Control method, device and equipment of high-frequency transformer test platform and storage medium

Abstract

The invention relates to the technical field of high-frequency transformers, and provides a control method, device and equipment of a high-frequency transformer test platform and a storage medium. The output end of each functional unit in a primary side functional unit group is connected in series or in parallel and then is connected to a primary side winding of a high-frequency transformer; the output end of each functional unit in the secondary side functional unit group is connected in series or in parallel and then is connected to a secondary side winding of the high-frequency transformer; the function unit comprises a power module, and the topology of the power module comprises a pre-stage pulse width modulation converter and a post-stage high-frequency H bridge; the method comprises the following steps of: adapting to test requirements of different working conditions of the high-frequency transformer by changing series connection and parallel connection modes of output ends of internal functional units of a primary side functional unit group and a secondary side functional unit group; and adjusting a control strategy of the high-frequency transformer according to test requirements, and outputting an electric signal waveform through a post-stage high-frequency H bridge to obtain test results of the high-frequency transformer under different working conditions. The test requirements of the high-capacity high-frequency transformer can be met.

Description

Technical Field

[0001] This application relates to the field of high-frequency transformer technology, and in particular to a control method for a high-frequency transformer test platform, a control device for a high-frequency transformer test platform, a corresponding electronic device, and a corresponding computer-readable storage medium. Background Technology

[0002] In power grid systems, the proportion of new energy power generation devices and power electronic transformers is increasing. Among them, power electronic transformers integrate power electronics, information communication and control and protection technologies. They can connect to power ports of different voltage levels and AC / DC types, enabling flexible regulation of power and voltage at each port, as well as energy interconnection and mutual assistance and fault management. They play a key role in scenarios such as high-proportion distributed energy aggregation, large-capacity energy storage access, flexible interaction between "source, grid, load and storage", and AC / DC grid interconnection, and are important equipment for future new power systems.

[0003] A typical power electronic transformer consists of a high-power rectifier unit, a high-power isolated DC-DC converter, and an inverter unit, enabling flexible functions such as AC / DC voltage input, bidirectional energy flow, control, and voltage transformation. Currently, the design and testing of high-frequency transformers lack standards and specifications, and there is a lack of suitable design theories and methods. Design and testing primarily rely on empirical formulas or methods used for power frequency transformers. Furthermore, most high-frequency transformer designs and applications are concentrated on low-voltage high-frequency (below 1kV, below 100kHz) or medium-voltage medium-frequency (1kV–3kV, ~10kHz). The comprehensive design and application of high-voltage, large-capacity high-frequency (above 3kV, hundreds of kVA, ~20kHz) transformers remains a gap, which will hinder the development of new power system equipment. Furthermore, unlike traditional large-capacity power frequency oil-immersed transformers, high-voltage, large-capacity, high-frequency transformers typically use solid insulation, are small in size, and have high power density. They need to withstand complex electromagnetic-thermal-mechanical stresses from non-sinusoidal, high-frequency, and transient pulses. There are significant differences between them and power frequency transformers in various loss mechanisms, thermal models and thermal management, vibration and noise control, insulation fault mechanisms and reliability evaluation, test methods, and standardization systems.

[0004] Therefore, many factors affect the performance of large-capacity high-frequency transformers, and there are no current testing standards for reference. Extensive performance testing is required to obtain a relatively stable high-frequency transformer manufacturing process. However, existing testing equipment is insufficient to meet the testing needs of high-frequency transformers. Summary of the Invention

[0005] This application provides a control method, device, equipment, and storage medium for a high-frequency transformer testing platform, which can solve the problem that existing testing devices cannot meet the testing requirements of large-capacity high-frequency transformers.

[0006] In one aspect, this application provides a control method for a high-frequency transformer testing platform. The main circuit structure of the testing platform includes a primary-side functional unit group and a secondary-side functional unit group. The output terminals of each functional unit in the primary-side functional unit group are connected to the primary winding of the high-frequency transformer via series or parallel connection. The output terminals of each functional unit in the secondary-side functional unit group are connected to the secondary winding of the high-frequency transformer via series or parallel connection. The functional unit includes a power module, and the topology of the power module is a front-stage pulse width modulation converter and a rear-stage high-frequency H-bridge. The method includes:

[0007] By changing the series and parallel connection of the output terminals of the functional units within the primary and secondary functional unit groups, the test requirements of the high-frequency transformer under different operating conditions can be adapted.

[0008] The control strategy of the high-frequency transformer is adjusted according to the test requirements, and the test results of the high-frequency transformer under different operating conditions are obtained by outputting the electrical signal waveform through the high-frequency H-bridge. The control strategy includes two-level control and H-bridge control.

[0009] On the other hand, this application provides a control device for a high-frequency transformer testing platform. The main circuit structure of the testing platform includes a primary-side functional unit group and a secondary-side functional unit group. The output terminals of each functional unit in the primary-side functional unit group are connected to the primary winding of the high-frequency transformer via series or parallel connection. The output terminals of each functional unit in the secondary-side functional unit group are connected to the secondary winding of the high-frequency transformer via series or parallel connection. Each functional unit includes a power module, and the topology of the power module is a front-stage pulse width modulation converter and a rear-stage high-frequency H-bridge. The device includes:

[0010] The test requirement determination module is used to determine the test requirements of the high-frequency transformer under different operating conditions by changing the series and parallel connection of the output terminals of the functional units within the primary side functional unit group and the secondary side functional unit group.

[0011] The test control module is used to adjust the control strategy of the high-frequency transformer according to the test requirements, and obtain the test results of the high-frequency transformer under different operating conditions by outputting the electrical signal waveform through the subsequent high-frequency H-bridge; wherein, the control strategy includes a two-level control strategy and an H-bridge control strategy.

[0012] In another aspect, this application also provides an electronic device, including: a processor, a memory, and a computer program stored in the memory and capable of running on the processor, wherein the computer program, when executed by the processor, implements the control method of the high-frequency transformer test platform described in any one of the claims.

[0013] In another aspect, this application also provides a computer-readable storage medium storing a computer program that, when executed by a processor, implements the control method of the high-frequency transformer test platform described in any one of the claims.

[0014] In another aspect, this application also provides a computer program product containing instructions that, when run on a computer, cause the computer to execute the control method for the high-frequency transformer test platform described in the above aspects.

