Electronic device and test data application method of fingerprint sensing module thereof

Abstract

The invention provides an electronic device and a test data application method of a fingerprint sensing module thereof. The method includes the following steps. Recording general test data of the fingerprint sensing module; the general test data is generated based on performing a test program on respective fingerprint sensing modules of a plurality of tested electronic devices. Recording special test data of the fingerprint sensing module; the dedicated test data is generated based on performing a test program on a fingerprint sensing module of the electronic device. When an assembly event related to the fingerprint sensing module occurs, application test data is selected from the dedicated test data and the general test data. The application test data is used for the fingerprint sensing module to execute a fingerprint registration program or a fingerprint verification program. Therefore, the adaptability and the stability of the fingerprint sensing module under different devices and assembly conditions can be enhanced.

Description

Technical Field

[0001] This disclosure relates to a test method for a fingerprint sensing module, and more particularly to a method for applying test data from an electronic device and its fingerprint sensing module. Background Technology

[0002] In recent years, fingerprint recognition technology has been widely used in various electronic devices to provide highly secure identity verification. Currently, when assembling a fingerprint sensing module into an electronic device, it must be tested using multiple test heads to obtain corresponding test data. This test data is typically used to confirm the quality of the fingerprint sensing module and to establish corresponding fingerprint background data or perform assembly calibration. However, current practices require repeatedly switching between different test heads to complete multiple tests, making the testing process cumbersome and time-consuming. Furthermore, when a fingerprint sensing module is reassembled into an electronic device due to repair or replacement, the repair site may not be equipped with dedicated test heads, or the repair personnel may lack the ability to perform the complete testing procedure. In such cases, the fingerprint background data cannot be correctly reconstructed, leading to reduced fingerprint recognition accuracy and consequently affecting the overall user experience and system security. Summary of the Invention

[0003] This disclosure provides a method for applying test data from an electronic device and its fingerprint sensing module that can effectively solve the above-mentioned problems.

[0004] This disclosure provides a method for applying test data of a fingerprint sensing module, applicable to electronic devices including a fingerprint sensing module, and includes the following steps: Recording general test data for the fingerprint sensing module. The general test data is generated based on test procedures performed on the fingerprint sensing modules of multiple tested electronic devices. Recording specific test data for the fingerprint sensing module. The specific test data is generated based on test procedures performed on the fingerprint sensing module of the electronic device. When an assembly event related to the fingerprint sensing module occurs, application test data is selected from the specific test data and the general test data. The application test data is used to enable the fingerprint sensing module to perform a fingerprint registration procedure or a fingerprint verification procedure.

[0005] This disclosure provides an electronic device including a storage device, a fingerprint sensing module, and a processor. The processor is connected to the storage device and the fingerprint sensing module and configured to perform the following operations: Recording general test data for the fingerprint sensing module. The general test data is generated based on test procedures performed on the fingerprint sensing modules of multiple tested electronic devices. Recording specific test data for the fingerprint sensing module. The specific test data is generated based on test procedures performed on the fingerprint sensing modules of the electronic devices. When an assembly event related to the fingerprint sensing module occurs, application test data is selected from the specific test data and the general test data. The application test data is used to enable the fingerprint sensing module to perform a fingerprint registration procedure or a fingerprint verification procedure.

[0006] Based on the above, in the embodiments disclosed herein, both general test data and dedicated test data for the fingerprint sensing module are recorded in the electronic device. General test data is generated based on test data from multiple tested electronic devices. Dedicated test data is test data obtained by the electronic device executing test procedures. When an assembly event related to the fingerprint sensing module occurs, application test data can be flexibly selected from the dedicated and general test data according to actual situational needs, and fingerprint registration and verification procedures can be executed based on the application test data. Therefore, stable fingerprint recognition performance can be maintained even in the absence of a complete testing environment or testing equipment, ensuring the usability and system stability after the fingerprint sensing module is installed. Furthermore, the adaptability and stability of the fingerprint sensing module under different device and assembly conditions can be enhanced. Attached Figure Description

[0007] Figure 1 This is a block diagram of an electronic device according to an embodiment of the present disclosure;

[0008] Figure 2 This is a flowchart of a test data application method for a fingerprint sensing module according to an embodiment of the present disclosure;

[0009] Figure 3 This is a flowchart of a test data application method for a fingerprint sensing module according to an embodiment of the present disclosure;

