BOE etching solution and preparation method thereof
By introducing a complex of benzotriazole-imidazolium-grafted polyethyleneimine and aminotrimethylenephosphonic acid into the BOE etching solution as a metal corrosion inhibitor, and using a composite buffer regulator of ammonium hydrogen fluoride, boric acid and amino acids, the problem of severe metal corrosion in the prior art is solved. This achieves efficient etching of silicon dioxide while reducing corrosion of metals such as tungsten, aluminum and titanium, thus meeting the high precision and high reliability requirements of advanced semiconductor devices.
Patent Information
- Application Number
- CN202610559576.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2026-04-27
- Publication Date
- 2026-05-26
AI Technical Summary
Existing BOE etching solutions cannot effectively suppress metal corrosion when etching devices containing metals such as tungsten, aluminum, and titanium. This is especially true under conditions of open contact holes and slight over-etching, which can lead to thinning, denting, or even breakage of metal lines, failing to meet the requirements of high-precision and high-reliability processes.
A complex of benzotriazole-imidazolium grafted with polyethyleneimine and aminotrimethylenephosphonic acid is used as a metal corrosion inhibitor, combined with a composite buffer regulator of ammonium hydrogen fluoride, boric acid and amino acids to form a stable protective structure, ensuring the high etching activity of the etching solution on silicon dioxide, while reducing corrosion of the metal.
It achieves high etching rates for silicon dioxide and extremely low corrosion rates for metals such as tungsten, aluminum, and titanium, ensuring the structural integrity of the device and improving the stability of the etching solution and the electrical stability and long-term reliability of the device.