An automatic control module and a multi-instrument cooperative test system and a test method thereof

The automatic control module enables collaborative control and data management of high-end testing instruments, solving the problems of synchronization and data management difficulties in existing technologies, and improving testing accuracy and efficiency.

CN122151598APending Publication Date: 2026-06-05FUDAN UNIVERSITY +1

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
FUDAN UNIVERSITY
Filing Date
2026-02-27
Publication Date
2026-06-05

AI Technical Summary

Technical Problem

In existing technologies, high-end testing instruments cannot achieve collaborative control and data exchange, resulting in large human error, scattered data management difficulties, and low efficiency.

Method used

An automatic control module is provided, including a coordination control unit, a data analysis unit, and a data management unit, to realize synchronous control of instruments, direct reading, analysis, and management of test data.

Benefits of technology

It improved the synchronization and accuracy of the testing instruments, enabled automatic data acquisition, analysis and centralized management, and enhanced testing efficiency and data processing capabilities.

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Abstract

The application provides an automatic control module, a multi-instrument cooperative test system and a test method thereof. The test system comprises a coordination control unit, a data analysis unit and a data management unit. The coordination control unit converts input initial parameter data into corresponding instrument test instructions, and transmits the instrument test instructions to corresponding test instruments according to a preset control time sequence, thereby improving the operation synchronization of different test instruments during cooperative work. The coordination control unit also collects initial test data from the corresponding test instruments in real time and outputs the initial test data to the data analysis unit. The data analysis unit analyzes the initial test data according to a preset analysis algorithm and outputs analysis parameter data, thereby improving the analysis and processing capability of the initial test data. Finally, the data management unit manages and stores the initial test data and the analysis parameter data according to a preset processing mode, thereby realizing centralized management of the data.
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Description

Technical Field

[0001] This invention relates to the technical field of data testing, and in particular to an automatic control module and a multi-instrument collaborative testing system and testing method. Background Technology

[0002] In the fields of semiconductor device testing, reliability assessment, and circuit characteristic analysis, it is often necessary to use a combination of high-end test instruments, such as semiconductor parameter analyzers (e.g., Keysight B1500A), arbitrary waveform generators (e.g., Tektronix AWG5200), and high-precision oscilloscopes (e.g., Tektronix MSO73304DX), and these instrument manufacturers provide powerful dedicated control software for their respective equipment.

[0003] However, the software of each instrument runs independently, making direct collaborative control and data exchange impossible. In practical applications, parameter settings and test initiation for each instrument are performed manually, introducing time errors due to human intervention. Furthermore, test data is stored by default on the internal hard drives of each instrument, resulting in data fragmentation, management difficulties, and cumbersome and inefficient data processing workflows. Summary of the Invention

[0004] To address the aforementioned technical problems, this invention provides an automatic control module and a multi-instrument collaborative testing system and method, which enables direct reading, analysis, and management of test data based on synchronized instrument control, thereby improving data processing efficiency and simplifying data management.

[0005] According to a first aspect of the technical solution of the present invention, an automatic control module is provided, comprising: Coordination and control unit, used for: Based on the start signal, the input initial parameter data are converted into several corresponding instrument test commands. According to the preset control timing sequence, several corresponding instrument test commands are transmitted to several corresponding test instruments; The system collects and outputs initial test data from the corresponding testing instruments in real time. The data analysis unit is used to analyze the initial test data according to a preset analysis algorithm and output analysis parameter data; The data management unit is used to manage and store the initial test data and the analysis parameter data according to a preset processing method.

[0006] Optionally, the coordination and control unit includes a logic control subunit, a timing control subunit, and a data acquisition subunit; The logic control subunit is used to convert several input initial parameter data into several corresponding instrument test commands based on the start signal. The timing control subunit is used to transmit several corresponding instrument test commands to several corresponding test instruments according to a preset control timing sequence; The data acquisition subunit is used to acquire and output initial test data in real time from the corresponding test instruments.

