A 3D chip design simulation modeling method and system based on twin technology
By using a 3D chip design simulation modeling method based on twin technology, the problem of multi-physics coupling in 3D chip design was solved, a more accurate simulation model was achieved, the risk of sudden changes in chip degradation rate was reduced, and the accuracy and reliability of the design were improved.
CN122088210BActive Publication Date: 2026-06-26AXD (ANXINDA) MEMORY TECH CO LTD
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- AXD (ANXINDA) MEMORY TECH CO LTD
- Filing Date
- 2026-04-23
- Publication Date
- 2026-06-26
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Figure CN122088210B_ABST
Abstract
The application relates to the technical field of digital twinning, and discloses a 3D chip design simulation modeling method and system based on twinning technology, which comprises the following steps: acquiring physical field simulation data, performing feature fusion of thermal stress and thermal-electric coupling by solving a thermal expansion vector field to obtain a preliminary mapping relationship; performing nonlinear cumulative effect calculation of dynamic power density according to the preliminary mapping relationship to obtain a final cumulative effect value; adjusting interconnection materials according to the final cumulative effect value to correct an index set; performing deviation quantitative calculation through thermal flow evolution path analysis according to the index set to obtain a thermal resistance degradation deviation matrix; performing Pareto frontier inflection point extraction according to the thermal resistance degradation deviation matrix to obtain a balanced configuration; screening a non-dominated solution cluster that meets a preset critical power threshold according to the balanced configuration to obtain a candidate solution cluster; screening an optimal configuration according to the candidate solution cluster to output a final optimization scheme. The method can reduce the risk of chip degradation rate mutation.
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Citation Information
Patent Citations
Multi-physics field coupling simulation method and device for industrial digital twinning
CN120671453A
Generating digital twins of semiconductor manufacturing equipment
US20240378347A1