Transient photoelectric detection method for aging degree of quantum dot display screen material
By constructing a dynamic threshold library and using real-time compensation and correction methods, the problem of insufficient signal acquisition in the aging detection of quantum dot display materials was solved, achieving high-precision and high-efficiency non-destructive testing, and ensuring the accuracy of test results and the integrity of samples.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- ZHONGXIAN OPTOELECTRONICS TECH (ZHEJIANG) CO LTD
- Filing Date
- 2026-02-02
- Publication Date
- 2026-04-28
AI Technical Summary
Existing methods for detecting the aging of materials in quantum dot displays suffer from insufficient signal acquisition quality, making it difficult to meet the actual needs of high-precision, high-efficiency, and non-destructive testing. Furthermore, they are susceptible to environmental interference, leading to signal distortion and sample damage.
By employing repeated excitation tests, the core photoelectric parameters of unaged standard samples were calibrated, a dynamic threshold library was constructed, and the photoelectric signals of the samples to be tested were synchronously acquired and compensated and corrected in real time under a controlled environment. Three core parameters were extracted: fluorescence decay lifetime, transient current peak, and carrier mobility. The threshold weights were dynamically adjusted according to the quantum dot type and the usage environment for judgment.
It achieves high-precision and high-efficiency non-destructive testing, improves signal acquisition quality, and ensures the accuracy of test results and the integrity of samples.
Smart Images
Figure CN121933489A_ABST
Abstract
Description
Technical Field
[0001] This invention relates to the field of quantum dot material performance testing technology, and in particular to a transient photoelectric detection method for the aging degree of quantum dot display materials. Background Technology
[0002] Quantum dot displays, with their superior characteristics such as high color gamut coverage, high brightness, low power consumption, and wide viewing angle, have been widely used in consumer electronics and professional display fields, including smartphones, televisions, and automotive displays. As the core light-emitting layer of the display, the luminescent properties (such as fluorescence quantum yield and fluorescence decay lifetime) and carrier transport properties (such as carrier mobility and transient current response) of quantum dot materials directly determine the display effect and service life of the screen. However, in actual use, quantum dot materials are susceptible to environmental factors such as temperature, humidity, and light, leading to aging phenomena such as oxidative degradation, particle agglomeration, or chemical bond breakage. This results in continuous degradation of photoelectric performance, ultimately manifesting as color distortion, brightness decay, and shortened lifespan. Therefore, accurately detecting the aging degree of quantum dot display materials is of great significance for quality control in the display manufacturing process, condition monitoring during service, and lifespan prediction.
[0003] Existing methods for detecting the aging of quantum dot materials suffer from technical defects due to insufficient signal acquisition quality, making it difficult to meet the practical requirements of high-precision, high-efficiency, and non-destructive testing. The detection process lacks effective control over environmental interferences such as temperature, humidity, light, and vibration. The acquired transient signals are easily affected by baseline drift, random noise, and ambient light superposition, and no real-time compensation correction is performed, resulting in signal distortion and affecting the accuracy of subsequent parameter extraction. Some methods use contact detection, which may also damage the sample and cannot meet the requirements of non-destructive testing. Summary of the Invention
[0004] The purpose of this invention is to provide a transient photoelectric detection method for the aging degree of quantum dot display materials, aiming to solve the technical problem that the signal acquisition quality in the prior art is insufficient and it is difficult to meet the actual needs of high precision, high efficiency and non-destructive testing.
[0005] To achieve the above objectives, the present invention employs a transient photoelectric detection method for the aging degree of quantum dot display materials, comprising the following steps: Repeated excitation tests were performed to calibrate the core photoelectric parameters of the unaged standard samples and construct a dynamic threshold library. The photoelectric signals of the samples to be tested were synchronously acquired and compensated and corrected in real time under a controlled environment. The acquired transient signals are corrected, and three core parameters are extracted: fluorescence decay lifetime, transient current peak value, and carrier mobility. The threshold weights are dynamically adjusted based on the quantum dot type and the usage environment. The extracted parameters are compared with the dynamic thresholds, and the non-aging and aging levels are determined based on the comparison results, generating a judgment report.
