Inverter conducted disturbance test method, apparatus, receiver, medium and system

Abstract

This invention provides a method, apparatus, receiver, medium, and system for conducting interference testing of inverters, relating to the field of equipment testing technology. The method includes: for any test condition among all test conditions, controlling a first LISN to perform phase adjustment, and performing conducted interference testing on the device under test based on the phase-adjusted first LISN; after all phase tests corresponding to the first LISN are completed and without power interruption, controlling a second LISN to perform phase adjustment, and performing conducted interference testing on the device under test based on the phase-adjusted second LISN; the first LISN may be an AC LISN or a DC LISN, and the second LISN may be an AC LISN or a DC LISN, wherein the first LISN and the second LISN are of different types. This invention can significantly reduce test time, thereby improving the overall test efficiency of conducted interference testing.

Description

Technical Field

[0001] This invention relates to the field of equipment testing technology, and in particular to a method, apparatus, receiver, medium, and system for testing conducted interference in inverters. Background Technology

[0002] With the global energy crisis and growing awareness of green energy, the demand for photovoltaic (PV) inverters is increasing. A PV inverter is a device that converts the solar energy collected by solar panels into AC power, which is then transmitted to the AC power grid or household appliances. Alternatively, it can convert the solar energy into DC power and store it in batteries, then convert it back into AC power to supply household appliances when the AC power grid fails. To protect household appliances from the effects of PV inverters, they must pass electromagnetic compatibility (EMC) testing in the market location before leaving the factory. Conducted emission (CE) testing during EMC testing of PV inverters requires simulating particularly complex operating conditions. Different AC (Alternating Current) and PV (Photovoltaic) ports must be tested separately under different operating conditions, each corresponding to a different phase.

[0003] In related technologies, when performing CE testing on photovoltaic inverters, the AC port is first tested and networked. CE testing is then conducted by manually modifying the phase of the AC port of the photovoltaic inverter under different operating conditions. After power-off, the PV port is switched to the test and networked, and the phase of the PV port of the photovoltaic inverter is manually modified again under different operating conditions for CE testing. During the testing process, different phases under each operating condition need to be manually modified, and the inverter needs to be powered off and then powered back on during network switching, resulting in a significant waste of testing time and low efficiency in inverter CE testing. Summary of the Invention

[0004] This invention provides a method, apparatus, receiver, medium, and system for conducting interference testing of inverters, which solves the problems of the need to manually modify different phases under various operating conditions during the testing process of related technologies, and the need to power off and then power on the inverter during network switching, resulting in a great waste of testing time and low CE testing efficiency of inverters.

[0005] This invention provides a method for testing conducted interference in an inverter, applied to a receiver connected to the device under test via an AC LISN and a DC LISN. The method includes: For any test condition among all test conditions, the first LISN is controlled to perform phase adjustment, and the conducted interference test is performed on the device under test based on the phase-adjusted first LISN; without power interruption, the second LISN is controlled to perform phase adjustment, and the conducted interference test is performed on the device under test based on the phase-adjusted second LISN. The first LISN includes the AC LISN or the DC LISN, and the second LISN includes the AC LISN or the DC LISN. The first LISN and the second LISN are of different types, and the port test types for conducted interference tests based on the first LISN and the second LISN are different.

[0006] According to the inverter conducted interference testing method provided by the present invention, the step of controlling the first LISN to perform phase adjustment includes: Responding to user actions, determine the current test template selected by the user under the current test conditions; The first phase is determined based on the template suffix of the current test template; Based on the first phase, a phase adjustment command is determined and sent to the first LISN. The phase adjustment command is used to instruct the first LISN to adjust from the previous phase to the first phase.

[0007] According to the inverter conducted interference testing method provided by the present invention, the port testing order of conducted interference testing is reversed in two adjacent test conditions.

[0008] According to the inverter conducted interference testing method provided by the present invention, in two adjacent test conditions, the first phase corresponding to the latter test condition is the same as the last phase corresponding to the former test condition.

[0009] According to the inverter conducted interference testing method provided by the present invention, each of the test conditions is determined by a first host computer connected to the device under test in response to a user operation. The first host computer is used to configure the device under test based on the operating condition parameters corresponding to each of the test conditions.

[0010] According to the inverter conducted interference testing method provided by the present invention, the conducted interference testing of the device under test based on the first LISN after phase adjustment includes: Receive the phase-adjusted interference signal corresponding to the device under test forwarded by the first LISN; Based on the interference signal, the first conducted interference test result of the device under test is determined.

