Solid-state spin zero field magnetic resonance temperature measurement method and system

Abstract

The invention provides a solid-state spin zero-field magnetic resonance temperature measurement method and system. The method comprises the following steps: an IQ modulator modulates an intrinsic signal vt according to a baseband low-frequency I (t) signal and a baseband low-frequency Q (t) signal, generates a composite dual-frequency microwave containing two resonant frequencies, and applies the composite dual-frequency microwave to a diamond sample; the diamond sample outputs a fluorescence signal and acts on the lock-in amplifier, the waveform generator outputs a reference signal to the lock-in amplifier, and the pulse transmitter performs sequential control on the microwave signal source and the lock-in amplifier; the lock-in amplifier outputs a lock-in amplifier output signal according to the fluorescence signal and the reference signal; performing data processing on the output signal of the lock-in amplifier to obtain a temperature field variation; and according to a reference temperature and the temperature field variable quantity, calculating and obtaining a solid-state spin zero field magnetic resonance temperature measurement result. By applying the technical scheme of the invention, the technical problem that the quantum precision measurement sensitivity based on solid-state spin magnetic resonance is limited by multi-physics field coupling in the prior art is solved.

Description

Technical Field

[0001] This invention relates to the field of quantum precision measurement technology, and in particular to a solid-state spin zero-field magnetic resonance temperature measurement method and system. Background Technology

[0002] Solid-state spin systems possess excellent properties in quantum precision measurement, including room-temperature measurement, high spatial resolution, and high stability, and are easily miniaturized, making them an important development direction for next-generation precision measurement technologies. However, spin systems are typically sensitive to multiple physical quantities simultaneously, such as magnetic fields, electric fields, and temperature. In precision measurements, the inability to distinguish between these multiple quantities limits measurement sensitivity and accuracy. Current techniques utilizing solid-state spin magnetic resonance spectroscopy to achieve combined measurements of magnetic fields and temperatures in a time-series manner still cannot avoid coupling between the temperature and magnetic field measurement signals. Even with magnetic shielding or magnetic compensation to achieve near-zero magnetic fields, residual magnetic noise still limits the sensitivity of temperature measurements based on spin magnetic resonance.

[0003] As can be seen from the above, in order to address the bottleneck of the sensitivity limitation of quantum precision measurement based on solid-state spin magnetic resonance due to the coupling of multiple physical fields, it is necessary to break through the existing measurement schemes and meet the measurement requirements of temperature and decoupling of multiple physical fields as well as sensitivity improvement. Summary of the Invention

[0004] This invention provides a solid-state spin zero-field magnetic resonance temperature measurement method and system, which can solve the technical problem that the sensitivity of quantum precision measurement based on solid-state spin magnetic resonance is limited by multi-physics field coupling in the prior art.

[0005] According to one aspect of the present invention, a method for measuring solid-state spin zero-field magnetic resonance temperature is provided according to a specific embodiment of the present invention. The method includes: generating a baseband low-frequency waveform using a waveform generator in a zero magnetic field environment. Signals and Signal, microwave signal source generates eigensignal The IQ modulator is based on the baseband low frequency. Signals and Signal to the intrinsic signal Modulation is performed to generate a composite dual-frequency microwave containing two resonant frequencies, and the composite dual-frequency microwave is applied to a diamond sample; the diamond sample outputs a fluorescence signal. The waveform generator outputs a reference signal to the lock-in amplifier, and the pulse transmitter performs timing control on the microwave signal source and the lock-in amplifier; the lock-in amplifier operates according to the fluorescence signal. The reference signal is output as the lock-in amplifier output signal; the lock-in amplifier output signal is processed to obtain the temperature field change; the solid-state spin zero-field magnetic resonance temperature measurement result is calculated based on the reference temperature and the temperature field change.

[0006] According to another aspect of the present invention, a solid-state spin zero-field magnetic resonance temperature measurement system is provided, which is used to implement the steps of the solid-state spin zero-field magnetic resonance temperature measurement method as described above.

