Test apparatus for performing tests on combinational logic circuits, method of operating a test apparatus and integrated circuit

Abstract

A test apparatus, a method for operating the test apparatus, and an integrated circuit are provided for testing combinational logic circuits configured to communicate electrically with analog circuits. The test apparatus includes: a plurality of flip-flops, each connected to the combinational logic circuit; and one or more processors connected to the flip-flops and configured to test the combinational logic circuit based on a scan signal. The one or more processors are configured to: input an input pattern to the combinational logic circuit via the plurality of flip-flops; obtain a first output value output from a first output node of the combinational logic circuit; determine whether a short-circuit current occurs in the analog circuit by inputting the first output value; and, based on the determination that no short-circuit current has occurred, connect a first unit circuit corresponding to the first output value between the first output node and the analog circuit.

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