Interlayer multiple wave spatial prediction method and device, electronic equipment and storage medium

Abstract

The application discloses a kind of interlayer multiple wave space prediction method, device, electronic equipment and storage medium.The method comprises: determining target time range based on the first time and the second time of target stratum, the reference reflection coefficient of target area included in target time range is as target reflection coefficient, the reference reflection time of interlayer multiple wave of target order is determined based on the first reflection time of primary wave corresponding to target reflection coefficient and the target number of interlayer multiple wave of target order corresponding to target reflection coefficient to second reflection time;From target reflection coefficient, the target number of interlayer multiple wave of target order corresponding to the reference reflection time between the first time and the second time in reference reflection time is obtained in target reflection coefficient pair, the target prediction value of interlayer multiple wave of target order is determined based on target number of reflection coefficient pairs.The embodiment realizes the accurate prediction of interlayer multiple wave of destination stratum.

Description

Technical Field

[0001] This invention relates to the field of exploration geophysics, and more particularly to a spatial prediction method, apparatus, electronic device, and storage medium for interlayer multiples. Background Technology

[0002] In conventional seismic data processing, the presence of multiples can lead to false structures and traps in the stacked profile, seriously misleading structural interpretation and trap finding, and posing significant risks to exploration and development. Therefore, they must be suppressed. Multiples are divided into surface multiples and interlayer multiples. Relatively speaking, surface multiples are easier to identify and suppress because their velocities differ significantly from primary multiples. Interlayer multiples, on the other hand, have highly similar kinematic and dynamic characteristics to primary multiples, making their identification and suppression very difficult.

[0003] For a given target layer, the development of inter-layer multiples varies spatially. In practical seismic data processing, targeted processing is usually performed on a specific target layer. Because the velocity difference between inter-layer multiples and primary waves is extremely small, the possibility of artifacts in the stacked profile is very high. Therefore, inter-layer multiple identification and suppression are crucial steps in targeted processing of the target layer. However, current techniques for identifying and predicting inter-layer multiples based on the target layer are relatively lacking. Typically, a combination of methods is used to directly and indiscriminately suppress inter-layer multiples. This approach increases computational load and can easily damage primary waves. Therefore, predicting inter-layer multiples before suppression is extremely important. Summary of the Invention

[0004] This invention provides a spatial prediction method, apparatus, electronic device, and storage medium for interlayer multiples, so as to achieve accurate prediction of interlayer multiples in the target layer, thereby providing prior information for the suppression of interlayer multiples and achieving accurate suppression of interlayer multiples.

[0005] According to one aspect of the present invention, a spatial prediction method for inter-layer multiples is provided, the method comprising:

[0006] Determine the reference reflection coefficient of the target area; the reference reflection coefficient is the reflection coefficient that is greater than the reflection coefficient threshold among all reflection coefficients in the target area, and the reflection coefficient is used to describe the reflection characteristics of the interface between adjacent target strata in the target area, and the target area contains multiple target strata;

[0007] A first time and a second time are obtained for the target stratum. A target time range is determined based on the first time and the second time, and the reference reflection coefficient included in the target time range is used as the target reflection coefficient. The first time is the travel time of the seismic wave to the top of the target stratum, and the second time is the travel time of the seismic wave to the bottom of the target stratum. The target time range is the time range of interlayer multiples of the target order that affect the target stratum. The time ranges of interlayer multiples of different orders are different, and each target reflection coefficient corresponds to a primary wave.

[0008] The first reflection time of the primary wave corresponding to the target reflection coefficient and the second reflection time of the target number pair of interlayer multiples of the target order corresponding to the target reflection coefficient are obtained. Based on the first reflection time and the second reflection time of the target number pair, the reference reflection time of the interlayer multiples of the target order is determined. The second reflection time includes the time of the up-reflection interface and the time of the down-reflection interface. The target number pair is the same as the target order.

[0009] The target reflection time is determined, and the target number pair of reflection coefficients for interlayer multiples of the target order corresponding to the target reflection time is obtained from the target reflection coefficients. The target predicted value of the interlayer multiples of the target order is determined based on the target number pair of reflection coefficients. The target reflection time is the reference reflection time that is between the first time and the second time in the reference reflection time. The reflection coefficient pair includes the first reflection coefficient of the uplink reflection interface and the second reflection coefficient of the downlink reflection interface.

[0010] According to another aspect of the present invention, a spatial prediction apparatus for inter-layer multiples is provided, the apparatus comprising:

[0011] A reflection coefficient determination module is used to determine a reference reflection coefficient for a target area; the reference reflection coefficient is the reflection coefficient that is greater than a reflection coefficient threshold among all reflection coefficients in the target area, and the reflection coefficient is used to describe the reflection characteristics of the interface between adjacent target strata in the target area, and the target area contains multiple target strata;

[0012] The time range determination module is used to acquire a first time and a second time of the target stratum, determine a target time range based on the first time and the second time, and use the reference reflection coefficient included in the target time range as the target reflection coefficient; the first time is the travel time of the seismic wave to the top of the target stratum, the second time is the travel time of the seismic wave to the bottom of the target stratum, and the target time range is the time range of interlayer multiples of the target order that affect the target stratum. The time ranges of interlayer multiples of different orders are different, and each target reflection coefficient corresponds to a primary wave;

[0013] The time determination module is used to obtain the first reflection time of the primary wave corresponding to the target reflection coefficient, and the second reflection time of the target number pair of interlayer multiples of the target order corresponding to the target reflection coefficient, and to determine the reference reflection time of the interlayer multiples of the target order based on the first reflection time and the second reflection time of the target number pair; the second reflection time includes the time of the up-reflection interface and the time of the down-reflection interface, and the target number pair is the same as the target order.

[0014] The prediction module is used to determine the target reflection time, obtain the target number pair of reflection coefficients for interlayer multiples of the target order corresponding to the target reflection time from the target reflection coefficients, and determine the target prediction value of the interlayer multiples of the target order based on the target number pair of reflection coefficients; the target reflection time is the reference reflection time between the first time and the second time in the reference reflection time, and the reflection coefficient pair includes the first reflection coefficient of the uplink reflection interface and the second reflection coefficient of the downlink reflection interface.

[0015] According to another aspect of the present invention, an electronic device is provided, the electronic device comprising:

[0016] At least one processor; and

[0017] A memory communicatively connected to the at least one processor; wherein,

[0018] The memory stores a computer program that can be executed by the at least one processor, which enables the at least one processor to perform the spatial prediction method for interlayer multiples as described in any embodiment of the present invention.