[0007] Furthermore, the solid-state spin zero-field magnetic resonance temperature measurement system includes a waveform generator, a microwave signal source, an IQ modulator, a diamond sample, a lock-in amplifier, a data processing module, and a control system. The control system is used to control the microwave signal source, the waveform generator, and the pulse transmitter. In a zero magnetic field environment, the waveform generator generates a baseband low frequency. Signals and The microwave signal source generates eigensignals. The IQ modulator is based on the baseband low frequency. Signals and Signal to the intrinsic signal Modulation is performed to generate a composite dual-frequency microwave containing two resonant frequencies, and the composite dual-frequency microwave is applied to the diamond sample; the diamond sample outputs a fluorescence signal. The waveform generator outputs a reference signal to the lock-in amplifier, and the pulse transmitter performs timing control on the microwave signal source and the lock-in amplifier; the lock-in amplifier operates according to the fluorescence signal. The reference signal is output by the lock-in amplifier; the data processing module processes the output signal of the lock-in amplifier to obtain the temperature field change, and calculates the solid-state spin zero-field magnetic resonance temperature measurement result based on the reference temperature and the temperature field change.

[0008] Applying the technical solution of this invention, a method for measuring solid-state spin zero-field magnetic resonance temperature is provided. This method generates a composite microwave containing two resonant frequencies by combining a microwave source with an arbitrary waveform generator (AWG) and an IQ modulator. The dual-frequency microwave field is applied to a diamond sample through a microwave resonator. The electron spin S=1 of the nitrogen-vacancy color center spin system within the diamond, and the nitrogen atom ( 14The N-nuclear spin I=1 possesses a hyperfine energy level structure. Its magnetic resonance spectrum under zero magnetic field conditions allows for temperature measurement insensitive to magnetic fields using a dual-resonance scheme, while simultaneously improving temperature measurement sensitivity. Two lock-in amplification and data processing methods are provided: microwave frequency modulation (FM) and amplitude modulation (AM). Both employ sinusoidal modulation to modulate the carrier signal output from the microwave signal source, followed by demodulation in the lock-in amplifier. Based on these lock-in amplification and data processing methods, the output temperature field change... Based on reference temperature Temperature measurement results can be obtained. Therefore, the solid-state spin zero-field magnetic resonance temperature measurement method provided by this invention can solve the technical problems of magnetic field and temperature coupling and low temperature measurement sensitivity in solid-state spin quantum precision measurement compared with the prior art. Attached Figure Description

[0009] The accompanying drawings, which form part of this specification, are provided to further illustrate embodiments of the invention and, together with the textual description, explain the principles of the invention. It is obvious that the drawings described below are merely some embodiments of the invention, and those skilled in the art can obtain other drawings based on these drawings without any creative effort.

[0010] Figure 1 A schematic diagram of the ODMR of the 14N hyperfine level and its first-order guide line under single-frequency / dual-frequency microwave field driving according to a specific embodiment of the present invention is shown.

[0011] Figure 2 A block diagram of a zero-field temperature sensing system driven by a composite dual-frequency microwave according to a specific embodiment of the present invention is shown. Detailed Implementation

[0012] It should be noted that, unless otherwise specified, the embodiments and features described in this application can be combined with each other. The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of the present invention, and not all of them. The following description of at least one exemplary embodiment is merely illustrative and is in no way intended to limit the present invention or its application or use. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0013] It should be noted that the terminology used herein is for the purpose of describing particular embodiments only and is not intended to limit the exemplary embodiments according to this application. As used herein, the singular form is intended to include the plural form as well, unless the context clearly indicates otherwise. Furthermore, it should be understood that when the terms "comprising" and / or "including" are used in this specification, they indicate the presence of features, steps, operations, devices, components, and / or combinations thereof.

[0014] Unless otherwise specifically stated, the relative arrangement, numerical expressions, and values ​​of the components and steps set forth in these embodiments do not limit the scope of the invention. It should also be understood that, for ease of description, the dimensions of the various parts shown in the drawings are not drawn to actual scale. Techniques, methods, and devices known to those skilled in the art may not be discussed in detail, but where appropriate, such techniques, methods, and devices should be considered part of the specification. In all examples shown and discussed herein, any specific values ​​should be interpreted as merely exemplary and not as limitations. Therefore, other examples of exemplary embodiments may have different values. It should be noted that similar reference numerals and letters in the following figures denote similar items; therefore, once an item is defined in one figure, it need not be further discussed in subsequent figures.