[0011] The present invention also provides an inverter conducted interference testing device, applied to a receiver, wherein the receiver is connected to the device under test based on an AC LISN and a DC LISN, and the device includes: The test module is used to control the first LISN to perform phase adjustment for any test condition in all test conditions, and to perform conducted interference tests on the device under test based on the phase-adjusted first LISN; and to control the second LISN to perform phase adjustment and to perform conducted interference tests on the device under test based on the phase-adjusted second LISN without power interruption. The first LISN includes the AC LISN or the DC LISN, and the second LISN includes the AC LISN or the DC LISN. The first LISN and the second LISN are of different types, and the port test types for conducted interference tests based on the first LISN and the second LISN are different.

[0012] The present invention also provides a receiver, including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the computer program to implement the inverter conducted interference testing method as described above.

[0013] The present invention also provides a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the inverter conducted disturbance test method as described above.

[0014] The present invention also provides a computer program product, including a computer program that, when executed by a processor, implements the inverter conducted disturbance testing method as described above.

[0015] This invention also provides an inverter conducted interference testing system, comprising: a receiver, an AC LISN, a DC LISN, a device under test, an AC test assembly, and a PV test assembly, wherein: The receiver is connected to the AC LISN and the DC LISN via an RF cable, and is also connected to the device under test via the AC LISN and the DC LISN. The receiver is used to perform the inverter conducted interference test method as described in any of the preceding claims. The AC LISN is also connected to the AC test component. The AC LISN is used to perform phase adjustment based on the phase adjustment command of the receiver and then forward the interference signal corresponding to the AC port of the device under test to the receiver. The DC LISN is connected to the PV test component, which is also connected to the AC test component. The DC LISN is used to perform phase adjustment based on the phase adjustment command of the receiver and then forward the interference signal corresponding to the PV port of the device under test to the receiver.

[0016] The present invention provides an inverter conducted interference testing method, apparatus, receiver, medium, and system. Under various test conditions, a first LISN is controlled to perform phase adjustment, and conducted interference testing is performed on the device under test based on the phase-adjusted first LISN. Without power interruption, a second LISN is controlled to perform phase adjustment, and conducted interference testing is performed on the device under test based on the phase-adjusted second LISN. In this embodiment, by controlling the first or second LISN to automatically perform phase adjustment, the automation level of conducted interference testing is improved. Simultaneously, the receiver is connected to the device under test through AC and DC LISNs, forming a comprehensive network that includes both AC port test networks and PV port test networks. All conducted interference tests can be completed with a single network setup, reducing the number of test condition changes. Furthermore, when changing the conducted interference port test type, there is no need to power off and reconnect the network, significantly reducing test time and thus improving the overall testing efficiency of conducted interference testing. Attached Figure Description

[0017] To more clearly illustrate the technical solutions in this invention or related technologies, the accompanying drawings used in the description of the embodiments or related technologies will be briefly introduced below. Obviously, the accompanying drawings described below are some embodiments of this invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0018] Figure 1 This is a schematic diagram of the inverter AC port networking structure provided by related technologies.

[0019] Figure 2 This is a schematic diagram of the inverter PV port networking structure provided by related technologies.

[0020] Figure 3 This is a flowchart illustrating the inverter conducted interference testing method provided by related technologies.

[0021] Figure 4 This is one of the flowcharts of the inverter conducted disturbance test method provided in the embodiments of the present invention.

[0022] Figure 5 This is the second flowchart of the inverter conducted interference test method provided in the embodiment of the present invention.

[0023] Figure 6This is a schematic diagram of the structure of the inverter conducted interference testing device provided in an embodiment of the present invention.

[0024] Figure 7 This is a schematic diagram of the receiver provided in an embodiment of the present invention.

[0025] Figure 8 This is a schematic diagram of the inverter conducted interference testing system provided in an embodiment of the present invention. Detailed Implementation

[0026] To make the objectives, technical solutions, and advantages of this invention clearer, the technical solutions of this invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some, not all, of the embodiments of this invention. All other embodiments obtained by those skilled in the art based on the embodiments of this invention without creative effort are within the scope of protection of this invention.

[0027] Conducted emission (CE) testing, also known as conducted emission testing or disturbance voltage testing, is an electromagnetic phenomenon where conducted emissions refer to the transmission of voltage or current from within electronic equipment through cables, becoming a source of interference for other electrical devices. Conducted emission testing is used to assess the potential impact of the device under test on other electrical devices in the same power network, thereby maintaining the electromagnetic compatibility of the entire power network.

