Temperature control module, test carrier, temperature control test box and test equipment

Abstract

This invention discloses a temperature control module, a test carrier, a temperature control test chamber, and a test device. The module includes an electrical control box, a temperature control test chamber, and a test carrier. The electrical control box has a first probe module and an interface module. The temperature control test chamber has a single test chamber, a temperature control module, and a second probe module. The temperature control module is arranged around the periphery of the single test chamber. The temperature control test chamber is detachably mounted on the electrical control box and electrically connected to the first and second probe modules. The test carrier has a product positioning slot, a back probe module, a front probe module, and a side probe module. The test carrier is placed inside the single test chamber. The back probe module is electrically connected to the second probe module, and the front and side probe modules are electrically connected to the back probe module. The side probe module is adapted to move towards or away from the product positioning slot. This invention provides an independent testing environment for each product under test through a modular structure, allowing for independent maintenance of each modular structure and improving maintainability.

Description

Technical Field

[0001] This invention relates to the field of automated testing equipment technology, and in particular to a temperature control module, a testing carrier, a temperature control testing chamber, and testing equipment. Background Technology

[0002] Battery technology involves methods or devices for directly converting chemical energy into electrical energy. To ensure the safety, reliability, and consistency of battery products, high and low temperature environmental adaptability testing is often required during production and R&D. In related technologies, especially in the manufacturing of experimental analytical instruments such as intelligent measuring instruments, high and low temperature testing typically involves batch testing multiple battery products in a large test cabinet. However, due to the large internal space of the test cabinet and the influence of factors such as air duct structure and air convection, the temperature field distribution varies at different locations within the test cabinet. This results in inconsistent actual temperature environments around each battery product, directly affecting the accuracy and comparability of battery test data, leading to insufficient test precision and difficulty in meeting the testing requirements of high-quality battery products. Furthermore, most test cabinets are integrated structures, requiring downtime for maintenance in case of malfunctions, which is detrimental to improving production efficiency. Summary of the Invention

[0003] This invention aims to solve at least one of the technical problems existing in the prior art. To this end, this invention proposes a temperature control module, a test carrier, a temperature control test chamber, and test equipment, which can provide an independent test environment for each product under test through a modular structure, and each modular structure can be maintained independently, thereby improving maintainability.

[0004] In a first aspect, embodiments of the present invention provide a temperature control module, comprising: The electrical control box is equipped with a first probe module located on the top and an interface module located on the side; A temperature control test chamber is provided with a single test chamber and a temperature adjustment module and a second probe module. The second probe module extends from the single test chamber to the bottom surface of the temperature control test chamber. The temperature adjustment module is arranged around the single test chamber and is electrically connected to the interface module. The temperature control test chamber can be detachably installed on the electrical control box and is electrically connected to the second probe module and the first probe module. A test carrier is provided with a product positioning slot and is equipped with a back probe module, a front probe module, and a side probe module. The test carrier is placed inside the single test chamber. The back probe module faces the back of the test carrier and is electrically connected to the second probe module. The front probe module and the side probe module are located adjacent to the product positioning slot and are both electrically connected to the back probe module. The front probe module faces the front of the test carrier, and the side probe module faces the product positioning slot and is adapted to move toward or away from the product positioning slot.

[0005] According to some embodiments of the present invention, the test carrier includes a carrier base and a carrier cover plate. The product positioning groove, the rear probe module, the front probe module and the side probe module are all disposed on the carrier base. The carrier cover plate is provided with a pusher. The carrier cover plate is closed and connected to the carrier base so that the pusher pushes the side probe module toward the product positioning groove.

[0006] According to some embodiments of the present invention, the lateral probe module includes a fixed frame and a movable frame. The fixed frame is mounted on the carrier base. The movable frame is provided with a guide and reset structure and is movably connected to the fixed frame through the guide and reset structure. A test probe facing the product positioning groove is provided at a first end of the movable frame. An abutment portion is provided at a second end of the movable frame. The pusher is adapted to abut against the abutment portion.

[0007] According to some embodiments of the present invention, the carrier base includes a base plate, a signal acquisition board, a fixing plate, and a lower template. The signal acquisition board is installed between the base plate and the fixing plate. The signal acquisition board is electrically connected to the rear probe module, the front probe module, and the side probe module, respectively. The product positioning groove is disposed on the lower template. The lower template is provided with a first clearance space and a second clearance space adjacent to the product positioning groove. The front probe module is installed in the first clearance space, and the side probe module is installed in the second clearance space.

[0008] According to some embodiments of the present invention, the vehicle cover is also movably mounted with an upper template, the upper template being provided with a pressing member, the position of which is adapted to the first clearance position and the product positioning groove.

[0009] According to some embodiments of the present invention, the fixing plate is provided with a first magnetic attracting member, the carrier cover plate is provided with a second magnetic attracting member, and the carrier cover plate and the fixing plate are magnetically connected by the second magnetic attracting member and the first magnetic attracting member.

[0010] Secondly, embodiments of the present invention provide a test vehicle, comprising: The carrier base is provided with a product positioning slot, a rear probe module, a front probe module, and a side probe module. The rear probe module faces the rear of the carrier base. The front probe module and the side probe module are located adjacent to the product positioning slot and are electrically connected to the rear probe module. The front probe module faces the front of the carrier base, and the side probe module faces the product positioning slot. The carrier cover is provided with a pusher, and the carrier cover is connected to the carrier base so that the pusher pushes the lateral probe module toward the product positioning groove.

