mass analyzer

Abstract

A mass analyzer is provided. The mass analyzer includes an ion source, a plurality of electrodes, a jitter compensation motor, and a voltage source. The ion source is configured to output ions along an ion trajectory. An ion detector is configured to detect the ions along the ion trajectory. The plurality of electrodes are arranged along the ion trajectory. Each electrode of the plurality of electrodes has an associated mass shift per volt perturbation. A jitter compensation electrode is disposed along the ion trajectory. The jitter compensation electrode and the plurality of electrodes are respectively connected to the voltage source. The jitter compensation electrode has a mass shift per volt perturbation configured to compensate for a net mass shift per volt perturbation of the plurality of electrodes.

Description

[0001] This invention application is a divisional application of the invention patent application with application number 202210618295.3, application date June 1, 2022, entitled "Voltage Supply for Quality Analyzer". Technical Field

[0002] This disclosure relates to a quality analyzer. In particular, this disclosure relates to a power supply for the quality analyzer. Background Technology

[0003] Commercial high-resolution precision mass analyzers typically need to measure mass values ​​within a few ppm of the true value, with sub-ppm being highly advantageous. When using external calibration, accurate mass measurements depend on the mV-level stability of the high-voltage power supply over a period of time after calibration. For such power supplies, two main forms of voltage instability can affect the measurement accuracy of the mass analyzer: jitter and power supply drift.

[0004] Shaking

[0005] Power supply jitter occurs due to voltage supply instability near or above the analyzer's acquisition frequency. Time-of-flight analyzers operate between 10 Hz and 30,000 Hz, with ion flight times ranging from tens of microseconds to milliseconds. Time-averaging the spectrum can mitigate the effects of power supply instability at frequencies higher than the average rate. Such time-averaging processes typically deliver an average spectrum from 10 Hz to 200 Hz. However, these techniques cannot compensate for jitter at the averaging frequency or lower.

[0006] If jitter is significant at or below the average frequency, the resolution of the average ToF spectrum will also be compromised. At very high frequencies (MHz+), noise can be averaged over the time it takes for ions to spend on a single element of the analyzer, and its impact on quality accuracy and resolution is greatly reduced.

[0007] To counteract some of the effects of power supply jitter, filtering of the power supply voltage is known. Active or passive low-pass filters are typically used to remove higher-frequency ripple. Suppressing such instability usually comes at the cost of additional resistors and high-voltage capacitors, resulting in improvements in power, safety, or features such as polarity switching. Furthermore, such filters cannot address any noise that may still be introduced between the filter and the electrodes.

[0008] Power drift

[0009] The power supply will also drift over time due to low-frequency noise sources and local temperature variations. During preheating, the power supply may drift by hundreds of ppm before reaching equilibrium, and typically by tens of ppm for every degree change in ambient temperature.

[0010] One known technique to counteract the effects of temperature drift on a mass analyzer is to control the temperature of the entire instrument (which also helps with mass errors caused by thermal expansion of the analyzer), the entire power supply, or the temperature of critical components. For example, Atsuhiko Toyama's white paper "On the Accurate Understanding of Mass Measurement Accuracy in Q-TOF MS," published on April 6, 2019, discloses a time-of-flight mass analyzer with improved flight tube temperature management. The flight tube includes a black nickel plating on the flight tube housing to maximize thermal radiation.

[0011] In this context, the purpose of this disclosure is to provide an improved, or at least commercially relevant, alternative power supply or quality analyzer. Summary of the Invention

[0012] According to a first aspect of this disclosure, a voltage supply for a quality analyzer is provided. The voltage supply includes a voltage source, a first voltage output terminal, a second voltage output terminal, and a voltage divider network. The first voltage output terminal is configured to provide a first voltage to a first electrode of the quality analyzer, the first electrode having a first mass offset per volt per disturbance. The second voltage output terminal is configured to provide a second voltage to a second electrode of the quality analyzer, the second electrode having a second mass offset per volt per disturbance. The second mass offset per volt per disturbance is opposite to the first mass offset per volt per disturbance. The voltage divider network is connected to the voltage source, the first voltage output terminal, and the second voltage output terminal. The voltage divider network includes a first resistor and a second resistor. The first resistor is configured to define the first voltage and has a first temperature coefficient. The second resistor is configured to define the second voltage and has a second temperature coefficient. The second temperature coefficient is selected based on the first and second mass offsets per volt per disturbance and the first temperature coefficient, such that the first mass offset associated with the first electrode is compensated by the second mass offset associated with the second electrode.

[0013] According to the voltage supply of the first aspect, a first voltage and a second voltage are respectively supplied to the first and second electrodes of the mass analyzer. Perturbations in the voltage applied to these electrodes cause a shift in the mass of the ions detected by the mass analyzer. It should be understood that, depending on the geometry of the mass analyzer / electrode, the relationship between the mass shift and the voltage perturbation (i.e., the mass shift per volt of perturbation) can be positive or negative. For the power supply of the first aspect, temperature changes in the voltage supply will cause changes in the resistance of the first and second resistors in the voltage divider network. This, in turn, causes a change in the voltage output of the voltage supply, thereby causing a change in the mass detected by the mass analyzer.

[0014] The first and second resistors in the first aspect have specific temperature coefficients. The temperature coefficient of each selected resistor will determine the mass shift per Kelvin temperature change in the mass analyzer. According to the first aspect, temperature coefficients are selected such that the first mass shift associated with the first electrode is compensated by the opposite second mass shift associated with the second electrode. That is, instead of simply selecting the first and second resistors with the lowest temperature coefficients to minimize resistance drift in the voltage supply, one or more resistors with higher temperature coefficients can be intentionally selected such that the total mass shift per Kelvin in the mass analyzer is reduced.

[0015] Although the voltage supply of the first aspect pertains to a voltage supply comprising two voltage outputs, it should be understood that in some embodiments, the voltage supply may include multiple voltage outputs. For example, the voltage supply may include at least three, four, or five voltage outputs for connection to the corresponding electrodes of the quality analyzer. Since each electrode of the quality analyzer has an associated per-volt mass offset perturbation relationship, the resistors of the voltage divider network can be selected to have a suitable temperature coefficient in order to reduce the total mass offset per Kelvin temperature change, in accordance with the principles of the first aspect.

[0016] According to a second aspect of this disclosure, a voltage supply for a quality analyzer is provided. The voltage supply includes a voltage source, a first voltage output terminal, a second voltage output terminal, and a voltage divider network. The first voltage output terminal is configured to provide a first voltage to a first electrode of the quality analyzer, the first electrode having a first mass offset per volt per disturbance. The second voltage output terminal is configured to provide a second voltage to a second electrode of the quality analyzer, the second electrode having a second mass offset per volt per disturbance. The second mass offset per volt per disturbance is opposite to the first mass offset per volt per disturbance. The voltage divider network is connected to the voltage source, the first voltage output terminal, and the second voltage output terminal. The voltage divider network includes a first resistor and a second resistor. The first resistor is configured to define the first voltage and has a first aging factor. The second resistor is configured to define the second voltage and has a second aging factor. A second aging factor is selected based on the first and second mass offsets per volt per disturbance and the first aging factor, such that the first mass offset associated with the first electrode is compensated by the second mass offset associated with the second electrode.

[0017] The voltage supply of the second aspect can have a similar structure to the voltage supply of the first aspect. Instead of selecting resistors based on temperature coefficients, it selects resistors based on aging coefficients. That is, the voltage supply of the second aspect addresses the problem of resistor resistance changing over time. For example, the resistance of a given resistor at a stable temperature may change (aging) over several weeks. Such aging changes may be independent of any temperature dependence. For example, in embodiments where the voltage supply temperature is carefully controlled to reduce power drift caused by temperature changes, power drift may still occur due to resistor aging. The voltage supply of the second aspect addresses this problem by providing resistors with aging coefficients selected to reduce the impact of resistor aging on the quality offset of the quality analyzer. It should be understood that the aging coefficient of the resistor can be selected according to a principle similar to that of the first aspect described above.