[0028] Figure 1 This is a schematic diagram of the inverter AC port networking structure provided by related technologies, such as... Figure 1 As shown, when networking at the AC (Alternating Current) port, the AC LISN (Line Impedance Stabilization Network) is connected to the receiver and the Equipment Under Test (EUT), which is the inverter under test. Figure 2 This is a schematic diagram of the inverter PV port networking structure provided by related technologies, such as... Figure 2 As shown, when networking on the PV (Photovoltaic) port, the DC LISN is connected to the receiver and the device under test respectively.

[0029] Figure 3 This is a flowchart illustrating the inverter conducted interference testing method provided by related technologies, such as... Figure 3 As shown, in related technologies, when conducting conducted interference tests, the AC ports of the device under test are networked, and the results are as follows: Figure 1The network diagram is shown below. Next, the user manually modifies the parameters to Condition 1 in the first host computer connected to the device under test. Then, in the second host computer connected to the receiver, the user manually selects the test template corresponding to the L1 phase in Condition 1 and manually switches the phase in the AC LISN to the L1 phase to complete the AC port test for the L1 phase under Condition 1. Then, the user manually switches to the test template corresponding to the L2 phase in the second host computer and manually switches the L1 phase in the AC LISN to the L2 phase to complete the AC port test for the L2 phase under Condition 1. This process is repeated until all phases of the AC port have been tested. Then, the user manually modifies the parameters to Condition 2 in the first host computer and continues to complete the AC port test for all phases. This process is repeated until all AC port tests under all conditions are completed, and then the user switches to PV port networking. Since inverters are high-voltage, high-current devices, switching from AC port networking to PV port networking requires careful attention to the specific conditions. Figure 2 When networking the PV ports as shown, the device under test (DUT) needs to be powered off and then powered on again. After networking the PV ports, the parameters can be manually modified to operating condition M via the first host computer. M represents the total number of operating conditions included in the CE test. Then, the test template corresponding to the P+ phase can be manually switched via the second host computer, and the phase of the DC LISN can be manually switched to the P+ phase to complete the PV port test under operating condition M. After that, the test template corresponding to the P- phase can be manually switched via the second host computer, and the DC LISN can be manually switched from the P+ phase to the P- phase to complete the PV port test under operating condition M. Repeat the above operations until the PV port tests under all operating conditions are completed, thus completing the CE test of the DUT.

[0030] To address the issues in related technologies where different phases under various operating conditions require manual modification during testing, and where power-off and power-back of the inverter are necessary during network switching, resulting in significant wasted testing time and low CE testing efficiency for inverters, this invention provides a conducted interference testing method for inverters. This method is applied to a receiver connected to the device under test via both an AC LISN and a DC LISN. Figure 4 This is one of the flowcharts illustrating the inverter conducted interference testing method provided in this embodiment of the invention, such as... Figure 4 As shown, the method includes the following steps 410.

[0031] Step 410: For any test condition among all test conditions, control the first LISN to perform phase adjustment, and perform conducted interference test on the device under test based on the phase-adjusted first LISN; after all phase tests corresponding to the first LISN are completed and without power interruption, control the second LISN to perform phase adjustment, and perform conducted interference test on the device under test based on the phase-adjusted second LISN. The first LISN includes the AC LISN or the DC LISN, and the second LISN includes the AC LISN or the DC LISN. The first LISN and the second LISN are of different types, and the port test types for conducted interference tests based on the first LISN and the second LISN are different.

[0032] In this embodiment of the invention, the receiver is connected to both an AC LISN and a DC LISN, and both the AC LISN and DC LISN are connected to the device under test (DUT), forming a comprehensive inverter conducted interference test system. This inverter conducted interference test system includes both AC port test networks and PV port test networks. With this inverter conducted interference test system, all CE tests can be completed with a single network setup. When performing AC port tests and PV port tests within the CE test separately, there is no need to power off and reconnect the network. Experiments show that avoiding power off and reconnecting the network in this embodiment of the invention saves at least 20 minutes of test time.

