A chip simulation data monitoring method, device, equipment, medium and product
By using a time-segmented monitoring method based on chip simulation data, combined with target modules and predefined screening logic, the problem of monitoring unknown states and high-resistivity states in chip design was solved, achieving efficient and accurate chip design defect localization.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- SUZHOU YIGE TECH CO LTD
- Filing Date
- 2026-01-29
- Publication Date
- 2026-06-12
AI Technical Summary
Existing technologies are insufficient for effectively monitoring and verifying unknown states (X states) and high-resistivity states (Z states) in chip designs, making it difficult to meet testing requirements for chip design verification accuracy.
By using waveform data based on chip simulation, combined with the target module to be monitored and predefined screening logic, a dataset to be monitored is formed using data processing methods. Then, by using time-segmented monitoring methods, the data monitoring module is used to perform screening and statistics to generate the final data monitoring results.
It improves the efficiency and accuracy of chip simulation data monitoring, can quickly locate chip design defects, reduce redundant log interference, and flexibly balance detection efficiency and resource consumption.
Smart Images
Figure CN122197758A_ABST
Abstract
Description
Technical Field
[0001] This invention relates to the field of chip design technology, and specifically to a chip simulation data monitoring method, apparatus, equipment, medium, and product. Background Technology
[0002] As chip design scales exceed tens of billions of transistors, the layers of chip design are becoming increasingly complex. The special logic states X (unknown state) and Z (high impedance state) in digital circuit simulation, due to their concealment and propagation, are gradually becoming one of the problems affecting the accuracy of verifying chip design.
[0003] The methods disclosed in related technologies for verifying chip accuracy include manual waveform inspection or detection using static analysis tools. Manual waveform inspection is difficult to meet the current requirements for monitoring the state of the massive signals corresponding to chip testing, while static analysis tools are difficult to capture the state change patterns in dynamic simulation of the chip. Therefore, the methods disclosed in related technologies for verifying chip accuracy are difficult to meet the testing requirements of chip design. Summary of the Invention
[0004] This invention provides a chip simulation data monitoring method, apparatus, equipment, medium, and product to solve the problem that the methods disclosed in related technologies for verifying chip accuracy are difficult to meet the testing requirements of chip design.
[0005] In a first aspect, the present invention provides a chip simulation data monitoring method, the method comprising:
[0006] Based on the waveform data from chip simulation, combined with the target module to be monitored and the predefined filtering logic, the data processing method is used to process the waveform data to obtain the processed waveform data, which is then integrated into the dataset to be detected. Based on the processed waveform data in the dataset to be detected, at least one constructed data monitoring module is used for filtering to obtain multiple time-segmented data monitoring results; the time-segmented data monitoring results include the monitoring results of unknown state signals or high impedance state signals at each time moment; Based on the monitoring results of multiple time periods, the final monitoring results are obtained by using data statistical methods. The final monitoring results include the distribution of unknown state signals or high impedance state signals and their corresponding distribution times.
[0007] Through the above implementation method, waveform data based on chip simulation, combined with the target module to be monitored and predefined filtering logic, is processed using data processing methods to form a dataset to be detected, effectively eliminating interference from redundant logs. Then, a time-segmented monitoring method is adopted, relying on at least one constructed data monitoring module to divide the complete simulation time range into multiple continuous and non-overlapping sub-time ranges, and further filtering and monitoring the waveform data in each time segment, outputting time-segmented data monitoring results, flexibly balancing detection efficiency and resource consumption. Finally, the data monitoring results of multiple time segments are statistically integrated to generate the final data monitoring results, improving the efficiency of locating abnormal signals in chip simulation data and facilitating users to quickly locate defects in chip design.
[0008] In one optional implementation, the data processing method includes a data filtering method and a signal confirmation method. The waveform data based on chip simulation, combined with the target module to be monitored and predefined filtering logic, is processed using the data processing method to obtain processed waveform data, which is then integrated into a dataset to be detected, including: Based on the waveform data from chip simulation, and combined with the target module to be monitored, multiple target waveform data are obtained using a data filtering method; the target waveform data includes waveform data associated with the target module to be monitored. Based on multiple target waveform data, combined with predefined filtering logic, a signal confirmation method is used for confirmation to obtain the final target waveform data, which is then integrated into a dataset to be detected.
[0009] Through the above implementation method, based on the waveform data of chip simulation, the target waveform data corresponding to the target module to be detected is obtained by using the data filtering method. This eliminates irrelevant signals of non-target modules to a certain extent and narrows the scope of data processing. Then, combined with predefined filtering logic, the signal confirmation method is used to remove normal unknown signals, repetitive signals or invalid signals, so as to avoid redundant data from interfering with subsequent monitoring. This makes it easier for the final target waveform data to provide high-quality data input for time-segmented parallel monitoring and accurate identification of abnormal signals, which significantly improves the efficiency and accuracy of chip simulation data monitoring.