[0015] like Figure 1 and Figure 2 As shown, a solid-state spin zero-field magnetic resonance temperature measurement method is provided according to a specific embodiment of the present invention. The solid-state spin zero-field magnetic resonance temperature measurement method includes: generating a baseband low frequency in a zero magnetic field environment using a waveform generator. Signals and Signal, microwave signal source generates eigensignal The IQ modulator is based on the baseband low frequency. Signals and Signal to the intrinsic signal Modulation is performed to generate a composite dual-frequency microwave containing two resonant frequencies, and the composite dual-frequency microwave is applied to a diamond sample; the diamond sample outputs a fluorescence signal. The waveform generator outputs a reference signal to the lock-in amplifier, and the pulse transmitter performs timing control on the microwave signal source and the lock-in amplifier; the lock-in amplifier operates according to the fluorescence signal. The reference signal is output as the lock-in amplifier output signal; the lock-in amplifier output signal is processed to obtain the temperature field change; the solid-state spin zero-field magnetic resonance temperature measurement result is calculated based on the reference temperature and the temperature field change.

[0016] This configuration provides a solid-state spin zero-field magnetic resonance temperature measurement method. This method generates a composite microwave containing two resonant frequencies using a microwave source combined with an arbitrary waveform generator (AWG) and an IQ modulator. The dual-frequency microwave field is then applied to a diamond sample via a microwave resonator. The electron spin S=1 in the nitrogen-vacancy color center spin system within the diamond, and the nitrogen atom (… 14 The N-nuclear spin I=1 possesses a hyperfine energy level structure. Its magnetic resonance spectrum under zero magnetic field conditions allows for temperature measurement insensitive to magnetic fields using a dual-resonance scheme, while simultaneously improving temperature measurement sensitivity. Two lock-in amplification and data processing methods are provided: microwave frequency modulation (FM) and amplitude modulation (AM). Both employ sinusoidal modulation to modulate the carrier signal output from the microwave signal source, followed by demodulation in the lock-in amplifier. Based on these lock-in amplification and data processing methods, the output temperature field change... Based on reference temperature Temperature measurement results can be obtained. Therefore, the solid-state spin zero-field magnetic resonance temperature measurement method provided by this invention can solve the technical problems of magnetic field and temperature coupling and low temperature measurement sensitivity in solid-state spin quantum precision measurement compared with the prior art.

[0017] Furthermore, in this invention, the IQ modulator uses two sinusoidal modulation methods, microwave frequency modulation (FM) and amplitude modulation (AM), to modulate the signal and generate the modulated composite dual-frequency microwave.

[0018] When signal modulation is performed using microwave frequency modulation, the modulated composite dual-frequency microwave... Represented as: ,in, To set the signal strength, The bias frequency of the IQ modulation stage. For modulation depth, The modulation frequency. Lock-in amplifier output signal. for: ,in, For the gain of the lock-in amplifier, For fixed carrier center frequency ODMR spectra under the following conditions This represents the normalization coefficient of the phase-locked output in frequency modulation mode. This is the detuning quantity. Full width at half maximum (FWHM). Minimum resolution temperature field change. for ,in, This represents the minimum detectable change in the output signal of the lock-in amplifier. This represents the maximum value of the scale coefficient for the phase-locked output signal.

[0019] Furthermore, when amplitude modulation is used for signal modulation, the modulated composite dual-frequency microwave... Represented as: ,in, To set the signal strength, For modulation amplitude, For microwave carrier frequency, The modulation frequency. Lock-in amplifier output signal. for: ,in, The normalization coefficient of the phase-locked output in amplitude modulation mode The bias frequency of the IQ modulation stage. Minimum resolution temperature field change. for ,in, This represents the minimum detectable change in the output signal of the lock-in amplifier. For temperature, This is the normalization coefficient for the phase-locked output in amplitude modulation mode.