[0011] According to some embodiments of the present invention, the carrier base includes a base plate, a signal acquisition board, a fixing plate, and a lower template. The signal acquisition board is installed between the base plate and the fixing plate. The signal acquisition board is electrically connected to the rear probe module, the front probe module, and the side probe module, respectively. The product positioning groove is disposed on the lower template. The lower template is provided with a first clearance space and a second clearance space adjacent to the product positioning groove. The front probe module is installed in the first clearance space, and the side probe module is installed in the second clearance space.

[0012] Thirdly, embodiments of the present invention provide a temperature-controlled testing chamber suitable for housing the aforementioned testing vessel, comprising: The enclosure is equipped with individual test chambers; A temperature control module is installed inside the housing and arranged around the periphery of the individual test chamber; The second probe module is installed inside the housing and extends from the individual test chamber to the bottom surface of the housing.

[0013] Fourthly, embodiments of the present invention provide a testing device, including the temperature control module described above, or the testing carrier described above, or the temperature control testing chamber described above.

[0014] The embodiments of the present invention have at least the following beneficial effects: The temperature control module is equipped with an independent electrical control box, temperature control test chamber, and test carrier. The product positioning slot of the test carrier is suitable for placing the product under test, and it is connected to the front probe module and the side probe module for signal connection to adapt to the irregular structure of the product under test. The test carrier is placed in the single test chamber of the temperature control test chamber, which can provide an independent test environment for the product under test, and the temperature is independently controlled by the electrical control box, which is conducive to the precise control of the test temperature of the product under test. The electrical control box, temperature test chamber and test carrier adopt a modular structure design and are electrically connected through probe modules, which can realize independent maintenance and quick disassembly and assembly, which can improve maintainability.

[0015] Additional aspects and advantages of the invention will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention. Attached Figure Description

[0016] The above and / or additional aspects and advantages of the present invention will become apparent and readily understood from the description of the embodiments taken in conjunction with the following drawings, in which: Figure 1 This is a schematic diagram of the temperature control module according to an embodiment of the present invention; Figure 2 for Figure 1 The diagram shown is an exploded view of the temperature control module. Figure 3 for Figure 1 The diagram shows the structure of the temperature control test chamber for the temperature control module. Figure 4 for Figure 3 The diagram shown is an exploded view of the temperature control test chamber. Figure 5 for Figure 2 The diagram shows the structural design of the test vehicle for the temperature control module. Figure 6 for Figure 5 The diagram shown illustrates the exploded structure of the test vehicle. Figure 7 for Figure 6 A schematic diagram of the front probe module of the test vehicle is shown. Figure 8 for Figure 5 The diagram shows the exploded structure of the test vehicle's cover plate; Figure 9 for Figure 6 One of the schematic diagrams of the side probe module of the test vehicle shown; Figure 10 for Figure 6 The second schematic diagram of the side probe module of the test vehicle is shown. Figure 11 This is a schematic diagram of the structure of multiple temperature control modules according to an embodiment of the present invention.

[0017] Figure label: Temperature control module 100, electrical control box 200, first probe module 201, interface module 202, temperature control test chamber 300, chamber body 310, chamber cover 320, individual test chamber 311, second probe module 312, test carrier 400, carrier base 410, base plate 411, signal acquisition board 412, fixing plate 413, first magnetic suction component 4131, first guide part 4132, lower template 414, product positioning groove 4141, first clearance position 4142 The components include: second clearance position 4143, carrier cover plate 420, pusher 421, pusher guide surface 4211, second guide part 422, upper template 423, pressing part 4231, second magnetic suction part 424, rear probe module 430, front probe module 440, side probe module 450, fixed frame 451, moving frame 452, test probe 4521, abutment part 4522, guide structure 4531, elastic reset part 4532, and signal adapter board 453. Detailed Implementation

[0018] Embodiments of the present invention are described in detail below. Examples of these embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present invention, and should not be construed as limiting the present invention.

[0019] In the description of this invention, it should be understood that the orientation descriptions, such as up, down, front, back, left, right, etc., are based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing this invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limiting this invention.

[0020] In the description of this invention, "several" means one or more, "multiple" means two or more, "greater than," "less than," "exceeding," etc. are understood to exclude the stated number, and "above," "below," "within," etc. are understood to include the stated number. If "first," "second," etc. are used in the description, they are only for the purpose of distinguishing technical features and should not be construed as indicating or implying relative importance or implicitly indicating the number of indicated technical features or the order of the indicated technical features.

[0021] In the description of this invention, unless otherwise explicitly defined, terms such as “setting,” “installing,” and “connecting” should be interpreted broadly, and “electrical connection” refers to a conductive connection for transmitting electrical signals. Those skilled in the art can reasonably determine the specific meaning of the above terms in this invention in conjunction with the specific content of the technical solution.

