Pulse test method and pulse test platform

Abstract

The invention discloses a pulse test method and a pulse test platform. A control signal is sent to the driving module through the control module; the driving module generates a pulse driving signal according to the control signal and sends the pulse driving signal to the test module and the power supply module; the power supply module provides corresponding test voltage for the to-be-tested device based on the pulse driving signal, and the test module performs pulse test on the to-be-tested device based on the pulse driving signal; the acquisition module is used for acquiring waveform data of the pulse test and uploading the waveform data to the control module; the control module receives the waveform data and generates a pulse test report based on the waveform data. Therefore, the full-process operation of one-key automatic pulse test, signal acquisition and analysis of the power device can be realized, and the test efficiency is correspondingly improved; meanwhile, different power devices are compatible, the power device to be tested can be placed on the pulse test platform for pulse test, and parameters do not need to be manually adjusted.

Description

Technical Field

[0001] This application belongs to the field of power device testing technology, specifically relating to a pulse testing method and a pulse testing platform. Background Technology

[0002] With the advent of the era of intelligent chips, servo motor controllers are key to the implementation of intelligent algorithms and have become core units in fields such as automotive, home appliances, and industrial robots. Their performance depends on the pulse signal response, switching delay, dead time setting, and anti-interference capability of power devices such as SiCMOSFETs (Silicon Carbide Field-Effect Transistors) and IGBTs (Insulated Gate Bipolar Transistors). Existing pulse tests for power devices generally follow a fixed framework and are conducted on a single type of power device.

[0003] Therefore, in the process of implementing the embodiments of this application, the inventors have found that the related technology has at least the following problems: testing relies on manual intervention, testing compatibility is poor and cannot adapt to the testing needs of different power devices, and testing security is insufficient. Summary of the Invention

[0004] The embodiments of this application mainly address the technical problems of low efficiency in manual operation and insufficient compatibility in testing multiple types of devices when performing pulse measurements of power devices.

[0005] To address the aforementioned technical problems, one technical solution adopted in this application is as follows: a pulse testing method is provided, applied to a pulse testing platform. The pulse testing platform includes a power supply module, a drive module, a testing module, an acquisition module, and a control module. The control module is connected to the acquisition module, the power supply module, and the drive module, respectively. The drive module and the power supply module are connected to the testing module, respectively. The testing module is also connected to the acquisition module and the device under test (DUT). The method includes: the control module sending a control signal to the drive module; the drive module receiving the control signal, generating a pulse drive signal based on the control signal, and sending the pulse drive signal to the testing module and the power supply module; the power supply module receiving the pulse drive signal and providing a corresponding test voltage to the DUT based on the pulse drive signal, so that the DUT is driven based on the test voltage; the testing module receiving the pulse drive signal and performing a pulse test on the DUT based on the pulse drive signal; the acquisition module acquiring waveform data of the pulse test and uploading the waveform data to the control module; and the control module receiving the waveform data and generating a pulse test report based on the waveform data.

[0006] Optionally, before the control module sends the control signal to the drive module, the method further includes: the control module performing a self-test on the drive module, power supply module, test module, and acquisition module; when the self-test meets preset conditions, the control module determines that the pulse test platform is normal and generates the control signal; when the self-test does not meet preset conditions, the control module determines that the pulse test platform has a fault and triggers an audible and visual alarm.

[0007] Optionally, the pulse test platform further includes a protection module, which is connected to both the power supply module and the test module. When the self-test meets preset conditions, the control module determines that the pulse test platform has a fault and triggers an audible and visual alarm, including: when the self-test does not meet preset conditions, the control module determines that the pulse test platform has a fault and generates a fault signal; the control module sends the fault signal to the protection module; the protection module receives the fault signal and, based on the fault signal, disconnects the connection between the power supply module and the test module to prevent the pulse test platform from starting; the control module records the self-test failure information and triggers an audible and visual alarm.

[0008] Optionally, the pulse test includes a single-pulse test and a double-pulse test; the control module sending a control signal to the drive module includes: the control module sending a control signal to the drive module according to the type of pulse test, including: when the pulse test is a single-pulse test, the control module sends a first control signal to the drive module; when the pulse test is a double-pulse test, the control module sends a second control signal to the drive module.

[0009] Optionally, the drive module receives the control signal, generates a pulse drive signal according to the control signal, and sends the pulse drive signal to the test module and the power supply module, including: the drive module receives the control signal, and when the control signal is the first control signal, configures single-pulse drive parameters; when the control signal is the second control signal, configures double-pulse drive parameters; the drive module sends the configured pulse drive parameters to the control module, the control module receives the pulse drive parameters and makes a judgment; if the pulse drive parameters are correct, the control module sends a braking signal to the drive module so that the drive module generates a pulse drive signal according to the braking signal; if the pulse drive parameters are incorrect, the control module sends a correction signal to the drive module so that the drive module reconfigures the pulse drive parameters; the drive module sends the pulse drive signal to the test module and the power supply module.

[0010] Optionally, the test module includes a load unit and a test unit, the load unit being connected to the test unit, and the test unit being connected to the drive module, the power supply module, the acquisition module, and the device under test (DUT). The test module receives the pulse drive signal and performs pulse testing on the DUT based on the pulse drive signal, including: the test unit receiving the pulse drive signal and sending the pulse drive signal to the DUT; the DUT receiving the pulse drive signal and the test voltage, and performing pulse testing based on the pulse drive signal and the test voltage; and the load unit maintaining the stability of the pulse testing of the DUT through the test unit.