[0007] Optionally, a display control unit may also be included for: Output the start signal, pause signal, and stop signal; The initial parameter data are set and output to the coordination and control unit; The initial test data and the analysis parameter data are plotted into test curves and parameter tables and displayed. Export the test curves and the parameter table; The coordination and control unit is also used for: Based on the pause signal, an instrument pause command is output to several corresponding test instruments; Based on the stop signal, an instrument stop command is output to several corresponding test instruments.

[0008] Optionally, the display control unit includes a test control subunit, a parameter input subunit, a data display subunit, and a data export subunit; The test control subunit is used to output the start signal, pause signal, and stop signal; The parameter input subunit is used to set and output the several initial parameter data; The data display subunit is used to plot the initial test data and the analysis parameter data into test curves and parameter tables and display them. The data export subunit is used to export the test curve and the parameter table.

[0009] Optionally, the test curve may include at least a waveform or a transition curve.

[0010] Optionally, the export format of the test curve and the parameter table may include at least TXT, CSV, or PNG.

[0011] Optionally, the preset processing method specifically includes: the data management unit stores the initial test data and the analysis parameter data into the computer's memory according to a preset directory structure.

[0012] According to a second aspect of the present invention, a multi-instrument collaborative testing system is provided, comprising a control computer, a router, and a plurality of testing instruments; The control computer is connected to the router via a connection line, and the router is connected to several testing instruments via connection lines. The control computer has a built-in automatic control module as described by the first inventor of this invention, and the control computer is used for: Based on the start signal, the input initial parameter data are converted into several corresponding instrument test commands. According to the preset control timing sequence, several corresponding instrument test commands are transmitted to several corresponding test instruments; Real-time acquisition of initial test data from several testing instruments; The initial test data is analyzed according to a preset analysis algorithm, and analysis parameter data is output. The initial test data and the analysis parameter data are managed and stored according to a preset processing method; Several testing instruments operate according to their respective testing instructions.

[0013] Optionally, the control computer is further configured to: Based on the pause signal, the instrument pause command is output to several corresponding test instruments; Based on the stop signal, an instrument stop command is output to several corresponding test instruments; Several testing instruments paused operation according to the instrument pause command, and several testing instruments also stopped operation according to the instrument stop command.

[0014] According to a third aspect of the present invention, a multi-instrument collaborative testing method is provided, based on the multi-instrument collaborative testing system described in the second aspect of the present invention, the method comprising: The control computer transmits several corresponding instrument test commands to several corresponding test instruments according to a preset control sequence. Several testing instruments operate according to their respective testing instructions. The computer controls the real-time acquisition of initial test data from several testing instruments, analyzes the initial test data according to a preset analysis algorithm, and outputs analysis parameter data. The computer controls the real-time display of the analysis parameter data and manages and stores the initial test data and the analysis parameter data according to a preset processing method.

[0015] Compared with the prior art, the technical solution of the present invention has the following beneficial effects: In the automatic control module provided by the technical solution of this invention, firstly, the coordination control unit converts several initial parameter data inputs into several corresponding instrument test commands based on a start signal, and then transmits these commands to several corresponding test instruments according to a preset control timing sequence. This ensures that different test instruments can work simultaneously, greatly improving the operational synchronization of different test instruments during collaborative work, increasing test accuracy, and significantly facilitating the control of different test instruments. The coordination control unit also collects initial test data from the corresponding test instruments in real time and outputs it to the data analysis unit, realizing automatic data collection for subsequent data analysis and centralized management. Secondly, the data analysis unit analyzes the initial test data according to a preset analysis algorithm and outputs analysis parameter data, thereby greatly improving the analysis and processing capabilities of the initial test data. Finally, the data management unit manages and stores the initial test data and the analysis parameter data according to a preset processing method, thereby achieving centralized data management.

[0016] In summary, the automatic control module provided by this invention greatly improves the operational synchronization of different testing instruments when working collaboratively, and realizes automatic acquisition, real-time personalized analysis, and centralized management of initial test data generated by different testing instruments, thereby greatly improving testing efficiency, testing accuracy, and data analysis depth.

