Pulse interference source test system

Abstract

The invention discloses a pulse interference source testing system which comprises a tested unit, a pulse voltage applying module, a constant current applying module, a data acquisition and operation module and a central control module. The tested unit simulates a device structure comprising an interference source circuit and an interfered circuit; the pulse voltage applying module is used for applying adjustable pulse voltage to the interference source circuit; the constant current applying module is used for providing constant weak current for the disturbed circuit; the data acquisition operation module acquires a current signal in a disturbed circuit in real time; and the central control module coordinates the work of each module and executes a two-stage test process. The method can quantitatively evaluate the interference degree of the high-voltage pulse signal to the weak current signal, and is suitable for electromagnetic compatibility verification of safety equipment such as an electrical penetration assembly of a nuclear power station.

Description

Technical Field

[0001] This invention relates to the field of electromagnetic compatibility testing technology, and in particular to a pulse interference source testing system. Background Technology

[0002] Advanced electrical penetrations are classified as Class 1E nuclear safety equipment and are part of the containment pressure boundary. Under normal operating conditions and design basis accident conditions, they must ensure the integrity of the containment pressure boundary and prevent the leakage of radioactive fission products. When the RPN (Reactive Power Response) system and RIC (Reactive Energy Response) system loops are placed within the same penetration, signal interference issues may arise. In some harsh industrial environments, electrical penetrations, as critical equipment within the containment pressure boundary, may simultaneously house multiple signal loops, such as reactor power measurement system loops and core measurement system loops. High-voltage pulse signals in these loops may cause electromagnetic interference to nearby weak current signals, affecting normal equipment operation and even threatening nuclear safety.

[0003] Currently, there is a lack of a systematic and quantifiable test scheme for assessing the interference of pulse voltage on weak current signals in such specific scenarios. Existing electromagnetic compatibility (EMC) test methods are often designed for general environments and cannot accurately simulate the internal structure, spatial layout, and signal characteristics of penetrating components, resulting in weak guidance for test results. Therefore, there is an urgent need to develop a dedicated test system and method that is highly targeted, has standardized operation, and provides reliable results. Summary of the Invention

[0004] To address the aforementioned technical issues, a pulse interference source testing system is provided.

[0005] To achieve the above objectives, the present invention discloses a pulse interference source testing system, including... The unit under test is used to simulate the structure of a device containing both interference source circuitry and interference-affected circuitry. A pulse voltage application module, connected to the interference source circuit, is used to apply an adjustable pulse voltage signal; A constant current application module, connected to the disturbed circuit, is used to provide a constant, weak current signal; A data acquisition and processing module is connected to the disturbed circuit and is used to acquire and record changes in the current signal in the disturbed circuit in real time. The central control module is connected to the pulse voltage application module, the constant current application module, and the data acquisition and processing module, respectively, and is used to control the test process, parameter settings, and data recording.

[0006] Furthermore, the unit under test is a test device simulating an electrical penetration structure, including a shielded housing with a feedthrough component installed, a junction box simulation device, and connecting cables.

[0007] Furthermore, the output voltage range of the pulse voltage application module is 0V to 1000V, and the voltage change rate is not less than 2V / 10ms.

[0008] Furthermore, the current signal output by the constant current application module is a nanoampere-level current, with a current range of 0.1nA to 4nA.

[0009] Furthermore, the system also includes a metal shielded room for housing the unit under test to isolate it from external electromagnetic interference.

[0010] Furthermore, the data acquisition and processing module includes a high-precision current sensor, a voltage sensor, and a data logger.

[0011] A method for testing the interference of a pulse interference source test system on a weak current signal includes the following steps: Phase 1 testing: S1. Apply a constant weak current to the disturbed circuit through the constant current application module and stabilize it for a preset time; S2. Apply a pulse voltage, which gradually increases from the starting voltage to the target voltage, to the interference source circuit through the pulse voltage application module, and record the fluctuation of the current signal in the disturbed circuit through the data acquisition and calculation module during this process. Phase Two Testing: S3. Apply a constant high voltage to the interference source circuit through the pulse voltage application module; S4. Apply a constant weak current to the disturbed circuit through the constant current application module and stabilize it for a preset time; S5. The voltage of the interference source circuit is gradually reduced from the constant high voltage by the pulse voltage application module, and the fluctuation of the current signal in the disturbed circuit is recorded by the data acquisition and calculation module during this process.

[0012] Furthermore, in the first stage of testing, the pulse voltage was increased from 0V to 900V, with a boost rate of no less than 2V / 10ms.

[0013] Furthermore, in the second stage of testing, the constant high voltage is 1000V, and the voltage drop rate is higher than -2V / 10ms.

[0014] Furthermore, the stabilization preset time is 1 minute.