[0018] In some embodiments, it should be understood that the voltage supply can select the first resistor and the second resistor based on a temperature coefficient and an aging coefficient. Therefore, in some embodiments, a voltage supply combining the first and second aspects can be provided. That is, in some embodiments, the first resistor has a first temperature coefficient and a first aging coefficient, and the second resistor has a second temperature coefficient and a second aging coefficient. The second temperature coefficient and the second aging coefficient can then be selected based on the first and second mass offsets per volt of disturbance, the first temperature coefficient, and the first aging coefficient, such that the first mass offset associated with the first electrode is compensated by the second mass offset associated with the second electrode. Therefore, the voltage supply can provide a voltage output to a quality analyzer that reduces or eliminates mass offset in response to temperature changes and resistor aging.

[0019] In some embodiments, the first temperature coefficient of the first resistor is different from the second temperature coefficient of the second resistor. In some embodiments, the first aging coefficient of the first resistor is different from the second aging coefficient of the second resistor.

[0020] In some embodiments, the first temperature coefficient of the first resistor is no greater than 50 ppm / K. In some embodiments, the second temperature coefficient of the second resistor is greater than the first temperature coefficient. Therefore, the first resistor is selected to have a relatively low temperature coefficient to reduce the total voltage change per Kelvin of the first electrode, and the second resistor can be selected to have an intentionally higher temperature coefficient to reduce or eliminate the mass shift per Kelvin of the mass analyzer.

[0021] In some embodiments, the first aging factor of the first resistor is no greater than 50 ppm / week. In some embodiments, the second aging factor of the second resistor is greater than the first aging factor. Therefore, the first resistor is selected to have a relatively low aging factor to reduce the total voltage variation of the first electrode per week, and the second resistor can be selected to have an intentionally high aging factor to reduce or eliminate the mass offset of the mass analyzer per week.

[0022] In some embodiments, the first electrode of the quality analyzer has a first mass offset of at least 0.001 ppm / mV per volt of perturbation, and the second electrode of the quality analyzer has a second mass offset of at least -0.001 ppm / mV per volt of perturbation. It should be understood that in many cases, the magnitudes (i.e., absolute values) of the first and second mass offsets per volt of perturbation will be different, such that the quality analyzer will have a total (synthetic) mass offset (positive or negative) per volt of perturbation. The power supply voltages of the first and second aspects are intended to reduce the total mass offset per volt of perturbation to zero.

[0023] In some embodiments, the first voltage output terminal is a first DC voltage output terminal, and / or the second voltage output terminal is a second DC voltage output terminal. In some embodiments, the first voltage output terminal and / or the second voltage output terminal can be the DC bias voltage of the corresponding electrode, wherein the RF voltage is superimposed on the corresponding DC bias voltage. In some embodiments, the first voltage output terminal and the second voltage output terminal are used to define the amplitude of the corresponding RF voltage.

[0024] According to a third aspect of this disclosure, a mass analyzer is provided. The mass analyzer includes: an ion source, an ion detector, a first electrode, a second electrode, and a voltage supply. The ion source is configured to output ions along an ion trajectory. The ion detector is configured to detect ions along the ion trajectory. The first electrode is arranged along the ion trajectory and has a first mass offset per volt per disturbance. The second electrode is arranged along the ion trajectory and has a second mass offset per volt per disturbance, wherein the second mass offset per volt per disturbance is opposite to the first mass offset per volt per disturbance. The voltage supply includes a voltage source, a first voltage output, a second voltage output, and a voltage divider network. The first voltage output is configured to provide a first voltage to the first electrode. The second voltage output is configured to provide a second voltage to the second electrode. The voltage divider network is connected to the first voltage output, the second voltage output, and the voltage source. The voltage divider network includes: a first resistor configured to define the first voltage, the first resistor having a first temperature coefficient; and a second resistor. The second resistor is configured to define the second voltage and has a second temperature coefficient. The second temperature coefficient is selected based on the first and second mass offsets per volt of disturbance and the first temperature coefficient, such that the first mass offset associated with the first electrode is compensated by the second mass offset associated with the second electrode.

[0025] Therefore, the quality analyzer of the third aspect may include the voltage supply according to the first aspect of this disclosure.

[0026] According to a fourth aspect of this disclosure, a mass analyzer is provided. The mass analyzer includes: an ion source, an ion detector, a first electrode, a second electrode, and a voltage supply. The ion source is configured to output ions along an ion trajectory. The ion detector is configured to detect ions along the ion trajectory. The first electrode is arranged along the ion trajectory and has a first mass offset per volt per disturbance. The second electrode is arranged along the ion trajectory and has a second mass offset per volt per disturbance, wherein the second mass offset per volt per disturbance is opposite to the first mass offset per volt per disturbance. The voltage supply includes a voltage source, a first voltage output, a second voltage output, and a voltage divider network. The first voltage output is configured to provide a first voltage to the first electrode. The second voltage output is configured to provide a second voltage to the second electrode. The voltage divider network is connected to the first voltage output, the second voltage output, and the voltage source. The voltage divider network includes: a first resistor configured to define the first voltage, the first resistor having a first aging factor; and a second resistor. The second resistor is configured to define the second voltage and has a second aging factor. A second aging factor is selected based on the first and second mass offsets per volt of disturbance and a first temperature coefficient, such that the first mass offset associated with the first electrode is compensated by the second mass offset associated with the second electrode.

[0027] Therefore, the quality analyzer of the fourth aspect may include the voltage supply according to the second aspect of this disclosure.

[0028] It should be understood that in some embodiments, the quality analyzer may be provided with a voltage supply, wherein a first resistor and a second resistor are selected according to the first and second aspects of this disclosure.

[0029] In some embodiments, the first temperature coefficient of the first resistor is different from the second temperature coefficient of the second resistor. In some embodiments, the first aging coefficient of the first resistor is different from the second aging coefficient of the second resistor.

[0030] In some embodiments, the mass analyzer further includes a jitter compensation electrode arranged along the ion trajectory and connected to a voltage source. The jitter compensation electrode has a mass offset per volt of perturbation, which is configured to compensate for the net mass offset per volt of perturbation of the first and second electrodes. Therefore, the mass analyzer may be provided with additional electrodes to counteract the effects of any jitter in the voltage source. Such voltage jitter can be independent of any variations due to temperature and / or resistor aging. Therefore, any voltage disturbances provided by the voltage source that may affect the voltage divider network are also reproduced on the jitter compensation electrode. Because the jitter compensation electrode has an associated mass offset per volt that is opposite to the net mass offset per volt of the first and second electrodes, the jitter compensation electrode compensates for the mass offset applied to the first and second electrodes by the voltage disturbance.

[0031] Although the jitter compensation electrode described above is configured to compensate for the net mass offset of the first and second electrodes of the quality analyzer, it should be understood that in other embodiments, the jitter compensation electrode may be configured to compensate for the net mass offset of multiple electrodes of the quality analyzer. That is, the jitter compensation electrode may be configured to compensate for at least the net mass offset of the electrode with the most significant mass offset per volt of disturbance. For example, the jitter compensation electrode may compensate for at least three electrodes of the quality analyzer with the most significant (i.e., highest) mass offset per volt of disturbance. In some embodiments, the jitter compensation electrode may compensate for at least five, seven, ten, fifteen, or twenty electrodes of the quality analyzer with the most significant (i.e., highest) mass offset per volt of disturbance.