[0033] Optionally, the device under test (DUT) is also connected to a battery, and the DUT includes an AC port and a PV port. When performing CE testing on the DUT, the test conditions can include: PV port to AC mains, PV port to battery, battery to AC power supply, and AC power supply to battery, among others. Specifically, when the test condition is PV port to AC mains, it tests the conducted interference level during the process of the DUT's PV port inverting light energy into DC power and then converting the DC power into AC power before outputting it to the AC mains. When the test condition is PV port to battery, it tests the conducted interference level during the process of the DUT inverting light energy into DC power and storing it in the battery. When the test condition is battery to AC power supply, it tests the conducted interference level during the process of the battery inverting DC power into AC power and outputting the AC power to the AC power supply. When the test condition is AC power supply to battery, it tests the conducted interference level during the process of the DUT inverting AC power into DC power and storing the DC power in the battery.

[0034] It should be noted that conducted interference testing includes both AC port testing and PV port testing. Under the same test condition, when the first LISN is an AC LISN, it corresponds to AC port testing; when the second LISN is a DC LISN, it corresponds to PV port testing. Conversely, when the first LISN is a DC LISN, the second LISN is an AC LISN. For example, after adjusting to the first test condition, the first LISN is an AC LISN, and the second LISN is a DC LISN. The receiver can control the AC LISN to automatically adjust to different phases sequentially to perform AC port testing under the corresponding phases until all phases of AC port testing under the first test condition are completed. Then, the receiver can control the DC LISN to automatically adjust to different phases sequentially to perform PV port testing under the corresponding phases until all phases of PV port testing under the first test condition are completed. Finally, the receiver adjusts to the second test condition. In the second test condition, the first LISN is a DC LISN, and the second LISN is an AC LISN. The receiver can control the DC LISN to automatically adjust to different phases sequentially to perform PV port tests under the corresponding phases until the PV port tests of all phases under the second test condition are completed. Then, the receiver can control the AC LISN to automatically adjust to different phases sequentially to perform AC port tests under the corresponding phases until the AC port tests of all phases under the second test condition are completed. Finally, the receiver can adjust to the third test condition to continue testing.

[0035] Further, controlling the first LISN to perform phase adjustment includes: Responding to user actions, determine the current test template selected by the user under the current test conditions; The first phase is determined based on the template suffix of the current test template; Based on the first phase, a phase adjustment command is determined and sent to the first LISN. The phase adjustment command is used to instruct the first LISN to adjust from the previous phase to the first phase.

[0036] Specifically, the receiver has a built-in software control program that can automatically adjust the first LISN to the first phase after the user manually selects the current test template for the first phase. That is, after the user inputs a template selection command into the receiver, the built-in software control program determines the current test template selected by the user under the current test condition based on the template selection command. Then, the receiver can identify the template suffix in the current test template and determine that suffix as the first phase corresponding to the current test template. Next, the receiver can generate a phase adjustment command corresponding to the first phase and send the phase adjustment command to the first LISN, controlling the first LISN to automatically adjust to the first phase to perform the conducted interference test corresponding to the first phase under the current test condition.

[0037] Optionally, when the first LISN is an AC LISN, the first phase can be the L1 phase, L2 phase, L3 phase or N phase; when the first LISN is a DC LISN, the first phase can be the P+ phase or P- phase.

[0038] Furthermore, the control process for the receiver to automatically adjust the second LISN to the second phase can refer to the control process for the receiver to automatically adjust the first LISN to the first phase, and will not be repeated here in this embodiment of the invention. When the second LISN is an AC LISN, the second phase can be the L1 phase, L2 phase, L3 phase, or N phase; when the second LISN is a DC LISN, the second phase can be the P+ phase or the P- phase.

[0039] In this embodiment of the invention, the automatic adjustment of the phases of the first LISN and the second LISN saves the time spent manually adjusting the phases, realizes semi-automatic conducted interference testing, and thus improves testing efficiency.

[0040] Furthermore, in two adjacent test conditions, the port test order for conducted interference is reversed.

[0041] Specifically, the port testing sequence for conducted interference testing is the order in which AC port testing and PV port testing are performed. This port testing sequence can include performing AC port testing first, followed by PV port testing, or vice versa. The port testing sequence differs between adjacent test conditions. For example, in the first test condition, the receiver first controls the AC LISN to perform phase adjustment and performs the AC port test, then controls the DC LISN to perform phase adjustment and performs the PV port test. After adjusting to the second test condition, the receiver first controls the DC LISN to perform phase adjustment and performs the PV port test, then controls the AC LISN to perform phase adjustment and performs the AC port test. After adjusting to the third test condition, the receiver first controls the AC LISN to perform phase adjustment and performs the AC port test, then controls the DC LISN to perform phase adjustment and performs the PV port test.

