Sample table for table type X-ray diffractometer

Abstract

The invention provides a sample table for a table type X-ray diffractometer, and relates to the field of diffractometers, the sample table comprises a sample rack, a sample table structure is inserted in the sample rack, the sample rack is provided with a lifting locking part used for limiting the sample table structure, the lifting locking part comprises a first T-shaped tube mounted at the bottom of the sample rack, and the first T-shaped tube is provided with a second T-shaped tube; a second T-shaped pipe is inserted into the bottom end of the first T-shaped pipe, a second T-shaped rod is connected to the second T-shaped pipe in a penetrating mode, a first T-shaped rod is connected to the top end of the second T-shaped rod, the top of the first T-shaped rod penetrates through the sample frame and extends into the sample frame, and the top of the first T-shaped rod makes contact with the bottom of the sample table structure. According to the sample table structure, the lifting locking part is arranged, the lifting locking part can complete locking of the sample table structure in a mode of rotating after lifting, the lifting locking part can complete unlocking action by moving downwards and resetting after rotating, operation is convenient and fast, use is facilitated, and the abrasion problem of traditional screw adjustment is avoided.

Description

Technical Field

[0001] This invention relates to the field of diffractometers, and more specifically, to a sample stage for a benchtop X-ray diffractometer. Background Technology

[0002] The existing benchtop X-ray diffractometer sample stage has the following problems: The adjustment mechanism is complex: traditional sample stages use screw or gear transmission to adjust the height, which is bulky and easy to wear, and the accuracy decreases after long-term use; Unreliable fixation: Some sample stages rely on friction locking, which is prone to displacement and affects the accuracy of diffraction data; Calibration is difficult: the alignment of the sample stage and the optical path requires repeated adjustments, and there is a lack of a rapid fine-tuning mechanism, resulting in low operating efficiency.

[0003] Therefore, we have made improvements to this and proposed a sample stage for benchtop X-ray diffractometers. Summary of the Invention

[0004] The purpose of this invention is to address the following issues with existing benchtop X-ray diffractometers: complex sample stage adjustment mechanisms; traditional sample stages use screw or gear transmissions for height adjustment, resulting in bulky structures that are prone to wear and experience decreased accuracy over long-term use; unreliable fixing; some sample stages rely on friction locking, which is prone to displacement and affects the accuracy of diffraction data; and difficult calibration; the sample stage requires repeated adjustments to align with the optical path, lacking a rapid fine-tuning mechanism, leading to low operational efficiency.

[0005] To achieve the above-mentioned objectives, the present invention provides a sample stage for a benchtop X-ray diffractometer to improve the aforementioned problems.

[0006] The application is as follows: The sample holder includes a sample stage structure inserted inside it. The sample holder also has a lifting and locking part for limiting the position of the sample stage structure. The lifting and locking part includes a first T-shaped tube installed at the bottom of the sample holder. A second T-shaped tube is inserted into the bottom end of the first T-shaped tube. A second T-shaped rod is inserted through the second T-shaped tube. A first T-shaped rod is connected to the top end of the second T-shaped rod. The top end of the first T-shaped rod passes through the sample holder and extends into its interior, contacting the bottom of the sample stage structure. A compression spring is provided between the first T-shaped rod and the second T-shaped tube. The first T-shaped tube has a vertical groove and a horizontal groove communicating with it. A lever is provided between the vertical groove and the horizontal groove, with one end of the lever fixedly connected to the second T-shaped tube.

[0007] As a preferred technical solution of this application, the sample stage structure includes a sample base inserted into a sample holder, the top of the sample base has a groove, and the sample stage body is placed in the groove, and the bottom of the sample base is in contact with the top of the first T-shaped rod.

[0008] As a preferred technical solution of this application, the lifting and locking part further includes an adjusting set screw, which is threadedly connected to the sample holder. The adjusting set screw is located above the main body of the sample stage, and the bottom end of the adjusting set screw abuts against the top of the main body of the sample stage when the main body of the sample stage is raised. Two lateral positioning blocks are installed inside the sample holder, and the two lateral positioning blocks are respectively located on both sides of the sample base.

[0009] As a preferred technical solution of this application, a positioning pin is also installed inside the sample holder. The positioning pin is located at the front end of the sample base insertion direction to limit the insertion depth of the sample base.

[0010] As a preferred technical solution of this application, a dovetail seat is provided on one side of the sample holder, a dovetail groove is provided on the dovetail seat, a dovetail block is inserted into the dovetail groove, and one side of the dovetail block is connected to the sample holder.

