A multi-domain design rule adaptive method based on EMC data assets

Abstract

This invention discloses a multi-domain adaptive design rule method based on EMC data assets. It includes: acquiring the target application scenario identifier, functional type, IC combination, and design objectives; retrieving matching typical basic products and their derivative product cases to obtain their feature sets and mapping relationships; constructing an initial design concept by combining IC-level and system-level data assets; retrieving the standard essential characteristics of the target application scenario; constructing an EMC domain adaptation model, establishing an adaptive mapping based on verified mapping relationships, and quantitatively correcting and generating design rule parameters; outputting design rules containing constraint objects, types, target values, source metadata, and protection layer priorities; and structurally storing and assigning multi-dimensional tags. This invention establishes cross-application scenario mappings through typical basic products and derivative products, achieving quantitative adaptive generation of design rules, supporting cross-domain reuse, test prediction, rule self-evolution, and automatic generation of design documents, shifting EMC design from experience-based to data-driven.

Description

Technical Field

[0001] This invention belongs to the field of electromagnetic compatibility (EMC) design technology, specifically involving a multi-domain design rule adaptive method based on EMC data assets. It is particularly suitable for integration into EMC intelligent design instruments or as computer software products (including standalone applications, software plug-ins, etc.). By retrieving typical basic products and their derivative product cases that match the functional type of the target product, and drawing on the verified EMC design feature sets therein, the initial EMC design concept of the product can be constructed before the detailed design of the product begins. Based on the essential characteristics of the EMC standard system of different application scenarios (including different fields and different product types within the same field), it adaptively generates EMC design rules that match the target application scenario. Background Technology

[0002] In the development of electronic products, different application scenarios (including different fields and different product types within the same field) have significantly different EMC performance requirements. These differences are reflected in the EMC standard systems followed by each scenario. For example, automotive electronics typically adhere to CISPR 25, industrial equipment follows CISPR 11 or the IEC 61000 series standards, while specialized industry equipment follows stringent standards specific to its respective field. Different standard systems have clear quantitative differences in test items, frequency ranges, limit curves, and classification levels. Therefore, for a product to be suitable for different application scenarios, its EMC design must be adaptively adjusted according to the standard system of the target application scenario. This process places extremely high demands on design efficiency and quality.

[0003] Existing technologies typically address EMC design issues across multiple domains using the following methods: First, relying on the engineer's personal experience to manually adjust design measures such as filtering, shielding, and grounding according to the EMC standards of the target domain. However, this approach is difficult to quantitatively evaluate the effectiveness of adjustments and is highly dependent on the engineer's expertise. Second, using general EMC design rules or enterprise EMC design specifications. However, these EMC rules / specifications are usually static and cannot be dynamically adapted to the differences in EMC standards across specific domains. Third, using EMC simulation software to iteratively optimize the design. However, simulation modeling has a long cycle, consumes significant computational resources, and requires complete design parameters as input, making it difficult to provide guidance in the early stages of design.

[0004] Patent application CN121279245A discloses a method, apparatus, device, and medium for electromagnetic compatibility (EMC) analysis of circuit schematics. It analyzes circuit schematics using a deep neural network model to perform EMC design rule analysis and outputs optimized solutions. However, this method relies on a pre-built EMC design rule library and training dataset. The rule library consists of static rules and does not address dynamic adaptation to different domain standard systems. Furthermore, its analysis object is the already drawn circuit schematic, making it unable to provide EMC design guidance in the early stages of design.

[0005] Patent application CN119603868A discloses a PCB layout design method and system based on heat dissipation optimization. This method improves the layout by performing logic design and electrical performance analysis on the PCB circuit board, combined with simulation optimization. The method focuses on heat dissipation optimization and signal integrity analysis. Its optimization process is based on specific design documents and does not involve differentiated adaptation to multi-domain standard systems, nor does it provide a mechanism for drawing design experience from historical design cases.

[0006] Patent application CN119720937A discloses a simulation system and method applicable to 5G communication circuit board design specifications. By extracting stack-up structure data and electrical parameter data, it performs signal propagation path analysis and electromagnetic compatibility simulation, ultimately optimizing the circuit board stack-up structure. However, this method is designed for the specific application domain of 5G communication and does not consider the differences in standard systems across different domains. Its simulation analysis relies on specific circuit board design data and cannot provide cross-domain rule-adaptive capabilities in the early stages of design.

