LED vehicle lamp test method with line sequence identification and tester

Abstract

The invention relates to an LED vehicle lamp test method with line sequence identification. The method comprises the following steps: S1, constructing a test link; s2, setting standard parameters; s3, connection identification: carrying out correlation induction detection on a lead of the to-be-tested vehicle lamp and a wiring port of the tester; s4, electrical testing: testing the working current of the to-be-tested vehicle lamp under the set voltage, and comparing the working current with the standard parameters; s5, line sequence identification: detecting and identifying the lead of the vehicle lamp to be detected through a visual camera or a color sensor; and S6, standard parameter adjustment: averaging the test data of a plurality of non-defective vehicle lamps, defining the average value as a new standard parameter, and then repeating the steps S3-S6. According to the scheme of the invention, the three steps of connection identification, electrical test and line sequence identification are cooperatively used to realize the quality detection of the LED vehicle lamp. The three parts cooperate with each other to detect errors which cannot be detected by a single electrical property test, so that defective parts can be detected more accurately.

Description

Technical Field

[0001] This application relates to the field of vehicle headlight testing, and in particular to a test method and tester for LED vehicle headlights with line sequence recognition. Background Technology

[0002] LED lights, short for light-emitting diode lights, are semiconductor solid-state light-emitting devices that directly convert electrical energy into light energy. LED lights have advantages such as high efficiency and energy saving, ultra-long lifespan, extremely fast response, and flexible design, so they can be used as automotive lights. There are many types of LED automotive lights, and many reasons often lead to abnormalities in LED automotive light components during the production process. For example, abnormal wiring sequence, damage to certain components on the PCB board causing short circuits or open circuits in the entire circuit, or abnormalities such as certain connectors not being properly inserted. Current testing instruments can usually only perform specific tests for one type of abnormality, such as conducting electrical tests by powering on the LED automotive light to form a circuit, or visually inspecting the LED automotive light on-site to check for incorrect wiring sequence.

[0003] Chinese patent CN212932909U discloses a continuous current and voltage monitoring device for testing LED vehicle lights. This monitoring device is a typical single anomaly detection device, which can only detect LED vehicle lights through current and voltage. This detection method has the following problems:

[0004] 1. Incorrect wiring sequence, such as connecting the low beam to the high beam circuit or the high beam to the low beam circuit, will affect the terminal function. However, since the low beam and high beam have the same operating voltage, they can still obtain normal current when being detected.

[0005] 2. Incorrect wiring sequence. For example, the low beam headlight is connected to the low beam headlight circuit through the high beam headlight circuit, and the high beam headlight is connected to the high beam headlight circuit through the low beam headlight circuit. This will not affect the terminal function, and normal current can still be obtained when tested. However, due to the wiring sequence requirements and subsequent maintenance requirements, this product is considered a defective product.

[0006] 3. Even if the wiring sequence is incorrect or the soldering is wrong, there is still a chance that normal current can be obtained during the inspection. Summary of the Invention

[0007] To ensure the product yield of LED vehicle lights, this application provides an LED vehicle light testing method and tester with line sequence recognition.

[0008] This application provides a testing method and testing instrument for LED vehicle lights with line sequence recognition, which adopts the following technical solution:

[0009] A testing method for LED vehicle lights with line sequence recognition includes the following steps:

[0010] S1. Assemble the test link by connecting the programmable power supply, tester and the vehicle lamp under test in sequence to form a circuit;

[0011] S2. Standard parameter setting: The tester tests qualified samples and processes the test data to set the standard parameters.

[0012] S3. Connection identification: Perform beam induction detection on the lead wires of the vehicle headlight under test and the connection port of the tester.

[0013] S4. Electrical test: Test the operating current of the vehicle lamp under test under a set voltage and compare it with the standard parameters.

[0014] S5. Wire sequence recognition: The wires of the vehicle headlight under test are detected and identified using a vision camera or color sensor.

[0015] S6. Standard parameter adjustment: Take the average value of the test data of several good quality car lights and define this average value as the new standard parameter. Then repeat steps S2-S6.