[0020] According to another aspect of the present invention, a solid-state spin zero-field magnetic resonance temperature measurement system is provided, which is used to implement the steps of the solid-state spin zero-field magnetic resonance temperature measurement method described above. The solid-state spin zero-field magnetic resonance temperature measurement system includes a waveform generator, a microwave signal source, an IQ modulator, a diamond sample, a lock-in amplifier, a data processing module, and a control system. The control system is used to control the microwave signal source, the waveform generator, and the pulse transmitter. In a zero magnetic field environment, the waveform generator generates a baseband low frequency... Signals and The microwave signal source generates eigensignals. The IQ modulator is based on the baseband low frequency. Signals and Signal to the intrinsic signal Modulation is performed to generate a composite dual-frequency microwave containing two resonant frequencies, and the composite dual-frequency microwave is applied to the diamond sample; the diamond sample outputs a fluorescence signal. The waveform generator outputs a reference signal to the lock-in amplifier, and the pulse transmitter performs timing control on the microwave signal source and the lock-in amplifier; the lock-in amplifier operates according to the fluorescence signal. The reference signal is output by the lock-in amplifier; the data processing module processes the output signal of the lock-in amplifier to obtain the temperature field change, and calculates the solid-state spin zero-field magnetic resonance temperature measurement result based on the reference temperature and the temperature field change.

[0021] To gain a further understanding of the present invention, the following description is provided in conjunction with... Figure 1 and Figure 2 The solid-state spin zero-field magnetic resonance temperature measurement method and system provided by this invention will be described in detail.

[0022] like Figure 1 and Figure 2 As shown in the figure, a solid-state spin zero-field magnetic resonance temperature measurement method is provided according to a specific embodiment of the present invention, which can solve the technical problems of magnetic field and temperature coupling and low temperature measurement sensitivity in solid-state spin quantum precision measurement.

[0023] The physical model of the temperature sensing method is based on NV. － nuclear spin hyperfine level interaction, NV － The spin ground-state Hamiltonian is described as follows:

[0024]

[0025] in, For zero-field splitting, ; and These are the parameters for axial and radial magnetic hyperfine coupling. These are the electric quadrupole moment splitting parameters; To combine the local electric field and strain field to obtain the total effective electric field parameters; and These are the axial and radial electric dipole moments, respectively; It is an electron spin operator. For the nuclear spin operator, corresponding to 14 N( )and 15 N( ).

[0026] The NV ensemble has no preferred orientation, and the electron spin (S=1) of each NV color center is related to its own... 14 N(I=1) / 15 The N (I=1 / 2) nuclear spin undergoes hyperfine interaction. Under zero magnetic conditions at room temperature ( The nitrogen nuclei have highly aliased spins and are thermally balanced, and are in a state of flux. The probabilities of the three states are exactly equal. Under zero magnetic field. The dominant factor is that the observed nonaxial magnetic hyperfine parameters have negligible influence on the zero-field hyperfine structure and state coupling. If we ignore the broadening of the resonant frequency at different NV color centers in the ensemble due to differences in local environments such as strain and electric field, then NV － The spin ground-state Hamiltonian simplifies to:

[0027]

[0028] Due to the degeneracy under zero magnetic field, we only need to consider The transition, the resonant frequency from Therefore, under zero magnetic field and zero electric field-strain field conditions... 14 The resonant frequency of the NV ensemble is However, in a real zero-field environment, the resonant frequency shifts due to strain and the presence of a local electric field, because in the weak-field limit... The state splits linearly in the presence of a nonaxial electric-strain field, rather than a non-degenerate state. In existence, satisfying <2 The nonaxial electric field-strain field exhibits quadratic repulsion. Therefore, the single-frequency microwave ODMR spectrum under a compensated zero magnetic field environment shows... Figure 1 The four resonance peaks shown include the two middle peaks. and The reason for the non-overlapping is the existence of a non-axial electric field-strain field.