[0007] Patent application CN120764476A discloses a PCB trace design method and system considering the pulse current fusing effect. Based on the differential impedance design principle, it establishes a current conductor heating model and a heat dissipation model, and determines the optimal differential impedance value that meets electromagnetic compatibility requirements through an optimization algorithm. This method focuses on the physical modeling and parameter optimization of the pulse current fusing effect. Its optimization objective is the current carrying capacity in a single domain, without involving the mapping relationship of multi-domain standard systems, nor utilizing historical design cases for rule adaptation.

[0008] In summary, existing technologies generally suffer from the following shortcomings when dealing with EMC design problems across multiple domains: First, when products need to be migrated between different application domains, the standard systems of each domain differ in terms of test items, frequency ranges, limit curves, and classification levels. However, these differences lack quantitative descriptions and are difficult to directly guide the adjustment of design parameters. Second, design experience (such as successful cases, rectification measures, and test results) for products of the same functional type is often tied to specific projects. When the design goals involve different application domains or different functional types of products within the same domain, it is difficult to draw on existing successful experiences. Third, EMC design adjustments for standards in different application domains mainly rely on engineers' understanding of the standard differences and their analysis of these differences to adjust design parameters. This adjustment process lacks quantitative basis, is highly random, inefficient, and prone to errors. Fourth, EMC standard systems in different domains differ significantly in the detector types (such as quasi-peak, peak, and average) and frequency coverage ranges for test items. These differences directly affect the determination of emission limits and immunity levels, but existing technologies lack quantitative descriptions and automated processing methods for these differences.

[0009] Therefore, there is a need for a method that can build an initial EMC design concept for a product before the detailed product design begins, based on typical basic products and their derivative product cases and their verified mapping relationships in a multi-domain EMC adaptation case library. This method can also establish an adaptive mapping relationship of essential parameters based on the essential characteristics of the EMC standard system in different application scenarios (including different domains and different product types in the same domain), thereby generating EMC design rules that match the target application scenario. Summary of the Invention

[0010] The purpose of this invention is to provide a multi-domain adaptive design rule method based on EMC data assets, addressing the problems in existing technologies such as the difficulty in quantitatively adapting differences in EMC standard systems across different application scenarios, the lack of design concept construction basis in the early stages of product design, the difficulty in systematically reusing historical design experience, and the reliance on manual experience for design rule generation. This invention retrieves typical basic products and their derivative product cases that match the functional type of the target product, draws on the verified EMC design feature sets therein, constructs an initial EMC design concept for the product before detailed product design begins, and establishes an adaptive mapping relationship of essential parameters based on the essential characteristics of EMC standard systems in different application scenarios (including different domains and different product types within the same domain), generating EMC design rules that match the target application scenario.

[0011] To achieve the above objectives, the present invention provides the following technical solution:

[0012] S1. Obtain the target field identifier of the target product, the functional type of the target product, the IC combination information of the target product, and the product design target parameters. The product design target parameters include at least one of the following: cost budget, development cycle, IC iteration adaptability requirements, and product advancement level.

[0013] S2. Based on the target domain identifier and the functional type of the target product, retrieve typical basic products and their derivative product cases that match the functional type from the multi-domain EMC adaptation case library; when the IC combination information of the target product contains multiple functional types, the system automatically identifies the dominant functional type and auxiliary functional type in the combination, and retrieves multiple corresponding typical basic products and their derivative product cases, and performs feature set fusion based on the coupling relationship between ICs to generate a combined initial reference case as the retrieved case; the typical basic product is a pre-selected standardized product representing a type of functional type, and the derivative product is a derivative variant formed on the basis of the typical basic product by adjusting the three-layer protection design parameters to adapt to the EMC standard system and its level in different application scenarios (including different domains and different product types in the same domain); the retrieved case includes at least: (a) the verified EMC design feature set of the derivative product that has successfully met the corresponding EMC standard system in the target application scenario; (b) the verified mapping relationship of the typical basic product and its derivative product in different application scenarios, and the mapping relationship records the quantitative correspondence between the adjustment of design parameters and the change of EMC standard level;

