Electronic component electrical performance testing fixture

Abstract

This utility model relates to the field of electronic component testing technology, and in particular to an electronic component electrical performance testing fixture, including a test platform, a support mounted on the test platform, and a test component mounted on the support. It also includes a rotating component, comprising a rotating shaft mounted on the test platform, a turntable rotatably connected to the rotating shaft, and recessed slots arrayed on the turntable for placing products under test, wherein the turntable is a regular polygon; a first positioning component for fixing the side of the turntable; a power component for driving the test component to move towards and contact the product under test; and a second positioning component for fixing the top of the turntable by the downward pressing action of the test component. This utility model, by setting multiple recessed slots on the turntable for placing products under test and utilizing the rotating shaft for rotation, can achieve rapid switching between testing various product models, resulting in high testing efficiency.

Description

Technical Field

[0001] This utility model relates to the field of electronic component testing technology, and in particular to a fixture for testing the electrical performance of electronic components. Background Technology

[0002] Withstand voltage testing and inductance testing are important performance indicators for electronic components. Withstand voltage testing, also known as high-voltage testing, involves applying a voltage higher than the device's rated value and maintaining it for a certain period of time to determine whether the device's insulation materials and spatial spacing meet the requirements.

[0003] Existing component testing devices, such as the inductor withstand voltage testing fixture disclosed in patent number CN 222379816 U, include: a base, a fixed bracket, a guide rail, a carrier, a testing section, and a driving device. The carrier is fixed on the base and is used to place the product to be tested. The guide rail is arranged vertically. The testing section is mounted on the guide rail via a test seat, and a probe group is provided on the testing section. The position of the probe group's detection part corresponds to the test point on the product on the carrier. The driving device is fixed on the fixed bracket and connected to the testing section, and is used to drive the testing section to move along the guide rail. Using this invention, precise control of the probe's contact position with the test point and the magnitude of the contact force can be achieved, resulting in accurate test results. It saves time and labor, protects components and probe detection parts from external damage, and allows one set of equipment to perform two tests without changing equipment, further saving labor.

[0004] In actual testing, the aforementioned device could not quickly switch between different product models, resulting in low testing efficiency and failing to meet actual production needs. Summary of the Invention

[0005] The purpose of this invention is to address the aforementioned shortcomings in the existing technology by proposing a testing fixture for the electrical performance of electronic components.

[0006] To achieve the above objectives, the present invention adopts the following technical solution:

[0007] Design a test fixture for the electrical performance of electronic components, including a test stage, a support mounted on the test stage, and test components mounted on the support, and further including...

[0008] A rotating assembly includes a rotating shaft mounted on the test bench, a turntable rotatably connected to the rotating shaft, and recessed slots arrayed on the turntable for placing the product to be tested, wherein the turntable is a regular polygon.

[0009] The first positioning component is used to fix the side of the turntable;

[0010] A power assembly is used to drive the test assembly to move toward the product under test and make contact with the product under test;

[0011] The second positioning component secures the top of the turntable by pressing down on the test component.

[0012] Furthermore, the first positioning component includes a housing on the test bench, a rod that slides with the housing, a tip and a handle at both ends of the rod, a baffle connected to the middle of the rod, a first spring connecting the baffle and the inner wall of the housing, and a slot on the side for inserting the tip.

[0013] Furthermore, the cross-section of the slot is triangular.

[0014] Furthermore, the power assembly includes a longitudinal groove penetrating the bracket, a connecting plate that slides with the longitudinal groove, a reinforcing plate connecting the connecting plate and the test assembly, a lifting plate located at the other end of the connecting plate and the reinforcing plate, and a cylinder for driving the lifting plate to move up and down.

[0015] Furthermore, the second positioning component includes a sliding hole penetrating the turntable and located on both sides of the recessed groove, a support rod that slides in conjunction with the sliding hole, a pressure plate disposed at the top of the support rod, a second spring connecting the pressure plate and the top, and a pressure plate disposed on the test component for pressing the pressure plate.

