Industrial controller mainboard function testing device

Abstract

The invention relates to the technical field of mainboard testing, in particular to an industrial controller mainboard function testing device which comprises a mounting table, a testing disc arranged on the top of the mounting table, a mainboard conveying belt arranged on the front side of the mounting table and a feeding assembly arranged on the top of the mounting table. The testing device has the beneficial effects that the problem that a traditional testing device cannot realize synchronous parallel operation of feeding and testing is effectively solved by arranging a cooperative matching structure of the rotating-disc-shaped testing disc, the conveying belt and the feeding assembly, and a material taking piece driven by a rotating stand column is matched with an elastic clamping piece in the testing disc; opening and resetting of the clamping structure are automatically triggered in the reciprocating action process of the feeding assembly, and automatic taking and placing and accurate positioning of the main board are achieved; meanwhile, the feeding assembly is in transmission with a ratchet gear arranged at the bottom of the testing disc, reciprocating motion of material transferring is converted into intermittent rotating motion of the testing disc, station switching is completed, and an independent rotating driving source does not need to be additionally arranged.

Description

Technical Field

[0001] This invention relates to the field of motherboard testing technology, and in particular to a functional testing device for industrial controller motherboards. Background Technology

[0002] Industrial controller motherboards are core components of industrial automation equipment, integrating microprocessors, memory chips, I / O interface circuits, and various functional modules. Their electrical performance and functional integrity directly determine the reliability of the entire control system. To ensure product quality, comprehensive functional testing of the motherboard must be performed during the production process, including the measurement of core parameters such as voltage threshold detection, signal integrity verification, communication protocol response, and load driving capability. Currently, the functional testing equipment commonly used in the industry mainly includes manual probe stations, ICT in-circuit testers, and customized FCT functional testing systems. These devices typically achieve electrical connection between test probes and motherboard test points through test fixtures or manual crimping, and then complete automated judgment in conjunction with host computer software.

[0003] For example, a controller motherboard testing device disclosed in Chinese Patent Publication No. (CN118604575A) includes a testing platform, a clamping mechanism, and a testing mechanism. The testing platform has multiple testing areas along a first horizontal direction for placing boards under test. The clamping mechanism is located on the testing platform and includes clamping components and a transmission module. The clamping components are located in each testing area, and the transmission module is located on the testing platform and connected to the clamping components. The transmission module drives the clamping components to simultaneously press against the opposite sides of the boards under test in the horizontal direction within each testing area to clamp and fix the boards under test. Thus, the clamping mechanism synchronously clamps and fixes the boards under test in each testing area to prevent them from deviating from the testing area. The testing mechanism then tests the boards under test clamped and fixed within the testing areas. When testing multiple groups of boards under test, the testing mechanism can reliably complete the testing of each group of boards under test, making the testing more efficient.

[0004] Existing technical solutions have structural defects in continuous testing operations. Traditional linear layouts or single-station testing platforms are limited by their own structural form, making it difficult to achieve synchronous parallel operations of loading, testing, and unloading within the same device. This results in the testing cycle time not being effectively matched with the automated production line. At the same time, most testing fixtures rely on cylinders or motors to clamp and release the motherboard, increasing system complexity and control difficulty. Furthermore, the lack of a motion coordination mechanism with the loading and unloading robots makes them prone to cycle time interference and positioning deviations. Summary of the Invention

[0005] In view of the problems existing in the above or prior art, the present invention is proposed.

[0006] Therefore, the purpose of this invention is to provide an industrial controller motherboard functional testing device that can realize synchronous parallel operation of loading, testing, and unloading, avoid configuring an independent drive source for the test panel, simplify the system structure, and eliminate cycle interference and positioning deviation.

