Inspection support device

Abstract

The present specification provides an inspection support device capable of automatically associating data of the same inspection site and displaying inspection results of the inspection site in an easy-to-observe manner. A first (second) data set is stored in the inspection support device. The first (second) data set includes: a first (second) inspection region map in which a first (second) mark is marked on each of a plurality of inspection sites on a map of a structure to be inspected; and first (second) inspection information which is information of each inspection site at the first (second) time period and which is associated with each first (second) marker. The computer sets a comparison range including the first mark for the first examination area map, projects the comparison range onto the second examination area map, and when the second mark is included in the projected comparison range, displays first (second) examination information associated with the first (second) mark included in the comparison range in one row on the display device.

Description

Technical Field

[0001] The technology disclosed in this specification relates to an inspection support device that displays past inspection results of the inspection site in an easily observable manner. Background Technology

[0002] Typically, multiple inspection areas are periodically examined in structures. Workers acquire images or record information such as deterioration for each inspection area. Inspection support devices that reduce the burden on workers performing inspections are disclosed, for example, in Patent Documents 1 and 2. The device in Patent Document 1 stores images of the inspection area in a corresponding association with the date and time of the photograph. Furthermore, the device calculates the difference in damage levels between two images of the same photographic location from the first and second photographic days, and displays a heat map corresponding to the difference in damage levels.

[0003] The apparatus in Patent Document 2 calculates a score representing the degree of surface deterioration of the inspected area based on images taken from the inspected area. The apparatus stores the images and scores in a corresponding association with the inspected area. Operators can refer to the images and scores of the inspected area at any time.

[0004] Patent Document 1: Japanese Patent No. 7440855

[0005] Patent Document 2: Japanese Patent Application Publication No. 2016-4285 Summary of the Invention

[0006] Images of the inspection area or annotations by operators are primarily stored as handwritten notes or digital data. Operators handwrite markings indicating the inspection area on drawings of structures including the inspection area. In this case, the position of the markings on the drawing sometimes varies slightly depending on the operator. Alternatively, the shape of the markings indicating the inspection area may also differ from operator to operator. Even with digital data, it is sometimes impossible to establish a correspondence between markings across multiple data points from different inspection periods. This specification provides an inspection support device that can automatically establish a correspondence between data points of the same inspection area from multiple data points from different inspection periods and display the inspection results in an easily observable manner.

[0007] The inspection support device disclosed in this specification includes a storage device, a display device, and a computer. The storage device stores the following first / second datasets. The first dataset is a dataset created in a first period and includes: a first inspection area map, which marks multiple inspection locations with first labels on a diagram of the structure of the inspection object; and first inspection information, which is information about each inspection location in the first period and is associated with each first label. For example, in a first inspection area map including two inspection locations (inspection location A and inspection location B), inspection location A is labeled with a first label, and inspection location B is labeled with a first label. The first inspection information related to inspection location A is associated with the first label, and the first inspection information related to inspection location B is associated with the first label.

[0008] The second dataset is the same as the first dataset. It is a dataset created in a second period, which is different from the first period, and includes: a second inspection area map, which is a map with the same composition as the first inspection area map, and each inspection area is marked with a second label; and second inspection information, which is the information of each inspection area in the second period, and is associated with each second label.

[0009] Furthermore, the computer sets a contrast range including the first mark for the first inspection area map and projects this contrast range onto the second inspection area map. When the second mark is included within the projected contrast range, it is determined that the first mark and the second mark included within the same contrast range represent the same inspection area. The computer displays the first inspection information associated with the first mark included within a contrast range and the second inspection information associated with the second mark included within the contrast range on a single line on the display device.

[0010] The inspection support device disclosed in this manual can display information about the same inspection area, which has been assigned different markings at different times, on a single line. This allows operators to quickly grasp the inspection results from different periods.

[0011] Data sets 1 and 2 can include various types of information. For example, they may include images of inspection areas labeled with markers indicating the inspection sites, annotations recorded by the operators, etc. In this case, the computer preferably displays data sets 1 and 2 separately for each type. Specifically, the computer can display a summary of the images included in data sets 1 and 2, or it can display a summary of the annotations included in data sets 1 and 2. This display makes it easier for operators to grasp the history of the inspection results.

[0012] Additionally, for example, if multiple inspection points are set in a road section, the "inspection area" is the entire road section, and the "inspection area diagram" can be a structural diagram (or top view or photograph) of the entire road section.

