Non-contact optical angle measuring instrument and measuring method

Abstract

The invention provides a non-contact optical angle measuring instrument and a measuring method, and relates to the technical field of part measurement. The problem that due to the manufacturability of the surface of the part and the particularity of the measuring environment, an existing measuring device is difficult to measure the relative angle of the two key grooves of the part is solved. The device comprises a positioning mechanism, a clamping mechanism and a measuring mechanism which are mounted on the top surface of a base and are linearly arranged, the measuring mechanism comprises a grating code disc, a measuring microscope, a reading microscope, a microscope support and a second transverse moving mechanism which are all installed on the microscope support, a circle of scale values are arranged on the surface of the side, close to the reading microscope, of the grating code disc, and the measuring microscope is perpendicular to the axis of the grating code disc. The reading microscope is parallel to the axis of the grating code disc, a lens faces the scale values, and the microscope support can rotate circumferentially around the axis of the grating code disc. The device is mainly used for non-contact measurement of the relative angle between a pair of key grooves of a cylindrical workpiece.

Description

Technical Field

[0001] This invention relates to the field of parts measurement technology, and in particular to a non-contact optical angle measuring instrument and measurement method. Background Technology

[0002] A cylindrical precision component with an arc-shaped optical glass cover at the head has two keyways that are not on the same plane. Due to the manufacturability of the component's surface and the special nature of the measurement environment (the component's working environment contains flammable substances and is an explosive environment), contact measuring devices and electronic measuring devices cannot be used, making it difficult for existing measuring devices to measure the relative angle between the two keyways of the component. Summary of the Invention

[0003] To address the aforementioned technical problems, this invention proposes a non-contact optical angle measuring instrument and method. The measuring device utilizes a grating code disk (a precision grating ruler composed of precise equiangular radial lines and digital angle values, manufactured on optical glass using precision processes such as photolithography) and an optical microscope (a microscope with a reticle on its internal focal plane, engraved with scales, crosshairs, and digital grids, providing a reference scale superimposed on the sample image, allowing users to perform positioning, comparison, and measurement). The device performs non-contact measurement of the head of the part to be inspected using the optical microscope. The device is a purely mechanical structure without electronic equipment and can be used for measuring parts in explosive environments.

[0004] To achieve the above objectives, the present invention adopts the following technical solution: a non-contact optical angle measuring instrument, comprising a base, and a positioning mechanism, a clamping mechanism, and a measuring mechanism installed on the top surface of the base and arranged linearly in sequence along a first direction; The positioning mechanism includes an angular positioning pin and a positioning pin bracket. The angular positioning pin is mounted on the positioning pin bracket and can move laterally relative to the positioning pin bracket. The clamping mechanism includes a left jaw and a right jaw arranged opposite to each other, and a transverse movement mechanism. The transverse movement mechanism can drive the left jaw and the right jaw to move and adjust the distance between them. The clamping surfaces of the left jaw and the right jaw are each equipped with several clamping wheels. The measuring mechanism includes a grating code disk, a measuring microscope, a reading microscope, a microscope support, and a second lateral movement mechanism. The measuring microscope and the reading microscope are located on opposite sides of the axial direction of the grating code disk and are both mounted on the microscope support. The second lateral movement mechanism can drive the grating code disk and the microscope support to move along the first direction. The axis of the grating code disk is parallel to the first direction. The surface of the grating code disk near the reading microscope has a ring of scale values. The "0" scale line of the scale values ​​is at the same height as the center line of the angular positioning pin and is parallel to each other. The measuring microscope is perpendicular to the axis of the grating code disk, and the reading microscope is parallel to the axis of the grating code disk with its lens facing the scale values. The microscope support can rotate circumferentially around the axis of the grating code disk.

[0005] Furthermore, the positioning pin bracket is a Y-shaped bracket, with the angular positioning pin installed on a branch at the top of the Y-shaped bracket.

[0006] Furthermore, each of the left and right jaws has two clamping wheels installed on its clamping surface, arranged in a rectangular four-corner configuration.