[0007] To solve the above-mentioned technical problems, the present invention provides the following technical solution: an industrial controller motherboard function testing device, which includes a mounting platform, a test plate disposed on the top of the mounting platform, a motherboard conveyor belt disposed on the front side of the mounting platform, and a feeding assembly disposed on the top of the mounting platform. The feeding assembly includes a rotating column rotatably mounted on the top of the mounting platform, a support arm fixedly mounted on the top of the rotating column, a material picking component inside the support arm, a clamping component on the top of the test plate, and an adjusting component inside the mounting platform. The material handling component includes two sets of through holes at the top of the support arm. A lifting rod is slidably installed inside each of the two sets of through holes. A toothed plate is embedded inside each of the two sets of lifting rods. A connecting plate is fixedly installed at the bottom of each of the two sets of lifting rods. A pneumatic suction cup is installed at the bottom of the connecting plate. A connecting groove is opened at the top of the support arm near the through holes. A rotating shaft is rotatably installed inside the connecting groove. Two sets of first gears are fixedly installed on the outside of the rotating shaft. The two sets of first gears mesh with the two sets of toothed plates respectively. A first motor is fixedly installed on the outside of the support arm, and the output shaft of the first motor is connected to the rotating shaft.

[0008] In a preferred embodiment of the industrial controller motherboard function testing device of the present invention, a number of motherboard placement boxes are fixedly arranged on the outer side of the motherboard conveyor belt.

[0009] In a preferred embodiment of the industrial controller motherboard function testing device of the present invention, a testing machine is provided on the top of the mounting platform and outside the testing disk, and a first connecting shaft is fixedly provided inside the testing disk.

[0010] In a preferred embodiment of the industrial controller motherboard function testing device of the present invention, the cross-sectional shape of the lifting rod is set to U-shape, and the length of the toothed plate is equal to the length of the lifting rod.

[0011] As a preferred embodiment of the industrial controller motherboard function testing device of the present invention, the inner walls of the two sets of through holes are fixedly provided with limit strips, and the outer sides of the two sets of lifting rods are provided with limit grooves that are adapted to the size of the limit strips.

[0012] As a preferred embodiment of the industrial controller motherboard function testing device of the present invention, the clamping member includes several sets of test slots opened on the top of the test disk. The inner walls of the left and right sides of the test slots are provided with storage slots. A first wedge block is slidably arranged inside each of the two sets of storage slots. A clamping plate is fixedly arranged on the side of the two sets of first wedge blocks that are close to each other. A support spring is fixedly arranged on the side of the two sets of first wedge blocks that are far apart from each other. The ends of the two sets of support springs that are far apart from each other are respectively connected to the inner walls of the two sets of storage slots. Two sets of second wedge blocks are fixedly arranged at the bottom of the connecting plate.

[0013] In a preferred embodiment of the industrial controller motherboard function testing device of the present invention, a plurality of test card slots are arranged in a ring on the top of the test disk, and the cross-sectional shape of the clamping plate is set as an inverted L shape.

[0014] In a preferred embodiment of the industrial controller motherboard function testing device of the present invention, two sets of the second wedge blocks are respectively disposed on the left and right sides of the pneumatic suction cup, and the inclined surfaces of the second wedge blocks are opposite to those of the first wedge blocks.

[0015] In a preferred embodiment of the industrial controller motherboard function testing device of the present invention, the adjusting component includes a second connecting shaft rotatably disposed inside the mounting platform, the top end of the second connecting shaft being connected to the rotating column; a third connecting shaft rotatably disposed on the inner top wall of the mounting platform; a gear disk fixedly disposed on the outer side of the first connecting shaft; a second gear fixedly disposed on the outer side of the third connecting shaft, the second gear meshing with the gear disk; a ratchet fixedly disposed on the outer side of the third connecting shaft and below the second gear; a connecting ring fixedly disposed on the outer side of the second connecting shaft; a pawl hinged to the outer side of the connecting ring; and a second motor fixedly disposed inside the mounting platform, the output shaft of the second motor being connected to the second connecting shaft.

[0016] In a preferred embodiment of the industrial controller motherboard function testing device of the present invention, the pawl is engaged with the ratchet, and the third connecting shaft is located in the middle of the side opposite to the first connecting shaft and the second connecting shaft.

[0017] The beneficial effects of this invention are as follows: By setting up a cooperative structure of a turntable-shaped test disc, a conveyor belt, and a feeding component, this invention effectively solves the structural defect of traditional testing devices that cannot achieve synchronous parallel operation of feeding and testing. The cooperation between the rotating column-driven material picking component and the elastic clamping component inside the test disc automatically triggers the opening and resetting of the clamping structure during the reciprocating motion of the feeding component, realizing automatic picking and placing and precise positioning of the main board. At the same time, through the ratchet gear transmission mechanism set at the bottom of the feeding component and the test disc, the reciprocating motion of material transfer is converted into the intermittent rotational motion of the test disc, completing the station switching without the need for an additional independent rotation drive source.