[0013] The detailed description of the technology disclosed in this specification and further improvements will be described in the following "Detailed Description". Attached Figure Description

[0014] Figure 1 This is a block diagram of the inspection support device in an embodiment.

[0015] Figure 2 This is an example from dataset 1.

[0016] Figure 3 This is an example from dataset 2.

[0017] Figure 4 It is a graph on the first inspection area graph where the comparison range is set.

[0018] Figure 5 It is a diagram that projects the comparison range onto the second inspection area diagram.

[0019] Figure 6 This is one example of the test results being displayed. Detailed Implementation

[0020] The inspection support device 10 of the embodiment will be described with reference to the accompanying drawings. Figure 1 The diagram shows a block diagram of the inspection support device 10. The inspection support device 10 displays multiple past inspection results for multiple inspection locations set within an inspection area in an easily observable manner. In this embodiment, the inspection area is a defined road section.

[0021] The inspection support device 10 includes a computer 11, a display device 12 connected to the computer 11, and a storage device 13. The storage device 13 can be connected to the computer 11 via a network. Furthermore, the inspection support device 10 includes a camera 14 connected to the computer 11. The computer 11 can store images captured by the camera in a primary storage device within the computer 11, or in the storage device 13. The computer 11 can be of a size that can be carried by an operator.

[0022] The operator inspecting the inspection area takes an image of the area using camera 14 and writes annotations related to that area. Alternatively, the operator inputs the annotations related to the inspection area into computer 11 using a keyboard (not shown). The annotations include details such as the deterioration state of the inspection area. Furthermore, the operator marks the location of the inspection area on the diagram of the structure to be inspected (in this embodiment, a top view of a specified road section). The mark indicates the inspection area. In this specification, the diagram of the structure to be inspected is referred to as the inspection area diagram.

[0023] The inspection area map, images of the inspection sites, and related annotations are collectively referred to as the dataset. Old datasets can be recorded on paper. In this case, the operator scans the paper media and stores it in storage device 13.

[0024] In this embodiment, the storage device 13 stores a first dataset 100 created in a first period (e.g., 2017) and a second dataset 200 created in a second period different from the first period (e.g., 2022). The storage device 13 may also store datasets from more periods.

[0025] An example of dataset 100 is shown below. Figure 2 The first dataset 100 includes a first inspection area diagram 110 with first labels marking the locations of multiple inspection parts in a diagram of the structure of the inspection object, and first inspection information related to each inspection part. Multiple first labels (first a label 111 and first b label 112) are assigned to the first inspection area diagram 110, and each piece of first inspection information is associated with each first label. First a label 111 is associated with first a inspection information 120, and first b label 112 is associated with first b inspection information (not shown).

[0026] Dataset 100 is the data created in the specified first period. Figure 2 In this example, two inspection areas are shown (inspection area A and inspection area B). Inspection area A is marked with a first label 111, and inspection area B is marked with a first label 112. The first inspection information 120 includes an image 121 of inspection area A and annotations 122 related to inspection area A. In this example, inspection area A is a road expansion joint, and image 121 is an image of the expansion joint in the first period. In image 121, the gray areas represent the deviation of the expansion joint from the road to the left. The width of the expansion joint expands and contracts according to this deviation. Annotation 122 is a note related to the condition of the expansion joint (inspection area A) in the first period. In this example, the note includes the component name of inspection area A, the type of damage, and the damage level. Annotation 122 may include further information related to inspection area A.

[0027] Although the illustrations are omitted, the first dataset 100 also includes the first b inspection information (the image of the first period inspection site B and the annotations related to the inspection site B) that corresponds to the first b tag 112 representing the inspection site B.

[0028] An example of dataset 200 is shown below. Figure 3 The second dataset 200 includes a second inspection area diagram 210 with second labels marked at various locations of multiple inspection parts in a diagram of the structure of the inspected object, and information related to each inspection part, i.e., second inspection information. Figure 3 In the example, two inspection sites (inspection site A and inspection site B) are shown. The second mark includes mark 2a 211 and mark 2b 212.

[0029] A 2a mark 211 is assigned to the location of inspection area A, and a 2b mark 212 is assigned to the location of inspection area B. The information of inspection area A in the second period (2a inspection information 220) is associated with the 2a mark 211. The information of inspection area B in the second period (2b inspection information not shown) is associated with the 2b mark 212.

[0030] Inspection information 220 2a includes image 221 of inspection site A in the second period and annotation 222 related to inspection site A in the second period. Image 221 is an image of the telescopic device, and the width of the gray area is larger than that of the telescopic device in the first period (image 121). This indicates that the telescopic device has deteriorated due to the increased width. Annotation 222 is an annotation related to inspection site B in the second period, indicating that deterioration is in progress, etc.