[0006] Among them, the steps of repeating multiple sets of excitation tests, calibrating the core photoelectric parameters of the unaged standard sample and constructing a dynamic threshold library, and synchronously acquiring and real-time compensating for the photoelectric signal of the sample to be tested under a controlled environment are as follows: Standard samples of unaged quantum dot display materials were selected and pretreated by drying and surface smoothing to build a data detection group; the data detection group included a narrow pulse light source and a dual-channel photoelectric signal acquisition device; Multiple sets of repeated excitation cycles were set, and standard samples were excited multiple times in each set. Transient fluorescence signals and transient current signals of each set were collected simultaneously, and the average value of the core photoelectric parameters was calculated as the standard parameters. The sample to be tested is cleaned and dried before being placed in a controlled and vibration-proof testing environment with controlled temperature, humidity, and light. Excitation light is emitted using excitation parameters consistent with those calibrated for the standard sample.
[0007] Among them, after setting multiple sets of repeated excitation cycles, exciting standard samples multiple times in each set, synchronously collecting transient fluorescence signals and transient current signals of each set, and calculating the average value of core photoelectric parameters as standard parameters: Samples with different aging degrees were prepared by using multiple accelerated aging paths, the parameter data of each aging node were detected, a model of parameter change with aging time was established, dynamic aging threshold intervals corresponding to multiple scenarios were divided, and a dynamic threshold library was constructed.
[0008] Among them, in the steps of cleaning and drying the sample to be tested, placing it in a controlled and vibration-proof testing environment with controlled temperature, humidity, and light, and emitting excitation light using excitation parameters consistent with those calibrated with the standard sample: It synchronously acquires transient signals, monitors environmental changes in real time, and compensates and corrects the signals.
[0009] Among the steps, the acquired transient signal is corrected, and three core parameters—fluorescence decay lifetime, transient current peak, and carrier mobility—are extracted: Baseline correction was performed on the acquired transient fluorescence and transient current signals to remove interference from signal drift; Wavelet transform denoising algorithm is used to filter random noise in the signal and retain effective signal components; The peak value of the current signal is identified by a combination of peak detection and integration.
[0010] After the step of using wavelet transform denoising algorithm to filter out random noise in the signal and retain the effective signal components: The preprocessed fluorescence signal was analyzed using an optimized double exponential decay fitting algorithm, and the average fluorescence decay lifetime was calculated.
[0011] After the step of identifying the peak value of the current signal using a combination of peak detection and integration: The carrier mobility was obtained by combining the film thickness of the quantum dot material and the applied bias voltage parameters after correction calculation.
[0012] Among the steps, the following steps are involved: dynamically adjusting the threshold weights based on the quantum dot type and the usage environment; comparing the extracted parameters with the dynamic thresholds; determining the level of non-aging or aging based on the comparison results; and generating a determination report: The matching basic threshold range is called from the dynamic threshold library, and the judgment weights corresponding to the three core parameters are dynamically adjusted according to the stability characteristics of quantum dots and the influence of the usage environment. The extracted core parameters are compared one by one with the adjusted dynamic thresholds, and the degree of sample aging is quantified by multi-parameter fusion scoring. Based on the fusion score results, the samples were classified as unaged, mildly aged, moderately aged, or severely aged.
[0013] Before the step of dynamically adjusting the judgment weights corresponding to the three core parameters based on the stability characteristics of quantum dots and the influence of the usage environment, the following steps are taken: Obtain information on the quantum dot type of the sample to be tested, as well as the actual operating conditions such as temperature and light intensity.
[0014] After determining whether a sample is unaged, mildly aged, moderately aged, or severely aged based on the fusion score results: Organize parameter data, threshold adjustment basis, and judgment results to generate a complete aging judgment report.
[0015] This invention discloses a transient photoelectric detection method for the aging degree of quantum dot display materials. The method involves repeating multiple excitation tests to calibrate the core photoelectric parameters of unaged standard samples and construct a dynamic threshold library. Under controlled conditions, synchronous photoelectric signals are acquired from the samples to be tested, and real-time compensation and correction are performed. The acquired transient signals are corrected, and three core parameters—fluorescence decay lifetime, transient current peak, and carrier mobility—are extracted. Threshold weights are dynamically adjusted based on the quantum dot type and the usage environment. The extracted parameters are compared with the dynamic thresholds, and the unaged or aged level is determined based on the comparison results, generating a judgment report. This method improves signal acquisition quality and meets the practical needs of high-precision, high-efficiency, and non-destructive testing. Attached Figure Description
[0016] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.