[0010] In one optional implementation, the predefined filtering logic includes: Select data path signals, control signals, or bidirectional signals, and exclude unknown state signals generated by preset type modules in a specified stage; the preset type modules include simulation modules, uninitialized memory, and bus contention logic, and the specified stage includes the initial simulation stage and the reset stage.
[0011] Through the above implementation method, the predefined screening logic is used to achieve targeted purification and precise focusing of chip simulation waveform data. By selecting data path signals, control signals and bidirectional signals, the monitoring objects that may characterize chip design defects are identified. At the same time, normal unknown state signals generated by simulation modules, uninitialized memory and bus competition logic in the early stage of simulation and reset stage are accurately excluded, avoiding the problem of generating massive redundant logs and interfering with monitoring results by normal unknown state signals.
[0012] In an optional implementation, the method further includes: Based on the acquired target waveform data, the signal name of each target waveform data is processed using the format preprocessing method to obtain the processed target waveform data.
[0013] Through the above implementation method, the signal names of the target waveform data are processed by the format preprocessing method, which eliminates the obstacles caused by the differences in the signal names of the target waveform data to the signal confirmation method, and improves the efficiency of obtaining the final target waveform data by the signal confirmation method.
[0014] In one optional implementation, the step of processing the signal name of each target waveform data based on the acquired target waveform data using a format preprocessing method to obtain processed target waveform data includes: For each target waveform data, the bit width identifier in the signal name of the corresponding target waveform data is deleted to obtain the processed target waveform data.
[0015] Through the above implementation method, the bit width identifier in the signal name of the target waveform data is removed by format preprocessing, thereby achieving standardization and unification of the signal name of the target waveform data, eliminating the name format differences of the same main signal with different bit widths, avoiding the matching deviation of the filtering rules caused by bit width label interference, and ensuring the accurate execution of the subsequent predefined filtering logic.
[0016] In an optional implementation, the method further includes: In response to data monitoring commands input by external users, a data monitoring module is obtained using a data monitoring module construction method; the data monitoring commands include data monitoring start time, data monitoring end time, and step time.
[0017] Through the above implementation method, based on the data monitoring commands input by external users, and by combining the monitoring start time, monitoring end time, and step time in the data monitoring commands with the data monitoring module construction method, the generated data monitoring module matches the target monitoring period and time accuracy. It can not only focus on the key stages of simulation to carry out refined monitoring, but also cover the entire process to achieve large-scale scanning, which can conveniently meet the diverse monitoring needs of different chip simulation scenarios.
[0018] Secondly, the present invention provides a chip simulation data monitoring device, the device comprising: The data processing module is used to process waveform data based on chip simulation, combined with the target module to be monitored and predefined filtering logic, using data processing methods to obtain processed waveform data, and then integrate them into a dataset to be detected. The segmented filtering module is used to filter the processed waveform data in the dataset to be detected using at least one constructed data monitoring module to obtain multiple time-segmented data monitoring results; the time-segmented data monitoring results include the monitoring results of unknown state signals or high impedance state signals at each moment; The result output module is used to obtain the final data monitoring result based on the monitoring results of multiple time periods and using data statistical methods; the final data monitoring result includes the distribution of unknown state signals or high impedance state signals and the corresponding distribution time.
[0019] Thirdly, the present invention provides an electronic device, comprising: a memory and a processor, wherein the memory and the processor are communicatively connected to each other, the memory stores computer instructions, and the processor executes the computer instructions to perform the chip simulation data monitoring method of the first aspect or any corresponding embodiment described above.
[0020] Fourthly, the present invention provides a computer-readable storage medium storing computer instructions for causing a computer to execute the chip simulation data monitoring method of the first aspect or any corresponding embodiment described above.
[0021] Fifthly, the present invention provides a computer program product, including computer instructions, which are used to cause a computer to execute the chip simulation data monitoring method of the first aspect or any corresponding embodiment described above. Attached Figure Description
[0022] To more clearly illustrate the specific embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the specific embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of the present invention. For those skilled in the art, other drawings can be obtained from these drawings without creative effort.
[0023] Figure 1 This is a schematic diagram of an application scenario according to an embodiment of the present invention; Figure 2 This is a schematic diagram of the first type of chip simulation data monitoring method according to an embodiment of the present invention; Figure 3This is a schematic diagram of the second process of the chip simulation data monitoring method according to an embodiment of the present invention; Figure 4 This is a schematic diagram of the third process of the chip simulation data monitoring method according to an embodiment of the present invention; Figure 5 This is a structural block diagram of a chip simulation data monitoring device according to an embodiment of the present invention; Figure 6 This is a schematic diagram of the hardware structure of an electronic device according to an embodiment of the present invention. Detailed Implementation
[0024] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.