[0019] According to another aspect of the present invention, a computer-readable storage medium is provided, the computer-readable storage medium storing computer instructions for causing a processor to execute and implement the spatial prediction method for interlayer multiples as described in any embodiment of the present invention.

[0020] The technical solution of this invention involves determining a reference reflection coefficient for a target region. The reference reflection coefficient is the reflection coefficient among all reflection coefficients in the target region that is greater than a reflection coefficient threshold. The reflection coefficient describes the reflection characteristics of the interface between adjacent target strata in the target region, which contains multiple target strata. Further, a first time and a second time of the target strata are obtained, and a target time range is determined based on the first and second times. The reference reflection coefficients included within the target time range are used as target reflection coefficients. Since the time ranges of interlayer multiples of different orders are different, and each target reflection coefficient corresponds to a primary wave, the primary wave corresponding to the target reflection coefficient is obtained. The first reflection time and the target number of interlayer multiples of the target order corresponding to the target reflection coefficient are used to determine the reference reflection time of the interlayer multiples of the target order based on the first reflection time and the target number of the second reflection time. Further, the target reflection time is determined, and the target number of interlayer multiples of the target order corresponding to the target reflection coefficient is obtained from the target reflection coefficient. Based on the target number of the reflection coefficient pair, the target predicted value of the interlayer multiples of the target order is determined, thus achieving accurate prediction of interlayer multiples of the target layer. This provides prior information for the suppression of interlayer multiples, enabling subsequent accurate suppression of interlayer multiples.

[0021] It should be understood that the description in this section is not intended to identify key or essential features of the embodiments of the present invention, nor is it intended to limit the scope of the invention. Other features of the invention will become readily apparent from the following description. Attached Figure Description

[0022] To more clearly illustrate the technical solutions in the embodiments of the present invention, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0023] Figure 1 This is a flowchart of a spatial prediction method for inter-layer multiples provided by an embodiment of the present invention;

[0024] Figure 2 This is a schematic diagram of a seismic overlay profile applicable to an embodiment of the present invention;

[0025] Figure 3 This is a schematic diagram of the reflection coefficient profile applicable to embodiments of the present invention;

[0026] Figure 4 This is a schematic diagram of a reference reflection coefficient profile applicable to an embodiment of the present invention;

[0027] Figure 5This is a flowchart of another spatial prediction method for inter-layer multiples provided by an embodiment of the present invention;

[0028] Figure 6 This is a schematic diagram of the spatial prediction results of a first-level inter-layer multiple wave in the target stratum to which this invention is applicable;

[0029] Figure 7 This is a flowchart of another spatial prediction method for inter-layer multiples provided by an embodiment of the present invention;

[0030] Figure 8 This is a schematic diagram of the spatial prediction results of the two-stage inter-wave multiples of the target stratum to which this invention is applicable;

[0031] Figure 9 This is a schematic diagram of the superimposed cross-section after interlayer multiple wave suppression, applicable to embodiments of the present invention.

[0032] Figure 10 This is a schematic diagram of the structure of a spatial prediction device for inter-layer multiples provided in an embodiment of the present invention;

[0033] Figure 11 This is a schematic diagram of the structure of an electronic device that implements the spatial prediction method for interlayer multiples according to an embodiment of the present invention. Detailed Implementation

[0034] To enable those skilled in the art to better understand the present invention, the technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings of the embodiments of the present invention. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort should fall within the scope of protection of the present invention.

[0035] It should be noted that the terms "first," "second," "target," "reference," "candidate," etc., used in the specification, claims, and accompanying drawings of this invention are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate so that embodiments of the invention described herein can be implemented in orders other than those illustrated or described herein. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover non-exclusive inclusion; for example, a process, method, system, product, or apparatus that comprises a series of steps or units is not necessarily limited to those steps or units explicitly listed, but may include other steps or units not explicitly listed or inherent to such processes, methods, products, or apparatus.

[0036] Example 1

[0037] Figure 1 This is a flowchart of a spatial prediction method for inter-layer multiples provided in an embodiment of the present invention. This embodiment is applicable to the prediction of inter-layer multiples in various strata of a target area. The method can be executed by a spatial prediction device for inter-layer multiples, which can be implemented in hardware and / or software and can be configured in any electronic device with network communication capabilities.

[0038] like Figure 1 As shown, the spatial prediction method for inter-layer multiples of the present invention includes the following process:

[0039] S110. Determine the reference reflection coefficient of the target area; the reference reflection coefficient is the reflection coefficient that is greater than the reflection coefficient threshold among all reflection coefficients in the target area. The reflection coefficient is used to describe the reflection characteristics of the interface between adjacent target strata in the target area. The target area contains multiple target strata.

[0040] Specifically, obtain the seismic overlay profile of the target area, such as Figure 2 The reflection coefficient is obtained by inverting the earthquake stacked profile, such as... Figure 3 The reflectance coefficients greater than the reflectance coefficient threshold are determined as the reference reflectance coefficients for the target area, such as... Figure 4 The reflection coefficient threshold is determined based on the reflection intensity of each interface of the target stratum in the target area.

[0041] Each reflection coefficient corresponds to a reflection interface, and the target stratum includes the top and bottom of the target stratum. The reflection coefficient is used to describe the reflection characteristics of the interface between adjacent target strata in the target area. The reflection coefficient threshold can be set according to the basic condition that interlayer multiples are usually generated by strong reflection interfaces.

[0042] S120. Obtain the first time and the second time of the target stratum, determine the target time range based on the first time and the second time, and use the reference reflection coefficient included in the target time range as the target reflection coefficient; the first time is the travel time of the seismic wave to the top of the target stratum, the second time is the travel time of the seismic wave to the bottom of the target stratum, and the target time range is the time range of interlayer multiples of the target order that affect the target stratum.

[0043] Among them, the time range of interlayer multiples of different orders is different, and each target reflection coefficient corresponds to a primary wave.

[0044] Specifically, determining the interlayer multiples that affect the target stratum requires a large amount of computation. Therefore, in order to reduce the amount of computation, the target time range is determined, and only the reflecting layers of the interlayer multiples within the target stratum range are included in the calculation.

[0045] There is a first correlation between the first and second times of the target stratum and the target time range. Therefore, after determining the first and second times of the target stratum, the target time range can be determined by querying the first correlation.

[0046] S130. Obtain the first reflection time of the primary wave corresponding to the target reflection coefficient, and the second reflection time of the target number pair of interlayer multiples of the target order corresponding to the target reflection coefficient. Determine the reference reflection time of the interlayer multiples of the target order based on the first reflection time and the second reflection time of the target number pair. The second reflection time includes the time of the uplink reflection interface and the time of the downlink reflection interface. The target number pair is the same as the target order.