[0017] Figure 1 This is a flowchart of the transient photoelectric detection method for the aging degree of quantum dot display materials according to the present invention.
[0018] Figure 2 This is a flowchart of steps S100 of the present invention.
[0019] Figure 3 This is a flowchart of steps S200 of the present invention.
[0020] Figure 4 This is a flowchart of steps S300 of the present invention.
[0021] Figure 5 This is a schematic diagram of the transient photoelectric detection system for the aging degree of quantum dot display materials according to the present invention.
[0022] Figure 6 This is a schematic diagram of the electronic device of the present invention.
[0023] 401 - Standard parameter calibration and sample testing module; 402 - Sample feature parameter extraction module; 403 - Dynamic aging determination module. Detailed Implementation
[0024] Exemplary embodiments will now be described in detail, examples of which are illustrated in the accompanying drawings. When the following description relates to the drawings, unless otherwise indicated, the same numbers in different drawings represent the same or similar elements. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with this application.
[0025] The terminology used in this application is for the purpose of describing particular embodiments only and is not intended to be limiting of the application. The singular forms “a,” “the,” and “the” used in this application and the appended claims are also intended to include the plural forms unless the context clearly indicates otherwise. It should also be understood that the term “and / or” as used herein refers to and includes any or all possible combinations of one or more of the associated listed items.
[0026] It should be understood that although the terms first, second, third, etc., may be used in this application to describe various information, such information should not be limited to these terms. These terms are only used to distinguish information of the same type from one another. For example, without departing from the scope of this application, first information may also be referred to as second information, and similarly, second information may also be referred to as first information. Depending on the context, the word "if" as used herein may be interpreted as "when," "when," or "in response to determination."
[0027] Please see Figures 1-4 This invention provides a transient photoelectric detection method for the aging degree of quantum dot display materials, comprising the following steps: S100: Repeat multiple sets of excitation tests to calibrate the core photoelectric parameters of unaged standard samples and construct a dynamic threshold library. Under controlled conditions, synchronous photoelectric signal acquisition and real-time compensation and correction are performed on the samples to be tested.
[0028] In this embodiment, multiple sets of excitation tests are repeated to calibrate the core photoelectric parameters of the unaged standard samples and construct a dynamic threshold library. Under controlled conditions, synchronous photoelectric signal acquisition and real-time compensation and correction are performed on the samples to be tested. The specific process is as follows: S101: Select standard samples of unaged quantum dot display materials, and after drying and surface smoothing pretreatment, build a data detection group; the data detection group includes a narrow pulse light source and a dual-channel photoelectric signal acquisition device; S102: Set multiple sets of repeated excitation cycles, excite standard samples multiple times in each set, and simultaneously collect transient fluorescence signals and transient current signals of each set, and calculate the average value of core photoelectric parameters as standard parameters; S103: Samples with different aging degrees are prepared through multiple accelerated aging paths, parameter data of each aging node are detected, a model of parameter change with aging time is established, dynamic aging threshold intervals corresponding to multiple scenarios are divided, and a dynamic threshold library is constructed. S104: The sample to be tested is cleaned and dried before being placed in a controlled and vibration-proof testing environment with controlled temperature, humidity, and light. Excitation light is emitted using excitation parameters consistent with those calibrated with the standard sample. Transient signals are collected synchronously, and environmental changes are monitored in real time and the signals are compensated and corrected.
[0029] In the above process, core light-emitting layer materials of quantum dot displays that have not undergone any aging treatment and have uniform performance are selected as standard samples. The material type can be selected according to the actual testing requirements (such as CdSe / ZnS core-shell structure quantum dot films, InP / ZnS quantum dot films, etc.). Visual inspection is conducted to ensure that the samples are undamaged and free of stains. The selected standard samples are placed in a vacuum drying oven and dried at 60°C for 2 hours to remove residual moisture. Subsequently, the surface flatness of the samples is tested using an atomic force microscope to ensure that the surface roughness Ra ≤ 5nm. If it does not meet the requirement, it is flattened by precision grinding to ensure that the sample test surface is in a consistent state.