[0015] The control method, device, equipment, and storage medium of the high-frequency transformer test platform provided in this application include a main circuit structure comprising a primary-side functional unit group and a secondary-side functional unit group. The output terminals of each functional unit in the primary-side functional unit group are connected to the primary winding of the high-frequency transformer via series or parallel connection. The output terminals of each functional unit in the secondary-side functional unit group are connected to the secondary winding of the high-frequency transformer via series or parallel connection. Each functional unit includes a power module, and the topology of the power module is a front-stage pulse width modulation converter and a rear-stage high-frequency H-bridge. By changing the series or parallel connection method of the output terminals of the functional units within the primary-side and secondary-side functional unit groups, the test requirements of the high-frequency transformer under different operating conditions can be adapted. Then, the control strategy of the high-frequency transformer is adjusted according to the test requirements, including the adjustment of the two-level control and H-bridge control. Subsequently, the electrical signal waveform output by the rear-stage high-frequency H-bridge is used to obtain the test results of the high-frequency transformer under different operating conditions, thus meeting the test requirements of large-capacity high-frequency transformers. Attached Figure Description

[0016] Figure 1 This is a schematic diagram of the main circuit structure of the high-frequency transformer test platform provided in the embodiments of this application;

[0017] Figure 2 This is a flowchart illustrating the steps of a control method for a high-frequency transformer testing platform provided in an embodiment of this application.

[0018] Figure 3 This is a schematic diagram of the trigger control of a two-level converter provided in an embodiment of this application;

[0019] Figure 4 This is a control block diagram of the voltage and current dual closed loop in the dq coordinate system provided in the embodiments of this application;

[0020] Figure 5 This is a block diagram of the voltage outer loop control provided in an embodiment of this application;

[0021] Figure 6 This is a block diagram of the current inner loop control provided in an embodiment of this application;

[0022] Figure 7 This is a block diagram of a phase-locked loop control provided in an embodiment of this application;

[0023] Figure 8 This is a schematic diagram of the trigger control of the high-frequency H-bridge provided in the embodiments of this application;

[0024] Figure 9 This is a schematic diagram of the topology of the high-frequency H-bridge provided in the embodiments of this application;

[0025] Figure 10 This is a schematic diagram of the SPS control waveform of the high-frequency H-bridge provided in the embodiments of this application;

[0026] Figure 11 This is a schematic diagram of the architecture of the control system provided in an embodiment of this application;

[0027] Figure 12 This is a schematic diagram of a control system interface provided in an embodiment of this application;

[0028] Figure 13 This is a schematic diagram of the data acquisition process provided in an embodiment of this application;

[0029] Figure 14 This is a schematic diagram of the structure of the digital fault recording device provided in the embodiments of this application;

[0030] Figure 15 This is a schematic diagram of the board configuration in the primary / secondary side port controller provided in the embodiments of this application;

[0031] Figure 16 This is a schematic diagram of the board configuration in the system synchronization controller provided in the embodiments of this application;

[0032] Figure 17 This is a schematic diagram of the test platform protection parameter setting interface provided in the embodiments of this application;

[0033] Figure 18 This is a schematic diagram of the test condition setting interface provided in the embodiments of this application;

[0034] Figure 19 This is a schematic diagram of the waveform monitoring interface provided in an embodiment of this application;

[0035] Figure 20 This is a schematic diagram of the steady-state current waveform at the input terminal provided in an embodiment of this application;

[0036] Figure 21 This is a schematic diagram of the steady-state current waveform at the output terminal provided in an embodiment of this application;

[0037] Figure 22 This is a structural block diagram of a control device for a high-frequency transformer testing platform provided in an embodiment of this application;

[0038] Figure 23This is a structural block diagram of an electronic device provided in an embodiment of this application;

[0039] Figure 24 This is a structural block diagram of a computer-readable storage medium provided in an embodiment of this application. Detailed Implementation

[0040] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0041] Reference Figure 1 The diagram shows a schematic diagram of the main circuit structure of the high-frequency transformer test platform provided in the embodiment of this application. The test platform is a high-frequency transformer power-to-load test platform. In order to achieve stable, accurate and efficient power cycle testing, the high-frequency transformer power-to-load test platform is usually designed with a dedicated main circuit structure.

[0042] like Figure 1 As shown, the main circuit structure of the high-frequency transformer power pair test platform can include eight functional units with identical structure and topology, namely functional units G1~G8, and the input terminal of each functional unit is connected to an AC380V power supply.

[0043] Optionally, the eight functional units can be divided into a primary-side functional unit group and a secondary-side functional unit group, with four functional units in each group. The primary-side and secondary-side functional unit groups are completely symmetrical and identical in structure and topology. The output terminals of each functional unit in the primary-side functional unit group can be connected to the primary winding of the high-frequency transformer via series or parallel connection, and the output terminals of each functional unit in the secondary-side functional unit group can be connected to the secondary winding of the high-frequency transformer via series or parallel connection.

[0044] In some embodiments of this application, the primary-side functional unit group and the secondary-side functional unit group can meet the testing requirements of high-frequency transformers under different operating conditions, i.e., different voltage and current levels, by changing the series and parallel connection between the output terminals of their internal power units.

[0045] Optionally, each functional unit can consist of a soft-start circuit, a nine-winding power frequency isolation transformer, and eight power modules. The power frequency input terminal of the power module is connected to the secondary winding of the nine-winding power frequency isolation transformer, and the high-frequency output terminal of the power module is led out in series.

[0046] Specifically, the power module adopts a topology of a front-end PWM (Pulse Width Modulation) converter and a rear-end high-frequency H-bridge. In the power module, the three-phase AC input is connected to the three-phase rectifier module of the front-end PWM converter after passing through an LCL (Inductor-Capacitor-Inductor) filter. The three-phase rectifier module operates in DC constant voltage mode and outputs a high-frequency inverter signal through the rear-end high-frequency H-bridge, specifically a high-frequency inverter voltage.

[0047] In some embodiments of this application, the control strategy can be adjusted according to the test requirements. By adjusting the control strategy, the output electrical signal of the subsequent high-frequency H-bridge can meet the test requirements of different operating conditions of the high-frequency transformer.

[0048] Reference Figure 2 The diagram illustrates a flowchart of the control method for a high-frequency transformer testing platform provided in an embodiment of this application, which may specifically include the following steps:

[0049] Step S201: By changing the series and parallel connection methods of the output terminals of the functional units within the primary and secondary functional unit groups, the test requirements of high-frequency transformers under different operating conditions can be adapted.

[0050] Optional, different operating conditions refer to different voltage and current levels; test requirements may include high-capacity, non-sinusoidal, high-frequency, and other test requirements.

[0051] To adapt to different testing conditions, hardware topology adaptation is involved. Specifically, voltage and current levels can be matched through series and parallel connections. This manifests as flexible adjustment of output voltage and current by switching between series and parallel connections at the output terminals of functional units within the primary and secondary functional unit groups.

