Test method, injection module, and computer-readable storage medium

Abstract

The application discloses a test method, an injection module and a computer readable storage medium, and the test method comprises the following steps: constructing a digital signal to obtain a periodic time window; selecting one or more connection nodes among the connection nodes between node devices of a daisy chain system; and injecting an error signal into the connection nodes to adjust the data signal transmitted between the node devices of the daisy chain system in the time window. According to the test method, the injection module and the computer readable storage medium, the time window is determined by constructing the digital signal, and the error signal is injected in the time window, so that, compared with the traditional error injection by using a sine wave to modulate a signal, the scheme improves the coverage in the design verification stage and the system robustness evaluation capability.

Description

Technical Field

[0001] This invention belongs to the field of multi-node system testing technology, specifically relating to a testing method, an injection module, and a computer-readable storage medium. Background Technology

[0002] like Figure 1 As shown, the in-vehicle distributed multi-node audio system uses a topology connection method. During the design and verification process, in order to simulate the actual working state of the system, a mechanism for incorrect insertion on the bus is needed. This allows the system to operate in a state close to the actual working and testing environment during simulation, thereby testing the system's stability.

[0003] Existing simulation testing is slow, while the random bit-flip error injection often used in digital testing is inconsistent with the continuous narrowband perturbations of EMC / BCI testing.

[0004] The information disclosed in this background section is intended only to enhance the understanding of the overall background of the invention and should not be construed as an admission or in any way implying that the information constitutes prior art known to those skilled in the art. Summary of the Invention

[0005] The purpose of this invention is to provide a testing method, an injection module, and a computer-readable storage medium that can improve the effectiveness of the design and verification environment for in-vehicle distributed multi-node audio systems.

[0006] To achieve the above objectives, a specific embodiment of the present invention provides the following technical solution: a testing method, comprising:

[0007] Constructing digital signals to obtain periodic time windows;

[0008] Select one or more connection nodes from the connection nodes between the node devices in the multi-node system;

[0009] Within a time window, error signals are injected into the connection nodes to adjust the duration of the data signal level transmitted between the nodes in a multi-node system.

[0010] In one or more embodiments of the present invention, the digital signal is constructed based on the maximum amplitude of the K-fold sinusoidal modulation signal, where 1 > K > 0.

[0011] In one or more embodiments of the present invention, K = 0.5 to 0.7.

[0012] In one or more embodiments of the present invention, a first endpoint is taken when the amplitude of the sinusoidal modulation signal gradually increases to K times its maximum amplitude, and a second endpoint is taken when the amplitude of the sinusoidal modulation signal gradually decreases to K times its maximum amplitude. The duration of the high level of the digital signal is equal to the distance between the first endpoint and the second endpoint.

[0013] In one or more embodiments of the present invention, the carrier frequency of the sinusoidal modulation signal is 1MHz~400MHz, the modulation frequency is (1±10%)×1KHz, and the modulation amplitude is 60%~90%.

[0014] In one or more embodiments of the present invention, a mask is injected into the data signals transmitted between the node devices of a multi-node system within a time window.

[0015] The present invention also discloses an injection module, which, based on the above-described testing method, includes:

[0016] The signal generation unit is used to construct digital signals to obtain periodic time windows;

[0017] The error injection unit, connected to the signal generation unit and the multi-node system, is used to generate an error signal for injecting into the connection node within a time window.

[0018] The monitoring unit is connected to the bus and error injection unit within the multi-node system to monitor the data signals on the bus and generate a mask for the injected connection node within a time window when there is a need for masking.

[0019] In one or more embodiments of the present invention, it is assumed that the data signal x(t) is a square wave with amplitude A_x, rise time t_r, and effective bandwidth B_x. It is assumed that the sinusoidal modulation signal injected into the data signal is i(t)=A_i×[1+m×sin(2π×f_m×t)]cos(2π×f_c×t), where A_i is the maximum amplitude of the carrier signal, f_c is the carrier frequency, f_m is the modulation frequency, and m is the modulation amplitude. The data signal after injecting the sinusoidal modulation signal into the data signal is y(t)=x(t)+i(t), and it is assumed that the amplitude constraint is: A_i(1+m)<0.5×A_x;

[0020] Perform frequency domain analysis, non-edge region analysis, derivative criterion, and offset formula for edge regions.