[0017] Furthermore, it also includes a display control unit, used for: outputting the start signal, pause signal, and stop signal; setting and outputting the several initial parameter data; plotting the initial test data and the analysis parameter data into test curves and parameter tables and displaying them; and exporting the test curves and parameter tables, thereby realizing real-time visualization of the data. Attached Figure Description

[0018] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0019] Figure 1 A schematic diagram of the automatic control module provided in the first embodiment of the present invention. Figure 1 ; Figure 2 A schematic diagram of the automatic control module provided in the first embodiment of the present invention. Figure 2 ; Figure 3A schematic diagram of a multi-instrument collaborative testing system provided in the second embodiment of the present invention; Figure 4 A flowchart of a multi-instrument collaborative testing method provided for a second embodiment of the present invention.

[0020] Explanation of reference numerals in the attached figures: 1-Control computer; 2-Router; 3- Several testing instruments; 10 - Display control unit; 11-Test Control Subunit; 12-Parameter Input Subunit; 13 - Data display subunit; 14-Data Export Sub-unit; 20 - Coordination and Control Unit; 21-Logic control subunit; 22-Timing control subunit; 23-Data Acquisition Subunit; 30 - Data Analysis Unit; 40 - Data Management Unit. Detailed Implementation

[0021] As described in the background section, in the existing fields of device testing, reliability assessment, and circuit characteristic analysis, it is often necessary to use a combination of various high-end test instruments. For example, semiconductor parameter analyzers (such as Keysight B1500A), arbitrary waveform generators (such as Tektronix AWG5200), and high-precision oscilloscopes (such as Tektronix MSO73304DX).

[0022] Although the manufacturers of these instruments provide powerful dedicated control software for their respective devices, because each instrument's software runs independently, direct collaborative control and data exchange are impossible. In practical applications, parameter settings and test initiation for each instrument are performed manually, introducing time errors due to human intervention. Furthermore, test data is stored by default on each instrument's internal hard drive, resulting in data fragmentation, management difficulties, and cumbersome and inefficient data processing workflows.

[0023] To address the aforementioned issues, existing technologies typically rely on general-purpose instrument control software (such as NI LabVIEW or Agilent VEE) for basic automated control of individual instruments. The specific approach involves connecting multiple instruments to a single computer via a bus such as GPIB or LAN, and then using graphical programming software like LabVIEW to write a control program.

[0024] This program can send SCPI (Standard Command for Programmable Instruments) instructions to each instrument sequentially, thereby automatically completing a series of settings. For example, the program can set the parameters of the B1500A and AWG5200 sequentially, and then send a "trigger" command to start the measurement. This solves the problem of "automatic sequential execution" and avoids repetitive manual operations.

[0025] Although this solution automates the operation sequence, its instructions are still sent "serially." This means the program needs to complete all settings and trigger commands for one instrument before processing another. For scenarios requiring extremely high synchronization accuracy, this software-sequence-based serial communication method still introduces a small but not negligible delay, making it difficult to achieve true "simultaneous" triggering.

[0026] Furthermore, the test data of each instrument is stored in the instrument's internal memory. However, platforms such as LabVIEW lack the ability to perform complex processing on the test data. Therefore, when retrieving test data from each instrument or performing custom analysis on multiple test data sets, it is necessary to edit very complex analysis and retrieval programs, which makes it inconvenient to analyze and centrally manage the test data.

