Method for evaluating electromagnetic radiation emission performance of electronic product

Abstract

The method for evaluating the electromagnetic radiation emission performance of the electronic product comprises the following steps: step 1, carrying out a near-field electromagnetic radiation emission test and a conventional electromagnetic radiation test in a primary sample stage of a standard product to obtain a near-field electromagnetic radiation spectrum curve and a conventional electromagnetic radiation spectrum curve of the standard product; 2, according to a near-field electromagnetic radiation spectrum curve, a conventional electromagnetic radiation spectrum curve and a conventional electromagnetic radiation test spectrum limit value parameter of a standard product; deducing a limit value parameter of a near-field electromagnetic radiation spectrum of the standard product according to a near-far field transformation relation method; 3, taking the limit value parameter of the near-field electromagnetic radiation spectrum as a standard curve, and obtaining a near-field electromagnetic radiation spectrum curve of the product to be detected through a planar near-field scanning method; and 4, judging whether the near-field electromagnetic radiation spectrum curve of the to-be-tested product is qualified or not according to the standard curve coordinates, so that whether the product has a conventional electromagnetic radiation test standard exceeding risk or not can be evaluated, and standard exceeding points on the printed board can be visually positioned.

Description

Technical Field

[0001] This invention belongs to the technical field of electromagnetic compatibility testing, and in particular relates to a method for evaluating the electromagnetic radiation emission performance of electronic products. Background Technology

[0002] Conventional electromagnetic compatibility (EMC) testing often occurs close to the product finalization and mass production stage. During this stage, EMC testing is concentrated, leading to limited testing resources and impacting product delivery cycles. Furthermore, the product design is largely finalized at this stage, and any design changes at this point often incur greater costs. Conventional testing methods can only provide amplitude-frequency curves, i.e., the superficial appearance of a fault in the spectrum, without providing further data analysis on the cause of the fault. This often requires extensive rectification and testing to resolve the issue, consuming significant manpower and time. Inaccurate root cause identification may lead to recurring problems, resulting in low testing efficiency.

[0003] In view of this, the present invention is hereby proposed. Summary of the Invention

[0004] The method for evaluating the electromagnetic radiation emission performance of electronic products provided by this invention solves the technical problem of low efficiency in existing testing methods. The technical solution of this invention has many beneficial effects, as described below: A method for evaluating the electromagnetic radiation emission performance of electronic products, the evaluation method comprising, Step 1: Conduct near-field electromagnetic radiation emission tests and conventional electromagnetic radiation tests during the initial sample stage of the standard product to obtain the near-field electromagnetic radiation spectrum curve and conventional electromagnetic radiation spectrum curve of the standard product. Step 2: Based on the near-field electromagnetic radiation spectrum curve, conventional electromagnetic radiation spectrum curve, and conventional electromagnetic radiation test spectrum limit parameters of the standard product, derive the limit parameters of the near-field electromagnetic radiation spectrum of the standard product using the near-far field transformation relationship method; Step 3: Using the limit parameters of the near-field electromagnetic radiation spectrum as a standard curve, the near-field electromagnetic radiation spectrum curve of the product under test is obtained by the planar near-field scanning method; Step 4: Determine whether the near-field electromagnetic radiation spectrum curve of the product under test is qualified based on the standard curve coordinates.

[0005] Compared with the prior art, the technical solution provided by the present invention has the following beneficial effects: This method allows for early implementation at key project milestones, saving valuable time for testing, analysis, and problem-solving. Furthermore, by conducting near-field electromagnetic radiation emission tests and visually representing strong radiation points through radiation cloud maps, it facilitates precise fault location and enables design optimization. Performing near-field electromagnetic radiation emission tests during the printed circuit board (PCB) prototyping stage, and comparing these tests with near-field electromagnetic radiation emission limits, allows for assessment of any risk of exceeding conventional electromagnetic radiation test standards. It also allows for direct location of exceeding standards on the PCB, enabling direct design optimization at the corresponding locations. Therefore, this invention is characterized by its high economic efficiency, short testing cycle, and strong guidance, achieving the goal of evaluating conventional electromagnetic radiation test performance through near-field radiation emission testing. It can be widely used for electromagnetic radiation emission assessment of electronic products requiring electromagnetic radiation emission testing, such as military electronic products and consumer electronic products. Attached Figure Description

