Temperature self-adaptive adjusting method and system of eMMC memory

By monitoring the temperature change rate of the eMMC memory in real time and adjusting the voltage, frequency, and signal timing in stages, the problem of insufficient performance and reliability of eMMC memory under extreme temperatures is solved, achieving higher operational reliability and stability.

CN121722318APending Publication Date: 2026-03-24WUHAN YUXIN SEMICON CO LTD
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Patent Information

Application Number
CN202511815029.X
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2025-12-04
Publication Date
2026-03-24

AI Technical Summary

Technical Problem

Existing eMMC memories suffer from insufficient performance and reliability when operating at extreme temperatures. They lack real-time adaptive adjustment mechanisms, leading to problems such as signal latch position offset, insufficient data retention time, high bit error rate, and abnormal power supply ripple.

Method used

By monitoring the rate of temperature change in real time through temperature sensors and ADC modules, voltage, frequency, IO drive capability, and signal timing are adjusted in segments. Combined with diagnostic testing and a fast response mechanism, the parameters are adaptively adjusted to prevent thermal shock damage.

Benefits of technology

This improves the reliability and performance stability of eMMC memory over a wide temperature range, reduces high-temperature failure rate and low-temperature data error rate, extends temperature cycle life, and achieves the best balance between performance and power consumption.

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Abstract

The invention provides a temperature self-adaptive adjusting method and system of an eMMC memory, and belongs to the technical field of embedded memories. Comprising the following steps: acquiring a real-time temperature and a temperature change rate of an eMMC memory; when the temperature change rate does not exceed a change rate threshold value, executing a corresponding parameter adjustment strategy according to the change condition of a preset temperature interval where the real-time temperature of the eMMC memory is located; after the parameters are adjusted, a diagnosis test link is operated, the performance of the eMMC memory under the current parameters is evaluated, and the current configuration is selectively effective according to a performance evaluation result; and when the temperature change rate exceeds a change rate threshold value, directly interrupting a current process to enter a quick response process, skipping a diagnostic test link and directly applying predefined conservative parameters to the eMMC memory regardless of the real-time temperature of the eMMC memory until the temperature change rate returns to normal or maintains the lowest performance level.
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