[0029] The temperature sensing method relies on ultra-fine energy level actuation via a composite dual-frequency microwave field under zero magnetic conditions. When aligned to zero magnetic field, the frequency of the outermost resonant peak is read as... and ( ), The first resonance frequency, The second resonance peak frequency drives these two resonance frequencies. The process for constructing the composite dual-frequency microwave field is as follows: Figure 2 As shown, a microwave source, combined with an arbitrary waveform generator (AWG) and an IQ modulator, generates a composite microwave containing two resonant frequencies. This dual-frequency microwave field is then applied to the diamond sample via a microwave resonator. The time-domain expression for the ideal dual-frequency microwave field is:

[0030]

[0031] in, Signal strength related to microwave power, The signal strength is related to the first resonance peak frequency and microwave power. The signal strength is related to the microwave power at the second resonant peak frequency. It is phase. For the first phase, This is the second phase. In practice, low frequencies are generated using an AWG (Automatic Gauge). The signal is sent to the IQ modulator, and the IQ modulator will... The signal acts on the intrinsic carrier signal, and is converted to a dual-frequency microwave of the form of equation (3). Specifically, the microwave signal source outputs a carrier frequency. Let be the local oscillator frequency of the IQ modulator, then the dual-frequency field is represented as:

[0032]

[0033] By combining formulas (3) and (4), the AWG output can be obtained. The signal is represented as

[0034]

[0035] Since the two resonance peaks driven in the uniformly oriented NV ensemble are approximately the same size, assume that the dual-frequency microwave power is uniform ( Phase alignment () At this time, the low-frequency signal of IQ modulation is represented as Therefore, only AWG output is needed. Signal.

[0036] This embodiment provides two lock-in amplification and data processing methods: microwave frequency modulation (FM) and amplitude modulation (AM). Both methods employ sinusoidal modulation to modulate the carrier signal output from the microwave signal source, which is then demodulated in the lock-in amplifier. The following analysis examines the expression of the lock-in amplifier output signal as a function of the external temperature field under different modulation schemes at zero magnetic field.

[0037] 1) Regarding the FM modulation and data processing method described in this embodiment

[0038] After zero magnetic compensation, at the reference temperature Next, scan the single-frequency ODMR spectrum to find the fixed carrier center frequency. The center of the resonant frequency is when the external temperature changes. Let the detuning quantity When the only external factor is temperature, the relationship between temperature and detuning is quantitatively described as follows: ,make When the external environment changes As a constant, the expression for the sinusoidal modulation carrier frequency is:

[0039]

[0040] in, Modulation depth; Here is the modulation frequency. The modulated dual-frequency signal is represented as:

[0041]

[0042] The two middle peaks of a single-frequency ODMR spectrum and The amplitude is much smaller than that of the outer peak. and Therefore, ignoring its influence in dual-frequency drive, when dual-frequency microwaves are applied to diamond, the ODMR spectrum of the NV center ensemble fluorescence can be expressed as a Lorentz line shape:

[0043]

[0044] in, The normalization coefficient for the fluorescence signal is denoted as . The normalization coefficient of the first fluorescence signal is . The normalization coefficient for the second fluorescence signal; For single-peak signal contrast; It is half height and full width. Assume... , Normalization coefficient of uniform fluorescence signal under uniform microwave driving

[0045]

[0046]

[0047] right At point Taylor expansion yields:

[0048]

[0049] Lock-in amplifier detects first harmonic component (reference frequency) Therefore, extract The coefficient of the term. Assume... Given the gain of the lock-in amplifier, the output signal of the lock-in amplifier is:

[0050]

[0051] in, Lock-in amplifier output signal For mistuning The derivative of is used to reflect changes in external temperature:

[0052]

[0053] Caused by temperature change Change to ,when hour Obtain the maximum slope At this point, the system's response to temperature changes is at its maximum, and the minimum resolvable temperature field is:

[0054]

[0055] in, This is the minimum detectable change in the output signal of the lock-in amplifier (depending on system noise, such as shot noise). The maximum value of the phase-locked output signal scale coefficient, when the line width (typical value) )hour ; Select to make The modulation depth that is maximized while maintaining good linearity is ; .

