High-voltage switch loop resistance rapid test method, device, equipment, storage medium and program product

Abstract

The application relates to a high-voltage switch loop resistance rapid testing method, device, equipment, storage medium and program product. The method comprises the following steps: sequentially applying a strong pulse current with a first time period and a target test current with a second time period to a conductive loop of a high-voltage switch to be tested; the first time period is less than the second time period, and the current value of the strong pulse current is greater than the current value of the target test current; during the application of the target test current, after the loop current of the conductive loop enters a stable state, a plurality of loop voltage values and corresponding plurality of loop current values between the two ends of the conductive loop are collected; and the loop resistance value of the conductive loop is determined according to the plurality of loop voltage values and the corresponding plurality of loop current values between the two ends of the conductive loop. The method can improve the high-voltage switch loop resistance test efficiency.

Description

Technical Field

[0001] This application relates to the field of power electronics technology, and in particular to a method, apparatus, computer equipment, computer-readable storage medium, and computer program product for rapid testing of the resistance of a high-voltage switching circuit. Background Technology

[0002] High-voltage switchgear refers to equipment used in power systems for switching, controlling, or protecting electrical energy during generation, transmission, distribution, conversion, and consumption. The circuit resistance of a high-voltage switchgear, also known as contact resistance, refers to the total resistance of the conductive circuit (from one terminal to the other) of a high-voltage circuit breaker, disconnector, or other switching equipment when it is in the closed position.

[0003] In related technologies, a closed-loop resistance test contact for high-voltage switchgear is used, comprising a test contact sleeve, a spring cap, a contact pressure holding spring, a spring seat, a voltage terminal strip, and a current terminal strip. The test contact sleeve is fitted onto the front end of the spring cap; one end of the contact pressure holding spring is fitted onto the spring cap, and the other end is fitted onto the spring seat; the test contact is fitted with a current terminal strip; one end of the voltage terminal strip is fixed to the outer surface of the spring cap. The method of using this test contact for loop resistance testing involves applying a large test current for an extended period, resulting in low efficiency in high-voltage switchgear loop resistance testing. Summary of the Invention

[0004] Therefore, it is necessary to provide a method, apparatus, computer equipment, computer-readable storage medium, and computer program product for rapidly testing the resistance of high-voltage switch circuits, which can improve the efficiency of high-voltage switch circuit resistance testing, in response to the above-mentioned technical problems.

[0005] Firstly, this application provides a rapid testing method for the resistance of a high-voltage switch circuit, including:

[0006] A strong pulse current lasting for a first time period and a target test current lasting for a second time period are sequentially applied to the conductive circuit of the high-voltage switch under test; the first time period is shorter than the second time period, and the current value of the strong pulse current is greater than the current value of the target test current;

[0007] During the application of the target test current, after the loop current of the conductive circuit enters a stable state, multiple loop voltage values ​​and corresponding multiple loop current values ​​are collected at both ends of the conductive circuit.

[0008] The circuit resistance value of the conductive circuit is determined based on the multiple circuit voltage values ​​and corresponding multiple circuit current values ​​at both ends of the conductive circuit.

[0009] In one embodiment, after acquiring multiple loop voltage values ​​and corresponding multiple loop current values ​​across the conductive loop, the method further includes:

[0010] Stop applying the target test current and control the loop current value flowing through the conductive loop to decrease to a minimum value within a third time period; the third time period is shorter than the second time period.

[0011] In one embodiment, after the loop current of the conductive circuit reaches a stable state and before acquiring multiple loop voltage values ​​and corresponding multiple loop current values ​​across the conductive circuit, the method further includes:

[0012] Obtain the rate of change of the loop current value flowing through the conductive loop;

[0013] If the rate of change of the current is less than the rate of change threshold, and the number of times the rate of change of the current is less than the rate of change threshold is greater than the number of times the rate of change is less than the number of times the current is less than the rate of change threshold is determined to be that the loop current of the conductive circuit has entered a stable state.

[0014] In one embodiment, determining the loop resistance value of the conductive loop based on multiple loop voltage values ​​and corresponding multiple loop current values ​​at both ends of the conductive loop includes:

[0015] Align the multiple loop voltage values ​​at both ends of the conductive loop with the corresponding multiple loop current values ​​to obtain multiple voltage and current groups;

[0016] The least squares method is used to perform linear fitting on the multiple voltage and current groups to obtain a fitted straight line between voltage and current.

[0017] The slope of the fitted straight line is determined as the resistance value of the conductive circuit.

[0018] In one embodiment, the method further includes:

[0019] If the ripple amplitude of the loop current value flowing through the conductive loop exceeds the amplitude threshold during the application of the target test current, the application of the target test current shall be stopped.

[0020] Increase the duration of the first time period, and return to the step of sequentially applying a strong pulse current for the first time period and a target test current for the second time period to the conductive circuit of the high-voltage switch under test.

[0021] In one embodiment, the method further includes:

[0022] The number of retries is counted for the step of sequentially applying a strong pulse current for a first duration and a target test current for a second duration to the conductive circuit of the high-voltage switch under test.

[0023] If the number of retries reaches a threshold, an alarm signal is output; the alarm signal is used to characterize an abnormality in the inductive reactance of the conductive circuit.

[0024] Secondly, this application also provides a rapid testing device for the resistance of a high-voltage switching circuit, comprising:

[0025] An application module is used to sequentially apply a strong pulse current lasting for a first time period and a target test current lasting for a second time period to the conductive circuit of the high-voltage switch under test; the first time period is shorter than the second time period, and the current value of the strong pulse current is greater than the current value of the target test current.

[0026] The acquisition module is used to acquire multiple loop voltage values ​​and corresponding multiple loop current values ​​at both ends of the conductive circuit after the loop current of the conductive circuit enters a stable state during the application of the target test current.

[0027] The determination module is used to determine the circuit resistance value of the conductive circuit based on multiple circuit voltage values ​​and corresponding multiple circuit current values ​​at both ends of the conductive circuit.

[0028] Thirdly, this application also provides a computer device, including a memory and a processor, wherein the memory stores a computer program, and the processor executes the computer program to implement the steps of the above-described method.

[0029] Fourthly, this application also provides a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the steps of the above-described method.

[0030] Fifthly, this application also provides a computer program product, including a computer program that, when executed by a processor, implements the steps of the above-described method.