[0031] Although the illustration is omitted, the second dataset 200 also includes second-b inspection information (an image of the second-period inspection site B and annotations related to the inspection site B) that corresponds to the second-b marker 212 representing the inspection site B.

[0032] Data set 100 is data created in the specified first period (e.g., 2017), and data set 200 is data created in a different period than the first period (e.g., 2022).

[0033] In this embodiment, the structure to be inspected is a specified road section, and the top view of the road section is marked in the inspection area diagrams 110 and 210.

[0034] Mark 111 (1a) and Mark 112 (1b) are handwritten marks made by workers in the first period, and are rectangular in shape. Mark 211 (2a) and Mark 212 (2b) are handwritten marks made by workers in the second period, and are rounded rectangles.

[0035] The first dataset 100 (first inspection area map 110, first a inspection information 120, and first b inspection information) created in the first period is simultaneously read into the computer 11. The first inspection area map 110 is converted into an image by a scanner and read into the computer 11. At this time, the characters of the first dataset are read by an optical character recognition device (OCR) and stored as digital data in the storage device 13. At this time, the computer 11 establishes a corresponding association between the markings of each inspection part of the first inspection area map 110 and the first inspection information and stores it. More specifically, the computer 11 establishes a corresponding association between the first a inspection information 120 and the first a mark 111 marking the location of inspection part A in the first period and stores it. And the computer 11 establishes a corresponding association between the first b inspection information (not shown) and the first b mark 112 marking the location of inspection part B and stores it.

[0036] An example of an algorithm for extracting markers from an inspection region map is as follows.

[0037] The computer 11 (storage device 13) stores an inspection area map without any markings. Hereinafter, the inspection area map without markings will be referred to as the base area map. The base area map is also an image of the same type as the inspection area maps 110 and 210 read from the scanner (e.g., a bitmap image). The computer 11 creates a map that takes the difference between the first inspection area map 110 and the base area map. Hereinafter, the map that only differs will be referred to as the first difference map. In the first difference map, only the first markings not depicted in the base area map are shown. Similarly, the computer 11 creates a map that takes the difference between the second inspection area map 210 and the base area map (the second difference map). In the second difference map, only the second markings not depicted in the base area map are shown. Computer 11 is able to determine the position and shape of the first marker (the first a marker 111 and the first b marker 112) in the first difference diagram from the first difference diagram, and is able to determine the position and shape of the second marker (the second a marker 211 and the second b marker 212) in the second difference diagram from the second difference diagram.

[0038] The same applies to the second dataset 200 created in the second period (second inspection area map 210, second inspection information 220, and second inspection information 2b). The computer 11 establishes a corresponding association between the second inspection information 220 and the second label 211 marking the location of the inspection site A in the second period, and stores it. Similarly, the computer 11 establishes a corresponding association between the second inspection information (not shown) and the second label 212 marking the location of the inspection site B, and stores it.

[0039] Markings 111 (1a) and 211 (2a) are handwritten by the operators. Therefore, both represent the same inspection area A, but their positions on the inspection area map and the shapes of the markings are slightly different. The same applies to markings 112 (1b) and 212 (2b).

[0040] Computer 11 can compare the first inspection area map 110 and the second inspection area map 210, extract markers representing the same inspection areas, and summarize and display inspection information related to the same inspection areas at different times. The mechanism will be explained below.

[0041] Computer 11 sets a comparison range in the first inspection area, Figure 110, that includes each of the first marks. Figure 4 The diagram shows a contrast range 21 containing the first a mark 111 defined in the first inspection area diagram 110. As described above, the position and shape of the first a mark 111 in the diagram are extracted from the first difference diagram. Figure 4 In the case of an example, the comparison range 21 containing the first mark 111 is set at the coordinates (X1, Y1) in the first inspection area figure 110.

[0042] Next, computer 11 projects the comparison area 21 onto the second inspection area diagram 210. Figure 5 The diagram shows a second inspection area 210 projected onto the comparison range 21. When a mark representing an inspection location exists within the projected comparison range 21, the computer 11 determines that the mark represents the same inspection location as the first mark 111. As described above, the position and shape of the second mark 211 in the diagram are extracted from the second difference diagram. In practice, the computer 11 projects the comparison range 21 onto the second difference diagram, and if a mark exists within the projected comparison range, it determines that the mark represents the same inspection location as the first mark 111. Figure 5 In the example, since the 2a mark 211 is located in the comparison range 21, the computer 11 determines that the 2a mark 211 is a mark indicating the same inspection site A as the 1a mark 111.