[0010] Figure 4 This is a flowchart of a test data application method for a fingerprint sensing module according to an embodiment of the present disclosure;

[0011] Figure 5 This is a flowchart of a test data application method for a fingerprint sensing module according to an embodiment of the present disclosure;

[0012] Figure 6 This is a flowchart of a test data application method for a fingerprint sensing module according to an embodiment of the present disclosure;

[0013] Figure 7This is a flowchart of a test data application method for a fingerprint sensing module according to an embodiment of the present disclosure;

[0014] Figure 8 This is a flowchart of a test data application method for a fingerprint sensing module according to an embodiment of the present disclosure. Detailed Implementation

[0015] Reference will now be made in detail to the exemplary embodiments disclosed herein, examples of which are illustrated in the accompanying drawings. Wherever possible, the same component symbols are used in the drawings and description to denote the same or similar parts.

[0016] Figure 1 This is a schematic diagram of an electronic device according to an embodiment of the present disclosure. Please refer to... Figure 1 The electronic device 100 may include a fingerprint sensing module 110, a storage device 120, a display 130, and a processor 140. The electronic device 100 may be implemented as a terminal device or portable electronic device such as a smartphone, tablet computer, or laptop computer, and this disclosure is not limited thereto.

[0017] The display 130 may be, for example, a light-emitting diode (LED) display, an organic light-emitting diode (OLED) display, or a liquid crystal display (LCD), etc., and this disclosure is not limiting. In some embodiments, the display 130 may display a user interface for receiving user commands.

[0018] The fingerprint sensing module 110 can be used to capture a user's fingerprint image for fingerprint registration or identity verification procedures. The fingerprint sensing module 110 can be an optical fingerprint sensing module and may include optical sensing circuitry, signal processing circuitry, and interface circuitry. In some embodiments, the fingerprint sensing module 110 can be an under-display fingerprint sensing module. Furthermore, the fingerprint sensing module 110 can be disposed below the display 130 and can be used to sense target objects located above the display 130. When the fingerprint sensing module 110 performs fingerprint sensing, the display 130 or other light source components can provide illumination light to the target object, so that the fingerprint sensor 120 can receive the sensing light reflected from the surface of the target object (i.e., the finger surface or test mold) to generate a fingerprint image.

[0019] Storage device 120 is used to store data, images, instructions, program code, software modules, etc., and can be, for example, any type of fixed or removable random access memory (RAM), read-only memory (ROM), flash memory, hard disk or other similar device, integrated circuit or combination thereof.

[0020] Processor 140 is coupled to fingerprint sensing module 110, storage device 120, and display 130. It is, for example, a central processing unit (CPU), application processor (AP), or other programmable general-purpose or special-purpose microprocessor, digital signal processor (DSP), image signal processor (ISP), graphics processing unit (GPU), or other similar device, integrated circuit, or combination thereof. In some embodiments, processor 140 may execute instructions or program code in storage device 120 and / or its internal memory to implement the steps of the test data application method of the fingerprint sensing module in this disclosed embodiment.

[0021] It should be noted that when the electronic device 100 executes a test program on the fingerprint sensing module 110 built inside, it can generate dedicated test data for the fingerprint sensing module 110. Similarly, when the tested electronic device executes a test program on the fingerprint sensing module built inside, it can also generate test data for its own fingerprint sensing module.

[0022] In some embodiments, the above-described testing procedure is typically performed in conjunction with a specific testing environment or testing equipment, including using the fingerprint sensing module 110 to capture test images from multiple test heads, and the dedicated test data of the fingerprint sensing module 110 can be generated based on these test images. The test head may include a test mold used to simulate different fingerprint characteristics or surface contact conditions, such as a flat, smooth, textureless light-colored resin mold, a black resin mold, or a rubber stamp mold with fingerprint-like texture, or a mold made of other materials with specific textures, transparency, or contact responses. A light-colored resin mold is, for example, a white resin mold or a skin-colored resin mold. This disclosure does not limit the material, color, or structure of the test head. For example, when the electronic device 100 executes the testing procedure of the fingerprint sensing module 110, the fingerprint sensing module 110 can capture one test image for the light-colored resin mold test head and one test image for the black resin mold test head. Similarly, the electronic device being tested can also perform the same test procedure on its internal fingerprint sensing module to obtain the corresponding test data.