[0032] A jitter compensation electrode can be an electrode positioned at a point along the ion trajectory. That is, the jitter compensation electrode can be positioned at any point along the ion trajectory between the ion source and the ion detector. For example, the jitter compensation electrode can be positioned along the ion trajectory before, between, or after the first and second electrodes. In some embodiments, the jitter compensation electrode can interact with the ion trajectory multiple times. That is, ions traveling along the ion trajectory can cross the electric field provided by the jitter compensation electrode multiple times as they travel between the ion source and the ion detector. For example, in a ToF mass analyzer (or multiple reflection ToF), a jitter compensation electrode can be provided such that the electric field extending from the jitter compensation electrode intersects the ion trajectory multiple times.

[0033] In some embodiments, the jitter compensation electrode is connected in parallel with the voltage divider network to a voltage source. In some embodiments, the jitter compensation electrode is capacitively coupled to the voltage source. Therefore, any voltage disturbances provided by the voltage source that may affect the voltage divider network are also reproduced on the jitter compensation electrode.

[0034] In some embodiments, the mass analyzer includes a time-of-flight (ToF) mass analyzer, wherein an ion detector and a first electrode and a second electrode are disposed within the ToF mass analyzer. In some embodiments, the mass analyzer includes an ion mirror comprising the first electrode and the second electrode. For example, the ToF mass analyzer may be provided with an ion mirror. In some embodiments, the ToF mass analyzer may be provided with a pair of opposing ion mirrors. In some embodiments, the ToF mass analyzer may be a multiple reflection ToF mass analyzer comprising a pair of ion mirrors. In some embodiments, in addition to the pair of ion mirrors, a jitter compensation electrode may also be provided.

[0035] In some embodiments, the mass analyzer includes a Fourier transform mass analyzer, such as an orbital trap mass analyzer or an electrostatic ion trap mass analyzer.

[0036] Although the third and fourth aspects disclosed above may be combined with jitter compensation electrodes in addition to the voltage supply of the first and / or second aspects, it should be understood that in some embodiments, the jitter compensation electrodes may be provided independently of the voltage supply described above.

[0037] Therefore, according to a fifth aspect of this disclosure, a mass analyzer is provided. The mass analyzer includes an ion source, an ion detector, a plurality of electrodes, a jitter compensation electrode, and a voltage source. The ion source is configured to output ions along an ion trajectory. The ion detector is configured to detect ions along the ion trajectory. The plurality of electrodes are arranged along the ion trajectory. Each of the plurality of electrodes has an associated mass offset per volt of perturbation. The jitter compensation electrode is arranged along the ion trajectory. The jitter compensation electrode and each of the plurality of electrodes are connected to the voltage source. The jitter compensation electrode has a mass offset per volt of perturbation, said mass offset per volt of perturbation being configured to compensate for the net mass offset per volt of perturbation of the plurality of electrodes.

[0038] Therefore, according to a fifth aspect of this disclosure, jitter compensation electrodes can be provided to counteract the effects of voltage source jitter on the electrodes of the quality analyzer. In particular, jitter compensation electrodes can be provided to counteract the effects of voltage source jitter on the electrodes of the quality analyzer. That is, each of the plurality of electrodes for which jitter compensation is to be performed can be provided as part of the quality analyzer. For example, the quality analyzer may include a ToF or Fourier transform quality analyzer.

[0039] The quality analyzer of the fifth aspect may incorporate any of the foregoing features associated with the first to fourth aspects of this disclosure. Attached Figure Description

[0040] Embodiments of this disclosure will now be described by way of example only with reference to the accompanying drawings, in which: Figure 1 A schematic diagram of a quality analyzer and a voltage supply according to a first embodiment of the present disclosure is shown; Figure 2 A schematic diagram of a quality analyzer according to a second embodiment of the present disclosure is shown; Figure 3 A schematic diagram of the jitter compensation electrode is shown; Figure 4 A schematic diagram of a quality analyzer according to a third embodiment of the present disclosure is shown; and Figure 5 A schematic diagram of a quality analyzer according to a fourth embodiment of the present disclosure is shown. Detailed Implementation

[0041] According to a first embodiment of this disclosure, a quality analyzer 1 is provided. Figure 1 A schematic diagram of quality analyzer 1 is shown. (As shown) Figure 1 As shown, the quality analyzer 1 includes a voltage supply 10 for the quality analyzer 1. Figure 1As shown, the voltage supply 10 includes a first voltage output terminal 12, a second voltage output terminal 14, a voltage source 16, and a voltage divider network 20. The mass analyzer 1 also includes an ion source 30, a first electrode 32, a second electrode 34, and an ion detector 36.

[0042] Figure 1 The mass analyzer 1 shown schematically is a time-of-flight (ToF) mass analyzer. Although relative to Figure 1 The embodiments provided provide a description of embodiments of the invention, but it should be understood that the invention can be applied to any mass spectrometer incorporating electrodes that may be subject to mass shifts caused by power supply drift and / or jitter.

[0043] Figure 1 The mass analyzer includes an ion source 30. The ion source is configured to output ions along an ion trajectory. The ion trajectory is... Figure 1 The schematic diagram shows the ion trajectory extending from the ion source 30 into the ToF flight chamber 38. A first electrode 32 is arranged in the flight chamber 38 as an ion mirror. The ion mirror is configured to reflect ions back to the entrance of the flight chamber 38, where an ion detector 36 is located. The principles of ToF operation involving one or more ion mirrors are known to those skilled in the art and will not be described in further detail herein.

[0044] The ion source 30, which outputs ions to the ToF, can be any suitable ion source. For example, the ion source 30 may include an ion trap (not shown) that accumulates ions before output to the ToF. The ion trap may in turn be connected to other ion optics components of a mass spectrometer system configured to generate and transport ions to the ion trap. Alternatively, the ion source may be an electrospray ion source configured to generate and output ions to the ToF.

[0045] To reflect ions traveling along their ion trajectories back to the ion detector 38, the first electrode 32 and the second electrode 34 are respectively connected to the first voltage output terminal 12 and the second voltage output terminal 14 of the voltage supply 10. The voltage supply is configured to output a first voltage (V1) to the first electrode 12 and a second voltage (V2) to the second electrode 14.

[0046] for Figure 1The Time-of-Flight (ToF) mass analyzer determines the mass of an ion based on the time it takes for an ion to travel from the ion source 30 to the ion detector 36. Ions with higher masses take longer to travel from the ion source 30 to the ion detector 36 than ions with lower masses. The time taken depends on the ion mass and the magnitude of the voltages applied to the first electrode 32 and the second electrode 34. Typically, the voltages applied to the first electrode 32 and the second electrode 34 are calibrated before analysis so that they are known (and are usually kept constant during analysis). This, in turn, allows the ion mass to be inferred from the time of flight. Therefore, it should be understood that any unexpected variation in the voltages applied to the first electrode 32 and the second electrode 34 can lead to unexpected variations in the ion time of flight, and thus errors in the determined ion mass.

[0047] exist Figure 1 In this embodiment, the first electrode 32 acts as an ion mirror, reflecting ions back to the entrance of the ToF. For positively charged ions, a positive first voltage V1 is applied to the first electrode 32. A positive perturbation of V1 has the effect of increasing the repulsive potential of the first electrode, thus effectively shortening the ion flight path of ions of a given mass (i.e., reducing the ion flight time). That is, a positive perturbation of the first voltage V1 results in a negative shift in the determined mass (relative to the mass determined without voltage perturbation). By performing mass analysis on ions of known mass using the mass analyzer 1 at two different first voltages V1 and determining the resulting mass shift (as a percentage of the known mass of the ion), the amount of mass shift that occurs when the first voltage is perturbed can be calculated. Based on the mass shift and the voltage difference, the relationship between the first voltage V1 applied to the first electrode and the resulting mass shift can be determined. That is, the first electrode 32 has a first mass shift Δ1 per volt of perturbation associated with it (i.e., the amount of mass shift caused by a 1 V perturbation of the voltage applied to the first electrode). For example, the first electrode 32 may have a first mass offset Δ1 of -0.01 ppm / mV per volt of perturbation. In such a case, a voltage perturbation of +100 mV would result in a measurement mass offset of -1 ppm (parts per million, or 0.0001%) of the ions. Correspondingly, a voltage perturbation of -100 mV would result in a measurement mass offset of +1 ppm of the ions.