[0027] In view of this, the technical solution of the present invention provides a new automatic control module, including a coordination control unit, a data analysis unit, and a data management unit. The coordination control unit, based on a start signal, converts several initial parameter data into several corresponding instrument test commands, and then transmits these commands to several corresponding test instruments according to a preset control sequence. This ensures that different test instruments can work simultaneously, greatly improving the operational synchronization of different test instruments during collaborative work, increasing test accuracy, and significantly facilitating the control of different test instruments. The coordination control unit also collects initial test data from the corresponding test instruments in real time and outputs it to the data analysis unit, realizing automatic data collection for subsequent centralized data management. Secondly, the data analysis unit analyzes the initial test data according to a preset analysis algorithm and outputs analysis parameter data, thereby greatly improving the analysis and processing capabilities of the initial test data. Finally, the data management unit manages and stores the initial test data and the analysis parameter data according to a preset processing method, thereby achieving centralized data management.

[0028] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0029] The terms “first,” “inner ring,” “third,” “fourth,” etc. (if present) in the specification, claims, and accompanying drawings of this invention are used to distinguish similar objects and do not necessarily describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate so that embodiments of the invention described herein can be implemented in orders other than those illustrated or described herein. Furthermore, the terms “comprising” and “having,” and any variations thereof, are intended to cover a non-exclusive inclusion; for example, a process, method, module, product, or apparatus that comprises a series of steps or sub-units is not necessarily limited to those explicitly listed, but may include other steps or sub-units not explicitly listed or inherent to such processes, methods, products, or apparatus.

[0030] The technical solution of the present invention will be described in detail below with reference to the embodiments in this example. These embodiments can be combined with each other, and the same or similar concepts or processes may not be described again in some embodiments.

[0031] [First Embodiment] Please refer to Figure 1 This embodiment provides an automatic control module, including a display control unit 10, a coordination control unit 20, a data analysis unit 30, and a data management unit 40.

[0032] The display control unit 10, based on external control, outputs start, pause, and stop signals to the coordination control unit 20. The display control unit 10 also, based on external control, outputs several initial parameter data to the coordination control unit 20. Furthermore, based on the input analysis parameter data, the display control unit 10 plots the initial test data and the analysis parameter data into test curves and parameter tables, displays them, and derives the test curves and parameter tables based on external control.

[0033] Please refer to Figure 2 In this embodiment, the display control unit 10 includes a test control subunit 11, a parameter input subunit 12, a data display subunit 13, and a data export subunit 14.

[0034] The test control subunit 11 outputs start signal, pause signal and stop signal to the coordination control unit 20 based on external control.

[0035] The parameter input subunit 12 outputs several initial parameter data to the coordination control unit 20 based on external control.

[0036] Furthermore, the initial parameter data specifically refers to the control parameters of each instrument, such as voltage, current, waveform, frequency, amplitude, sampling rate, and terminal impedance. The specific content of the initial parameter data can be set according to the actual application and the type of corresponding instrument, and is not limited here.

[0037] The data display subunit 13, based on the input analysis parameter data, plots the initial test data and the analysis parameter data into test curves and parameter tables and displays them.

[0038] Furthermore, the test curve may include a transition curve or a waveform, etc., which are not limited here.

[0039] The data export subunit 14 exports the test curves and parameter tables based on external control.

[0040] Furthermore, the export formats of the test curves and the parameter tables include at least TXT, CSV, and PNG, etc., and are not limited here.

[0041] In this embodiment, the display control unit 10 can be understood as a graphical interface developed based on PyQt5, on which users can perform various operations. Each of the aforementioned sub-units can be understood as a different page within the graphical interface, and each page is assigned a different function. Specifically, the page corresponding to the test control sub-unit 11 is used to control the sending of start, pause, and stop signals; the page corresponding to the parameter input sub-unit 12 is used to set several initial parameter data; the page corresponding to the data display sub-unit 13 is used to plot the initial test data and the analysis parameter data into test curves and parameter tables and display them; and the page corresponding to the data export sub-unit 14 is used to export the test curves and parameter tables to a commonly used format according to a provided custom output directory.

[0042] PyQt5 can be understood as a combination of Python and Qt5, leveraging Python's concise syntax to achieve Qt's powerful graphical display capabilities. Furthermore, code written using PyQt5 can run on Windows, Mac, and Linux with almost no modification, eliminating the need for separate development for different systems and significantly saving time and costs associated with programming for different platforms.