[0011] As a preferred technical solution of this application, a limiting block is installed on the top of the dovetail base, and the limiting block is used to limit the position of the dovetail base.

[0012] As a preferred technical solution of this application, a support base is installed at the bottom of the dovetail block, and an mounting base is installed at the bottom of the support base. Both the support base and the mounting base are provided with mounting holes. An adjusting bolt is threaded onto the support base, and the top of the adjusting bolt contacts the bottom of the dovetail block.

[0013] As a preferred technical solution of this application, both the limiting block and the sample holder have mounting grooves on their tops, and a laser knife is inserted between the two mounting grooves.

[0014] As a preferred technical solution of this application, the top of the adjusting set screw is provided with a scale assembly for recording its adjustment depth. The scale assembly includes a knob fixedly installed on the top of the adjusting set screw. A cam groove extending inward is opened at the center of the top of the knob. A T-shaped central shaft is sleeved on the knob through the cam groove. The central shaft extends above the knob. A rotating cam is rotatably sleeved on the outer side of the top of the central shaft. The rotating cam matches the cam groove. A turntable is fixedly installed on the top of the rotating cam, and an extension shaft is fixedly installed on the outer side of the turntable. An inwardly extending slot is opened on the inner side of the extension shaft. Arc-shaped plates are spaced apart on the outer side of the adjusting set screw, and the slot matches the side wall of the arc-shaped plate. The inner side of the arc-shaped plate has a preset scale, and both sides of the arc-shaped plate are preset with anti-slip cloth. The inner side of the slot is also preset with anti-slip cloth. By the contact of the two sets of anti-slip cloths, the friction between the arc-shaped plate and the extension shaft is increased, thereby preventing the adjusting set screw from slipping under the action of external factors.

[0015] As a preferred technical solution of this application, the bottom of the sample base is provided with a limiting component for preventing the sample base from shifting. The limiting component includes a bottom groove formed at the bottom of the sample base. The sample base is rotatably sleeved with a limiting T-shaft through the bottom groove. The limiting T-shaft passes through the sample holder and the first T-shaped tube and extends to the bottom of the first T-shaped tube. The sample holder and the first T-shaped tube are both rotatably sleeved with the limiting T-shaft. An arc-shaped ring plate is sleeved on the bottom of the outer side of the limiting T-shaft, and the inner side of the arc-shaped ring plate is fixedly connected to the outer side of the second T-shaped tube. The sample base has symmetrically formed T-shaped circular grooves inside, which are connected to the groove. The sample base is sleeved with a pressing shaft through the circular groove. One end of the pressing shaft contacts the outer side of the sample stage body, and the other end of the pressing shaft is fixedly installed with a limiting spring fixedly connected to the inner side of the sample base.

[0016] Compared with existing technologies, this invention achieves rapid and free clamping and unclamping of samples and tools through a lifting and rotating locking mechanism, significantly improving operational efficiency. This mechanical structure effectively avoids the wear problems of traditional threaded drives, possessing excellent durability and long-term accuracy retention. Simultaneously, the stable clamping achieved using spring force and the multi-dimensional anti-offset design ensure ultra-high sample stability during testing, guaranteeing the accuracy and repeatability of diffraction data. The fine-tuning set screw integrated above the sample stage, combined with the anti-loosening scale component, supports precise and visible height and tilt angle adjustments, making the optical path alignment process more accurate and faster. Furthermore, the modular sample stage design and quick-release laser blade slot further enhance the application flexibility and functional expandability of the equipment. The overall structure has good rigidity and incorporates user-friendly operational details, improving measurement reliability while optimizing the user experience. Attached Figure Description

[0017] Figure 1 This is a three-dimensional structural diagram of a sample stage for a benchtop X-ray diffractometer according to the present invention. Figure 2 This is a bottom view of the sample stage for a benchtop X-ray diffractometer according to the present invention. Figure 3 This is a side view of a sample stage for a benchtop X-ray diffractometer according to the present invention. Figure 4 This is a partial bottom view of the sample stage for a benchtop X-ray diffractometer according to the present invention. Figure 5 This is a partial side view of the sample stage for a benchtop X-ray diffractometer according to the present invention. Figure 6 This is a cross-sectional view of the first T-shaped tube for a benchtop X-ray diffractometer according to the present invention. Figure 7 This is a structural diagram of a mounting slot for a benchtop X-ray diffractometer according to the present invention; Figure 8 This is a structural diagram of a groove for a benchtop X-ray diffractometer according to the present invention; Figure 9 This is an exploded view of the connection structure of a calibration assembly for a benchtop X-ray diffractometer according to the present invention. Figure 10 This is a schematic diagram of the connection structure of a limiting component for a benchtop X-ray diffractometer according to the present invention. Figure 11 This is a cross-sectional view of the internal structure of a sample base for a benchtop X-ray diffractometer according to the present invention.

