Sma jumper multifunctional testing device and testing method thereof

Abstract

The application discloses a kind of SMA jumper multifunctional testing device and testing method thereof, comprising: medical wave band laser unit, coupling connection unit is coupled with the medical wave band laser unit, output end is used to connect at least one SMA jumper to be tested, control and data processing unit, test software, thermal imager test SMA jumper to be tested overall temperature.The application, 10~50W medical SMA jumper multi-wavelength, multi-parameter integration automatic test is realized, replace flange plate can be adapted to different wavelengths, reduce equipment cost and utilization rate is improved, single jumper full parameter test time is short, satisfy batch detection demand;Power drift is over threshold value and is automatically alarmed, reduce artificial error, test accurate, data is automatically collected and calculated, determine storage, can be connected to MES system, realize whole process traceability, also can detect jumper temperature under high power, comprehensively solve the problems, such as traditional test cost is high, efficiency is low, data management is weak.

Description

Technical Field

[0001] This invention relates to the field of jumper testing technology, and in particular to a multifunctional testing device and testing method for SMA jumpers. Background Technology

[0002] In the field of medical laser equipment, SMA jumpers are core transmission components. Their optical parameters, such as insertion loss and return loss, as well as their stability under high-power conditions, directly affect the accuracy and safety of laser treatment. Therefore, batch, efficient, and accurate testing of SMA jumpers is a key process in the production of medical laser equipment.

[0003] However, current SMA patch cord testing technology faces several pressing issues: First, due to the significant variations in fiber core diameter specifications for medical SMA patch cords, existing testing equipment requires specially designed and developed adapter modules for different core diameter specifications. The lack of a universal commercial testing solution results in high equipment development costs, poor versatility, and difficulty in adapting to diverse production needs. Second, traditional testing methods rely on manual data recording, making it impossible to save and trace test results in real time. They lack automatic judgment functions and the ability to interface with Manufacturing Execution Systems (MES), hindering the linkage management of test data and production processes. This leads to data errors, traceability difficulties, and other problems, impacting production. Quality control efficiency is a concern. Furthermore, existing testing equipment is mostly designed for single wavelengths and single parameters, allowing only one indicator to be tested per test. Frequent equipment changes or parameter adjustments are necessary, resulting in low equipment utilization, time-consuming cable replacements, and difficulty meeting the efficiency requirements for batch testing of high-power medical SMA jumpers. Additionally, in 10-50W high-power medical applications, temperature stability is a critical performance indicator for SMA jumpers, but existing equipment lacks a dedicated temperature testing module. Moreover, the light source power is prone to drift, and there is no effective real-time monitoring and alarm mechanism, leading to insufficient testing reliability in high-power scenarios and failing to fully guarantee the safety of SMA jumpers.

[0004] Therefore, developing an integrated testing device that combines multi-wavelength adaptation, multi-parameter synchronous testing, automatic data processing, and high-power scenario stability monitoring capabilities to solve the problems of high cost, low efficiency, weak data management, and insufficient testing reliability in existing technologies has become an urgent need in the field of medical SMA jumper testing. Summary of the Invention

[0005] The purpose of this invention is to address the shortcomings mentioned above by providing a multi-functional testing device and method for SMA jumpers, which solves the problems of high cost, low efficiency, and weak data management in traditional testing.

[0006] To solve the above-mentioned technical problems, the present invention adopts the following technical solution: a medical SMA jumper optical parameter testing device, comprising: A medical band laser unit, comprising an LD1 light source, an LD2 light source, a CPS mode matcher, a CMS mode stripper, an SMA connector, a PD1 detector, a PD2 detector, and a PD3 detector; The CPS mode matcher is connected to the light source, the CMS stripper is connected to the CPS mode matcher, and the SMA connector is matched with the CMS stripper to provide medical laser output; The PD1 detector is connected to the CMS stripper and is used to monitor the power of the LD1 light source. The PD2 detector is used to monitor the power of the LD2 light source. The dark current of the PD1 detector, PD2 detector, and PD3 detector is higher than 1nA, and the responsivity is higher than 0.9A / W. A coupling connection unit, wherein the input end of the coupling connection unit is coupled to the medical band laser unit, and the output end is used to connect at least one SMA jumper to be tested; The control and data processing unit includes an embedded ARM+FPGA main control board and a server. The ARM+FPGA main control board is electrically connected to the medical band laser unit and is used to control the on / off state of the laser. The server is communicatively connected to the ARM+FPGA main control board and is used to receive, calculate, determine and store test data. The testing software, deployed on a server, is used to import product specification templates, automatically determine whether the SMA jumper under test is qualified based on test data, generate test reports, and interact with the MES system. A thermal imager is used to test the overall temperature of the SMA jumper under test after the LD1 light source power reaches a predetermined value and continues for a preset time.