[0047] Specifically, there is a second correlation between the first reflection time and the target quantity, the second reflection time, and the reference reflection time of the interlayer multiples of the target order. After obtaining the first reflection time of the primary wave corresponding to the target reflection coefficient and the target quantity of the interlayer multiples of the target order corresponding to the target reflection coefficient, the reference reflection time of the interlayer multiples of the target order can be determined by querying the second correlation.

[0048] S140. Determine the target reflection time, obtain the target quantity pair of reflection coefficients for the interlayer multiples of the target order corresponding to the target reflection time from the target reflection coefficients, and determine the target prediction value of the interlayer multiples of the target order based on the target quantity pair of reflection coefficients; the target reflection time is the reference reflection time between the first time and the second time in the reference reflection time, and the reflection coefficient pair includes the first reflection coefficient of the uplink reflection interface and the second reflection coefficient of the downlink reflection interface.

[0049] The reference reflection time can include multiple candidate reflection time groups. The number of reference reflection times in each candidate reflection time group is the same as the number of target reflection coefficients. Each target reflection coefficient has a one-to-one corresponding reference reflection time in each candidate reflection time group. Each candidate reflection time group corresponds to a target order. That is, the reference reflection time in each candidate reflection time group is the reference reflection time of interlayer multiples belonging to the same target order among the reference reflection times of interlayer multiples of the target order.

[0050] Specifically, determining the target reflection time includes: determining whether the reference reflection time corresponding to each target reflection coefficient in the candidate reflection time group is between the first time and the second time. If so, the reference reflection time between the first time and the second time corresponding to the reference reflection time of each target reflection coefficient in the candidate reflection time group is taken as the target reflection time; and determining the reference number of interlayer multiples of the target order corresponding to the candidate reflection time group, where the reference number is the number of reference reflection times between the first time and the second time for the reference reflection time of the interlayer multiples of the target order corresponding to the target reflection coefficient. If the reference reflection time corresponding to each target reflection coefficient in the candidate reflection time group is not between the first time and the second time, then the target stratum does not have interlayer multiples of the target order corresponding to the reference reflection time.

[0051] Furthermore, the target predicted value of inter-layer multiples of the target order is determined based on the target quantity and reflection coefficient pair, including: if the reference quantity is 1, the target predicted value of the inter-layer multiples of the target order is obtained by multiplying the absolute values ​​of the target quantity and reflection coefficient pairs of the inter-layer multiples of the target order by a preset power. The preset power has a one-to-one correspondence with the target order; for example, if the target order is first, the preset power is first power; if the target order is second, the preset power is fourth power. If the reference quantity is not 1, the predicted value of the inter-layer multiples of each target order is determined based on the target quantity and reflection coefficient pair of the inter-layer multiples of each target order, and the sum of the predicted values ​​of the inter-layer multiples of each target order is used as the target predicted value.

[0052] In addition, when outputting the prediction results, the target predicted value and the reflecting horizon that will generate interlayer multiples can be output. The larger the target predicted value, the greater the probability of interlayer multiples, and vice versa.

[0053] The technical solution of this invention involves determining a reference reflection coefficient for a target region. The reference reflection coefficient is the reflection coefficient among all reflection coefficients in the target region that is greater than a reflection coefficient threshold. The reflection coefficient describes the reflection characteristics of the interface between adjacent target strata in the target region, which contains multiple target strata. Further, a first time and a second time of the target strata are obtained, and a target time range is determined based on the first and second times. The reference reflection coefficients included within the target time range are used as target reflection coefficients. Since the time ranges of interlayer multiples of different orders are different, and each target reflection coefficient corresponds to a primary wave, the primary wave corresponding to the target reflection coefficient is obtained. The first reflection time and the target number of interlayer multiples of the target order corresponding to the target reflection coefficient are used to determine the reference reflection time of the interlayer multiples of the target order based on the first reflection time and the target number of the second reflection time. Further, the target reflection time is determined, and the target number of interlayer multiples of the target order corresponding to the target reflection coefficient is obtained from the target reflection coefficient. Based on the target number of the reflection coefficient pair, the target predicted value of the interlayer multiples of the target order is determined, thus achieving accurate prediction of interlayer multiples of the target layer. This provides prior information for the suppression of interlayer multiples, enabling subsequent accurate suppression of interlayer multiples.

[0054] Example 2

[0055] Figure 5 This is a flowchart of another spatial prediction method for inter-layer multiples provided by an embodiment of the present invention. The technical solution of this embodiment provides a detailed description of the prediction process of inter-layer multiples of the target order as a first-order inter-layer multiple in the above embodiments, based on the above embodiments. This embodiment can be combined with various optional solutions in one or more of the above embodiments.

[0056] like Figure 5 As shown, the spatial prediction method for inter-layer multiples of the present invention includes the following process:

[0057] S210. Determine the reference reflection coefficient of the target area; the reference reflection coefficient is the reflection coefficient that is greater than the reflection coefficient threshold among all reflection coefficients in the target area. The reflection coefficient is used to describe the reflection characteristics of the interface between adjacent target strata in the target area. The target area contains multiple target strata.

[0058] S220. If the target order is first order, then the interlayer multiples of the target order are first-order interlayer multiples. Obtain the first time and the second time of the target stratum, determine the target time range based on the first time and the second time, and use the reference reflection coefficients included in the target time range as the target reflection coefficients.

[0059] Specifically, the upper limit of the target time range is calculated by subtracting the product of the first parameter and the first time from the product of the second parameter and the second time. The lower limit of the target time range is calculated by taking the product of the first parameter and the first time. The first and second parameters are positive integers. For example, if the first time is t1, the second time is t2, the first parameter is 3, the second parameter is 2, and the target time range is (3t1-2t2, t2).

[0060] S230, with the target quantity pair being 1, obtain the first reflection time of the primary wave corresponding to the target reflection coefficient, and the second reflection time of the target quantity pair of the first-order interlayer multiple wave corresponding to the target reflection coefficient. Based on the first reflection time and the second reflection time of the target quantity pair, determine the reference reflection time of the interlayer multiple wave of the target order.

[0061] Specifically, the difference between the time of the upward reflection interface of the first-level inter-wave multiple and the time of the downward reflection interface of the first-level inter-wave multiple is taken as the first time difference, and the sum of the first reflection time and the first time difference is determined as the reference reflection time of the first-level inter-wave multiple.