[0031] The aforementioned method, apparatus, computer equipment, computer-readable storage medium, and computer program product for rapid testing of high-voltage switch circuit resistance sequentially apply a strong pulse current for a first duration and a target test current for a second duration to the conductive circuit of the high-voltage switch under test. The first duration is shorter than the second duration, and the value of the strong pulse current is greater than the value of the target test current. During the application of the target test current, after the circuit current of the conductive circuit reaches a stable state, multiple circuit voltage values ​​and corresponding multiple circuit current values ​​are collected at both ends of the conductive circuit. Based on the multiple circuit voltage values ​​and corresponding multiple circuit current values ​​at both ends of the conductive circuit, the circuit resistance value of the conductive circuit is determined. Thus, a short-duration strong pulse current is first applied to the conductive circuit to quickly overcome the inductive reactance of the conductive circuit and establish a magnetic field; then a relatively long-duration target test current is applied, and the voltage and corresponding current values ​​are sampled only after the target test current stabilizes; finally, the circuit resistance value is calculated based on the collected data. By optimizing the application method of the test current and the voltage sampling sequence, rapid and accurate testing of the high-voltage switch circuit resistance can be achieved. This can significantly reduce the application time of large current, thereby avoiding problems such as high battery energy consumption, severe equipment overheating, and high risk of thermal shock to switch contacts caused by applying large test current for a long time. At the same time, the test accuracy is guaranteed to meet the requirements, and the test efficiency is improved. Attached Figure Description

[0032] To more clearly illustrate the technical solutions in the embodiments of this application or related technologies, the drawings used in the description of the embodiments of this application or related technologies will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other related drawings can be obtained based on these drawings without creative effort.

[0033] Figure 1 This is an application environment diagram of a rapid testing method for the resistance of a high-voltage switch circuit in one embodiment.

[0034] Figure 2 This is a logic diagram of a rapid testing method for the resistance of a high-voltage switch circuit in one embodiment;

[0035] Figure 3 This is a flowchart illustrating a rapid testing method for the resistance of a high-voltage switch circuit in another embodiment;

[0036] Figure 4 This is a structural block diagram of a high-voltage switch circuit resistance rapid testing device in one embodiment;

[0037] Figure 5 This is an internal structural diagram of a computer device in one embodiment. Detailed Implementation

[0038] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the scope of this application.

[0039] The rapid testing method for the circuit resistance of a high-voltage switch provided in this application can be applied to a testing device that can be connected to the conductive circuit of the high-voltage switch under test. The testing device can be a circuit resistance tester, an intelligent detection terminal, or similar equipment. The testing device can apply current to the conductive circuit of the high-voltage switch under test and monitor the circuit current. Synchronous acquisition of the circuit voltage and current is triggered only after the circuit current reaches a stable state. Finally, the testing device can calculate the resistance value of the conductive circuit based on the acquired voltage and current data.

[0040] In one embodiment, the testing equipment may include a closed-loop resistance test contact for a high-voltage switchgear. This test contact includes a test contact sleeve, a spring cap, a contact pressure holding spring, a spring seat, a voltage terminal strip, and a current terminal strip. The test contact sleeve is fitted onto the front end of the spring cap. One end of the contact pressure holding spring is fitted onto the spring cap, and the other end is fitted onto the spring seat. The test contact is fitted with a current terminal strip. One end of the voltage terminal strip is fixed to the outer surface of the spring cap. Based on the hardware of this full-loop test contact, this application proposes a rapid high-voltage switchgear circuit resistance testing method based on dynamic pulse current and synchronous sampling by optimizing the application of the test current and the timing of voltage sampling.

[0041] In one exemplary embodiment, such as Figure 1 As shown, a rapid testing method for the resistance of a high-voltage switch circuit is provided. The method is illustrated using an example of its application in testing equipment, and includes:

[0042] Step S102: Apply a strong pulse current for a first time period and a target test current for a second time period to the conductive circuit of the high voltage switch under test in sequence.

[0043] The high-voltage switch under test refers to high-voltage circuit breakers, disconnectors, and other switching equipment that require loop resistance testing. The conductive circuit refers to the current path formed from one terminal to the other when the high-voltage switch is in the closed position. This conductive circuit includes the switch's stationary contact, moving contact, and the conductors connecting these contacts.

[0044] The testing equipment establishes an electrical connection with the conductive circuit of the high-voltage switch under test through test contacts. Specifically, the current terminal strip of the test contact is connected to the wiring terminals of the conductive circuit to inject test current into the conductive circuit; the voltage terminal strip of the test contact is connected to the corresponding position in the conductive circuit to collect the voltage drop across the conductive circuit.

[0045] Among them, strong pulse current refers to a pulse current with a large current value, which is much larger than the target test current. The function of strong pulse current is to quickly overcome the inductive reactance generated by inductive components (such as coils, inductors, etc.) in the conductive circuit and rapidly establish a magnetic field in the conductive circuit, so that the subsequently applied target test current can reach a stable state more quickly.

[0046] The first time period is shorter than the second time period.

[0047] The first time period refers to the duration of the strong pulse current. Since the main function of the strong pulse current is to rapidly establish a magnetic field and overcome inductive reactance, the first time period is relatively short. For example, the first time period can be from 1 millisecond to 3 milliseconds.

[0048] The target test current refers to the current used to actually measure the circuit resistance. The value of the target test current is determined based on the test standard and the rated parameters of the device under test. For example, the target test current might be 100 amperes (A).

[0049] The second time period refers to the duration of the target test current. This second time period needs to be long enough to ensure the target test current reaches a stable state and provides a sufficient time window for voltage and current acquisition. For example, the second time period could be 10 to 50 milliseconds.

[0050] Because the first time period is shorter than the second time period, and the current value of the strong pulse current is greater than the current value of the target test current, the entire test process can be completed in a shorter time while ensuring the accuracy of the test.

[0051] In practice, the test equipment includes a control unit and a power output circuit. The control unit generates control signals to control the output state of the power output circuit. The power output circuit includes power switching devices, such as metal-oxide-semiconductor field-effect transistors (MOSFETs) or insulated-gate bipolar transistors (IGBTs).

[0052] The strong pulse current has a value greater than the target test current. For example, when the target test current is 100A, the strong pulse current can be 150A.

[0053] In practice, the control unit of the test equipment first generates a first control signal to drive the power output circuit to output a strong pulse current. Specifically, the control unit controls the power switching device to operate with a large duty cycle or in a fully on state, causing the current flowing through the conductive circuit to rise rapidly to the value of the strong pulse current. After this strong pulse current lasts for a first time period, the control unit generates a second control signal to adjust the operating state of the power switching device, causing the output current to decrease to the target test current value, and maintaining this current value for a second time period.

[0054] For example, the test equipment can apply a smart pulse current to the conductive circuit. The control unit of the test equipment first drives the power output circuit to apply a pre-charge current (i.e., a strong pulse current) that is much higher than the rated test current (e.g., 150% of 100A, i.e., 150A). This current is applied for an extremely short time (1~2 milliseconds) to quickly overcome the inductive reactance of the circuit under test (including the stationary contacts of switchgear, the moving contacts of handcart circuit breakers, etc.) and establish a magnetic field. After the pre-charge current is applied, the current is immediately stabilized at the target test current value (e.g., 100A). The entire current application window is strictly controlled within an extremely short time of 10~50 milliseconds, which shortens the current application time by 1~2 orders of magnitude compared to traditional test methods.