[0052] For example, when the outputs of functional units are connected in series, the overall output voltage level can be increased to meet the testing requirements of high-voltage conditions for high-frequency transformers; when the outputs of functional units are connected in parallel, the overall output current level can be increased to meet the testing requirements of high-current conditions for high-frequency transformers. This flexible adjustment of the hardware topology can solve the problem of different voltage and current test sources required for high-frequency transformers of different specifications, thus achieving compatibility of the test platform.

[0053] Step S202: Adjust the control strategy of the high-frequency transformer according to the test requirements, and obtain the test results of the high-frequency transformer under different operating conditions by outputting the electrical signal waveform through the high-frequency H-bridge.

[0054] To meet the testing requirements of different operating conditions, software control strategy adaptation is involved. Specifically, waveform adjustment can be used to match the testing conditions. This means that, based on the determined hardware topology, a corresponding control strategy is selected according to specific testing needs, such as non-sinusoidal, high frequency, and large capacity, so that a specific electrical signal waveform is output through the inverter function of the subsequent high-frequency H-bridge.

[0055] The control strategy may include two-level control and H-bridge control.

[0056] For example, when two-level control is selected, basic waveforms such as square waves can be output to meet the testing requirements of high-frequency transformers under normal operating conditions. When H-bridge control is selected, complex waveforms such as multi-level stepped waves can be output to meet the testing requirements of high-frequency transformers under special operating conditions such as non-sinusoidal and high-frequency conditions. It should be noted that adjusting the control strategy can ensure that the test platform can output waveforms that meet the operating condition requirements, thus guaranteeing the accuracy of the test results.

[0057] In this embodiment, hardware series-parallel adjustments determine the voltage and current range covered by the test platform; software control strategy adjustments determine the waveform types that the test platform can output. Based on the combination of these two methods, comprehensive testing of high-frequency transformers under different voltage and current levels and waveform conditions is achieved, ultimately obtaining accurate test results.

[0058] In some embodiments of this application, when a two-level control strategy is adopted, the implementation involves a two-level control PWM strategy and an IGBT (Insulated Gate Bipolar Transistor) trigger configuration. The PWM strategy involves adjusting the duty cycle according to test requirements, while the IGBT trigger configuration involves the input of a square wave trigger signal and the configuration of the trigger angles of each IGBT and each power module group.

[0059] Optionally, a square wave trigger signal of a preset frequency can be input to each IGBT in the power module, and the trigger angles of each insulated gate bipolar transistor are sequentially different from a preset first angle threshold, and the trigger angles of each group of power modules contained in each functional unit are sequentially delayed by a preset second angle threshold.

[0060] For example, the simulation module for the trigger signal of a two-level converter and its internal structure are as follows: Figure 3 As shown, a 50Hz square wave trigger signal can be input to the 6 IGBTs (S1 to S6) in the power module. The trigger angles of the 6 IGBTs (S1 to S6) in each power module are 60° apart. Each functional unit contains 8 groups of power modules, and the trigger angles of each group are delayed by 7.5°.

[0061] Furthermore, the two-level control employs pulse width modulation (PWM) control, which allows adjustment of the duty cycle of the output pulse signal—the proportion of the high-level duration to the cycle—to control the analog circuit according to testing requirements. Its core idea is to achieve different equivalent average voltages or powers by changing the "on" and "off" time ratios of the pulses at a fixed frequency.

[0062] By configuring the two-level control described above, the high-frequency H-bridge outputs the corresponding electrical signal waveform, thereby obtaining the test results of the high-frequency transformer under different operating conditions.

[0063] Specifically, the two-level control adopts a voltage and current dual closed-loop control structure, which is designed in a synchronous rotating (d-axis and q-axis, abbreviated as dq) coordinate system. The overall control block diagram can be seen as follows: Figure 4 As shown, the d-axis primarily controls active power and DC bus voltage, while the q-axis primarily controls reactive power and power factor. Independent control of the d-axis and q-axis components allows for more precise regulation of active and reactive power, improving the system's dynamic performance and control accuracy.

[0064] The voltage and current dual closed-loop control structure can include an outer voltage loop, an inner current loop, and a phase-locked loop control circuit.

[0065] Optionally, the outer voltage loop can be used to control the DC bus voltage, and the difference between the real-time monitored DC bus voltage and the reference voltage is input to a proportional-integral (PI) regulator. The output signal of the PI regulator is used to adjust the setpoint current of the inner current loop. This allows the PI regulator to compensate for DC bus voltage deviations in real time, converting stable voltage control results into a setpoint value for the inner current loop, providing a stable reference for subsequent precise current control. The stability of the DC bus voltage is fundamental to the output of the subsequent high-frequency H-bridge inverter, preventing output waveform distortion caused by voltage fluctuations.

[0066] like Figure 5As shown, the main function of the outer voltage loop is to control the DC bus voltage and stabilize it at a set value. When the DC bus voltage fluctuates due to factors such as load changes and grid fluctuations, the outer voltage loop can monitor the DC bus voltage in real time and compare it with a set reference voltage value. The difference between the two is used as a control signal input to the PI regulator. The PI regulator performs calculations based on the difference and outputs a control signal to adjust the setpoint of the inner current loop. For example, when the DC bus voltage is higher than the reference value, the PI regulator reduces its output, causing the setpoint of the inner current loop to decrease, thereby controlling the converter to reduce energy input and gradually restore the DC bus voltage to the reference value. When the DC bus voltage is lower than the reference value, the PI regulator increases its output, increasing the setpoint of the inner current loop, causing the converter to increase energy input and boost the DC bus voltage. This application does not limit the scope of the embodiments.

[0067] Optionally, the inner current loop can be used to control the current by using the active current output from the outer voltage loop as a given current. For example... Figure 6 As shown, the switching state of power devices can be quickly adjusted using a PI control algorithm, enabling the actual current to rapidly track the given current. When the load changes, the inner current loop can quickly adjust the current, ensuring the system's stability and dynamic response performance.

[0068] In a three-phase AC system, current can be decomposed into active current and reactive current. The inner current loop ensures that the converter's output current meets the load's power requirements through precise control of the active current. Simultaneously, power factor regulation is achieved by controlling the reactive current. When an improvement in the power factor is needed, the inner current loop can adjust the reactive current, enabling the converter to supply or absorb appropriate reactive power to the grid, thereby improving the power factor and reducing reactive power losses in the grid.

[0069] The inner current loop can also control the direction of energy flow based on the sign of the active current. Specifically, it controls the direction of energy flow by controlling the active current. When the active current is positive, energy flows from the AC side to the DC side; when the active current is negative, energy flows from the DC side to the AC side.

