A photoresist collecting member, a photoresist coating apparatus, and a photoresist waste liquid cleaning method
By designing a photoresist collection device and coating equipment, and utilizing vacuum adsorption and a step-moving isolation sleeve to clean the photoresist, the problem of residual photoresist particle contamination in the coating chamber was solved, thereby improving photoresist coating efficiency and equipment reliability.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- WEIFANG UNIV OF SCI & TECH
- Filing Date
- 2026-04-09
- Publication Date
- 2026-06-02
AI Technical Summary
After prolonged use, existing photoresist coating equipment suffers from an accumulation of dried photoresist particles in the coating chamber, leading to an increased wafer coating defect rate. Furthermore, frequent cleaning operations increase equipment costs and downtime.
Design a photoresist collection device, including a housing assembly and a flexible isolation sleeve, to achieve efficient cleaning of photoresist through vacuum adsorption and step-by-step movement, avoiding residual photoresist particles from contaminating the wafer.
This reduces the impact of dried photoresist particles on the wafer, improves photoresist coating efficiency, reduces downtime maintenance costs, and enables long-term continuous photoresist coating operations.
Smart Images

Figure CN122131547A_ABST