[0062] For example, if the first reflection time is tp, the time of the upward reflection interface of the first-level inter-wave multiple is tu, and the time of the downward reflection interface of the first-level inter-wave multiple is td, then the first time difference is td-tu, and the reference reflection time is tm = tp + td-tu.

[0063] S240. Determine the target reflection time, obtain the target quantity pair reflection coefficient pair of the first-level inter-wave multiple corresponding to the target reflection time from the target reflection coefficient, and determine the target prediction value of the first-level inter-wave multiple based on the target quantity pair reflection coefficient pair.

[0064] Specifically, determining the target reflection time includes: determining whether the reference reflection time of the first-order inter-layer multiple corresponding to each target reflection coefficient is between the first time and the second time; if so, then determining the reference reflection time of the first-order inter-layer multiple corresponding to the target reflection coefficient as the target reflection time, and determining the first number of first-order inter-layer multiples, the first number being the number of reference reflection times between the first time and the second time for the reference reflection time of the first-order inter-layer multiple corresponding to the target reflection coefficient; if not, then there are no first-order inter-layer multiples in the target stratum.

[0065] Furthermore, the target prediction value of the interlayer multiple wave of the target order is determined based on the target quantity and the reflection coefficient, including: if the first quantity is 1, the product of the absolute value x1 of the first reflection coefficient corresponding to the downlink reflection interface of the first interlayer multiple wave and the absolute value x2 of the second reflection coefficient corresponding to the downlink reflection interface of the first interlayer multiple wave is taken as the first product value, and the square root of the first product value is taken to obtain the target prediction value D of the first interlayer multiple wave. If the first quantity is not 1, then the predicted value of each inter-level multiple is determined based on a pair of reflection coefficients for each first-level inter-level multiple, and the sum of the predicted values ​​of each inter-level inter-level multiple is used as the target predicted value. For example, as shown... Figure 6 The spatial prediction results of inter-layer multiple waves of a target stratum in a certain area.

[0066] In addition, when outputting the prediction results, the target predicted value and the reflecting horizon that will generate interlayer multiples can be output. The larger the target predicted value, the greater the probability of interlayer multiples, and vice versa.

[0067] This embodiment's technical solution determines a reference reflection coefficient for the target area. The reference reflection coefficient is the reflection coefficient among all reflection coefficients in the target area that is greater than a reflection coefficient threshold. The reflection coefficient describes the reflection characteristics of the interface between adjacent target strata in the target area, which contains multiple target strata. When the target order is first-order, the interlayer multiples of the target order are first-order interlayer multiples, with a target quantity pair of 1. The first and second times of the target strata are obtained, and the target time range is determined based on the first and second times, significantly reducing computational load. The reference reflection coefficients included within the target time range are used as the target reflection coefficients. Further, the first reflection time of the primary wave corresponding to the target reflection coefficient and the second reflection time of the first-order interlayer multiples corresponding to the target reflection coefficient are obtained. The reference reflection time of the interlayer multiples of the target order is determined based on the first reflection time and the second reflection time of the target quantity pair. Finally, the target reflection time is determined, and the target quantity pair of reflection coefficients corresponding to the target reflection time of the first-level interlayer multiples is obtained from the target reflection coefficients. Based on the target quantity pair of reflection coefficients, the target prediction value of the first-level interlayer multiples is determined, avoiding the defect of extremely small values ​​due to multiple multiplications. This achieves accurate prediction of interlayer multiples of the target layer, provides prior information for the suppression of interlayer multiples, and enables accurate subsequent suppression of interlayer multiples.

[0068] Example 3

[0069] Figure 7 This is a flowchart of another spatial prediction method for inter-layer multiples provided by an embodiment of the present invention. The technical solution of this embodiment provides a detailed description of the prediction process of inter-layer multiples of the target order as second-order inter-layer multiples in the above embodiments, based on the above embodiments. This embodiment can be combined with various optional solutions in one or more of the above embodiments.

[0070] like Figure 7 As shown, the spatial prediction method for inter-layer multiples of the present invention includes the following process:

[0071] S310. Determine the reference reflection coefficient of the target area; the reference reflection coefficient is the reflection coefficient that is greater than the reflection coefficient threshold among all reflection coefficients in the target area. The reflection coefficient is used to describe the reflection characteristics of the interface between adjacent target strata in the target area. The target area contains multiple target strata.

[0072] S320. If the target order is second order, then the interlayer multiples of the target order are second-order interlayer multiples. Obtain the first time and the second time of the target stratum, determine the target time range based on the first time and the second time, and use the reference reflection coefficients included in the target time range as the target reflection coefficients.

[0073] Specifically, the upper limit of the target time range is calculated by subtracting the product of the third parameter and the first time from the product of the first parameter and the second time. The second time is used as the lower limit of the target time range, and the first and third parameters are positive integers. For example, if the first time is t1, the second time is t2, the first parameter is 3, the third parameter is 4, and the target time range is (4t1-3t2, t2).

[0074] S330, with a target quantity pair of 2, obtain the first reflection time of the primary wave corresponding to the target reflection coefficient, and the second reflection time of the target quantity pair of the inter-layer multiple wave corresponding to the target reflection coefficient. Based on the first reflection time and the second reflection time of the target quantity pair, determine the reference reflection time of the inter-layer multiple wave of the target order.

[0075] Specifically, the difference between the time tu1 of the first pair of upward reflection interfaces of the second-level inter-level multiple and the time td1 of the first pair of downward reflection interfaces of the second-level inter-level multiple is taken as the second time difference T1, i.e., the second time difference T1 = td1 - tu1; the difference between the time tu2 of the second pair of upward reflection interfaces of the second-level inter-level multiple and the time of the second pair of downward reflection interfaces of the second-level inter-level multiple is taken as the third time difference T2, i.e., the second time difference T1 = td2 - tu2; the sum of the first reflection time tp, the second time difference, and the third time difference is determined as the reference reflection time tm of the second-level inter-level multiple, tm = tp + T1 + T2.

[0076] S340. Determine the target reflection time, obtain the target quantity pair of reflection coefficients corresponding to the target reflection time from the target reflection coefficients, and determine the target prediction value of the second-level inter-multiple wave based on the target quantity pair of reflection coefficients.

[0077] Specifically, determining the target reflection time includes: determining whether the reference reflection time of the second-order inter-multiple wave corresponding to each target reflection coefficient is between the first time and the second time; if so, then determining the reference reflection time of the second-order inter-multiple wave corresponding to the target reflection coefficient as the target reflection time, and determining a second number of second-order inter-multiple waves, the second number being the number of reference reflection times between the first time and the second time for the reference reflection time of the second-order inter-multiple wave corresponding to the target reflection coefficient; if not, then there is no second-order inter-multiple wave in the target stratum.