[0056] 2) Regarding the AM modulation and data processing method described in this embodiment

[0057] In AM modulation, the microwave carrier frequency is fixed at 1000 MHz. The center of the resonant frequency is With temperature change, This is the detuning quantity. The amplitude is sinusoidally modulated, and the microwave field is represented as:

[0058]

[0059] in, Modulation amplitude; Modulation frequency. Microwave power. Therefore, the contrast changes over time:

[0060]

[0061] Will Substituting into equation (9), and repeating the derivation process of the lock-in output signal, we obtain the lock-in amplifier output signal and its first derivative signal as follows:

[0062]

[0063]

[0064] in, Similar to FM, The expression for the minimum temperature resolution field can be obtained as follows:

[0065]

[0066] Based on the lock-in amplification and data processing method, the output temperature field change is... Based on reference temperature The temperature measurement result is as follows: .

[0067] In summary, this invention provides a solid-state spin zero-field magnetic resonance temperature measurement method. This method generates a composite microwave containing two resonant frequencies using a microwave source combined with an arbitrary waveform generator (AWG) and an IQ modulator. The dual-frequency microwave field is then applied to a diamond sample via a microwave resonator. The electron spin S=1 in the nitrogen-vacancy color center spin system within the diamond, and the nitrogen atom (… 14 The N-nuclear spin I=1 possesses a hyperfine energy level structure. Its magnetic resonance spectrum under zero magnetic field conditions allows for temperature measurement insensitive to magnetic fields using a dual-resonance scheme, while simultaneously improving temperature measurement sensitivity. Two lock-in amplification and data processing methods are provided: microwave frequency modulation (FM) and amplitude modulation (AM). Both employ sinusoidal modulation to modulate the carrier signal output from the microwave signal source, followed by demodulation in the lock-in amplifier. Based on these lock-in amplification and data processing methods, the output temperature field change... Based on reference temperature Temperature measurement results can be obtained. Therefore, the solid-state spin zero-field magnetic resonance temperature measurement method provided by this invention can solve the technical problems of magnetic field and temperature coupling and low temperature measurement sensitivity in solid-state spin quantum precision measurement compared with the prior art.

[0068] For ease of description, spatial relative terms such as "above," "on top of," "on the upper surface of," "above," etc., are used herein to describe the spatial positional relationship of a device or feature as shown in the figures to other devices or features. It should be understood that spatial relative terms are intended to encompass different orientations in use or operation beyond the orientation of the device as described in the figures. For example, if the device in the figures were inverted, a device described as "above" or "on top of" other devices or structures would subsequently be positioned as "below" or "under" other devices or structures. Thus, the exemplary term "above" can include both "above" and "below." The device may also be positioned in other different ways (rotated 90 degrees or in other orientations), and the spatial relative descriptions used herein will be interpreted accordingly.

[0069] Furthermore, it should be noted that the use of terms such as "first" and "second" to define components is merely for the purpose of distinguishing the corresponding components. Unless otherwise stated, the above terms have no special meaning and therefore should not be construed as limiting the scope of protection of this invention.

[0070] The above description is merely a preferred embodiment of the present invention and is not intended to limit the invention. Various modifications and variations can be made to the present invention by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention should be included within the scope of protection of the present invention.

Claims

1. A method for measuring solid-state spin zero-field magnetic resonance temperature, characterized in that, The solid-state spin zero-field magnetic resonance temperature measurement method includes: In a zero magnetic field environment, the waveform generator generates baseband low frequency. Signals and Signal, microwave signal source generates eigensignal The IQ modulator is based on the baseband low frequency. Signals and Signal to the intrinsic signal Modulation is performed to generate a composite dual-frequency microwave containing two resonant frequencies, and the composite dual-frequency microwave is applied to the diamond sample. The diamond sample outputs a fluorescence signal. And it acts on the lock-in amplifier, the waveform generator outputs a reference signal. The pulse transmitter performs timing control on the microwave signal source and the lock-in amplifier. The lock-in amplifier is based on the fluorescence signal. and the reference signal Output signal of the lock-in amplifier; The output signal of the lock-in amplifier is processed to obtain the temperature field change. The solid-state spin zero-field magnetic resonance temperature measurement results are obtained by calculating the reference temperature and the temperature field change.