[0011] Optionally, the load unit includes an inductive load; the load unit maintains the stable pulse test of the device under test (DUT) through the test unit, including: the control module sets a target current value and a target inductance value according to the DUT, and sends the target current value and the target inductance value to the load unit; the load unit adjusts the inductance value of the inductive load according to the target inductance value to initialize the inductive load; after the DUT starts the pulse test, the load unit maintains the loop current of the DUT within a preset current fluctuation range of the target current value.

[0012] Optionally, the device under test (DUT) receives the pulse drive signal and the test voltage, and performs a pulse test based on the pulse drive signal and the test voltage, including: the DUT receives the test voltage and starts based on the test voltage; the DUT receives the pulse drive signal and turns on based on the pulse drive signal to form a current loop, so that the acquisition module can acquire waveform data of the current loop for pulse test.

[0013] Optionally, the acquisition module includes an oscilloscope and an acquisition unit, the acquisition unit being connected to both the oscilloscope and the test module, and the oscilloscope being connected to the control module. The acquisition module acquires waveform data from the pulse test and uploads the waveform data to the control module, including: the acquisition unit acting on the test point of the test module to acquire waveform data from the pulse test; the acquisition unit uploading the acquired waveform data to the oscilloscope; the oscilloscope receiving and displaying the waveform data; and the oscilloscope uploading the waveform data to the control module.

[0014] To solve the above-mentioned technical problems, one technical solution adopted in this application is: providing a pulse test platform, the pulse test platform including a power supply module, a drive module, a test module, an acquisition module, and a control module, the control module being connected to the acquisition module, the power supply module, and the drive module respectively, the drive module and the power supply module being connected to the test module respectively, and the test module being connected to the acquisition module and the device under test respectively; the control module is configured to send a control signal to the drive module; the drive module is configured to receive the control signal, generate a pulse drive signal according to the control signal, and drive the pulse... A pulse drive signal is sent to the test module and the power supply module; the power supply module is configured to receive the pulse drive signal and provide a corresponding test voltage to the device under test based on the pulse drive signal, so that the device under test is driven based on the test voltage; the test module is configured to receive the pulse drive signal and perform pulse testing on the device under test based on the pulse drive signal; the acquisition module is configured to acquire the waveform data of the pulse test and upload the waveform data to the control module; the control module is also configured to receive the waveform data and generate a pulse test report based on the waveform data.

[0015] Unlike related technologies, this application provides a pulse testing method and a pulse testing platform. A control module sends a control signal to a drive module, which generates a pulse drive signal and sends it to a test module and a power supply module. The power supply module provides a corresponding test voltage to the device under test (DUT) based on the pulse drive signal, enabling the DUT to be driven by the test voltage. The test module performs pulse testing on the DUT based on the pulse drive signal. The acquisition module acquires the waveform data from the pulse test and uploads it to the control module. The control module receives the waveform data and generates a pulse test report based on it. This solves the problems of reliance on manual intervention and complex hardware setup in existing pulse testing technologies. It enables one-click automatic pulse testing, signal acquisition, and analysis of power devices, significantly improving testing efficiency. Furthermore, it is compatible with different power devices; the DUT can be placed on the pulse testing platform for pulse testing without manual parameter adjustment. Attached Figure Description

[0016] One or more embodiments are illustrated by way of example with reference to the accompanying drawings. These illustrations do not constitute a limitation on the embodiments. Elements having the same reference numerals in the drawings are denoted as similar elements. Unless otherwise stated, the figures in the drawings are not to be limited by scale.

[0017] Figure 1 This is a schematic diagram illustrating an application scenario of a pulse testing method provided in an embodiment of this application.

[0018] Figure 2 This is a schematic diagram of the structure of a pulse testing platform proposed in an embodiment of this application.

[0019] Figure 3 This is a schematic flowchart of a pulse testing method provided in an embodiment of this application.

[0020] Figure 4 This is a schematic diagram of a pulse drive signal generation process proposed in an embodiment of this application.

[0021] Figure 5 This is a schematic diagram of a test module performing pulse testing according to an embodiment of this application. Detailed Implementation

[0022] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the scope of this application.

[0023] It should be noted that, unless otherwise specified, the various features in the embodiments of this application can be combined with each other, all of which are within the protection scope of this application. Furthermore, although functional modules are divided in the device schematic diagram and a logical order is shown in the flowchart, in some cases, the steps shown or described may be performed in a different order than the module division in the device schematic diagram or the order in the flowchart.

[0024] Unless otherwise defined, all technical and scientific terms used in this specification have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used in this specification is for the purpose of describing particular embodiments only and is not intended to limit the scope of this application. The term "and / or" as used in this specification includes any and all combinations of one or more of the associated listed items.