[0030] The data detection team consists of two core components: a narrow-pulse light source and a dual-channel photoelectric signal acquisition unit. The narrow-pulse light source uses a tunable pulsed laser diode, with an emission wavelength adjustable within the range of 380–450 nm, a pulse width of 5–10 ns, a single-pulse energy of 2–8 μJ, and a fixed pulse repetition frequency of 5 kHz. The dual-channel photoelectric signal acquisition unit includes a fluorescence detector and a transient current sensor. The fluorescence detector uses an avalanche photodiode with a response wavelength range of 500–700 nm and a time resolution ≤0.5 ns. The transient current sensor has a bandwidth ≥1.2 GHz and a sampling rate ≥15 GS / s, ensuring simultaneous acquisition of transient fluorescence and transient current signals.
[0031] Plan 10-20 sets of repeated excitation cycles, with 5 consecutive excitations per set and an interval of 100ms between each excitation, to avoid the sample temperature rising due to continuous excitation and affecting the test results.
[0032] The narrow pulse light source is activated, and excitation light is emitted to the standard sample according to the set excitation parameters. The dual-channel photoelectric signal acquisition device synchronously acquires the transient fluorescence signal and transient current signal corresponding to each group of 5 excitations, and records the complete waveform data of each group of signals.
[0033] The collected signals for each group are initially processed to remove abnormal waveforms (such as abnormal peak signals caused by sudden interference). The fluorescence decay lifetime, transient current peak value, and carrier mobility of each group are calculated. The average value of the parameters of all valid groups is then taken as the final standard parameters (τ0, I0, μ0) to reduce the random error of a single test.
[0034] Multi-path accelerated aging sample preparation: Samples with different aging degrees are prepared through three typical accelerated aging paths to simulate aging scenarios in real-world use. High temperature and high humidity aging: The samples were placed in an environmental chamber at 85℃ and 85% relative humidity for 0h, 200h, 400h, 600h, 800h and 1000h respectively; UV aging: The samples were irradiated with a UV lamp with a wavelength of 365nm and a power of 100mW / cm2 for 0h, 100h, 200h, 300h, 400h and 500h respectively; High-temperature aging: The samples were placed in a dry environment chamber at 100℃ and aged for 0h, 300h, 600h, 900h and 1200h respectively.
[0035] Aging sample parameter detection: For each aging node sample, photoelectric signals are collected according to the test procedure in step S102, and the corresponding fluorescence decay lifetime, transient current peak, and carrier mobility data are extracted.
[0036] Change model establishment and threshold division: A cubic polynomial fitting algorithm is used to establish change models of the three core parameters with aging time, and to clarify the decay law of the parameters with the degree of aging. Combined with the common usage environment of quantum dot display screens (such as low temperature, normal temperature, high temperature, strong light, and weak light), dynamic threshold intervals are divided into four levels: no aging, mild aging, moderate aging, and severe aging. All data are integrated to form a dynamic threshold library and stored in the database.
[0037] Sample pretreatment: Clean the surface of the sample to be tested by wiping the test surface of the sample with a lint-free cloth dipped in anhydrous ethanol to remove dust and oil stains, and then put it into a vacuum drying oven at 40℃ for 1 hour to remove residual ethanol and moisture on the surface.
[0038] Preparation of the testing environment: Place the pretreated sample to be tested on an environmentally controlled sample stage. The sample stage is equipped with a temperature control system, a humidity control system and a shock-absorbing structure. Turn on the environmental control device to adjust the testing environment to a temperature of 25±0.5℃ and a humidity of ≤60%RH. At the same time, turn off the ambient light source and activate the light shield to ensure that the ambient light intensity is ≤10 lux and reduce external interference.
[0039] Signal acquisition: Using excitation parameters (wavelength, pulse width, single pulse energy, repetition frequency) that are completely consistent with those in the standard sample calibration stage, a narrow pulse light source is activated to emit excitation light to the sample to be tested, and dual-channel photoelectric signal acquisition devices simultaneously acquire transient fluorescence signals and transient current signals.