2. The solid-state spin zero-field magnetic resonance temperature measurement method according to claim 1, characterized in that, The IQ modulator uses two sinusoidal modulation methods, microwave frequency modulation (FM) and amplitude modulation (AM), to modulate the signal and generate a modulated composite dual-frequency microwave.

3. The solid-state spin zero-field magnetic resonance temperature measurement method according to claim 2, characterized in that, When signal modulation is performed using microwave frequency modulation, the modulated composite dual-frequency microwave... Represented as: ,in, To set the signal strength, This is the bias frequency of the IQ modulation stage. For modulation depth, The modulation frequency.

4. The solid-state spin zero-field magnetic resonance temperature measurement method according to claim 3, characterized in that, When signal modulation is performed using microwave frequency modulation, the lock-in amplifier output signal for: ,in, For the gain of the lock-in amplifier, For fixed carrier center frequency ODMR spectra under the following conditions This represents the normalization coefficient of the phase-locked output in frequency modulation mode. This is the detuning quantity. It is half height and full width.

5. The solid-state spin zero-field magnetic resonance temperature measurement method according to claim 4, characterized in that, When using microwave frequency modulation for signal modulation, the minimum resolvable temperature field change is... for ,in, This represents the minimum detectable change in the output signal of the lock-in amplifier. This represents the maximum value of the scale coefficient for the phase-locked output signal. For temperature.

6. The solid-state spin zero-field magnetic resonance temperature measurement method according to claim 2, characterized in that, When amplitude modulation is used for signal modulation, the modulated composite dual-frequency microwave... Represented as: ,in, To set the signal strength, For modulation amplitude, For microwave carrier frequency, The modulation frequency.

7. The solid-state spin zero-field magnetic resonance temperature measurement method according to claim 6, characterized in that, When amplitude modulation is used for signal modulation, the lock-in amplifier outputs a signal. for: ,in, These are the normalization coefficients for the phase-locked output in amplitude modulation mode. This is the detuning quantity. It is half the height and full width. This is the bias frequency of the IQ modulation stage.

8. The solid-state spin zero-field magnetic resonance temperature measurement method according to claim 7, characterized in that, When using amplitude modulation for signal modulation, the minimum resolvable temperature field change for ,in, This represents the minimum detectable change in the output signal of the lock-in amplifier. For temperature, This is the normalization coefficient for the phase-locked output in amplitude modulation mode.

9. A solid-state spin zero-field magnetic resonance temperature measurement system, characterized in that, The solid-state spin zero-field magnetic resonance temperature measurement system is used to implement the steps of the solid-state spin zero-field magnetic resonance temperature measurement method as described in any one of claims 1 to 8.

10. The solid-state spin zero-field magnetic resonance temperature measurement system according to claim 9, characterized in that, The solid-state spin zero-field magnetic resonance temperature measurement system includes a waveform generator, a microwave signal source, an IQ modulator, a diamond sample, a lock-in amplifier, a data processing module, and a control system. The control system is used to control the microwave signal source, the waveform generator, and the pulse transmitter. In a zero-magnetic-field environment, the waveform generator generates a baseband low frequency. Signals and The microwave signal source generates eigensignals. The IQ modulator is based on the baseband low frequency. Signals and Signal to the intrinsic signal Modulation is performed to generate a composite dual-frequency microwave containing two resonant frequencies, and the composite dual-frequency microwave is applied to a diamond sample; the diamond sample outputs a fluorescence signal. The waveform generator outputs a reference signal to the lock-in amplifier, and the pulse transmitter performs timing control on the microwave signal source and the lock-in amplifier; the lock-in amplifier operates according to the fluorescence signal. and the reference signal The output signal of the lock-in amplifier is output; the data processing module processes the output signal of the lock-in amplifier to obtain the temperature field change, and calculates the solid-state spin zero-field magnetic resonance temperature measurement result based on the reference temperature and the temperature field change.

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