[0078] Furthermore, the target prediction value of the inter-layer multiple wave, which determines the target order based on the target quantity and the reflection coefficient, includes: if the second quantity is 1, then the product of the absolute values ​​of the first and second reflection coefficients in the first pair of reflection coefficients of the second-layer inter-layer multiple wave is taken as the second product value; the product of the absolute values ​​of the first and second reflection coefficients in the second pair of reflection coefficients of the second-layer inter-layer multiple wave is taken as the third product value; and the square root of the product of the second and third product values ​​is taken to obtain the target prediction value of the second-layer inter-layer multiple wave; that is, the absolute values ​​of the first and second reflection coefficients in the first pair of reflection coefficients are x3 and x4 respectively, the absolute values ​​of the first and second reflection coefficients in the second pair of reflection coefficients are x5 and x6 respectively, the second product value is A = x3 × x4, the third product value is B = x5 × x6, and the target prediction value T is... If the second quantity is not 1, then the predicted value of each inter-second-level inter-multiple is determined based on two pairs of reflection coefficients for each inter-second-level multiple, and the sum of the predicted values ​​of each inter-second-level inter-multiple is used as the target predicted value. For example, as shown... Figure 7 Spatial prediction results of inter-layer multiple waves in a target stratum in a certain area.

[0079] In addition, when outputting the prediction results, the target predicted value and the reflecting horizon that will generate interlayer multiples can be output. The larger the target predicted value, the greater the probability of interlayer multiples, and vice versa.

[0080] Furthermore, after identifying the different orders of level multiples in the target stratum, suppressing these level multiples yields results such as... Figure 9 Superimposed profiles after interlayer multiple wave suppression, and Figure 2 In comparison, the target layer did indeed develop more interlayer multiples, and Figure 6 and Figure 8 The predictions were accurate.

[0081] In this embodiment, the technical solution determines the reference reflection coefficient of the target area. The reference reflection coefficient is the reflection coefficient that is greater than the reflection coefficient threshold among all reflection coefficients in the target area. The reflection coefficient is used to describe the reflection characteristics of the interface between adjacent target strata in the target area. The target area contains multiple target strata. If the target order is second-order, then the interlayer multiples of the target order are second-order interlayer multiples with a target quantity pair of 2. The first and second times of the target stratum are obtained, and the target time range is determined based on these times, significantly reducing computational load. The reference reflection coefficients included within the target time range are used as the target reflection coefficients. Further, the first reflection time of the primary wave corresponding to the target reflection coefficients and the second reflection time of the target quantity pair of second-order interlayer multiples corresponding to the target reflection coefficients are obtained. Based on the first reflection time and the second reflection time of the target quantity pair, the reference reflection time of the interlayer multiples of the target order is determined. Finally, the target reflection time is determined, and the target quantity pair of reflection coefficients corresponding to the target reflection time is obtained from the target reflection coefficients. Based on the target quantity pair of reflection coefficients, the target predicted value of the second-order interlayer multiples is determined, avoiding the defect of extremely small values ​​due to multiple multiplications. This achieves accurate prediction of interlayer multiples in the target stratum, providing prior information for the suppression of interlayer multiples and enabling accurate subsequent suppression.

[0082] Example 4

[0083] Figure 10 This is a schematic diagram of a spatial prediction device for inter-layer multiples provided in an embodiment of the present invention. This embodiment is applicable to the prediction of inter-layer multiples in various strata of a target area. The spatial prediction device for inter-layer multiples can be implemented in hardware and / or software and can be configured in any electronic device with network communication function.

[0084] like Figure 10 As shown, the spatial prediction device for inter-layer multiples of the present invention includes:

[0085] The reflection coefficient determination module 410 is used to determine the reference reflection coefficient of the target area; the reference reflection coefficient is the reflection coefficient that is greater than the reflection coefficient threshold among all reflection coefficients of the target area, and the reflection coefficient is used to describe the reflection characteristics of the interface between adjacent target strata in the target area, and the target area contains multiple target strata;

[0086] The time range determination module 420 is used to acquire a first time and a second time of the target stratum, determine a target time range based on the first time and the second time, and use the reference reflection coefficient included in the target time range as the target reflection coefficient; the first time is the travel time of the seismic wave to the top of the target stratum, the second time is the travel time of the seismic wave to the bottom of the target stratum, and the target time range is the time range of interlayer multiples of the target order that affect the target stratum. The time ranges of interlayer multiples of different orders are different, and each target reflection coefficient corresponds to a primary wave;

[0087] The time determination module 430 is used to obtain the first reflection time of the primary wave corresponding to the target reflection coefficient, and the second reflection time of the target number pair of interlayer multiples of the target order corresponding to the target reflection coefficient, and to determine the reference reflection time of the interlayer multiples of the target order based on the first reflection time and the second reflection time of the target number pair; the second reflection time includes the time of the uplink reflection interface and the time of the downlink reflection interface, and the target number pair is the same as the target order;

[0088] The prediction module 440 is used to determine the target reflection time, obtain the target number pair of reflection coefficients for interlayer multiples of the target order corresponding to the target reflection time from the target reflection coefficients, and determine the target prediction value of the interlayer multiples of the target order based on the target number pair of reflection coefficients; the target reflection time is the reference reflection time between the first time and the second time in the reference reflection time, and the reflection coefficient pair includes the first reflection coefficient of the uplink reflection interface and the second reflection coefficient of the downlink reflection interface.

[0089] Based on the above embodiments, optionally, a reflection coefficient determination module is used to: obtain a seismic stacked profile of the target area; perform inversion on the seismic stacked profile to obtain reflection coefficients; determine the reflection coefficients greater than a reflection coefficient threshold among the reflection coefficients as reference reflection coefficients of the target area; the reflection coefficient threshold is determined based on the reflection intensity of each interface of the target stratum in the target area.

[0090] Based on the above embodiments, optionally, if the target order is first order, then the interlayer multiples of the target order are first-order interlayer multiples. The time range determination module includes a first time range determination unit, which is used to: subtract the product of the first parameter and the first time from the product of the second parameter and the second time as the upper limit of the target time range, and the second time as the lower limit of the target time range, wherein the first parameter and the second parameter are positive integers.