[0014] S3. Based on the IC combination information, retrieve the corresponding IC intrinsic characteristic data and system coupling prediction data from the IC-level EMC data assets and system-level EMC data assets, and combine them with the verified EMC design feature set in the typical basic products and their derivative product cases to construct the initial EMC design concept of the product. The initial EMC design concept of the product includes at least one or more of the following: IC intrinsic characteristic data, system coupling prediction data, measure sensitivity data, macroscopic law data, and at least one of the following initial schemes: shell structure initial scheme, cable routing initial scheme, and PCB layout initial scheme borrowed from the verified EMC design feature set. The initial EMC design concept of the product is used to characterize the electromagnetic intrinsic characteristics and initial design constraints of the target product.

[0015] S4. Retrieve the essential features of the EMC standard system that match the target field from the multi-domain EMC standard system database. The essential features of the EMC standard system are used to characterize the deep essence of the EMC standard system in the field, and include at least the quantitative feature set of the EMC standard system in the field, the quantitative feature set of non-EMC attribute constraints in the field, and the quantitative difference value between the field and the general reference benchmark.

[0016] S5. Construct an EMC domain adaptation model, using the initial EMC design concept of the product and the essential characteristics of the EMC standard system as model input variables. Based on the verified mapping relationship stored in the typical basic product and its derivative product cases, establish an adaptive mapping relationship of essential parameters between the two. The adaptive mapping relationship of essential parameters includes quantitatively correcting the parameters in the initial EMC design concept of the product according to the quantitative difference value in the essential characteristics of the EMC standard system, generating design rule parameters that match the target application scenario. The basis for the quantitative correction comes from the correspondence between the design parameter adjustment amount and the change of EMC standard level recorded in the verified mapping relationship.

[0017] S6. Based on the adaptive mapping relationship of the essential parameters, generate at least one EMC domain-specific design rule applicable to the target domain. Each design rule includes constraint object, constraint type, target value or range, rule source metadata, design complexity assessment indication, and protection layer adjustment priority. The priority is divided into mandatory adjustment layer, suggested adjustment layer, and alternative layer, and includes quantification of the cost impact and cycle impact of each layer adjustment.

[0018] S7. Store the EMC domain-specific design rules in the form of structured data assets, and assign multi-dimensional searchable tags to the structured data assets. The multi-dimensional searchable tags include at least one of the following: domain tag, function type tag, IC combination tag, product type tag, function module tag, rule type tag, constraint type tag, and directionality tag.

[0019] Furthermore, the multi-domain EMC adaptation case library is constructed in the following way:

[0020] At least two typical basic products representing different functional types are pre-selected, and the functional types include at least one of the following: power supply, control, high-speed signal, data acquisition, radio frequency, interface, isolation, clock, storage, and sensor.

[0021] For each typical basic product, while keeping its core functions unchanged, by adjusting at least one layer of protection design among IC-level protection, PCB-level protection, and system-level external protection, EMC standard systems and their derivative products adapted to different application scenarios (including different fields and different product types within the same field) are formed.

[0022] Record the three-layer protection design parameters of each derivative product and the EMC standard system level it meets, forming a verified EMC design feature set;

[0023] By comparing the differences in design parameters and the corresponding differences in EMC standard system levels among different derivative products of the same typical basic product, a verified mapping relationship is extracted. The mapping relationship includes a quantitative correspondence between the adjustment of design parameters and the change of EMC standard level.

[0024] The typical basic products, derivative products, verified EMC design feature sets, and verified mapping relationships are associated and stored to form the multi-domain EMC adaptation case library.

[0025] Furthermore, the multi-domain EMC standard system database is constructed by pre-parsed EMC standard systems from at least two different domains, the parsing including:

[0026] Extract a list of test items for each field, including at least one of conducted emission, radiated emission, conducted immunity, radiated immunity, transient immunity, transient emission, and special test items;

[0027] Extract the frequency range, limit curves, and level requirements for each test item; test setup requirements, test equipment configuration, and judgment criteria; level classification of each test item; quantitative difference values ​​between levels; and essential test characteristics. The essential test characteristics are used to characterize the type of electromagnetic phenomenon verified by the test item and the corresponding type of protective measures.

