Measurement method and device for correcting actual ocean shallow profile temperature
By combining infrared thermometry with thermistor technology, along with indoor emissivity calibration and Monte Carlo model correction, high-precision temperature measurement from the cold skin layer of the sea surface to a depth of 20 meters underwater was achieved, solving the problem of insufficient accuracy and resolution in existing technologies for shallow ocean profile temperature measurement.
Patent Information
- Application Number
- CN202511815199.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-12-04
- Publication Date
- 2026-04-07
AI Technical Summary
Existing technologies struggle to accurately measure shallow ocean profile temperatures under complex sea conditions, particularly the cold surface temperature of the sea and the temperature of seawater at different depths. They suffer from problems such as insufficient spatial resolution, poor weather adaptability, high cost of wide-area coverage, or lack of millimeter-level accuracy.
By combining infrared thermometry with thermistors, and through indoor calm water surface emissivity calibration and Monte Carlo model correction, combined with the deployment of thermistor chains of different scales, high-precision temperature measurement can be achieved from the cold skin layer of the sea surface to 20 meters underwater.
It enables continuous, synchronous, and high-precision measurements from millimeter-level thin layers at the sea surface to underwater profiles tens of meters deep under dynamic sea conditions, improving measurement accuracy and resolution and filling the gap in existing technologies for integrated sea surface-profile measurements.