[0025] It is understood that before using the technical solutions disclosed in the various embodiments of the present invention, users should be informed of the types, scope of use, and usage scenarios of the personal information involved in the present invention and their authorization should be obtained in accordance with relevant laws and regulations through appropriate means.
[0026] The terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of this invention, "a plurality of" means two or more, unless otherwise explicitly specified.
[0027] As an optional application scenario of this invention, such as Figure 1 As shown, application 101 is installed in terminal device 110, and user 130 can interact with application 101 through terminal device 110 and / or access device of terminal device 110.
[0028] For example, application 101 can be any application that provides question-and-answer related services. For instance, application 101 could be a question-and-answer interactive application, such as a text-to-text application, an image-to-text application, etc. Figure 1 In the application scenario shown, if application 101 is active, the terminal device 110 can display the interface 102 of application 101. The interface 102 may include various pages that application 101 can provide, such as interactive pages, settings pages, query pages, etc.
[0029] In some embodiments, terminal device 110 is communicatively connected to server 120 to provide services to application 101. Terminal device 110 may be a mobile terminal, fixed terminal, or portable terminal, etc., including but not limited to mobile phones, desktop computers, laptop computers, multimedia tablets, e-book devices, gaming devices, or any combination thereof, including accessories and peripherals of these devices or any combination thereof. In some embodiments, terminal device 110 may also support any type of interface, and server 120 may be various types of computing systems or servers capable of providing computing power, including but not limited to mainframes, edge computing nodes, computing devices in cloud environments, etc.
[0030] It should be noted that, Figure 1 This is merely an example of an application scenario and does not limit the scope of protection of this invention.
[0031] The embodiments of the present invention will now be described with reference to the accompanying drawings. It should be understood that the pages shown in the drawings are merely examples, and various page designs are possible in practice. The various graphic elements on the page may have different arrangements and different visual representations; one or more elements may be omitted or replaced, and one or more other elements may also be present, without any limitation in the embodiments of the present invention. Furthermore, the embodiments described below primarily pertain to terminal device 110. It should be understood that the actions described relative to terminal device 110 can be performed by application 101 on terminal device 110, or can be performed by application 101 in conjunction with its server (e.g., server 120).
[0032] The methods disclosed in related technologies for verifying chip accuracy include manual waveform inspection or detection using static analysis tools. Manual waveform inspection is difficult to meet the current requirements for monitoring the state of the massive signals corresponding to chip testing, while static analysis tools are difficult to capture the state change patterns in dynamic simulation of the chip. Therefore, the methods disclosed in related technologies for verifying chip accuracy are difficult to meet the testing requirements of chip design.
[0033] In summary, to overcome the shortcomings of publicly disclosed chip accuracy verification methods in lower-level technologies, which are difficult to meet the testing requirements of chip design, this invention provides a chip simulation data monitoring method. This method uses waveform data based on chip simulation, combined with the target module to be monitored and predefined filtering logic, to process the data and form a dataset to be tested, effectively eliminating interference from redundant logs. Then, a time-segmented monitoring approach is adopted, relying on at least one constructed data monitoring module to divide the complete simulation time range into multiple continuous and non-overlapping sub-time ranges. The waveform data within each time segment is further filtered and monitored, outputting time-segmented data monitoring results, flexibly balancing detection efficiency and resource consumption. Finally, the multiple time-segmented data monitoring results are statistically integrated to generate the final data monitoring result, improving the efficiency of identifying abnormal signals in chip simulation data and facilitating users to quickly locate defects in chip design.
[0034] According to an embodiment of the present invention, a chip simulation data monitoring method embodiment is provided. It should be noted that the steps shown in the flowchart in the accompanying drawings can be executed in a computer system such as a set of computer-executable instructions. Furthermore, although a logical order is shown in the flowchart, in some cases, the steps shown or described may be executed in a different order than that shown here.
[0035] This embodiment provides a chip simulation data monitoring method, which can be used in the aforementioned chip test server terminal. Figure 2 This is a flowchart of a chip simulation data monitoring method according to an embodiment of the present invention, such as... Figure 2 As shown, the process includes the following steps: S201, based on the waveform data from chip simulation, combined with the target module to be monitored and predefined filtering logic, uses data processing methods to process the waveform data, and then integrates it into the dataset to be detected.
[0036] Waveform data from chip simulation refers to the dynamic data file output by a chip during electronic design automation simulation, which records the changes in the state of all signals over time. It corresponds to the FSDB (Fast Signal Database) file and includes the name, bit width, level state at different time points, and logical relationships between signals of each module in the chip under test.