[0070] The inner current loop tracks the active current setpoint output by the outer voltage loop, precisely controlling the switching state of power devices to ensure the accuracy of power transmission. On the other hand, it optimizes the system power factor by adjusting the reactive current, reducing useless power consumption. At the same time, it realizes bidirectional energy flow control based on the positive and negative of the active current, enabling the power-to-drag test platform to simulate the working conditions of transformers with different energy transmission directions, thus playing the role of power and energy control in the inner current loop.

[0071] Optionally, the phase-locked loop (PLL) control circuit can be used to track the phase of the three-phase AC input voltage and obtain input voltage phase information. That is, the PLL control circuit plays a crucial role in the system, its main function being to achieve synchronous tracking of the three-phase AC input voltage and accurately obtain the phase information of the input voltage. The PLL control block diagram can be shown as follows: Figure 7 As shown, by comparing the phase difference between the input signal and the internal reference signal, the phase and frequency of the output signal are adjusted using its internal feedback mechanism to achieve accurate tracking of the input signal.

[0072] The phase-locked loop (PLL) control circuit obtains accurate phase information by tracking the phase of the three-phase AC input voltage, which can play a role in ensuring the synchronization of the PLL. This ensures that the entire closed-loop control strategy is synchronized with the phase of the input power supply, avoids control disorder, increased harmonics or damage to power devices caused by phase deviation, and improves the stability of system operation.

[0073] In this embodiment, the pulse width modulation control can specifically employ sinusoidal pulse width modulation (SPWM). Its core principle is to adjust the pulse width to make the fundamental component (sine wave) of the output signal equivalent to the target sine wave, while suppressing higher harmonics. Specifically, a pulse sequence can be generated using SPWM to make the fundamental component of the output signal equivalent to the target sine wave, while suppressing higher harmonic interference. This ensures the waveform quality of the high-frequency H-bridge output, meets the testing requirements for non-sinusoidal and low-harmonic conditions of high-frequency transformers, improves the accuracy of test results, and achieves waveform optimization through SPWM modulation.

[0074] In some embodiments of this application, when H-bridge control is used in the control strategy, the implementation involves the association of phase-shift modulation, enable signal (i.e., Enable signal) configuration and waveform output, and operating condition testing.

[0075] Optionally, the duty cycle can be set to a preset value, and the trigger signal of the secondary high-frequency H-bridge can lag behind the trigger signal of the primary high-frequency H-bridge, and an enable signal can be configured to set the unlocking time of the high-frequency H-bridge.

[0076] For example, the high-frequency H-bridge trigger signal simulation module and its internal structure can be as follows: Figure 8 As shown, the high-frequency H-bridge uses a single-phase-shift modulation method, sets the duty cycle to 0.5, and the secondary side lags behind the primary side; and uses an Enable signal to facilitate setting the unlocking time of the high-frequency H-bridge.

[0077] The high-frequency H-bridge section employs a phase-shift control strategy to generate power. This section outputs power via chopping. The output control rules for different waveforms under H-bridge control can be expressed as follows: when the test requirement is to output a high-frequency square wave, the carriers of all power modules remain in phase, ensuring that the waveforms output by each power module are consistent; when the test requirement is to output a multi-level stepped wave, the carriers of each power module are shifted sequentially.

[0078] In some embodiments of this application, the H-bridge control hardware topology and power regulation logic can be further defined. Specifically, refer to... Figure 9 The diagram shows a schematic topology of a high-frequency H-bridge provided in an embodiment of this application.

[0079] like Figure 9 As shown, the primary and secondary sides of the high-frequency transformer are connected to the primary full-bridge H1 and the secondary full-bridge H2, respectively. When using H-bridge control in the control strategy, the magnitude and direction of the transmitted power can be adjusted by regulating the phase shift angle of the trigger pulses between each arm of the primary full-bridge H1 and the secondary full-bridge H2. It should be noted that there is a certain relationship between the transmitted power and the phase shift angle; when determining fixed input and output voltage values, only the adjustment of the phase shift angle needs to be considered.

[0080] like Figure 10 As shown, in the primary-side full bridge H1, the drive signals of the first switch S1 and the fourth switch S4 are the same, the drive signals of the second switch S2 and the third switch S3 are the same, and the drive signals of the first switch S1 and the second switch S2 are opposite; in the secondary-side full bridge H2, the drive signals of the fifth switch Q1 and the eighth switch Q4 are the same, the drive signals of the sixth switch Q2 and the seventh switch Q3 are the same, and the drive signals of the fifth switch Q1 and the sixth switch Q2 are opposite.

[0081] By configuring the H-bridge control as described above, the high-frequency H-bridge outputs the corresponding electrical signal waveform, thereby obtaining the test results of the high-frequency transformer under different operating conditions.

[0082] In some embodiments of this application, the control method of the high-frequency transformer test platform provided in this application has a corresponding control system.

[0083] Reference Figure 11 The diagram illustrates the architecture of the control system provided in this application embodiment. The architecture of the control system may include three layers, specifically including the bottom layer module control board, the middle layer two port controllers KZQ1~KZQ2, and the top layer industrial control computer and integrated automation system.

[0084] Among them, the KZQ3 synchronous controller is mainly used to provide global synchronization signals for the module control board and port controller; the underlying module control board is mainly responsible for the analog sampling of the module, PWM pulse transmission, fault reporting and local fault interlocking; the port controller is mainly responsible for the analog sampling of the port, the action control of the port circuit breaker and contactor, the execution of the core control algorithm and external communication; the upper-level industrial control computer and integrated automation system are mainly responsible for human-machine interface display, communication and integrated energy management, etc.

[0085] Specifically, the control interface of the control system can be as follows: Figure 12 As shown, its control interface can independently control each functional unit, thereby realizing the control method of the high-frequency transformer test platform provided in this application embodiment.

[0086] Optionally, data acquisition is involved. This manifests in the control system where the power unit motherboard uses an AD (Analog-to-Digital Converter) chip and an FPGA (Field-Programmable Gate Array) for data acquisition. Specifically, it can collect information such as capacitor voltage, module current, and temperature within the module, and transmit the acquired information to controllers KZQ1 and KZQ2 via fiber optic interfaces for computation, monitoring, and protection.

[0087] For example, such as Figure 13 As shown, closed-loop voltage Hall effect sensors and closed-loop current Hall effect sensors (LEM closed-loop voltage Hall effect and closed-loop current Hall effect sensors are based on the Hall effect principle and are also known as compensated or zero flux sensors) can be used to convert capacitor voltage and module current respectively. A 16-bit synchronous sampling chip is selected for the analog-to-digital converter, with a parallel sampling rate of up to 200KSPS. For the DC port module, the voltage sampling range is 0~1000V, and the current sampling range is ±300A. The AD chip is connected to the FPGA via a parallel bus, and the FPGA controls the sampling timing of the AD chip, thereby achieving high-speed parallel data acquisition.