[0055] By applying a strong pulse current, the inductive reactance of the conductive circuit can be overcome in a very short time, reducing the current rise time and allowing the target test current to reach a steady state more quickly. This significantly shortens the total test time, thereby improving test efficiency, reducing energy consumption, and minimizing equipment heating and thermal shock to the tested switch contacts.

[0056] Step S104: During the application of the target test current, after the loop current of the conductive circuit enters a stable state, multiple loop voltage values ​​and corresponding multiple loop current values ​​are collected at both ends of the conductive circuit.

[0057] Here, loop current refers to the current flowing through a conductive loop. Loop voltage refers to the voltage drop across the conductive loop, which is mainly caused by the resistance of the conductive loop.

[0058] The steady state refers to a state where the rate of change of the loop current is sufficiently small, meaning the loop current essentially no longer changes with time. When the loop current enters the steady state, the influence of the inductive component in the conductive circuit on the measurement is essentially eliminated, and the collected voltage and current values ​​can accurately reflect the resistance characteristics of the conductive circuit.

[0059] The testing equipment may include a current acquisition circuit and a voltage acquisition circuit. The current acquisition circuit is used to acquire the loop current value flowing through the conductive loop; this circuit may include a current sensor, such as a Hall sensor or a sampling resistor. The voltage acquisition circuit is used to acquire the loop voltage value across the conductive loop; this circuit is connected to the conductive loop via a voltage terminal block.

[0060] In practice, the testing equipment continuously monitors the state of the loop current while applying the target test current. Once the testing equipment determines that the loop current has entered a stable state, it triggers the voltage and current acquisition circuits to synchronously acquire multiple loop voltage values ​​and corresponding loop current values. Synchronous acquisition means that the voltage and current acquisition circuits acquire voltage and current values ​​at the same time points to ensure that the acquired voltage and current values ​​correspond to the same operating state of the conductive loop. Through synchronous acquisition, the correspondence between voltage and current can be accurately established, providing a reliable data foundation for subsequent resistance calculations.

[0061] Here, multiple loop voltage values ​​and corresponding multiple loop current values ​​refer to multiple sets of voltage-current data pairs obtained through multiple acquisitions under stable loop current conditions. By acquiring multiple sets of data, the accuracy of the measurement can be improved, the impact of single acquisition errors can be reduced, and more accurate resistance values ​​can be obtained through data processing methods (such as averaging or linear fitting).

[0062] For example, once the current pulse reaches a stable state, the high-precision voltage sampling circuit performs multiple high-speed, synchronous samplings of the loop voltage drop collected by the voltage terminal strip on the test contact within an extremely short time window of 1 to 5 milliseconds. The sampling timing is strictly synchronized with the current stabilization phase, ensuring that the sampled voltage drop reflects the true resistance under stable current. This effectively avoids interference from inductive components in the loop, laying the foundation for subsequent accurate calculation of the loop resistance.

[0063] Step S106: Determine the circuit resistance value of the conductive circuit based on the multiple circuit voltage values ​​and corresponding multiple circuit current values ​​at both ends of the conductive circuit.

[0064] In practice, the testing equipment processes multiple sets of synchronously acquired current and voltage data points in real time. Processing methods include calculating the average value of the data or performing linear fitting using the least squares method, and then directly calculating the loop resistance value based on Ohm's law (R=V / I). The entire "current application-data sampling" process can be completed within 100 milliseconds. For applications with higher reliability requirements, a method of continuously applying 3-5 of the aforementioned short pulses and calculating the average resistance can be used; the entire testing process still only requires a few hundred milliseconds.

[0065] As an example, the test equipment can calculate the average value of all loop voltage values ​​and the average value of all loop current values, and then calculate the loop resistance value according to Ohm's law R=V / I, where R represents the loop resistance value, V represents the average loop voltage value, and I represents the average loop current value.

[0066] As another example, the test equipment can calculate the resistance value for each set of loop voltage values ​​and corresponding loop current values, and then calculate the average of all resistance values ​​as the final loop resistance value.

[0067] As another example, the test equipment can determine the loop resistance value by using a linear fitting method based on the collected multiple loop voltage values ​​and corresponding multiple loop current values. This method will be described in detail in subsequent embodiments.

[0068] In the aforementioned rapid testing method for the resistance of high-voltage switch circuits, a short-duration strong pulse current is first applied to the conductive circuit to quickly overcome the inductive reactance of the conductive circuit and establish a magnetic field. Subsequently, a target test current with a relatively long duration is applied, and the voltage and corresponding current values ​​are sampled only after the target test current stabilizes. Finally, the circuit resistance value is calculated based on the collected data. By optimizing the application method of the test current and the voltage sampling sequence, rapid and accurate testing of the resistance of high-voltage switch circuits can be achieved. This method can significantly reduce the application time of large current, thereby avoiding problems such as high battery energy consumption, severe equipment overheating, and high risk of thermal shock to switch contacts caused by applying large test current for a long time. At the same time, it ensures that the test accuracy meets the requirements and improves the test efficiency.

[0069] In another embodiment, after acquiring multiple loop voltage values ​​and corresponding multiple loop current values ​​at both ends of the conductive loop, the method further includes: stopping the application of the target test current and controlling the loop current value flowing through the conductive loop to decrease to a minimum value within a third time period; the third time period is shorter than the second time period.

[0070] The minimum value refers to a value where the loop current is essentially zero or close to zero.

[0071] The third time period refers to the time elapsed from when the target test current is stopped to when the loop current decreases to its minimum value. The third time period is shorter than the second time period, meaning the current decreases more rapidly and can be switched off in a shorter time. For example, the third time period is 0.5 milliseconds to 2 milliseconds.

[0072] In practice, after completing voltage and current acquisition, the control unit of the testing equipment generates a third control signal to quickly shut down the power output circuit. Specifically, the control unit can control the power switching device to quickly enter the cutoff state, cutting off the current path.

[0073] For example, the entire test process includes a first time period of applying a strong pulse current, a second time period of applying the target test current, and a third time period of current reduction. Assuming the first time period is 2 milliseconds, the second time period is 30 milliseconds, and the third time period is 1 millisecond, the total time of the entire test process is much less than 100 milliseconds, significantly shortening the test time.

[0074] The technical solution of this application embodiment can further shorten the entire test cycle, reduce total energy consumption, reduce the thermal impact on the test equipment and the switch under test, and improve the test efficiency of high voltage switch circuit resistance by quickly cutting off the current.