[0091] Based on the above embodiments, optionally, the target quantity pair is 1, and the time determination module includes a first reflection time determination unit, which is used to: take the difference between the time of the upward reflection interface of the first-level inter-wave multiple and the time of the downward reflection interface of the first-level inter-wave multiple as a first time difference; and determine the sum of the first reflection time and the first time difference as the reference reflection time of the first-level inter-wave multiple.

[0092] Based on the above embodiments, optionally, the prediction module includes a first target reflection time determination unit, which is used to: determine whether the reference reflection time of the first-order inter-layer multiple corresponding to each target reflection coefficient is between the first time and the second time; if yes, determine the reference reflection time of the first-order inter-layer multiple corresponding to the target reflection coefficient as the target reflection time, and determine a first number of the first-order inter-layer multiples, the first number being the number of reference reflection times of the first-order inter-layer multiple corresponding to the target reflection coefficient that are between the first time and the second time; if no, then the target stratum does not have a first-order inter-layer multiple.

[0093] Based on the above embodiments, optionally, the prediction module includes a first prediction unit, which is used to: if the first quantity is 1, then take the product of the absolute value of the first reflection coefficient corresponding to the downlink reflection interface of the first-level inter-wave multiple and the absolute value of the second reflection coefficient corresponding to the downlink reflection interface of the first-level inter-wave multiple as the first product value, and take the square root of the first product value to obtain the target prediction value of the first-level inter-wave multiple; if the first quantity is not 1, then determine the prediction value of each first-level inter-wave multiple based on a pair of reflection coefficients of each first-level inter-wave multiple, and take the sum of the prediction values ​​of each first-level inter-wave multiple as the target prediction value.

[0094] Based on the above embodiments, optionally, the target order is second order, and the time range determination module includes a second time range determination unit. The second time range determination unit is used to: subtract the product of the first parameter and the second time from the product of the third parameter and the first time as the upper limit of the target time range, and the second time as the lower limit of the target time range, wherein the first parameter and the third parameter are positive integers.

[0095] Based on the above embodiments, optionally, the target quantity pair is 2, and the time determination module includes a second reflection time determination unit, which is used to: take the difference between the time of the first pair of upward reflection interfaces of the second-level inter-wave multiple and the time of the first pair of downward reflection interfaces of the second-level inter-wave multiple as a second time difference; take the difference between the time of the second pair of upward reflection interfaces of the second-level inter-wave multiple and the time of the second pair of downward reflection interfaces of the second-level inter-wave multiple as a third time difference; and determine the sum of the first reflection time, the second time difference, and the third time difference as the reference reflection time of the second-level inter-wave multiple.

[0096] Based on the above embodiments, optionally, the prediction module includes a second target reflection time determination unit, which is used to: determine whether the reference reflection time of the second-order inter-multiple corresponding to each target reflection coefficient is between the first time and the second time; if yes, determine the reference reflection time of the second-order inter-multiple corresponding to the target reflection coefficient as the target reflection time, and determine a second number of the second-order inter-multiple, the second number being the number of reference reflection times of the second-order inter-multiple corresponding to the target reflection coefficient that are between the first time and the second time; if no, then the target stratum does not have a first-order inter-multiple.

[0097] Based on the above embodiments, optionally, the prediction module includes a second prediction unit, which is used to: if the second quantity is 1, take the product of the absolute values ​​of the first reflection coefficient and the second reflection coefficient in the first pair of reflection coefficients of the second-order inter-multiple as the second product value, take the product of the absolute values ​​of the first reflection coefficient and the second reflection coefficient in the second pair of reflection coefficients of the second-order inter-multiple as the third product value, and take the fourth root of the product of the second product value and the third product value to obtain the target prediction value of the second-order inter-multiple; if the second quantity is not 1, determine the prediction value of each second-order inter-multiple based on the two pairs of reflection coefficients of each second-order inter-multiple, and take the sum of the prediction values ​​of each second-order inter-multiple as the target prediction value.

[0098] The spatial prediction device for inter-layer multiples provided in the embodiments of the present invention can execute the spatial prediction method for inter-layer multiples provided in any embodiment of the present invention, and has the corresponding functional modules and beneficial effects of the method.

[0099] Example 5

[0100] According to embodiments of this disclosure, this disclosure also provides an electronic device, a readable storage medium, and a computer program product.

[0101] Figure 11A schematic diagram of an electronic device is shown that can be used to implement the spatial prediction method for inter-layer multiples according to embodiments of the present invention. The electronic device is intended to represent various forms of digital computers, such as laptop computers, desktop computers, workbenches, personal digital assistants, servers, blade servers, mainframe computers, and other suitable computers. The electronic device can also represent various forms of mobile devices, such as personal digital processors, cellular phones, smartphones, wearable devices (e.g., helmets, glasses, watches, etc.), and other similar computing devices. The components shown herein, their connections and relationships, and their functions are merely illustrative and are not intended to limit the implementation of the invention described and / or claimed herein.

[0102] like Figure 11 As shown, the electronic device 10 includes at least one processor 11 and a memory, such as a read-only memory (ROM) 12 or a random access memory (RAM) 13, communicatively connected to the at least one processor 11. The memory stores computer programs executable by the at least one processor. The processor 11 can perform various appropriate actions and processes based on the computer program stored in the ROM 12 or loaded from storage unit 18 into the RAM 13. The RAM 13 may also store various programs and data required for the operation of the electronic device 10. The processor 11, ROM 12, and RAM 13 are interconnected via a bus 14. An input / output (I / O) interface 15 is also connected to the bus 14.

[0103] Multiple components in electronic device 10 are connected to I / O interface 15, including: input unit 16, such as keyboard, mouse, etc.; output unit 17, such as various types of displays, speakers, etc.; storage unit 18, such as disk, optical disk, etc.; and communication unit 19, such as network card, modem, wireless transceiver, etc. Communication unit 19 allows electronic device 10 to exchange information / data with other devices through computer networks such as the Internet and / or various telecommunications networks.

[0104] Processor 11 can be a variety of general-purpose and / or special-purpose processing components with processing and computing capabilities. Some examples of processor 11 include, but are not limited to, a central processing unit (CPU), a graphics processing unit (GPU), various special-purpose artificial intelligence (AI) computing chips, various processors running machine learning model algorithms, a digital signal processor (DSP), and any suitable processor, controller, microcontroller, etc. Processor 11 performs the various methods and processes described above, such as spatial prediction methods for interlayer multiple waves.