[0018] The image shows: 1. Sample holder; 101. Lateral positioning block; 102. Positioning pin; 2. Sample base; 201. Groove; 202. Sample stage body; 3. First T-shaped tube; 301. Vertical groove; 302. Horizontal groove; 304. First T-shaped rod; 305. Second T-shaped rod; 306. Second T-shaped tube; 307. Lever; 308. Compression spring; 4. Adjusting set screw; 5. Light-emitting knife; 601. Dovetail base; 602. Dovetail groove; 603. Dovetail block; 604. Limiting block; 605, Adjusting bolt; 606, Support base; 607, Mounting base; 7, Mounting groove; 8, Scale assembly; 801, Knob; 802, Cam groove; 803, Central shaft; 804, Rotary cam; 805, Turntable; 806, Extension shaft; 807, Slot; 808, Arc plate; 9, Limiting assembly; 901, Arc ring plate; 902, Limiting T-shaft; 903, Bottom groove; 10, Circular groove; 11, Extrusion shaft; 12, Limiting spring. Detailed Implementation

[0019] To enable those skilled in the art to better understand the present invention, the technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings of the embodiments of the present invention. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort should fall within the scope of protection of the present invention.

[0020] As described in the background section, the current tabletop X-ray diffractometer's sample stage adjustment mechanism is complex: traditional sample stages use screw or gear transmission to adjust height, which is bulky and prone to wear, resulting in decreased accuracy after long-term use; the fixing is unreliable: some sample stages rely on friction locking, which is prone to displacement, affecting the accuracy of diffraction data; calibration is difficult: the alignment of the sample stage with the optical path requires repeated adjustments, lacking a rapid fine-tuning mechanism, resulting in low operating efficiency.

[0021] For details, please refer to Figure 1 - Figure 11 , a sample stage for a benchtop X-ray diffractometer.

[0022] The sample holder 1 includes a sample stage structure inserted inside it. The sample holder 1 is equipped with a lifting and locking part for limiting the position of the sample stage structure. The lifting and locking part includes a first T-shaped tube 3 installed at the bottom of the sample holder 1. A second T-shaped tube 306 is inserted into the bottom end of the first T-shaped tube 3. A second T-shaped rod 305 is inserted through the second T-shaped tube 306. A first T-shaped rod 304 is connected to the top end of the second T-shaped rod 305. The top end of the first T-shaped rod 304 passes through the sample holder 1 and extends into the interior of the sample holder 1. The top end of the first T-shaped rod 304 contacts the bottom of the sample stage structure. A compression spring 308 is provided between the first T-shaped rod 304 and the second T-shaped tube 306. A vertical groove 301 and a horizontal groove 302 communicating with the vertical groove 301 are provided on the first T-shaped tube 3. A lever 307 is provided between the vertical groove 301 and the horizontal groove 302. One end of the lever 307 is fixedly connected to the second T-shaped tube 306. The lifting and locking mechanism locks the sample stage structure by lifting and rotating, and unlocks it by rotating and lowering it back to its original position. This convenient and easy-to-use mechanism avoids the wear problems associated with traditional screw adjustments. It also enables micron-level precision positioning of the sample stage, ensuring no displacement during testing.

[0023] To enable those skilled in the art to better understand the present invention, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings.

[0024] It should be noted that, unless otherwise specified, the embodiments and features and technical solutions in the embodiments of the present invention can be combined with each other.

[0025] It should be noted that similar labels and letters in the following figures indicate similar items. Therefore, once an item is defined in one figure, it does not need to be further defined and explained in subsequent figures.

[0026] Furthermore, the sample stage structure includes a sample base 2 inserted into the sample holder 1. The top of the sample base 2 is provided with a groove 201, and the sample stage body 202 is placed in the groove 201. The bottom of the sample base 2 contacts the top of the first T-shaped rod 304. The groove 201 can position the sample stage body 202. The sample stage body 202 is directly inserted into the groove 201, which facilitates the replacement of the sample stage body 202. Furthermore, the lifting and locking part also includes an adjusting screw 4, which is threaded onto the sample holder 1. The adjusting screw 4 is located above the sample stage body 202, and the bottom end of the adjusting screw 4 abuts against the top of the sample stage body 202 when the sample stage body 202 is raised. By rotating the adjusting screw 4, the height and tilt angle of the sample stage body 202 can be finely adjusted so that the plane of the sample stage body 202 is aligned with the X-ray beam path.