[0015] Compared with existing technologies, the beneficial effects of this invention are as follows: the system is built in close conjunction with the actual structure of specific equipment such as electrical penetrations, the test scenario is highly realistic, and by recording the precise fluctuation curve of the disturbed current, the degree of interference can be quantitatively analyzed and compared. Key parameters such as test voltage, current, rate of change, and settling time can be precisely controlled, ensuring the consistency and repeatability of the test. The test results can be directly used to evaluate the effectiveness of different shielding schemes (such as adding a shielding layer, adding metal flexible conduit to the cable, etc.), providing data support for product optimization design. Attached Figure Description

[0016] The present invention will now be described in further detail with reference to the accompanying drawings and specific embodiments.

[0017] Figure 1 This is a test installation diagram of Scheme 1 (no additional shielding, no flexible tubing for the outer cable) in an embodiment of the present invention.

[0018] Figure 2 This is a test installation diagram of Scheme 2 (no additional shielding, the cable outside the shell has a flexible tube) in an embodiment of the present invention.

[0019] Figure 3 This is a test installation diagram of Scheme 3 (with additional shielding, no flexible tubing for the outer cable) in an embodiment of the present invention.

[0020] Figure 4 This is a test installation diagram of Scheme 4 (with additional shielding, and the outer cable has a flexible tube) in the embodiment of the present invention.

[0021] Figure 5 This is a schematic diagram of the inner and outer ring holes in the shielding shell of the present invention. Detailed Implementation

[0022] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the protection scope of the present invention.

[0023] In one embodiment of the present invention, the system and method of the present invention are used to test the anti-interference capability between the RPN system (interference source) and the RIC system (interference source) of a certain type of advanced electrical penetration component.

[0024] The unit under test uses an electrical penetration test piece manufactured by Jiangsu Huaguang, which is equipped with an RIC feedthrough assembly (simulating the disturbed circuit, using AWG16 wire) and an RPN feedthrough assembly (simulating the interference source circuit, using 50Ω coaxial cable). The two are installed in adjacent channels 50mm apart. Depending on the test plan, options include whether to add an EMC metal flexible conduit to the cable outside the RIC shell, and whether to add an additional metal shielding layer between the two feedthrough assemblies, forming a total of four combination schemes. The entire test is carried out in a metal shielded room, and all equipment is connected to a common ground to eliminate external interference.

[0025] The pulse voltage application module uses a programmable DC high voltage source, which is connected to both ends of the RPN feedthrough component.

[0026] The constant current application module uses a high-stability nanoampere current source and is connected to the RIC feedthrough component.

[0027] The data acquisition and processing module uses a high-precision current probe and a data acquisition card, which are connected to the RIC circuit to acquire current signals in real time.

[0028] The central control module uses an industrial computer and customized control software to integrate and control all the above-mentioned equipment.

[0029] Phase 1: S1, Control the constant current application module to output a constant current of 4nA to the RIC feedthrough component and stabilize it for 1 minute; S2, Control the pulse voltage application module to apply a voltage starting from 0V to 900V to the RPN coaxial feedthrough component at a rate of not less than 2V / 10ms. During this process, the data acquisition and processing module continuously records the current fluctuation curve in the RIC circuit. Phase 2: S3, Control the pulse voltage application module to output and maintain a 1000V DC voltage to the RPN feedthrough component. S4, Control the constant current application module to output a 4nA constant current to the RIC feedthrough component and stabilize for 1 minute. S5, Control the pulse voltage application module to reduce the RPN voltage from 1000V to 0V at a rate not exceeding -2V / 10ms. During this process, the data acquisition and processing module continuously records the current fluctuation curve in the RIC circuit.

[0030] The flexible hose can be made of plastic or metal. In this embodiment, a metal flexible hose is used for testing, and four anti-interference test schemes are conducted, one with a shielded structure and the other without: Option 1 Without additional shielding (RIC outer cable without additional metal flexible conduit), such as Figure 1As shown, the RPN feedthrough assembly and the RIC feedthrough assembly are installed in two feedthrough channels 50mm apart. The RIC feedthrough assembly leads inside the containment of the junction box are fitted with EMC metal flexible tubing (the inner layer is a stainless steel wound metal flexible tubing, and the outer layer is a stainless steel braided layer). The cable that connects to the RIC feedthrough assembly inside the containment is fitted with EMC metal flexible tubing and extends to the output end of the current signal transmitter (the inner side of the RIC feedthrough assembly is connected to the output end of the current signal generator, and the outer side is connected to the receiving end of the current signal). A 50Ω coaxial cable is used to terminate both ends of the RPN feedthrough assembly. One end of the coaxial cable is terminated with the RPN feedthrough using a coaxial connector, and the other end is connected to the voltage output device.

[0031] Option 2 The scheme without accessory shielding structure (adding metal flexible tubing to the RIC housing cable) involves installing the RPN feeder assembly and the RIC feeder assembly in two feeder channels 50mm apart. EMC metal flexible tubing (with an inner layer of stainless steel strip wound and an outer layer of stainless steel wire braid) is installed at both ends of the RIC feeder assembly lead wire inside the junction box. The cable connecting to the RIC feeder assembly inside the containment is fitted with EMC metal flexible tubing and extends to the output end of the current signal transmitter (the inner side of the RIC feeder assembly housing connects to the output end of the current signal generator, and the outer side connects to the current signal receiver). A 50Ω coaxial cable is used to terminate both ends of the RPN feeder assembly. One end of the coaxial cable is terminated with the RPN feeder using a coaxial connector, and the other end is connected to the voltage output device.