[0042] Furthermore, in two adjacent test conditions, the first phase corresponding to the latter test condition is the same as the last phase corresponding to the former test condition.

[0043] For example, Figure 5 This is a second schematic flowchart of the inverter conducted interference testing method provided in this embodiment of the invention, as shown below. Figure 5As shown, after adjusting to the first test condition, the user can select the test template corresponding to the L1 phase on the second host computer connected to the receiver. The receiver can then control the AC LISN to automatically adjust to the L1 phase according to the test template, thereby completing the AC port test of the L1 phase under the first test condition. Afterwards, the user selects the test template corresponding to the L2 phase on the second host computer, and the receiver can continue to control the AC LISN to automatically switch from the L1 phase to the L2 phase according to the test template, completing the AC port test of the L2 phase under the first test condition. This process is repeated until the AC port test of all phases under the first test condition is completed. Next, the user can select the test template corresponding to the P+ phase on the second host computer, and the receiver can control the DC LISN to automatically adjust to the P+ phase according to the test template, completing the PV port test of the P+ phase under the first test condition. Finally, the user can select the test template corresponding to the P- phase on the second host computer, and the receiver can continue to control the DC LISN to automatically switch from the P+ phase to the P- phase according to the test template, completing the PV port test of the P- phase under the first test condition. This completes the conducted interference testing for all phases under the first test condition. After switching to the second test condition, no phase adjustment is required; the PV port test for the P-phase under the second test condition can be completed via a DC LISN. Subsequently, the user can select the test template corresponding to the P+ phase on the second host computer. The receiver can then control the DC LISN to automatically adjust the phase to the P+ phase according to the test template, completing the PV port test for the P+ phase under the second test condition. Afterwards, the user can sequentially select the test templates corresponding to the L1, L2, L3, and N phases on the second host computer. The receiver can then control the AC LISN to automatically adjust the phase to the L1, L2, L3, and N phases respectively according to the corresponding test templates. Alternatively, the user can sequentially select the test templates corresponding to the N, L3, L2, and L1 phases on the second host computer. The receiver can then control the AC LISN to automatically adjust the phase to the N, L3, L2, and L1 phases respectively according to the corresponding test templates, completing the AC port test for all phases under the second test condition. After switching to the third test condition, no phase adjustment is required. The AC port test for the N phases under the third test condition can be completed via the AC LISN. Repeat the above operation to complete the conducted interference test for all phases under the third test condition. Repeat the above operation until the conducted interference test for all test conditions is completed, and then the test ends.

[0044] In this embodiment of the invention, since the first phase of the later test condition is the same as the last phase of the previous test condition in two adjacent test conditions, the user does not need to manually select a test template and control phase adjustment, thus reducing test time. Furthermore, in related technologies, the number of test condition changes is 2(M-1) times, while in this embodiment of the invention, the number of changes is reduced to (M-1) times, further reducing test time and thereby improving the overall test efficiency of conducted disturbance testing.

[0045] Furthermore, each of the test conditions is determined by a first host computer connected to the device under test in response to a user operation. The first host computer is used to configure the device under test based on the condition parameters corresponding to each of the test conditions.

[0046] Specifically, the device under test (DUT) is also connected to a first host computer. This host computer has controls configured for different test conditions, each with its own pre-configured parameters. When switching test conditions, the user can trigger the target control for the desired test condition on the first host computer. The DUT is then configured using the pre-configured parameters within this target control, thus completing the test condition selection. Compared to related technologies where users need to manually modify parameters to adjust test conditions, this embodiment allows for one-click input of all parameters for the target test condition, reducing testing time and improving efficiency.

[0047] Further, the conducted interference test on the device under test based on the phase-adjusted first LISN includes: Receive the phase-adjusted interference signal corresponding to the device under test forwarded by the first LISN; Based on the interference signal, the first conducted interference test result of the device under test is determined.

[0048] Specifically, after the receiver controls the first LISN to perform phase adjustment, the receiver can receive the interference signal generated by the device under test (DUT) under the corresponding test condition and phase, relayed by the first LISN. Based on this interference signal, the receiver determines the first conducted interference test result for the DUT, which indicates whether the DUT passes the test under the corresponding test condition and phase. For example, when the interference signal is a conducted interference voltage, it can be compared with a threshold value. If the conducted interference voltage is greater than the threshold value, it indicates that the DUT has failed the CE test and is unqualified. If the conducted interference voltage is less than or equal to the threshold value, it indicates that the DUT passes the test under the corresponding test condition and phase.