[0037] The target module to be monitored is a specific functional module whose signal status needs to be monitored by the user based on the chip verification requirements. This is used to limit the data processing object to the associated signals of this module and its subordinate sub-modules, thereby reducing the probability of invalid processing of the massive signals of the entire chip.
[0038] The predefined filtering logic is a set of rules that are set in advance to distinguish between "monitoring signals to be selected" and "redundant signals to be excluded", which can further purify the target waveform data.
[0039] For example, the predefined filtering logic includes: Select data path signals, control signals, or bidirectional signals, and exclude unknown state signals generated by preset type modules in a specified stage; the preset type modules include simulation modules, uninitialized memory, and bus contention logic, and the specified stage includes the initial simulation stage and the reset stage.
[0040] Specifically, the presence of unknown or high-impedance states in data path signals, control signals, and bidirectional signals usually indicates a design defect, while unknown state signals generated by analog modules, uninitialized memory, or bus contention logic in the early stages of simulation or during the reset phase are normal.
[0041] By utilizing predefined filtering logic, the directional purification and precise focusing of chip simulation waveform data are achieved. By selecting data path signals, control signals, and bidirectional signals, the monitoring objects that may characterize chip design defects are identified. At the same time, normal unknown state signals generated by simulation modules, uninitialized memory, and bus competition logic in the early stage of simulation and reset phase are accurately excluded, avoiding the problem of generating massive redundant logs and interfering with monitoring results by normal unknown state signals.
[0042] The data processing method is used to process the waveform data of chip simulation and construct it into a dataset to be tested, so as to facilitate the subsequent screening of unknown state signals or high impedance state signals by the data monitoring module and reduce the amount of waveform data of chip simulation processed by the data monitoring module.
[0043] Processed waveform data refers to waveform data that contains only the key signals of the target module after being processed by data processing methods, in order to improve the efficiency of subsequent waveform data processing.
[0044] The dataset to be detected refers to a standardized dataset formed by integrating all processed waveform data according to preset rules, which is used to screen abnormal signals using subsequent data monitoring modules.
[0045] S202, based on the processed waveform data in the dataset to be detected, at least one constructed data monitoring module is used for filtering to obtain multiple time-segmented data monitoring results; the time-segmented data monitoring results include the monitoring results of unknown state signals or high impedance state signals at each time moment.
[0046] The data monitoring module is a functional unit built based on user-input monitoring commands to monitor abnormal signals in the dataset to be detected. It is the core carrier for performing time-segmented monitoring. Multiple data monitoring modules can be deployed to process waveform data of different sub-time ranges in parallel, thereby meeting the monitoring needs of chips of different sizes.
[0047] Specifically, the data monitoring module can be implemented as a script generated based on the monitoring command input by the user, which reads the waveform data of the dataset to be detected, scans the signal state at a preset time granularity, and identifies and records unknown state signals or high impedance state signals.
[0048] The data monitoring module can be implemented by setting a time cursor according to the wvSetCursor command at the start time of data monitoring, then obtaining the value of the waveform data after centralized processing of the dataset to be detected at that moment, and then determining whether there are unknown state signals or high impedance state signals. After detecting all signals, a step time will be added to start the next round of detection.
[0049] The time-segmented data monitoring results are the signal anomaly monitoring results corresponding to each sub-time interval after the complete simulation monitoring time range is divided into multiple continuous and non-overlapping sub-time intervals.
[0050] Unknown state signals refer to signals that are in an uncertain level state during chip simulation due to reasons such as undefined logic, uncovered conditional branches, or signal assignment conflicts. The corresponding state is marked as X state.
[0051] A high-impedance signal refers to a signal that is in a floating state without effective drive during chip simulation, and the corresponding state is identified as the Z state.
[0052] S203. Based on the monitoring results of multiple time-segmented data, the final data monitoring result is obtained by using data statistical methods; the final data monitoring result includes the distribution of unknown state signals or high impedance state signals and the corresponding distribution time.
[0053] Time-segmented data monitoring results refer to the signal anomaly monitoring records independently output by the data monitoring module within each sub-time period after division. These records include the names of all unknown state signals and high-impedance state signals within each sub-time period, the specific time when the anomaly occurred, and the signal status value.
[0054] Data statistical methods refer to a series of processing techniques for summarizing, classifying, and analyzing monitoring results from multiple time periods, thereby transforming isolated monitoring records scattered across various sub-time periods into statistical data with correlation and regularity.
[0055] The final data monitoring result refers to the comprehensive monitoring report output after data statistical processing. It is used to intuitively present the overall distribution characteristics of abnormal signals during chip simulation, and to provide engineers with a global and structured reference for locating design defects.