[0007] Furthermore, the transverse movement mechanism includes a slide rail, a ball screw, and a screw seat. The slide rail and the screw seat are both mounted on the top surface of the base. The ball screw is mounted inside the screw seat. The slide rail is parallel to the ball screw. The left and right pawls are slidably connected to the slide rail and threadedly connected to the ball screw.

[0008] Furthermore, a handle is installed at one end of the ball screw, and a locking screw is provided on the screw seat.

[0009] Furthermore, the scale has a total of 1440 scale lines, the angle between adjacent scale lines is 0.25 degrees, and the reticle value of the reading microscope is 0.025 degrees.

[0010] Furthermore, the second transverse movement mechanism includes a second slide rail, a second ball screw, a second screw seat, and a slide block. The second slide rail and the second screw seat are both mounted on the top surface of the base. The second ball screw is mounted inside the second screw seat. The second slide rail is parallel to the second ball screw. The bottom of the slide block is slidably connected to the second slide rail and threadedly connected to the second ball screw. The grating code disk is mounted on the top surface of the slide block. The microscope support is connected to the slide block and can rotate relative to it.

[0011] Furthermore, a handle is installed at one end of the ball screw, and a locking screw is provided on the screw seat.

[0012] Furthermore, the microscope support is equipped with a coarse adjustment knob and a fine adjustment knob.

[0013] A non-contact optical measurement method for the relative angle between a pair of keyways on a cylindrical workpiece, using a non-contact optical angle measuring instrument, specifically includes the following steps: S1. Install the workpiece: Transport the workpiece to be measured between the left jaw and the right jaw, adjust the transverse movement mechanism to drive the left jaw and the right jaw to move closer, fix the workpiece to be measured on the clamping mechanism, and make the workpiece to be measured coaxial with the grating code disk. S2. Positioning the workpiece: Rotate the workpiece to be measured so that one keyway is aligned with the angular positioning pin, and insert the angular positioning pin into the keyway; S3. Measurement: Adjust the second transverse movement mechanism and rotate the microscope support so that the crosshairs on the measuring microscope reticle fall on the axis of the other keyway. S4. Reading: Use a reading microscope to read the scale value of the grating code disk, which is the relative angle between a pair of keyways on the cylindrical workpiece.

[0014] Compared with the prior art, the beneficial effects of the non-contact optical angle measuring instrument and method described in this invention are: 1. This invention comprises a positioning mechanism, a clamping mechanism, and a measuring mechanism to form a precision angle measuring instrument. It utilizes a grating code disk, a measuring microscope, and a reading microscope to form an optical microscope group, thereby achieving non-contact measurement. The reading resolution is 0.025 degrees, and the measurement results are highly accurate, with the error controllable within 0.05 degrees.

[0015] 2. This invention is a purely mechanical structure that does not contain any electronic equipment. It can be used for non-contact measurement of the relative angle between a pair of keyways on a cylindrical workpiece in an explosive environment. Attached Figure Description

[0016] The accompanying drawings, which form part of this invention, are used to provide a further understanding of the invention. The illustrative embodiments of the invention and their descriptions are used to explain the invention and do not constitute an undue limitation of the invention. In the drawings: Figure 1 This is a schematic diagram of the structure of a non-contact optical angle measuring instrument according to the present invention; Figure 2 This is a schematic diagram of the positioning mechanism described in this invention; Figure 3 This is a schematic diagram of the clamping mechanism described in the present invention. Figure 1 ; Figure 4 This is a schematic diagram of the clamping mechanism described in the present invention. Figure 2 ; Figure 5 This is a schematic diagram of the measuring mechanism described in this invention; Figure 6 This is a schematic diagram of the structure of the grating code disk described in this invention; Figure 7 This is a schematic diagram of the reticle grid values ​​of the measuring microscope described in this invention; Figure 8 This is a schematic diagram of the reticle grid values ​​of the reading microscope described in this invention; Figure 9 This is a schematic diagram of the microscope support structure described in this invention; In the diagram: 1-base; 2-positioning mechanism; 3-clamping mechanism; 4-measuring mechanism; 21 - Angular locating pin; 22 - Locating pin bracket; 31-Left jaw; 32-Right jaw; 33-Clamping wheel; 34-Slide rail one; 35-Ball screw one; 36-Screw seat one; 37-Handle one; 38-Locking screw one; 41-Raster code disk; 42-Measuring microscope; 43-Reading microscope; 44-Microscope stand; 45-Slide rail two; 46-Ball screw two; 47-Screw seat two; 48-Slide block; 49-Handle two; 50-Locking screw two; 441 - Coarse adjustment screw; 442 - Fine adjustment screw; A is the workpiece to be measured, B is the keyway of the workpiece to be measured, and C is the reticle value of the measuring microscope. Detailed Implementation