[0088] Optionally, the megavolt-ampere-level high-frequency transformer power pair test platform can also have multiple safety protection functions.

[0089] For example, protection functions may include voltage protection, current protection, temperature protection, and power module protection. Voltage protection automatically activates when the input or output voltage exceeds the normal range to prevent damage from overvoltage. Current protection immediately activates protection measures if the input or output current is too high to avoid overload and safety hazards. Temperature protection features internal temperature monitoring; if the temperature is too high, the system automatically shuts down to prevent overheating damage. Power module protection automatically detects and takes appropriate protective measures if the power module malfunctions to prevent further damage and ensure stable operation of the overall equipment. These functions generate protection signals. Upon detecting the protection signal, the FPGA chip immediately sends a fault status to the controller, and the fault indicator fiber rapidly changes. After receiving the fault signal, the controller issues an emergency interlock command to protect the module and equipment. Furthermore, alarms and status can be displayed and recorded on a screen.

[0090] Optionally, the megavolt-ampere-level high-frequency transformer power pair test platform is equipped with a digital fault recording device. For example, the fault recording device can be housed in a 19-inch wide, 6U high standard aluminum chassis, 300mm deep, and employ a back-mounted design. The arrangement of the various functional modules can be as follows: Figure 14 As shown, ① is the hard contact alarm signal terminal block, ② is the analog signal acquisition port, ③ is the reserved expansion panel, ④ is the fiber optic B-code and NTP (Network Time Protocol) measurement panel, ⑤ is the waveform recording alarm signal terminal block, and ⑥ is the display output port.

[0091] The digital fault recorder configured on the test platform fully meets the needs of the rapid development and application of smart substations. It seamlessly connects to smart devices while remaining compatible with traditional equipment, allowing for flexible use in substations that partially or fully utilize smart devices. It supports the power industry communication standard DL / T667-1999 (IEC60870-5-103) and the next-generation substation communication standard IEC61850, and establishes an IEC61850 model for the recorder. It utilizes a fully embedded multi-core hardware platform, operating independently without an industrial control extension platform or relying on a background industrial control computer. It supports point-to-point substation network architectures and bay-based centralized switching network architectures, supporting dual-network, dual-AD configurations. It can utilize analog and digital channels to record merging unit characteristics such as sampling counts and synchronization bits. It is compatible with traditional recording requirements; for existing users, only virtual terminal configuration is required, and the recording data management and analysis interface is consistent with traditional recorders.

[0092] Optionally, the megavolt-ampere-level high-frequency transformer power-to-drag test platform is equipped with a control cabinet.

[0093] In practical applications, to meet technical specifications, three controllers can be configured, specifically including a primary-side port controller, a secondary-side port controller, and a system synchronization controller. All three types of controllers can adopt a vertically pluggable IEC standard 6U full-width design and a modular structure, providing excellent heat dissipation.

[0094] For example, the board configuration in the primary / secondary side port controller can be as follows: Figure 15 As shown, this port controller is equipped with 17 control boards, divided into 8 types of functional board plug-ins. These include power board plug-ins, analog sampling plug-ins, digital input / output plug-ins, main control plug-ins, fiber optic communication plug-ins, fiber optic output plug-ins, fiber optic input plug-ins, and FT3 communication plug-ins. The power board plug-ins have an input voltage range of 220V AC / DC, providing a stable and reliable power supply for the controller. The analog sampling plug-ins are used to acquire port current and voltage signals. The digital input / output plug-ins are used to receive position signals from the starter cabinet and drive port switches. The main control plug-ins are used to perform port control and protection logic operations. The fiber optic communication plug-ins are used to communicate with downstream power modules. The fiber optic output plug-ins are used to communicate with downstream power modules. The fiber optic input plug-ins are used to communicate with downstream power modules. The FT3 communication plug-ins are used to communicate with waveform recording devices, specifically in multi-machine cascading configurations.

[0095] Optionally, the megavolt-ampere-level high-frequency transformer power-to-drag test platform is equipped with a system synchronization controller.

[0096] For example, the board configuration in the system synchronization controller can be as follows: Figure 16 As shown, this synchronous controller is equipped with eight control boards, divided into three types of functional board plug-ins, which can include power board plug-ins, main control plug-ins, and fiber optic output plug-ins. The power board plug-ins have an input voltage range of 220V AC / DC, providing a stable and reliable power supply for the controller; the main control plug-ins are used to generate the system's synchronization clock signal; and the fiber optic output plug-ins are used to communicate with downstream power modules.

[0097] In this embodiment of the application, two-level converter trigger control or high-frequency H-bridge trigger control can be performed on the three configured controllers to achieve the testing of high-frequency transformers.

[0098] The testing process can be described as follows: after completing the installation and wiring of the high-frequency transformer and confirming that the electrical connection of the test sample is correct, the test platform can be started, and a start signal can be sent to KZQ3 to start the power units on both sides that are in standby mode. Then, the test platform parameters can be set according to the high-frequency transformer parameters. After the test platform parameters are completed, signals are sent to KZQ1 and KZQ2 to start the power units on both sides that are in running mode to test the high-frequency transformer and output electrical signal waveforms. After obtaining the test results based on the output electrical signal waveforms, the test can be ended. At this time, KZQ3 can send stop signals to the primary and secondary controllers (KZQ1 and KZQ2) respectively and disconnect the power module relays, and the power units on both sides are in standby mode.

[0099] When setting the parameters of the test platform, for example, such as Figure 17 As shown, protection parameters for the test platform, such as input over / under voltage, overcurrent, output over / under voltage, overcurrent, and overtemperature, can be set; for example... Figure 18 As shown, test conditions can also be set. This is achieved by setting rated parameters and limiting parameters in the test item parameter configuration before executing the test. Rated parameters refer to the rated output of the test platform, which may include primary voltage and current, secondary voltage and current, etc. Limiting parameters refer to the voltage and current under extreme operating conditions of the high-frequency transformer, which belong to the protection limits of the high-frequency transformer.

[0100] During testing, real-time waveforms can be monitored to determine if the system is overloaded. Optionally, the waveform monitoring interface can be configured as follows: Figure 19 As shown. For example, after the system reaches steady state, the input current waveform can be as follows: Figure 20 As shown, the waveform is good, with a current amplitude of around 1000A; after the system reaches steady state, the output current waveform can be seen as follows. Figure 21 As shown, the waveform is good, and the current amplitude is around 1000A. It should be noted that the input and output referred to here are the input and output of the dual-side power modules of the test platform; for example, they can be defined as follows: Figure 1 The power module on the left is the input side, and the power module on the right is the output side. This application does not limit this aspect in the embodiments.

