Film layer overflow detection method and device based on thin film interference imaging

By using a thin-film interferometric imaging method, geometric and texture features for membrane overflow detection are extracted, a similarity evaluation mechanism is constructed, and feature fusion and region localization are combined to achieve high precision and accuracy in membrane overflow detection, thus solving the detection deficiencies in existing technologies.

CN121904050BActive Publication Date: 2026-06-12CHENGDU CNS VISION TECH CO LTD
2 Cites 0 Cited by

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
CHENGDU CNS VISION TECH CO LTD
Filing Date
2026-03-24
Publication Date
2026-06-12

AI Technical Summary

⚠Technical Problem

Existing membrane overflow detection methods have shortcomings in image processing, feature extraction, region localization, and anomaly analysis, resulting in low detection accuracy and precision.

⚗Method used

A thin-film interferometric imaging-based method is adopted to determine the outer boundary of the display area through edge detection, extract the geometric contour and texture distribution features of the overflow inspection area and the uncoated inspection area, construct the detection formula data structure, calculate the proportional relationship, fuse the similarity of geometric and texture features, perform Gaussian filtering and histogram equalization, accurately locate the inspection area, quantitatively analyze the stripe direction angle and the proportion of broken pixels, and generate an inspection report.

🎯Benefits of technology

It achieves high precision and accuracy in membrane overflow detection, overcomes the shortcomings of traditional technologies in feature extraction, region localization and anomaly analysis, and provides a reliable detection strategy.

✦ Generated by Eureka AI based on patent content.

Smart Images

  • Figure 1
    Figure 1
  • Figure 2
    Figure 2
  • Figure 3
    Figure 3
Patent Text Reader

Abstract

The embodiment of the application provides a film layer overflow detection method and device based on thin film interference imaging, information is effectively extracted through innovatively designing a feature extraction system, through geometric analysis and texture analysis, a similarity evaluation mechanism is constructed, a reliable detection strategy is established in combination with feature fusion and region positioning, and abnormal analysis is introduced, parameter quantization and level evaluation are used to ensure the accuracy of detection. The method effectively solves the shortcomings of traditional technologies in feature extraction, region positioning and abnormal analysis, and provides technical support for film layer detection.
Need to check novelty before this filing date? Find Prior Art