[0022] Please refer to Figure 1 and Figure 2This embodiment discloses a temperature control module 100, including an electrical control box 200, a temperature control test chamber 300, and a test carrier 400. The electrical control box 200 is provided with a first probe module 201 located on the top and an interface module 202 located on the side. An electrical control board is provided inside the electrical control box 200. The first probe module 201 and the interface module 202 are both electrically connected to the electrical control board. The interface module 202 includes multiple functional interfaces, such as a power interface, a signal input / output interface, and a temperature control function interface. The power interface is used to connect to a power supply, such as AC power. The signal input / output interface is used to connect to an external control module, such as a main control module, to form a complete test device. The temperature control function interface is used to connect to the temperature adjustment module inside the temperature control test chamber 300, as described below, to perform temperature control on the temperature adjustment module, such as heating, cooling, or refrigeration, thereby providing the temperature conditions required for testing the battery product under test.

[0023] Please refer to Figure 2 , Figure 3 and Figure 4 The temperature control test chamber 300 is provided with a single test chamber 311 and a temperature regulation module (not shown in the figure) and a second probe module 312. The second probe module 312 extends from the single test chamber 311 to the bottom surface of the temperature control test chamber 300 (i.e., extends from the inside to the outside). The temperature regulation module is arranged on the periphery of the single test chamber 311. The temperature control test chamber 300 is detachably installed on the electrical control box 200 and is electrically connected to the first probe module 201 through the second probe module 312. The single test chamber 311 is a cavity space suitable for accommodating a single test carrier 400, but cannot accommodate two or more test carriers 400. It can provide an independent test environment for the product under test in each test carrier 400. The individual test chamber 311 is an openable and closable sealed cavity to isolate temperature interference from the external environment. For example, the temperature control test chamber 300 includes a chamber body 310 and a cover 320. The individual test chamber 311 is disposed inside the chamber body 310, and the cover 320 is connected to the chamber body 310 to seal the individual test chamber 311. The temperature control test chamber 300 is equipped with a temperature regulation module, such as a semiconductor cooler and a liquid cooling radiator. The semiconductor cooler can achieve both cooling and heating without the need for additional heating elements, while the liquid cooling radiator is used to cool the individual test chamber 311 after high-temperature testing, preventing the formation of large amounts of water vapor due to a sudden temperature drop. The temperature regulation module is electrically connected to the interface module 202 of the electrical control box 200, allowing for independent temperature control of the temperature regulation module.

[0024] Please refer to Figure 5 , Figure 6 and Figure 7The test carrier 400 is provided with a product positioning groove 4141 and is equipped with a back probe module 430, a front probe module 440 and a side probe module 450. The test carrier 400 is placed in a single test chamber 311. The back probe module 430 faces the back of the test carrier 400 and is electrically connected to the second probe module 312. The front probe module 440 and the side probe module 450 are located on the adjacent side of the product positioning groove 4141 and are electrically connected to the back probe module 430. The front probe module 440 faces the front of the test carrier 400 and the side probe module 450 faces the product positioning groove 4141 and is adapted to move toward or away from the product positioning groove 4141. The product positioning slot 4141 is suitable for placing the product under test (DUT). The DUT has an irregular shape, for example, it includes an L-shaped main body and a bent part. The bottom surface of the bent part has a first test contact, while the side surface of the main body has a second test contact. Since the first and second test contacts are not in the same plane, and the main body is thin and difficult to place vertically and stably to expose both the first and second test contacts simultaneously, a corresponding test carrier 400 needs to be designed for the DUT. The front probe module 440 is suitable for placing the bent part of the DUT, so that the end of the front probe module 440 contacts the first test contact of the DUT from bottom to top. The side probe module 450 faces the product positioning slot 4141 and can move towards or away from the product positioning slot 4141, thereby contacting or disengaging from the second test contact of the DUT, realizing the electrical connection between the side probe module 450 and the second test contact. Both the forward probe module and the side probe module 450 are electrically connected to the back probe module 430, and the back probe module 430 is electrically connected to the second probe module 312. It is also electrically connected to the control box 200 through the second probe module 312 and the first probe module 201, thereby transmitting the test signal from the control box 200 to the product under test and collecting the test signal from the product under test.

[0025] It is worth mentioning that the electrical control box 200, the temperature control test box 300, and the test carrier 400 are matched with each other, and each is a single unit. That is, a temperature control module 100 includes a single electrical control box 200 and a single temperature control test box 300, and the temperature control test box 300 can only hold a single test carrier 400 at a time. The electrical control box 200, the temperature control test chamber 300, and the test carrier 400 are designed as independent modular structures that can be assembled and separated. The first probe module 201 is located on the top of the electrical control box 200, while the second probe module 312 is located at the bottom of the temperature control test chamber 300. The temperature control test chamber 300 is detachably mounted on the electrical control box 200, and the first probe module 201 and the second probe module 312 are connected. That is, the temperature control test chamber 300 and the electrical control box 200 are stacked vertically, so that the second probe module 312 and the first probe module 201 are in contact vertically. In this way, the weight of the temperature control test chamber 300 can be used to ensure that the first probe module 201 and the second probe module 312 remain in contact without the need for an additional probe locking mechanism. Similarly, the back probe module 430 of the test carrier 400 faces the back of the test carrier 400. The back probe module 430 is connected vertically to the second probe module 312, and the test carrier 400 automatically ensures that the back probe module 430 and the second probe module 312 maintain contact. Moreover, the first probe module 201, the second probe module 312, and the back probe module 430 can automatically and quickly make electrical connections to form a signal channel when placed in place, without the need for complicated manual wiring. Especially in automated testing processes, it can realize the automated and rapid placement of the test carrier 400 and the temperature control test chamber 300.