[0056] The distribution of unknown state signals or high impedance state signals and their corresponding distribution time refer to the statistical distribution of abnormal signals in the chip module, including their attribution, type, and frequency distribution, as well as the time interval and time pattern of each abnormal signal.
[0057] In a chip simulation data monitoring method provided by this invention, waveform data from chip simulation is processed using a data processing method, combined with the target module to be monitored and predefined filtering logic, to form a dataset to be detected, effectively eliminating interference from redundant logs. Then, a time-segmented monitoring approach is adopted, relying on at least one constructed data monitoring module to divide the complete simulation time range into multiple continuous and non-overlapping sub-time ranges, and further filtering and monitoring the waveform data within each time segment, outputting time-segmented data monitoring results, flexibly balancing detection efficiency and resource consumption. Finally, the multiple time-segmented data monitoring results are statistically integrated to generate the final data monitoring results, improving the efficiency of identifying abnormal signals in chip simulation data and facilitating users to quickly locate defects in chip design.
[0058] This embodiment provides a chip simulation data monitoring method, which can be used in the aforementioned chip test server terminal. Figure 3 This is a flowchart of a chip simulation data monitoring method according to an embodiment of the present invention, such as... Figure 3 As shown, the process includes the following steps: S301 uses waveform data from chip simulation, combined with the target module to be monitored and predefined filtering logic, to process the data using data processing methods, obtain the processed waveform data, and integrate them into the dataset to be detected.
[0059] Specifically, S301 includes: S3011, based on the waveform data from chip simulation, combined with the target module to be monitored, multiple target waveform data are obtained using a data filtering method; the target waveform data includes waveform data associated with the target module to be monitored; S3012, based on multiple target waveform data, combined with predefined filtering logic, uses a signal confirmation method to confirm and obtain the final target waveform data, which is then integrated into a dataset to be detected.
[0060] The data filtering method can be implemented by using wvGetSignalByAcope (a command used to precisely obtain signal objects by specifying a hierarchical path of the signal in the waveform window of the Verdi tool, which is a platform for debugging and verifying system-on-a-chip or integrated circuit designs) to obtain all signals for a given module name.
[0061] The signal confirmation method involves masking or selecting certain target waveform data based on given conditions. Specifically, it is normal for simulation modules, uninitialized memory, or bus contention logic to generate unknown state signals during the initial simulation or reset phase. By eliminating these signals, irrelevant log data to be detected can be reduced. However, the presence of unknown state signals in data paths, control signals, and bidirectional signals indicates the existence of logical errors, uncovered conditional branches, or assignment conflicts. These signals need to be selected according to preset logic to facilitate subsequent verification of the chip design.
[0062] By using waveform data based on chip simulation and employing data filtering methods, target waveform data corresponding to the target module to be detected is obtained, which to some extent eliminates irrelevant signals from non-target modules and narrows the scope of data processing. Then, combined with predefined filtering logic, signal confirmation methods are used to remove normal unknown signals, repetitive signals, or invalid signals, avoiding redundant data interference with subsequent monitoring. This facilitates the provision of high-quality data input for the final target waveform data to support time-segmented parallel monitoring and accurate identification of abnormal signals, significantly improving the efficiency and accuracy of chip simulation data monitoring.
[0063] Furthermore, to improve the convenience of filtering target waveform data, this embodiment of the invention, after acquiring multiple target waveform data, further includes: a1, based on the acquired target waveform data, uses the format preprocessing method to process the signal name of each target waveform data to obtain the processed target waveform data.
[0064] Specifically, a1 above includes: For each target waveform data, the bit width identifier in the signal name of the corresponding target waveform data is deleted to obtain the processed target waveform data.
[0065] By using format preprocessing to remove the bit width identifier from the signal name of the target waveform data, the signal name of the target waveform data is standardized and unified, eliminating the name format differences of the same main signal with different bit widths, avoiding the matching deviation of the filtering rules caused by bit width label interference, and ensuring the accurate execution of the subsequent predefined filtering logic.
[0066] S302, based on the processed waveform data in the dataset to be detected, at least one constructed data monitoring module is used for filtering to obtain multiple time-segmented data monitoring results; the time-segmented data monitoring results include the monitoring results of unknown state signals or high-impedance state signals at each time moment. For details, please refer to... Figure 1 S202 of the illustrated embodiment will not be described again here.
[0067] S303, based on monitoring results from multiple time-segmented data points, uses statistical methods to obtain the final data monitoring result; the final data monitoring result includes the distribution of unknown state signals or high-impedance state signals and their corresponding distribution times. For details, please refer to [link to relevant documentation]. Figure 1 S203 of the illustrated embodiment will not be described again here.