[0048] exist Figure 1In this embodiment, the second electrode 34 can be biased to increase the time it takes for ions to travel through the mass analyzer. Therefore, a positive voltage perturbation applied to the second electrode results in an increase in the ion mass measured by the ToF. That is, the second electrode has a second mass offset Δ2 per volt of perturbation associated with it, which is opposite to that of the first electrode 32. The mass offset characteristic per volt of perturbation of the second electrode 34 can be determined in a manner similar to that of the first electrode 32 described above. For example, the second mass offset characteristic Δ2 per volt of perturbation associated with the second electrode could be +0.01 ppm / mV. Therefore, a voltage perturbation of 100 mV applied to the second electrode results in a deviation of +1 ppm in the mass measured by the mass analyzer.

[0049] To apply a first voltage V1 and a second voltage V2 to the quality analyzer 1, a voltage supply 10 is provided. The voltage supply 10 includes a first voltage output terminal 12 configured to provide the first voltage V1 to a first electrode 32. The voltage supply also includes a second voltage output terminal 14 configured to provide the second voltage V2 to a second electrode 34. As described above, the first electrode 32 has a first mass offset Δ1 per volt of disturbance associated with it, and the second electrode 34 has a second mass offset Δ2 per volt of disturbance associated with it, wherein the second mass offset per volt of disturbance is opposite to the first mass offset per volt of disturbance (i.e., Δ1 and Δ2 have opposite signs (positive or negative)).

[0050] like Figure 1 As shown, the voltage supply 10 includes a voltage source 16. The voltage source 16 is a voltage source that, in conjunction with a voltage divider network, provides a desired voltage output to a first voltage output terminal and a second voltage output terminal 12, 14. Therefore, in Figure 1 In this embodiment, voltage source 16 may be a DC voltage source, preferably a DC voltage exceeding 1000V. Various circuits for providing high voltage are known to those skilled in the art.

[0051] Voltage divider network 20 is connected to voltage source 16, first voltage output terminal 12 and second voltage output terminal 14. Figure 1 A voltage divider network 20 is schematically shown. The voltage divider network 20 includes a first resistor 22 and a second resistor 24. The first resistor 22 is configured to define a first voltage V1 output to a first voltage output terminal 12. Although in Figure 1 In this embodiment, the first voltage V1 is shown as being defined by the first resistor 22; however, it should be understood that in other embodiments, the first voltage V1 may be defined by one or more first resistors. Various voltage divider network circuits for providing the desired voltage from the DC voltage output terminal of the voltage source 16 are known to those skilled in the art and therefore will not be discussed further in detail herein.

[0052] Similar to the first resistor 22, the second resistor 24 is configured to define a second voltage V2. The second voltage V2 may also be defined by one or more second resistors 24.

[0053] The first and second resistors have corresponding temperature coefficients (C1, C2). The temperature coefficient of each resistor represents the degree to which the nominal resistance value changes with temperature. Conventionally, for applications where temperature stability is critical, resistors with low temperature coefficients (i.e., resistors whose resistance changes relatively little with temperature) are selected. In embodiments of this disclosure, a second temperature coefficient of the second resistor is selected based on the first and second mass offsets per volt of disturbance and the first temperature coefficient, such that the first mass offset associated with the first electrode is compensated by the second mass offset associated with the second electrode. Therefore, resistors with different temperature coefficients can be selected to balance the mass offsets occurring in the mass analyzer.

[0054] As an example, in this embodiment, the first electrode 32 is provided with a first voltage V1 of +6000 V, while the second electrode 34 is provided with a second voltage V2 of +3000 V. The first electrode has a first mass offset Δ1 associated with a per-volt perturbation of -0.01 ppm / mV. The second electrode has a second mass offset Δ2 with a per-volt perturbation of +0.01 ppm / mV. In such an example, the first resistor 22 selected to define the first voltage output terminal 12 of the voltage divider network is selected to have a first temperature coefficient C1 of 5 ppm / K (i.e., a resistance change of 0.0005% per K). A relatively low temperature coefficient is chosen for this resistor to minimize the overall temperature variation of the voltage supply 10.

[0055] Choosing this type of first temperature coefficient results in a change of approximately 30 mV in the first voltage V1 for every one Kelvin increase in temperature (i.e., δ). V1 = C1 V1). Therefore, the first electrode has δ m1 = Δ1 δ V1 = -0.3 ppm / K associated mass shift (δ) m1 )

[0056] Therefore, a second resistor 22 is chosen to balance this mass offset (i.e., δ). m2 = +0.3 ppm / K). That is, a second resistor is chosen to provide the voltage perturbation per Kelvin, i.e., δ. V2 = δ m2 / Δ2 = 30 mV. For the second electrode 34, the ideal temperature coefficient of the corresponding second resistor is therefore approximately C2 = δ V2 / V2 = 10 ppm / K. Therefore, by taking into account the effect of temperature-induced voltage disturbances on the final mass offset of the mass analyzer 1, selecting a second resistor with an intentionally higher temperature coefficient can actually provide a temperature compensation effect. Note that in the example above, it is assumed that a single resistor primarily defines the output voltage of each electrode 32, 34, and similarly, the temperature coefficient of the single resistor is used to calculate the mass offset associated with each voltage output.

[0057] For other voltage divider networks, the relationship between the temperature coefficients of (one or more) resistors and the voltage output of the voltage divider network may differ. For example, a resistor divider comprising multiple resistors can use a combination of resistors with different thermal coefficients, which can be selected to provide a more accurate balance of mass offsets in the quality analyzer. Therefore, the principle of selecting the temperature coefficients of one or more resistors to compensate for mass offsets in the quality analyzer can be applied to any suitable voltage supply for quality analyzer 1.

[0058] The first resistor 22 and the second resistor 24 can be selected from resistors having temperature coefficients such as 1 ppm / K, 2 ppm / K, 5 ppm / K, 10 ppm / K, 20 ppm / K, 50 ppm / K, 100 ppm / K, 200 ppm / K, 500 ppm / K, 1000 ppm / K, etc. In some embodiments, a resistor with a precise desired temperature coefficient may not be available; in such cases, a second resistor (or a combination of the first and second resistors) with a temperature coefficient that minimizes the total (net) mass offset can be selected.

[0059] Although the above examples are provided accordingly for the temperature coefficients C1, C2 of the first resistor 22 and the second resistor 24, it should be understood that similar selections can also be made for the aging coefficients (A1, A2) of the resistors. The aging coefficient of a resistor reflects the change in its resistance over time. A resistor may age due to repetitive voltage cycling or simply due to the passage of time. One way to characterize resistor aging is as an aging coefficient expressed as parts per million (ppm / week) of resistance change, where the passage of time is the primary mechanism of resistor aging. In such embodiments, the aging coefficient of the resistor can be selected in an attempt to compensate for changes in the mass offset of the quality analyzer 1 over time. For example, for resistors with the parameters described above... Figure 1 The quality analyzer can select a first resistor 22 with an aging factor A1 of 20 ppm / week. In this case, a second resistor 24 with an aging factor of 40 ppm / week will compensate for the quality shift caused by the aging of the first resistor.

[0060] It should also be understood that the first resistor and the second resistor in the first embodiment can be selected with corresponding aging coefficients and temperature coefficients, so that the voltage supply 10 compensates for the quality deviation caused by both temperature changes and aging changes.

[0061] although Figure 1 The first embodiment shown illustrates a mass analyzer 1 including a first electrode 32 and a second electrode 34; however, it should be understood that other electrodes (or indeed other voltage-controlled ion optics devices) may also be present, each electrode potentially having an associated mass offset per volt of perturbation. Each of these electrodes / devices can be compensated for using a voltage supply with appropriately selected resistors.