[0040] Real-time compensation and correction: Environmental parameter monitoring is achieved by using high-precision sensors built into the sample stage to collect temperature at a frequency of 10Hz (accuracy ±0.1℃), humidity at a frequency of 5Hz (accuracy ±1%RH), and ambient light intensity at a frequency of 5Hz (accuracy ±1lux). At the same time, the time difference between the two signal acquisitions is monitored by a synchronous clock unit.
[0041] Deviation determination involves comparing real-time environmental parameters with baseline parameters (25℃, ≤60%RH, ≤10lux) and calculating the deviation value. If the temperature deviation is ±0.5℃, humidity deviation is ±5%RH, light deviation is ±5lux, or the signal acquisition time difference exceeds 10ps, the correction process is triggered; if the deviation is within the allowable range, the original signal is retained.
[0042] Factor-based correction: When there is a temperature deviation, the current signal and fluorescence decay rate are finely adjusted according to the preset coefficient library; when the humidity exceeds the standard, a correction coefficient is applied to the fluorescence signal and low-frequency noise of the current is filtered out; when there is light interference, the ambient light component is deducted through a filtering algorithm; when there is a synchronization error, the time axis of the current signal is shifted based on the fluorescence signal acquisition time.
[0043] The results are verified by comparing the signal waveforms before and after correction to check whether they conform to the photoelectric response law of quantum dots. If there is an abnormality, the correction is repeated until a qualified transient signal is output.
[0044] S200: Corrects the acquired transient signals and extracts three core parameters: fluorescence decay lifetime, transient current peak, and carrier mobility.
[0045] In this embodiment, the acquired transient signal is corrected, and three core parameters are extracted: fluorescence decay lifetime, transient current peak value, and carrier mobility. The specific process is as follows: S201: Perform baseline correction on the acquired transient fluorescence and transient current signals to remove interference from signal drift; S202: Wavelet transform denoising algorithm is used to filter random noise in the signal and retain effective signal components. The preprocessed fluorescence signal is analyzed by an optimized double exponential decay fitting algorithm to calculate the average fluorescence decay lifetime. S203: The peak value of the current signal is identified by a combination of peak detection and integration. The carrier mobility is obtained by combining the thickness of the quantum dot material and the applied bias voltage parameters and then correcting the calculation.
[0046] In the above process, for the transient fluorescence signal and transient current signal acquired and corrected in step S104, a polynomial fitting baseline subtraction method is used to identify the baseline drift component in the signal (such as the slowly changing component caused by sensor zero drift), and the original signal is subtracted from the fitted baseline signal to eliminate the interference of baseline drift on subsequent parameter extraction and ensure signal reference consistency.
[0047] Wavelet transform denoising: For the baseline-corrected signal, a wavelet transform denoising algorithm with db4 wavelet basis and 3-level decomposition is used to separate random noise (such as electronic noise and environmental electromagnetic interference) in the signal, retain the effective signal components that reflect the photoelectric properties of quantum dots, and make the signal waveform smoother.
[0048] Fluorescence decay lifetime calculation: An optimized double exponential decay fitting algorithm is used to fit and analyze the noise-reduced transient fluorescence signal. The fitting coefficient is optimized through algorithm iteration to ensure that the goodness of fit R2≥0.98. Then, based on the decay lifetimes of the fast and slow components obtained from the fitting, the average fluorescence decay lifetime is calculated as one of the core parameters.
[0049] Transient current peak identification: A method combining peak detection and integration is adopted. First, the peak position in the current signal is located by adaptive thresholding, and the peak value is extracted as the transient current peak. Then, the signal in a certain interval before and after the peak is integrated to verify the validity of the peak and avoid false extraction caused by noise interference.
[0050] Carrier mobility calculation: The thickness of the quantum dot material film and the area of the detection region of the sample to be tested are measured, the bias voltage parameters applied during detection are recorded, and the extracted transient current peak value is combined with the dielectric constant and carrier concentration characteristics of the quantum dot material. The carrier mobility is accurately obtained through the corrected calculation logic to ensure that the parameters reflect the true carrier transport performance.
[0051] S300: Based on the quantum dot type and usage environment, the threshold weight is dynamically adjusted, the extracted parameters are compared with the dynamic threshold, and the non-aging or aging level is determined according to the comparison results, and a judgment report is generated.