[0043] Of course, in addition to PyQt5, the display control unit 10 can also be developed using other programming languages ​​such as C or C++, and this is not limited here.

[0044] The coordination and control unit 20, based on the start signal, converts several initial parameter data into several corresponding instrument test commands, and transmits the several corresponding instrument test commands to several corresponding test instruments according to the preset control timing sequence, so as to ensure that different test instruments can work at the same time. This not only greatly improves the operational synchronization of different test instruments when working together and improves the test accuracy, but also greatly facilitates the control of different test instruments.

[0045] The coordination and control unit 20 also collects the initial test data from the corresponding test instruments in real time and outputs it to the data analysis unit 30, realizing automatic data collection so as to facilitate subsequent data analysis and centralized management.

[0046] In addition, the coordination control unit 20 also outputs an instrument pause command to several corresponding test instruments based on the pause signal, and outputs an instrument stop command to several corresponding test instruments based on the stop signal.

[0047] In this embodiment, the testing instrument includes a semiconductor parameter analyzer and a waveform generator. Of course, in other embodiments, the testing instrument can be extended to any measurement device that supports remote control, such as a power supply, spectrum analyzer, or switch matrix, depending on the application scenario; no limitation is made here.

[0048] Please continue to refer to this. Figure 2 The coordination and control unit 20 includes a logic control subunit 21, a timing control subunit 22, and a data acquisition subunit 23.

[0049] The logic control subunit 21, based on the start signal, converts several input initial parameter data into several corresponding instrument test commands. The logic control subunit 21 also, based on the pause signal, outputs an instrument pause command to several corresponding test instruments, and based on the stop signal, outputs an instrument stop command to several corresponding test instruments.

[0050] The timing control subunit 22 transmits several corresponding instrument test commands to several corresponding test instruments according to a preset control timing sequence.

[0051] For example, in hot carrier injection testing, the timing control subunit 22 can ensure that while sending a stress application command to the semiconductor parameter analyzer, a command to start outputting pulses is sent to the waveform generator, achieving millisecond-level synchronization accuracy.

[0052] The data acquisition subunit 23 acquires and outputs initial test data in real time from the corresponding test instruments.

[0053] For example, in a hot carrier injection test, the data acquisition subunit 23 can read the current and voltage parameters measured by the semiconductor parameter analyzer in real time, as well as the waveform array acquired by the oscilloscope in real time. Of course, different test experiments use different experimental instruments and require different test data, so the type of initial test data is not limited.

[0054] The data analysis unit 30 analyzes the initial test data according to a preset analysis algorithm and outputs the analysis parameter data to the data display subunit 13.

[0055] For example, in hot carrier injection testing, the preset analysis algorithm may include extracting the threshold voltage using the derivative method or the constant current method, and calculating the transconductance and subthreshold swing by extracting the curve derivative. The preset analysis algorithm may also include extracting parameters such as peak-to-peak value, rise / fall time, pulse width, and frequency.

[0056] The data management unit 40 manages and stores the initial test data and the analysis parameter data according to a preset processing method.

[0057] In this embodiment, the preset processing method can be understood as follows: the data management unit 40 stores the initial test data and the analysis parameter data in the computer's memory according to the preset directory structure.

[0058] In addition, after storing the initial test data and the analysis parameter data, the data management unit 40 will generate a unified index file, such as a CSV file or a database entry, to facilitate subsequent retrieval.

[0059] The preset directory structure can be customized according to "project / device number / test date / test number" or on the image page corresponding to the data export subunit 14.

[0060] In summary, the automatic control module provided in this embodiment greatly improves the operational synchronization of different testing instruments when working together, and realizes automatic acquisition, real-time personalized analysis and centralized management of initial test data generated by different testing instruments, thereby greatly improving testing efficiency, testing accuracy and data analysis depth.