[0026] After assembly, the temperature control test chamber 300 is installed on top of the electrical control box 200. The temperature regulation module of the temperature control test chamber 300 is electrically connected to the interface module 202 of the electrical control box 200, and the first probe module 201 and the second probe module 312 are electrically connected. When testing is required, the product to be tested is placed in the product positioning slot 4141 of the test carrier 400 so that the test contacts of the product to be tested can be electrically connected to the front probe module 440 and the side probe module 450. The test carrier 400, which contains the product to be tested, is placed from top to bottom into the single test chamber 311 of the temperature control test chamber 300 so that the back probe module 430 located on the back of the test carrier 400 automatically contacts the second probe module 312 of the temperature control test chamber 300 to achieve electrical connection. This allows the test carrier 400 to be electrically connected to the electrical control box 200 through the conductive path formed by the second probe module 312 and the first probe module 201 within the sealed single test chamber 311, thereby achieving signal transmission. Compared to wire-type conductors, the second probe module 312, as a metal conductive connector connecting the first probe module 201 and the rear probe module 430, eliminates the need for manual wiring, facilitating automatic and rapid connection. Furthermore, it can withstand high and low temperature variations during testing, exhibiting high reliability. After sealing the temperature-controlled test chamber 300, test control signals and feedback signals can be sent to the product under test (DUT) according to a pre-set program via the signal channel formed by the first probe module 201, the second probe module 312, the rear probe module 430, the front probe module 440, and the side probe module 450, to perform high and low temperature testing on the DUT. It is worth noting that... (Please refer to...) Figure 11 In practical applications, multiple temperature control modules 100 can be equipped simultaneously. Each temperature control module 100 independently regulates the temperature of the temperature control test chamber 300 through an independent electrical control box 200. If one temperature control module 100 malfunctions, the electrical control box 200, the temperature control test chamber 300, and the test carrier 400 can be independently repaired or replaced without affecting other groups of temperature control modules 100. Furthermore, since the temperature control test chamber 300 is designed as an independent module, it can be miniaturized according to the product under test, facilitating maintenance.

[0027] Therefore, the temperature control module 100 is equipped with an independent electrical control box 200, a temperature control test chamber 300, and a test carrier 400. The product positioning slot 4141 of the test carrier 400 is suitable for placing the product under test, and is connected to the front probe module 440 and the side probe module 450 for signal connection to adapt to the irregular structure of the product under test. The test carrier 400 is placed in the single test chamber 311 of the temperature control test chamber 300, which can provide an independent test environment for the product under test, and perform independent temperature control through the electrical control box 200, which is conducive to accurately controlling the test temperature of the product under test. The electrical control box 200, the temperature test chamber, and the test carrier 400 adopt a modular structure design and are electrically connected through the probe module, which can realize independent maintenance and quick disassembly and assembly, which is conducive to improving maintainability.

[0028] Please refer to Figure 5 , Figure 6 and Figure 8 The test carrier 400 includes a carrier base 410 and a carrier cover 420. A product positioning slot 4141, a rear probe module 430, a front probe module 440, and a side probe module 450 are all mounted on the carrier base 410. The carrier cover 420 is provided with a pusher 421, and the carrier cover 420 is closed and connected to the carrier base 410 so that the pusher 421 pushes the side probe module 450 towards the product positioning slot 4141. The pusher 421 can be a columnar structure, a strip structure, or an irregular shape. The first end of the pusher 421 is connected to the carrier cover 420, and the second end of the pusher 421 is provided with an inclined pusher guide surface 4211, adapted to push the side probe module 450. In this embodiment, the carrier base 410 can be completely separated from the carrier cover 420. During operation, an automated mechanism, such as an industrial robot, grips the product under test and places it into the product positioning slot 4141. At this time, the end of the lateral probe module 450 has not yet reached the test contact on the side of the product under test. The carrier cover 420 is then placed on the carrier base 410. During the closing process, the pusher 421 approaches the lateral probe module 450 from top to bottom and pushes it... The pusher surface 4211 applies a pushing force to the lateral probe module 450, causing the lateral probe module 450 to move toward the product positioning groove 4141 until the end of the lateral probe module 450 abuts against the test contact on the side of the product under test. At this time, the carrier cover plate 420 and the carrier base 410 are closed and connected, and the pusher 421 continuously applies a pushing force to the lateral probe module 450 to ensure good contact between the lateral probe module 450 and the test contact of the product under test.

