and Figure 5 The second adjusting component 5 also includes a second fixed shaft 55, which is fixedly connected to the first moving plate 22. A second annular groove 551 is formed at the end of the second fixed shaft 55 away from the first moving plate 22. One end of the second return spring 53 is fitted into the second annular groove 551, and the other end is fixedly connected to the second moving plate 52. The fact that one end of the second return spring 53 is fixed to the second fixed shaft 55 through the second annular groove 551 effectively prevents the second return spring 53 from falling off the second fixed shaft 55 during extension or reset, ensuring stable force transmission between the second return spring 53 and the second moving plate 52, and providing stable assistance for the movement of the second moving plate 52.
[0069] To further improve the adjustment range of the test probe, see [link to relevant documentation]. Figure 1The chip test probe adjustment and fast retraction device also includes a third adjustment component 6. The third adjustment component 6 includes a third knob 61, a swing member 62, a third reset spring 63, and a clamping member 64. The third knob 61 is screwed to the second moving plate 52 along the second direction. The two ends of the third reset spring 63 are respectively fixedly connected to the second moving plate 52 and the swing member 62. The clamping member 64 is detachably connected to the swing member 62. The third knob 61 can push the swing member 62 to make the swing member 62 drive the clamping member 64 to swing. The clamping member 64 is used to fix the test probe.
[0070] Specifically, the third adjustment component 6 also includes a mounting block, which is fixedly connected to the second moving plate 52. The third reset spring 63 is fixedly inserted into the mounting block and the swinging component 62. During maintenance, only the damaged mounting block needs to be replaced, which reduces maintenance steps, improves maintenance efficiency, and reduces maintenance costs.
[0071] It should be noted that when the test probe is clamped within the clamping member 64, and the third knob 61 pushes against the swing member 62, the swing member 62 causes the clamping member 64 to swing, which in turn causes the test probe to swing, adjusting the perpendicularity of the test probe. Simultaneously, the swing member 62 is connected to the second moving plate 52 via the third return spring 63, ensuring that the swing member 62 can move with the second moving plate 52, thereby adjusting the test probe along the second direction. The second moving plate 52 is slidably connected to the first moving plate 22, and when the first moving plate 22 moves, it can adjust the test probe along the first direction. Therefore, by rotating the first knob 21, the second knob 51, and the third knob 61, the position and orientation of the test probe can be adjusted, ensuring that the test probe can contact the chip pins and improving the accuracy of chip testing.
[0072] Further, see Figure 6 The swing member 62 is provided with a pushing surface 621, which is an inclined surface. The third knob 61 can push the pushing surface 621 to make the swing member 62 swing, thus enabling the swing member 62 to be smoothly and finely adjusted.
[0073] In this embodiment, the first knob 21, the second knob 51 and the third knob 61 are all provided with a knob cap. The knob cap is provided with multiple anti-slip grooves, which can increase friction, prevent slippage, improve the rotation efficiency of the first knob 21, the second knob 51 and the third knob 61, and thus improve the efficiency of adjusting the test probe.
[0074] Specifically, the anti-slip groove extends along the axial direction of the cap, and the grooves are arranged circumferentially on the outer surface of the cap.
[0075] The chip test probe adjustment and quick-return device provided by the present invention, in use, rotates the first knob 21 to push the push block 24 along the first direction, thereby driving the first moving plate 22 to move along the first direction, realizing the fine adjustment of the test probe in the first direction; rotates the second knob 51 to push the first moving plate 22 along the second direction, thereby driving the second moving plate 52 to move along the second direction, realizing the fine adjustment of the test probe in the second direction; rotates the third knob 61 to push the swing member 62 along the second direction, and the sliding of the third knob 61 along the push surface 621 of the swing member 62 can make the swing member 62 swing around the axis of the third reset spring 63, thereby driving the clamping member 64 to swing, realizing the fine adjustment of the angle of the test probe.
[0076] During retraction, the first moving plate 22 can be moved in the opposite direction by rotating the first knob 21 in the reverse direction, thereby moving the test probe away from the working position. Alternatively, the quick-retraction lever 31 can be moved, sliding within the limiting groove 3321 to push against the connector 33, thereby moving the first moving plate 22 backward. Since this adjustment method does not require repeated rotation of the first knob 21, but only requires moving the quick-retraction lever 31 along the limiting groove 3321, it enables rapid adjustment of the test probe along the first direction, facilitating the maintenance and replacement of the test probe, improving maintenance efficiency, and thus improving the efficiency of chip testing.
[0077] Obviously, the above embodiments of the present invention are merely examples for clearly illustrating the present invention, and are not intended to limit the implementation of the present invention. Those skilled in the art can make other variations or modifications based on the above description. It is neither necessary nor possible to exhaustively describe all embodiments here. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of the present invention should be included within the scope of protection of the claims of the present invention.