[0101] In this embodiment, the main circuit structure of the test platform includes a primary-side functional unit group and a secondary-side functional unit group. The output terminals of each functional unit in the primary-side functional unit group are connected to the primary winding of the high-frequency transformer via series or parallel connection. The output terminals of each functional unit in the secondary-side functional unit group are connected to the secondary winding of the high-frequency transformer via series or parallel connection. Each functional unit includes a power module, and the topology of the power module is a front-stage pulse width modulation converter and a rear-stage high-frequency H-bridge. At this time, by changing the series or parallel connection method of the output terminals of the functional units within the primary-side and secondary-side functional unit groups, the test requirements of the high-frequency transformer under different operating conditions can be adapted. Then, the control strategy of the high-frequency transformer is adjusted according to the test requirements, including the adjustment of the two-level control and H-bridge control. Then, the electrical signal waveform is output through the rear-stage high-frequency H-bridge to obtain the test results of the high-frequency transformer under different operating conditions, thus meeting the test requirements of large-capacity high-frequency transformers.

[0102] It should be noted that, for the sake of simplicity, the method embodiments are all described as a series of actions. However, those skilled in the art should understand that the embodiments of this application are not limited to the described order of actions, because according to the embodiments of this application, some steps can be performed in other orders or simultaneously. Secondly, those skilled in the art should also understand that the embodiments described in the specification are all preferred embodiments, and the actions involved are not necessarily required by the embodiments of this application.

[0103] Reference Figure 22 The diagram shows a structural block diagram of a control device for a high-frequency transformer testing platform provided in an embodiment of this application, which may specifically include the following modules:

[0104] The test requirement determination module 2201 is used to determine the test requirements of high-frequency transformers under different operating conditions by changing the series and parallel connection of the output terminals of the functional units within the primary and secondary functional unit groups.

[0105] The test control module 2202 is used to adjust the control strategy of the high-frequency transformer according to the test requirements. It obtains the test results of the high-frequency transformer under different operating conditions by outputting the electrical signal waveform through the high-frequency H-bridge. The control strategy includes a two-level control strategy and an H-bridge control strategy.

[0106] In some embodiments of this application, the test control module 2202 may include the following sub-modules:

[0107] The two-level control submodule is used when the two-level control strategy is adopted. The two-level control uses pulse width modulation control to adjust the duty cycle of the output pulse signal according to the test requirements to control the analog circuit. At the same time, it inputs a square wave trigger signal of preset frequency to each insulated gate bipolar transistor in the power module, and the trigger angle of each insulated gate bipolar transistor is sequentially delayed by a preset first angle threshold, and the trigger angle of each group of power modules in each functional unit is sequentially delayed by a preset second angle threshold. Through the configuration of two-level control, the high-frequency H-bridge outputs the corresponding electrical signal waveform to obtain the test results of the high-frequency transformer under different operating conditions.

[0108] In some embodiments of this application, the two-level control submodule is further configured to employ a voltage and current dual closed-loop control structure when using two-level control in the control strategy, and the voltage and current dual closed-loop control structure is designed in a synchronous rotating coordinate system; the voltage and current dual closed-loop control structure includes a voltage outer loop, a current inner loop, and a phase-locked loop control loop.

[0109] The system comprises several components: an outer voltage loop for controlling the DC bus voltage and inputting the difference between the real-time monitored DC bus voltage and the reference voltage into a proportional-integral (PI) controller; the output signal of the PI controller is used to adjust the given current of the inner current loop; a inner current loop uses the active current output from the outer voltage loop as the given current and adjusts the switching state of the power devices through a PI control algorithm to ensure that the actual current tracks the given current; power factor regulation is achieved by controlling the reactive current; and the direction of energy flow is controlled based on the sign of the active current; a phase-locked loop (PLL) control loop is used to track the phase of the three-phase AC input voltage and obtain the input voltage phase information; and a pulse width modulation (PWM) control system employs sinusoidal pulse width modulation, adjusting the pulse width to make the fundamental component of the output signal equivalent to the target sine wave and suppressing higher harmonics.

[0110] In some embodiments of this application, the test control module 2202 may include the following sub-modules:

[0111] The H-bridge control submodule is used when the H-bridge control strategy employs a single-phase-shift modulation method, setting the duty cycle to a preset value, and ensuring the trigger signal of the secondary high-frequency H-bridge lags behind the trigger signal of the primary high-frequency H-bridge. It also configures an enable signal to set the unlocking time of the high-frequency H-bridge. The high-frequency H-bridge generates power using a phase-shift control strategy and outputs it via chopping. When the test requirement is to output a high-frequency square wave, the carriers of all power modules remain in phase, ensuring consistent waveforms across all power modules. When the test requirement is to output a multi-level stepped wave, the carriers of each power module are sequentially shifted. Through the configuration of the H-bridge control, the subsequent high-frequency H-bridge outputs the corresponding electrical signal waveform, obtaining the test results of the high-frequency transformer under different operating conditions.

[0112] In some embodiments of this application, the H-bridge control submodule is further configured to adjust the magnitude and direction of the transmission power by adjusting the phase shift angle of the trigger pulses between each arm of the primary full-bridge H1 and the secondary full-bridge H2 when the H-bridge control in the control strategy is adopted.

[0113] In this embodiment, the main circuit structure of the test platform includes a primary-side functional unit group and a secondary-side functional unit group. The output terminals of each functional unit in the primary-side functional unit group are connected to the primary winding of the high-frequency transformer via series or parallel connection. The output terminals of each functional unit in the secondary-side functional unit group are connected to the secondary winding of the high-frequency transformer via series or parallel connection. Each functional unit includes a power module, and the topology of the power module is a front-stage pulse width modulation converter and a rear-stage high-frequency H-bridge. At this time, by changing the series or parallel connection method of the output terminals of the functional units within the primary-side and secondary-side functional unit groups, the test requirements of the high-frequency transformer under different operating conditions can be adapted. Then, the control strategy of the high-frequency transformer is adjusted according to the test requirements, including the adjustment of the two-level control and H-bridge control. Then, the electrical signal waveform is output through the rear-stage high-frequency H-bridge to obtain the test results of the high-frequency transformer under different operating conditions, thus meeting the test requirements of large-capacity high-frequency transformers.

[0114] As the device embodiment is basically similar to the method embodiment, the description is relatively simple, and relevant parts can be found in the description of the method embodiment.

[0115] This application also provides an electronic device, see embodiments thereof. Figure 23 The provided electronic device 2300 includes a memory 2310, a processor 2320, and a computer program 2311 stored in the memory 2310 and capable of running on the processor 2320. When the computer program 2311 is executed by the processor, it implements the various processes of the control method embodiment of the high-frequency transformer test platform described above and can achieve the same technical effect. To avoid repetition, it will not be described again here.