[0016] By adopting the above technical solution, the three steps of connection identification, electrical testing and wiring sequence identification work together to achieve the quality inspection of LED vehicle lights. The three complement each other, making the inspection system more complete, thereby improving the inspection efficiency of LED vehicle lights and reducing labor costs.

[0017] Optionally, in step S1, two 0-80V programmable power supplies are configured. The first programmable power supply is used to provide continuous power to the vehicle lamp under test, and the second programmable power supply is used to output voltage signals to the vehicle lamp under test. The normal operating voltage of the vehicle lamp under test is aV-bV. Then, the second programmable power supply has a first output voltage aV and a second output voltage bV. The second programmable power supply will perform cyclic testing on the vehicle lamp under test with aV and bV.

[0018] By adopting the above technical solution, the programmable power supply can provide a stable voltage, which can provide a continuous power supply for the LED vehicle lights, provide a detection voltage, and provide a set voltage to perform comprehensive testing on the LED vehicle lights, ensuring that the LED vehicle lights can operate stably under various conditions.

[0019] Optionally, in step S1, the vehicle lamp under test is an integration of multiple lamps, and the tester is used to simultaneously test all lamps and display the test results at the same time.

[0020] By adopting the above technical solution, the vehicle lights under test include, but are not limited to, front position lights, low beam lights and high beam lights. All the light circuits are bundled together and can be plugged into the tester at the same time. The tester can test all the lights independently at the same time and display the test results separately, thus improving the testing efficiency.

[0021] Optionally, in step S2, the standard parameter is set as the current parameter. After the vehicle lamp under test is energized with aV and bV, its current value is detected and used as the standard parameter. The subsequent tester will use the set error value as the error range to test the subsequent vehicle lamps under test.

[0022] By adopting the above technical solution, the setting of standard parameters provides a benchmark for subsequent judgment. Each voltage has a corresponding current value. The tester will combine the current value and error range to test the subsequent LED vehicle lights. This standard parameter setting method is more reasonable, thus making the entire testing procedure more reasonable.

[0023] Optionally, in step S3, the beam induction detection is achieved through a transmitter and a receiver, which are positioned opposite each other inside the wiring port of the tester. When the lead wire of the vehicle light under test is fully inserted into the wiring port, the receiver cannot receive the transmitted signal.

[0024] By adopting the above technical solution, through-beam induction detection can effectively eliminate current changes caused by poor contact, providing a basic guarantee for subsequent electrical testing. Furthermore, the transmitter and receiver have a simple structure and high practicality.

[0025] Optionally, in step S4, the vehicle lamp under test is tested 50 times in turn at aV and bV, and then the test current is compared with the standard parameters to determine the quality of the vehicle lamp under test.

[0026] By adopting the above technical solution, the vehicle headlight under test is tested with two different voltages. After 50 tests with each voltage, the test is switched and repeated cyclically to maximize the effectiveness of the test. Optionally, in step S5, the vision camera takes a picture of the connector and reads the image, then compares it with the stored image of the reference component.

[0027] By adopting the above technical solution, the vision camera can determine the color of the wire by comparing it with the stored image of the reference component, and thus determine whether the connection is incorrect.

[0028] Optionally, the color sensor includes a transmitter and a receiver. The transmitter emits a beam of white light onto the vehicle headlight under test. The light reflected from the headlight enters the receiver, which performs quantization processing and compares it with a set value.

[0029] By adopting the above technical solution, the quantitative processing results make the detection more accurate and can effectively ensure that the wiring of LED vehicle lights is correct.

[0030] Optionally, each of steps S2-S6 includes an overcurrent protection circuit based on a test method. This circuit is used to protect the product under test when the current is overloaded. The circuit uses a series linear regulated power supply with a P-channel MOSFET. The circuit includes a power supply, a reference voltage source, a P-channel MOSFET, a gate pull-up resistor, a gate protection Zener diode ZD1, an output filter capacitor C2, a current sampling resistor Rs, a current feedback resistor R7, an output voltage divider network, an operational amplifier U1, an op-amp power supply decoupling capacitor C3, and a frequency compensation capacitor Comp.

[0031] By adopting the above technical solution, when a defective product is detected, there may be a situation where the current is too high and the product is damaged. The protection circuit can quickly and effectively adjust the current to protect the product.