[0062] As another example, Figure 2 A schematic diagram of a quality analyzer 100 according to a second embodiment of the present disclosure is shown.

[0063] Similar to the first embodiment, the quality analyzer 100 is a time-of-flight quality analyzer. Figure 2 Zhongyu Figure 1 The same reference numerals are shared by components similar to those in the quality analyzer 1. Figure 2 As shown, the mass analyzer 100 includes an ion source 30, an ion detector 36, a flight tube 38, and a voltage supply 10.

[0064] Figure 2 The quality analyzer 100 also includes multiple electrodes 33 (33a, 33b, 33c, 33d, 33e, 33f, 33g, 33h). Similar to... Figure 1 The first electrode 32 and the second electrode 34, along with multiple electrodes, are arranged in an ion mirror. Similar to... Figure 1 The first electrode 32 and the second electrode 34, each of the plurality of electrodes 33 having a mass offset (Δ) per volt of disturbance associated therewith. a Δ b Δ c Δ d Δ e Δ f Δ g Δ h Multiple electrodes 33 are each connected to corresponding voltage output terminals 13a, 13b, 13c, 13d, 13e, 13f, 13g, and 13h of the voltage supply 10. The voltage supply 10 includes a voltage source 16 and a voltage divider network 20 to provide DC voltage to each of the voltage output terminals. Figure 2 In this embodiment, voltage source 16 is an 8 kV DC voltage source. Each resistor in the voltage divider network can be selected using temperature and / or aging factors to compensate for any quality shifts caused by temperature or aging variations.

[0065] As described above, it should be understood that the mass offset per volt of per disturbance for each of the plurality of electrodes 33 can be positive or negative. Similarly, the mass offset per volt of per disturbance for each of the electrodes can be different. Therefore, the plurality of electrodes 33 can have a total (net) mass offset per volt of per disturbance, which is the sum of the mass offsets per volt of all the individual per volt of per disturbance for each of the electrodes (Δ). 净 = Δ a + Δ b + Δ c + Δ d + Δ e + Δ f + Δ g + Δ h It should be understood that the net mass shift per volt of disturbance at electrode 33 can be non-zero. In such cases, any disturbance (jitter) of the voltage source 16 of voltage supply 10 can cause a mass shift in the quality analyzer. Since all electrodes 33 are connected to the same voltage source 16, voltage disturbances (jitter) will affect all electrodes. Therefore, the mass shift will be proportional to the net mass shift per volt of disturbance at electrode 33.

[0066] To counteract the effects of voltage source jitter Figure 2 The mass analyzer 100 is equipped with a jitter compensation electrode 40. The jitter compensation electrode 40 is arranged along the ion trajectory. Figure 2 As shown, a jitter compensation electrode 40 is disposed between the flight tube 38 and the ion mirror. The jitter compensation electrode is provided with a mass offset per volt associated with the per-volt perturbation, the mass offset per volt being a net mass offset Δ of the per-volt perturbation of electrode 33. 净 On the contrary, for example, Figure 2 In the embodiments, the plurality of electrodes 33 have a ΔV of -0.1 ppm / mV. 净 Therefore, the jitter compensation electrode 40 is provided in such a way that the mass shift Δ per volt of disturbance is... 抖动 The value is +0.1 ppm / mV. By connecting the jitter compensation electrode 40 to the voltage source 16, the multiple electrodes 33 and the jitter compensation electrode 40 experience any voltage disturbance from the voltage source 16. Therefore, the mass shift from the multiple electrodes 33 can be compensated for by the mass shift of the jitter compensation electrode 40.

[0067] exist Figure 2 In one embodiment, the jitter compensation electrode 40 is connected in parallel with the voltage divider network 20 to the voltage source 16. Figure 2In some embodiments, the jitter compensation electrode 40 is capacitively coupled to a voltage source such that only voltage disturbances within a defined frequency range are reproduced on the jitter compensation electrode 40. In some embodiments, a coupling circuit 42 may be provided to capacitively couple the jitter compensation electrode 40 to the voltage source 16. Figure 2 In some embodiments, the coupling circuit 42 includes a resistor and a capacitor. Therefore, the resistor and capacitor of the coupling circuit 42 can be selected to compensate for voltage source jitter having a frequency of at least, for example, 10 Hz. In some embodiments, the coupling circuit 42 can be configured to compensate for voltage source jitter with a frequency not greater than 30,000 Hz. In some embodiments, the coupling circuit 42 can be provided to supply jitter only through a voltage within a frequency range (i.e., a bandpass filter). Various bandpass filter circuits and other filter circuits for capacitive coupling are known to those skilled in the art and therefore will not be discussed in detail herein.

[0068] exist Figure 2 In the quality analyzer, the most significant source of voltage jitter-related error is related to the voltage supply of electrode 33. As mentioned above, the Δ of the electrode... 净 = -0.1 ppm / mV. This perturbation occurs because the stronger magnetic field pushes the reflection point toward the ion mirror inlet, effectively shortening the flight path. However, the positive voltage perturbation on the compensating electrode will slow down the passing ions, increase the flight time, and give a mass shift of the same magnitude as the voltage perturbation.

[0069] By transmitting voltage disturbances from the voltage supply to the jitter compensation electrode 40 via capacitive coupling, time-of-flight disturbances are reduced. Importantly, the length of the compensation electrode is adjusted as part of the flight tube so that the amplitude of the disturbance approximates that of the ion mirror. That is, the length of the jitter compensation electrode along the ion trajectory can be adjusted / selected to provide the desired Δ 抖动 Alternatively, the voltage jitter applied to the jitter compensation electrode 40 can be amplified or attenuated such that the resulting mass shift associated with the jitter compensation electrode compensates for the mass shift associated with electrode 33. In a relatively typical system with a short flight tube of <1 m, the compensation electrode portion of the flight tube can extend along a large portion of the flight tube. For example, the jitter compensation electrode can extend along at least 50%, 70%, 80%, 90%, 95%, or 99% of the flight tube.

[0070] It should be noted that, although Figure 2 The embodiments use capacitive coupling, but other means of transmitting disturbances to the compensation electrodes may also be suitable, such as inductive coupling. Advantageously, inductive coupling can avoid the use of capacitors (e.g., relatively large nF-class HV capacitors) that might be used in the capacitive coupling embodiments.

[0071] Therefore, the quality analyzer 100 may be provided with jitter compensation electrodes 40 to compensate for voltage supply jitter. It should be understood that the jitter compensation electrodes may be provided independently of the voltage supply 10. That is, in some embodiments, the quality analyzer 100 may be provided with both jitter compensation electrodes and a conventional voltage supply.

[0072] although Figure 2 The jitter compensation electrode 40 is capacitor-connected to the voltage supply 10. However, it should be understood that in some embodiments of this disclosure, the jitter compensation electrode may be directly connected to the voltage supply, such as a high-voltage source that supplies high voltage (e.g., more than 100 V) to one or more electrodes of the quality analyzer. Figure 3 An example of such a jitter compensation electrode is shown.

[0073] Although jitter compensation electrodes, including single-plate electrodes, can be directly connected to a high-voltage power supply, such jitter compensation electrodes complicate the overall design of the quality analyzer. Specifically, in voltage sources (e.g., Figure 1 V in the embodiments HV Ion trajectories incorporating jitter compensation electrodes at DC voltages can adversely affect ion trajectories. In other words, without careful design, the potential output by such jitter compensation electrodes may be too high for ions to pass through their trajectories. Figure 3 The jitter compensation electrode shown is intended to reduce voltage penetration into the ion flight path by providing alternating high-voltage electrodes with a ground electrode. Advantageously, the jitter compensation electrode, directly connected to a high-voltage power supply, can be configured to compensate for power supply drift as well as temperature drift of the power supply.