[0021] In one or more embodiments of the present invention, frequency domain analysis includes: expanding the sinusoidal modulated signal based on the standard identity of trigonometric functions: i(t)=A_i×cos(2π×f_c×t)+(A_i×m / 2)cos[2π×(f_c+f_m)×t]+(A_i×m / 2)cos[2π×(f_c-f_m)×t];

[0022] The spectrum of the data signal x(t) is limited to [0, B_x], and the linear superposition yields: Y(f) = X(f) + I(f), where X(f) is the frequency domain representation of the data signal x(t) and I(f) is the frequency domain representation of the sinusoidal modulation signal i(t);

[0023] Non-edge region analysis includes:

[0024] The non-edge interval is defined as: I={t||x(t)-x_0|<ε,|x'(t)|<δ}, where x_0=0 or A_x, x'(t) represents the instantaneous rate of signal change, and ε and δ define the small tolerance value of the "non-edge interval";

[0025] In this interval, x(t)≈x_0, therefore:

[0026] y(t) = x_0 + i(t)

[0027] From the amplitude constraint, we can obtain:

[0028] |y(t)-x_0|≤A_i(1+m)<0.5×A_x

[0029] If x_0=0, then 0≤y(t)<0.5×A_x;

[0030] If x_0 = A_x, then 0.5 × A_x <y(t)≤A_x;

[0031] The derivative criterion includes:

[0032] In the non-edge interval, x'(t)≈0, therefore: y'(t)=i'(t), i'(t) is a continuous periodic function with a zero interval of approximately 1 / (2f_c);

[0033] The offset formula for the edge region includes:

[0034] Suppose that the edges of the data signal satisfy: x(t_0)=θ, and x'(t_0)≠0, where θ is the decision threshold voltage of the data signal at time t_0, and x'(t_0) is the slope of the data signal at time t_0.

[0035] The data signal after the injection of the sinusoidal modulation signal must satisfy: x(t)+i(t)=θ. The Taylor expansion near time t_0 is: x(t_0+Δt)≈x(t_0)+x'(t_0)×Δt. Therefore, the edge offset is: Δt≈-i(t_0) / x'(t_0).

[0036] The present invention also discloses a computer-readable storage medium storing computer instructions for causing a computer to perform the above-described test method.

[0037] Compared with existing technologies, the test method, injection module, and computer-readable storage medium of this invention determine the time window by constructing a digital signal and injecting an error signal within the time window. This innovative error injection method (i.e., injecting an error signal within the time window to change the duration of the data signal level) is more able to reflect real error scenarios than the traditional error injection method using sinusoidal wave modulation signals. This solution can improve the coverage and system robustness evaluation capabilities of the multi-node system design verification stage. Attached Figure Description

[0038] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments recorded in the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0039] Figure 1 This describes the topology of a multi-node audio system in the existing technology.

[0040] Figure 2 This is a flowchart illustrating the testing method in one embodiment of the present invention.

[0041] Figure 3 This is a schematic diagram showing the time window corresponding to the uplink and downlink frame positions in one embodiment of the present invention.

[0042] Figure 4 This is a schematic diagram of an error signal injection node device according to an embodiment of the present invention.

[0043] Figure 5 This is a schematic diagram illustrating the injection of an error signal into a data signal within a time window, according to an embodiment of the present invention.

[0044] Figure 6 This is a schematic diagram of the structure of the injection module connected to the multi-node system in one embodiment of the present invention. Detailed Implementation

[0045] To enable those skilled in the art to better understand the technical solutions in this disclosure, the technical solutions in the embodiments of this disclosure will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this disclosure, and not all embodiments. Based on the embodiments in this disclosure, all other embodiments obtained by those skilled in the art without creative effort should fall within the scope of protection of this disclosure.