[0007] Furthermore, the coupling connection unit is equipped with SMA interface flanges of various specifications. The interface flanges are detachable and are used to adapt to SMA jumpers with different core diameters.

[0008] Furthermore, it also includes a power meter, which is communicatively connected to the server and used to collect power data of the SMA jumper under test and transmit it to the server. The server establishes a data connection with the power meter through GPIB or LAN communication.

[0009] Furthermore, the medical band laser unit also includes a coupler, which is connected to the LD2 light source, the PD2 detector, and the PD3 detector to form a return loss test optical path.

[0010] Furthermore, the server is connected to an SQL Server database, which is used to store test data, product specification templates, and test reports of the SMA jumper under test.

[0011] Furthermore, it also includes a barcode scanning module, which is connected to the server to scan the barcode of the SMA jumper under test and bind the jumper ID. The server downloads the corresponding test task from the MES system according to the jumper ID.

[0012] The present invention adopts another technical solution as follows: a method for testing SMA jumpers using a medical SMA jumper optical parameter testing device, comprising the following steps: S1: Based on the specifications of the SMA jumper under test, select the matching wavelength and light source power parameters, perform a zeroing action on the test device, scan the barcode of the SMA jumper under test through the barcode scanning module, bind the jumper ID, and download the corresponding test task from the MES system; S2: Import the product specification template that matches the SMA jumper under test into the testing software, and set the judgment thresholds for insertion loss and return loss in the template. S3: Connect the SMA jumper to be tested to the interface flange of the coupling connection unit, start the medical band laser unit, and collect power data in real time through the power meter, PD1 detector, and PD2 detector and transmit it to the server; S4: The server calculates the insertion loss and return loss parameters of the SMA jumper under test based on the collected power data, compares the calculation results with the set judgment threshold, and automatically marks the qualified / unqualified results and unqualified data items through the test software. S5: The server writes the test data and judgment results into the SQL Server database, automatically generates a test report in PDF or Excel format through the test software, and uploads the test report to the MES system; S6: If you need to test the temperature performance under high power, adjust the LD1 light source power to 50W and continue for a preset time. Use a thermal imager to test the overall temperature of the SMA jumper under test and determine whether the temperature meets the product specifications.

[0013] Furthermore, in step S3, the power drift of LD1 and LD2 light sources is monitored in real time. If the power drift exceeds ±3%, the test software automatically sends a command to the server to pause the test and trigger an alarm.

[0014] Furthermore, in step S3, when testing the return loss parameters, the LD2 light source is selected as the test light source, the tail of the SMA jumper to be tested is wrapped tightly, the return power data is collected through the coupler and PD3 detector and transmitted to the server, and the server calculates the return loss parameters.

[0015] Furthermore, the testing device supports testing of high-power medical laser jumpers ranging from 10 to 50W, and the full parameter testing time for a single SMA jumper under test is ≤30s.

[0016] The beneficial effects of this invention are reflected in: This invention enables integrated automatic testing of 10-50W medical SMA jumpers across multiple wavelengths and parameters. Different wavelengths can be adapted simply by changing the flange, reducing equipment costs and increasing utilization. The short testing time for each jumper meets batch testing needs. Automatic alarm for power drift exceeding thresholds reduces human error, ensuring accurate testing. Data is automatically collected, calculated, judged, and stored, allowing integration with MES systems for full-process traceability. It can also detect jumper temperature under high power conditions, comprehensively solving the problems of high cost, low efficiency, and weak data management in traditional testing. Attached Figure Description

[0017] Figure 1 This is a schematic diagram of the optical path of the system of the present invention; Figure 2 This is a schematic diagram of the optical path for RL testing in the system of the present invention; Figure 3 This is a block diagram of the control unit and drive / receiver circuit of the present invention. Detailed Implementation

[0018] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of the present invention, and not all of them. Unless otherwise specified, the embodiments and features in the embodiments of this application can be combined with each other. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0019] Please see Figure 1-3 This invention discloses a medical SMA jumper optical parameter testing device and corresponding testing method. The device can realize multi-wavelength, multi-parameter integrated automatic testing of 10~50W high-power medical SMA jumpers. The full parameter testing time of a single jumper is controlled within 20~30s, which can meet the batch rapid testing needs of medical high-power SMA jumpers and solve the technical problems of high testing cost, low efficiency, weak data management and insufficient testing reliability in the prior art. The following describes the overall structure of the device and the actual operation process in detail. The various components of the device establish a linkage relationship through optical coupling, electrical connection or standardized communication protocol to realize full-process automation from laser output, parameter acquisition to data processing and result judgment.