[0017] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. It should be noted that, unless otherwise specified, the embodiments and features in the embodiments of the present invention can be combined with each other, and the described embodiments are only some embodiments of the present invention, not all embodiments.

[0018] I. Detailed Implementation Method 1, see [link / reference] Figure 1-9 This embodiment describes a non-contact optical angle measuring instrument, which includes a base 1 and a positioning mechanism 2, a clamping mechanism 3, and a measuring mechanism 4, which are installed on the top surface of the base 1 and arranged linearly along a first direction. The base 1 is rectangular. The positioning mechanism 2 includes an angular positioning pin 21 and a positioning pin bracket 22. The angular positioning pin 21 is mounted on the positioning pin bracket 22, and the positioning pin bracket 22 is mounted on the top surface of the base 1. The angular positioning pin 21 is arranged laterally and can move laterally relative to the positioning pin bracket 22 in a direction perpendicular to the axis of the workpiece A to be measured. The clamping mechanism 3 includes a left jaw 31 and a right jaw 32 arranged opposite to each other, and a transverse movement mechanism 1. The transverse movement mechanism 1 is installed on the top surface of the base 1. The transverse movement mechanism 1 can drive the left jaw 31 and the right jaw 32 to move in a direction perpendicular to the axis of the workpiece A to be measured, and adjust the distance between them. The clamping surfaces of the left jaw 31 and the right jaw 32 are each equipped with a number of clamping wheels 33. The measuring mechanism 4 includes a grating code disk 41, a measuring microscope 42, a reading microscope 43, a microscope support 44, and a second lateral movement mechanism. The measuring microscope 42 and the reading microscope 43 are located on opposite sides of the axial direction of the grating code disk 41 and are both mounted on the microscope support 44. The second lateral movement mechanism can drive the grating code disk 41 and the microscope support 44 to move along the first direction. The axis of the grating code disk 41 is parallel to the first direction. The surface of the grating code disk 41 near the reading microscope 43 has a ring of scale values. The "0" scale line of the scale values ​​is at the same height as the center line of the angular positioning pin 21 and is parallel to each other. The measuring microscope 42 is perpendicular to the axis of the grating code disk 41, and the reading microscope 43 is parallel to the axis of the grating code disk 41 with its lens facing the scale values. The microscope support 44 can rotate circumferentially around the axis of the grating code disk 41. Both the measuring microscope 42 and the reading microscope 43 are optical microscopes.

[0019] Preferably, the positioning pin bracket 22 is a Y-shaped bracket, the opening of the Y-shaped bracket is used to accommodate the workpiece A to be measured, the angular positioning pin 21 is installed on a branch at the top of the Y-shaped bracket, and a protective plate is installed on the side of the opening of the Y-shaped bracket away from the workpiece A to be measured, which serves to protect the workpiece from scratches and bumps.

[0020] Preferably, the clamping surfaces of the left jaw 31 and the right jaw 32 are each equipped with two clamping wheels 33, for a total of four, and the clamping wheels 33 are arranged in a rectangular shape at the four corners.

[0021] Preferably, the transverse movement mechanism includes a slide rail 34, a ball screw 35, and a screw seat 36. The slide rail 34 and the screw seat 36 are both mounted on the top surface of the base 1. The ball screw 35 is mounted inside the screw seat 36. The slide rail 34 is parallel to the ball screw 35. The left pawl 31 and the right pawl 32 are both slidably connected to the slide rail 34 and threadedly connected to the ball screw 35.