[0068] In a chip simulation data monitoring method provided by this invention, waveform data from chip simulation is processed using a data processing method, combined with the target module to be monitored and predefined filtering logic, to form a dataset to be detected, effectively eliminating interference from redundant logs. Then, a time-segmented monitoring approach is adopted, relying on at least one constructed data monitoring module to divide the complete simulation time range into multiple continuous and non-overlapping sub-time ranges, and further filtering and monitoring the waveform data within each time segment, outputting time-segmented data monitoring results, flexibly balancing detection efficiency and resource consumption. Finally, the multiple time-segmented data monitoring results are statistically integrated to generate the final data monitoring results, improving the efficiency of identifying abnormal signals in chip simulation data and facilitating users to quickly locate defects in chip design.
[0069] This embodiment provides a chip simulation data monitoring method, which can be used in the aforementioned chip test server terminal. Figure 4 This is a flowchart of a chip simulation data monitoring method according to an embodiment of the present invention, such as... Figure 4 As shown, the process includes the following steps: S401, based on waveform data from chip simulation, combines the target module to be monitored and predefined filtering logic, and uses data processing methods to process the data to obtain the processed waveform data, which is then integrated into the dataset to be tested. For details, please refer to [link to relevant documentation]. Figure 2 S201 of the illustrated embodiment will not be described again here.
[0070] S402, in response to a data monitoring command input by an external user, a data monitoring module is obtained using a data monitoring module construction method; the data monitoring command includes a data monitoring start time, a data monitoring end time, and a step time.
[0071] The step time can be set using the Verdi tools' `verdiSetTimeUnit` command (which sets the display unit of the time axis in the waveform window), such as 1 ps (picosecond, 10 ps). - ¹² s, picosecond); meanwhile, the start and end times of data monitoring can be obtained from the waveform data of the chip using the wvGetViewTimeRange command (a command for setting the time axis range in the waveform window).
[0072] Based on data monitoring commands input by external users, the system generates data monitoring modules that match the target monitoring period and time precision by monitoring start time, monitoring end time, and step time, combined with the data monitoring module construction method. This allows users to set monitoring intervals and granularity as needed, enabling them to focus on key simulation stages for refined monitoring or cover the entire process for large-scale scanning. This significantly improves the flexibility and adaptability of the method, meeting the diverse monitoring needs of different chip simulation scenarios.
[0073] S403, based on the processed waveform data in the dataset to be detected, at least one constructed data monitoring module is used for filtering to obtain multiple time-segmented data monitoring results; the time-segmented data monitoring results include the monitoring results of unknown state signals or high-impedance state signals at each time moment. For details, please refer to... Figure 1 S202 of the illustrated embodiment will not be described again here.
[0074] S404, based on monitoring results from multiple time periods, uses statistical methods to obtain the final monitoring results; the final monitoring results include the distribution of unknown state signals or high-impedance state signals and their corresponding distribution times. For details, please refer to [link to relevant documentation]. Figure 1 S203 of the illustrated embodiment will not be described again here.
[0075] In a chip simulation data monitoring method provided by this invention, waveform data from chip simulation is processed using a data processing method, combined with the target module to be monitored and predefined filtering logic, to form a dataset to be detected, effectively eliminating interference from redundant logs. Then, a time-segmented monitoring approach is adopted, relying on at least one constructed data monitoring module to divide the complete simulation time range into multiple continuous and non-overlapping sub-time ranges, and further filtering and monitoring the waveform data within each time segment, outputting time-segmented data monitoring results, flexibly balancing detection efficiency and resource consumption. Finally, the multiple time-segmented data monitoring results are statistically integrated to generate the final data monitoring results, improving the efficiency of identifying abnormal signals in chip simulation data and facilitating users to quickly locate defects in chip design.
[0076] This embodiment also provides a chip simulation data monitoring device, which is used to implement the above embodiments and preferred embodiments; details already described will not be repeated. As used below, the term "module" can be a combination of software and / or hardware that implements a predetermined function. Although the device described in the following embodiments is preferably implemented in software, hardware implementation, or a combination of software and hardware, is also possible and contemplated.
[0077] This embodiment provides a chip simulation data monitoring device, such as... Figure 5 As shown, the device includes: The data processing module 510 is used to process waveform data based on chip simulation, combined with the target module to be monitored and predefined filtering logic, using data processing methods to obtain processed waveform data, and integrate them into a dataset to be detected. The segmented filtering module 520 is used to filter the processed waveform data in the dataset to be detected using at least one constructed data monitoring module to obtain multiple time-segmented data monitoring results; the time-segmented data monitoring results include the monitoring results of unknown state signals or high impedance state signals at each moment; The result output module 530 is used to obtain the final data monitoring result based on the monitoring results of multiple time periods and using data statistical methods; the final data monitoring result includes the distribution of unknown state signals or high impedance state signals and the corresponding distribution time.