[0043] Computer 11 determines that the first a mark 111 and the second a mark 211 represent the same inspection area, and displays the first a inspection information 120, which is associated with the first a mark 111, and the second a inspection information 220, which is associated with the second a mark 211, on the display device 12. At this time, computer 11 displays the first a inspection information 120 and the second a inspection information 220 on the screen of display device 12 in one line.

[0044] exist Figure 6An example is shown below. As described above, the first inspection information 120 includes an image 121 of the inspection site A in the first period and a note 122 related to the inspection site A in the first period. The second inspection information 220 includes an image 221 of the inspection site A in the second period and a note 222 related to the inspection site A in the second period. Figure 6 In the example, inspection information 120 (image 121 of inspection site A and annotation 122 related to inspection site A) and inspection information 220 (image 221 of inspection site A and annotation 222 related to inspection site A) are displayed in a single line 12a.

[0045] Furthermore, in Figure 6 In the example, the first inspection area diagram 110 and the second inspection area diagram 210 are also displayed in the same row 12a. That is, the computer 11 displays the first dataset 100 and the second dataset 200 related to the inspection site A in one row 12a.

[0046] More specifically, computer 11 displays a first dataset 100 and a second dataset 200 on display device 12 according to the type of information. The first dataset 100 includes a first inspection area image 110 and first inspection information 120 (an image 121 of inspection area A and annotations 122 related to inspection area A). The data type of the first inspection area image 110 is a scanned bitmap image, image 121 is an image of other data structures (e.g., TIFF format), and annotation 122 is text data read by an optical character recognition device. The second dataset 200 also contains the same type of information. Figure 6 In the image, the first inspection area map 110 and the second inspection area map 210 of the bitmap are displayed together in column 12b on the screen. Similarly, images 121 and 221, which are TIFF type image data, are displayed together in column 12c on the screen, and annotations 122 and 222, which are text data, are displayed together in column 12d on the screen.

[0047] The computer 11 processes the 1b mark 112 in the same way as it processes the 1a mark 111. If it is determined that the 1b mark 112 and the 2b mark 212 are marks representing the same inspection location B, the computer 11 displays the 1b inspection information associated with the 1b mark and the 2b inspection information associated with the 2b mark 212 on the display device 12 in one line.

[0048] Computer 11 extracts the markings from the inspection area map and determines their location and shape (size). Furthermore, computer 11 can display information about the same inspection area marked differently at different times in a single line. This allows operators to easily grasp the history of the inspection results.

[0049] The features of the inspection support device 10 of the embodiment are summarized below. The inspection support device 10 includes a computer 11, a display device 12, and a storage device 13. The storage device 13 stores a first dataset 100 and a second dataset 200. The first dataset 100 is a dataset created in a first period. The first dataset 100 includes: a first inspection area map 110, which marks multiple inspection locations with first labels on a map of the structure of the inspection object; and first inspection information, which is information about each inspection location in the first period, and is associated with each first label. In the embodiment, the first label includes a first a label 111 and a first b label 112. The first a label 111 is associated with the first a inspection information 120, and the first b label 112 is associated with the first b inspection information (not shown).

[0050] The second dataset 200 is a dataset created in a second period, different from the first period. The second dataset 200 includes: a second inspection area map 210, which marks multiple inspection locations with second labels on a diagram of the structure of the inspection object; and second inspection information, which is information about each inspection location in the second period and is associated with each second label. In this embodiment, the second labels include a seconda label 211 and a secondb label 212. The seconda label 211 is associated with the seconda inspection information 220, and the secondb label 212 is associated with the secondb inspection information (not shown).

[0051] Computer 11 sets a contrast range 21 on the first inspection area diagram 110 that includes a first mark (e.g., mark 1a 111), and projects the contrast range 21 onto the second inspection area diagram 210. If the projected contrast range 21 includes a second mark (mark 2a 211), computer 11 determines that the two marks represent the same inspection area. In this case, computer 11 displays the first a inspection information 120 and the second a inspection information 220 in a single line (horizontally arranged) on the screen of display device 12.