[0075] The core optimization principle of this application's embodiments is dynamic pulses and synchronous sampling. Traditional testing methods use continuous, stable DC current for several seconds, while this application's embodiments optimize this into a carefully designed, short dynamic current pulse sequence, and ensure that voltage sampling and current pulses are closely coordinated in time, significantly improving testing efficiency and accuracy.

[0076] The waveform optimization method for the test current will be explained next.

[0077] The optimized current waveform is no longer a simple "on-hold-off" pattern, but is precisely divided into three stages, with the time and function of each stage as follows:

[0078] Phase 1 (t0~t1, i.e., the first time period): Strong pre-charge pulse;

[0079] Objective: To overcome the inductive reactance of the circuit, establish a test magnetic field as quickly as possible, and force the current to reach a stable value rapidly;

[0080] Action: At time t0, the control unit commands the power MOSFET or IGBT to be fully turned on, applying a strong pulse current (e.g., 150A) that is much higher than the target test current (e.g., 100A). This phase lasts for a very short time, typically 1 to 3 milliseconds.

[0081] Function: Greatly reduces current rise time, effectively compressing the entire test cycle.

[0082] Second phase (t1~t2, i.e., the second time period): Precision flow stabilization platform;

[0083] Objective: To provide a short-lived but extremely stable current source to ensure high-precision voltage sampling;

[0084] Action: When the current reaches its peak value (e.g., 150A), the control loop immediately intervenes to quickly and accurately maintain the current at the target test current value (e.g., 100A). The duration of the "plateau period" is strictly controlled within 10~50 milliseconds.

[0085] Purpose: This stage is the "effective data window" for the entire test, where current ripple is controlled at an extremely low level (<1%), ensuring the accuracy of the sampled data.

[0086] The third stage (t2~t3, i.e. the third time period): rapid shutdown;

[0087] Objective: To immediately disconnect the current after data acquisition to minimize total energy consumption and thermal effects;

[0088] Action: At time t2, the control unit turns off the power switch, and the current drops to zero rapidly within 1 millisecond.

[0089] By precisely controlling these three stages, the entire current application process (t0~t3) can be shortened from several seconds to less than 100 milliseconds.

[0090] The following section explains the voltage sampling timing synchronization optimization method.

[0091] After the loop current in the conductive circuit reaches a steady state, multiple loop voltage values ​​and corresponding multiple loop current values ​​are collected across the conductive circuit. This voltage sampling no longer simply starts and ends simultaneously with the current application, but achieves millisecond-level synchronization with specific stages of the current waveform. The specific optimization method is as follows:

[0092] Sampling trigger condition: The voltage sampling circuit (high-speed ADC) continuously monitors the current waveform. The sampling trigger condition is not "current on", but "the current has entered the second stage of stable plateau period". The high-precision voltage sampling sequence is only started when the detected current value is stable within ±1% of the target value (e.g., 100A).

[0093] Sampling mode: During the steady-state plateau period (t1~t2), the ADC will perform multiple high-speed samplings (e.g., 1000 samplings within 20 milliseconds, i.e., a sampling rate of 50kSPS). Multi-point sampling can effectively filter random noise and eliminate any tiny residual inductive reactance voltage through algorithms, thereby improving the quality of the sampled data.

[0094] In another embodiment, after the loop current of the conductive circuit enters a stable state, and before acquiring multiple loop voltage values ​​and corresponding multiple loop current values ​​at both ends of the conductive circuit, the method further includes: acquiring the current change rate of the loop current value flowing through the conductive circuit; and determining that the loop current of the conductive circuit has entered a stable state if the current change rate is less than a change rate threshold and the number of times the current change rate is less than the change rate threshold is greater than a number threshold.

[0095] The rate of change of current refers to the speed at which the value of the loop current changes over time. It is usually expressed as the amount of change in the current value per unit time, such as amperes per millisecond or amperes per second.

[0096] Optionally, a high-speed, high-precision analog-to-digital converter (ADC) can be used to acquire signals from current sensing circuits (such as Hall sensors or sampling resistors) to obtain the loop current value flowing through the conductive loop. To capture rapidly changing currents, the ADC sampling rate needs to be high enough, such as 10,000 samples per second (10kSPS) or higher.

[0097] In practice, the testing equipment continuously collects the loop current value through the current acquisition circuit and calculates the current change rate based on the current values ​​at adjacent time points. Specifically, if the current value collected at time point t(n) is I(n) and the current value collected at time point t(n-1) is I(n-1), then the current change rate at time point t(n) can be expressed as: [I(n)-I(n-1)] / [t(n)-t(n-1)].

[0098] For example, the test equipment collects loop current values ​​at a sampling frequency of 10,000 samples per second (10 kSPS), with a time interval of 0.1 milliseconds between two adjacent samples. In this case, the rate of change of current can be expressed as the difference between two adjacent sampled current values ​​divided by 0.1 milliseconds.

[0099] In practical applications, the raw sampled data contains high-frequency switching noise and random interference, which would introduce significant errors if directly used to calculate the derivative. Therefore, digital filtering is necessary. To reduce the impact of sampling noise on the calculation of the current change rate, the test equipment can filter the acquired loop current values. Filtering methods can include moving average filtering, low-pass filtering, and other digital filtering techniques.

[0100] For example, the test equipment can feed the sampled value of the loop current into a digital filter (such as a moving average filter or a low-pass filter). Taking a moving average filter as an example, moving average filtering refers to taking the average of the most recent sampled values ​​as the filtered current value at the current moment. For example, using an 8-point moving average filter means taking the average of the most recent 8 sampled current values ​​as the filtered current value at the current moment. Through moving average filtering, the current waveform can be smoothed, high-frequency noise can be suppressed, and the calculation of the current change rate can be more accurate.

[0101] In practical implementation, the backward difference method can be used to approximate the instantaneous rate of change of the loop current. As the rate of change of current, the calculation formula can be expressed as: di / dt≈(I n -I n-1 ) / ΔT, where I n Let I be the filtered current value at the current time n. n-1 ΔT is the filtered current value at the previous time n-1, and ΔT is the sampling interval of the ADC (e.g., 100μs).

[0102] The rate of change threshold refers to the threshold used to determine whether the current is stable. When the rate of change of the current is less than this threshold, the rate of change of the current is considered sufficiently small, approaching a steady state. The setting of the rate of change threshold can be determined based on the required test accuracy and circuit characteristics.

[0103] Optionally, the rate of change threshold can be a value close to zero, or it can be 0.3% to 0.8% of the target test current value per millisecond. For example, the rate of change threshold can be set to 0.5% of the target test current value per millisecond. If the target test current value is 100A, then the rate of change threshold = 100A * 0.5% / 1ms = 0.5A / ms.

[0104] The number of times the current change rate must remain below a certain threshold is defined. By setting a number of times, it is possible to avoid misjudging the current as having entered a stable state due to occasional sampling fluctuations. For example, the number of times the threshold can be set can be between 5 and 15.