[0046] The terms "coupled," "connected," or "linked" in the specification include both direct and indirect connections. An indirect connection is a connection made through an intermediate medium, such as an electrical conduction medium, which may have parasitic inductance or capacitance. Indirect connections may also include connections made through other active or passive devices to achieve the same or similar functional purpose, such as connections through switches, follower circuits, or other circuits or components. Furthermore, in the invention, terms such as "first" and "second" are primarily used to distinguish one technical feature from another, and do not necessarily require or imply any actual relationship, quantity, or order between these technical features.

[0047] In the detailed description of this specification, reference is made to the accompanying drawings, which form a part thereof, wherein like reference numerals always denote like parts, and wherein exemplary embodiments are shown by way of example that may be implemented. It should be understood that other embodiments may be utilized, and structural or logical changes may be made, without departing from the scope of this disclosure. Therefore, the following detailed description should not be considered limiting.

[0048] The various operations in the specification may be described sequentially as multiple discrete actions or operations in a manner most conducive to understanding the claimed subject matter. However, the order of description should not be construed as implying that these operations must be sequentially related. Specifically, these operations may not be performed in the order presented. The described operations may be performed in a different order than in the described embodiments. Various additional operations may be performed in additional embodiments and / or the described operations may be omitted.

[0049] For the purposes of this disclosure, the phrase “A and / or B” means (A), (B), or (A and B). For the purposes of this disclosure, the phrase “A, B and / or C” means (A), (B), (C), (A and B), (A and C), (B and C), or (A, B and C).

[0050] Various components and devices may be referred to or shown in the singular (e.g., “transistor”, “transistor”, “switch”, etc.) in this document, but only for the convenience of discussion, and any element referred to in the singular may include multiple such elements as taught herein.

[0051] The description uses the phrases "in one embodiment," "in other embodiments," or "in some embodiments," each of which may refer to one or more of the same or different embodiments. Furthermore, the terms "comprising," "including," "having," etc., used with respect to embodiments of this disclosure are synonymous.

[0052] One embodiment of the present invention provides a testing method for an in-vehicle distributed multi-node audio system. This method aims to simulate the real-world operating environment of the system during the design and verification phases, thereby more effectively evaluating the system's stability and anti-interference capabilities. The core of this testing method lies in a controllable error-injection mechanism that can simulate communication anomalies that the system may encounter during actual operation.

[0053] like Figure 2 As shown, the test methods include:

[0054] Construct digital signals to obtain periodic time windows. For example... Figure 3 As shown, in one embodiment, a digital signal is constructed based on the maximum amplitude of the sinusoidal modulation signal signal, which is K times the maximum amplitude of the sinusoidal modulation signal signal, where 1 > K > 0, and preferably, K = 0.5~0.7. For the link establishment phase of the in-vehicle distributed multi-node audio system, 50% (K = 0.5) of the maximum amplitude of the sinusoidal modulation signal signal is used, and for the normal communication phase of the system, 70% (K = 0.7) of the maximum amplitude of the sinusoidal modulation signal signal is used.

[0055] Specifically, the first endpoint is taken when the amplitude of the sinusoidal modulation signal signal gradually increases to K times its maximum amplitude, and the second endpoint is taken when the amplitude of the sinusoidal modulation signal gradually decreases from its maximum amplitude to K times its maximum amplitude. The duration of the high level of the digital signal is equal to the distance between the first endpoint and the second endpoint. The digital signal is constructed in this way, and the duration of the high level of the digital signal is the corresponding time window.

[0056] The carrier frequency of the sinusoidal modulation signal signalal provided for reference is 1MHz~400MHz, the modulation frequency is (1±10%)×1KHz, and the modulation amplitude is 60%~90%. In one embodiment, the modulation amplitude is 80%.

[0057] like Figure 4 As shown, connection nodes (communication interfaces TX and RX connecting the bus and the node devices) are selected between the node devices in a multi-node system. One or more connection nodes can be selected as needed.

[0058] Within a time window, error signals are injected into the connection nodes to adjust the duration of the data signal level transmitted between the nodes in a multi-node system. This duration is determined by the distance between the rising and falling edges connecting the two sides of the level; a wider distance results in a longer duration, and vice versa. The duration can be adjusted by shifting the rising and falling edges left or right. In one embodiment, the data signal includes an upstream frame and a downstream frame. Error signals can be injected into the frame header to test the system's anti-interference capability during frame initialization, and into the frame tail to test the robustness of the frame termination and verification mechanism.