[0018] Another beneficial effect of this invention is that by replacing traditional pneumatic or motor-driven clamps with elastic mechanical clamps, the number of power sources and pipeline wiring are reduced, and the spatial integration and operational reliability of the device are improved. The clamping component adopts a wedge-shaped block triggering mechanism, which is coordinated with the movement trajectory of the material picking component to avoid cycle interference and positioning deviation. Secondly, the multi-station ring layout realizes parallel operation in the testing process. While one station completes the loading, the other stations can simultaneously carry out testing and unloading operations, shortening the overall testing cycle. Attached Figure Description

[0019] To more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings used in the following description of the embodiments will be briefly introduced. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0020] Figure 1 This is a schematic diagram of the overall structure of an industrial controller motherboard functional testing device.

[0021] Figure 2 This is a partial structural diagram of an industrial controller motherboard functional testing device.

[0022] Figure 3 This is a schematic diagram of the material handling components of an industrial controller motherboard functional testing device.

[0023] Figure 4 Industrial controller motherboard functional testing device Figure 3 Enlarged schematic diagram of the structure at point A in the middle.

[0024] Figure 5 This is a schematic diagram of the clamping components of an industrial controller motherboard functional testing device.

[0025] Figure 6 This is a schematic diagram of the adjustment components of an industrial controller motherboard function testing device.

[0026] In the diagram: 1. Mounting platform; 2. Test plate; 21. First connecting shaft; 3. Main board conveyor belt; 4. Feeding assembly; 41. Rotating column; 42. Support arm; 43. Material handling component; 431. Through hole; 432. Lifting rod; 433. Toothed plate; 434. Connecting plate; 435. Pneumatic suction cup; 436. Connecting groove; 437. Rotating shaft; 438. First gear; 439. First motor; 44. Clamping component; 441. Test card slot; 442. Storage slot; 443. First wedge block; 444. Clamping plate; 445. Support spring; 446. Second wedge block; 45. Adjusting component; 451. Second connecting shaft; 452. Third connecting shaft; 453. Gear disk; 454. Second gear; 455. Ratchet; 456. Connecting ring; 457. Pawl; 458. Second motor. Detailed Implementation

[0027] To make the above-mentioned objects, features and advantages of the present invention more apparent and understandable, the specific embodiments of the present invention will be described in detail below with reference to the accompanying drawings.

[0028] Many specific details are set forth in the following description in order to provide a full understanding of the invention. However, the invention may also be practiced in other ways different from those described herein, and those skilled in the art can make similar extensions without departing from the spirit of the invention. Therefore, the invention is not limited to the specific embodiments disclosed below.

[0029] Secondly, the term "one embodiment" or "embodiment" as used herein refers to a specific feature, structure, or characteristic that may be included in at least one implementation of the present invention. The phrase "in one embodiment" appearing in different places in this specification does not necessarily refer to the same embodiment, nor is it a single or selective embodiment that is mutually exclusive with other embodiments.

[0030] Example 1, referring to Figures 1-6 This is the first embodiment of the present invention. This embodiment provides an industrial controller motherboard functional testing device, which can realize rapid loading of industrial controller motherboards for functional testing. It includes a mounting platform 1, a test tray 2 set on the top of the mounting platform 1, a motherboard conveyor belt 3 set on the front side of the mounting platform 1, and a loading component 4 set on the top of the mounting platform 1. The loading component 4 includes a rotating column 41 rotatably set on the top of the mounting platform 1, a support arm 42 fixedly set on the top of the rotating column 41, a material picking component 43 set inside the support arm 42, a clamping component 44 set on the top of the test tray 2, and an adjusting component 45 set inside the mounting platform 1.