[0105] In practical applications, a dual-condition judgment can be used to determine whether the current in a conductive circuit has entered a steady state, ensuring reliability and anti-interference capability. Condition one is that the rate of change of the current is less than the rate of change threshold α, and condition two is that the number of times the rate of change of the current is less than the rate of change threshold is greater than the number of times it occurs. Condition one is satisfied when |di / dt| < α. Then, the duration or number of occurrences can be used for auxiliary judgment. To prevent accidental triggering due to random fluctuations at a single sampling point, condition one must be continuously satisfied for N sampling periods. For example, if the sampling period is 100 milliseconds, it is required that the rate of change be less than the threshold 10 times consecutively (i.e., for 1 milliseconds). When the number of consecutive occurrences of condition one (Count) >= N, condition two is satisfied. The control unit determines that the current has entered a steady state only when conditions one and two are simultaneously satisfied, and then issues a trigger signal to initiate high-speed synchronous sampling of the voltage circuit.

[0106] The technical solution of this embodiment does not rely on a fixed timer and can adapt to the natural changes in current settling time under different loads (inductive reactance), exhibiting strong adaptability. The dual criteria effectively avoid false triggering caused by noise, ensuring accurate and reliable judgment results with high reliability. It guarantees that voltage sampling is performed at the moment when the current is most stable, ensuring measurement accuracy from the source, resulting in high precision. Through a closed-loop detection process combining hardware and software, the optimal measurement window can be captured accurately and reliably, providing a technical foundation for the realization of the entire optimized testing scheme.

[0107] In another embodiment, determining the circuit resistance value of a conductive circuit based on multiple circuit voltage values ​​and corresponding multiple circuit current values ​​at both ends of the conductive circuit includes: aligning the multiple circuit voltage values ​​and corresponding multiple circuit current values ​​at both ends of the conductive circuit to obtain multiple voltage-current sets; performing linear fitting on the multiple voltage-current sets using the least squares method to obtain a fitted straight line between voltage and current; and determining the slope of the fitted straight line as the resistance value of the conductive circuit.

[0108] Alignment refers to matching the voltage value acquired by the voltage acquisition circuit with the current value acquired by the current acquisition circuit according to the acquisition time, and establishing a one-to-one correspondence.

[0109] A voltage-current pair refers to a pair of corresponding voltage and current values, which can be expressed as (V i I i ), where V i I represents the i-th voltage value. i This represents the i-th current value, where i is the index of the data point.

[0110] In practice, if the voltage acquisition circuit and the current acquisition circuit acquire data synchronously at the same sampling frequency, they can be directly paired according to the acquisition order. That is, the voltage value acquired in the i-th acquisition is paired with the current value acquired in the i-th acquisition to form the i-th voltage and current group.

[0111] In practical applications, after obtaining the voltage and current sets, multiple sets of current and voltage data can be filtered to remove abnormal data where the current deviates from the target test current by ±1%. For example, five sets can be removed, and the remaining voltage and current sets are considered valid data. The valid voltage data is then subjected to a moving average filter to further reduce the impact of random noise.

[0112] Least squares is a mathematical optimization method used to find the best function fit for data. Specifically, it involves using least squares to perform linear fitting on multiple voltage and current sets to find a straight line that minimizes the sum of squared deviations from all data points.

[0113] For example, the least squares method is used to linearly fit the VI curve, with current as the abscissa (X) and voltage as the ordinate (Y). Substituting multiple sets of voltage and current data, the fitting equation Y = kX + b is calculated, where the slope k is the loop resistance value. For instance, assuming there are 1490 sets of voltage and current data, the calculated k = 0.000085Ω = 85μΩ, and the intercept b = 0.000002V (the intercept is close to 0, indicating no systematic error). Simultaneously, the average value method is used for verification: the average current value I is calculated. avg =(ΣI) / 1490=100.02A, average voltage value V avg=(ΣV) / 1490=0.008502V, and R=85.004μΩ is calculated according to R=V / I, which is consistent with the linear fitting result, with an error of <0.01%.

[0114] Then, repeatability verification can be performed. For example, the test is repeated 5 times. The results of the 5 resistance tests are 85μΩ, 84.9μΩ, 85.1μΩ, 85μΩ and 84.9μΩ respectively. The average value is 85μΩ and the standard deviation is 0.08μΩ. The repeatability is good, indicating that the test results are reliable.

[0115] The technical solution in this embodiment maps multiple voltage data points to synchronously acquired current data points, and uses the least squares method for linear fitting to calculate the slope of the VI curve, which is the loop resistance value. This method can minimize sampling errors and minor fluctuations, and its accuracy is far higher than that of single-point calculation.

[0116] In another embodiment, the method further includes: if the ripple amplitude of the loop current value flowing through the conductive loop exceeds the amplitude threshold during the application of the target test current, then the application of the target test current is stopped; the duration of the first time period is increased, and the method returns to the step of sequentially applying a strong pulse current for the first time period and a target test current for the second time period to the conductive loop of the high-voltage switch under test.

[0117] Ripple amplitude refers to the fluctuation range of the loop current value under steady-state conditions. Ideally, the loop current should remain constant under steady-state conditions. However, due to factors such as switching noise and power supply ripple in the circuit, the actual loop current will fluctuate slightly around the target value. This fluctuation is called current ripple.

[0118] The ripple amplitude can be expressed in various ways, such as peak-to-peak value (the difference between the maximum and minimum values), RMS value, or percentage relative to the target current value.

[0119] The amplitude threshold can be set as the maximum allowable ripple amplitude. When the ripple amplitude exceeds this threshold, it indicates insufficient current stability, which may affect measurement accuracy. The amplitude threshold can be set according to the required test accuracy. For example, the amplitude threshold can be 1% to 3% of the target test current value.

[0120] When the testing equipment detects that the ripple amplitude exceeds the amplitude threshold, it determines that the current stability is insufficient and accurate voltage and current acquisition is impossible. At this point, the testing equipment immediately stops applying the target test current and quickly shuts off the current, ending the test attempt. The reason for the ripple amplitude exceeding the threshold may be that the inductive reactance of the conductive circuit is too high, causing the strong pulse current to fail to fully overcome the inductive reactance within the first time period, preventing the target test current from quickly reaching a stable state. To solve this problem, the testing equipment increases the duration of the first time period, allowing the strong pulse current to pre-charge the conductive circuit for a longer time, more fully overcoming the inductive reactance and establishing a more stable magnetic field. After increasing the first time period, the testing equipment can reapply the continuously increased strong pulse current of the first time period and the target test current of the second time period sequentially to the conductive circuit and continue executing subsequent test steps.