[0023] In some embodiments, the dedicated test data for the fingerprint sensing module 110 may include exposure time, fingerprint effective area (FEA), fingerprint background data, image magnification factor (M factor), signal intensity parameters (such as peak grayscale value or average brightness), noise parameters, and image response differences reflected for different brightness areas. From another perspective, the dedicated test data for the fingerprint sensing module 110 may include test data generated by a test procedure based on a light-colored molded test head and test data generated by a test procedure based on a black molded test head. Similarly, when a test device performs a test procedure on the fingerprint sensing module it carries, the same type of test data can be obtained. The test data from the test device can be collected centrally and then statistically summarized, mean-modeled, or clustered to establish representative general test data. For example, the test device may be a small number of electronic devices manufactured during the pilot production stage. During the pilot production stage, a small number of electronic devices are typically manufactured for testing, and the test data obtained during this stage can be used to establish general test data. Alternatively, the test device may be a portion of the electronic devices used in the mass production product testing stage.

[0024] Figure 2 This is a flowchart illustrating a test data application method for a fingerprint sensing module according to embodiments of this disclosure. Please refer to... Figure 2 The method in this embodiment can be derived from... Figure 1 The electronic device 100 performs the following: Figure 1Component description shown Figure 2 Details of each step.

[0025] In step S210, the processor 140 records general test data for the fingerprint sensing module 110. Specifically, the general test data is generated based on test procedures performed on the fingerprint sensing modules installed in each of the multiple tested electronic devices. The general test data is a statistical result of the test data of multiple other fingerprint sensing modules in the multiple tested electronic devices. In other words, when the tested electronic devices perform test procedures on their internal fingerprint sensing modules during the manufacturing or quality control stages, multiple sets of test data can be obtained according to the same standards and test conditions. These test data can be collected centrally and processed through statistical aggregation and outlier removal to obtain representative general test data. The electronic device 100 can be one of the tested electronic devices.

[0026] For example, multiple fingerprint sensing modules of the tested electronic devices can each capture at least one test image from both the light-colored and black-colored molded test heads, generating multiple sets of test data including exposure time, FEA, background grayscale value, image magnification, signal strength, and noise parameters. These multiple sets of test data can be collected and processed by a computing device to calculate the average or weighted average of the test data from the multiple tested electronic devices to obtain general test data. The general test data can be recorded in the storage device 120 of the electronic device 100.

[0027] In step S220, the processor 140 records dedicated test data for the fingerprint sensing module 110. This dedicated test data is generated based on a testing procedure performed on the fingerprint sensing module 110 of the electronic device 100. Specifically, in some embodiments, when the electronic device 100 is first assembled, repaired, replaced, or recalibrated, the processor 140 can control the fingerprint sensing module 110 to perform sensing operations on a predetermined test head (such as a light-colored plastic film test head, a black plastic film test head, etc.) and capture multiple test images. Then, the processor 140 can generate dedicated test data for the fingerprint sensing module 110 based on each test image. In other words, the dedicated test data is generated for the individual characteristics of the fingerprint sensing module 110 after it is actually assembled into the electronic device 100.

[0028] It should be noted that this disclosure does not restrict the order of execution of steps S210 and S220. That is, step S210 can be executed earlier or later than step S220.

[0029] In step S230, when an assembly event related to the fingerprint sensing module 110 occurs, the processor 140 selects application test data from dedicated test data and general test data. In some embodiments, the processor 140 may detect device identification information (such as a device identification code) of the fingerprint sensing module 110 or other key components integrated with the fingerprint sensing module 110 after power-on, and determine whether an assembly event related to the fingerprint sensing module 110 has occurred based on the detected device identification information. In some embodiments, the assembly event related to the fingerprint sensing module 110 may include the initial assembly of the fingerprint sensing module 110, reassembly after repair, module replacement, or any other structural changes that may affect the module's sensing characteristics. Alternatively, in other embodiments, the assembly event may also extend to the assembly process of other key components integrated with the fingerprint sensing module 110. For example, if the fingerprint sensing module 110 is an under-display fingerprint sensing module, its performance may be limited by the type of display 130, its transmittance, bonding adhesive, or assembly pressure. Therefore, when the display 130 is replaced, re-attached, or reassembled, it can be considered an assembly event related to the fingerprint sensing module 110. Alternatively, when the motherboard of the electronic device 100 is replaced, it can be considered an assembly event related to the fingerprint sensing module 110.