[0078] In some optional embodiments, the data processing module 510 includes: The first screening unit, based on the waveform data from chip simulation and combined with the target module to be monitored, uses a data screening method to obtain multiple target waveform data; the target waveform data includes waveform data associated with the target module to be monitored; The second filtering unit is used to verify multiple target waveform data using a signal verification method based on predefined filtering logic, to obtain the final target waveform data, and to synthesize it into a dataset to be detected.
[0079] In some optional embodiments, the predefined filtering logic in the data processing module 510 includes: Select data path signals, control signals, or bidirectional signals, and exclude unknown state signals generated by preset type modules in a specified stage; the preset type modules include simulation modules, uninitialized memory, and bus contention logic, and the specified stage includes the initial simulation stage and the reset stage.
[0080] In some optional embodiments, the data processing module 510 further includes: The signal name preprocessing unit is used to process the signal name of each target waveform data according to the acquired target waveform data using the format preprocessing method, so as to obtain the processed target waveform data.
[0081] In some alternative implementations, the signal name preprocessing unit may be implemented as follows: For each target waveform data, the bit width identifier in the signal name of the corresponding target waveform data is deleted to obtain the processed target waveform data.
[0082] In some optional embodiments, it also includes: The monitoring module construction module is used to respond to data monitoring commands input by external users and to obtain the data monitoring module using the data monitoring module construction method; the data monitoring command includes data monitoring start time, data monitoring end time, and step time.
[0083] The chip simulation data monitoring device provided in this embodiment of the invention can execute the chip simulation data monitoring method provided in any embodiment of the invention, and has the corresponding functional modules and beneficial effects for executing the method. Further functional descriptions of the above modules and units are the same as in the corresponding embodiments described above, and will not be repeated here.
[0084] Figure 6 This is a schematic diagram of the structure of an electronic device provided in an embodiment of the present invention.
[0085] The following is a detailed reference. Figure 6 This diagram illustrates a suitable structural design for implementing an electronic device according to embodiments of the present invention. The electronic device may include a processor (e.g., a central processing unit, graphics processor, etc.) 601, which can perform various appropriate actions and processes based on a program stored in read-only memory (ROM) 602 or a program loaded from memory 608 into random access memory (RAM) 603. RAM 603 also stores various programs and data required for the operation of the electronic device. The processor 601, ROM 602, and RAM 603 are interconnected via a bus 604. An input / output (I / O) interface 605 is also connected to the bus 604.
[0086] Typically, the following devices can be connected to I / O interface 605: input devices 606 including, for example, touchscreens, touchpads, keyboards, mice, cameras, microphones, accelerometers, gyroscopes, etc.; output devices 607 including, for example, liquid crystal displays (LCDs), speakers, vibrators, etc.; memory devices 608 including, for example, magnetic tapes, hard disks, etc.; and communication devices 609. Communication device 609 allows electronic devices to communicate wirelessly or wiredly with other devices to exchange data. Although Figure 6Electronic devices with various devices are shown, but it should be understood that it is not required to implement or have all of the devices shown, and more or fewer devices may be implemented or have instead.
[0087] In particular, according to embodiments of the present invention, the processes described above with reference to the flowcharts can be implemented as computer software programs. For example, embodiments of the present invention include a computer program product comprising a computer program carried on a non-transitory computer-readable medium, the computer program containing program code for performing the methods shown in the flowcharts. In such embodiments, the computer program can be downloaded and installed from a network via a communication device 609, or installed from a memory 608, or installed from a ROM 602. When the computer program is executed by the processor 601, it performs the functions defined in the chip simulation data monitoring method of the embodiments of the present invention.
[0088] Figure 6 The electronic device shown is merely an example and should not be construed as limiting the functionality and scope of use of the embodiments of the present invention.
[0089] This invention also provides a computer-readable storage medium. The methods described above according to embodiments of the invention can be implemented in hardware or firmware, or implemented as computer code that can be recorded on a storage medium, or implemented as computer code downloaded via a network and originally stored on a remote storage medium or a non-transitory machine-readable storage medium and then stored on a local storage medium. Thus, the methods described herein can be processed by software stored on a storage medium using a general-purpose computer, a dedicated processor, or programmable or dedicated hardware. The storage medium can be a magnetic disk, optical disk, read-only memory, random access memory, flash memory, hard disk, or solid-state drive, etc.; further, the storage medium can also include combinations of the above types of memory. It is understood that computers, processors, microprocessor controllers, or programmable hardware include storage components capable of storing or receiving software or computer code. When the software or computer code is accessed and executed by the computer, processor, or hardware, the chip simulation data monitoring method shown in the above embodiments is implemented.