[0121] The technical solution of this embodiment, through an adaptive adjustment mechanism, enables the testing equipment to automatically adjust the test parameters according to the actual characteristics of the conductive circuit under test, ensuring a stable test current under different inductive reactance conditions, thereby guaranteeing the accuracy and reliability of the test.

[0122] In another embodiment, the method further includes: counting the number of retries to the step of sequentially applying a strong pulse current for a first time period and a target test current for a second time period to the conductive circuit of the high-voltage switch under test; outputting an alarm signal when the number of retries reaches a threshold; the alarm signal is used to characterize an abnormality in the inductive reactance of the conductive circuit.

[0123] The retry count refers to the number of times the test step is re-executed due to ripple amplitude exceeding the threshold. The retry count is incremented by 1 each time ripple exceeds the threshold and a retest is returned.

[0124] The retries threshold refers to the maximum allowed number of retries. When the retries reach this threshold, it indicates that even after multiple adjustments to the test parameters, a stable test current cannot be obtained, suggesting a possible abnormal situation. The retries threshold can be set according to actual application requirements to avoid excessive retries leading to excessively long test times; for example, the threshold could be 3 to 5 retries.

[0125] Alarm signals, in this context, refer to signals output by the testing equipment to alert the user to abnormal conditions. Alarm signals can take the form of audible alarms, display prompts, flashing indicator lights, or alarm messages sent to external systems via communication interfaces. Alarm signals characterize abnormal inductive reactance in conductive circuits. Abnormal inductive reactance means that the inductive reactance value of the conductive circuit is significantly higher than the normal range, which may be caused by the presence of additional inductive components in the conductive circuit, wiring errors, poor contact, or other reasons.

[0126] For example, alarm signals can include specific abnormal information, such as "excessive inductive reactance of the conductive circuit", "please check the wiring of the circuit under test", "it is recommended to replace with a higher power test device", etc., to help users quickly locate and solve problems.

[0127] For example, if the current ripple exceeds the standard during the test (e.g., the ripple reaches 2%), the instrument will automatically trigger the retry mechanism, extend the precharge time to 3ms, and reapply the pulse current until the ripple meets the requirements. If the test fails after three consecutive retryes, the test equipment will display an alarm for "excessive loop inductance", prompting you to check the wiring of the circuit under test or replace it with a precharge module with higher power.

[0128] The technical solution of this application embodiment, through retry and alarm mechanisms, enables the testing equipment to automatically adjust test parameters while timely detecting and reporting abnormal situations, avoiding invalid repeated tests, improving testing efficiency, and helping users quickly solve problems.

[0129] For the convenience of those skilled in the art, Figure 2 An exemplary logic diagram of a rapid testing method for the resistance of a high-voltage switching circuit is provided. As can be seen, the current waveform is precisely divided into three millisecond-level stages: t0~t1 (strong pre-charge pulse): rapidly establishing a magnetic field with high current; t1~t2 (precise current stabilization platform): the core measurement window, where the current is extremely stable; t2~t3 (rapid shutdown): immediately shutting off after measurement.

[0130] It should be noted that the process is precisely divided into three millisecond-level stages: t0~t1 (strong pre-charge pulse) uses high current to quickly establish the magnetic field; t1~t2 (precise current stabilization platform) is the core measurement window, where the current is extremely stable; t2~t3 (rapid shutdown) is immediately shut down after measurement is completed; an event-triggered mode is adopted, and a short-term high-speed synchronous sampling window is only started after the current is confirmed to have entered the stable "stage two" to ensure the acquisition of high-quality and effective data; multiple data points collected in the stable stage are used for linear fitting to further improve anti-interference capability and calculation accuracy.

[0131] In another embodiment, such as Figure 3 As shown, a rapid testing method for the resistance of a high-voltage switch circuit is provided. Taking the application of this method to a testing device as an example, the method includes the following steps:

[0132] Step S302: Apply a strong pulse current for a first time period and a target test current for a second time period to the conductive circuit of the high voltage switch under test in sequence.

[0133] In this process, the first time period is shorter than the second time period, and the current value of the strong pulse current is greater than the current value of the target test current.

[0134] Step S304: During the application of the target test current, the rate of change of the current flowing through the conductive loop is obtained; if the rate of change of the current is less than the rate of change threshold and the number of times the rate of change of the current is less than the rate of change threshold is greater than the number of times the rate of change of the current ...

[0135] Step S306: After the loop current of the conductive circuit enters a stable state, collect multiple loop voltage values ​​and corresponding multiple loop current values ​​at both ends of the conductive circuit.

[0136] Step S308: Stop applying the target test current and control the loop current value flowing through the conductive loop to decrease to the minimum value within the third time period.

[0137] The third time period is shorter than the second time period.

[0138] Step S310: Align the multiple loop voltage values ​​at both ends of the conductive loop with the corresponding multiple loop current values ​​to obtain multiple voltage and current sets; use the least squares method to perform linear fitting on the multiple voltage and current sets to obtain a fitting straight line between voltage and current; determine the slope of the fitting straight line as the resistance value of the conductive loop.

[0139] In step S312, if the ripple amplitude of the loop current value flowing through the conductive circuit exceeds the amplitude threshold during the application of the target test current, the application of the target test current is stopped; the duration of the first time period is increased, and the process returns to the step of sequentially applying a strong pulse current for the first time period and a target test current for the second time period to the conductive circuit of the high-voltage switch under test.

[0140] Step S314: Count the number of retries for the step of sequentially applying a strong pulse current for a first time period and a target test current for a second time period to the conductive circuit of the high-voltage switch under test; if the number of retries reaches the threshold, output an alarm signal.

[0141] Among them, the alarm signal is used to characterize the abnormal inductive reactance of the conductive circuit.

[0142] It should be noted that the specific limitations of the above steps can be found in the specific limitations of a rapid testing method for the resistance of a high-voltage switch circuit described above.

[0143] The technical solution of this application embodiment achieves rapid, high-precision, and low-loss testing of the circuit resistance of switching equipment by precisely optimizing the test current application method and voltage sampling timing, and combining efficient data processing and current stability judgment mechanisms. Compared with traditional testing methods that last from several seconds to tens of seconds, this significantly shortens the testing time while ensuring testing accuracy and reducing thermal shock to the equipment.

[0144] Specifically, it greatly shortens the application time of high current, significantly reduces the consumption of the battery inside the test instrument, and greatly reduces the thermal shock and cumulative thermal effect of the test current on the contacts of the switching equipment, improving test safety, and is more friendly to the equipment, extending the service life of the equipment.

[0145] By using "strong pre-charge + stable current" current waveform control and strictly synchronized high-speed voltage sampling, it ensures that stable, anti-inductive and anti-interference effective data can be captured even in transient processes. The calculation accuracy fully meets the national standard requirements, providing an accurate basis for equipment performance evaluation.