[0032] A testing instrument includes: a working platform; a human-machine interface module, including a display screen and buttons; a main control module, including a microcontroller, a test screen, a detection circuit, and an alarm; an information acquisition module, including a vision camera or color sensor; and a mechanical connection module, including a physical interface for connecting a vehicle lamp under test; wherein the human-machine interface module, the main control module, the information acquisition module, and the mechanical connection module are all mounted on the working platform, the main control module and the human-machine interface module are connected, and the information acquisition module and the mechanical connection module are both connected to the main control module; the buttons include those for testing with multiple voltages; the test screen is used to simultaneously display multiple test results; the information acquisition module also includes a spotlight, and when an abnormal test result is found, the microcontroller controls the spotlight to adjust its brightness and then retests; the alarm sounds when a defective part is detected; and the microcontroller records and uploads the total number of tests and defect data.

[0033] By adopting the above technical solution, the tester can perform cyclic testing with multiple voltages to achieve comprehensive testing of the vehicle lights under test. The microcontroller can synchronously output all test values ​​of the vehicle lights under test and has an alarm function. It can also upload test data to investigate the defect rate.

[0034] In summary, this application includes at least one of the following beneficial technical effects:

[0035] 1. The three steps of connection identification, electrical testing and wiring sequence identification work together to achieve the quality inspection of LED vehicle lights. The three steps work together to detect errors that cannot be detected by a single electrical test, thereby preventing defective parts from entering the market.

[0036] 2. The tester is easy to operate and users can easily learn it, which can directly reduce labor costs. In addition, the tester's test results are more accurate and stable, and there will be no errors caused by human error. At the same time, the tester's test method is more efficient.

[0037] 3. The tester has measurement and alarm functions, can record long-term test data, perform data verification, and optimize the testing process through data to obtain higher product yield. Attached Figure Description

[0038] Figure 1 This is a schematic diagram of the tester's structure.

[0039] Explanation of reference numerals in the attached diagram: 1. Working platform; 2. Display screen; 3. Test screen; 4. Vision camera; 5. Physical interface. Detailed Implementation

[0040] The present application will be further described in detail below with reference to the accompanying drawings.

[0041] A testing method for LED vehicle lights with line sequence recognition includes the following steps:

[0042] S1. Assemble the test link by connecting the programmable power supply, tester and the vehicle lamp under test in sequence to form a circuit;

[0043] S2. Standard parameter setting: The tester tests qualified samples and processes the test data to set the standard parameters.

[0044] S3. Connection identification: Perform beam induction detection on the lead wires of the vehicle headlight under test and the connection port of the tester.

[0045] S4. Electrical test: Test the operating current of the vehicle lamp under test under a set voltage and compare it with the standard parameters.

[0046] S5. Wire sequence recognition: The wires of the vehicle headlight under test are detected and identified using a vision camera or color sensor.

[0047] S6. Standard parameter adjustment: Take the average value of the test data of several good quality car lights and define this average value as the new standard parameter. Then repeat steps S2-S6.

[0048] This application originally used to test the accuracy of the wiring sequence of LED vehicle lights. Now, it achieves this through three coordinated tests. Specifically, the three tests include three steps: connection identification, electrical testing, and wiring sequence identification. Connection identification ensures the stability of the tester and wiring connections; electrical testing ensures the internal hardware of the LED vehicle lights is correct; and wiring sequence identification ensures the wiring sequence requirements are met. These three testing steps complement each other, making the testing system more complete and effectively preventing defects caused by a single test. This improves the accuracy of LED vehicle light testing, prevents defective products from entering the market, and improves testing efficiency and reduces labor costs by using a tester.

[0049] In step S1, two 0-80V programmable power supplies are configured. The first programmable power supply is used to continuously power the LED headlight under test, and the second programmable power supply is used to output voltage signals to the headlight under test. The normal operating voltage of the headlight under test is aV-bV. Therefore, the second programmable power supply has a first output voltage aV and a second output voltage bV. The second programmable power supply will perform cyclic testing on the headlight under test with aV and bV. The programmable power supply can provide a stable voltage, providing continuous power to the LED headlight on one hand, and providing a detection voltage on the other. It can also provide a set voltage to perform comprehensive testing on the LED headlight, ensuring that the LED headlight will operate stably under various conditions. The operating voltage of the LED headlight to be tested in this application is 12V-15V. A stable input voltage can be obtained through the programmable power supply. The programmable power supply will supply power to the LED headlight multiple times with 12V and 15V respectively for testing. There are other types of headlights with an operating voltage of 48V, so a 0-80V programmable power supply is required.