[0025] As intelligent chip technology becomes a core development trend in industries such as manufacturing, electronics, and automotive, servo motor controllers have become the "muscle memory DNA" of various intelligent devices. Servo motor controllers are the key hub connecting algorithms and mechanical execution structures, directly determining the response speed, control accuracy, and stability of mechanical equipment. They are indispensable in automotive electronics, smart home appliances, and industrial robots. The performance of a servo motor controller largely depends on the characteristics of its internal power devices, such as SiC MOSFETs, IGBTs, and silicon carbide. These devices often need to rapidly switch operating states under high-frequency, high-voltage, or extremely high-current environments. Therefore, parameters such as pulse signal response, switching delay time, and anti-interference capability directly affect the efficiency, power consumption, and lifespan of the servo motor controller. Thus, accurate and efficient testing of power devices has become a crucial link in the entire R&D and production process of the industry.

[0026] Existing power device testing solutions require the binding of instruments, manual setup of the test environment, and manual connection of multiple instruments. The testing time for a single device is too long, and data recording and parameter calculation are still required, resulting in extremely low efficiency and a high risk of errors. More importantly, traditional equipment testing is very limited, with a single test frequency, making it unsuitable for testing different types of power devices such as high-frequency SiCMOSFETs and low-frequency IGBTs, and the test results are not accurate.

[0027] In view of this, this application proposes a pulse testing platform, which can automatically and efficiently complete the pulse testing method proposed in this application, so as to solve the technical problems of low efficiency of manual operation and insufficient compatibility of testing multiple types of devices when performing pulse measurement of power devices.

[0028] Pulse testing, in particular, is a testing method that applies a pulse electrical signal with specific parameters to the device under test (DUT) and collects its voltage and current waveforms during the switching process to analyze its dynamic characteristics. It is a means of evaluating the performance of power devices. Unlike ordinary testing, pulse testing focuses on the dynamic behavior of the DUT at the moment of switching, and the parameters evaluated include switching speed, operating losses, and interference immunity, reflecting the performance of the power device in actual operation.

[0029] Please see Figure 1 , Figure 1 This is a schematic diagram of an application scenario for a pulse testing method proposed in this application embodiment. The application scenario specifically includes a pulse testing platform 10, a device under test 20, a host computer 30, and a customized fixture 40.

[0030] Specifically, when performing pulse testing on the device under test (DUT) 20, the user first fixes the DUT 20 onto the customized fixture 40, which then fixes the DUT 20 onto the pulse testing platform 10. The user then selects the test scenario via the host computer 30: for example, incoming material selection testing, equipment factory testing, or R&D testing, and selects pulse testing according to the corresponding scenario. The host computer 30 sends the selected information to the pulse testing platform 10. Upon receiving the signal from the host computer 30, the pulse testing platform 10 starts and performs pulse testing on the DUT 20. After the pulse test is completed, the pulse testing platform 10 generates a pulse test report and uploads it to the host computer 30 for storage and to notify the user. Finally, the user shuts down the host computer 30, the pulse testing platform 10 is powered off, and the user removes the DUT 20 from the customized fixture 40, completing the testing of the DUT 20. The entire process requires no manual intervention, greatly improving testing efficiency.

[0031] Customized fixtures ensure the stability of the testing system through contact points, while adding shielding reduces interference from wire connections and further enhances the accuracy of test data and the integrity of the waveform of the device under test.

[0032] Please see Figure 2 , Figure 2 This is a schematic diagram of the structure of a pulse testing platform corresponding to a pulse testing method proposed in an embodiment of this application, as shown below. Figure 2 As shown, the pulse test platform 10 includes: a power supply module 11, a drive module 12, a test module 13, an acquisition module 14, and a control module 15. The control module 15 is connected to the acquisition module 14, the power supply module 11, and the drive module 12. The drive module 12 and the power supply module 11 are connected to the test module 13. The test module 13 is also connected to the acquisition module 14 and the device under test (DUT) 20. Specifically, the control module 15 interacts with the host computer 30. The host computer 30 sends the information selected by the user to the control module 15. The control module 15 drives the drive module 12 to work according to the user's selection. The drive module 12 further drives the test module 13 and the power supply module 11 to test the DUT 20. The acquisition module 14 acquires data from the test and sends the acquisition results to the control module 15. The control module 15 then sends the final result to the host computer 30.

[0033] In some embodiments of this application, please refer to Figure 3 , Figure 3 The following is a flowchart illustrating a pulse testing method provided in an embodiment of this application. The method is performed by a control module and includes, but is not limited to, the following steps:

[0034] 101: The control module sends control signals to the drive module.

[0035] In some embodiments, before performing step 101, the method further includes the control module 15 performing a self-test operation on the pulse test platform 10, specifically including but not limited to the following steps: 1001: The control module performs self-tests on the drive module, power supply module, test module, and acquisition module. If the self-test meets the preset conditions, proceed to step 1002; if the self-test does not meet the preset conditions, proceed to step 1003.

[0036] 1002: The control module determines that the pulse test platform is normal and generates a control signal.

[0037] 1003: The control module determines that there is a fault in the pulse test platform and triggers an audible and visual alarm.

[0038] Understandably, the self-test is an automated, full-coverage testing process for the core modules of the pulse testing platform 10. Essentially, it simulates module function verification and parameter calibration before pulse testing, an action performed by the control module 15 but requiring manual intervention. The self-test can include: testing the communication links between modules to verify smooth communication and confirm connection status; performing functional simulation tests on each module, executing basic functions to verify normal operation; and calibrating the parameters of each module. By using the control module 15 for automated, one-click self-testing of each module, replacing traditional manual checks, efficiency is improved, and safety is significantly enhanced. Furthermore, the accuracy of automated self-testing is much higher than that of manual checks.