[0030] In some embodiments, when an assembly event related to the fingerprint sensing module 110 occurs, the processor 140 may select dedicated test data or general test data as application test data based on a predetermined condition. For example, in the absence of a test head, the processor 140 may select general test data as application test data based on user instructions or test head detection results.

[0031] In some embodiments, the processor 140 executes a fingerprint registration procedure or a fingerprint verification procedure through the fingerprint sensing module 110 based on application test data. Specifically, the processor 140 may perform steps such as fingerprint image capture, feature point extraction, and fingerprint template construction based on parameters contained in the application test data. The fingerprint registration procedure is used to establish a fingerprint template. The fingerprint verification procedure is used to perform identity verification based on the fingerprint template.

[0032] In some embodiments, the processor 140 may determine fingerprint image processing parameters based on application test data. The processor 140 may then execute fingerprint registration and verification procedures through the fingerprint sensing module 110 based on these fingerprint image processing parameters. These fingerprint image processing parameters may include, but are not limited to, image gain, dynamic exposure value, contrast enhancement parameters, filtering weight, brightness correction coefficient, noise reduction level, and edge enhancement parameters. These fingerprint image processing parameters can be automatically and adaptively adjusted according to the parameter characteristics in the application test data to optimize the reliability of the fingerprint sensing module 110.

[0033] In some embodiments, when the application test data is dedicated test data, the processor 140 may determine that the threshold parameter used for the fingerprint registration or fingerprint verification procedure is a first value. When the application test data is general test data, the processor 140 may determine that the threshold parameter used for the fingerprint registration or fingerprint verification procedure is a second value. This threshold parameter may be a matching score threshold used to determine whether a comparison passes, or a liveness detection confidence threshold used for anti-spoofing mechanisms, etc.

[0034] For example, when the application test data is dedicated test data, the processor 140 can set a higher threshold value (first value) to enhance the verification rigor because it can obtain the sensing characteristics and optimization parameters specific to the electronic device 100. Conversely, when the application test data is general test data, the processor 140 can adjust the threshold value to a lower threshold value (second value) to avoid being overly strict and causing legitimate users to fail the verification.

[0035] Figure 3 This is a flowchart illustrating a test data application method for a fingerprint sensing module according to embodiments of this disclosure. Please refer to... Figure 3 The method in this embodiment can be derived from... Figure 1 The electronic device 100 performs the following: Figure 1 Component description shown Figure 3 Details of each step.

[0036] In step S310, the processor 140 records general test data for the fingerprint sensing module 110. This general test data is generated based on test procedures performed on the fingerprint sensing modules of multiple tested electronic devices. In step S320, the processor 140 records specific test data for the fingerprint sensing module 110. This specific test data is generated based on test procedures performed on the fingerprint sensing module 110 of the electronic device 100. It should be noted that this disclosure does not limit the execution order of steps S310 and S320. That is, step S310 can be executed earlier or later than step S320.

[0037] In step S330, when an assembly event related to the fingerprint sensing module 110 occurs, the processor 140 selects application test data from dedicated test data and general test data. In some embodiments, step S330 may be implemented as including steps S331 to S332.

[0038] In step S331, when an assembly event related to the fingerprint sensing module 110 occurs, the processor 140 can use the fingerprint sensing module 110 to execute a test program and update the dedicated test data of the fingerprint sensing module 110. That is, when an assembly event related to the fingerprint sensing module 110 occurs, the processor 140 can control the fingerprint sensing module 110 to execute a test program to re-capture test images and update the dedicated test data of the fingerprint sensing module 110 accordingly. The updated dedicated test data is recorded in the storage device 130.

[0039] In step S332, the processor 140 can select application test data from updated dedicated test data and general test data. In different embodiments, the processor 140 can select updated dedicated test data or general test data based on whether the test program has been completed, data correctness, or user instructions. In some embodiments, the processor 140 can further check the data correctness of the updated dedicated test data. When the processor 140 checks that the updated dedicated test data has unreasonable values, it can discard the updated dedicated test data and select general test data instead.

[0040] In step S340, the processor 140 executes the fingerprint registration procedure or fingerprint verification procedure through the fingerprint sensing module 110 based on the application test data.