[0016] Furthermore, the bracket is also provided with an auxiliary buffer assembly, which includes a mounting groove formed in the inner wall of the longitudinal groove, a transverse block that slides in cooperation with the mounting groove, a third spring connecting the transverse block and the bottom of the mounting groove, a first inclined surface provided on the transverse block, a pressing block for pushing the transverse block to slide in the mounting groove, and a second inclined surface provided on the pressing block and cooperating with the first inclined surface.

[0017] Furthermore, the pressing block is connected to the connecting plate via a hanging plate.

[0018] Furthermore, the mounting groove is provided with a limiting plate for limiting the movement of the transverse block.

[0019] The present invention provides a testing fixture for the electrical performance of electronic components, which has the following advantages:

[0020] This invention enables rapid switching between testing various product models by setting multiple recessed slots on a turntable for placing the product to be tested and using a rotating shaft for rotation, resulting in high testing efficiency. By setting a first positioning component and a second positioning component to fix the side and top of the turntable respectively, the turntable is prevented from rotating during testing, improving the stability of the testing components when in contact with the product to be tested, thereby improving testing accuracy. Attached Figure Description

[0021] Figure 1 This is a schematic diagram of the structure of this utility model;

[0022] Figure 2 This is another structural schematic diagram of the present invention;

[0023] Figure 3 This is a schematic diagram of the power components;

[0024] Figure 4 This is a schematic diagram of the auxiliary buffer component; Detailed Implementation

[0025] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments of the present utility model. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments.

[0026] Example, refer to Figure 1-4 An electronic component electrical performance testing fixture includes a test bench 1, a support 2 mounted on the test bench 1, and a test assembly 3 mounted on the support 2. In this embodiment, the test assembly 3 is prior art. Specifically, the test assembly 3 includes a housing 301 and a probe 302. The housing 301 accommodates the probe 302 and the wires connecting the probe 302. The probe 302 extends downwards and is connected to a control device via the wires. When the probe 302 contacts a test point on the product, the control device performs electrical performance tests such as inductance testing or withstand voltage testing according to a preset program, and returns test data. The fixture also includes...

[0027] The rotating component 4 includes a rotating shaft 401 mounted on the test bench 1, a turntable 402 rotatably connected to the rotating shaft 401, and recessed slots 403 arrayed on the turntable 402 for placing products to be tested. The turntable 402 is a regular polygon, preferably a regular hexagon in this embodiment. By rotating the rotating shaft 401, the recessed slots 403 are arrayed to place multiple products to be tested, thereby realizing multi-model testing.

[0028] The first positioning component 5 is used to fix the side 4021 of the turntable 402. During testing, the side 4021 of the turntable is fixed to prevent the turntable 402 from rotating.

[0029] The power assembly 6 is used to drive the test assembly 3 to move towards the product under test and contact the product under test. The power assembly 6 drives the test assembly 3 to move downward so that the probe 302 contacts the test point of the product.

[0030] The second positioning component 7 fixes the top 4022 of the turntable 402 by pressing down the test component 3. When the test component 3 presses down, it simultaneously fixes the top 4022 of the turntable 402, further improving stability.

[0031] This invention enables rapid switching between testing various product models by setting multiple recessed grooves 403 on the turntable 402 for placing the products to be tested and rotating it using a rotating shaft 401, resulting in high testing efficiency. By setting a first positioning component 5 and a second positioning component 7 to fix the side 4021 and top 4022 of the turntable 402 respectively, the turntable 402 is prevented from rotating during testing, improving the stability of the testing component 3 when it contacts the product to be tested, thereby improving testing accuracy.

[0032] In an optional embodiment of this utility model, the first positioning component 5 includes a box 501 mounted on the test bench 1, a rod 502 slidably engaged with the box 501, tips 503 and handles 504 respectively located at both ends of the rod 502, a baffle 505 connected to the middle of the rod 502, a first spring 506 connecting the baffle 505 and the inner wall of the box 501, and a slot 507 on the side 4021 for inserting the tips 503. The rod 502 is reset by the first spring 506, and the tips 503 of the rod 502 are inserted into the slot 507 on the side 4021 of the turntable to achieve mechanical locking. The handle 504 is used to manually operate the sliding of the rod 502. The baffle 505 limits the stroke of the rod 502. The mechanical locking method between the rod 502 and the slot 507 is simple and reliable. The first spring 506 provides an automatic reset function, making operation convenient. The baffle 505 prevents the rod 502 from disengaging, enhancing safety.