Claims
1. A chip test probe adjusting and quick return device, characterized in that, The utility model relates to a chip testing device, which comprises a fixing assembly (1), a first adjusting assembly (2), a fast-back assembly (3) and a test probe. The fixing assembly (1) comprises a base (11) and a fixing plate (12), the base (11) can be fixedly connected to a chip testing device, and the fixing plate (12) is fixedly connected to the base (11). The first adjusting assembly (2) comprises a first knob (21), a first moving plate (22), a first reset spring (23) and a pushing block (24), the first moving plate (22) is movably connected to the fixing plate (12) in a first direction, the pushing block (24) is fixedly connected to the fixing plate (12), the first knob (21) is screwed to the first moving plate (22), and the first knob (21) can push against the pushing block (24) during screwing to make the first moving plate (22) move in the first direction, and the two ends of the first reset spring (23) are fixedly connected to the first moving plate (22) and the fixing plate (12) respectively. The fast-back assembly (3) comprises a fast-back lever (31), a swing lever (32) and a connecting piece (33), the connecting piece (33) is fixed to the first moving plate (22), the connecting piece (33) is provided with a limiting groove (3321), one end of the fast-back lever (31) is fixedly connected to the swing lever (32), the other end of the swing lever (32) is rotatably connected to the pushing block (24), and the fast-back lever (31) can push against the groove wall of the limiting groove (3321) to make the first moving plate (22) move in the first direction. The test probe is arranged on the first moving plate (22) and can move along the first moving plate (22) in the first direction.
2. The chip test probe adjusting and quick return device according to claim 1, characterized in that, The connecting piece (33) comprises a connecting part (331), a limiting part (332) and a first screwing part (333), the connecting part (331) is fixedly connected to the first moving plate (22), the first screwing part (333) is fixedly connected to the connecting part (331) and extends above the fixing plate (12), the first knob (21) is screwed to the first screwing part (333) and can push against the pushing block (24), and the limiting part (332) is fixedly connected to the connecting part (331) and extends in the first direction, and the limiting part (332) is provided with the limiting groove (3321).
3. The chip test probe adjusting and quick return device according to claim 2, characterized in that, The pushing block (24) is an L-shaped block, the horizontal section of the pushing block (24) is fixedly connected to the fixing plate (12), the first screwing part (333) is located above the horizontal section of the pushing block (24), and the first knob (21) can push against the vertical section of the pushing block (24) by screwing the first screwing part (333).
4. The chip test probe adjusting and quick return device according to claim 2, characterized in that, The utility model further comprises a cross guide rail (4), the first moving plate (22) is slidably connected to the fixing plate (12) through the cross guide rail (4), and the cross guide rail (4) extends in the first direction.
5. The chip test probe adjusting and quick return device according to claim 1, wherein The second adjusting assembly (5) comprises a second knob (51), a second moving plate (52) and a second reset spring (53), the second moving plate (52) is movably connected to the first moving plate (22) along a second direction, the second knob (51) is screwed to the second moving plate (52), and screwing in can push the first moving plate (22) to make the second moving plate (52) move along the second direction, the first direction is perpendicular to the second direction, and two ends of the second reset spring (53) are fixedly connected to the first moving plate (22) and the second moving plate (52) respectively.
6. The chip test probe adjusting and quick return device according to claim 5, characterized in that, The second adjusting assembly (5) further comprises a fixed block (54), the fixed block (54) comprises a second screwing part (541) and a mounting part (542) arranged at an angle, the mounting part (542) is fixedly connected to the second moving plate (52), the second screwing part (541) is fixedly connected to the mounting part (542) and extends above the first moving plate (22), and the second knob (51) is screwed to the second screwing part (541).
7. The chip test probe adjusting and quick return device according to claim 5, characterized in that, The third adjusting assembly (6) comprises a third knob (61), a swing piece (62), a third reset spring (63) and a clamping piece (64), the third knob (61) is screwed to the second moving plate (52) along the second direction, two ends of the third reset spring (63) are fixedly connected to the second moving plate (52) and the swing piece (62) respectively, the clamping piece (64) is detachably connected to the swing piece (62), the third knob (61) can push the swing piece (62) to make the swing piece (62) drive the clamping piece (64) to swing, and the clamping piece (64) is used for fixing the test probe.
8. The chip test probe adjusting and quick return device according to claim 7, characterized in that, The swing piece (62) is provided with a pushing surface (621), the pushing surface (621) is an inclined surface, and the third knob (61) can push the pushing surface (621) to make the swing piece (62) swing.
9. The probe card adjustment and quick return apparatus of any of claims 1-8, wherein, The first moving plate (22) is provided with a containing groove along the first direction, and the first reset spring (23) is arranged in the containing groove.
10. The probe card adjustment and quick return apparatus of any of claims 1-8, wherein, The base (11) is provided with a plurality of mounting holes, and the plurality of mounting holes are arranged at intervals along the circumference of the base (11).