[0061] Furthermore, the display control unit 10 is used to: output the start signal, pause signal, and stop signal; set and output the several initial parameter data; plot the initial test data and the analysis parameter data into test curves and parameter tables and display them; and export the test curves and parameter tables, thereby realizing real-time visualization of the data.

[0062] [Second Embodiment] Please refer to Figure 3 This embodiment provides a multi-instrument collaborative testing system, including a control computer 1, a router 2, and several testing instruments 3.

[0063] The control computer 1 is connected to the router 2 via a connection line, and the router 2 is connected to several testing instruments 3 via connection lines. The control computer 1 establishes a communication connection with the several testing instruments 3 through a local area network consisting of the connection line, the router 2, and the connection line.

[0064] The control computer 1 has a built-in automatic control module provided in the first embodiment. Based on an externally input start signal, the control computer 1 converts several initial parameter data into several corresponding instrument test commands; transmits these commands to several corresponding test instruments according to a preset control sequence; collects initial test data from several test instruments 3 in real time; analyzes the initial test data according to a preset analysis algorithm and outputs analysis parameter data; and manages and stores the initial test data and analysis parameter data in the computer's memory according to a preset processing method.

[0065] The control computer 1 also outputs an instrument pause command to several corresponding test instruments based on an externally input pause signal; and outputs an instrument stop command to several corresponding test instruments based on an externally input stop signal.

[0066] In this embodiment, the automatic control module can be understood as a control program installed in a computer. This control program can be written using high-level programming languages, such as C++, Python, C, and Java, etc., without limitation. Since the automatic control module is an application program in the computer, it is equipped with programming interfaces and drivers provided by various instrument manufacturers, or directly integrates the SCPI command instruction set, to translate the instructions of the core logic layer into specific commands that the instrument can recognize.

[0067] Several testing instruments operate according to corresponding instrument testing instructions. These instruments also pause operation according to an instrument pause instruction and stop operation according to an instrument stop instruction.

[0068] In this embodiment, the testing instrument includes a semiconductor parameter analyzer and a waveform generator. Of course, in other embodiments, the testing instrument can be extended to any measurement device that supports remote control, such as a power supply, spectrum analyzer, or switch matrix, depending on the application scenario; no limitation is made here.

[0069] In this embodiment, the connection line can be a network cable. In other embodiments, the network cable can be replaced with other standard bus interfaces such as GPIB, USB, and RS-232.

[0070] In other embodiments, the control computer 1 may be replaced by a server, and remote access and control may be achieved via a client or web page.

[0071] Please refer to Figure 4 Based on the multi-instrument collaborative testing system provided in this embodiment, this embodiment also provides a multi-instrument collaborative testing method, which specifically includes the following steps: Step S100: The control computer transmits several corresponding instrument test commands to several corresponding test instruments according to the preset control timing sequence.

[0072] Step S200: Several testing instruments operate according to several corresponding instrument testing instructions.

[0073] Step S300: Control the computer to collect initial test data from several testing instruments in real time, analyze the initial test data according to the preset analysis algorithm, and output analysis parameter data.

[0074] Step S400: Control the computer to display the analysis parameter data in real time, and manage and store the initial test data and the analysis parameter data according to the preset processing method.

[0075] Step S500: Determine whether a loop is needed. If a loop is needed, proceed to step S100. If a loop is not needed, end the test.

[0076] It should be noted that before step S100, the process further includes: the user setting the initial parameter data and test procedure through the control computer's page. After setting the initial parameter data and test procedure, the control computer establishes a connection with each test instrument via a network cable. After establishing the connection with each test instrument, the control computer, based on the user-input start signal, converts the input initial parameter data into corresponding instrument test commands.

[0077] Based on the automatic control module built into the control computer, the operation synchronization of different testing instruments when working together is greatly improved. It also realizes the automatic acquisition, real-time personalized analysis and centralized management of the initial test data generated by different testing instruments, thereby greatly improving the testing efficiency, testing accuracy and data analysis depth.

[0078] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, and not to limit them; although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some or all of the technical features; and these modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of the present invention.