[0050] In step S1, the vehicle light under test is an integration of multiple lamps. The tester is used to simultaneously test all lamps and display the test results at the same time. The vehicle light under test includes, but is not limited to, front position lights, low beam headlights, and high beam headlights. All lamp circuits are bundled together and can be plugged into the tester at the same time. The tester can simultaneously and independently test all lamps and display the test results separately, which improves the testing efficiency. When a problem occurs in the test data of any circuit, the problematic circuit can be quickly identified.

[0051] In step S2, the standard parameter is set as a current parameter. After the vehicle lamp under test is powered on with 12V and 15V, its current value is detected and used as the standard parameter. The subsequent tester will use the set error value as the error range to test the subsequent vehicle lamps under test. The setting of the standard parameter provides a benchmark for subsequent judgment. 12V and 15V each have a corresponding current value. The tester will combine the current value and the error range to test the subsequent LED vehicle lamps. This standard parameter setting method is more reasonable, thus making the entire testing procedure more reasonable.

[0052] In step S3, the through-beam induction detection is achieved through a transmitter and a receiver. The transmitter and receiver are positioned opposite each other inside the wiring port of the tester. When the lead wire of the vehicle light under test is fully inserted into the wiring port, the receiver cannot receive the transmitted signal. Through-beam induction detection can effectively eliminate the change in current caused by poor contact, providing a basic guarantee for subsequent electrical tests. Furthermore, the transmitter and receiver have a simple structure and high practicality.

[0053] In step S4, the vehicle light under test is tested 50 times each with 12V and 15V, and then the test current is compared with the standard parameters to determine the quality of the vehicle light under test. The vehicle light under test is tested with two different voltages, and after 50 tests with each voltage, the test is switched and repeated to maximize the effectiveness of the test. Specifically, the test method is to test the first to the 50th vehicle light under test with 12V, and then test the 51st to the 100th vehicle light under test with 15V, and repeat the process.

[0054] In step S5, the vision camera takes a picture of the connection point and reads it, then compares it with the stored image of the reference component. The vision camera can determine the color of the wire by comparing it with the stored image of the reference component, and thus determine whether the connection is incorrect.

[0055] The color sensor includes a transmitter and a receiver. The transmitter emits a beam of white light onto the vehicle light under test. The light reflected from the vehicle light under test enters the receiver. After quantization processing, the receiver compares the light with a set value. The quantization processing result makes the detection more accurate and can effectively ensure that the wiring of the LED vehicle light is correct.

[0056] In actual testing, the following situations may occur: First, incorrect wiring sequence, such as connecting the low beam to the high beam circuit, or vice versa. This will affect the terminal function, but because the low beam and high beam operate at the same voltage, normal current can still be obtained during testing. Second, incorrect wiring sequence, such as connecting the low beam to the low beam circuit through the high beam circuit, or vice versa. This will not affect the terminal function, and normal current can still be obtained during testing. However, due to wiring sequence requirements and subsequent maintenance requirements, this product is considered defective. Third, incorrect wiring sequence and soldering errors may still result in normal current being obtained during testing. Due to these three situations, three testing steps are needed to complement each other to complete the defective product testing.

[0057] Each of steps S2-S6 includes an overcurrent protection circuit based on a test method. This circuit is used to protect the vehicle lamp under test when the current is overloaded. The circuit adopts a P-channel MOSFET series voltage regulator architecture. The circuit includes a P-channel MOSFET Q1, an operational amplifier U1, a reference voltage source ZD2 (2.5V), a Zener diode ZD1 (gate protection), a current sampling resistor Rs, a voltage divider resistor network, and a filter capacitor.