[0006] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0007] Figure 1 This is a flowchart of the method of the present invention; Figure 2 Standard product electromagnetic radiation spectrum curve; Figure 3 Near-field electromagnetic radiation spectrum curve of standard product; Figure 4 Standard product electromagnetic radiation emission spectrum limit parameter diagram; Figure 5 Parameter diagram of near-field electromagnetic radiation emission spectrum limits for standard products; Figure 6 Comparison of near-field electromagnetic radiation spectrum curves of the product under test with limit parameters; Figure 7 A comparison chart of the optimized near-field electromagnetic radiation spectrum curve of the product under test and the limit parameters. Detailed Implementation

[0008] The following specific examples illustrate the implementation of the present invention. Those skilled in the art can easily understand other advantages and effects of the present invention from the content disclosed in this specification. Obviously, the described embodiments are only a part of the embodiments of the present invention, and not all of them. The present invention can also be implemented or applied through other different specific embodiments, and the details in this specification can also be modified or changed based on different viewpoints and applications without departing from the spirit of the present invention. It should be noted that, in the absence of conflict, the following embodiments and features in the embodiments can be combined with each other. All other embodiments obtained by those skilled in the art based on the embodiments of the present invention without creative effort are within the scope of protection of the present invention.

[0009] It should be noted that the various aspects of the embodiments described below within the scope of the appended claims should be apparent, and the aspects described herein can be embodied in a wide variety of forms, and any particular structure and / or function described herein is merely illustrative. Based on this invention, those skilled in the art will understand that one aspect described herein can be implemented independently of any other aspect, and two or more of these aspects can be combined in various ways. For example, any number of aspects set forth herein can be used to implement the device and / or practice the method. Additionally, this device and / or method can be implemented using other structures and / or functionalities besides one or more of the aspects set forth herein.

[0010] It should also be noted that the illustrations provided in the following embodiments are only schematic representations of the basic concept of the present invention. The drawings only show the components related to the present invention and are not drawn according to the actual number, shape and size of the components in the actual implementation. In the actual implementation, the form, quantity and proportion of each component can be arbitrarily changed, and the layout of the components may also be more complex.

[0011] Furthermore, specific details are provided in the following description to facilitate a thorough understanding of the examples. However, those skilled in the art will understand that aspects can be practiced without these specific details. To enable those skilled in the art to better understand the invention, the invention will be further described in detail below with reference to the accompanying drawings and specific embodiments. The terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of indicated technical features. Thus, features defined as "first" and "second" may explicitly or implicitly include one or more of that feature. In the description of the invention, unless otherwise stated, "a plurality of" means two or more.

[0012] like Figures 1 to 7The method for evaluating the electromagnetic radiation emission performance of electronic products, as shown, can assess the electromagnetic radiation performance of products in the prototype stage through near-field radiated emission testing, and can accurately locate faults to facilitate product optimization. The evaluation method includes... Step 1: Conduct near-field electromagnetic radiation emission tests and conventional electromagnetic radiation tests during the initial sample stage of the standard product to obtain the near-field electromagnetic radiation spectrum curve and conventional electromagnetic radiation spectrum curve of the standard product. Step 2: Based on the near-field electromagnetic radiation spectrum curve of the standard product, the conventional electromagnetic radiation spectrum curve, and the conventional electromagnetic radiation test spectrum limit parameters (conventional refers to the electromagnetic radiation specifications of electronic products, military standards, or civilian standards; the curve is selected according to the product model and the performance being tested; the upper and lower limits of the product test spectrum are determined according to the design specifications; the upper and lower limits can be the same or different, thus determining the range); The limit parameters of the near-field electromagnetic radiation spectrum of the standard product are derived based on the near-field and far-field transformation relationship method. Step 3: Using the limit parameters of the near-field electromagnetic radiation spectrum as a standard curve, the near-field electromagnetic radiation spectrum curve of the product under test is obtained by the planar near-field scanning method; Step 4: Determine whether the near-field electromagnetic radiation spectrum curve of the product under test is qualified based on the standard curve coordinates.