[0033] In one optional embodiment of this utility model, the cross-section of the slot 507 is triangular, and the triangular slot matches the tip of the plug rod to form a stable insertion, thereby improving the fitting accuracy between the plug rod 502 and the slot 507 and preventing loosening.

[0034] In an optional embodiment of this utility model, the power assembly 6 includes a longitudinal groove 601 penetrating the bracket 2, a connecting plate 602 slidably engaged with the longitudinal groove 601, a reinforcing plate 603 connecting the connecting plate 602 and the test assembly 3, a lifting plate 604 located at the other end of the connecting plate 602 on the reinforcing plate 603, and a cylinder 605 for driving the lifting plate 604 to move up and down. Preferably, in this embodiment, the reinforcing plate 603 has a U-shaped cross-section and is fixed to the cover 301 of the test assembly 3 by bolts. The cylinder 605 drives the lifting plate 604 to move up and down, causing the connecting plate 602 to slide along the longitudinal groove 601, thereby controlling the lifting of the test assembly 3.

[0035] In an optional embodiment of this utility model, the second positioning component 7 includes a sliding hole 701 penetrating the turntable 402 and located on both sides of the recessed groove 403, a support rod 702 slidably engaged with the sliding hole 701, a pressure plate 703 disposed at the top of the support rod 702, a second spring 704 connecting the pressure plate 703 and the top 4022, and a pressure plate 705 disposed on the test component 3 for pressing the pressure plate 703. Preferably, in this embodiment, the test table 1 may be provided with a positioning groove (not shown) for the support rod 702 to enter. The pressure plates 705 are disposed on both sides of the cover 301. When the cover 301 descends, it drives the pressure plate 705 to press the pressure plate 703, so that the support rod 702 enters the positioning groove, thereby fixing the turntable 402. At the same time, the second spring 704 can buffer the cover 301, reduce the impact force when the probe 302 contacts the product, and avoid damage to the probe 302.

[0036] In an optional embodiment of this utility model, the bracket 2 is further provided with an auxiliary buffer assembly 8. The auxiliary buffer assembly 8 includes a mounting groove 801 formed in the inner wall of the longitudinal groove 601, a transverse block 802 that slides in cooperation with the mounting groove 801, a third spring 803 connecting the transverse block 802 and the bottom of the mounting groove 801, a first inclined surface 804 provided on the transverse block 802, a pressing block 805 for pushing the transverse block 802 to slide in the mounting groove 801, and a second inclined surface 806 provided on the pressing block 805 and cooperating with the first inclined surface 804. Preferably, in this embodiment, the mounting groove 801 is symmetrically distributed on both sides of the longitudinal groove 601. When the connecting plate 602 moves down, the pressing block 805, through the cooperation of the first inclined surface 804 and the second inclined surface 806, pushes the transverse block 802 to compress the third spring 803, absorbs the impact energy, reduces the instantaneous impact of the test assembly 3, and extends the service life of the cylinder and probe.

[0037] In an optional embodiment of this utility model, the lower pressure block 805 is connected to the connecting plate 602 via the hanging plate 807. The hanging plate 807 fixes the lower pressure block 805 on the connecting plate 602 to ensure that the two move synchronously and improve reliability.

[0038] In an optional embodiment of this utility model, a limiting plate 808 for limiting the transverse block 802 is provided in the mounting groove 801. The limiting plate 808 can prevent the transverse block 802 from moving excessively and ensure that the buffer stroke is controllable.

[0039] In the description of this specification, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential", etc., indicating the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, are only for the convenience of describing the technical solution of this patent and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation on this patent application.

[0040] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of indicated technical features. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of that feature. In the description of this patent application, "a plurality of" means at least two, such as two, three, etc., unless otherwise explicitly specified.