[0105] In some embodiments, the spatial prediction method for inter-layer multiples can be implemented as a computer program tangibly contained in a computer-readable storage medium, such as storage unit 18. In some embodiments, part or all of the computer program can be loaded and / or mounted on electronic device 10 via ROM 12 and / or communication unit 19. When the computer program is loaded into RAM 13 and executed by processor 11, one or more steps of the spatial prediction method for inter-layer multiples described above can be performed. Alternatively, in other embodiments, processor 11 can be configured to perform the spatial prediction method for inter-layer multiples by any other suitable means (e.g., by means of firmware).

[0106] Various embodiments of the systems and techniques described above herein can be implemented in digital electronic circuit systems, integrated circuit systems, field-programmable gate arrays (FPGAs), application-specific integrated circuits (ASICs), application-specific standard products (ASSPs), systems-on-a-chip (SoCs), complex programmable logic devices (CPLDs), computer hardware, firmware, software, and / or combinations thereof. These various embodiments may include implementations in one or more computer programs that can be executed and / or interpreted on a programmable system including at least one programmable processor, which may be a dedicated or general-purpose programmable processor, capable of receiving data and instructions from a storage system, at least one input device, and at least one output device, and transmitting data and instructions to the storage system, the at least one input device, and the at least one output device.

[0107] Computer programs used to implement the methods of the present invention may be written in any combination of one or more programming languages. These computer programs may be provided to a processor of a general-purpose computer, a special-purpose computer, or other programmable data processing device, such that when executed by the processor, the computer programs cause the functions / operations specified in the flowcharts and / or block diagrams to be performed. The computer programs may be executed entirely on a machine, partially on a machine, or as a standalone software package, partially on a machine and partially on a remote machine, or entirely on a remote machine or server.

[0108] In the context of this invention, a computer-readable storage medium can be a tangible medium that may contain or store a computer program for use by or in conjunction with an instruction execution system, apparatus, or device. A computer-readable storage medium may include, but is not limited to, electronic, magnetic, optical, electromagnetic, infrared, or semiconductor systems, apparatus, or devices, or any suitable combination thereof. Alternatively, a computer-readable storage medium may be a machine-readable signal medium. More specific examples of machine-readable storage media include electrical connections based on one or more wires, portable computer disks, hard disks, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), optical fibers, portable compact disk read-only memory (CD-ROM), optical storage devices, magnetic storage devices, or any suitable combination thereof.

[0109] To provide interaction with a user, the systems and techniques described herein can be implemented on an electronic device having: a display device (e.g., a CRT (cathode ray tube) or LCD (liquid crystal display) monitor) for displaying information to the user; and a keyboard and pointing device (e.g., a mouse or trackball) through which the user provides input to the electronic device. Other types of devices can also be used to provide interaction with the user; for example, feedback provided to the user can be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback); and input from the user can be received in any form (including sound input, voice input, or tactile input).

[0110] The systems and technologies described herein can be implemented in computing systems that include backend components (e.g., as data servers), or computing systems that include middleware components (e.g., application servers), or computing systems that include frontend components (e.g., user computers with graphical user interfaces or web browsers through which users can interact with implementations of the systems and technologies described herein), or any combination of such backend, middleware, or frontend components. The components of the system can be interconnected via digital data communication of any form or medium (e.g., communication networks). Examples of communication networks include local area networks (LANs), wide area networks (WANs), blockchain networks, and the Internet.

[0111] A computing system can include clients and servers. Clients and servers are generally located far apart and typically interact through a communication network. The client-server relationship is created by computer programs running on the respective computers and having a client-server relationship with each other. The server can be a cloud server, also known as a cloud computing server or cloud host, which is a hosting product within the cloud computing service system to address the shortcomings of traditional physical hosts and VPS services, such as high management difficulty and weak business scalability.

[0112] It should be understood that the various forms of processes shown above can be used, with steps reordered, added, or deleted. For example, the steps described in this invention can be executed in parallel, sequentially, or in different orders, as long as the desired result of the technical solution of this invention can be achieved, and this is not limited herein.

[0113] The specific embodiments described above do not constitute a limitation on the scope of protection of this invention. Those skilled in the art should understand that various modifications, combinations, sub-combinations, and substitutions can be made according to design requirements and other factors. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of this invention should be included within the scope of protection of this invention.

Claims

1. A spatial prediction method for inter-layer multiples, characterized in that, The method includes: Determine the reference reflection coefficient of the target area; the reference reflection coefficient is the reflection coefficient that is greater than the reflection coefficient threshold among all reflection coefficients in the target area, and the reflection coefficient is used to describe the reflection characteristics of the interface between adjacent target strata in the target area, and the target area contains multiple target strata; A first time and a second time are obtained for the target stratum. A target time range is determined based on the first time and the second time, and the reference reflection coefficient included in the target time range is used as the target reflection coefficient. The first time is the travel time of the seismic wave to the top of the target stratum, and the second time is the travel time of the seismic wave to the bottom of the target stratum. The target time range is the time range of interlayer multiples of the target order that affect the target stratum. The time ranges of interlayer multiples of different orders are different, and each target reflection coefficient corresponds to a primary wave. The first reflection time of the primary wave corresponding to the target reflection coefficient and the second reflection time of the target number pair of interlayer multiples of the target order corresponding to the target reflection coefficient are obtained. Based on the first reflection time and the second reflection time of the target number pair, the reference reflection time of the interlayer multiples of the target order is determined. The second reflection time includes the time of the up-reflection interface and the time of the down-reflection interface. The target number pair is the same as the target order. The target reflection time is determined, and the target number pair of reflection coefficients for the interlayer multiples of the target order corresponding to the target reflection time is obtained from the target reflection coefficients. Based on the target number pair of reflection coefficients, the target prediction value of the interlayer multiples of the target order is determined. The target reflection time is the reference reflection time that is between the first time and the second time in the reference reflection time. The reflection coefficient pair includes the first reflection coefficient of the uplink reflection interface and the second reflection coefficient of the downlink reflection interface. Wherein, if the target order is first order, then the interlayer multiples of the target order are first-order interlayer multiples. The target time range is determined based on the first time and the second time, including: The product of the first parameter and the first time minus the product of the second parameter and the second time is used as the upper limit of the target time range, and the second time is used as the lower limit of the target time range. The first parameter and the second parameter are positive integers. Wherein, if the target order is second-order, then the interlayer multiples of the target order are second-order interlayer multiples. The target time range is determined based on the first time and the second time, including: The upper limit of the target time range is obtained by subtracting the product of the third parameter and the first time from the product of the first parameter and the second time, and the lower limit of the target time range is obtained by taking the product of the third parameter and the first time. The first parameter and the third parameter are positive integers.