[0074] Therefore, as Figure 3 As shown, the jitter compensation electrode is a jitter compensation electrode assembly 50. The jitter compensation electrode assembly includes multiple ring electrodes 51a, 51b, 51c, 51d, 51e, 51f, 51g, 51h, 51i, 51j, and 51k arranged around the ion trajectory. The multiple ring electrodes are alternately connected to a voltage source or ground along the ion trajectory, wherein the voltage source connected to some of the multiple ring electrodes is the voltage source to which jitter compensation is performed. Therefore, the jitter compensation electrode assembly 50 can be formed from stacked ring ion directors with suitable alternating connections to one of the voltage sources and ground.

[0075] According to this design of the jitter compensation electrode assembly 50, the potential reaching the center of the jitter compensation electrode assembly 50 is approximately half the voltage of the voltage source. Figure 3 V in HV / 2). From voltage source (V HV The voltage is obtained by alternating V along the ion trajectory. HVThe voltage experienced by ions at the center of the jitter compensation electrode assembly 50 can be further attenuated, for example, by changing the thickness, pacing, or voltage applied to the plates in the stack. Using a ring-shaped ion director of such a stack as the jitter compensation electrode assembly 50 can not only compensate for voltage supply jitter but also improve ion focusing in a quality analyzer.

[0076] Another optional jitter compensation electrode (not shown) can be formed using a cylindrical grid surrounding the ion trajectory, wherein the voltage (V) to be jitter compensated is... HV The voltage is applied to the cylindrical grid and surrounded by the flight potential from the ion source, causing the voltage at the center to end the superposition of the two.

[0077] Figure 1 and Figure 2 The embodiments relate to ToF mass analyzers 1, 100 with ion trajectories of single reflection. The principles of this disclosure can also be applied to multiple reflection ToF (MR-ToF) mass analyzers, such as... Figure 4 As shown in the image.

[0078] Figure 4 A schematic diagram of an MR-ToF 200 according to a third embodiment of the present disclosure is shown. The MR-ToF 200 includes a first converging ion mirror 202 and a second converging ion mirror 204. The first converging ion mirror 202 and the second converging ion mirror 204 are arranged opposite to each other to define ion trajectories involving multiple reflections between the first converging ion mirror 202 and the second converging ion mirror 204. Figure 4 As further illustrated, ions are input from the ion trap source 230 into the MR-ToF 200. Before traveling between converging ion mirrors 202 and 204, the ions travel from the ion trap source 230 through a first out-of-plane lens 231, a first deflector 232, a second out-of-plane lens 233, and a second deflector 234. Ions exiting the MR-ToF 200 are captured by the ion detector 236.

[0079] exist Figure 4 In the first converging ion mirror 202, five mirror electrodes 205, 206, 207, 208, and 209 are included. Each of the five mirror electrodes 205, 206, 207, 208, and 209 has an associated mass shift (Δ) per volt of perturbation. m1 Δ m2 Δ m3 Δ m4 Δ m5 The second converging ion mirror 204 can be equipped with five mirror electrodes of similar structure.

[0080] like Figure 4As shown, the first converging ion mirror 202 and the second converging ion mirror 204 are each connected to the voltage supply 210. The voltage supply 210 is... Figure 4 The first mirror electrode 205 is schematically shown connected to the first converging ion mirror 202. It should be understood that a voltage supply 210 is connected to each of the mirror electrodes 205, 206, 207, 208, 209 to provide a desired DC voltage to each of the mirror electrodes. It should be understood that the mirror electrodes of the second converging ion mirror 204 are also each connected to a voltage supply (…). Figure 4 (not shown in the image), the voltage supply can be the same voltage supply 210 or a different voltage supply.

[0081] like Figure 4 As shown, a jitter compensation electrode 240 can be provided to compensate for the effects of power supply jitter. Figure 4 In one embodiment, a pair of jitter compensation electrodes 240 are provided, one for each of the first converging ion mirror 202 and the second converging ion mirror 204. The jitter compensation electrode 240 is disposed between the first converging ion mirror 202 and the second converging ion mirror 204. The jitter compensation electrode 240 is disposed adjacent to the respective converging ion mirror 202, 204. Each jitter compensation electrode 240 is configured to compensate for the net mass offset per volt of perturbation associated with the respective converging ion mirror. Various configurations for suitable jitter compensation electrodes 240 will be apparent to those skilled in the art based on embodiments of this disclosure. For example, the jitter compensation electrode 240 may be provided in a manner similar to the correction strip electrode described in more detail in US-B-9136101. Figure 4 In this embodiment, the jitter compensation electrode is supplied with voltage by the jitter compensation voltage source 211. The jitter compensation electrode is capacitively coupled to the voltage supply 210 via a capacitor.

[0082] As shown in Table 1 below, the five mirror electrodes of the first converging ion mirror will be supplied with the following voltages (V) and have the following associated mass offsets (Δ) per volt of perturbation. Table 1 also shows the voltages (V) of the jitter compensation electrodes and the associated mass offsets (Δ) per volt of perturbation.

[0083]

[0084] Table 1

[0085] As shown in Table 1, the mass shift per volt of perturbation associated with mirror electrodes 205 and 206 is the most significant. The net mass shift per volt of perturbation (Δ) of the five mirror electrodes of the first ion mirror 202 is shown in Table 1. 净The jitter compensation electrode 240 can be provided with an associated quality offset per volt of disturbance, which compensates for at least some of the total net quality offset. Therefore, by providing the jitter compensation electrode 240 to the quality analyzer 200, the net quality offset per volt of disturbance is reduced to -0.0494 ppm / mV. In effect, the jitter compensation electrode 240 compensates for any quality offset associated with the voltage disturbance of the mirror electrode 205. Therefore, as... Figure 4 As shown, the jitter compensation electrode 240 is capacitively coupled to the mirror electrode 205 via a capacitor. Similar capacitive coupling is used for another jitter compensation electrode 240 and a second converging ion mirror 204 (not shown).

[0086] In addition to jitter compensation, the MR-TOF 200 may also be provided with a voltage supply 210, which is configured to reduce power drift (temperature drift and / or aging drift) of the mirror electrodes 205, 206, 207, 208, 209 of the converging ion mirrors 202, 204.

[0087] Similar to the embodiments described above, the voltages supplied to the four mirror electrodes receiving non-zero voltages 205, 206, 207, and 208 can be limited using a voltage divider network (not shown). In such a voltage divider network, one or more resistors can be selected to limit a corresponding voltage for each of the four mirror electrodes 205, 206, 207, and 208, such that the net effects of temperature drift and / or aging are reduced and / or eliminated.

[0088] For example, as shown in Table 2 below, a resistor with a temperature coefficient of 5 ppm / K can be selected for the voltage divider network to output the voltages of the first mirror electrode 205, the second mirror electrode 206, and the fourth mirror electrode 208. As shown in Table 2 below, a temperature drift of +1 K will result in a net mass shift of -3.4 ppm in the MR-ToF 200. If a resistor in the voltage divider network used to output the voltage of the third mirror electrode 207 is selected with a temperature coefficient of 100 ppm / K, a +1 K temperature mass drift will result in a mass shift of +3.24 ppm associated with the third electrode 207. Therefore, the temperature coefficient of the resistors in the voltage divider network can be selected to reduce the net temperature drift of the mass analyzer 200 to -0.26 ppm / K. Thus, by intentionally using one or more resistors with a higher temperature coefficient than other resistors in the voltage divider network, the mass analyzer 200 can have a temperature drift of less than + / -1 ppm / K.

[0089]

[0090] Table 2

[0091] Although the table above refers to the resistors of the voltage supply 210 for the converging ion mirrors 202 and 204, it should be understood that the principle of resistor selection can also be applied to the voltage supply of any other component of the mass analyzer 200, where voltage perturbations can cause a mass shift in the detected ion mass. For example, the same principle can be applied to the voltages of one or more of the following: the ion trap source 230, the first out-of-plane lens 231, the first deflector 232, the second out-of-plane lens 233, and the second deflector 234.