[0052] In this embodiment, the threshold weight is dynamically adjusted based on the quantum dot type and usage environment. The extracted parameters are compared with the dynamic threshold, and the level of non-aging or aging is determined based on the comparison results, generating a determination report. The specific process is as follows: S301: Obtain information on the quantum dot type of the sample to be tested and the actual operating conditions such as temperature and light intensity in the actual use environment; S302: Call the matching basic threshold range from the dynamic threshold library, and dynamically adjust the judgment weights corresponding to the three core parameters according to the stability characteristics of quantum dots and the influence of the usage environment; S303: The extracted core parameters are compared one by one with the adjusted dynamic thresholds, and the sample aging degree is quantified by multi-parameter fusion scoring. S304: Based on the fusion score results, the sample is determined to be unaged, mildly aged, moderately aged, or severely aged; S305: Organize parameter data, threshold adjustment basis and judgment results to generate a complete aging judgment report.
[0053] During the above process, the quantum dot type of the sample to be tested (such as CdSe / ZnS, InP / ZnS) is entered, and key operating parameters of the actual use environment of the sample are obtained, including the daily operating temperature range (-20℃~60℃) and the light intensity range (0~10000 lux), to provide a basis for threshold weight adjustment.
[0054] Threshold range retrieval: Based on the obtained quantum dot type and operating parameters, retrieve the matching basic threshold ranges for non-aging, lightly aged, moderately aged, and severely aged from the dynamic threshold library constructed in step S103.
[0055] Dynamic weight adjustment: Combining the stability characteristics of quantum dot materials (e.g., CdSe / ZnS has higher stability than InP / ZnS) and the influence of the usage environment (e.g., high temperature environment has a more significant impact on current performance), the judgment weights of the three core parameters (fluorescence decay lifetime, transient current peak, and carrier mobility) are adjusted, with the total weight being 1, to ensure that the judgment criteria are consistent with the actual application scenarios of the samples.
[0056] The three core parameters extracted in step S200 are compared one by one with the corresponding dynamic threshold ranges adjusted in step S302 to obtain the degree of deviation of each parameter; then, according to the adjusted weights, a multi-parameter fusion scoring model is used to calculate the comprehensive aging score of the sample, which quantitatively reflects the overall aging degree of the sample.
[0057] Based on the comprehensive aging score results, the following grading thresholds were established: a comprehensive score ≥ 0.95 indicates no aging; a comprehensive score ≤ 0.85 < 0.95 indicates mild aging; a comprehensive score ≤ 0.70 < 0.85 indicates moderate aging; and a comprehensive score < 0.70 indicates severe aging. This clarified the aging status of the samples.
[0058] Organize key data from the testing process, including standard parameters, core parameters of the sample to be tested, environmental parameter records, threshold adjustment basis, and comprehensive aging score. Also, indicate the judgment results and corresponding level descriptions to generate a complete aging judgment report. The report supports data export and printing, which facilitates subsequent quality traceability and analysis.
[0059] Corresponding to the aforementioned embodiments of the transient photoelectric detection method for the aging degree of quantum dot display materials, this application also provides embodiments of a transient photoelectric detection system for the aging degree of quantum dot display materials.
[0060] Figure 5 This is a block diagram illustrating a transient photoelectric detection system for the aging degree of quantum dot display materials, according to an exemplary embodiment. (Refer to...) Figure 5 The system may include: a standard parameter calibration and sample testing module 401, a sample feature parameter extraction module 402, and an aging degree dynamic determination module 403. The standard parameter calibration and test sample module 401 is used to repeat multiple sets of excitation tests, calibrate the core photoelectric parameters of the unaged standard sample and construct a dynamic threshold library, and perform synchronous photoelectric signal acquisition and real-time compensation and correction of the test sample under controlled environment. The sample feature parameter extraction module 402 is used to correct the acquired transient signal and extract three core parameters: fluorescence decay lifetime, transient current peak value, and carrier mobility. The dynamic aging determination module 403 is used to dynamically adjust the threshold weight according to the quantum dot type and the usage environment, compare the extracted parameters with the dynamic threshold, determine the non-aging or aging level based on the comparison results, and generate a determination report.