[0090] A portion of this invention can be applied as a computer program product, such as computer program instructions, which, when executed by a computer, can invoke or provide the methods and / or technical solutions according to the invention through the operation of the computer. Those skilled in the art will understand that the forms in which computer program instructions exist in a computer-readable medium include, but are not limited to, source files, executable files, installation package files, etc. Correspondingly, the ways in which computer program instructions are executed by a computer include, but are not limited to: the computer directly executing the instructions, or the computer compiling the instructions and then executing the corresponding compiled program, or the computer reading and executing the instructions, or the computer reading and installing the instructions and then executing the corresponding installed program. Here, the computer-readable medium can be any available computer-readable storage medium or communication medium accessible to a computer.
[0091] Although embodiments of the invention have been described in conjunction with the accompanying drawings, those skilled in the art can make various modifications and variations without departing from the spirit and scope of the invention, and such modifications and variations all fall within the scope defined by the appended claims.
Claims
1. A method for monitoring chip simulation data, characterized in that, The method includes: Based on the waveform data from chip simulation, combined with the target module to be monitored and the predefined filtering logic, the data processing method is used to process the waveform data to obtain the processed waveform data, which is then integrated into the dataset to be detected. Based on the processed waveform data in the dataset to be detected, at least one constructed data monitoring module is used for filtering to obtain multiple time-segmented data monitoring results; the time-segmented data monitoring results include the monitoring results of unknown state signals or high impedance state signals at each time moment; Based on the monitoring results of multiple time periods, the final monitoring results are obtained by using data statistical methods. The final monitoring results include the distribution of unknown state signals or high impedance state signals and their corresponding distribution times.
2. The method according to claim 1, characterized in that, The data processing method includes a data filtering method and a signal confirmation method. The waveform data based on chip simulation, combined with the target module to be monitored and predefined filtering logic, is processed using the data processing method to obtain processed waveform data, which is then integrated into a dataset to be detected, including: Based on the waveform data from chip simulation, and combined with the target module to be monitored, multiple target waveform data are obtained using a data filtering method; the target waveform data includes waveform data associated with the target module to be monitored. Based on multiple target waveform data, combined with predefined filtering logic, a signal confirmation method is used for confirmation to obtain the final target waveform data, which is then integrated into a dataset to be detected.
3. The method according to claim 2, characterized in that, The predefined filtering logic includes: Select data path signals, control signals, or bidirectional signals, and exclude unknown state signals generated by preset type modules in a specified stage; the preset type modules include simulation modules, uninitialized memory, and bus contention logic, and the specified stage includes the initial simulation stage and the reset stage.
4. The method according to claim 2, characterized in that, The method further includes: Based on the acquired target waveform data, the signal name of each target waveform data is processed using the format preprocessing method to obtain the processed target waveform data.
5. The method according to claim 4, characterized in that, Based on the acquired target waveform data, the signal name of each target waveform data is processed using a format preprocessing method to obtain processed target waveform data, including: For each target waveform data, the bit width identifier in the signal name of the corresponding target waveform data is deleted to obtain the processed target waveform data.
6. The method according to claim 1, characterized in that, The method further includes: In response to data monitoring commands input by external users, a data monitoring module is obtained using a data monitoring module construction method; the data monitoring commands include data monitoring start time, data monitoring end time, and step time.
7. A chip simulation data monitoring device, characterized in that, The device includes: The data processing module is used to process waveform data based on chip simulation, combined with the target module to be monitored and predefined filtering logic, using data processing methods to obtain processed waveform data, and then integrate them into a dataset to be detected. The segmented filtering module is used to filter the processed waveform data in the dataset to be detected using at least one constructed data monitoring module to obtain multiple time-segmented data monitoring results; the time-segmented data monitoring results include the monitoring results of unknown state signals or high impedance state signals at each moment; The result output module is used to obtain the final data monitoring result based on the monitoring results of multiple time periods and using data statistical methods; the final data monitoring result includes the distribution of unknown state signals or high impedance state signals and the corresponding distribution time.
8. An electronic device, characterized in that, include: A memory and a processor are interconnected, the memory stores computer instructions, and the processor executes the computer instructions to perform the chip simulation data monitoring method according to any one of claims 1 to 6.
9. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores computer instructions for causing the computer to execute the chip simulation data monitoring method according to any one of claims 1 to 6.
10. A computer program product, characterized in that, It includes computer instructions for causing a computer to execute the chip simulation data monitoring method according to any one of claims 1 to 6.