[0058] The connection methods for each component are as follows:

[0059] The source of Q1 is connected to the positive terminal of the input power supply, the drain is connected to the positive terminal of the output, and the gate is connected to the output terminal of U1 through a current-limiting resistor; the cathode of ZD1 is connected to the gate and the anode is connected to the source to realize gate overvoltage protection; the current sampling resistor Rs is connected in series in the negative terminal circuit of the output to collect the current signal and feed it back to the non-inverting terminal of U1; the inverting terminal of U1 is connected to the reference voltage to realize current closed-loop control; the voltage divider network collects the output voltage to realize voltage regulation; the frequency compensation capacitor avoids system oscillation, and the filter capacitor removes power supply ripple.

[0060] The circuit works as follows: when the loop current exceeds the limit, the voltage drop across Rs increases, the output level of U1 flips, and Q1 is turned off, quickly cutting off the power supply. After the current returns to normal, it automatically restarts without manual reset.

[0061] A testing instrument includes: a working platform 1; a human-machine interface module, including a display screen 2 and buttons; a main control module, including a microcontroller, a test screen 3, a detection circuit, and an alarm; an information acquisition module, including a vision camera 4 or a color sensor; and a mechanical connection module, including a physical interface 5 for connecting a vehicle lamp under test; wherein the human-machine interface module, the main control module, the information acquisition module, and the mechanical connection module are all mounted on the working platform 1, the main control module and the human-machine interface module are connected, and the information acquisition module and the mechanical connection module are both connected to the main control module; the buttons include those for testing with multiple voltages; the test screen 3 is used to simultaneously display multiple test results; the information acquisition module also includes a searchlight, and when an abnormal test result is found, the microcontroller controls the searchlight to adjust its brightness and then retests; the alarm sounds when a defective part is detected; the microcontroller is used to record and upload the total number of tests and defect data.

[0062] The display screen 2 has several buttons that can control the switch, adjust the voltage, and connect the detection circuit and alarm to the microcontroller. The test screen 3 has a zoned test function, distinguishing between the front position lights, low beam lights, and high beam lights, and can display the test results separately. The alarm can sound when the data is abnormal, reminding personnel that the tester has detected defective parts. The information acquisition module is a vision camera 4 or a color sensor. In this embodiment, it is a vision camera 4. The vision camera 4 is above the physical interface 5 and can take pictures of the connection point and compare them with the reference parts, mainly comparing the wire color. The color sensor will emit a beam of white light onto the headlight under test. The light reflected by the headlight under test enters the receiving end. After quantization processing, the receiving end compares it with the set value. When the test is completed, the microcontroller can upload all the data. Personnel will obtain the total number of tested products and the number of defective parts, thus obtaining the product yield, thereby optimizing the process flow and creating a digital factory.

[0063] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of this invention, "a plurality of" means two or more, unless otherwise explicitly specified.

[0064] In this invention, unless otherwise explicitly specified and limited, the terms "installation," "connection," "linking," and "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components. Those skilled in the art can understand the specific meaning of the above terms in this invention according to the specific circumstances.

[0065] In this invention, unless otherwise explicitly specified and limited, "above" or "below" the second feature can mean that the first feature is in direct contact with the second feature, or that the first feature is in indirect contact with the second feature through an intermediate medium. Furthermore, "above," "over," and "on top" of the second feature can mean that the first feature is directly above or diagonally above the second feature, or simply that the first feature is at a higher horizontal level than the second feature. "Below," "below," and "under" the second feature can mean that the first feature is directly below or diagonally below the second feature, or simply that the first feature is at a lower horizontal level than the second feature.

[0066] In the description of this specification, the references to terms such as "one embodiment," "some embodiments," "example," "specific example," or "some examples," etc., indicate that a specific feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of the present invention. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples. Moreover, without contradiction, those skilled in the art can combine and integrate the different embodiments or examples described in this specification, as well as the features of different embodiments or examples.

[0067] The above are all preferred embodiments of this application, and are not intended to limit the scope of protection of this application. Therefore, all equivalent changes made in accordance with the structure, shape and principle of this application should be covered within the scope of protection of this application.