[0031] Furthermore, the material handling component 43 includes two sets of through holes 431 opened at the top of the support arm 42. Lifting rods 432 are slidably arranged inside the two sets of through holes 431. Toothed plates 433 are embedded inside the two sets of lifting rods 432. Connecting plates 434 are fixedly arranged at the bottom of the two sets of lifting rods 432. Pneumatic suction cups 435 are arranged at the bottom of the connecting plates 434. A connecting groove 436 is opened at the top of the support arm 42 near the through holes 431. A rotating shaft 437 is rotatably arranged inside the connecting groove 436. Two sets of first gears 438 are fixed on the outside of the rotating shaft 437. The two sets of first gears 438 are respectively meshed with the two sets of toothed plates 433. A first motor 439 is fixedly arranged on the outside of the support arm 42. The output shaft of the first motor 439 is connected to the rotating shaft 437.

[0032] It should be noted that the pneumatic suction cup 435, as a vacuum adsorption device for picking up the motherboard at the end of the execution, works as follows: when the picking component 43 descends and the pneumatic suction cup 435 contacts the motherboard surface, the external vacuum generator is turned on and a negative pressure is formed in the inner cavity of the suction cup, firmly adsorbing the motherboard; after the motherboard is transferred to the test slot 441 and placed in place, the vacuum circuit is disconnected, the negative pressure in the suction cup is released, and the motherboard is accurately released. The suction cup material is usually anti-static silicone rubber, which can avoid electrostatic damage and surface scratches. The adsorption force is set according to the weight and size of the motherboard through the vacuum pressure regulating valve to ensure stable suction without deformation.

[0033] When in use, when the first motor 439 drives the rotating shaft 437 to rotate in both directions, the toothed plate 433 drives the lifting rod 432 to slide precisely up and down along the through hole 431 of the support arm 42. The limiting strip on the inner wall of the through hole 431 cooperates with the limiting groove on the outer side of the lifting rod 432 to prevent deflection or shaking during the lifting process, and to ensure the vertical accuracy of the suction and placement actions. The bottom end of the lifting rod 432 is fixed with a pneumatic suction cup 435 for adsorbing or releasing the main board.

[0034] In summary, by using the reciprocating motion of the support arm 42 driven by the rotating column 41 and the picking component 43, combined with the adjustment component 45 to convert the swing of the support arm 42 into the intermittent rotation of the test plate 2, the mechanical linkage of material transfer and workstation switching is realized. At the same time, during the placement of the motherboard, the picking component 43 automatically triggers the opening and resetting of the clamping plate 444 through the cooperation of the second wedge block 446 and the first wedge block 443 of the clamping component 44. This simplifies the control logic, eliminates the need for an independent drive source for the rotation of the test plate 2, ensures seamless connection of the loading, testing, and unloading processes, and significantly improves the continuity and cycle efficiency of the testing operation.

[0035] Example 2, refer to Figures 1-6This is the second embodiment of the present invention, which differs from the first embodiment in that it also includes a test plate 2 for quick clamping of the motherboard and coordinated adjustment of its angle. In the previous embodiment, the industrial controller motherboard functional testing device includes a mounting platform 1, a test plate 2 disposed on the top of the mounting platform 1, a motherboard conveyor belt 3 disposed on the front side of the mounting platform 1, and a feeding assembly 4 disposed on the top of the mounting platform 1; the feeding assembly 4 includes a rotating column 41 rotatably disposed on the top of the mounting platform 1, a support arm 42 fixedly disposed on the top of the rotating column 41, a material picking component 43 disposed inside the support arm 42, a clamping component 44 disposed on the top of the test plate 2, and an adjusting component 45 disposed inside the mounting platform 1.

[0036] Furthermore, the material handling component 43 includes two sets of through holes 431 opened at the top of the support arm 42. Lifting rods 432 are slidably arranged inside the two sets of through holes 431. Toothed plates 433 are embedded inside the two sets of lifting rods 432. Connecting plates 434 are fixedly arranged at the bottom of the two sets of lifting rods 432. Pneumatic suction cups 435 are arranged at the bottom of the connecting plates 434. A connecting groove 436 is opened at the top of the support arm 42 near the through holes 431. A rotating shaft 437 is rotatably arranged inside the connecting groove 436. Two sets of first gears 438 are fixed on the outside of the rotating shaft 437. The two sets of first gears 438 are respectively meshed with the two sets of toothed plates 433. A first motor 439 is fixedly arranged on the outside of the support arm 42. The output shaft of the first motor 439 is connected to the rotating shaft 437.