[0061] In this embodiment, the standard parameter calibration and sample testing module 401 repeats multiple sets of excitation tests to calibrate the core photoelectric parameters of the unaged standard sample and construct a dynamic threshold library. Under controlled conditions, it synchronously acquires photoelectric signals from the sample to be tested and performs real-time compensation and correction. The sample feature parameter extraction module 402 corrects the acquired transient signals and extracts three core parameters: fluorescence decay lifetime, transient current peak, and carrier mobility. The aging degree dynamic determination module 403 dynamically adjusts the threshold weights based on the quantum dot type and the usage environment, compares the extracted parameters with the dynamic thresholds, determines the unaged or aged level based on the comparison results, and generates a determination report. Through these methods, the signal acquisition quality is improved, meeting the practical needs of high-precision, high-efficiency, and non-destructive testing.
[0062] Regarding the system in the above embodiments, the specific ways in which each module performs operations have been described in detail in the embodiments related to the method, and will not be elaborated here.
[0063] For the system embodiments, since they basically correspond to the method embodiments, the relevant parts can be referred to in the description of the method embodiments. The device embodiments described above are merely illustrative. The units described as separate components may or may not be physically separate, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed across multiple network units. Some or all of the modules can be selected to achieve the purpose of this application according to actual needs. Those skilled in the art can understand and implement this without creative effort.
[0064] Accordingly, this application also provides an electronic device, comprising: one or more processors; a memory for storing one or more programs; and, when the one or more programs are executed by the one or more processors, causing the one or more processors to implement the transient photoelectric detection method for the aging degree of quantum dot display materials as described above. Figure 6 The diagram shown is a hardware structure diagram of any device with data processing capabilities, used in a transient photoelectric detection system for the aging degree of quantum dot display materials according to an embodiment of the present invention. Except for... Figure 6In addition to the processor, memory, and network interface shown, any data processing device in the embodiment may also include other hardware depending on the actual function of the data processing device, which will not be described in detail here.
[0065] Accordingly, this application also provides a computer-readable storage medium storing computer instructions, which, when executed by a processor, implement the transient photoelectric detection method for the aging degree of quantum dot display materials as described above. The computer-readable storage medium can be an internal storage unit of any data processing device as described in any of the foregoing embodiments, such as a hard disk or memory. The computer-readable storage medium can also be an external storage device, such as a plug-in hard disk, smart media card (SMC), SD card, flash card, etc., equipped on the device. Furthermore, the computer-readable storage medium can include both internal storage units of any data processing device and external storage devices. The computer-readable storage medium is used to store the computer program and other programs and data required by the data processing device, and can also be used to temporarily store data that has been output or will be output.
[0066] Other embodiments of this application will readily occur to those skilled in the art upon consideration of the specification and practice of the disclosure herein. This application is intended to cover any variations, uses, or adaptations of this application that follow the general principles of this application and include common knowledge or customary techniques in the art not disclosed herein.
[0067] It should be understood that this application is not limited to the precise structure described above and shown in the accompanying drawings, and various modifications and changes can be made without departing from its scope.
Claims
1. A transient photoelectric detection method for the aging degree of quantum dot display materials, characterized in that, Includes the following steps: Repeated excitation tests were conducted to calibrate the core photoelectric parameters of the unaged standard samples and construct a dynamic threshold library. The photoelectric signals of the samples to be tested were synchronously acquired and compensated and corrected in real time under a controlled environment. The acquired transient signals are corrected, and three core parameters are extracted: fluorescence decay lifetime, transient current peak value, and carrier mobility. The threshold weights are dynamically adjusted based on the quantum dot type and the usage environment. The extracted parameters are compared with the dynamic thresholds, and the non-aging and aging levels are determined based on the comparison results, generating a judgment report.