[0049] The inverter conducted interference testing method provided in this invention adjusts the phase of a first LISN under various test conditions and performs conducted interference testing on the device under test based on the phase-adjusted first LISN. Without interrupting power, it adjusts the phase of a second LISN and performs conducted interference testing on the device under test based on the phase-adjusted second LISN. This invention improves the automation of conducted interference testing by automatically adjusting the phase of either the first or second LISN. Simultaneously, the receiver connects to the device under test via AC and DC LISNs, forming a comprehensive network that includes both AC port and PV port test networks. All conducted interference tests can be completed with a single network setup, reducing the number of test condition changes. Furthermore, when changing the conducted interference port test type, there is no need to power off and reconnect the network, significantly reducing test time and improving the overall efficiency of conducted interference testing.

[0050] The inverter conducted interference testing device provided by the present invention is described below. The inverter conducted interference testing device described below and the inverter conducted interference testing method described above can be referred to in correspondence.

[0051] This invention also provides an inverter conducted interference testing device, applied to a receiver, wherein the receiver is connected to the device under test based on an AC LISN and a DC LISN. Figure 6 This is a schematic diagram of the structure of the inverter conducted interference testing device provided in an embodiment of the present invention, as shown below. Figure 6 As shown, the inverter conducted disturbance test device 600 includes a test module 610.

[0052] The test module 610 is used to control the first LISN to perform phase adjustment for any test condition in all test conditions, and to perform conducted interference test on the device under test based on the phase-adjusted first LISN; after all phase tests corresponding to the first LISN are completed and without power interruption, it controls the second LISN to perform phase adjustment, and to perform conducted interference test on the device under test based on the phase-adjusted second LISN.

[0053] The first LISN includes the AC LISN or the DC LISN, and the second LISN includes the AC LISN or the DC LISN. The first LISN and the second LISN are of different types, and the port test types for conducted interference tests based on the first LISN and the second LISN are different.

[0054] The inverter conducted interference testing device provided in this invention adjusts the phase of a first LISN under various test conditions and performs conducted interference testing on the device under test based on the phase-adjusted first LISN. Without power interruption, it adjusts the phase of a second LISN and performs conducted interference testing on the device under test based on the phase-adjusted second LISN. This invention improves the automation of conducted interference testing by automatically adjusting the phase of either the first or second LISN. Simultaneously, the receiver connects to the device under test via AC and DC LISNs, forming a comprehensive network that includes both AC port and PV port test networks. All conducted interference tests can be completed with a single network setup, reducing the number of test condition changes. Furthermore, when changing the conducted interference port test type, there is no need to power off and reconnect the network, significantly reducing test time and improving the overall efficiency of conducted interference testing.

[0055] Optionally, the test module 610 is specifically used for: Responding to user actions, determine the current test template selected by the user under the current test conditions; The first phase is determined based on the template suffix of the current test template; Based on the first phase, a phase adjustment command is determined and sent to the first LISN. The phase adjustment command is used to instruct the first LISN to adjust from the previous phase to the first phase.

[0056] Optionally, in two adjacent test conditions, the port test order for conducted interference is reversed.

[0057] Optionally, in two adjacent test conditions, the first phase corresponding to the latter test condition is the same as the last phase corresponding to the former test condition.

[0058] Optionally, each of the test conditions is determined by a first host computer connected to the device under test in response to a user operation. The first host computer is used to configure the device under test based on the condition parameters corresponding to each of the test conditions.

[0059] Optionally, the test module 610 is specifically used for: Receive the phase-adjusted interference signal corresponding to the device under test forwarded by the first LISN; Based on the interference signal, the first conducted interference test result of the device under test is determined.

[0060] Figure 7 This is a schematic diagram of the receiver provided in an embodiment of the present invention, as shown below. Figure 7As shown, the receiver may include a processor 710, a communications interface 720, a memory 730, and a communication bus 740. The processor 710, communications interface 720, and memory 730 communicate with each other via the communication bus 740. The processor 710 can call logic instructions from the memory 730 to execute an inverter conducted interference test method, which includes: For any test condition among all test conditions, the first LISN is controlled to perform phase adjustment, and the conducted interference test is performed on the device under test based on the phase-adjusted first LISN; after all phase tests corresponding to the first LISN are completed and power is not interrupted, the second LISN is controlled to perform phase adjustment, and the conducted interference test is performed on the device under test based on the phase-adjusted second LISN. The first LISN includes the AC LISN or the DC LISN, and the second LISN includes the AC LISN or the DC LISN. The first LISN and the second LISN are of different types, and the port test types for conducted interference tests based on the first LISN and the second LISN are different.