[0037] Furthermore, several sets of motherboard placement boxes are fixedly installed on the outer side of the motherboard conveyor belt 3.

[0038] Furthermore, a testing machine is installed on the top of the mounting platform 1 and outside the test plate 2, and a first connecting shaft 21 is fixedly installed inside the test plate 2.

[0039] Furthermore, the cross-sectional shape of the lifting rod 432 is set to U-shape, and the length of the toothed plate 433 is equal to the length of the lifting rod 432.

[0040] Furthermore, the inner walls of both sets of through holes 431 are fixedly provided with limit strips, and the outer sides of both sets of lifting rods 432 are provided with limit grooves that are adapted to the size of the limit strips.

[0041] Furthermore, the clamping member 44 includes several sets of test slots 441 opened on the top of the test plate 2. The inner walls of the left and right sides of the test slots 441 are provided with storage slots 442. The interior of each set of storage slots 442 is slidably provided with a first wedge block 443. The side of the two sets of first wedge blocks 443 that are close to each other is fixedly provided with a clamping plate 444. The side of the two sets of first wedge blocks 443 that are far apart from each other is fixedly provided with a support spring 445. The ends of the two sets of support springs 445 that are far apart from each other are respectively connected to the inner walls of the two sets of storage slots 442. The bottom of the connecting plate 434 is fixedly provided with two sets of second wedge blocks 446.

[0042] Furthermore, several sets of test slots 441 are arranged in a ring on the top of the test disk 2, and the cross-sectional shape of the clamping plate 444 is set as an inverted L shape.

[0043] Furthermore, two sets of second wedge blocks 446 are respectively disposed on the left and right sides of the pneumatic suction cup 435, and the inclined surfaces of the second wedge blocks 446 are opposite to those of the first wedge blocks 443.

[0044] Specifically, two sets of second wedge blocks 446 are symmetrically arranged on both sides of the suction cup. The inclined surface direction is opposite to that of the first wedge block 443 of the clamping member 44. When the picking member 43 descends to pick up the main board, the second wedge block 446 contacts the first wedge block 443 before the suction cup. The clamping plate 444 is pushed open by the inclined surface squeezing action, so that the test card slot 441 is in an open state. After the main board is accurately placed in the test card slot 441, the picking member 43 rises, the second wedge block 446 disengages from the first wedge block 443, and the clamping plate 444 automatically resets under the action of the spring and clamps the main board, completing one feeding cycle.

[0045] Furthermore, the adjusting component 45 includes a second connecting shaft 451 rotatably disposed inside the mounting platform 1, the top end of the second connecting shaft 451 being connected to the rotating column 41, a third connecting shaft 452 rotatably disposed on the inner top wall of the mounting platform 1, a gear disk 453 fixedly disposed on the outer side of the first connecting shaft 21, a second gear 454 fixedly disposed on the outer side of the third connecting shaft 452, the second gear 454 meshing with the gear disk 453, a ratchet 455 fixedly disposed on the outer side of the third connecting shaft 452 and below the second gear 454, a connecting ring 456 fixedly disposed on the outer side of the second connecting shaft 451, a pawl 457 hinged to the outer side of the connecting ring 456, and a second motor 458 fixedly disposed inside the mounting platform 1, the output shaft of the second motor 458 being connected to the second connecting shaft 451.

[0046] Specifically, the second motor 458 drives the rotating column 41 to rotate the support arm 42 toward the main board conveyor belt 3. During this process, the pawl 457 of the adjusting component 45 engages with the ratchet 455, and pushes the test disk 2 to rotate at a fixed angle through the second connecting shaft 451 and the first connecting shaft 21, so that the next empty test card slot 441 is aligned with the loading station.

[0047] Secondly, after the support arm 42 reaches above the conveyor belt, the material handling component 43 drives the pneumatic suction cup 435 to descend and adsorb the motherboard to be tested and then rises back. Subsequently, the second motor 458 drives the support arm 42 to rotate in the opposite direction to the side of the test plate 2. During this return process, the pawl 457 brushes past the ratchet 455 in one direction without driving the test plate 2 to rotate, thereby realizing the directional linkage between the reciprocating motion of the support arm 42 and the intermittent indexing of the test plate 2.