[0032] Option 3 The scheme with additional shielding (without adding a metal flexible conduit to the RIC outer cable) installs the RPN and RIC feeder components in the same way as Scheme 1, except that an additional shielding layer is added between the two feeder components to isolate the RPN and RIC feeder components.

[0033] Option 4 The solution with accessory shielding structure (adding a metal flexible tube to the RIC shell cable) has the same installation method for RPN and RIC feeder components as in Solution 2, except that an additional metal shielding layer is added between the two feeder components to isolate the RPN and RIC feeder components.

[0034] By comparing and analyzing two sets of current fluctuation curves recorded under four different shielding schemes, it was found that the smaller the fluctuation amplitude, the stronger the ability of the shielding structure to suppress interference under that scheme. This provides direct and objective experimental basis for determining the optimal shielding design scheme (whether an additional shielding layer is needed, or whether a metal flexible tube is needed for the outer cable).

[0035] The above description is merely a preferred embodiment of the present invention and does not limit the patent scope of the present invention. Any equivalent structural or procedural transformations made based on the concept of the present invention and the description and drawings, or direct / indirect applications to other related technical fields, should be included within the protection scope of the present invention.

[0036] Several points need to be clarified: First, in the description of this application, it should be noted that, unless otherwise specified and limited, the terms "installation," "connection," and "linkage" should be interpreted broadly, and can refer to mechanical or electrical connections, or internal connections between two components, or direct connections. Terms such as "upper," "lower," "left," and "right" are only used to indicate relative positional relationships, and the relative positional relationships may change when the absolute position of the described objects changes. Second, in this document, relational terms such as "first" and "second" are only used to distinguish one entity from another entity, and do not necessarily require or imply any such actual relationship or order between these entities.

[0037] The examples above are merely illustrative of the present invention and do not constitute a limitation on the scope of protection of the present invention. All designs that are the same as or similar to the present invention are within the scope of protection of the present invention.

Claims

1. A pulse interference source testing system, characterized in that, include: The unit under test is used to simulate the structure of a device containing both interference source circuitry and interference-affected circuitry. A pulse voltage application module, connected to the interference source circuit, is used to apply an adjustable pulse voltage signal; A constant current application module, connected to the disturbed circuit, is used to provide a constant, weak current signal; A data acquisition and processing module is connected to the disturbed circuit and is used to acquire and record changes in the current signal in the disturbed circuit in real time. The central control module is connected to the pulse voltage application module, the constant current application module, and the data acquisition and processing module, respectively, and is used to control the test process, parameter settings, and data recording.

2. The pulse interference source testing system according to claim 1, characterized in that, The unit under test is a test device that simulates an electrical penetration structure, including a shielded housing with a feedthrough component, a junction box simulation device, and connecting cables.

3. The pulse interference source testing system according to claim 1, characterized in that, The output voltage range of the pulse voltage application module is 0V to 1000V, and the voltage change rate is not less than 2V / 10ms.

4. The pulse interference source testing system according to claim 1, characterized in that, The current signal output by the constant current application module is a nanoampere level current, with a current range of 0.1nA to 4nA.

5. The pulse interference source testing system according to claim 1, characterized in that, The system also includes a metal shielded room for placing the unit under test to isolate it from external electromagnetic interference.

6. The pulse interference source testing system according to claim 1, characterized in that, The data acquisition and processing module includes a high-precision current sensor, a voltage sensor, and a data logger.

7. A method for testing the interference of a weak current signal using a pulse voltage from a system as described in any one of claims 1-6, characterized in that, Includes the following steps: Phase 1 testing: S1. Apply a constant weak current to the disturbed circuit through the constant current application module and stabilize it for a preset time; S2. Apply a pulse voltage, which gradually increases from the starting voltage to the target voltage, to the interference source circuit through the pulse voltage application module, and record the fluctuation of the current signal in the disturbed circuit through the data acquisition and calculation module during this process. Phase Two Testing: S3. Apply a constant high voltage to the interference source circuit through the pulse voltage application module; S4. Apply a constant weak current to the disturbed circuit through the constant current application module and stabilize it for a preset time; S5. The voltage of the interference source circuit is gradually reduced from the constant high voltage by the pulse voltage application module, and the fluctuation of the current signal in the disturbed circuit is recorded by the data acquisition and calculation module during this process.

8. The test method according to claim 7, characterized in that, In the first stage of testing, the pulse voltage was increased from 0V to 900V, with a boost rate of no less than 2V / 10ms.

9. The test method according to claim 7, characterized in that, In the second stage of testing, the constant high voltage was 1000V, and the voltage drop rate was higher than -2V / 10ms.

10. The test method according to claim 7, characterized in that, The preset stabilization time is 1 minute.

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