2. The method according to claim 1, characterized in that, Determine the reference reflectance of the target area, including: Obtain the seismic stacked profile of the target area, and invert the seismic stacked profile to obtain the reflection coefficient; The reflection coefficients that are greater than the reflection coefficient threshold are determined as the reference reflection coefficients of the target area; the reflection coefficient threshold is determined based on the reflection intensity of each interface of the target stratum in the target area.

3. The method according to claim 1, characterized in that, The target order is first-order, the target quantity pair is 1, and the reference reflection time of the interlayer multiple of the target order is determined based on the first reflection time and the second reflection time of the target quantity pair, including: The difference between the time of the upward reflection interface of the first-order inter-wave multiple and the time of the downward reflection interface of the first-order inter-wave multiple is taken as the first time difference. The sum of the first reflection time and the first time difference is determined as the reference reflection time of the first-order inter-wave multiple.

4. The method according to claim 3, characterized in that, Determining the target reflection time includes: Determine whether the reference reflection time of the first-order inter-wave multiple corresponding to each target reflection coefficient is between the first time and the second time; If so, the reference reflection time of the first-order inter-wave multiple corresponding to the target reflection coefficient is determined as the target reflection time, and a first number of the first-order inter-wave multiple is determined, wherein the first number is the number of reference reflection times between the first time and the second time for the reference reflection time of the first-order inter-wave multiple corresponding to the target reflection coefficient. If not, then the target stratum does not have inter-stratum multiple waves.

5. The method according to claim 4, characterized in that, Based on the target quantity and reflection coefficient, the target prediction value of the interlayer multiple wave of the target order is determined, including: If the first quantity is 1, then the product of the absolute value of the first reflection coefficient corresponding to the downlink reflection interface of the first-level inter-wavelet and the absolute value of the second reflection coefficient corresponding to the downlink reflection interface of the first-level inter-wavelet is taken as the first product value, and the square root of the first product value is used to obtain the target prediction value of the first-level inter-wavelet. If the first quantity is not 1, then the predicted value of each inter-level multiple is determined based on a pair of reflection coefficients of each first-level inter-level multiple, and the sum of the predicted values ​​of each inter-level multiple is used as the target predicted value.

6. The method according to claim 1, characterized in that, The target order is second-order, the target quantity pair is 2, and the reference reflection time of the interlayer multiple of the target order is determined based on the first reflection time and the second reflection time of the target quantity pair, including: The difference between the time of the first pair of upward reflection interfaces of the second-stage inter-wavelet and the time of the first pair of downward reflection interfaces of the second-stage inter-wavelet is taken as the second time difference. The difference between the time of the second pair of upward reflection interfaces of the second-stage inter-wavelet and the time of the second pair of downward reflection interfaces of the second-stage inter-wavelet is taken as the third time difference; the sum of the first reflection time, the second time difference and the third time difference is determined as the reference reflection time of the second-stage inter-wavelet.

7. The method according to claim 6, characterized in that, Determining the target reflection time includes: Determine whether the reference reflection time of the second-order inter-wave multiple corresponding to each target reflection coefficient is between the first time and the second time; If so, then the reference reflection time of the second-order inter-multiple wave corresponding to the target reflection coefficient is determined as the target reflection time, and a second number of the second-order inter-multiple wave is determined, the second number being the number of reference reflection times between the first time and the second time for the reference reflection time of the second-order inter-multiple wave corresponding to the target reflection coefficient. If not, then the target stratum does not have inter-secondary multiple waves.

8. The method according to claim 7, characterized in that, Based on the target quantity and reflection coefficient, the target prediction value of the interlayer multiple wave of the target order is determined, including: If the second quantity is 1, then the product of the absolute values ​​of the first reflection coefficient and the second reflection coefficient in the first pair of reflection coefficients of the second-level inter-multiple is taken as the second product value, and the product of the absolute values ​​of the first reflection coefficient and the second reflection coefficient in the second pair of reflection coefficients of the second-level inter-multiple is taken as the third product value. The fourth root of the product of the second product value and the third product value is used to obtain the target prediction value of the second-level inter-multiple. If the second quantity is not 1, then the predicted value of each inter-secondary multiple is determined based on the two pairs of reflection coefficients of each inter-secondary multiple, and the sum of the predicted values ​​of each inter-secondary multiple is used as the target predicted value.

9. A spatial prediction device for inter-layer multiples, characterized in that, The apparatus for performing the spatial prediction method for inter-layer multiples according to any one of claims 1-8 comprises: A reflection coefficient determination module is used to determine a reference reflection coefficient for a target area; the reference reflection coefficient is the reflection coefficient that is greater than a reflection coefficient threshold among all reflection coefficients in the target area, and the reflection coefficient is used to describe the reflection characteristics of the interface between adjacent target strata in the target area, and the target area contains multiple target strata; The time range determination module is used to acquire a first time and a second time of the target stratum, determine a target time range based on the first time and the second time, and use the reference reflection coefficient included in the target time range as the target reflection coefficient; the first time is the travel time of the seismic wave to the top of the target stratum, the second time is the travel time of the seismic wave to the bottom of the target stratum, and the target time range is the time range of interlayer multiples of the target order that affect the target stratum. The time ranges of interlayer multiples of different orders are different, and each target reflection coefficient corresponds to a primary wave; The time determination module is used to obtain the first reflection time of the primary wave corresponding to the target reflection coefficient, and the second reflection time of the target number pair of interlayer multiples of the target order corresponding to the target reflection coefficient, and to determine the reference reflection time of the interlayer multiples of the target order based on the first reflection time and the second reflection time of the target number pair; the second reflection time includes the time of the up-reflection interface and the time of the down-reflection interface, and the target number pair is the same as the target order. The prediction module is used to determine the target reflection time, obtain the target number pair of reflection coefficients for interlayer multiples of the target order corresponding to the target reflection time from the target reflection coefficients, and determine the target prediction value of the interlayer multiples of the target order based on the target number pair of reflection coefficients; the target reflection time is the reference reflection time between the first time and the second time in the reference reflection time, and the reflection coefficient pair includes the first reflection coefficient of the uplink reflection interface and the second reflection coefficient of the downlink reflection interface.

10. An electronic device, characterized in that, The electronic device includes: At least one processor; and A memory communicatively connected to the at least one processor; wherein, The memory stores a computer program that can be executed by the at least one processor to enable the at least one processor to perform the spatial prediction method for interlayer multiples as described in any one of claims 1-8.

11. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores computer instructions that cause a processor to execute the spatial prediction method for interlayer multiples as described in any one of claims 1-8.

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