[0048] Furthermore, the pawl 457 is engaged with the ratchet 455, and the third connecting shaft 452 is located in the middle of the opposite side of the first connecting shaft 21 and the second connecting shaft 451.

[0049] It should be noted that the adjusting component 45 adopts a reduction transmission between the second gear 454 and the gear disk 453. The diameter of the second gear 454 is smaller than the diameter of the gear disk 453, forming a reduction and torque increase transmission ratio. When the support arm 42 swings back and forth, the power is transmitted to the second connecting shaft 451 through the third connecting shaft 452, driving the second gear 454 to rotate. The second gear 454 then meshes with the gear disk 453, driving the test disk 2 to achieve intermittent indexing rotation. This reduction transmission design ensures that one reciprocating motion of the support arm 42 corresponds to a fixed rotation angle of the test disk 2. At the same time, since the diameter of the second gear 454 is smaller than that of the gear disk 453, the transmission process has a reduction and torque increase effect, which improves the stability and positioning accuracy of the rotation of the test disk 2 and avoids misalignment of the work position caused by inertial impact.

[0050] In use, initially, the support arm 42 of the feeding component 4 is suspended above the test plate 2. During testing, the second motor 458 drives the rotating column 41 to rotate the support arm 42 towards the main board conveyor belt 3. During this process, the pawl 457 of the adjusting component 45 engages the ratchet 455, and pushes the test plate 2 to rotate at a fixed angle through the second connecting shaft 451 and the first connecting shaft 21, so that the next empty test slot 441 is aligned with the feeding station. After the support arm 42 reaches above the conveyor belt, the picking component 43 drives the pneumatic suction cup 435 to descend and adsorb the main board to be tested and then rises. Subsequently, the second motor 458 drives the support arm 42 to rotate back to the side of the test plate 2. During this return stroke, the pawl 457 brushes past the ratchet 455 in one direction and does not drive the test plate 2 to rotate, thereby realizing the directional linkage between the reciprocating motion of the support arm 42 and the intermittent indexing of the test plate 2.

[0051] Furthermore, when the support arm 42 returns to the loading station, the material take-up component 43 descends and places the main board into the test slot 441. During placement, the second wedge block 446 at the bottom of the material take-up component 43 presses against the first wedge block 443 of the clamping component 44, pushing the clamping plate 444 to open outward against the spring force. After the main board is in place, the material take-up component 43 rises, the second wedge block 446 disengages from the first wedge block 443, and the clamping plate 444 automatically resets under the action of the spring and clamps the main board to complete the positioning. Subsequently, the testing machine performs voltage, signal and other electrical parameter tests on the main board at the station.

[0052] In summary, the meshing transmission structure of the lifting rod 432 and the toothed plate 433 is adopted, and the limiting strip on the inner wall of the through hole 431 and the guiding cooperation of the limiting groove on the outer side of the lifting rod 432 are added. This effectively avoids the deflection and shaking of the picking part 43 during the lifting process, significantly improves the vertical accuracy of the pneumatic suction cup 435 in picking up and placing the main board, reduces the positioning deviation caused by mechanical vibration, and ensures the repeatability and stability of electrical parameter measurement. At the same time, the enhanced rigidity of the lifting transmission makes the inclined surface cooperation between the second wedge block 446 and the first wedge block 443 more reliable, ensuring the precise control of the opening angle of the clamping plate 444 and the synchronization of the reset action, further improving the operational reliability of the device.

[0053] It should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention and are not intended to limit it. Although the present invention has been described in detail with reference to preferred embodiments, those skilled in the art should understand that modifications or equivalent substitutions can be made to the technical solutions of the present invention without departing from the spirit and scope of the technical solutions of the present invention, and all such modifications or substitutions should be covered within the scope of the claims of the present invention.