[0013] This invention utilizes near-field electromagnetic radiation spectrum to test conventional electromagnetic radiation. Traditional methods, which use conventional electromagnetic radiation spectrum, only obtain the spectrum curve but cannot pinpoint the specific location of radiation exceeding the limit. This invention innovatively employs near-field electromagnetic radiation spectrum to pinpoint the exact location of radiation exceeding the limit in the product under test, and optimizes this location accordingly. This avoids the possibility of inaccurate root cause localization leading to recurring problems. It allows for testing and evaluation during the initial prototype stage, alleviating the need for concentrated use of testing resources. Furthermore, near-field radiated emission testing provides both the radiation spectrum and the corresponding location information, facilitating precise fault location. This solves problems such as late exposure of electromagnetic radiation emission exceeding the limit, limited conventional electromagnetic radiation testing resources, unclear root causes, and ineffective optimization measures.

[0014] In one example, the near-field electromagnetic radiation spectrum curve of the product under test is obtained in the following way: using a near-field electromagnetic measurement probe, adopting a two-dimensional plane scanning measurement mode, collecting electromagnetic field strength data within a preset frequency range, and generating a spectrum curve based on the data. For example, determining whether the near-field electromagnetic radiation spectrum curve of the product under test is a standard curve coordinate includes determining it based on the amplitude difference between any point on the standard curve and the corresponding point on the near-field electromagnetic radiation spectrum curve of the product under test.

[0015] The aforementioned conventional electromagnetic radiation test spectrum limit parameters need to be determined according to military or civilian standards.

[0016] In one embodiment, determining whether the near-field electromagnetic radiation spectrum curve of the product under test is qualified based on the standard curve coordinates includes determining whether the near-field electromagnetic radiation spectrum curve of the product under test is below the standard curve coordinates. If yes, the conventional electromagnetic radiation spectrum of the product under test is qualified; if no, the conventional electromagnetic radiation spectrum of the product under test is unqualified.

[0017] The following example uses the electromagnetic radiation emission assessment of a certain type of electronic product. Figure 1 The implementation flowchart was used.

[0018] First, conventional electromagnetic radiation emission tests and near-field electromagnetic radiation emission tests were conducted on the standard product to obtain the corresponding radiation spectrum curves in the 0.1GHz-1GHz frequency band, i.e., the conventional electromagnetic radiation spectrum curves. Figure 2 ) and near-field electromagnetic radiation spectrum curve ( Figure 3 ); and easily found conventional electromagnetic radiation emission spectrum limit parameters can be found in military or civilian standards ( Figure 4 Based on the near-field and far-field correspondence method, the limit parameters of the near-field electromagnetic radiation spectrum of the standard product are derived (as a standard curve). Figure 5 ); Near-field electromagnetic radiation emission testing is conducted on the product under test, and the test frequency domain curve is compared with the limit parameters of the near-field electromagnetic radiation spectrum obtained in the previous step. Figure 6 ),like Figure 6 As shown, the near-field electromagnetic radiation spectrum curve of the product under test exceeds the limit parameter curve coordinate near 0.4GHz, indicating that the conventional electromagnetic radiation spectrum of the product under test is unqualified. The near-field electromagnetic radiation emission test can locate the crystal oscillator circuit on the printed circuit board as the radiation strong point, so it is necessary to perform filtering and other optimization processing on this circuit. By performing filtering optimization on the crystal oscillator circuit and its peripheral circuits, such as... Figure 7After optimization, the near-field electromagnetic radiation spectrum curves are all below the limit parameter curve coordinates, indicating that the conventional electromagnetic radiation spectrum of the printed circuit board is qualified. This solves the problem of excessive electromagnetic radiation emission in electronic products. Addressing issues such as late exposure of excessive electromagnetic radiation in electronic products, limited resources for conventional electromagnetic radiation testing, unclear root causes, and ineffective optimization measures, this invention provides an electromagnetic compatibility radiation emission assessment method for electronic products. This method involves conducting near-field electromagnetic radiation emission tests and conventional electromagnetic radiation tests on the printed circuit board. By combining the conventional electromagnetic radiation test spectrum limit requirements, the corresponding near-field electromagnetic radiation emission limit requirements are derived. Subsequent electronic products of the same type can then be assessed based on the near-field electromagnetic radiation emission limit requirements by evaluating the near-field radiation emission data of the printed circuit board to determine if they meet the limit requirements. This invention enables near-field electromagnetic radiation emission testing during the initial prototype stage of printed circuit boards. By comparing the near-field electromagnetic radiation emission limit requirements, it can assess whether the product has the risk of exceeding the standard in conventional electromagnetic radiation testing. Furthermore, it can intuitively locate the points exceeding the standard on the printed circuit board and directly optimize the design for the corresponding locations. Therefore, this invention has the characteristics of high economy, short testing cycle, and strong guidance, achieving the purpose of evaluating the performance of conventional electromagnetic radiation testing through near-field radiation emission testing. It can be widely used for electromagnetic radiation emission assessment of electronic products with electromagnetic radiation emission testing requirements, such as military electronic products and consumer electronic products.