[0027] Furthermore, two lateral positioning blocks 101 are installed inside the sample holder 1. The two lateral positioning blocks 101 are located on both sides of the sample base 2. The lateral positioning blocks 101 are used to limit the sides of the sample base 2 to reduce the deviation and shaking of the sample base 2.

[0028] Furthermore, a positioning pin 102 is also installed inside the sample holder 1. The positioning pin 102 is located at the front end of the sample base 2 in the insertion direction to limit the insertion depth of the sample base 2 and ensure that the sample base 2 is inserted in place.

[0029] In use, insert the sample base 2 between the two side positioning blocks 101. When the sample base 2 contacts the positioning pin 102, it means that it is inserted in place. Push the lever 307 upward and then rotate the lever 307 into the horizontal groove 302. When the lever 307 is pushed upward, it drives the second T-shaped tube 306 to push upward to compress the compression spring 308. The force of the compression spring 308 pushes the first T-shaped rod 304 to rise, thereby pushing the sample base 2 so that the top of the sample stage body 202 abuts against the adjusting screw 4 to complete the locking action. When unlocking, rotating the push lever 307 causes it to return from the horizontal slot 302 to the vertical slot 301. At this time, the second T-shaped tube 306 descends, and the first T-shaped rod 304 also descends to release the lock on the sample base 2 and the sample stage body 202. Pulling the sample base 2 outward will pull it out.

[0030] Furthermore, a dovetail seat 601 is provided on one side of the sample holder 1, and a dovetail groove 602 is provided on the dovetail seat 601. A dovetail block 603 is inserted into the dovetail groove 602, and one side of the dovetail block 603 is connected to the sample holder 1. The dovetail block 603 and the dovetail groove 602 cooperate with each other to connect the sample holder 1 and the dovetail seat 601 together.

[0031] Furthermore, a limiting block 604 is installed on the top of the dovetail seat 601. The limiting block 604 is used to limit the dovetail block 603. The limiting block 604 is installed on the top of the dovetail seat 601 by bolts to reduce the possibility of the dovetail block 603 disengaging upward from the dovetail groove 602.

[0032] Furthermore, a support base 606 is installed at the bottom of the dovetail base 601, and a mounting base 607 is installed at the bottom of the support base 606. Mounting holes are installed on both the support base 606 and the mounting base 607. The mounting holes are used to cooperate with bolts to realize the connection between the present application and the support surface.

[0033] Furthermore, the support base 606 is threaded with an adjusting bolt 605. The top of the adjusting bolt 605 contacts the bottom of the dovetail block 603. Rotating the adjusting bolt 605 can adjust the height of the dovetail block 603, thereby adjusting the height of the sample holder 1.

[0034] Furthermore, both the limiting block 604 and the sample holder 1 have mounting slots 7 on their tops, and a beam-emitting knife 5 is inserted between the two mounting slots 7. The beam-emitting knife 5 is installed by inserting into the mounting slots 7, which can achieve quick installation and quick removal. For example, in this application, the beam-emitting knife 5 has two gap incident widths of 2mm and 4mm on its front and back sides.