[0022] Preferably, a handle 37 is installed at one end of the ball screw 35, and a locking screw 38 is provided on the screw seat 36.

[0023] See attached document Figure 6-8 Preferably, the scale value has a total of 1440 scale lines, the angle between adjacent scale lines is 0.25 degrees, and the reticle value of the reading microscope 43 is 0.025 degrees.

[0024] Preferably, the second transverse mechanism includes a second slide rail 45, a second ball screw 46, a second screw seat 47, and a slide block 48. The second slide rail 45 and the second screw seat 47 are both mounted on the top surface of the base 1. The second ball screw 46 is mounted inside the second screw seat 47. The second slide rail 45 is parallel to the second ball screw 46. The bottom of the slide block 48 is slidably connected to the second slide rail 45 and threadedly connected to the second ball screw 46. The grating code disk 41 is mounted on the top surface of the slide block 48. The microscope support 44 is connected to the slide block 48 and can rotate circumferentially around the axis of the grating code disk 41 relative to the slide block 48.

[0025] The microscope support 44 is equipped with a coarse adjustment screw 441 and a fine adjustment screw 442. The coarse adjustment refers to the rapid rotation around a fixed axis at any angle to adjust the resolution to 1 degree. The fine adjustment is achieved by using a worm gear assembly with a transmission speed ratio of 1:100. When the worm rotates 1 degree, the worm gear rotates 0.01 degrees, adjusting the resolution to 0.01 degrees.

[0026] A non-contact optical measurement method for the relative angle between a pair of keyways on a cylindrical workpiece, using a non-contact optical angle measuring instrument, specifically includes the following steps: S1. Install the workpiece: Transport the workpiece A to be measured between the left jaw 31 and the right jaw 32, adjust the transverse movement mechanism to drive the left jaw 31 and the right jaw 32 to move closer, fix the workpiece A to be measured on the clamping mechanism 3, so that the workpiece A to be measured is coaxial with the grating code disk 41, and complete the coaxial positioning of the workpiece A to be measured and the measurement reference. S2. Positioning the workpiece: Rotate the workpiece A to be measured so that a keyway is aligned with the angular positioning pin 21. Insert the angular positioning pin 21 into the keyway to complete the angular positioning of the workpiece A to be measured. S3. Measurement: Adjust the transverse movement mechanism 2 and rotate the microscope support 44 so that the crosshair on the reticle of the measuring microscope 42 falls on the axis of another keyway, that is, on the center line of the keyway. S4. Reading: Use the reading microscope 43 to read the scale value of the grating code disk 41, which is the relative angle between a pair of keyways on the cylindrical workpiece.

[0027] The embodiments of the present invention disclosed above are merely illustrative of the invention. These embodiments do not exhaustively describe all details, nor do they limit the invention to the specific implementations described. Many modifications and variations can be made based on the content of this specification. This specification selects and specifically describes these embodiments to better explain the principles and practical applications of the invention, thereby enabling those skilled in the art to better understand and utilize the invention.

Claims

1. A non-contact optical angle measuring instrument, characterized in that, It includes a base (1), and a positioning mechanism (2), a clamping mechanism (3) and a measuring mechanism (4) installed on the top surface of the base (1) and arranged linearly in sequence along a first direction; The positioning mechanism (2) includes an angular positioning pin (21) and a positioning pin bracket (22). The angular positioning pin (21) is mounted on the positioning pin bracket (22) and can move laterally relative to the positioning pin bracket (22). The clamping mechanism (3) includes a left jaw (31) and a right jaw (32) arranged opposite to each other, and a transverse movement mechanism. The transverse movement mechanism can drive the left jaw (31) and the right jaw (32) to move and adjust the distance between them. The clamping surfaces of the left jaw (31) and the right jaw (32) are each equipped with a number of clamping wheels (33). The measuring mechanism (4) includes a grating code disk (41), a measuring microscope (42), a reading microscope (43), a microscope support (44), and a second transverse movement mechanism. The measuring microscope (42) and the reading microscope (43) are located on opposite sides of the axial direction of the grating code disk (41) and are both mounted on the microscope support (44). The second transverse movement mechanism can drive the grating code disk (41) and the microscope support (44) to move along the first direction. The axis of the grating code disk (41) is parallel to the first direction. The surface of the grating code disk (41) near the reading microscope (43) is provided with a ring of scale values. The "0" scale line of the scale value is at the same height as the center line of the angular positioning pin (21) and is parallel to each other. The measuring microscope (42) is perpendicular to the axis of the grating code disk (41). The reading microscope (43) is parallel to the axis of the grating code disk (41) and its lens faces the scale value. The microscope support (44) can rotate circumferentially around the axis of the grating code disk (41).