[0041] Figure 4 This is a flowchart illustrating a test data application method for a fingerprint sensing module according to embodiments of this disclosure. Please refer to... Figure 4 The method in this embodiment can be derived from... Figure 1 The electronic device 100 performs the following: Figure 1 Component description shown Figure 4 Details of each step.

[0042] In step S410, the processor 140 records general test data for the fingerprint sensing module 110. This general test data is generated based on test procedures performed on the fingerprint sensing modules of multiple tested electronic devices. In step S420, the processor 140 records specific test data for the fingerprint sensing module 110. This specific test data is generated based on test procedures performed on the fingerprint sensing module 110 of the electronic device 100. It should be noted that this disclosure does not limit the execution order of steps S410 and S420. That is, step S410 can be executed earlier or later than step S420.

[0043] In step S430, when an assembly event related to the fingerprint sensing module 110 occurs, the processor 140 selects application test data from dedicated test data and general test data. In some embodiments, step S430 may be implemented as including steps S431 to S432.

[0044] In step S431, when an assembly event related to the fingerprint sensing module 110 occurs, the processor 140 can receive user commands via the user interface displayed on the display 130. Specifically, when an assembly event occurs, such as after the fingerprint sensing module 110 is reassembled, the display is replaced, or after maintenance and adjustment, the processor 140 can control the display 130 to display the user interface, prompting the user to select the desired test data source. The aforementioned user interface can present an option list including dedicated test data and / or general test data, and the processor 140 can receive user commands via touch, buttons, mouse, etc.

[0045] In step S432, the processor 140 can select application test data from dedicated test data and general test data according to user instructions. For example, after assembling the fingerprint sensing module 110 onto the electronic device 100, if a dedicated testing space and testing equipment (e.g., a test head) are available on-site, production line or maintenance personnel can input user instructions to select dedicated test data. The processor 140 can then control the electronic device 100 to execute the test program and generate or update the dedicated test data according to the user instructions. If the fingerprint sensing module 110 does not wish to execute the test program after assembly, for example, if there is no testing equipment available on-site for the electronic device 100, the user or maintenance personnel can issue a user instruction to select general test data. The processor 140 can then use the general test data according to the user instructions to execute the fingerprint registration and fingerprint verification procedures.

[0046] In step S440, the processor 140 executes the fingerprint registration procedure or fingerprint verification procedure through the fingerprint sensing module 110 based on the application test data.

[0047] Figure 5 This is a flowchart illustrating a test data application method for a fingerprint sensing module according to embodiments of this disclosure. Please refer to... Figure 5 The method in this embodiment can be derived from... Figure 1 The electronic device 100 performs the following: Figure 1 Component description shown Figure 5 Details of each step.

[0048] In step S510, the processor 140 records general test data for the fingerprint sensing module 110. This general test data is generated based on test procedures performed on the fingerprint sensing modules of multiple tested electronic devices. In step S520, the processor 140 records specific test data for the fingerprint sensing module 110. This specific test data is generated based on test procedures performed on the fingerprint sensing module 110 of the electronic device 100. It should be noted that this disclosure does not limit the execution order of steps S510 and S520. That is, step S510 can be executed earlier or later than step S520.

[0049] In step S530, when an assembly event related to the fingerprint sensing module 110 occurs, the processor 140 selects application test data from dedicated test data and general test data. In some embodiments, step S530 may be implemented as including steps S531 to S534.

[0050] In step S531, when an assembly event related to the fingerprint sensing module 110 occurs, the processor 140 can determine whether the fingerprint sensing module 110 detects the test head within a predetermined time period. This test head can be the aforementioned test mold, such as a light-colored plastic mold test head, a black plastic mold test head, or a stamped plastic mold test head. The predetermined time period can be a waiting period after the fingerprint sensing module 110 is powered on or after assembly, for example, 5 to 30 seconds. In some embodiments, the processor 140 can control the fingerprint sensing module 110 to capture at least one sensing image at a preset time (e.g., after the fingerprint sensing module 110 is powered on), and determine whether the test head is detected based on one or more sensing images. For example, the processor 140 can control the fingerprint sensing module 110 to capture a first sensing image at a first preset time and then capture multiple second sensing images at subsequent second preset times. By comparing the brightness of the first sensing image with the brightness of these second sensing images, the processor 140 can determine whether the test head is detected.