[0029] The lateral probe module 450 includes a fixed frame 451 and a movable frame 452. The fixed frame 451 is mounted on the carrier base 410. The movable frame 452 is provided with a guide and reset structure and is movably connected to the fixed frame 451 through the guide and reset structure. The guide and reset structure can be a combination of a guide structure 4531, such as a guide pin, guide rail, or guide groove, and an elastic reset member 4532. The elastic reset member 4532 can be a structure such as a spring or a spring sheet. The first end of the movable frame 452 is provided with a test probe 4521 facing the product positioning groove 4141. The second end of the movable frame 452 is provided with an abutment part 4522. The pusher 421 is adapted to abut against the abutment part 4522, so that the movable frame 452 moves towards the product positioning groove 4141 under the guidance of the guide and reset structure until the end of the test probe 4521 abuts against the test contact of the product under test. After the pushing force applied to the movable frame 452 is removed by the pushing member 421, the movable frame 452 resets in the opposite direction under the guidance and elastic force of the guide reset structure. To improve the smoothness of the pushing process between the pushing member 421 and the movable frame 452, the abutment portion 4522 of the movable frame 452 can be configured as a rolling element such as a roller or ball bearing, or as a smooth wedge-shaped guide surface. Furthermore, both the lateral probe module 450 and the front probe module 440 can be detachably mounted on the carrier base 410 as independent components. In the event of a malfunction in either the lateral probe module 450 or the front probe module 440, the corresponding probe module can be disassembled for repair or replacement, improving maintainability.

[0030] The vehicle base 410 includes a base plate 411, a signal acquisition board 412, a fixing plate 413, and a lower template 414. The base plate 411 serves as the assembly foundation for the vehicle base 410, supporting structures such as the signal acquisition board 412, the fixing plate 413, and the lower template 414. The signal acquisition board 412 is installed between the base plate 411 and the fixing plate 413, and is fixedly mounted on the base plate 411 by the fixing plate 413. The signal acquisition board 412 is a circuit board, and it is electrically connected to the rear probe module 430, the front probe module 440, and the side probe module 450, respectively. The rear probe module 430 is installed on the back of the signal acquisition board 412. It should be noted that the front of the vehicle base 410 refers to the side facing upwards when the vehicle base 410 is placed flat on a horizontal surface, while the back of the vehicle base 410 faces the opposite direction to the front. Product positioning groove 4141 is disposed on lower template 414. Lower template 414 is provided with a first clearance 4142 and a second clearance 4143 on the adjacent side of product positioning groove 4141. Front probe module 440 is installed in the first clearance 4142, and the end of front probe module 440 is exposed to facilitate connection with test contacts of product under test. Side probe module 450 is installed in the second clearance 4143. Second clearance 4143 is connected to product positioning groove 4141 so that the end of side probe module 450 can abut against test contacts on the side of product under test located in product positioning groove 4141. Please refer to Figure 9 and Figure 10 The lateral probe module 450 also includes a signal adapter board 453, which is mounted on the moving frame 452 and electrically connected to the test probe 4521 set on the moving frame 452. The signal adapter board 453 is also electrically connected to the signal acquisition board 412 of the carrier base 410.

[0031] Please refer to Figure 8The carrier cover plate 420 is also movably mounted with an upper template 423, which is provided with a pressing member 4231. The position of the pressing member 4231 is adapted to the first clearance position 4142 and the product positioning groove 4141. The upper template 423 can be movably connected to the carrier cover plate 420 by a structure such as a guide pin or a linear bearing. In some application examples, the pressing member 4231 can be a structure independent of the upper template 423, such as a block structure or a column structure. Alternatively, in other application examples, the pressing member 4231 can be a partial structure of the upper template 423, such as a protrusion. The pressing member 4231 can press and fix the product under test located in the first clearance position 4142 to ensure that the test contacts of the product under test can maintain good contact with the front probe module 440. The position of the pressing member 4231 is also adapted to the product positioning groove 4141 to abut and press and fix the product under test located in the product positioning groove 4141. The number of pressing elements 4231 can be one or more. When there are multiple pressing elements 4231, they can be distributed at different positions in the product positioning groove 4141. To ensure that the temperature conditions around the product under test meet the preset temperature conditions, the upper template 423 and the lower template 414 are made of thermally conductive materials, such as brass, to facilitate better heat conduction.

[0032] Please refer to Figure 6 and Figure 8 The fixing plate 413 is provided with a first magnetic suction member 4131, and the carrier cover plate 420 is provided with a second magnetic suction member 424. The carrier cover plate 420 and the fixing plate 413 are magnetically connected by the second magnetic suction member 424 and the first magnetic suction member 4131, which can hold the carrier cover plate 420 and the fixing plate 413 tightly together, preventing the carrier cover plate 420 and the carrier base 410 from detaching or shifting during the transfer of the test carrier 400.

[0033] Please refer to Figure 5 , Figure 6 , Figure 7 and Figure 8Based on the above technical concept, this embodiment also provides a test carrier 400, including a carrier base 410 and a carrier cover 420. The carrier base 410 is provided with a product positioning groove 4141, a back probe module 430, a front probe module 440, and a side probe module 450. The back probe module 430 faces the back of the carrier base 410. The front probe module 440 and the side probe module 450 are located adjacent to the product positioning groove 4141 and are electrically connected to the back probe module 430. The front probe module 440 faces the front of the carrier base 410, and the side probe module 450 faces the product positioning groove 4141. The carrier cover 420 is provided with a pusher 421. The carrier cover 420 is closed and connected to the carrier base 410 so that the pusher 421 pushes the side probe module 450 toward the product positioning groove 4141.