[0028] Extract non-EMC attribute constraint parameters from various fields, including at least one of the following: operating temperature range, vibration level, and reliability level;

[0029] Establish a database of quantitative difference values ​​between various fields and a general reference benchmark. The quantitative difference values ​​include at least one of the following: limit difference at the same frequency point, frequency range offset, immunity level difference, constraint parameter scaling factor, and quantitative difference values ​​of the same test item at different levels.

[0030] Furthermore, the essential characteristics of the EMC standard system described in step S4 also include: priority weights for non-EMC attribute constraints in this domain, which are predefined according to domain characteristics and used to perform weighted correction on multiple non-EMC attribute constraints in the essential parameter adaptive mapping relationship in step S5, so as to prioritize satisfying constraints with higher weights; and the product design target parameters include at least one of cost priority, volume priority, weight priority, performance priority, and cycle priority, which are used as optimization guidance to perform weighted adjustment on design rule parameters in the essential parameter adaptive mapping relationship.

[0031] Furthermore, the essential characteristics of the EMC standard system mentioned in step S4 also include: the adaptability of this field to IC changes, wherein the adaptability of the IC changes includes the influence coefficient of the essential characteristics of the EMC standard system on the intrinsic characteristics of the replacement IC when the IC model in the IC combination information is changed to a replacement IC;

[0032] The influence coefficient is calculated based on the difference between the intrinsic characteristic data of the alternative IC and the intrinsic characteristic data of the original IC, and is used to correct the parameter adjustment amount in the intrinsic parameter adaptive mapping relationship in step S5.

[0033] The IC change adaptability features also include historical application case data of the alternative IC in the target domain. The historical application case data comes from a multi-domain EMC adaptation case library stored in the user's local design knowledge base and is used to evaluate the confidence level of the design rules after the IC change.

[0034] Furthermore, the construction of the EMC domain adaptation model also includes: retrieving adaptation cases from the multi-domain EMC adaptation case library based on the target domain identifier. These adaptation cases are formed by iterating typical basic products through different application scenario standard systems. The adaptation cases include the design rules of the basic products in different application scenarios, the corresponding EMC test results, and the level corresponding to each test item and the test results under that level.

[0035] The intrinsic parameter adaptive mapping relationship is further calibrated based on the design rules and test results in the adaptation cases to optimize the correction accuracy of the quantitative difference value and establish a mapping relationship between the same test item level in different application scenarios and a quantitative model of the differences between levels; and the directional label includes a protection level indication, which includes at least one of system-level external protection, PCB-level protection, and IC-level protection. The protection level indication is used to characterize the EMC design levels that need to be prioritized to meet the EMC requirements of the target domain.

[0036] Furthermore, the EMC-specific design rules described in step S6 also include:

[0037] The design rule satisfies a list of non-EMC attribute constraints, which includes at least one of temperature adaptability constraints and reliability level constraints, and the priority weight of each constraint in the list of non-EMC attribute constraints is determined according to the priority weight of the corresponding non-EMC attribute constraint in claim 4.

[0038] The expected confidence level of the design rule in the target domain is calculated based on the data completeness of the essential characteristics of the EMC standard system, the sample size of the quantitative data, and the similarity between the target domain and historical cases in the multi-domain EMC adaptation case library.

[0039] The expected confidence level is divided into three levels: high, medium, and low, which are used to characterize the adoptability of the design rule in the target domain.

[0040] Furthermore, the method also includes:

[0041] The steps for generating an adaptive testing strategy in the EMC domain are as follows: Based on the differences in test items and limits within the essential characteristics of the EMC standard system, a test priority ranking for the target domain is generated; based on the test priorities and the test method characteristics of the target domain, a recommended sequence of test methods is generated; based on the limit curve parameters of the target domain, the initial EMC design concept of the product, and the essential test characteristics within the essential characteristics of the EMC standard system, a predictive model is generated to estimate the pass probability of the target product in each test item; based on the differences between the essential test characteristics and the initial EMC design concept of the product, supplementary design rule suggestions are generated.

[0042] And automatic verification steps: When generating EMC-specific design rules, the system automatically verifies whether the recommended devices or solutions meet the non-EMC attribute constraints of the target domain. If there are conflicts, it automatically retrieves alternative solutions that meet the constraints and outputs conflict flags and alternative suggestions.