[0020] In this application, the medical band laser unit is the core light source output module of the device, and is equipped with an LD1 light source, an LD2 light source, a CPS mode matcher, a CMS mode stripper, an SMA connector with an SMA flange, a PD1 detector, a PD2 detector, a PD3 detector, and a coupler. Among them, PD1, PD2 and PD3 all use InGaAs detectors, with dark current ≥1nA and responsivity ≥0.9A / W, which can effectively reduce the detection noise caused by dark current and improve the signal detection accuracy in the low power range.

[0021] Secondly, the CPS mode matcher is connected to the light source, the CMS stripper is connected to the CPS mode matcher, and the SMA connector is matched with the CMS stripper to achieve stable output of medical laser. PD1 is dedicated to monitoring the power of LD1 light source, and PD2 is dedicated to monitoring the power of LD2 light source. The coupler is a 2*2 coupler, which is connected to LD2 light source, PD2, and PD3 to form a dedicated test optical path for return loss (RL), providing the optical path foundation for accurate testing of RL parameters.

[0022] In this application, the coupling connection unit is an adapter connection module between the device and the jumper under test. Its input end is optically coupled to the medical band laser unit, and its output end is used to connect at least one SMA jumper under test. The unit is equipped with multiple detachable SMA905 interface flanges, which are adapted to mainstream medical laser wavelengths such as 635nm, 808nm, 980nm, and 1064nm. The flanges adopt a threaded connection, and the replacement operation takes ≤3s. There is no need to recalibrate the optical path. A single device can realize multi-wavelength jumper testing, which greatly reduces the research and development and production costs of dedicated testing equipment and increases the equipment utilization rate by more than 80%.

[0023] In this application, the control and data processing unit is the core instruction control and data processing module of the device, consisting of an ARM+FPGA main control board and a server. The ARM+FPGA main control board is electrically connected to the medical band laser unit, enabling precise control of the on / off state and power adjustment of LD1 and LD2 light sources. The server establishes a bidirectional data connection with the main control board via the RS485 serial communication protocol, issuing light source control commands and transmitting test data back. Simultaneously, it receives data collected from various PD detectors and power meters, performs data calculation, analysis, and result judgment, and then classifies and stores the data. The server connects to an SQL Server database to store test data, product specification templates, and test reports, achieving long-term data preservation and full-process traceability. The power meter and server provide continuous raw data for calculating insertion loss (IL) and RL. The barcode scanning module communicates with the server, scanning product barcodes to bind jumper IDs. The server automatically downloads the corresponding test tasks from the MES system based on the bound IDs, eliminating the need for manual data entry and enabling linkage between test data and the production system.

[0024] In this application, the testing software and thermal imager are supplementary modules to the device. The thermal imager is used for high-power temperature performance testing of the jumper under test, and the testing software is deployed on a server to achieve intelligent data processing. The testing software can import product specification templates that match the jumper under test. The templates contain core judgment criteria such as the wavelength adaptation range of the jumper under test, the IL threshold, RL threshold, and temperature threshold at 50W power, etc. The software has a built-in industry-standard optical parameter calculation model. IL is calculated using the formula IL=-10lg(Pout / Pin), where Pin is the output power of the laser unit and Pout is the output power of the jumper under test. RL is calculated using the formula RL=-10lg(Pre / Pin), where Pre is the echo power acquired by PD3; The software can compare the calculation results with the template threshold in real time, automatically identify the pass / fail status of the test results, highlight parameters exceeding the threshold in red, and record the deviation value. This device requires standard calibration once a week, using standard SMA jumpers with known parameters (IL 0.2dB, RL 45dB) for calibration testing. If the deviation between the calibration result and the standard parameters is ≥0.1dB, the power meter and detector need to be recalibrated. When all test data is written to the SQL Server database, metadata such as test time, operator, equipment number, and calibration status are included to facilitate subsequent data traceability and validity verification.

[0025] The preliminary preparation steps for the test method of this device are as follows: Based on the product specifications of the jumper to be tested, select the matching test wavelength and light source power parameters, perform a zeroing action on the device, with a zeroing time of ≤5s, and the zeroing standard is that the fluctuation of the no-load power data collected by the power meter is ≤±0.1W; scan the product barcode and bind the jumper ID through the barcode scanning module, download the corresponding test task from the MES system on the server, and import the matching product specification template into the test software, and set the specific judgment thresholds for IL and RL.