[0041] In this specification, unless otherwise expressly specified and limited, the terms "installation," "connection," "joining," and "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components, unless otherwise expressly limited. Those skilled in the art can understand the specific meaning of the above terms in this specification according to the specific circumstances.

[0042] In this specification, unless otherwise expressly specified and limited, "above" or "below" the second feature can mean that the first and second features are in direct contact, or that the first and second features are in indirect contact through an intermediate medium. Furthermore, "above," "over," and "on top" of the second feature can mean that the first feature is directly above or diagonally above the second feature, or simply that the first feature is at a higher horizontal level than the second feature. "Below," "below," and "under" the second feature can mean that the first feature is directly below or diagonally below the second feature, or simply that the first feature is at a lower horizontal level than the second feature.

[0043] In the description of this specification, the references to terms such as "one embodiment," "some embodiments," "example," "specific example," or "some examples," etc., indicate that a specific feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of the present invention. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples. Moreover, without contradiction, those skilled in the art can combine and integrate the different embodiments or examples described in this specification, as well as the features of different embodiments or examples.

Claims

1. A testing fixture for the electrical performance of electronic components, comprising a test stage (1), a support (2) disposed on the test stage (1), and a testing assembly (3) disposed on the support (2), characterized in that: Also includes The rotating assembly (4) includes a rotating shaft (401) provided on the test bench (1), a turntable (402) rotatably connected to the rotating shaft (401), and recessed grooves (403) arrayed on the turntable (402) for placing the product to be tested, wherein the turntable (402) is a regular polygon; The first positioning component (5) is used to fix the side (4021) of the turntable (402); A power component (6) is used to drive the test component (3) to move toward the product under test and contact the product under test; The second positioning component (7) fixes the top (4022) of the turntable (402) by the pressing action of the test component (3).

2. The electronic component electrical performance testing fixture according to claim 1, characterized in that: The first positioning component (5) includes a box (501) disposed on the test bench (1), a rod (502) that slides with the box (501), a tip (503) and a handle (504) disposed at both ends of the rod (502), a baffle (505) connected to the middle of the rod (502), a first spring (506) connecting the baffle (505) and the inner wall of the box (501), and a slot (507) disposed on the side (4021) for insertion of the tip (503).

3. The electronic component electrical performance testing fixture according to claim 2, characterized in that: The slot (507) has a triangular cross-section.

4. The electronic component electrical performance testing fixture according to claim 1, characterized in that: The power assembly (6) includes a longitudinal groove (601) penetrating the bracket (2), a connecting plate (602) that slides with the longitudinal groove (601), a reinforcing plate (603) connecting the connecting plate (602) and the test assembly (3), a lifting plate (604) located at the other end of the reinforcing plate (603) on the connecting plate (602), and a cylinder (605) for driving the lifting plate (604) to rise and fall.

5. The electronic component electrical performance testing fixture according to claim 1, characterized in that: The second positioning component (7) includes a sliding hole (701) that passes through the turntable (402) and is located on both sides of the recess (403), a support rod (702) that slides in cooperation with the sliding hole (701), a pressure plate (703) provided at the top of the support rod (702), a second spring (704) that connects the pressure plate (703) and the top (4022), and a pressure plate (705) provided on the test component (3) for pressing the pressure plate (703).

6. The electronic component electrical performance testing fixture according to claim 4, characterized in that: The bracket (2) is also provided with an auxiliary buffer assembly (8), which includes a mounting groove (801) opened in the inner wall of the longitudinal groove (601), a transverse block (802) that slides in cooperation with the mounting groove (801), a third spring (803) connecting the transverse block (802) and the bottom of the mounting groove (801), a first inclined surface (804) provided on the transverse block (802), a pressing block (805) for pushing the transverse block (802) to slide in the mounting groove (801), and a second inclined surface (806) provided on the pressing block (805) and cooperating with the first inclined surface (804).

7. The electronic component electrical performance testing fixture according to claim 6, characterized in that: The pressing block (805) is connected to the connecting plate (602) via the hanging plate (807).

8. The electronic component electrical performance testing fixture according to claim 6, characterized in that: The mounting groove (801) is provided with a limiting plate (808) for limiting the movement of the transverse block (802).

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