[0035] The top of the adjusting set screw 4 is provided with a scale assembly 8 for recording its adjustment depth. The scale assembly 8 includes a knob 801 fixedly installed on the top of the adjusting set screw 4. A cam groove 802 extending inward is opened at the center of the top of the knob 801. A T-shaped central shaft 803 is fitted onto the knob 801 through the cam groove 802. The central shaft 803 extends above the knob 801. A rotating cam 804 is rotatably fitted onto the outer side of the top of the central shaft 803. The rotating cam 804 matches the cam groove 802. A turntable 805 is fixedly installed on the top of the rotating cam 804. An extension shaft 806 is fixedly installed on the outer side of the turntable 805. An inwardly extending slot 807 is provided on the inner side of the extension shaft 806. An arc-shaped plate 808 is provided at intervals on the outer side of the adjusting top screw 4. The slot 807 matches the side wall of the arc-shaped plate 808. The inner side of the arc-shaped plate 808 is preset with a scale. Both sides of the arc-shaped plate 808 are preset with anti-slip cloth. The inner side of the slot 807 is also preset with anti-slip cloth. By the contact of the two sets of anti-slip cloths, the friction between the arc-shaped plate 808 and the extension shaft 806 is increased, thereby preventing the adjusting top screw 4 from slipping under the action of external factors. The knob 801 can be rotated by adjusting the set screw 4, or the knob 801 can be used to directly rotate the set screw 4. The knob 801 is continuously adjusted in position with the set screw 4 until it is adjusted to the appropriate position. At this time, the turntable 805 can be rotated, which will drive the rotating cam 804 and the extension shaft 806 to rotate around the central axis 803 until the slot 807 on one side of the extension shaft 806 is fully pressed and engaged with the outer side of the arc plate 808. At this time, the rotating cam 804 rotates to the cam groove 80. The top of 2 can be pressed down on the turntable 805 to engage the rotary cam 804, thereby engaging the turntable 805 with the knob 801 and pressing the extension shaft 806 with the arc plate 808. The friction between the arc plate 808 and the extension shaft 806 is used to prevent the adjusting screw 4 from slipping due to external factors. At the same time, by observing the contact position between the upper surface of the extension shaft 806 and the preset scale on the inner side of the arc plate 808, the adjustment depth of the adjusting screw 4 can be seen intuitively.

[0036] Furthermore, the bottom of the sample base 2 is provided with a limiting component 9 to prevent the sample base 2 from shifting. The limiting component 9 includes a bottom groove 903 opened at the bottom of the sample base 2. The sample base 2 is rotatably sleeved with a limiting T-shaft 902 through the bottom groove 903. The limiting T-shaft 902 passes through the sample holder 1 and the first T-shaped tube 3 and extends to the bottom of the first T-shaped tube 3. The sample holder 1 and the first T-shaped tube 3 are both rotatably sleeved with the limiting T-shaft 902. An arc-shaped ring plate 901 is sleeved on the bottom of the outer side of the limiting T-shaft 902, and the inner side of the arc-shaped ring plate 901 is fixedly connected to the outer side of the second T-shaped tube 306. The sample base 2 is symmetrically provided with T-shaped circular grooves 10. The circular grooves 10 and the grooves 201 are connected. The sample base 2 is sleeved with a pressing shaft 11 through the circular grooves 10. One end of the pressing shaft 11 is in contact with the outer side of the sample stage body 202. The other end of the pressing shaft 11 is fixedly installed with a limiting spring 12 fixedly connected to the inner side of the sample base 2. In use, the sample stage body 202 is first placed inside the groove 201, and the two sets of extrusion shafts 11 are squeezed to compress the limiting spring 12. Then, the reaction force of the limiting spring 12 clamps and limits the sample stage body 202. This operation can be adapted to sample stage bodies 202 of different sizes. At the same time, it can also fix the sample stage body 202 to prevent the sample stage body 202 from shifting due to external vibration during the lifting process. In addition, the bottom groove 903 opened at the bottom of the sample base 2, combined with the limiting T shaft 902 and the positioning pin 102, can fully limit the sample base 2, and prevent the sample base 2 from tilting due to the pressure applied not being in the center when the adjusting screw 4 squeezes the sample base 2.

[0037] In this invention, unless otherwise explicitly specified and limited, the terms "installation," "connection," "linking," and "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection, an electrical connection, or a connection that allows communication between them; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components, unless otherwise explicitly limited. Those skilled in the art can understand the specific meaning of the above terms in this invention according to the specific circumstances.

Claims

1. A sample stage for a benchtop X-ray diffractometer, characterized in that, The sample holder (1) includes a sample stage structure inserted inside it. The sample holder (1) is equipped with a lifting and locking part for limiting the position of the sample stage structure. The lifting and locking part includes a first T-shaped tube (3) installed at the bottom of the sample holder (1). A second T-shaped tube (306) is inserted into the bottom end of the first T-shaped tube (3). A second T-shaped rod (305) is inserted through the second T-shaped tube (306). A first T-shaped rod (304) is connected to the top end of the second T-shaped rod (305). The top end of the first T-shaped rod (304) passes through... The sample holder (1) extends through the sample holder (1) and into the interior of the sample holder (1), and the top of the first T-shaped rod (304) contacts the bottom of the sample stage structure. A compression spring (308) is provided between the first T-shaped rod (304) and the second T-shaped tube (306). A vertical groove (301) and a horizontal groove (302) communicating with the vertical groove (301) are provided on the first T-shaped tube (3). A lever (307) is provided between the vertical groove (301) and the horizontal groove (302). One end of the lever (307) is fixedly connected to the second T-shaped tube (306).