2. The transient photoelectric detection method for the aging degree of quantum dot display materials as described in claim 1, characterized in that, In the steps of repeating multiple sets of excitation tests, calibrating the core photoelectric parameters of unaged standard samples and constructing a dynamic threshold library, and synchronously acquiring and real-time compensating and correcting photoelectric signals of the samples to be tested under a controlled environment: Standard samples of unaged quantum dot display materials were selected and pretreated by drying and surface smoothing to build a data detection group; the data detection group included a narrow pulse light source and a dual-channel photoelectric signal acquisition device; Multiple sets of repeated excitation cycles were set, and standard samples were excited multiple times in each set. Transient fluorescence signals and transient current signals of each set were collected simultaneously, and the average value of the core photoelectric parameters was calculated as the standard parameters. The sample to be tested is cleaned and dried before being placed in a controlled and vibration-proof testing environment with controlled temperature, humidity, and light. Excitation light is emitted using excitation parameters consistent with those calibrated for the standard sample.
3. The transient photoelectric detection method for the aging degree of quantum dot display materials as described in claim 2, characterized in that, After setting multiple sets of repeated excitation cycles, exciting standard samples multiple times in each set, synchronously acquiring transient fluorescence and transient current signals for each set, and calculating the average value of the core photoelectric parameters as standard parameters: Samples with different aging degrees were prepared by using multiple accelerated aging paths, the parameter data of each aging node were detected, a model of parameter change with aging time was established, dynamic aging threshold intervals corresponding to multiple scenarios were divided, and a dynamic threshold library was constructed.
4. The transient photoelectric detection method for the aging degree of quantum dot display materials as described in claim 2, characterized in that, In the process of cleaning and drying the sample to be tested, placing it in a controlled and vibration-proof testing environment with controlled temperature, humidity, and light, and emitting excitation light using excitation parameters consistent with those calibrated for the standard sample: It synchronously acquires transient signals, monitors environmental changes in real time, and compensates and corrects the signals.
5. The transient photoelectric detection method for the aging degree of quantum dot display materials as described in claim 1, characterized in that, In the steps of correcting the acquired transient signal and extracting the three core parameters—fluorescence decay lifetime, transient current peak, and carrier mobility: Baseline correction was performed on the acquired transient fluorescence and transient current signals to remove interference from signal drift; Wavelet transform denoising algorithm is used to filter random noise in the signal and retain effective signal components; The peak value of the current signal is identified by a combination of peak detection and integration.
6. The transient photoelectric detection method for the aging degree of quantum dot display materials as described in claim 5, characterized in that, After using wavelet transform denoising algorithm to filter out random noise in the signal and retain effective signal components: The preprocessed fluorescence signal was analyzed using an optimized double exponential decay fitting algorithm, and the average fluorescence decay lifetime was calculated.
7. The transient photoelectric detection method for the aging degree of quantum dot display materials as described in claim 6, characterized in that, After the step of identifying the peak value of the current signal using a combination of peak detection and integration: The carrier mobility was obtained by combining the film thickness of the quantum dot material and the applied bias voltage parameters after correction calculation.
8. The transient photoelectric detection method for the aging degree of quantum dot display materials as described in claim 1, characterized in that, In the steps of dynamically adjusting the threshold weight based on the quantum dot type and usage environment, comparing the extracted parameters with the dynamic threshold, determining the level of no aging or aging based on the comparison results, and generating a determination report: The matching basic threshold range is called from the dynamic threshold library, and the judgment weights corresponding to the three core parameters are dynamically adjusted according to the stability characteristics of quantum dots and the influence of the usage environment. The extracted core parameters are compared one by one with the adjusted dynamic thresholds, and the degree of sample aging is quantified by multi-parameter fusion scoring. Based on the fusion score results, the samples were classified as unaged, mildly aged, moderately aged, or severely aged.
9. The transient photoelectric detection method for the aging degree of quantum dot display materials as described in claim 8, characterized in that, Before the steps of dynamically adjusting the judgment weights corresponding to the three core parameters based on the stability characteristics of quantum dots and the influence of the usage environment, and calling the matching basic threshold range from the dynamic threshold library: Obtain information on the quantum dot type of the sample to be tested, as well as the actual operating conditions such as temperature and light intensity.
10. The transient photoelectric detection method for the aging degree of quantum dot display materials as described in claim 9, characterized in that, After determining the sample's aging status (unaged, mildly aged, moderately aged, or severely aged) based on the fusion score results: Organize parameter data, threshold adjustment basis, and judgment results to generate a complete aging judgment report.