[0019] The product provided by this invention has been described in detail above. Specific examples have been used to illustrate the principles and implementation methods of this invention. The descriptions of the embodiments above are merely for the purpose of helping to understand the core ideas of this invention. It should be noted that those skilled in the art can make various improvements and modifications to the invention without departing from the principles of the invention, and these improvements and modifications also fall within the protection scope of the invention claims.

Claims

1. A method for evaluating the electromagnetic radiation emission performance of electronic products, characterized in that, The evaluation methods include, Step 1: Conduct near-field electromagnetic radiation emission tests and conventional electromagnetic radiation tests during the initial sample stage of the standard product to obtain the near-field electromagnetic radiation spectrum curve and conventional electromagnetic radiation spectrum curve of the standard product. Step 2: Based on the near-field electromagnetic radiation spectrum curve, conventional electromagnetic radiation spectrum curve, and conventional electromagnetic radiation test spectrum limit parameters of the standard product, derive the limit parameters of the near-field electromagnetic radiation spectrum of the standard product using the near-far field transformation relationship method. Step 3: Using the limit parameters of the near-field electromagnetic radiation spectrum as a standard curve, the near-field electromagnetic radiation spectrum curve of the product under test is obtained by the planar near-field scanning method; Step 4: Determine whether the near-field electromagnetic radiation spectrum curve of the product under test is qualified based on the standard curve coordinates.

2. The evaluation method according to claim 1, characterized in that, The near-field electromagnetic radiation spectrum curve of the product under test is obtained by using a near-field electromagnetic measurement probe, adopting a two-dimensional plane scanning measurement mode, collecting electromagnetic field intensity data within a preset frequency range, and generating a spectrum curve based on the data.

3. The evaluation method according to claim 1, characterized in that, The determination of whether the near-field electromagnetic radiation spectrum curve of the product under test is the same as the standard curve coordinates below includes the determination based on the amplitude difference between any point on the standard curve and the corresponding point on the near-field electromagnetic radiation spectrum curve of the product under test.

4. The evaluation method according to claim 1, characterized in that, The spectral limit parameters for routine electromagnetic radiation tests need to be determined according to military or civilian standards.

5. The evaluation method according to claim 1, characterized in that, Determining whether the near-field electromagnetic radiation spectrum curve of the product under test is qualified based on the standard curve coordinates includes determining whether the near-field electromagnetic radiation spectrum curve of the product under test is below the standard curve coordinates. If so, the conventional electromagnetic radiation spectrum of the product under test is qualified; if not, the conventional electromagnetic radiation spectrum of the product under test is unqualified.

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