2. A sample stage for a benchtop X-ray diffractometer according to claim 1, characterized in that, The sample stage structure includes a sample base (2) inserted into the sample holder (1). The top of the sample base (2) has a groove (201) and the sample stage body (202) is placed in the groove (201). The bottom of the sample base (2) is in contact with the top of the first T-shaped rod (304).

3. A sample stage for a benchtop X-ray diffractometer according to claim 2, characterized in that, The lifting and locking part also includes an adjusting screw (4), which is threadedly connected to the sample holder (1). The adjusting screw (4) is located above the sample stage body (202), and the bottom end of the adjusting screw (4) abuts against the top of the sample stage body (202) when the sample stage body (202) is raised. Two lateral positioning blocks (101) are installed inside the sample holder (1), and the two lateral positioning blocks (101) are located on both sides of the sample base (2).

4. A sample stage for a benchtop X-ray diffractometer according to claim 2, characterized in that, The sample holder (1) is also equipped with a positioning pin (102), which is located at the front end of the sample base (2) in the insertion direction to limit the insertion depth of the sample base (2).

5. A sample stage for a benchtop X-ray diffractometer according to claim 1, characterized in that, A dovetail seat (601) is provided on one side of the sample holder (1), and a dovetail groove (602) is provided on the dovetail seat (601). A dovetail block (603) is inserted into the dovetail groove (602), and one side of the dovetail block (603) is connected to the sample holder (1).

6. A sample stage for a benchtop X-ray diffractometer according to claim 5, characterized in that, A limiting block (604) is installed on the top of the dovetail base (601), and the limiting block (604) is used to limit the dovetail block (603).

7. A sample stage for a benchtop X-ray diffractometer according to claim 6, characterized in that, The bottom of the dovetail base (601) is equipped with a support base (606), and the bottom of the support base (606) is equipped with a mounting base (607). Both the support base (606) and the mounting base (607) are equipped with mounting holes. An adjusting bolt (605) is threaded onto the support base (606), and the top of the adjusting bolt (605) contacts the bottom of the dovetail block (603).

8. A sample stage for a benchtop X-ray diffractometer according to claim 6, characterized in that, The top of the limiting block (604) and the sample holder (1) are both provided with mounting slots (7), and a laser knife (5) is inserted between the two mounting slots (7).

9. A sample stage for a benchtop X-ray diffractometer according to claim 3, characterized in that, The top of the adjusting screw (4) is provided with a scale assembly (8) for recording its adjustment depth. The scale assembly (8) includes a knob (801) fixedly installed on the top of the adjusting screw (4). A cam groove (802) extending inward is provided at the center of the top of the knob (801). The knob (801) is fitted with a T-shaped central shaft (803) through the cam groove (802). A rotating cam (804) is rotatably fitted on the outer side of the top of the central shaft (803). A turntable (805) is fixedly installed on the top of the rotating cam (804), and an extension shaft (806) is fixedly installed on the outer side of the turntable (805). An inwardly extending slot (807) is provided on the inner side of the extension shaft (806). An arc plate (808) is provided at intervals on the outer side of the adjusting screw (4), and the slot (807) matches the side wall of the arc plate (808).

10. A sample stage for a benchtop X-ray diffractometer according to claim 2, characterized in that, The bottom of the sample base (2) is provided with a limiting component (9) to prevent the sample base (2) from shifting. The limiting component (9) includes a bottom groove (903) formed at the bottom of the sample base (2). The sample base (2) is rotatably sleeved with a limiting T-shaft (902) through the bottom groove (903). The limiting T-shaft (902) extends through the sample holder (1) and the first T-shaped tube (3) to the bottom of the first T-shaped tube (3). An arc-shaped ring plate (901) is sleeved on the bottom of the outer side of the limiting T-shaft (902). The inner side of the ring plate (901) is fixedly connected to the outer side of the second T-shaped tube (306). The sample base (2) has a T-shaped circular groove (10) symmetrically opened inside. The circular groove (10) is connected to the groove (201). The sample base (2) is fitted with a pressing shaft (11) through the circular groove (10). One end of the pressing shaft (11) is in contact with the outer side of the sample stage body (202). The other end of the pressing shaft (11) is fixedly installed with a limiting spring (12) fixedly connected to the inner side of the sample base (2).

Images