[0061] Furthermore, the logical instructions in the aforementioned memory 730 can be implemented as software functional units and, when sold or used as independent products, can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present invention, or the part that contributes to related technologies, or a portion of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods described in the various embodiments of the present invention. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.

[0062] This invention also provides an inverter conducted interference testing system. Figure 8 This is a schematic diagram of the inverter conducted interference testing system provided in an embodiment of the present invention, as shown below. Figure 8 As shown, the system includes: a receiver, an AC LISN, a DC LISN, a device under test, an AC test assembly, and a PV test assembly.

[0063] The receiver is connected to the AC LISN and the DC LISN via an RF cable, and is also connected to the device under test via the AC LISN and the DC LISN. The receiver is used to perform the inverter conducted interference test method as described in any of the preceding claims.

[0064] The AC LISN is also connected to the AC test component. The AC LISN is used to perform phase adjustment based on the phase adjustment command of the receiver and then forward the interference signal corresponding to the AC port of the device under test to the receiver.

[0065] The DC LISN is connected to the PV test component, which is also connected to the AC test component. The DC LISN is used to perform phase adjustment based on the phase adjustment command of the receiver and then forward the interference signal corresponding to the PV port of the device under test to the receiver.

[0066] This AC test assembly comprises an AC power supply, an isolation transformer, a laboratory filter, and an AC filter connected in series. The AC power supply provides the AC power required for the device under test (DUT) to operate. The isolation transformer isolates interference signals from the power grid, ensuring the purity of the test environment. The laboratory filter filters out high-frequency interference signals from the test environment, ensuring the accuracy of the test results. The output of the AC filter is connected to an AC LISN to filter interference signals from the AC power supply, protecting the DUT from external interference.

[0067] The PV test assembly includes a DC PV source and a DC filter connected in series. The input of the DC PV source is connected to the input of the AC filter, and the output of the DC filter is connected to a DC LISN. The DC PV source is used to provide the DC power required for the inverter to operate, simulating the function of a solar panel. The DC filter is used to filter out interference signals in the DC PV source.

[0068] The receiver is connected to both an AC LISN and a DC LISN via RF lines. The AC LISN simulates the line impedance between the device under test (DUT) and the AC power grid, measuring the interference signal generated by the DUT during AC port testing and transmitting this interference signal to the receiver. The DC LISN measures the interference signal generated by the DUT during PV port testing and transmits this interference signal to the receiver.

[0069] The inverter conducted interference testing system provided in this embodiment of the invention includes both AC port test network and PV port test network. All conducted interference tests can be performed with a single network setup. When changing the type of conducted interference port test, there is no need to power off and reconnect the network, which reduces test time and improves the overall test efficiency of conducted interference testing.

[0070] On the other hand, the present invention also provides a computer program product, the computer program product comprising a computer program that can be stored on a computer-readable storage medium, wherein when the computer program is executed by a processor, the computer is able to execute the inverter conducted interference testing method provided by the above methods, the method comprising: For any test condition among all test conditions, the first LISN is controlled to perform phase adjustment, and the conducted interference test is performed on the device under test based on the phase-adjusted first LISN; after all phase tests corresponding to the first LISN are completed and power is not interrupted, the second LISN is controlled to perform phase adjustment, and the conducted interference test is performed on the device under test based on the phase-adjusted second LISN. The first LISN includes the AC LISN or the DC LISN, and the second LISN includes the AC LISN or the DC LISN. The first LISN and the second LISN are of different types, and the port test types for conducted interference tests based on the first LISN and the second LISN are different.

[0071] In another aspect, the present invention also provides a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, is implemented to perform the inverter conducted interference testing method provided by the methods described above, the method comprising: For any test condition among all test conditions, the first LISN is controlled to perform phase adjustment, and the conducted interference test is performed on the device under test based on the phase-adjusted first LISN; after all phase tests corresponding to the first LISN are completed and power is not interrupted, the second LISN is controlled to perform phase adjustment, and the conducted interference test is performed on the device under test based on the phase-adjusted second LISN. The first LISN includes the AC LISN or the DC LISN, and the second LISN includes the AC LISN or the DC LISN. The first LISN and the second LISN are of different types, and the port test types for conducted interference tests based on the first LISN and the second LISN are different.