[0034] For example, the product under test is a battery product of a 3C consumer electronic device. The battery product has an L-shaped main body and a bent part. The bottom surface of the bent part is provided with a first test contact, while the side surface of the main body is provided with a second test contact. Since the first test contact and the second test contact are not in the same plane, and the thickness of the main body is relatively thin, it is difficult to place it vertically and stably to expose both the first and second test points simultaneously. Therefore, in the process of modular design of the temperature control module 100, the test carrier 400 needs to be designed according to the structural characteristics of the product under test. In this embodiment, the shape of the product positioning groove 4141 is adapted to the product under test, that is, the product positioning groove 4141 is a long groove to facilitate the placement of the main body of the product under test. The front probe module 440 and the side probe module 450 are located on the adjacent side of the product positioning groove 4141. The front probe module 440 can support the bent part of the product under test and can also contact the first test contact of the product under test to achieve electrical connection.

[0035] The lateral probe module 450 faces the product positioning slot 4141 and is adapted to move towards or away from the product positioning slot 4141. Thus, when the product to be tested needs to be placed into the product positioning slot 4141, the lateral probe module 450 is located in a position away from the product positioning slot 4141 to avoid the placement path of the product to be tested. After the product to be tested is placed into the product positioning slot 4141, the carrier cover plate 420 is closed onto the carrier base 410. During the closing process, the pusher 421 of the carrier cover plate 420 gradually applies a pushing force to the lateral probe module 450 from top to bottom to push the lateral probe module 450 towards the product positioning slot 4141 until the lateral probe module 450 abuts against the second test point of the product to be tested. The front probe module 440 and the side probe module 450 are both electrically connected to the rear probe module 430 to transmit the test control signals of external components (such as the electrical control box 200 mentioned above) to the product under test, and to collect the test feedback signals of the product under test and transmit them to the external components.

[0036] It is worth mentioning that the back probe module 430 faces the back of the carrier base 410. In use, the test carrier 400, on which the product to be tested is placed, is placed from top to bottom into the single test chamber 311 of the temperature control test chamber 300, so that the back probe module 430 located on the back of the test carrier 400 automatically contacts the second probe module 312 of the temperature control test chamber 300 to achieve electrical connection. Moreover, the test carrier 400 can automatically ensure that the back probe module 430 and the second probe module 312 maintain contact connection.

[0037] Please continue to refer to Figure 5 , Figure 6 and Figure 8The vehicle base 410 includes a base plate 411, a signal acquisition board 412, a fixing plate 413, and a lower template 414. The base plate 411 serves as the assembly foundation for the vehicle base 410, supporting structures such as the signal acquisition board 412, the fixing plate 413, and the lower template 414. The signal acquisition board 412 is installed between the base plate 411 and the fixing plate 413, and is fixedly mounted on the base plate 411 by the fixing plate 413. The signal acquisition board 412 is a circuit board, and it is electrically connected to the rear probe module 430, the front probe module 440, and the side probe module 450, respectively. The rear probe module 430 is installed on the back of the signal acquisition board 412. It should be noted that the front of the vehicle base 410 refers to the side facing upwards when the vehicle base 410 is placed flat on a horizontal surface, while the back of the vehicle base 410 faces the opposite direction to the front. Product positioning groove 4141 is disposed on lower template 414. Lower template 414 is provided with a first clearance 4142 and a second clearance 4143 on the adjacent side of product positioning groove 4141. Front probe module 440 is installed in the first clearance 4142, and the end of front probe module 440 is exposed to facilitate connection with test contact of product under test. Lateral probe module 450 is installed in the second clearance 4143. Second clearance 4143 is connected to product positioning groove 4141 so that the end of lateral probe module 450 can abut against test contact of product under test located in product positioning groove 4141.

[0038] Please refer to Figure 9 and Figure 10The lateral probe module 450 includes a fixed frame 451 and a movable frame 452. The fixed frame 451 is mounted on the carrier base 410. The movable frame 452 is provided with a guide and reset structure and is movably connected to the fixed frame 451 through the guide and reset structure. The guide and reset structure can be a combination of a guide structure 4531, such as a guide pin, guide rail, or guide groove, and an elastic reset member 4532. The elastic reset member 4532 can be a structure such as a spring or a spring sheet. The first end of the movable frame 452 is provided with a test probe 4521 facing the product positioning groove 4141. The second end of the movable frame 452 is provided with an abutment part 4522. The pusher 421 is adapted to abut against the abutment part 4522, so that the movable frame 452 moves towards the product positioning groove 4141 under the guidance of the guide and reset structure until the end of the test probe 4521 abuts against the test contact of the product under test. After the pushing force applied to the moving frame 452 is removed by the pushing member 421, the moving frame 452 resets in the opposite direction under the guidance and elastic force of the guide reset structure. To improve the smoothness of the pushing process between the pushing member 421 and the moving frame 452, the abutment portion 4522 of the moving frame 452 can be configured as a rolling element such as a roller or ball bearing, or as a smooth wedge-shaped guide surface. The lateral probe module 450 also includes a signal adapter board 453, which is mounted on the moving frame 452 and electrically connected to the test probe 4521 disposed on the moving frame 452. The signal adapter board 453 is also electrically connected to the signal acquisition board 412 of the carrier base 410.