Claims

1. An industrial controller motherboard functional testing apparatus, characterized by: It includes a mounting platform (1), a test plate (2) set on the top of the mounting platform (1), a main board conveyor belt (3) set on the front side of the mounting platform (1), and a feeding assembly (4) set on the top of the mounting platform (1). The feeding assembly (4) includes a rotating column (41) rotatably mounted on the top of the mounting platform (1), a support arm (42) fixedly mounted on the top of the rotating column (41), a material picking component (43) inside the support arm (42), a clamping component (44) on the top of the test plate (2), and an adjusting component (45) inside the mounting platform (1). The material handling component (43) includes two sets of through holes (431) opened at the top of the support arm (42). Lifting rods (432) are slidably arranged inside the two sets of through holes (431). Tooth plates (433) are embedded inside the two sets of lifting rods (432). Connecting plates (434) are fixedly arranged at the bottom of the two sets of lifting rods (432). Pneumatic suction cups (435) are arranged at the bottom of the connecting plates (434). A connecting groove (436) is opened at the top of the support arm (42) near the through holes (431). A rotating shaft (437) is rotatably arranged inside the connecting groove (436). Two sets of first gears (438) are fixed on the outside of the rotating shaft (437). The two sets of first gears (438) are respectively meshed with the two sets of tooth plates (433). A first motor (439) is fixedly arranged on the outside of the support arm (42). The output shaft of the first motor (439) is connected to the rotating shaft (437).

2. An industrial controller main board functional testing apparatus as recited in claim 1, wherein: Several sets of motherboard placement boxes are fixedly installed on the outer side of the motherboard conveyor belt (3).

3. The industrial controller motherboard functional testing device as described in claim 2, characterized in that: A testing machine is provided on the top of the mounting platform (1) and outside the test plate (2), and a first connecting shaft (21) is fixedly provided inside the test plate (2).

4. The industrial controller motherboard functional testing device as described in claim 3, characterized in that: The cross-sectional shape of the lifting rod (432) is U-shaped, and the length of the toothed plate (433) is equal to the length of the lifting rod (432).

5. The industrial controller motherboard functional testing device as described in claim 4, characterized in that: The inner walls of both sets of through holes (431) are fixedly provided with limit strips, and the outer sides of both sets of lifting rods (432) are provided with limit grooves that are adapted to the size of the limit strips.

6. The industrial controller motherboard functional testing device as described in claim 5, characterized in that: The clamping member (44) includes several sets of test slots (441) opened on the top of the test plate (2). The inner walls of the left and right sides of the test slots (441) are provided with storage slots (442). The interior of the two sets of storage slots (442) is slidably provided with first wedge blocks (443). The side of the two sets of first wedge blocks (443) that are close to each other is fixedly provided with clamping plates (444). The side of the two sets of first wedge blocks (443) that are far apart from each other is fixedly provided with support springs (445). The ends of the two sets of support springs (445) that are far apart from each other are respectively connected to the inner walls of the two sets of storage slots (442). The bottom of the connecting plate (434) is fixedly provided with two sets of second wedge blocks (446).

7. The industrial controller motherboard functional testing device as described in claim 6, characterized in that: Several sets of test slots (441) are arranged in a ring on the top of the test disk (2), and the cross-sectional shape of the clamping plate (444) is set as an inverted L shape.

8. The industrial controller motherboard functional testing device as described in claim 7, characterized in that: Two sets of the second wedge blocks (446) are respectively disposed on the left and right sides of the pneumatic suction cup (435), and the inclined surfaces of the second wedge blocks (446) are opposite to those of the first wedge blocks (443).

9. The industrial controller motherboard functional testing device as described in claim 8, characterized in that: The adjusting component (45) includes a second connecting shaft (451) rotatably disposed inside the mounting platform (1), the top end of the second connecting shaft (451) being connected to the rotating column (41), a third connecting shaft (452) rotatably disposed on the inner top wall of the mounting platform (1), a gear disk (453) fixedly disposed on the outer side of the first connecting shaft (21), a second gear (454) fixedly disposed on the outer side of the third connecting shaft (452), the second gear (454) meshing with the gear disk (453), a ratchet (455) fixedly disposed on the outer side of the third connecting shaft (452) and below the second gear (454), a connecting ring (456) fixedly disposed on the outer side of the second connecting shaft (451), a pawl (457) hinged to the outer side of the connecting ring (456), a second motor (458) fixedly disposed inside the mounting platform (1), and the output shaft of the second motor (458) being connected to the second connecting shaft (451).

10. The industrial controller motherboard functional testing device as described in claim 9, characterized in that: The pawl (457) is engaged with the ratchet (455), and the third connecting shaft (452) is located in the middle of the side opposite to the first connecting shaft (21) and the second connecting shaft (451).

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