[0072] The device embodiments described above are merely illustrative. The units described as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the modules can be selected to achieve the purpose of this embodiment according to actual needs. Those skilled in the art can understand and implement this without any creative effort.

[0073] Through the above description of the embodiments, those skilled in the art can clearly understand that each embodiment can be implemented by means of software plus necessary general-purpose hardware platforms, and of course, it can also be implemented by hardware. Based on this understanding, the above technical solutions, in essence or the parts that contribute to the related technology, can be embodied in the form of software products. This computer software product can be stored in a computer-readable storage medium, such as ROM / RAM, magnetic disk, optical disk, etc., and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute the methods described in the various embodiments or some parts of the embodiments.

[0074] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, and not to limit them; although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features; and these modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A method for testing conducted interference in an inverter, characterized in that, Applied to a receiver, the receiver being connected to the device under test based on AC LISN and DC LISN, the method includes: For any test condition among all test conditions, the first LISN is controlled to perform phase adjustment, and the conducted interference test is performed on the device under test based on the phase-adjusted first LISN; after all phase tests corresponding to the first LISN are completed and power is not interrupted, the second LISN is controlled to perform phase adjustment, and the conducted interference test is performed on the device under test based on the phase-adjusted second LISN. The first LISN includes the AC LISN or the DC LISN, and the second LISN includes the AC LISN or the DC LISN. The first LISN and the second LISN are of different types, and the port test types for conducted interference tests based on the first LISN and the second LISN are different.

2. The inverter conducted interference test method according to claim 1, characterized in that, The control of the first LISN to perform phase adjustment includes: Responding to user actions, determine the current test template selected by the user under the current test conditions; The first phase is determined based on the template suffix of the current test template; Based on the first phase, a phase adjustment command is determined and sent to the first LISN. The phase adjustment command is used to instruct the first LISN to adjust from the previous phase to the first phase.

3. The inverter conducted interference test method according to claim 1, characterized in that, In two adjacent test conditions, the port test order for conducted interference is reversed.

4. The inverter conducted interference test method according to claim 1, characterized in that, In two adjacent test conditions, the first phase of the latter test condition is the same as the last phase of the former test condition.

5. The inverter conducted interference test method according to any one of claims 1-4, characterized in that, Each of the aforementioned test conditions is determined by a first host computer connected to the device under test in response to user operation. The first host computer is used to configure the device under test based on the condition parameters corresponding to each of the aforementioned test conditions.

6. The inverter conducted interference test method according to any one of claims 1-4, characterized in that, The conducted interference test of the device under test based on the phase-adjusted first LISN includes: Receive the phase-adjusted interference signal corresponding to the device under test forwarded by the first LISN; Based on the interference signal, the first conducted interference test result of the device under test is determined.

7. An inverter conducted interference testing device, characterized in that, Applied to a receiver, the receiver being connected to the device under test based on AC LISN and DC LISN, the device includes: The test module is used to control the first LISN to perform phase adjustment for any test condition in all test conditions, and to perform conducted interference tests on the device under test based on the phase-adjusted first LISN; and to control the second LISN to perform phase adjustment and to perform conducted interference tests on the device under test based on the phase-adjusted second LISN without power interruption. The first LISN includes the AC LISN or the DC LISN, and the second LISN includes the AC LISN or the DC LISN. The first LISN and the second LISN are of different types, and the port test types for conducted interference tests based on the first LISN and the second LISN are different.

8. A receiver, comprising a memory, a processor, and a computer program stored in the memory and running on the processor, characterized in that, When the processor executes the computer program, it implements the inverter conducted disturbance test method as described in any one of claims 1 to 6.

9. A computer-readable storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by the processor, it implements the inverter conducted disturbance test method as described in any one of claims 1 to 6.

10. An inverter conducted interference testing system, characterized in that, include: Receiver, AC LISN, DC LISN, device under test, AC test kit and PV test kit, wherein: The receiver is connected to the AC LISN and the DC LISN via an RF cable, and is also connected to the device under test via the AC LISN and the DC LISN. The receiver is used to perform the inverter conducted interference test method as described in any one of claims 1-6. The AC LISN is also connected to the AC test component. The AC LISN is used to perform phase adjustment based on the phase adjustment command of the receiver and then forward the interference signal corresponding to the AC port of the device under test to the receiver. The DC LISN is connected to the PV test component, which is also connected to the AC test component. The DC LISN is used to perform phase adjustment based on the phase adjustment command of the receiver and then forward the interference signal corresponding to the PV port of the device under test to the receiver.

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