[0039] Furthermore, the side probe module 450 is detachably mounted on the carrier base 410 as an independent component. In the event of a malfunction in the side probe module 450, it can be disassembled for repair or replacement, improving maintainability. For example, the mounting bracket 451 and mounting plate 413 of the side probe module 450 are detachably connected via threaded fasteners such as screws or bolts, and the signal adapter board 453 and signal acquisition board 412 of the side probe module 450 are connected via a flexible circuit board. In the event of a malfunction in the side probe module 450, it can be quickly disassembled for repair or replacement. Similarly, when testing different models of products, the corresponding model of the side probe module 450 can be replaced to accommodate the test contact positions on the side of the product under test, facilitating compatibility with different models of products under test. Similarly, the front probe module 440 and the rear probe module 430 can also be installed as independent components on the carrier base 410 to facilitate maintenance, replacement or compatibility with different models of the product under test.

[0040] Please refer to Figure 8The carrier cover plate 420 is also movably mounted with an upper template 423, which is provided with a pressing member 4231. The position of the pressing member 4231 is adapted to the first clearance position 4142 and the product positioning groove 4141. The upper template 423 can be movably connected to the carrier cover plate 420 via a guide structure 4531 such as a guide pin or a linear bearing. In some application examples, the pressing member 4231 can be a structure independent of the upper template 423, such as a block structure or a column structure. Alternatively, in other application examples, the pressing member 4231 can be a partial structure of the upper template 423, such as a protrusion. The pressing member 4231 can press and fix the product under test located in the first clearance position 4142 to ensure that the test contacts of the product under test can maintain good contact with the front probe module 440. The position of the pressing member 4231 is also adapted to the product positioning groove 4141 to abut and press and fix the product under test located in the product positioning groove 4141. The number of pressing elements 4231 can be one or more. When there are multiple pressing elements 4231, they can be distributed at different positions in the product positioning groove 4141. To ensure that the temperature conditions around the product under test meet the preset temperature conditions, the upper template 423 and the lower template 414 are made of thermally conductive materials, such as brass, to facilitate better heat conduction.

[0041] Please refer to Figure 6 and Figure 8 The fixing plate 413 is provided with a first magnetic attraction member 4131, and the carrier cover plate 420 is provided with a second magnetic attraction member 424. The carrier cover plate 420 and the fixing plate 413 are magnetically connected by the second magnetic attraction member 424 and the first magnetic attraction member 4131, which can hold the carrier cover plate 420 and the fixing plate 413 tightly together, preventing the carrier cover plate 420 and the carrier base 410 from detaching or shifting during the transfer of the test carrier 400. Both the first magnetic attraction member 4131 and the second magnetic attraction member 424 are magnets, or a combination of magnets and magnetic metal materials.

[0042] Please continue to refer to Figure 6 and Figure 8 The fixing plate 413 is also provided with a first guide portion 4132, and the vehicle cover plate 420 is provided with a second guide portion 422. The first guide portion 4132 and the second guide portion 422 cooperate with each other to ensure that the vehicle cover plate 420 can be accurately positioned during the closing process. The first guide portion 4132 and the second guide portion 422 can be a combination of guide holes and guide posts.

[0043] Please refer to Figures 2 to 4This embodiment provides a temperature-controlled test chamber 300, suitable for housing the aforementioned test carrier 400, including a chamber body 310, a temperature regulation module, and a second probe module 312. The chamber body 310 is provided with a single test chamber 311. The single test chamber 311 is a cavity space suitable for accommodating a single test carrier 400, but unable to accommodate two or more test carriers 400, providing an independent testing environment for each product under test within each test carrier 400. The single test chamber 311 is an openable and closable sealed cavity to isolate temperature interference from the external environment. For example, the temperature-controlled test chamber 300 includes a chamber body 310 and a cover 320, with the single test chamber 311 disposed within the chamber body 310, and the cover 320 closed to the chamber body 310 to seal the single test chamber 311. The temperature control module is installed inside the housing 310 and arranged around the periphery of the individual test chamber 311. The second probe module 312 is installed inside the housing 310 and extends from the individual test chamber 311 to the bottom surface of the housing 310. For example, the temperature control module adopts a structure such as a semiconductor cooler and a liquid-cooled heat sink. The semiconductor cooler can achieve both cooling and heating without the need for additional heating elements, while the liquid-cooled heat sink is used to cool the individual test chamber 311 after high-temperature testing, preventing a large amount of water vapor from forming inside the individual test chamber 311 due to a sudden drop in temperature. The temperature control module is electrically connected to the interface module 202 of the electrical control box 200, allowing for independent temperature control of the temperature control module.

[0044] Please refer to Figure 1 , Figure 2 and 10 This embodiment provides a testing device, including the temperature control module 100, the test carrier 400, or the temperature control test chamber 300.

[0045] The temperature control module 100 is equipped with an independent electrical control box 200, a temperature control test chamber 300, and a test carrier 400. The product positioning slot 4141 of the test carrier 400 is suitable for placing the product under test and is connected to the front probe module 440 and the side probe module 450 for signal connection to adapt to the irregular structure of the product under test. The test carrier 400 is placed in the single test chamber 311 of the temperature control test chamber 300, which can provide an independent test environment for the product under test and perform independent temperature control through the electrical control box 200, which is conducive to accurately controlling the test temperature of the product under test. The electrical control box 200, the temperature test chamber, and the test carrier 400 adopt a modular structure design and are electrically connected through the probe module, which can realize independent maintenance and quick disassembly and assembly, which is conducive to improving maintainability.

[0046] The embodiments of the present invention have been described in detail above with reference to the accompanying drawings. However, the present invention is not limited to the above embodiments. Within the scope of knowledge possessed by those skilled in the art, various changes can be made without departing from the spirit of the present invention.