[0059] like Figure 5 As shown, in one embodiment, the data signal uses 8b / 10b encoding. Within a time window, an error signal is injected into the data signal, causing both the rising and falling edges of a positive (high) level of the data signal to be shifted. This increases the duration of the positive level of the data signal within the time window, while decreasing the duration of the adjacent 0 and negative levels. In other embodiments, only the rising or falling edge may be shifted left or right, depending on the error condition. The data signal may use 64b / 66b or be scrambled.

[0060] The duration of the error signal can be set within the required range to ensure that the test covers error scenarios at various time scales. During the duration, if there is a need for masking, a mask is injected into the data signal within the time window region to mask irrelevant time-domain errors.

[0061] In the above testing method, the order of the process can be changed according to actual needs.

[0062] Mathematical analysis of the sine wave error-equivalent model:

[0063] Assume the original signal (data signal) is a square wave x(t) with high and low levels generated by a 100MHz clock signal. It is continuously differentiable, with an amplitude of A_x, a rise time of t_r, and an effective bandwidth of B_x≈0.35 / t_r.

[0064] The BCI test injection sinusoidal modulated signal signal is defined as:

[0065] i(t)=A_i×[1+m×sin(2π×f_m×t)]cos(2π×f_c×t)

[0066] Where A_i is the maximum amplitude of the carrier signal, the carrier frequency f_c∈[1,400]MHz, the modulation frequency f_m=1kHz, and the modulation amplitude m=0.8.

[0067] The system is a linear, time-invariant system, and the final output data signal is:

[0068] y(t) = x(t) + i(t)

[0069] And assume amplitude constraints:

[0070] A_i(1+m)<0.5×A_x

[0071] This analysis is based on an ideal model that ignores actual effects such as circuit nonlinearity, ESD, and rectification.

[0072] Analysis of offset formulas in the frequency domain, non-edge region, derivative criterion, and edge region:

[0073] A. Frequency Domain Analysis

[0074] The sinusoidal modulated signal signal is expanded based on the standard trigonometric identities:

[0075] i(t) = A_i × cos(2π × f_c × t)

[0076] +(A_i×m / 2)cos[2π×(f_c+f_m)×t]

[0077] +(A_i×m / 2)cos[2π×(f_c-f_m)×t]

[0078] Therefore, the spectrum of the interference signal only contains three discrete spectral lines: f_c and f_c±f_m, and does not contain low-frequency or DC components.

[0079] The spectrum of the original signal x(t) is confined within [0, B_x], and by linear superposition, we obtain:

[0080] Y(f) = X(f) + I(f)

[0081] X(f) and I(f) are the frequency domain representations of x(t) and i(t), respectively. Therefore, the output spectrum still consists of the original signal band and a small number of high-frequency lines, and no new low-frequency components are generated. Since the "peak" corresponds to a wideband structure, a true peak abrupt change cannot be generated in this model.

[0082] B. Non-edge region analysis

[0083] Define the non-edge interval as:

[0084] I = {t||x(t)-x_0|<ε,|x'(t)|<δ}, where x_0=0 or A_x, x'(t) represents the instantaneous rate of signal change, and ε and δ define the small tolerance values ​​of the "non-edge interval".

[0085] In this interval, x(t)≈x_0, therefore:

[0086] y(t) = x_0 + i(t)

[0087] From the amplitude constraint, we can obtain:

[0088] |y(t)-x_0|≤A_i(1+m)<0.5×A_x

[0089] If x_0=0, then 0≤y(t)<0.5×A_x;

[0090] If x_0 = A_x, then 0.5 × A_x <y(t)≤A_x。

[0091] Therefore, within the non-edge interval, the output signal can never cross half the amplitude, and it is impossible to form a new rising-falling structure.

[0092] C. Derivative Criterion

[0093] In the non-edge interval, x'(t)≈0, therefore:

[0094] y'(t)=i'(t)

[0095] i'(t) is a continuous periodic function with a zero interval of approximately 1 / (2f_c), which corresponds to high-frequency oscillations rather than an isolated spike structure. Furthermore, due to amplitude limitations, it cannot form the defined "spike".