[0052] More specifically, computer 11 performs the following processing. Computer 11 (storage device 13) stores images (basic region images) of the structures of the unmarked inspection objects. The first inspection region image 110, the second inspection region image 210, and the basic region image are image data of the same type. Computer 11 creates a first difference image by taking the difference between the first inspection region image 110 and the basic region image, and creates a second difference image by taking the difference between the second inspection region image 210 and the basic region image. "Taking the image difference" means taking the difference in numerical values ​​representing the intensity of each pixel. In the difference image, only the graphics not represented in the basic region image remain. In other words, only the marks depicted at the locations of the inspection areas remain in the difference image. Multiple marks remain in the difference image. Computer 11 determines the position and shape (size) of each of the multiple first marks in the image from the first difference image, and determines the position and shape (size) of each of the multiple second marks in the image from the second difference image. The position and shape of each mark are determined in the first inspection area diagram 110 and the second inspection area diagram 210, respectively. Therefore, as described above, the computer 11 is able to determine the positional relationship between each first mark and the second mark.

[0053] The size of the comparison range can be set, for example, to the size of a specified margin around a first marker. Alternatively, the size of the comparison range can be set to one-tenth (one-twentieth) of the area of ​​the area map being examined.

[0054] The inspection support device 10 of the embodiment was originally able to automatically perform the correspondence association of inspection results from different inspection periods that were not established, and could display the past inspection results of each inspection part in an easy-to-observe manner.

[0055] Notes related to the technology of the embodiments are explained. When the structure to be inspected is a nuclear reactor or the like, the "inspection area map" can be a perspective view, top view, or side view of the structure including the inspection area. Furthermore, the "inspection area map" can be a photograph of the structure including the inspection area. In the "inspection area map," structures such as bridges or nuclear reactors can be stylized or simplified. When the inspection area is a structure along a specific road (guardrail, road sign, utility pole, etc.), the "inspection area map" can be a map including the specific road. The structure to be inspected can be a road within a defined section. In this case, the road can be represented by stylized lines in the "inspection area map." The locations of multiple inspection areas are illustrated on the "inspection area map."

[0056] The notes regarding the inspected parts may include the part name or part number, or the characteristics of the part. The notes may also include the inspection results (such as the degree of deterioration of the inspected part).

[0057] Inspection information can originally be digital data. In a dataset from the same period, inspection information is associated with corresponding markers. However, the correspondence between markers and inspection information from one period and those from another period is unclear. The technique used in this embodiment establishes a correspondence between markers from one period and those from another period, thereby determining that the inspection information from one period and the inspection information from another period are related to the same inspection site.

[0058] The specific examples of the present invention have been described in detail above, but these are merely illustrative and do not limit the scope of the claims. The technology described within the scope of the claims includes technologies obtained by various modifications and alterations to the specific examples described above. The technical elements illustrated in this specification or drawings exert their technical usefulness individually or in various combinations, and are not limited to the combinations described in the claims at the time of application. Furthermore, the technologies illustrated in this specification or drawings can achieve multiple objectives simultaneously, wherein achieving only one objective is itself technically useful.

[0059] Symbol Explanation

[0060] 10 - Inspection support device, 11 - Computer, 12 - Display device, 13 - Storage device, 14 - Camera, 21 - Contrast range, 100 - First dataset, 110 - First inspection area map, 111, 112 - First marker, 120 - First inspection information (first inspection information), 121, 221 - Image, 122, 222 - Annotation, 200 - Second dataset, 210 - Second inspection area map, 211, 212 - Second marker, 220 - Second inspection information (second inspection information).

Claims

1. An inspection support device, characterized in that, include: Storage device; Display device; and computer, The storage device stores the first dataset and the second dataset. The first dataset is the dataset created in the first period and includes: a first inspection area map, which marks multiple inspection areas with first labels on a diagram of the structure of the inspection object; and first inspection information, which is the information of each inspection area in the first period and establishes a corresponding association with each first label. The second dataset is a dataset created in a second period different from the first period, and includes: a second inspection area map, which, on a map with the same composition as the first inspection area map, labels each of the inspection sites with a second marker; and second inspection information, which is information about each of the inspection sites in the second period, and establishes a corresponding association with each of the second markers. The computer sets a comparison range containing the first mark for the first inspection area map and projects the comparison range onto the second inspection area map. When the second mark is included in the projected comparison range, the first inspection information corresponding to the first mark included in the comparison range and the second inspection information corresponding to the second mark included in the comparison range are displayed on the display device in a row.

2. The inspection support device according to claim 1, characterized in that, The first dataset and the second dataset include multiple types of information, and the computer displays the first dataset and the second dataset on the display device according to each type.

Images