[0051] In step S532, if the fingerprint sensing module 110 does not detect the test head within a predetermined time period (as determined in step S531), the processor 140 can select general test data as the application test data. In other words, when the test procedure cannot be performed at the repair site or when a test head is lacking, general test data can be directly used to ensure that the fingerprint recognition function can maintain basic recognition accuracy and user experience.

[0052] In step S533, when the fingerprint sensing module 110 detects the test head within a predetermined time period (as determined in step S531), the processor 140 can use the fingerprint sensing module 110 in conjunction with the test head to execute a test program and update the dedicated test data of the fingerprint sensing module 110. That is, when the fingerprint sensing module 110 successfully detects the test head within a predetermined time period, the processor 140 can control the fingerprint sensing module 110 to execute a test program, capture test images, and update the dedicated test data.

[0053] In step S534, the processor 140 can select the updated dedicated test data as the application test data. Through the above process, the electronic device 100 can automatically determine and select the test data source without manual operation, thereby realizing the flexibility of the test process and the stability of the identification procedure.

[0054] In step S540, the processor 140 executes the fingerprint registration procedure or fingerprint verification procedure through the fingerprint sensing module 110 based on the application test data.

[0055] Figure 6 This is a flowchart illustrating a test data application method for a fingerprint sensing module according to embodiments of this disclosure. Please refer to... Figure 6 The method in this embodiment can be derived from... Figure 1 The electronic device 100 performs the following: Figure 1 Component description shown Figure 6 Details of each step.

[0056] In step S610, the processor 140 records general test data for the fingerprint sensing module 110. This general test data is generated based on test procedures performed on the fingerprint sensing modules of multiple tested electronic devices. In step S620, the processor 140 records specific test data for the fingerprint sensing module 110. This specific test data is generated based on test procedures performed on the fingerprint sensing module 110 of the electronic device 100. It should be noted that this disclosure does not limit the execution order of steps S610 and S620. That is, step S610 can be executed earlier or later than step S620.

[0057] In step S630, when an assembly event related to the fingerprint sensing module 110 occurs, the processor 140 selects application test data from dedicated test data and general test data. In some embodiments, step S630 may be implemented as including steps S631 to S633.

[0058] In step S631, when an assembly event related to the fingerprint sensing module 110 occurs, the processor 140 can use the fingerprint sensing module 110 to execute a test program and update the dedicated test data of the fingerprint sensing module 110. In step S632, the processor 140 can receive user instructions via a user interface. In step S633, the processor 140 can select application test data from the updated dedicated test data and general test data according to the user instructions. That is, even if the fingerprint sensing module 110 executes a test program, technicians or users can still decide whether to use the updated dedicated test data based on actual test conditions and quality judgment.

[0059] In step S640, the processor 140 executes the fingerprint registration procedure or fingerprint verification procedure through the fingerprint sensing module 110 based on the application test data.

[0060] Figure 7 This is a flowchart illustrating a test data application method for a fingerprint sensing module according to embodiments of this disclosure. Please refer to... Figure 7 The method in this embodiment can be derived from... Figure 1The electronic device 100 performs the following: Figure 1 Component description shown Figure 7 Details of each step.

[0061] In step S710, the processor 140 records general test data for the fingerprint sensing module 110. This general test data is generated based on test procedures performed on the fingerprint sensing modules of multiple tested electronic devices. In step S720, the processor 140 records specific test data for the fingerprint sensing module 110. This specific test data is generated based on test procedures performed on the fingerprint sensing module 110 of the electronic device 100. It should be noted that this disclosure does not limit the execution order of steps S710 and S720. That is, step S710 can be executed earlier or later than step S720.

[0062] In step S730, when an assembly event related to the fingerprint sensing module 110 occurs, the processor 140 selects application test data from dedicated test data and general test data. In some embodiments, step S730 may be implemented as including steps S731 to S734.