[0096] D. Offset formula for edge region

[0097] Assume the original signal edges satisfy:

[0098] x(t_0) = θ, and x'(t_0) ≠ 0, where θ is the decision threshold voltage of the original signal at time t_0, and x'(t_0) is the slope of the original signal at time t_0.

[0099] After injection, the following conditions must be met:

[0100] x(t)+i(t)=θ

[0101] The Taylor expansion near time t_0 yields:

[0102] x(t_0+Δt)≈x(t_0)+x'(t_0)×Δt

[0103] Therefore, the edge offset is:

[0104] Δt≈-i(t_0) / x'(t_0)

[0105] The offset is proportional to the disturbance amplitude and inversely proportional to the edge slope, causing only time jitter and shape distortion without introducing new edges.

[0106] E. Conclusion

[0107] Under the continuous, linear, band-limited model, the sinusoidal injection signal specified in ISO 11452-4 is:

[0108] 1. It will not generate new rise-fall structures with amplitudes exceeding 50% in the non-edge regions of the original signal;

[0109] 2. It only causes time shifts and geometric distortions near the original edges.

[0110] like Figure 6 As shown, this embodiment also discloses an injection module, which is connected to the connection node of the node device in a multi-node system. The node devices are connected through a bus. The node device has connection nodes a and b. The injection module includes a signal generation unit, an error injection unit, and a monitoring unit.

[0111] The signal generation unit is used to construct digital signals to obtain periodic time windows. The signal generation unit can adjust the period of the digital signal and the duration of the time window by adjusting its own configuration.

[0112] The error injection unit is connected to the signal generation unit and the multi-node system to generate error signals injected into the connection nodes within a time window to adjust the duty cycle of the data signals on the bus. In one embodiment, the error injection unit may be connected to connection node a or connection node b of the node device, and the error injection unit may be connected to the connection nodes of multiple node devices to perform multi-point error injection.

[0113] The monitoring unit is connected to the bus and error injection unit that connect the node devices in the multi-node system. It monitors and analyzes the data signals on the bus, and generates a mask for the injected connection node within a time window when there is a masking requirement (i.e., to provide a basis for judging whether to inject a mask).

[0114] The injection module allows for flexible selection of target node devices and their corresponding communication interfaces in multi-node systems for error injection. It supports simultaneous or independent error injection across multiple communication interfaces, making the test highly configurable and capable of covering real-world working scenarios under different topologies.

[0115] The present invention also discloses an electronic device, comprising:

[0116] At least one processor; and

[0117] The memory stores instructions that, when executed by the at least one processor, cause the at least one processor to perform the test method described above.

[0118] The present invention also discloses a computer-readable storage medium storing computer instructions for causing a computer to perform the above-described test method.

[0119] It will be apparent to those skilled in the art that this disclosure is not limited to the details of the exemplary embodiments described above, and that this disclosure can be implemented in other specific forms without departing from its spirit or essential characteristics. Therefore, the embodiments should be considered in all respects as exemplary and non-limiting, and the scope of this disclosure is defined by the appended claims rather than the foregoing description. Thus, all variations falling within the meaning and scope of equivalents of the claims are intended to be included within this disclosure. No reference numerals in the claims should be construed as limiting the scope of the claims.

[0120] Furthermore, it should be understood that although this specification describes embodiments, not every embodiment contains only one independent technical solution. This narrative style is merely for clarity. Those skilled in the art should consider the specification as a whole, and the technical solutions in each embodiment can also be appropriately combined to form other embodiments that can be understood by those skilled in the art.

Claims

1. A testing method, characterized in that, include: Constructing digital signals to obtain periodic time windows; Select one or more connection nodes from the connection nodes between the node devices in the multi-node system; Within a time window, error signals are injected into the connection nodes to adjust the duration of the data signal level transmitted between the nodes in a multi-node system.

2. The test method according to claim 1, characterized in that, A digital signal is constructed based on the maximum amplitude of a sinusoidal modulated signal that is K times the amplitude, where 1 > K > 0.