[0039] Specifically, after performing self-checks on each module, the control module 15 verifies whether preset conditions are met. These preset conditions are the criteria used by the control module 15 to determine whether each module can successfully perform pulse testing. These conditions are set in advance by the user based on the component specifications and represent the acceptable standards for the normal operation of the pulse testing platform. For example, the preset conditions for the power supply module 11 might be whether the voltage and current parameters of the power supply output meet the set values ​​and whether there is any leakage. For the test module 13, the preset conditions might be whether the test conditions meet the regulations and whether the contact with the customized fixture 40 is good. The preset conditions for the drive module and the acquisition module are not elaborated upon, but they essentially reflect the criteria for whether the module can work normally. Performing self-checks on each module can prevent pulse test failures due to module malfunctions and also protect the device under test from damage by faulty modules, improving the safety of the test.

[0040] In some embodiments, such as Figure 2As shown, the pulse test platform 10 also includes a protection module 16, which is connected to both the power supply module 11 and the test module 13. The protection module, connected between the power supply module 11 and the test module 13, serves as a crucial protection function module for the pulse test platform 10. It can immediately cut off the power supply upon detecting an abnormality, preventing the pulse test platform 10 from continuing operation under fault conditions and causing serious consequences. Step 1003 includes, but is not limited to, the following steps: 10031: When the self-test does not meet the preset conditions, the control module determines that there is a fault in the pulse test platform and generates a fault signal.

[0041] 10032: The control module sends a fault signal to the protection module. The protection module receives the fault signal and, based on the fault signal, cuts off the connection between the power supply module and the test module to prevent the pulse test platform from starting.

[0042] 10033: The control module records the self-test failure information and triggers an audible and visual alarm.

[0043] Understandably, when the self-test fails to meet the preset conditions, the control module 15 generates a fault signal and sends it to the protection module 16. Specifically, the fault signal may include: an identifier of the faulty module, indicating which module has malfunctioned and failed the self-test; a fault type, corresponding to the specific fault scenario, such as a communication failure or a short circuit; and an execution command, which acts on the protection module 16. Under this command, the protection module 16 performs an emergency disconnection between the power supply module 11 and the test module 13. By disconnecting the power supply module 11 and the test module 13, the power supply module 11 can no longer function for the entire pulse test platform 10, thereby enabling a rapid switchover of the pulse test platform 10's operation.

[0044] The self-test failure information is included within the fault signal; the control module extracts and records the specific information. Specifically, the self-test failure information may include: fault occurrence time, fault module information, fault type information, and specific fault data. Simultaneously, the control module 15 triggers an audible and visual alarm to prompt the user to perform fault detection, thus ensuring the safety of the test. Furthermore, users can view the self-test failure information to examine the detailed cause of the fault, accurately locate the faulty module and fault content, and achieve rapid detection.

[0045] In some embodiments, this application performs pulse testing on the device under test 20, including single-pulse testing and double-pulse testing. Further, step 101 also includes: When the pulse test is a single pulse test, the control module sends a first control signal to the drive module; when the pulse test is a double pulse test, the control module sends a second control signal to the drive module.

[0046] Understandably, by distinguishing between single-pulse and double-pulse tests, the control module 15 can send different signals to different test requirements. In the pre-test phase, the user selects the test requirement via a host computer. After the user selects the corresponding pulse test, the control module 15 sends either a first control signal or a second control signal to the drive module.

[0047] The single-pulse test involves applying a pulse signal to the power device, causing the device under test (DUT) 20 to turn on from an off state and then off again. The voltage and current waveforms are then collected and analyzed to assess its steady-state conduction characteristics. Its core objective is to measure the steady-state operating parameters of the power device and evaluate its basic conduction performance. The double-pulse test applies two consecutive pulse signals to the power device. First, a steady-state state is established using the first pulse signal to obtain the steady-state current. Then, a second pulse signal triggers the power device to turn on. The test primarily collects the characteristics during the interval between the two pulse signals and when the device turns on with the second pulse signal. Its core objective is to evaluate the switching performance of the power device and simulate the continuous switching scenarios of the power device in actual operation.

[0048] Furthermore, the first control signal is the control signal generated by the control module 15 in the single-pulse test mode, which is used to transmit the signal for executing the single-pulse test to the drive module 12; the second control signal is the control signal generated by the control module 15 in the double-pulse test mode, which is used to transmit the signal for executing the double-pulse test to the drive module 12.

[0049] 102: The drive module receives the control signal, generates a pulse drive signal based on the control signal, and sends the pulse drive signal to the test module and the power supply module.

[0050] In some embodiments, please refer to Figure 4 , Figure 4 This is a schematic diagram of a pulse drive signal generation process proposed in an embodiment of this application, as shown below. Figure 4 As shown, step 102 includes, but is not limited to, the following steps: 1021: The drive module receives the control signal and configures the single-pulse drive parameters when the control signal is the first control signal; and configures the double-pulse drive parameters when the control signal is the second control signal.

[0051] 1022: The drive module sends the configured pulse drive parameters to the control module. The control module receives the pulse drive parameters and makes a judgment. If the pulse drive parameters are correct, proceed to step 1023; if the pulse drive parameters are incorrect, proceed to step 1024.