[0146] The extremely short testing cycle allows for more frequent preventative testing, enabling the timely detection of potential equipment problems. It also facilitates automated, inspection-based testing, reducing labor costs and improving the overall efficiency of the testing process.

[0147] Traditional testing methods suffer from high energy consumption and significant thermal shock: These methods require applying a large current for several seconds to tens of seconds, leading to rapid battery depletion and prolonged high current application causing substantial thermal shock and cumulative heat effects on the switching contacts, impacting equipment lifespan. This application addresses these issues by reducing the high current application time from seconds to milliseconds and optimizing the current waveform to a three-stage process: "strong pre-charge pulse - precise current stabilization platform - rapid shutdown." This significantly reduces energy consumption and thermal shock.

[0148] Traditional testing suffers from the problem of susceptibility to interference: the sampling window and current application window of traditional tests largely overlap, resulting in long durations and slow current rise. Inductive components in the circuit easily interfere with the sampling results. Furthermore, data processing often uses single-point or simple average calculations, leading to low accuracy. This application's embodiment controls the current waveform through "strong pre-charge + current stabilization," enabling rapid current stabilization and maintaining extremely low ripple (<1%). Voltage sampling is triggered only during the current stabilization phase. Combined with high-speed multi-point sampling and least-squares linear fitting, this effectively avoids interference from inductive components, improves calculation accuracy, and solves the problem.

[0149] Traditional testing suffers from low efficiency and difficulty in automation: Traditional testing is time-consuming (from several seconds to tens of seconds), making frequent preventative testing difficult, and it relies heavily on manual operation, hindering the implementation of automated and inspection-based testing. The "current application-data sampling" process in this application's embodiment can be completed within 100 milliseconds, and even multiple pulse tests require only a few hundred milliseconds. This extremely short testing cycle allows for frequent testing, making automated and inspection-based testing possible and solving the efficiency and automation challenges.

[0150] Traditional current stability assessment suffers from poor reliability and limited adaptability: traditional tests may rely on fixed timers to determine current stability, which cannot adapt to changes in current settling time under different loads (inductive reactance), and are susceptible to noise interference leading to misjudgments, affecting the accuracy of sampling timing. This application's embodiment addresses these issues by real-time monitoring of the current change rate, combined with digital filtering to process noise, and employing a dual criterion of "change rate threshold + duration count." This approach offers strong adaptability, accurately capturing the current stability phase, avoiding false triggers, and resolving the reliability and adaptability problems of stability assessment.

[0151] It should be understood that although the steps in the flowcharts of the embodiments described above are shown sequentially according to the arrows, these steps are not necessarily executed in the order indicated by the arrows. Unless explicitly stated herein, there is no strict order restriction on the execution of these steps, and they can be executed in other orders. Moreover, at least some steps in the flowcharts of the embodiments described above may include multiple steps or multiple stages. These steps or stages are not necessarily completed at the same time, but can be executed at different times. The execution order of these steps or stages is not necessarily sequential, but can be performed alternately or in turn with other steps or at least some of the steps or stages of other steps.

[0152] Based on the same inventive concept, this application also provides a high-voltage switch circuit resistance rapid testing device for implementing the high-voltage switch circuit resistance rapid testing method described above. The solution provided by this device is similar to the solution described in the above method; therefore, the specific limitations in one or more embodiments of the high-voltage switch circuit resistance rapid testing device provided below can be found in the limitations of the high-voltage switch circuit resistance rapid testing method described above, and will not be repeated here.

[0153] In one exemplary embodiment, such as Figure 4 As shown, a rapid testing device for the resistance of a high-voltage switch circuit is provided, comprising:

[0154] The application module 410 is used to sequentially apply a strong pulse current for a first time period and a target test current for a second time period to the conductive circuit of the high-voltage switch under test; the first time period is shorter than the second time period, and the current value of the strong pulse current is greater than the current value of the target test current.

[0155] The acquisition module 420 is used to acquire multiple loop voltage values ​​and corresponding multiple loop current values ​​at both ends of the conductive circuit after the loop current of the conductive circuit enters a stable state during the application of the target test current.

[0156] The determining module 430 is used to determine the circuit resistance value of the conductive circuit based on the multiple circuit voltage values ​​and the corresponding multiple circuit current values ​​at both ends of the conductive circuit.

[0157] In one embodiment, the high-voltage switch circuit resistance rapid testing device further includes a stop module; the stop module is specifically used to stop applying the target test current and control the circuit current value flowing through the conductive circuit to decrease to a minimum value within a third time period; the third time period is shorter than the second time period.

[0158] In one embodiment, the acquisition module 420 is specifically used to acquire the rate of change of the loop current value flowing through the conductive loop; when the rate of change of the current is less than the rate of change threshold, and the number of times the rate of change of the current is less than the rate of change threshold is greater than the number of times threshold is reached, it is determined that the loop current of the conductive loop has entered a stable state.

[0159] In one embodiment, the determining module 430 is specifically used to align multiple loop voltage values ​​at both ends of the conductive loop with corresponding multiple loop current values ​​to obtain multiple voltage and current groups; to perform linear fitting on the multiple voltage and current groups using the least squares method to obtain a fitted straight line between voltage and current; and to determine the slope of the fitted straight line as the resistance value of the conductive loop.

[0160] In one embodiment, the high-voltage switch circuit resistance rapid testing device further includes an early warning module; the early warning module is specifically used to stop applying the target test current if the ripple amplitude of the circuit current value flowing through the conductive circuit exceeds the amplitude threshold during the application of the target test current; increase the duration of the first time period, and return to the step of sequentially applying a strong pulse current for a continuous first time period and a target test current for a continuous second time period to the conductive circuit of the high-voltage switch under test.

[0161] In one embodiment, the early warning module is specifically used to count the number of retries in the step of sequentially applying a strong pulse current for a first time period and a target test current for a second time period to the conductive circuit of the high-voltage switch under test; when the number of retries reaches a threshold, an alarm signal is output; the alarm signal is used to characterize the abnormal inductive reactance of the conductive circuit.

[0162] Each module in the aforementioned high-voltage switch circuit resistance rapid testing device can be implemented entirely or partially through software, hardware, or a combination thereof. These modules can be embedded in the processor of a computer device in hardware form or independent of it, or stored in the memory of a computer device in software form, so that the processor can call and execute the corresponding operations of each module.