[0116] This application also provides a computer-readable storage medium, see embodiments thereof. Figure 24 The computer-readable storage medium 2400 provided stores a computer program 2311. When the computer program 2311 is executed by the processor, it implements the various processes of the control method embodiment of the high-frequency transformer test platform described above and can achieve the same technical effect. To avoid repetition, it will not be described again here.

[0117] The various embodiments in this specification are described in a progressive manner, with each embodiment focusing on the differences from other embodiments. The same or similar parts between the various embodiments can be referred to each other.

[0118] It should be noted that the terms "first," "second," etc., in the specification, claims, and accompanying drawings of the embodiments of this application are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate so that the embodiments described herein can be implemented in an order other than that illustrated or described herein. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover non-exclusive inclusion. For example, a process, method, system, product, or device that includes a series of steps or modules is not necessarily limited to those steps or modules explicitly listed, but may include other steps or modules not explicitly listed or inherent to these processes, methods, products, or devices. The division of modules in the embodiments of this application is merely a logical division; in actual applications, there may be other division methods. For example, multiple modules may be combined into or integrated into another system, or some features may be ignored or not performed. Additionally, the shown or discussed mutual coupling or direct coupling or communication connection may be through some interface, and the indirect coupling or communication connection between modules may be electrical or other similar forms, none of which are limited in the embodiments of this application. Furthermore, the modules or sub-modules described as separate components may or may not be physically separated, may or may not be physical modules, or may be distributed among multiple circuit modules. Some or all of the modules may be selected according to actual needs to achieve the purpose of the embodiments of this application.

[0119] In the above embodiments, the descriptions of each embodiment have different focuses. For parts not described in detail in a certain embodiment, please refer to the relevant descriptions in other embodiments.

[0120] Those skilled in the art will clearly understand that, for the sake of convenience and brevity, the specific working processes of the systems, devices, and modules described above can be referred to the corresponding processes in the foregoing method embodiments, and will not be repeated here.

[0121] In the embodiments provided in this application, it should be understood that the disclosed systems, apparatuses, and methods can be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative; for instance, the division of modules is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple modules or components may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the coupling or direct coupling or communication connection shown or discussed may be indirect coupling or communication connection through some interfaces, apparatuses, or modules, and may be electrical, mechanical, or other forms.

[0122] The modules described as separate components may or may not be physically separate. The components shown as modules may or may not be physical modules; that is, they may be located in one place or distributed across multiple network modules. Some or all of the modules can be selected to achieve the purpose of this embodiment according to actual needs.

[0123] Furthermore, the functional modules in the various embodiments of this application can be integrated into one processing module, or each module can exist physically separately, or two or more modules can be integrated into one module. The integrated module can be implemented in hardware or as a software functional module. If the integrated module is implemented as a software functional module and sold or used as an independent product, it can be stored in a computer-readable storage medium.

[0124] In the above embodiments, implementation can be achieved, in whole or in part, through software, hardware, firmware, or any combination thereof. When implemented in software, it can be implemented, in whole or in part, as a computer program product.

[0125] The computer program product includes one or more computer instructions. When the computer program instructions are loaded and executed on a computer, all or part of the processes or functions described in the embodiments of this application are generated. The computer may be a general-purpose computer, a special-purpose computer, a computer network, or other programmable device. The computer instructions may be stored in a computer-readable storage medium or transmitted from one computer-readable storage medium to another. For example, the computer instructions may be transmitted from one website, computer, server, or data center to another website, computer, server, or data center via wired (e.g., coaxial cable, fiber optic, Digital Subscriber Line (DSL)) or wireless (e.g., infrared, wireless, microwave, etc.) means. The computer-readable storage medium may be any available medium that a computer can store or a data storage device such as a server or data center that integrates one or more available media. The available medium may be a magnetic medium (e.g., floppy disk, hard disk, magnetic tape), an optical medium (e.g., DVD), or a semiconductor medium (e.g., a solid-state drive (SSD)).

[0126] This application describes embodiments with reference to flowchart illustrations and / or block diagrams of methods, terminal devices (systems), and computer program products according to embodiments of this application. It should be understood that each block of the flowchart illustrations and / or block diagrams, and combinations of blocks in the flowchart illustrations and / or block diagrams, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, special-purpose computer, embedded processor, or other programmable data processing terminal device to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing terminal device, generate instructions for implementing the flowchart illustrations. Figure 1 One or more processes and / or boxes Figure 1 A device that provides the functions specified in one or more boxes.

[0127] These computer program instructions may also be stored in a computer-readable storage medium that can direct a computer or other programmable data processing terminal device to operate in a particular manner, such that the instructions stored in the computer-readable storage medium produce an article of manufacture including instruction means, which are implemented in a process Figure 1 One or more processes and / or boxes Figure 1 The functions specified in one or more boxes; these computer program instructions may also be loaded onto a computer or other programmable data processing terminal equipment to cause a series of operational steps to be performed on the computer or other programmable terminal equipment to produce a computer-implemented process, thereby providing instructions that execute on the computer or other programmable terminal equipment for implementing the process. Figure 1 One or more processes and / or boxes Figure 1 The steps of the function specified in one or more boxes.

[0128] Although preferred embodiments of the present application have been described, those skilled in the art, upon learning the basic inventive concept, can make other changes and modifications to these embodiments. Therefore, the appended claims are intended to be interpreted as including the preferred embodiments as well as all changes and modifications falling within the scope of the embodiments of the present application.

[0129] Finally, it should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data used for analysis, data stored, data displayed, etc.) involved in this application are all information and data authorized by the user or fully authorized by all parties. Furthermore, the collection, use and processing of the relevant data must comply with the relevant laws, regulations and standards of the relevant countries and regions, and corresponding operation portals are provided for users to choose to authorize or refuse.

[0130] The technical solutions provided in the embodiments of this application have been described in detail above. Specific examples have been used in the embodiments of this application to illustrate the principles and implementation methods of the embodiments of this application. The description of the above embodiments is only for the purpose of helping to understand the methods and core ideas of the embodiments of this application. At the same time, for those skilled in the art, there will be changes in the specific implementation methods and application scope based on the ideas of the embodiments of this application. Therefore, the content of this specification should not be construed as a limitation on the embodiments of this application.