[0052] 1023: The control module sends a braking signal to the drive module, so that the drive module generates a pulse drive signal according to the braking signal and executes step 1025.

[0053] 1024: The control module sends a correction signal to the drive module to reconfigure the pulse drive parameters and returns to step 1022.

[0054] 1025: The drive module sends pulse drive signals to the test module and the power supply module.

[0055] Understandably, the drive module 12 configures the corresponding pulse drive parameters based on the received control signal to ensure that the pulse drive signal accurately matches the test requirements, avoiding invalid test data or damage to the device under test 20 due to incorrect parameters. The single-pulse drive parameters may include pulse width, pulse amplitude range, on-state voltage drop, steady-state conduction loss, and on-current rise time, reflecting the associated parameters generated by a single pulse signal, and are parameters that can convey whether the device under test 20 has entered a steady-state conduction state. The dual-pulse drive parameters may include the width of the two pulse signals, the interval and amplitude of the two pulses, switching loss, and reverse recovery current, reflecting the associated parameters generated by the two pulse signals, and are parameters that can convey the state of the device under test 20 during continuous switching.

[0056] After the drive module 12 completes the pulse drive parameter configuration, it transmits the configured pulse drive parameters back to the control module 15 for judgment. Specifically, this includes: whether the parameter range is feasible and whether it conforms to the test mode of the device under test. If the judgment is incorrect, the control module 15 generates a correction signal to the drive module 12 so that the drive module 12 reconfigures the pulse drive parameters; if it is correct, it generates a braking signal to the drive module 12 so that the drive module 12 generates a pulse drive signal.

[0057] The correction signal is a command signal generated by the control module 15 that causes the drive module 12 to reconfigure the pulse drive parameters. The braking signal is a start signal that initiates the generation of pulse drive signals by the drive module 12. The braking signal contains the pulse drive parameters and is sent together to the test module 13 and the power supply module 11.

[0058] 103: The power supply module receives the pulse drive signal and provides the corresponding test voltage to the device under test based on the pulse drive signal, so that the device under test is driven based on the test voltage.

[0059] The power supply module 11, as an energy supply unit, can output a test voltage that matches the testing requirements of the device under test 20. Specifically, the power supply module 11 receives a pulse drive signal and starts working, matching and outputting a test voltage that matches the device under test 20, providing energy support for pulse testing. The specific voltage is determined based on the rated voltage of the device under test 20, which is sent to the power supply module 11 along with the pulse drive signal.

[0060] The power supply module 11 must support high voltage (e.g., 600V / 1200V) and high current output, be compatible with the rated specifications of power devices, and possess high precision, a wide adjustable range, low ripple and low noise, and support voltage ramp-up and ramp-down for soft start. Simultaneously, the power supply module 11 supports a LAN interface (Local Area Network) for remote control by the host computer 30.

[0061] 104: The test module receives the pulse drive signal and performs pulse testing on the device under test based on the pulse drive signal.

[0062] In some embodiments, such as Figure 2 As shown, the test module 13 includes a load unit 131 and a test unit 132. The load unit 131 is connected to the test unit 132. The test unit 132 is also connected to the drive module 12, the power supply module 11, the acquisition module 14 and the device under test 20, respectively. The load unit includes an inductive load.

[0063] Please see Figure 5 , Figure 5 This is a schematic diagram of a test module performing pulse testing according to an embodiment of this application, as shown below. Figure 5 As shown, step 104 includes, but is not limited to, the following steps: 1041: The test unit receives the pulse drive signal and sends the pulse drive signal to the device under test.

[0064] 1042: The device under test receives the test voltage and starts based on the test voltage.

[0065] 1043: The device under test receives a pulse drive signal and conducts a current loop based on the pulse drive signal.

[0066] 1044: The control module sets the target current value and target inductance value according to the device under test, and sends the target current value and target inductance value to the load unit.

[0067] 1045: The load unit adjusts the inductance value of the inductive load according to the target inductance value to initialize the inductive load.

[0068] 1046: After the device under test (DUT) starts pulse testing, the load unit maintains the loop current of the DUT within the preset current fluctuation range of the target current value.

[0069] Among them, the current loop is a closed path through which the test voltage drives the current to flow after the device under test 20 is turned on, providing a carrier for the testing of the device under test 20.

[0070] Test unit 132 is the hub responsible for signal transmission, module communication, and fixing of the device under test 20. During pulse testing, the chip under test 20 is fixed on test unit 132 using customized fixture 40 for pulse testing.

[0071] Understandably, load unit 131 is the unit in the test module responsible for maintaining stable loop current and simulating the actual operating load environment of the device under test 20. It consists of an inductive load, a sensor network, and a PID (Proportional Integral Derivative) fuzzy control circuit, such as a smart power load cabinet. Specifically, key parameters such as current, pressure, temperature, and speed are continuously monitored through the sensor network, and the PID fuzzy control circuit analyzes the data and calculates the required adjustment amount of the parameters to maintain stable loop current.

[0072] Inductive loads are electrical components within load unit 131 that possess inductive characteristics, such as coils or inductor modules, and are crucial for maintaining stable pulse test circuit current. To maintain stable circuit current, load unit 131 initializes the inductive load using a target inductance value.