Claims

1. A temperature control module, characterized by, include: The electrical control box (200) is equipped with a first probe module (201) located on the top and an interface module (202) located on the side. The temperature control test chamber (300) is provided with a single test chamber (311) and a temperature adjustment module and a second probe module (312) are installed. The second probe module (312) extends from the inside to the bottom surface of the temperature control test chamber (300). The temperature adjustment module is electrically connected to the interface module (202). The temperature control test chamber (300) can be detachably installed on the electrical control box (200) and electrically connected to the second probe module (312) and the first probe module (201). The test carrier (400) is provided with a product positioning slot (4141) and is equipped with a back probe module (430), a front probe module (440) and a side probe module (450). The test carrier (400) is placed in the single test chamber (311). The back probe module (430) is electrically connected to the second probe module (312). The front probe module (440) and the side probe module (450) are located on the adjacent side of the product positioning slot (4141) and are both electrically connected to the back probe module (430). The front probe module (440) faces the front of the test carrier (400), and the side probe module (450) faces the product positioning slot (4141) and is adapted to move toward or away from the product positioning slot (4141).

2. The temperature-controlled module of claim 1, wherein, The test vehicle (400) includes a vehicle base (410) and a vehicle cover (420). The product positioning groove (4141), the rear probe module (430), the front probe module (440), and the side probe module (450) are all disposed on the vehicle base (410). The vehicle cover (420) is provided with a pusher (421). The vehicle cover (420) is closed and connected to the vehicle base (410) so that the pusher (421) pushes the side probe module (450) toward the product positioning groove (4141).

3. The temperature-controlled module of claim 2, wherein, The lateral probe module (450) includes a fixed frame (451) and a movable frame (452). The fixed frame (451) is mounted on the carrier base (410). The movable frame (452) is provided with a guide and reset structure and is movably connected to the fixed frame (451) through the guide and reset structure. The first end of the movable frame (452) is provided with a test probe (4521) facing the product positioning groove (4141). The second end of the movable frame (452) is provided with an abutment part (4522). The pusher (421) is adapted to abut against the abutment part (4522).

4. Temperature control module according to claim 2 or 3, characterized in that The carrier base (410) includes a base plate (411), a signal acquisition board (412), a fixing plate (413), and a lower template (414). The signal acquisition board (412) is installed between the base plate (411) and the fixing plate (413). The signal acquisition board (412) is electrically connected to the rear probe module (430), the front probe module (440), and the side probe module (450), respectively. The product positioning groove (4141) is disposed on the lower template (414). The lower template (414) is provided with a first clearance position (4142) and a second clearance position (4143) on the adjacent side of the product positioning groove (4141). The front probe module (440) is installed in the first clearance position (4142), and the side probe module (450) is installed in the second clearance position (4143).

5. The temperature-controlled module of claim 4, wherein, The vehicle cover plate (420) is also movably mounted with an upper template (423), the upper template (423) is provided with a pressing member (4231), the position of the pressing member (4231) is adapted to the first clearance position (4142) and the product positioning groove (4141).

6. The temperature-controlled module of claim 4, wherein, The fixing plate (413) is provided with a first magnetic suction member (4131), and the vehicle cover plate (420) is provided with a second magnetic suction member (424). The vehicle cover plate (420) and the fixing plate (413) are magnetically connected through the second magnetic suction member (424) and the first magnetic suction member (4131).

7. A test carrier characterized by, include: The carrier base (410) is provided with a product positioning groove (4141), a rear probe module (430), a front probe module (440), and a side probe module (450). The rear probe module (430) faces the back of the carrier base (410). The front probe module (440) and the side probe module (450) are located adjacent to the product positioning groove (4141) and are electrically connected to the rear probe module (430). The front probe module (440) faces the front of the carrier base (410), and the side probe module (450) faces the product positioning groove (4141). The carrier cover (420) is provided with a pusher (421), which is connected to the carrier base (410) so that the pusher (421) pushes the lateral probe module (450) toward the product positioning groove (4141).

8. The test carrier of claim 7, wherein, The carrier base (410) includes a base plate (411), a signal acquisition board (412), a fixing plate (413), and a lower template (414). The signal acquisition board (412) is installed between the base plate (411) and the fixing plate (413). The signal acquisition board (412) is electrically connected to the rear probe module (430), the front probe module (440), and the side probe module (450), respectively. The product positioning groove (4141) is disposed on the lower template (414). The lower template (414) is provided with a first clearance position (4142) and a second clearance position (4143) on the adjacent side of the product positioning groove (4141). The front probe module (440) is installed in the first clearance position (4142), and the side probe module (450) is installed in the second clearance position (4143).

9. A temperature-controlled test chamber adapted to house a test carrier as claimed in claim 7 or 8, characterised in that, include: The housing (310) is provided with a single-unit test chamber (311); A temperature control module is installed inside the housing (310) and arranged around the periphery of the individual test chamber (311); The second probe module (312) is installed inside the housing (310) and extends from the single test chamber (311) to the bottom surface of the housing (310).

10. A test apparatus, characterized by, It includes the temperature control module as described in any one of claims 1 to 6, or the test vehicle as described in claim 7 or 8, or the temperature control test chamber as described in claim 9.

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