LED voltage-current characteristic test method, device, equipment and system

By calculating the current deviation and frequency characteristics of LEDs under different voltages, an abnormal detection range is constructed, and the degree of conformity to the actual defects and the risk assessment index are calculated. This solves the accuracy problem of LED current-voltage characteristic detection in the existing technology and realizes the effective assessment of LED performance degradation.

CN122131111APending Publication Date: 2026-06-02XI'AN PETROLEUM UNIVERSITY
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
XI'AN PETROLEUM UNIVERSITY
Filing Date
2026-04-08
Publication Date
2026-06-02

AI Technical Summary

Technical Problem

Existing methods have difficulty accurately capturing the current-voltage characteristics of LEDs, resulting in missed detections of LEDs that initially meet performance requirements but have a rapid decay rate.

Method used

By acquiring the current of LEDs under different voltages and within a temperature and time range, calculating the current deviation, screening abnormal time periods, converting them to the frequency domain, determining the degree of current interference by combining frequency characteristics and differences, constructing an abnormal detection range, calculating the degree of conformity to actual defects and risk assessment index, the current-voltage characteristic test of LEDs can be achieved.

Benefits of technology

It improves the accuracy of LED detection, can screen out abnormal LEDs, reduce the false negative rate, and enhances the ability to assess the risk of LED performance degradation.

✦ Generated by Eureka AI based on patent content.

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Abstract

This application relates to the field of electrical variable measurement technology, specifically to a method, apparatus, equipment, and system for testing the volt-ampere characteristics of LEDs. The method includes: acquiring the current and temperature under LED voltage; comparing current differences under the same voltage to screen abnormal time periods, then calculating the degree of current interference through frequency domain characteristics to obtain the abnormal voltage; constructing a detection abnormal interval for voltage acquisition, and after partitioning by volt-ampere characteristics, calculating the degree of conformity to the actual defect based on different changes in the degree of current interference and the frequency shift of the voltage in different partitions; determining a risk assessment index based on the change in the degree of conformity to the actual defect with voltage and the deviation between the LED voltage and the number of detection abnormal intervals in the test group; and completing the volt-ampere characteristic test using the risk assessment index. This application improves the accuracy of LED volt-ampere characteristic testing.
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