[0073] Specifically, the target current value is a reference current value set by the control module 15 based on the specifications of the device under test (DUT) 20 and the test requirements, which is the current reference value that the circuit is expected to maintain stably during the pulse test. The target inductance value is a reference inductance value that the inductive load needs to reach, set by the control module 15 based on the characteristics of the DUT 20 and the target current value. This is used to ensure that the load characteristics match the test and provide a suitable circuit impedance for stabilizing the current. The larger the target current value, the smaller the target inductance value is usually, and the faster the switching speed of the DUT 20, the more precise the target inductance value needs to be set. The inductive load initialization is the process by which the load unit 131 adjusts the actual inductance value of the inductive load to the target inductance value set by the control module 15 and stabilizes it before the test starts. This is a preparatory step to ensure that the current is quickly established and the operation is stable during the test.

[0074] Finally, the load unit 131 maintains the loop current of the device under test 20 within a preset current fluctuation range of the target current value. The preset current fluctuation range is the range set by the control module 15 based on the test accuracy requirements of the device under test 20, allowing the loop current to fluctuate around the target current value, for example, set to ±5% of the target current value.

[0075] 105: The acquisition module acquires the waveform data of the pulse test and uploads the waveform data to the control module.

[0076] In some embodiments, such as Figure 2As shown, the acquisition module 14 includes an oscilloscope 141 and an acquisition unit 142. The acquisition unit 142 is connected to both the oscilloscope 141 and the test module 13. The oscilloscope 141 is also connected to the control module 15. Data from the pulse test can be acquired through the acquisition unit and then displayed on the oscilloscope 141. Specifically, step 105 includes, but is not limited to, the following steps: 1051: The acquisition unit operates at the test point of the test module to acquire waveform data of the pulse test.

[0077] 1052: The acquisition unit uploads the acquired waveform data to the oscilloscope, which receives and displays the waveform data.

[0078] 1053: The oscilloscope uploads waveform data to the control module.

[0079] The acquisition unit 142 is the main data acquisition unit, which can be composed of a high-voltage differential voltage probe and a current probe. It directly contacts the current loop being tested and converts the voltage and current signals into electrical signals for acquisition. The oscilloscope 141 is responsible for receiving the data from the acquisition unit 142, displaying the waveform in real time, and uploading the waveform data to the control module 15.

[0080] 106: The control module receives waveform data and generates a pulse test report based on the waveform data.

[0081] Understandably, after receiving the final waveform data, the control module 15 analyzes, calculates, and integrates the data, and finally automatically generates a pulse test report and uploads the pulse test report to the host computer. This process does not require manual intervention.

[0082] For example, the control module may include the following parameters for pulse testing and their calculation: The single-pulse test parameters include steady-state on-state voltage drop and on-state current rise time.

[0083] The steady-state on-state voltage drop is the average voltage between the collector and emitter of an IGBT or the drain and source of a MOSFET when the device under test (DUT) 20 is turned on and the current reaches a steady state. It is a core steady-state parameter reflecting the conduction loss of the DUT 20. First, the steady-state range is determined by the current waveform: calculate the difference between adjacent current samples |Ii+1 - Ii|. If the difference between 10 consecutive sampling points is ≤5%Isteady (steady-state current), the final result is determined and the process enters the steady-state phase. The average value of all voltage samples within the steady-state range is taken as the steady-state on-state voltage drop. It is calculated using Formula 1-1, as follows:

[0084] If uneven intervals are used, formula 1-2 can be used for correction:

[0085] Where Vce(sat) is the steady-state on-state voltage drop of the IGBT; Vds(on) is the steady-state on-state voltage drop of the MOSFET; Tstart is the start time of the current entering steady state (satisfying |I(t) - Isteady| ≤ 5%Isteady); Tend is the time when the current begins to turn off; V(t) is the continuous function of the device voltage over time within the test interval; t_i is the discrete sampling time point of the oscilloscope; V_i is the voltage sample value corresponding to time t_i; N is the number of sampling points within the steady-state interval; Δt is the sampling interval (Δt = t_i+1 - t_i, when the sampling rate is fixed, Δt=1 / f_s, where f_s is the sampling rate).

[0086] The conduction current rise time is the time it takes for the current to rise from 10% I_steady to 90% I_steady during single-pulse turn-on, reflecting the speed at which the current builds up when the device is turned on, i.e., the dynamic process before steady state. Ti10 and Ti90 are located using interpolation: if Ii < 10% Isteady and I(i+1) ≥ 10% Isteady at a certain sampling point, then Ti10 = Ti + ((0.1Isteady - Ii) / (I_i+1 - Ii) Δt). Calculated using Formula 2-1, as follows:

[0087] Where Tr(steady) is the rise time of the conduction current; TI10 is the time point when the current rises to 10%Isteady; and TI90 is the time point when the current rises to 90%Isteady.

[0088] The dual-pulse test parameters include turn-on current spike, freewheeling diode reverse recovery charge, and turn-on voltage overshoot freewheeling diode reverse recovery charge.

[0089] The turn-on current spike is a brief peak value that occurs during the turn-on process when the current rises (due to reverse recovery of the freewheeling diode or discharge of parasitic capacitance). To avoid overcurrent damage, it must be less than 115% of the device's rated current. The calculation using formula 3-1 is as follows:

[0090] Where Ipeak(on) is the peak current during the turn-on process; Imax(on) is the maximum current value within the turn-on interval.