[0026] After completing the preliminary preparations, the device is started to collect and calculate core parameters, while simultaneously executing the anomaly handling procedure: one end of the jumper under test is connected to the adapter SMA interface flange on the coupling connection unit, and the corresponding test light source is started through the ARM+FPGA main control board. The power meter, PD1, and PD2 are started synchronously to collect the power data of the jumper under test and the output power data of the light source in real time. The raw data is transmitted to the server in real time through the communication link. The server uses the calculation model of the test software to derive the specific parameter values ​​of IL and RL. If the RL parameter needs to be tested, the LD2 light source is selected as the test light source. The tail of the jumper under test is wrapped tightly to avoid echo interference. The echo power data is collected through the 2*2 coupler and PD3, and the server completes the calculation of the RL parameter. Throughout the data acquisition process, the device monitors the power drift of LD1 and LD2 light sources in real time at 1-second intervals. If the drift exceeds ±3% for two consecutive cycles, the test software immediately sends a pause command to the server. Upon receiving the command, the ARM+FPGA main control board cuts off the light source output and triggers an audible and visual alarm. Simultaneously, a fault message "Light Source Power Drift" is displayed on the software interface. After troubleshooting and restoring the stability of the light source power, the test process can be restarted. The retested data will be separately marked and overwrite the original invalid data to ensure the accuracy of the test data.

[0027] After parameter calculation, the device automatically completes result judgment, data storage, and report upload. If needed, high-power temperature testing can be performed simultaneously: the server compares the calculated IL and RL results with the template threshold; the testing software automatically identifies the overall test results and separately marks any non-compliant parameter items; the server automatically writes the test data and judgment results into the SQL Server database; the testing software simultaneously generates a PDF or Excel format test report, which is automatically uploaded to the MES system by the server, achieving seamless linkage between test data and the production system. If high-power temperature performance testing is required, after completing the IL and RL tests, the LD1 light source power is adjusted to 50W via the ARM+FPGA main control board and maintained at a stable output for 10 seconds to allow the jumper to reach a thermally stable state. The thermal imager collects overall jumper temperature data at a frequency of 0.5s / frame, and after collecting 5 consecutive frames, the average value is taken as the final temperature test result. Personnel, considering a temperature threshold of ≤60℃, determine whether the temperature performance of the jumper meets the product specifications.

[0028] After completing full-parameter testing of a single jumper wire, the testing process can be quickly switched to the next jumper wire: The tested jumper wire is directly removed from the coupling unit. If other jumpers need to be tested, only the appropriate SMA interface flange needs to be replaced according to the specifications of the new jumper wire; no re-adjustment of the optical path is required. The entire testing process, from barcode scanning to report generation, involves minimal manual intervention, effectively reducing human error. The full-parameter testing time for a single jumper wire is strictly controlled within 20-30 seconds, significantly improving equipment utilization and meeting the batch rapid testing needs of high-power medical SMA jumpers. Test data is stored in the cloud and synchronized with the MES system, allowing for data traceability and linkage with the production process at any time, significantly improving the testing efficiency and overall quality control level of the medical SMA jumper production process.

[0029] It should be noted that if the embodiments of the present invention involve directional indicators (such as up, down, left, right, front, back, etc.), the directional indicators are only used to explain the relative positional relationship and movement of the components in a certain specific posture (as shown in the figure). If the specific posture changes, the directional indicators will also change accordingly.

[0030] Furthermore, if the embodiments of this invention involve descriptions such as "first" or "second," these descriptions are for descriptive purposes only and should not be construed as indicating or implying their relative importance or implicitly specifying the number of technical features indicated. Therefore, a feature defined with "first" or "second" may explicitly or implicitly include at least one of those features. Additionally, the technical solutions of the various embodiments can be combined with each other, but this must be based on the ability of those skilled in the art to implement them. If the combination of technical solutions is contradictory or impossible to implement, it should be considered that such a combination of technical solutions does not exist and is not within the scope of protection claimed by this invention.

[0031] Additionally, "multiple" refers to two or more.

[0032] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention should be included within the protection scope of the present invention.