[0063] In step S731, when an assembly event related to the fingerprint sensing module 110 occurs, the processor 140 can receive a user instruction via a user interface. More specifically, the user instruction can be used to determine whether to proceed with the testing process of the fingerprint sensing module 110. For example, the user interface can provide options such as "Test Now" or "Skip Test". In step S732, the processor 140 can update the dedicated test data of the fingerprint sensing module 110 by executing a test procedure using the fingerprint sensing module 110 according to the user instruction. When the user instruction instructs the processor 140 to proceed with the testing process of the fingerprint sensing module 110, the dedicated test data of the fingerprint sensing module 110 can be updated. In step S733, the processor 140 can select the updated dedicated test data as application test data, for example, in application scenarios where technicians manually perform on-site testing and wish to update the dedicated test data in real time. On the other hand, the user instruction can also be used to determine whether to use general test data. In step S734, the processor 140 can select general test data as application test data according to the user instruction. For example, when a user instruction instructs the processor 140 to omit the testing process for the fingerprint sensing module 110, the processor 140 may select general test data as application test data.

[0064] In step S740, the processor 140 executes the fingerprint registration procedure or fingerprint verification procedure through the fingerprint sensing module 110 based on the application test data.

[0065] Figure 8 This is a flowchart illustrating a test data application method for a fingerprint sensing module according to embodiments of this disclosure. Please refer to... Figure 8 The method in this embodiment can be derived from... Figure 1 The electronic device 100 performs the following: Figure 1 Component description shown Figure 8 Details of each step.

[0066] In step S810, the processor 140 records general test data for the fingerprint sensing module 110. This general test data is generated based on test procedures performed on the fingerprint sensing modules of multiple tested electronic devices. The general test data can be recorded in the storage device 130 before the electronic device 100 leaves the factory.

[0067] In step S820, during the initial assembly period of the fingerprint sensing module 110, the processor 140 uses the fingerprint sensing module 110 to execute a test program and obtain dedicated test data for the fingerprint sensing module 110. The initial assembly period can be defined as the period during which the fingerprint sensing module 110 is first assembled into the electronic device 100 by the original manufacturer and undergoes functional verification and calibration at the original manufacturer's production line or test station.

[0068] In step S830, the processor 140 records dedicated test data for the fingerprint sensing module 110. The dedicated test data is generated based on a test procedure performed on the fingerprint sensing module 110 of the electronic device 100. That is, after the electronic device 100 undergoes a test procedure at the original manufacturer's production line or testing station, the dedicated test data for the fingerprint sensing module 110 can be recorded in the storage device 130.

[0069] In step S840, before the assembly event related to the fingerprint sensing module 110 occurs, the processor 140 executes the fingerprint registration procedure and the fingerprint verification procedure through the fingerprint sensing module 110 based on dedicated test data. That is, before the assembly event related to the fingerprint sensing module 110 occurs, the processor 140 can execute the fingerprint registration procedure and the fingerprint verification procedure through the fingerprint sensing module 110 based on dedicated test data.

[0070] In step S850, when an assembly event related to the fingerprint sensing module 110 occurs, the processor 140 selects application test data from dedicated test data and general test data. Generally, if the test program is not executed again, the processor 140 selects general test data as application test data to avoid using dedicated test data that is no longer suitable due to the assembly event.

[0071] In step S860, the processor 140 executes a fingerprint registration or fingerprint verification procedure through the fingerprint sensing module 110 based on application test data. The first registered fingerprint data obtained based on the dedicated test data is updated to the second registered fingerprint data obtained based on the application test data. In this scenario, the processor 140 can update the registered fingerprint data based on the application test data, that is, replace the first registered fingerprint data previously established with the dedicated test data with the second registered fingerprint data, to ensure that the identification accuracy and anti-counterfeiting capability are maintained under different assembly conditions.

[0072] In summary, in this disclosed embodiment, by employing a flexible selection mechanism that incorporates both dedicated and general test data, the performance variations of the fingerprint sensing module after manufacturing, repair, or replacement can be addressed, thereby improving the fingerprint recognition reliability and user experience of the electronic device under different assembly conditions. Furthermore, using pre-stored general test data simplifies the testing process and reduces testing costs.

[0073] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions disclosed herein, and are not intended to limit them. Although the present disclosure has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some or all of the technical features therein. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments disclosed herein.

Claims

1. A method for applying test data from a fingerprint sensing module, applicable to electronic devices including a fingerprint sensing module, characterized in that, The method includes: Record general test data of the fingerprint sensing module, wherein the general test data is generated based on test procedures performed on the fingerprint sensing modules of multiple tested electronic devices; Record dedicated test data for the fingerprint sensing module, wherein the dedicated test data is generated based on the test procedure performed on the fingerprint sensing module of the electronic device; and When an assembly event related to the fingerprint sensing module occurs, application test data is selected from the dedicated test data and the general test data; The application test data is used to enable the fingerprint sensing module to perform a fingerprint registration or fingerprint verification procedure.