[0091] The reverse recovery charge of the freewheeling diode occurs when the first pulse of the double-pulse circuit turns off, causing the freewheeling diode to conduct; when the second pulse turns it on, the diode switches from conducting to reverse-biased cutoff, storing the charge generated by the release of charge carriers. This is the core parameter of the reverse recovery loss. It is calculated using formula 4-1 as follows:

[0092] Where Qrr is the reverse recovery charge; t_rr-start is the time point when the diode current starts to rise in the reverse direction from 0; t_rr-end is the time point when the diode reverse current drops to 25% of I_rr-peak; I_rr-peak is the peak reverse recovery current; I_diode(t) is the freewheeling diode current; and M is the number of sampling points in the reverse recovery interval.

[0093] The reverse recovery charge of the turn-on voltage overshoot freewheeling diode is a brief peak in the device voltage before it drops during the turn-on process (due to the coupling between parasitic inductance and current rate of change). It needs to be less than 85% of the device's rated voltage (to avoid breakdown). Directly iterate through all voltage samples within the interval, take the maximum value Vmax(on), and then subtract the bus voltage Vdc. Calculate using formula 5-1, as follows:

[0094] Where Vpeak(on) is the turn-on voltage overshoot; Vdc is the bus voltage; and Vmax(on) is the maximum voltage value within the turn-on interval.

[0095] It is understood that the embodiments of this application are compatible with the communication protocols of commonly used instruments (oscilloscopes, function generators, high-power three-phase power supplies, load banks, etc.) and adopt the standardized command language SCPI (Standard Commands for Programmable Instruments). It is built on widely used hardware communication layers such as GPIB (General Purpose Interface Bus), USB-TMC (USB Test and Measurement Class), Ethernet / LXI (LAN eXtensions for Instrumentation), and serial ports. Therefore, the pulse testing method proposed in the embodiments of this application is compatible with SiC MOSFETs, IGBTs, or other types of power devices. The driver module proposed in the embodiments of this application can communicate using the USB-TMC protocol, while the oscilloscope and power supply module can communicate using Ethernet / LXI.

[0096] Unlike related technologies, this application provides a pulse testing method. A control module sends a control signal to a drive module, which generates a pulse drive signal and sends it to a test module and a power supply module. The power supply module provides a corresponding test voltage to the device under test (DUT) based on the pulse drive signal, enabling the DUT to be driven by the test voltage. The test module performs pulse testing on the DUT based on the pulse drive signal. The acquisition module acquires the waveform data from the pulse test and uploads it to the control module. The control module receives the waveform data and generates a pulse test report based on it. This solves the problems of reliance on manual intervention and complex hardware setup in existing pulse testing technologies. It enables one-click automatic pulse testing, signal acquisition, and analysis of power devices, significantly improving testing efficiency. Furthermore, it is compatible with different power devices; the DUT can be placed on a pulse testing platform for pulse testing without manual parameter adjustment.

[0097] In another embodiment, this application provides a pulse test platform 10, which includes a power supply module 11, a drive module 12, a test module 13, an acquisition module 14, and a control module 15. The control module 15 is connected to the acquisition module 14, the power supply module 11, and the drive module 12, respectively. The drive module 12 and the power supply module 11 are connected to the test module 13, respectively. The test module 13 is also connected to the acquisition module 14 and the device under test 20, respectively.

[0098] In some embodiments, such as Figure 2 As shown, the pulse test platform 10 also includes a protection module 16, which is connected to the power supply module 11 and the test module 13 respectively.

[0099] The control module 15 is configured to send control signals to the drive module.

[0100] The drive module 12 is configured to receive control signals, generate pulse drive signals according to the control signals, and send the pulse drive signals to the test module and the power supply module.

[0101] The power supply module 11 is configured to receive pulse drive signals and provide corresponding test voltages to the device under test based on the pulse drive signals, so that the device under test is driven based on the test voltage.

[0102] Test module 13 is configured to receive pulse drive signals and perform pulse tests on the device under test based on the pulse drive signals.

[0103] The acquisition module 14 is configured to acquire waveform data from the pulse test and upload the waveform data to the control module.

[0104] The control module 15 is also configured to receive waveform data and generate a pulse test report based on the waveform data.

[0105] The protection module 16 is configured to receive the fault signal and, based on the fault signal, disconnect the power supply module and the test module to prevent the pulse test platform from starting.

[0106] The above-disclosed embodiments are merely preferred embodiments of this application and should not be construed as limiting the scope of this application. Therefore, any equivalent variations made in accordance with the claims of this application shall still fall within the scope of this application.

Claims

1. A pulse testing method, characterized in that, The invention is applied to a pulse test platform, which includes a power supply module, a drive module, a test module, an acquisition module, and a control module. The control module is connected to the acquisition module, the power supply module, and the drive module, respectively. The drive module and the power supply module are connected to the test module, respectively. The test module is also connected to the acquisition module and the device under test. The method includes: The control module sends control signals to the drive module; The drive module receives the control signal, generates a pulse drive signal according to the control signal, and sends the pulse drive signal to the test module and the power supply module; The power supply module receives the pulse drive signal and provides a corresponding test voltage to the device under test based on the pulse drive signal, so that the device under test is driven based on the test voltage; The test module receives the pulse drive signal and performs pulse testing on the device under test based on the pulse drive signal; The acquisition module acquires the waveform data of the pulse test and uploads the waveform data to the control module; The control module receives the waveform data and generates a pulse test report based on the waveform data.