3. The test method according to claim 2, characterized in that, The value of K is 0.5 to 0.

7.

4. The test method according to claim 2, characterized in that, The first endpoint is taken when the amplitude of the sinusoidal modulation signal gradually increases to K times its maximum amplitude, and the second endpoint is taken when the amplitude of the sinusoidal modulation signal gradually decreases to K times its maximum amplitude. The duration of the high level of the digital signal is equal to the distance between the first endpoint and the second endpoint.

5. The test method according to claim 2, characterized in that, The carrier frequency of the sinusoidal modulation signal is 1MHz~400MHz, the modulation frequency is (1±10%)×1KHz, and the modulation amplitude is 60%~90%.

6. The test method according to claim 1, characterized in that, Within the time window, a mask is injected into the data signals transmitted between the devices at each node of the multi-node system.

7. The test method according to claim 1, characterized in that, Assume the data signal x(t) is a square wave with amplitude A_x, rise time t_r, and effective bandwidth B_x. Assume the sinusoidal modulation signal injected into the data signal is i(t) = A_i × [1 + m × sin(2π × f_m × t)] cos(2π × f_c × t), where A_i is the maximum amplitude of the carrier signal, f_c is the carrier frequency, f_m is the modulation frequency, and m is the modulation amplitude. The data signal after injecting the sinusoidal modulation signal into the data signal is y(t) = x(t) + i(t), and assume the amplitude constraint: A_i(1 + m) < 0.5 × A_x; Perform frequency domain analysis, non-edge region analysis, derivative criterion, and offset formula for edge regions.

8. The test method according to claim 1, characterized in that, Frequency domain analysis includes: expanding the sinusoidal modulated signal based on the standard identity of trigonometric functions: i(t) = A_i×cos(2π×f_c×t) + (A_i×m / 2)cos[2π×(f_c+f_m)×t] + (A_i×m / 2)cos[2π×(f_c-f_m)×t]; The spectrum of the data signal x(t) is limited to [0, B_x], and the linear superposition yields: Y(f) = X(f) + I(f), where X(f) is the frequency domain representation of the data signal x(t) and I(f) is the frequency domain representation of the sinusoidal modulation signal i(t); Non-edge region analysis includes: The non-edge interval is defined as: I={t||x(t)-x_0|<ε,|x'(t)|<δ}, where x_0=0 or A_x, x'(t) represents the instantaneous rate of signal change, and ε and δ define the small tolerance value of the "non-edge interval"; In this interval, x(t)≈x_0, therefore: y(t) = x_0 + i(t) From the amplitude constraint, we can obtain: |y(t)-x_0|≤A_i(1+m)<0.5×A_x If x_0=0, then 0≤y(t)<0.5×A_x; If x_0 = A_x, then 0.5 × A_x <y(t)≤A_x; The derivative criterion includes: In the non-edge interval, x'(t)≈0, therefore: y'(t)=i'(t), i'(t) is a continuous periodic function with a zero interval of approximately 1 / (2f_c); The offset formula for the edge region includes: Suppose that the edges of the data signal satisfy: x(t_0)=θ, and x'(t_0)≠0, where θ is the decision threshold voltage of the data signal at time t_0, and x'(t_0) is the slope of the data signal at time t_0. The data signal after the injection of the sinusoidal modulation signal must satisfy: x(t)+i(t)=θ. The Taylor expansion near time t_0 is: x(t_0+Δt)≈x(t_0)+x'(t_0)×Δt. Therefore, the edge offset is: Δt≈-i(t_0) / x'(t_0).

9. An injection module, characterized in that, Based on the testing method according to any one of claims 1 to 7, the injection module includes: The signal generation unit is used to construct digital signals to obtain periodic time windows; The error injection unit, connected to the signal generation unit and the multi-node system, is used to generate an error signal for injecting into the connected nodes within a time window. The monitoring unit is connected to the bus and error injection unit within the multi-node system to monitor the data signals on the bus and generate a mask for the injected connection node within a time window when there is a need for masking.

10. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores computer instructions for causing the computer to perform the test method according to any one of claims 1 to 7.

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