[0163] In one exemplary embodiment, a computer device is provided, which may be a testing device, and its internal structure diagram may be as follows: Figure 5 As shown, the computer device includes a processor, memory, input / output interfaces, a communication interface, a display unit, and an input device. The processor, memory, and input / output interfaces are connected via a system bus, and the communication interface, display unit, and input device are also connected to the system bus via the input / output interfaces. The processor provides computing and control capabilities. The memory includes non-volatile storage media and internal memory. The non-volatile storage media stores the operating system and computer programs. The internal memory provides an environment for the operation of the operating system and computer programs stored in the non-volatile storage media. The input / output interfaces are used for exchanging information between the processor and external devices. The communication interface is used for wired or wireless communication with external terminals; wireless communication can be achieved through Wi-Fi, mobile cellular networks, Near Field Communication (NFC), or other technologies. When the computer program is executed by the processor, it implements a method for rapid testing of the resistance of a high-voltage switching circuit. The display unit is used to form a visually visible image and can be a display screen, a projection device, or a virtual reality imaging device. The display screen can be an LCD screen or an e-ink screen. The input device of the computer device can be a touch layer covering the display screen, or buttons, trackballs, or touchpads set on the casing of the computer device, or external keyboards, touchpads, or mice, etc.

[0164] Those skilled in the art will understand that Figure 5 The structure shown is merely a block diagram of a portion of the structure related to the present application and does not constitute a limitation on the computer device to which the present application is applied. Specific computer devices may include more or fewer components than those shown in the figure, or combine certain components, or have different component arrangements.

[0165] In one exemplary embodiment, a computer device is provided, including a memory and a processor, wherein the memory stores a computer program, and the processor executes the computer program to implement the steps in the above-described method embodiments.

[0166] In one embodiment, a computer-readable storage medium is provided having a computer program stored thereon, which, when executed by a processor, implements the steps in the above method embodiments.

[0167] In one embodiment, a computer program product is provided, including a computer program that, when executed by a processor, implements the steps in the above method embodiments.

[0168] It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data used for analysis, data stored, data displayed, etc.) involved in this application are all information and data authorized by the user or fully authorized by all parties, and the collection, use and processing of the relevant data must comply with relevant regulations.

[0169] Those skilled in the art will understand that all or part of the processes in the methods of the above embodiments can be implemented by a computer program instructing related hardware. The computer program can be stored in a non-volatile computer-readable storage medium, and when executed, it can include the processes of the embodiments of the above methods. Any references to memory, databases, or other media used in the embodiments provided in this application can include at least one of non-volatile memory and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetic random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. By way of illustration and not limitation, RAM can take many forms, such as Static Random Access Memory (SRAM) or Dynamic Random Access Memory (DRAM). The databases involved in the embodiments provided in this application may include at least one type of relational database and non-relational database. Non-relational databases may include, but are not limited to, blockchain-based distributed databases. The processors involved in the embodiments provided in this application may be general-purpose processors, central processing units, graphics processing units, digital signal processors, programmable logic devices, quantum computing-based data processing logic devices, artificial intelligence (AI) processors, etc., and are not limited to these.

[0170] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this application.

[0171] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are specific and detailed, they should not be construed as limiting the scope of this patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this application should be determined by the appended claims.

Claims

1. A rapid testing method for the resistance of a high-voltage switch circuit, characterized in that, The method includes: A strong pulse current lasting for a first time period and a target test current lasting for a second time period are sequentially applied to the conductive circuit of the high-voltage switch under test; the first time period is shorter than the second time period, and the current value of the strong pulse current is greater than the current value of the target test current; During the application of the target test current, after the loop current of the conductive circuit enters a stable state, multiple loop voltage values ​​and corresponding multiple loop current values ​​are collected at both ends of the conductive circuit. The circuit resistance value of the conductive circuit is determined based on the multiple circuit voltage values ​​and corresponding multiple circuit current values ​​at both ends of the conductive circuit.

2. The method according to claim 1, characterized in that, After acquiring the multiple loop voltage values ​​and corresponding multiple loop current values ​​at both ends of the conductive loop, the method further includes: Stop applying the target test current and control the loop current value flowing through the conductive loop to decrease to a minimum value within a third time period; the third time period is shorter than the second time period.

3. The method according to claim 1, characterized in that, After the loop current of the conductive circuit reaches a stable state, and before acquiring multiple loop voltage values ​​and corresponding multiple loop current values ​​across the conductive circuit, the method further includes: Obtain the rate of change of the loop current value flowing through the conductive loop; If the rate of change of the current is less than the rate of change threshold, and the number of times the rate of change of the current is less than the rate of change threshold is greater than the number of times the rate of change is less than the number of times the current is less than the rate of change threshold is determined to be that the loop current of the conductive circuit has entered a stable state.

4. The method according to claim 1, characterized in that, Determining the circuit resistance value of the conductive circuit based on multiple circuit voltage values ​​and corresponding multiple circuit current values ​​at both ends of the conductive circuit includes: Align the multiple loop voltage values ​​at both ends of the conductive loop with the corresponding multiple loop current values ​​to obtain multiple voltage and current groups; The least squares method is used to perform linear fitting on the multiple voltage and current groups to obtain a fitted straight line between voltage and current. The slope of the fitted straight line is determined as the resistance value of the conductive circuit.

5. The method according to claim 1, characterized in that, The method further includes: If the ripple amplitude of the loop current value flowing through the conductive loop exceeds the amplitude threshold during the application of the target test current, the application of the target test current shall be stopped. Increase the duration of the first time period, and return to the step of sequentially applying a strong pulse current for a first time period and a target test current for a second time period to the conductive circuit of the high-voltage switch under test.

6. The method according to claim 5, characterized in that, The method further includes: The number of retries is counted in the step of sequentially applying a strong pulse current for a first time period and a target test current for a second time period to the conductive circuit of the high-voltage switch under test. If the number of retries reaches a threshold, an alarm signal is output; the alarm signal is used to characterize an abnormality in the inductive reactance of the conductive circuit.

7. A rapid testing device for the resistance of a high-voltage switch circuit, characterized in that, The device includes: An application module is used to sequentially apply a strong pulse current lasting for a first time period and a target test current lasting for a second time period to the conductive circuit of the high-voltage switch under test; the first time period is shorter than the second time period, and the current value of the strong pulse current is greater than the current value of the target test current. The acquisition module is used to acquire multiple loop voltage values ​​and corresponding multiple loop current values ​​at both ends of the conductive circuit after the loop current of the conductive circuit enters a stable state during the application of the target test current. The determination module is used to determine the circuit resistance value of the conductive circuit based on multiple circuit voltage values ​​and corresponding multiple circuit current values ​​at both ends of the conductive circuit.

8. A computer device comprising a memory and a processor, wherein the memory stores a computer program, characterized in that, When the processor executes the computer program, it implements the steps of the method according to any one of claims 1 to 6.

9. A computer-readable storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by a processor, it implements the steps of the method according to any one of claims 1 to 6.

10. A computer program product, comprising a computer program, characterized in that, When the computer program is executed by a processor, it implements the steps of the method according to any one of claims 1 to 6.

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