2. The pulse testing method according to claim 1, characterized in that, Before the control module sends a control signal to the drive module, the method further includes: The control module performs self-test operations on the drive module, power supply module, test module and acquisition module; When the self-test meets the preset conditions, the control module determines that the pulse test platform is normal and generates the control signal; When the self-test fails to meet the preset conditions, the control module determines that the pulse test platform is faulty and triggers an audible and visual alarm.

3. The pulse testing method according to claim 2, characterized in that, The pulse test platform also includes a protection module, which is connected to both the power supply module and the test module. When the self-test meets preset conditions, the control module determines that the pulse test platform has a fault and triggers an audible and visual alarm, including: When the self-test fails to meet the preset conditions, the control module determines that the pulse test platform is faulty and generates a fault signal. The control module sends the fault signal to the protection module. The protection module receives the fault signal and, based on the fault signal, disconnects the power supply module and the test module to prevent the pulse test platform from starting. The control module records self-test failure information and triggers an audible and visual alarm.

4. The pulse testing method according to claim 1, characterized in that, The pulse test includes single-pulse testing and double-pulse testing; The control module sends control signals to the drive module, including: The control module sends control signals to the drive module according to the type of pulse test, including: When the pulse test is a single pulse test, the control module sends a first control signal to the drive module; When the pulse test is a double pulse test, the control module sends a second control signal to the drive module.

5. The pulse testing method according to claim 4, characterized in that, The drive module receives the control signal, generates a pulse drive signal according to the control signal, and sends the pulse drive signal to the test module and the power supply module, including: The drive module receives the control signal and configures single-pulse drive parameters when the control signal is the first control signal; and When the control signal is the second control signal, configure the dual-pulse drive parameters; The driving module sends the configured pulse driving parameters to the control module, and the control module receives the pulse driving parameters and makes a judgment. If the pulse drive parameters are correct, the control module sends a braking signal to the drive module, so that the drive module generates a pulse drive signal according to the braking signal. If the pulse drive parameters are incorrect, the control module sends a correction signal to the drive module to reconfigure the pulse drive parameters. The drive module sends the pulse drive signal to the test module and the power supply module.

6. The pulse testing method according to claim 1, characterized in that, The test module includes a load unit and a test unit. The load unit is connected to the test unit, and the test unit is also connected to the drive module, the power supply module, the acquisition module, and the device under test. The test module receives the pulse drive signal and performs pulse testing on the device under test based on the pulse drive signal, including: The test unit receives the pulse drive signal and sends the pulse drive signal to the device under test; The device under test receives the pulse drive signal and the test voltage, and performs pulse testing based on the pulse drive signal and the test voltage; The load unit maintains the stability of the pulse test of the device under test through the test unit.

7. The pulse testing method according to claim 6, characterized in that, The load unit includes an inductive load; The load unit maintains stable pulse testing of the device under test through the test unit, including: The control module sets the target current value and target inductance value according to the device under test, and sends the target current value and target inductance value to the load unit; The load unit adjusts the inductance value of the inductive load according to the target inductance value to initialize the inductive load; After the device under test (DUT) initiates a pulse test, the load unit maintains the loop current of the DUT within a preset current fluctuation range of the target current value.

8. The pulse testing method according to claim 6, characterized in that, The device under test receives the pulse drive signal and the test voltage, and performs pulse testing based on the pulse drive signal and the test voltage, including: The device under test receives the test voltage and starts based on the test voltage; The device under test receives the pulse drive signal and forms a current loop based on the pulse drive signal, so that the acquisition module can acquire waveform data of the current loop for pulse testing.

9. The pulse testing method according to claim 1, characterized in that, The acquisition module includes an oscilloscope and an acquisition unit. The acquisition unit is connected to the oscilloscope and the test module, respectively. The oscilloscope is also connected to the control module. The acquisition module acquires waveform data from the pulse test and uploads the waveform data to the control module, including: The acquisition unit operates at the test points of the test module to acquire waveform data of the pulse test; The acquisition unit uploads the acquired waveform data to the oscilloscope, and the oscilloscope receives and displays the waveform data. The oscilloscope uploads the waveform data to the control module.

10. A pulse testing platform, characterized in that, The pulse test platform includes a power supply module, a drive module, a test module, an acquisition module, and a control module. The control module is connected to the acquisition module, the power supply module, and the drive module. The drive module and the power supply module are connected to the test module. The test module is also connected to the acquisition module and the device under test. The control module is configured to send control signals to the drive module; The drive module is configured to receive the control signal, generate a pulse drive signal according to the control signal, and send the pulse drive signal to the test module and the power supply module; The power supply module is configured to receive the pulse drive signal and provide a corresponding test voltage to the device under test based on the pulse drive signal, so that the device under test is driven based on the test voltage; The test module is configured to receive the pulse drive signal and perform pulse testing on the device under test based on the pulse drive signal; The acquisition module is configured to acquire waveform data from the pulse test and upload the waveform data to the control module. The control module is also configured to receive the waveform data and generate a pulse test report based on the waveform data.

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