2. The method for applying test data from the fingerprint sensing module according to claim 1, characterized in that, When the assembly event related to the fingerprint sensing module occurs, the step of selecting the application test data from the dedicated test data and the general test data includes: When the assembly event related to the fingerprint sensing module occurs, the dedicated test data of the fingerprint sensing module is updated by executing the test procedure using the fingerprint sensing module; and The application test data is selected from the updated specialized test data and the general test data.

3. The method for applying test data from the fingerprint sensing module according to claim 1 or 2, characterized in that, Before the step of selecting the application test data from the dedicated test data and the general test data when the assembly event related to the fingerprint sensing module occurs, the method further includes: During the initial assembly of the fingerprint sensing module, the dedicated test data of the fingerprint sensing module is obtained by executing the test procedure using the fingerprint sensing module; and Prior to the assembly event related to the fingerprint sensing module, the fingerprint registration procedure and the fingerprint verification procedure are executed through the fingerprint sensing module based on the dedicated test data.

4. The method for applying test data from the fingerprint sensing module according to claim 3, characterized in that, The steps of executing the fingerprint registration procedure and the fingerprint verification procedure through the fingerprint sensing module based on the application test data include: The first registration fingerprint data obtained based on the dedicated test data is updated to the second registration fingerprint data obtained based on the application test data.

5. The method for applying test data from the fingerprint sensing module according to claim 1, characterized in that, When the assembly event related to the fingerprint sensing module occurs, the step of selecting the application test data from the dedicated test data and the general test data includes: When the assembly event related to the fingerprint sensing module occurs, a user command is received via the user interface; and The application test data is selected from the dedicated test data and the general test data according to the user instructions.

6. The method for applying test data from the fingerprint sensing module according to claim 1, characterized in that, When the assembly event related to the fingerprint sensing module occurs, the step of selecting the application test data from the dedicated test data and the general test data includes: When the assembly event related to the fingerprint sensing module occurs, determine whether the fingerprint sensing module detects the test head within a predetermined time period; and If the fingerprint sensing module does not detect the test head within the predetermined time period, the general test data is selected as the application test data.

7. The method for applying test data from the fingerprint sensing module according to claim 6, characterized in that, When the assembly event related to the fingerprint sensing module occurs, the step of selecting the application test data from the dedicated test data and the general test data further includes: When the fingerprint sensing module detects the test head within the predetermined time period, it executes the test procedure using the fingerprint sensing module to update the dedicated test data of the fingerprint sensing module; and Select the updated dedicated test data as the application test data.

8. The method for applying test data from the fingerprint sensing module according to claim 1, characterized in that, The general test data is the statistical result of the test data of the fingerprint sensing modules of the multiple tested electronic devices.

9. The method for applying test data from the fingerprint sensing module according to claim 1, characterized in that, The steps of executing the fingerprint registration procedure and the fingerprint verification procedure through the fingerprint sensing module based on the application test data include: The fingerprint image processing parameters are determined based on the application test data; and The fingerprint registration procedure and the fingerprint verification procedure are executed by the fingerprint sensing module based on the fingerprint image processing parameters.

10. The method for applying test data from the fingerprint sensing module according to claim 9, characterized in that, The steps of executing the fingerprint registration procedure and the fingerprint verification procedure through the fingerprint sensing module based on the application test data include: When the application test data is the dedicated test data, the threshold parameter used for the fingerprint registration program or the fingerprint verification program is determined to be a first value; and When the application test data is the general test data, the threshold parameter used for the fingerprint registration program or the fingerprint verification program is determined to be the second value.

11. An electronic device, characterized in that, include: Storage device; Fingerprint sensing module; as well as The processor, connected to the storage device and the fingerprint sensing module, is configured to: Record general test data of the fingerprint sensing module, wherein the general test data is generated based on test procedures performed on the fingerprint sensing modules of multiple tested electronic devices; It is generated based on the test procedure performed on the fingerprint sensing module of the electronic device; as well as When an assembly event related to the fingerprint sensing module occurs, application test data is selected from the dedicated test data and the general test data. The application test data is used to enable the fingerprint sensing module to perform a fingerprint registration or fingerprint verification procedure.

Images