Claims

1. A testing method for LED vehicle lights with line sequence recognition, characterized in that, Includes the following steps: S1. Assemble the test link by connecting the programmable power supply, tester and the vehicle lamp under test in sequence to form a circuit; S2. Standard parameter setting: The tester tests qualified samples and processes the test data to set the standard parameters. S3. Connection identification: Perform beam induction detection on the lead wires of the vehicle headlight under test and the connection port of the tester. S4. Electrical test: Test the operating current of the vehicle lamp under test under a set voltage and compare it with the standard parameters. S5. Wire sequence recognition: The wires of the vehicle headlight under test are detected and identified using a vision camera or color sensor. S6. Standard parameter adjustment: Take the average value of the test data of several good quality vehicle lights and define this average value as the new standard parameter. Then repeat steps S3-S6.

2. The LED vehicle light testing method with line sequence recognition according to claim 1, characterized in that: In step S1, two 0-80V programmable power supplies are configured. The first programmable power supply is used to provide continuous power to the vehicle lamp under test, and the second programmable power supply is used to output voltage signals to the vehicle lamp under test. The normal operating voltage of the vehicle lamp under test is aV-bV. The second programmable power supply has a first output voltage aV and a second output voltage bV. The second programmable power supply will perform cyclic testing on the vehicle lamp under test with aV and bV.

3. The LED vehicle light testing method with line sequence recognition according to claim 1, characterized in that: In step S1, the vehicle light under test is an integration of multiple lights. The tester is used to simultaneously test all the lights and display the test results at the same time.

4. The LED vehicle light testing method with line sequence recognition according to claim 1, characterized in that: In step S2, the standard parameter is set as the current parameter. After the vehicle lamp under test is energized with aV and bV, its current value is detected and used as the standard parameter. The subsequent tester will use the set error value as the error range to test the subsequent vehicle lamps under test.

5. The LED vehicle light testing method with line sequence recognition according to claim 1, characterized in that: In step S3, the beam induction detection is achieved through a transmitter and a receiver. The transmitter and receiver are positioned opposite each other inside the wiring port of the tester. When the lead wire of the vehicle light under test is fully inserted into the wiring port, the receiver cannot receive the transmitted signal.

6. The LED vehicle light testing method with line sequence recognition according to claim 1, characterized in that: In step S4, the vehicle lamp under test is tested 50 times in turn at aV and bV, and then the test current is compared with the standard parameters to determine the quality of the vehicle lamp under test.

7. The LED vehicle light testing method with line sequence recognition according to claim 1, characterized in that: In step S5, the vision camera takes a picture of the insertion point and reads it, then compares it with the stored image of the reference component.

8. The LED vehicle light testing method with line sequence recognition according to claim 1, characterized in that: The color sensor includes a transmitter and a receiver. The transmitter emits a beam of white light onto the headlight under test. The light reflected from the headlight enters the receiver, which performs quantization processing and compares it with a set value.

9. The LED vehicle light testing method with line sequence recognition according to claim 1, characterized in that: Each of steps S2-S6 includes an overcurrent protection circuit based on a test method. This circuit is used to protect the vehicle lamp under test when the current is overloaded. The circuit adopts a P-channel MOSFET series voltage regulator architecture. The circuit includes a P-channel MOSFET Q1, an operational amplifier U1, a 2.5V reference voltage source ZD2, a Zener diode ZD1 as gate protection, a current sampling resistor Rs, a voltage divider resistor network, and a filter capacitor.

10. A testing instrument based on the testing method of any one of claims 1-9, characterized in that, include: Work platform (1); The human-computer interaction module includes a display screen (2) and buttons; The main control module includes a microcontroller, a test panel (3), a detection circuit, and an alarm. The information acquisition module includes a visual camera (4) or a color sensor; as well as The mechanical connection module includes a physical interface (5) for connecting the vehicle lamp under test; Among them, the human-computer interaction module, the main control module, the information acquisition module and the mechanical connection module are all set on the work platform (1). The main control module and the human-computer interaction module are connected, and the information acquisition module and the mechanical connection module are connected to the main control module. The buttons include those tested with multiple voltages; The test screen (3) is used to display multiple test results simultaneously; The information acquisition module also includes a searchlight. When the test results are abnormal, the microcontroller controls the searchlight to adjust the brightness and then retests. The alarm sounds when a defective part is detected; The microcontroller is used to record and upload the total number of tests and defective data.

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