Claims

1. An automatic control module, characterized in that, include: Coordination and control unit, used for: Based on the start signal, the input initial parameter data are converted into several corresponding instrument test commands. According to the preset control timing sequence, several corresponding instrument test commands are transmitted to several corresponding test instruments; The system collects and outputs initial test data from the corresponding testing instruments in real time. The data analysis unit is used to analyze the initial test data according to a preset analysis algorithm and output analysis parameter data; The data management unit is used to manage and store the initial test data and the analysis parameter data according to a preset processing method.

2. The automatic control module according to claim 1, characterized in that, The coordination and control unit includes a logic control subunit, a timing control subunit, and a data acquisition subunit; The logic control subunit is used to convert several input initial parameter data into several corresponding instrument test commands based on the start signal. The timing control subunit is used to transmit several corresponding instrument test commands to several corresponding test instruments according to a preset control timing sequence; The data acquisition subunit is used to acquire and output initial test data in real time from the corresponding test instruments.

3. The automatic control module according to claim 1, characterized in that, It also includes a display control unit, used for: Output the start signal, pause signal, and stop signal; The initial parameter data are set and output to the coordination and control unit; The initial test data and the analysis parameter data are plotted into test curves and parameter tables and displayed. Export the test curves and the parameter table; The coordination and control unit is also used for: Based on the pause signal, an instrument pause command is output to several corresponding test instruments; Based on the stop signal, an instrument stop command is output to several corresponding test instruments.

4. The automatic control module according to claim 3, characterized in that, The display control unit includes a test control subunit, a parameter input subunit, a data display subunit, and a data export subunit; The test control subunit is used to output the start signal, pause signal, and stop signal; The parameter input subunit is used to set and output the several initial parameter data; The data display subunit is used to plot the initial test data and the analysis parameter data into test curves and parameter tables and display them. The data export subunit is used to export the test curve and the parameter table.

5. The automatic control module according to claim 4, characterized in that, The test curve includes at least a waveform or a transition curve.

6. The automatic control module according to claim 4, characterized in that, The export formats for the test curves and the parameter tables include at least TXT, CSV, or PNG.

7. The automatic control module according to claim 1, characterized in that, The preset processing method specifically includes: the data management unit stores the initial test data and the analysis parameter data into the computer's memory according to a preset directory structure.

8. A multi-instrument collaborative testing system, characterized in that, Includes a control computer, router, and several testing instruments; The control computer is connected to the router via a connection line, and the router is connected to several testing instruments via connection lines. The control computer has a built-in automatic control module according to any one of claims 1 to 7, and the control computer is used for: Based on the start signal, the input initial parameter data are converted into several corresponding instrument test commands. According to the preset control timing sequence, several corresponding instrument test commands are transmitted to several corresponding test instruments; Real-time acquisition of initial test data from several testing instruments; The initial test data is analyzed according to a preset analysis algorithm, and analysis parameter data is output. The initial test data and the analysis parameter data are managed and stored according to a preset processing method; Several testing instruments operate according to their respective testing instructions.

9. The multi-instrument collaborative testing system according to claim 8, characterized in that, The control computer is also used for: Based on the pause signal, the instrument pause command is output to several corresponding test instruments; Based on the stop signal, an instrument stop command is output to several corresponding test instruments; Several testing instruments paused operation according to the instrument pause command, and several testing instruments also stopped operation according to the instrument stop command.

10. A multi-instrument collaborative testing method, characterized in that, Based on the multi-instrument collaborative testing system according to any one of claims 8 to 9, the method includes: The control computer transmits several corresponding instrument test commands to several corresponding test instruments according to a preset control sequence. Several testing instruments operate according to their respective testing instructions. The computer controls the real-time acquisition of initial test data from several testing instruments, analyzes the initial test data according to a preset analysis algorithm, and outputs analysis parameter data. The computer controls the real-time display of the analysis parameter data and manages and stores the initial test data and the analysis parameter data according to a preset processing method.