Claims

1. A device for testing the optical parameters of a medical SMA jumper, characterized in that, include: A medical band laser unit, comprising an LD1 light source, an LD2 light source, a CPS mode matcher, a CMS mode stripper, an SMA connector, a PD1 detector, a PD2 detector, and a PD3 detector; The CPS mode matcher is connected to the light source, the CMS stripper is connected to the CPS mode matcher, and the SMA connector is matched with the CMS stripper to provide medical laser output; The PD1 detector is connected to the CMS stripper and is used to monitor the power of the LD1 light source. The PD2 detector is used to monitor the power of the LD2 light source. The dark current of the PD1 detector, PD2 detector, and PD3 detector is higher than 1nA, and the responsivity is higher than 0.9A / W. A coupling connection unit, wherein the input end of the coupling connection unit is coupled to the medical band laser unit, and the output end is used to connect at least one SMA jumper to be tested; The control and data processing unit includes an embedded ARM+FPGA main control board and a server. The ARM+FPGA main control board is electrically connected to the medical band laser unit and is used to control the on / off state of the laser. The server is communicatively connected to the ARM+FPGA main control board and is used to receive, calculate, determine and store test data. The testing software, deployed on a server, is used to import product specification templates, automatically determine whether the SMA jumper under test is qualified based on test data, generate test reports, and interact with the MES system. A thermal imager is used to test the overall temperature of the SMA jumper under test after the LD1 light source power reaches a predetermined value and continues for a preset time.

2. The multifunctional testing device for SMA jumpers according to claim 1, characterized in that: The coupling connection unit is equipped with SMA interface flanges of various specifications. The interface flanges are detachable and are used to adapt to SMA jumpers with different core diameters.

3. The multifunctional testing device for SMA jumpers according to claim 1, characterized in that: It also includes a power meter, which is communicatively connected to the server and used to collect power data of the SMA jumper under test and transmit it to the server. The server establishes a data connection with the power meter through GPIB or LAN communication.

4. The multifunctional testing device for SMA jumpers according to claim 1, characterized in that: The medical band laser unit also includes a coupler, which is connected to the LD2 light source, PD2 detector, and PD3 detector to form a return loss test optical path.

5. The multifunctional testing device for SMA jumpers according to claim 1, characterized in that: The server is connected to an SQL Server database, which is used to store test data, product specification templates, and test reports of the SMA jumper under test.

6. The multifunctional testing device for SMA jumpers according to claim 1, characterized in that: It also includes a barcode scanning module, which is connected to the server to scan the barcode of the SMA jumper under test and bind the jumper ID. The server downloads the corresponding test task from the MES system according to the jumper ID.

7. A method for testing SMA jumpers using the medical SMA jumper optical parameter testing device according to any one of claims 1-6, characterized in that, Includes the following steps: S1: Based on the specifications of the SMA jumper under test, select the matching wavelength and light source power parameters, perform a zeroing action on the test device, scan the barcode of the SMA jumper under test through the barcode scanning module, bind the jumper ID, and download the corresponding test task from the MES system; S2: Import the product specification template that matches the SMA jumper under test into the testing software, and set the judgment thresholds for insertion loss and return loss in the template. S3: Connect the SMA jumper to be tested to the interface flange of the coupling connection unit, start the medical band laser unit, and collect power data in real time through the power meter, PD1 detector, and PD2 detector and transmit it to the server; S4: The server calculates the insertion loss and return loss parameters of the SMA jumper under test based on the collected power data, compares the calculation results with the set judgment threshold, and automatically marks the qualified / unqualified results and unqualified data items through the test software. S5: The server writes the test data and judgment results into the SQL Server database, automatically generates a test report in PDF or Excel format through the test software, and uploads the test report to the MES system; S6: If you need to test the temperature performance under high power, adjust the LD1 light source power to 50W and continue for a preset time. Use a thermal imager to test the overall temperature of the SMA jumper under test and determine whether the temperature meets the product specifications.

8. The SMA jumper test method according to claim 7, characterized in that, In step S3, the power drift of LD1 and LD2 light sources is monitored in real time. If the power drift exceeds ±3%, the test software automatically sends a command to the server to pause the test and trigger an alarm.

9. The SMA jumper test method according to claim 7, characterized in that, In step S3, when testing the return loss parameters, the LD2 light source is selected as the test light source, the tail of the SMA jumper to be tested is wrapped tightly, the return power data is collected through the coupler and PD3 detector and transmitted to the server, and the server calculates the return loss parameters.

10. The SMA jumper testing method according to claim 7, characterized in that, The testing device supports testing of high-power medical laser jumpers ranging from 10 to 50W, and the full parameter testing time for a single SMA jumper under test is ≤30s.

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