Claims

1. A control method for a high-frequency transformer testing platform, characterized in that, The main circuit structure of the test platform includes a primary-side functional unit group and a secondary-side functional unit group. The output terminals of each functional unit in the primary-side functional unit group are connected to the primary winding of the high-frequency transformer after being connected in series or parallel. The output terminals of each functional unit in the secondary-side functional unit group are connected to the secondary winding of the high-frequency transformer after being connected in series or parallel. The functional unit includes a power module, and the topology of the power module is a front-stage pulse width modulation converter and a rear-stage high-frequency H-bridge. The method includes: By changing the series and parallel connection of the output terminals of the functional units within the primary and secondary functional unit groups, the test requirements of the high-frequency transformer under different operating conditions can be adapted. The control strategy of the high-frequency transformer is adjusted according to the test requirements, and the test results of the high-frequency transformer under different operating conditions are obtained by outputting the electrical signal waveform through the high-frequency H-bridge. The control strategy includes two-level control and H-bridge control.

2. The method according to claim 1, characterized in that, The functional unit also includes a soft-start circuit and a nine-winding power frequency isolation transformer. The power frequency input terminal of the power module is connected to the secondary winding of the nine-winding power frequency isolation transformer, and the high frequency output terminal of the power module is led out in series.

3. The method according to claim 1 or 2, characterized in that, In the power module, the three-phase AC input is connected to the three-phase rectifier module of the preceding pulse width modulation converter after passing through an inductor-capacitor-inductor filter; the three-phase rectifier module operates in DC constant voltage mode and outputs a high-frequency inverter signal through the following high-frequency H-bridge.

4. The method according to claim 1, characterized in that, The process of adjusting the control strategy of the high-frequency transformer according to the test requirements, and obtaining the test results of the high-frequency transformer under different operating conditions through the output electrical signal waveform of the subsequent high-frequency H-bridge, includes: When the two-level control in the control strategy is adopted, the two-level control adopts pulse width modulation control, and adjusts the duty cycle of the output pulse signal according to the test requirements to control the analog circuit; at the same time, a square wave trigger signal of preset frequency is input to each insulated gate bipolar transistor in the power module, and the trigger angle of each insulated gate bipolar transistor is sequentially different from a preset first angle threshold, and the trigger angle of each group of power modules contained in each functional unit is sequentially delayed by a preset second angle threshold. By configuring the two-level control, the high-frequency H-bridge outputs the corresponding electrical signal waveform, and the test results of the high-frequency transformer under different operating conditions are obtained.

5. The method according to claim 4, characterized in that, Also includes: When the two-level control in the control strategy is adopted, the two-level control adopts a voltage and current dual closed-loop control structure, and the voltage and current dual closed-loop control structure is designed in a synchronous rotating coordinate system; the voltage and current dual closed-loop control structure includes a voltage outer loop, a current inner loop, and a phase-locked loop control loop. The voltage outer loop controls the DC bus voltage and inputs the difference between the real-time monitored DC bus voltage and the reference voltage into a proportional-integral (PI) regulator. The output signal of the PI regulator is used to adjust the given current of the current inner loop. The current inner loop uses the active current output by the voltage outer loop as the given current and adjusts the switching state of the power devices through a PI control algorithm to make the actual current track the given current. At the same time, it controls the reactive current to achieve power factor regulation and controls the energy flow direction based on the positive or negative sign of the active current. The phase-locked loop (PLL) control loop tracks the phase of the three-phase AC input voltage and obtains the input voltage phase information. The pulse width modulation (PWM) control adopts a sinusoidal pulse width modulation method, which adjusts the pulse width to make the fundamental component of the output signal equivalent to the target sine wave and suppresses higher harmonics.

6. The method according to claim 1, characterized in that, The process of adjusting the control strategy of the high-frequency transformer according to the test requirements, and obtaining the test results of the high-frequency transformer under different operating conditions through the output electrical signal waveform of the subsequent high-frequency H-bridge, includes: When the H-bridge control in the aforementioned control strategy is adopted, the H-bridge control uses a single-phase-shift modulation method, sets the duty cycle to a preset value, and the trigger signal of the secondary high-frequency H-bridge lags behind the trigger signal of the primary high-frequency H-bridge; and an enable signal is configured to set the unlocking time of the high-frequency H-bridge; wherein, the high-frequency H-bridge uses a phase-shift control strategy to generate power and outputs it in a chopping manner; when the test requirement is to output a high-frequency square wave, the carriers of all power modules remain in phase, so that the waveforms output by each power module are consistent; when the test requirement is to output a multi-level stepped wave, the carriers of each power module are shifted sequentially; By configuring the H-bridge control, the high-frequency H-bridge outputs the corresponding electrical signal waveform, thereby obtaining the test results of the high-frequency transformer under different operating conditions.

7. The method according to claim 6, characterized in that, The primary and secondary sides of the high-frequency transformer are respectively connected to a primary full-bridge and a secondary full-bridge; in the primary full-bridge, the drive signals of the first and fourth switches are the same, the drive signals of the second and third switches are the same, and the drive signals of the first and second switches are opposite; in the secondary full-bridge, the drive signals of the fifth and eighth switches are the same, the drive signals of the sixth and seventh switches are the same, and the drive signals of the fifth and sixth switches are opposite, and the transformer further includes: When the H-bridge control in the aforementioned control strategy is adopted, the magnitude and direction of the transmitted power are adjusted by adjusting the phase shift angle of the trigger pulses between each arm of the primary full-bridge and the secondary full-bridge.

8. A control device for a high-frequency transformer testing platform, characterized in that, The main circuit structure of the test platform includes a primary-side functional unit group and a secondary-side functional unit group. The output terminals of each functional unit in the primary-side functional unit group are connected to the primary winding of the high-frequency transformer after being connected in series or parallel. The output terminals of each functional unit in the secondary-side functional unit group are connected to the secondary winding of the high-frequency transformer after being connected in series or parallel. The functional unit includes a power module, and the topology of the power module is a front-stage pulse width modulation converter and a rear-stage high-frequency H-bridge. The device includes: The test requirement determination module is used to determine the test requirements of the high-frequency transformer under different operating conditions by changing the series and parallel connection of the output terminals of the functional units within the primary side functional unit group and the secondary side functional unit group. The test control module is used to adjust the control strategy of the high-frequency transformer according to the test requirements, and obtain the test results of the high-frequency transformer under different operating conditions by outputting the electrical signal waveform through the subsequent high-frequency H-bridge; wherein, the control strategy includes a two-level control strategy and an H-bridge control strategy.

9. An electronic device, characterized in that, include: A processor, a memory, and a computer program stored in the memory and capable of running on the processor, wherein the computer program, when executed by the processor, implements the control method of the high-frequency transformer test platform as described in any one of claims 1 to 7.

10. A computer-readable storage medium, characterized in that, A computer program is stored on the computer-readable storage medium, which, when executed by a processor, implements the control method of the high-frequency transformer test platform as described in any one of claims 1 to 7.

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