2. The non-contact optical angle measuring instrument according to claim 1, characterized in that, The positioning pin bracket (22) is a Y-shaped bracket, and the angular positioning pin (21) is installed on a branch at the top of the Y-shaped bracket.

3. The non-contact optical angle measuring instrument according to claim 1, characterized in that, The left jaw (31) and right jaw (32) are each equipped with two clamping wheels (33), which are arranged in a rectangular four-corner arrangement.

4. The non-contact optical angle measuring instrument according to claim 1, characterized in that, The transverse mechanism includes a slide rail (34), a ball screw (35), and a screw seat (36). The slide rail (34) and the screw seat (36) are both mounted on the top surface of the base (1). The ball screw (35) is mounted inside the screw seat (36). The slide rail (34) is parallel to the ball screw (35). The left pawl (31) and the right pawl (32) are slidably connected to the slide rail (34) and threadedly connected to the ball screw (35).

5. A non-contact optical angle measuring instrument according to claim 4, characterized in that, The ball screw (35) is equipped with a handle (37) at one end, and the screw seat (36) is provided with a locking screw (38).

6. A non-contact optical angle measuring instrument according to claim 1, characterized in that, The scale has 1440 scale lines, the angle between adjacent scale lines is 0.25 degrees, and the reticle value of the reading microscope (43) is 0.025 degrees.

7. A non-contact optical angle measuring instrument according to claim 1, characterized in that, The second transverse mechanism includes a second slide rail (45), a second ball screw (46), a second screw seat (47), and a slide block (48). The second slide rail (45) and the second screw seat (47) are both installed on the top surface of the base (1). The second ball screw (46) is installed inside the second screw seat (47). The second slide rail (45) is parallel to the second ball screw (46). The bottom of the slide block (48) is slidably connected to the second slide rail (45) and threadedly connected to the second ball screw (46). The grating code disk (41) is installed on the top surface of the slide block (48). The microscope support (44) is connected to the slide block (48) and can rotate relative to it.

8. A non-contact optical angle measuring instrument according to claim 7, characterized in that, The ball screw 2 (46) is equipped with a handle 2 (49) at one end, and the screw seat 2 (47) is provided with a locking screw 2 (50).

9. A non-contact optical angle measuring instrument according to claim 1, characterized in that, The microscope stand (44) is equipped with a coarse adjustment screw (441) and a fine adjustment screw (442).

10. A non-contact optical measurement method for the relative angle between a pair of keyways on a cylindrical workpiece, characterized in that, Using a non-contact optical angle measuring instrument as described in any one of claims 1-9 specifically includes the following steps: S1. Install the workpiece: Transport the workpiece (A) to be measured between the left jaw (31) and the right jaw (32), adjust the transverse movement mechanism to drive the left jaw (31) and the right jaw (32) to move closer, fix the workpiece (A) to be measured on the clamping mechanism (3), and make the workpiece (A) to be measured coaxial with the grating code disk (41). S2. Positioning the workpiece: Rotate the workpiece to be measured (A) so that a keyway is aligned with the angular positioning pin (21), and insert the angular positioning pin (21) into the keyway; S3. Measurement: Adjust the transverse movement mechanism two and rotate the microscope support (44) so ​​that the crosshairs on the measuring microscope (42) fall on the axis of another keyway. S4. Reading: Use the reading microscope (43) to read the scale value of the grating code disk (41), which is the relative angle between a pair of keyways of the cylindrical workpiece.

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