[0092] although Figure 4 The above discussion relates to the selection of resistors with a desired temperature coefficient, but it should be understood that the same principle can also be applied to the selection of resistors with a desired aging coefficient in order to reduce or eliminate the effects of aging-related drift on the quality analyzer 200.

[0093] although Figure 1 , Figure 2 and Figure 4 The embodiments described herein relate to ToF mass analyzers, but it should be understood that this disclosure is not limited to ToF mass analyzers. For example, embodiments of this disclosure include voltage supplies for other types of mass analyzers, such as ion trap mass analyzers or Fourier transform mass analyzers.

[0094] According to the fourth embodiment, Figure 5 A schematic diagram of a Fourier transform quality analyzer is shown. Figure 5 The Fourier transform mass analyzer is an orbital trapping mass analyzer 300. For example, an orbital trapping mass analyzer can be provided as substantially described in US-B-8841604. The orbital trapping mass analyzer 300 includes an internal electrode 302 and a plurality of outer electrode 504. A voltage supply 310 is connected to the internal electrode 302, while the outer electrode 304 is used to detect the ion current surrounding the internal electrode. Figure 5 As shown, the jitter compensation electrode 340 may be disposed adjacent to one or more external electrodes 304. For example, as Figure 5 As shown, a jitter compensation electrode may be disposed in a slot of one of the external electrodes 304. The jitter compensation electrode 540 may be directly or capacitively coupled to the voltage supply 310, wherein the jitter compensation electrode is configured to compensate for voltage jitter on the internal electrode 302. In some embodiments, the voltage supply may also be configured to include a voltage divider network (not shown) to provide voltage to the internal electrode 302 and the jitter compensation electrode 340. In such embodiments, according to the embodiments described above, the voltage divider network may include resistors selected to reduce thermal drift and / or aging drift of the voltage supply 310.

[0095] Therefore, according to embodiments of this disclosure, the mass offset associated with the voltage applied to components (e.g., electrodes) of the mass analyzer can be used to configure the mass analyzer to reduce or eliminate the effects of power supply drift and / or power supply jitter. This principle can be used to provide a mass analyzer with high stability (e.g., thermal stability below 1 ppm / K), enabling high-precision measurements to be performed using the mass analyzer. In particular, according to the above embodiments, a voltage supply for a mass analyzer can be provided.

[0096] Although embodiments of the invention have been described in detail herein, those skilled in the art will understand that variations may be made to these embodiments without departing from the scope of the invention or the appended claims.

[0097] The embodiments of this disclosure may also be provided in accordance with the following terms: 1. A voltage supply for a quality analyzer, comprising: Voltage source; A first voltage output terminal is configured to provide a first voltage to a first electrode of the mass analyzer, the first electrode of the mass analyzer having a first mass offset per volt of perturbation; A second voltage output terminal is configured to provide a second voltage to a second electrode of the mass analyzer, the second electrode of the mass analyzer having a second mass offset per volt per disturbance. The second mass offset per volt of the per-volt perturbation is opposite to the first mass offset per volt of the per-volt perturbation; and A voltage divider network, connected to the voltage source, the first voltage output terminal, and the second voltage output terminal, the voltage divider network comprising: A first resistor, configured to define the first voltage, the first resistor having a first temperature coefficient; and A second resistor is configured to define the second voltage. The second resistor has a second temperature coefficient, wherein the second temperature coefficient is selected based on the first and second mass offsets per volt of the disturbance and the first temperature coefficient, such that the first mass offset associated with the first electrode is compensated by the second mass offset associated with the second electrode.

[0098] 2. A voltage supply for a quality analyzer, comprising: Voltage source; A first voltage output terminal is configured to provide a first voltage to a first electrode of the mass analyzer, the first electrode of the mass analyzer having a first mass offset per volt of perturbation; A second voltage output terminal is configured to provide a second voltage to a second electrode of the mass analyzer, the second electrode of the mass analyzer having a second mass offset per volt per disturbance. The second mass offset per volt of the per-volt perturbation is opposite to the first mass offset per volt of the per-volt perturbation; and A voltage divider network is connected to the first voltage output terminal, the second voltage output terminal, and the voltage source. The voltage divider network includes: A first resistor, configured to define the first voltage, the first resistor having a first aging factor; and A second resistor is configured to define the second voltage. The second resistor has a second aging factor, wherein the second aging factor is selected based on the first and second mass offsets per volt of disturbance and the first aging factor, such that the first mass offset associated with the first electrode is compensated by the second mass offset associated with the second electrode.

[0099] 3. The voltage supply as described in Clause 1, wherein

[0100] The first temperature coefficient of the first resistor is different from the second temperature coefficient of the second resistor; or

[0101] According to the voltage supply described in Clause 2, wherein

[0102] The first aging factor of the first resistor is different from the second aging factor of the second resistor.

[0103] 4. A voltage supply according to any of the preceding clauses, wherein

[0104] The first resistor has a first temperature coefficient and a first aging coefficient, and

[0105] The second resistor has a second temperature coefficient and a second aging coefficient, wherein the second temperature coefficient and the second aging coefficient are selected based on the first and second mass offsets per volt of the disturbance, the first temperature coefficient and the first aging coefficient, such that the first mass offset associated with the first electrode is compensated by the second mass offset associated with the second electrode.

[0106] 5. A voltage supply according to any of the preceding clauses, wherein

[0107] The first temperature coefficient of the first resistor is not greater than 50 ppm / K, or the first aging coefficient of the first resistor is not greater than 50 ppm / week.

[0108] 6. A voltage supply according to any of the preceding clauses, wherein

[0109] The first electrode of the mass analyzer has a first mass offset of at least 0.001 ppm / mV per volt of perturbation; and

[0110] The second electrode of the mass analyzer has a second mass offset of at least -0.001 ppm / mV per volt of perturbation.

[0111] 7. A voltage supply according to any of the preceding clauses, wherein

[0112] The first voltage output terminal is a first DC voltage output terminal; and / or

[0113] The second voltage output terminal is the second DC voltage output terminal.

[0114] 8. A quality analyzer comprising: An ion source, configured to output ions along an ion trajectory; An ion detector configured to detect ions along the ion trajectory; A first electrode, which is arranged along the ion trajectory, has a first mass offset per volt of perturbation; A second electrode, arranged along the ion trajectory, has a second mass offset per volt of perturbation, wherein the second mass offset per volt of perturbation is opposite to a first mass offset per volt of perturbation; and A voltage supply, comprising: Voltage source; A first voltage output terminal is configured to provide a first voltage to the first electrode; A second voltage output terminal is configured to provide a second voltage to the second electrode; and A voltage divider network is connected to the first voltage output terminal, the second voltage output terminal, and the voltage source. The voltage divider network includes: A first resistor, configured to define the first voltage, the first resistor having a first temperature coefficient; and A second resistor is configured to define the second voltage. The second resistor has a second temperature coefficient, wherein the second temperature coefficient is selected based on the first and second mass offsets per volt of the disturbance and the first temperature coefficient, such that the first mass offset associated with the first electrode is compensated by the second mass offset associated with the second electrode.

[0115] 9. A quality analyzer comprising: An ion source, configured to output ions along an ion trajectory; An ion detector configured to detect ions along the ion trajectory; A first electrode, which is arranged along the ion trajectory, has a first mass offset per volt of perturbation; A second electrode, arranged along the ion trajectory, has a second mass offset per volt of perturbation, wherein the second mass offset per volt of perturbation is opposite to a first mass offset per volt of perturbation; and A voltage supply, comprising: Voltage source; A first voltage output terminal is configured to provide a first voltage to the first electrode; A second voltage output terminal is configured to provide a second voltage to the second electrode; and A voltage divider network is connected to the first voltage output terminal, the second voltage output terminal, and the voltage source. The voltage divider network includes: A first resistor, configured to define the first voltage, the first resistor having a first aging factor; and A second resistor is configured to define the second voltage. The second resistor has a second aging factor, wherein the second aging factor is selected based on the first and second mass offsets per volt of disturbance and the first temperature coefficient, such that the first mass offset associated with the first electrode is compensated by the second mass offset associated with the second electrode.

[0116] 10. The quality analyzer as described in Clause 8, wherein

[0117] The first temperature coefficient of the first resistor is different from the second temperature coefficient of the second resistor; or

[0118] According to the voltage supply described in Clause 9, wherein

[0119] The first aging factor of the first resistor is different from the second aging factor of the second resistor.

[0120] 11. The quality analyzer according to any one of clauses 8 to 10, further comprising: A jitter compensation electrode, arranged along the ion trajectory, is connected to the voltage source. The jitter compensation electrode has a mass offset per volt of disturbance, which is configured to compensate for the net mass offset per volt of disturbance of the first electrode and the second electrode.

[0121] 12. The quality analyzer as described in Clause 11, wherein

[0122] The jitter compensation electrode is connected in parallel with the voltage divider network to the voltage source.

[0123] 13. A quality analyzer according to any one of Clauses 8 to 12, wherein

[0124] The mass analyzer includes a time-of-flight (ToF) mass analyzer, wherein the ion detector, the first electrode, and the second electrode are disposed within the ToF mass analyzer.

[0125] 14. The quality analyzer according to any one of clauses 8 to 13, wherein

[0126] The mass analyzer includes an ion mirror comprising the first electrode and the second electrode.

[0127] 15. The quality analyzer according to any one of clauses 8 to 12, wherein

[0128] The mass analyzer includes an orbital capture mass analyzer.

Claims

1. A quality analyzer, comprising: An ion source, configured to output ions along an ion trajectory; An ion detector configured to detect ions along the ion trajectory; Multiple electrodes are arranged along the ion trajectory, each of the multiple electrodes having an associated mass offset per volt of perturbation; A vibration compensation electrode is disposed along the ion trajectory; as well as A voltage source, which is connected to the plurality of electrodes and the jitter compensation electrode, The jitter compensation electrode has a mass offset per volt of disturbance, which is configured to compensate for the net mass offset per volt of disturbance of the plurality of electrodes.

2. The quality analyzer according to claim 1, further comprising: A capacitive coupling circuit is configured to connect the jitter compensation electrode to the voltage source.

3. The quality analyzer according to claim 1 or claim 2, wherein, The length of the jitter compensation electrode aligned with the ion trajectory is configured to provide a mass offset per volt of the perturbation to compensate for the net mass offset per volt of the perturbation of the plurality of electrodes.

4. The quality analyzer according to any one of claims 1 to 3, wherein, The jitter compensation electrode is a jitter compensation electrode assembly. The jitter compensation electrode assembly includes a plurality of ring electrodes, each ring electrode being arranged around the ion trajectory, wherein the plurality of ring electrodes are alternately connected to the voltage source or ground along the ion trajectory.

5. A quality analyzer according to any one of claims 1 to 3, wherein, The jitter compensation electrode includes a plate electrode.

6. The quality analyzer according to any one of claims 1 to 3, characterized in that, The jitter compensation electrode includes a cylindrical grid electrode configured to surround the ion trajectory.

7. A quality analyzer according to any one of claims 1 to 6, wherein, The plurality of electrodes includes a first electrode arranged along the ion trajectory, the first electrode having a first mass offset per volt of perturbation; as well as The plurality of electrodes includes a second electrode arranged along the ion trajectory, the second electrode having a second mass offset per volt of perturbation, wherein the second mass offset per volt of perturbation cancels out a first mass offset per volt of perturbation.

8. The quality analyzer as described in claim 7, characterized in that, The first mass offset of the first electrode of the mass analyzer per volt of perturbation is at least 0.001 ppm / mV; and The second mass offset of the second electrode of the mass analyzer per volt perturbation is at least -0.001 ppm / mV.

9. The quality analyzer of claim 7 or claim 8, wherein the voltage source is provided as part of a voltage supply, the voltage supply comprising: The voltage source; A first voltage output terminal is configured to provide a first voltage to the first electrode; The second voltage output terminal is configured to provide a second voltage to the second electrode; as well as A voltage divider network is connected to the first voltage output terminal, the second voltage output terminal, and the voltage source. The voltage divider network includes: A first resistor is configured to limit the first voltage, and the first resistor has a first temperature coefficient; as well as A second resistor is configured to define the second voltage. The second resistor has a second temperature coefficient, wherein the second temperature coefficient is selected based on the first and second mass offsets per volt of the disturbance and the first temperature coefficient, such that the first mass offset associated with the first electrode is compensated by the second mass offset associated with the second electrode.

10. The quality analyzer according to claim 7 or claim 8, wherein, The voltage source is provided as part of a voltage supply, which includes: The voltage source; A first voltage output terminal is configured to provide a first voltage to the first electrode; A second voltage output terminal is configured to provide a second voltage to the second electrode; and A voltage divider network is connected to the first voltage output terminal, the second voltage output terminal, and the voltage source. The voltage divider network includes: A first resistor, configured to define the first voltage, the first resistor having a first aging factor; and A second resistor is configured to define the second voltage. The second resistor has a second aging factor, wherein the second aging factor is selected based on the first and second mass offsets per volt of disturbance and the first aging factor, such that the first mass offset associated with the first electrode is compensated by the second mass offset associated with the second electrode.

11. The quality analyzer according to claim 9, wherein, The first temperature coefficient of the first resistor is different from the second temperature coefficient of the second resistor; or The quality analyzer according to claim 10, wherein The first aging factor of the first resistor is different from the second aging factor of the second resistor.

12. A power supply according to any one of claims 9 to 11, wherein The first resistor has a first temperature coefficient and a first aging coefficient, and The second resistor has a second temperature coefficient and a second aging coefficient, wherein, The second temperature coefficient and the second aging coefficient are selected based on the first and second mass offsets per volt of disturbance, the first temperature coefficient, and the first aging coefficient, such that the first mass offset associated with the first electrode is compensated by the second mass offset associated with the second electrode.

13. The quality analyzer according to any one of claims 9 to 12, wherein, The first temperature coefficient of the first resistor is not greater than 50 ppm / K, or the first aging coefficient of the first resistor is not greater than 50 ppm / week.

14. The quality analyzer according to any one of claims 9 to 13, wherein, The first voltage output terminal is a first DC voltage output terminal; and / or The second voltage output terminal is a second DC voltage output.

15. The quality analyzer according to any one of claims 9 to 14, wherein, The jitter compensation electrode is connected in parallel with the voltage divider network to the voltage source.

16. The quality analyzer according to any of the preceding claims, wherein, The mass analyzer includes a time-of-flight (ToF) mass analyzer, wherein the ion detector, the plurality of electrodes, and the jitter compensation electrode are disposed within the ToF mass analyzer.

17. The quality analyzer according to any one of claims 1 to 16, wherein, The mass analyzer includes an ion mirror, which includes at least some of the plurality of electrodes.

18. The quality analyzer according to any one of claims 1 to 17, wherein, The plurality of electrodes are arranged to define a first converging ion mirror and a second converging ion mirror, the first and second converging ion mirrors being arranged opposite each other to define ion trajectories involving multiple reflections between the first and second converging ion mirrors.

19. The quality analyzer according to claim 18, further comprising: Additional jitter compensation electrodes, wherein, The jitter compensation electrode is arranged near the first converging ion mirror, and the additional jitter compensation electrode is arranged near the second converging ion mirror. Each of the even-numbered jitter compensation electrodes is configured to compensate for the net mass shift per volt of disturbance associated with the corresponding converging ion mirror.

20. The quality analyzer according to any of the preceding claims, wherein, The quality analyzer includes an orbit capture quality analyzer.

Images