[0043] The EMC domain rule adaptive evolution steps are as follows: Based on user adoption of design rules and subsequent EMC test feedback, a rule application effect database is constructed; based on the rule application effect database, the accuracy of the design rules is calculated; when the accuracy is lower than a preset threshold, the system automatically triggers the rule optimization process: first, deviation cases are analyzed to identify the key factors causing the deviations; then, based on the key factors, the quantitative difference values ​​in the essential characteristics of the EMC standard system are automatically updated, and the updated rules and corresponding multi-domain EMC adaptation cases are stored in the user's local design knowledge base.

[0044] The design rule file generation process includes: After generating EMC-specific design rules, the design rule file is automatically generated and supports visual preview, one-click import, and highlighting of constrained ICs, networks, and areas on the PCB layout interface.

[0045] Furthermore, the method also includes a cross-domain reuse adaptability comparison step:

[0046] When the target domain differs from the domain of historical design cases stored in the user's local design knowledge base, the system calls the operation sequence and state snapshot data assets of the historical design cases, generates cross-domain reuse adaptive comparison results, and stores them as data assets.

[0047] The cross-domain reuse adaptive comparison results include at least the following:

[0048] A quantitative comparison of the target domain and the historical domain in terms of the essential characteristics of the EMC standard system;

[0049] Feasibility assessment of the reuse of design rules from the historical design cases in the target domain;

[0050] If reuse is deemed feasible, provide the parameters and adjustment amounts that need to be adjusted for the design rules, and provide suggestions for the adjusted rule parameters;

[0051] If reuse is deemed not feasible, alternative design rules and expected effects will be provided.

[0052] Furthermore, the method is applied to an EMC intelligent design instrument as a domain adaptation module of the instrument; the instrument integrates the multi-domain EMC standard system database and the multi-domain EMC adaptation case library; or, the method is implemented as an independent computer software product or EMC design software plug-in.

[0053] Beneficial effects

[0054] The present invention has the following beneficial effects:

[0055] First, this invention retrieves typical basic products and their derivative product cases that match the functional type of the target product, and draws on the verified EMC design feature sets therein to construct the initial EMC design concept of the product before the detailed design begins. This transforms historical design experience into reusable data assets, providing a basis for the early design phase.

[0056] Second, this invention retrieves the essential characteristics of the EMC standard system from a multi-domain EMC standard system database, performs quantitative analysis of the standard system, and transforms the differences in test items, detector types, frequency ranges, limit curves, level classifications, essential test characteristics, and non-EMC attribute constraints into quantifiable parameters, providing a data foundation for cross-application scenario adaptation.

[0057] Third, this invention constructs an EMC domain adaptation model, which establishes an adaptive mapping relationship for essential parameters based on the verified mapping relationships stored in typical basic products and their derivative product cases. This model is used to connect the initial EMC design concept of a product with the essential characteristics of the EMC standard system, quantitatively correct the design parameters, and transform EMC design from experience-oriented to data-driven.

[0058] Fourth, the structured EMC domain-specific design rules generated by this invention include constraint objects, constraint types, target values ​​or ranges, rule source metadata, design complexity assessment indicators, and protection layer adjustment priorities.

[0059] The priority of the protection layer adjustment is divided into mandatory adjustment layer, recommended adjustment layer, and alternative layer, and includes the quantification of the cost impact and cycle impact of each layer adjustment.

[0060] The design rules are traceable, searchable, and quantifiable, providing engineers with a quantitative basis for cross-layer optimization.

[0061] Fifth, this invention enables the reuse of design experience across different application scenarios through a cross-domain reuse adaptive comparison step. When the target application scenario differs from the application scenario of historical design cases, the system calls the operation sequence and state snapshot data assets of historical design cases to generate comparison results that include quantitative comparison, reuse feasibility assessment and adjustment suggestions, providing a basis for decision-making in cross-application scenario design.

[0062] Sixth, this invention, through an adaptive testing strategy generation step in the EMC field, generates test priority ranking, recommended test method sequences, and a predictive model based on the differences in test items and limits inherent in the EMC standard system, as well as the initial EMC design concept of the product. This predictive model can estimate the probability of test pass during the design phase, helping to reduce the risk of test failure in later stages.

[0063] Seventh, this invention achieves continuous optimization of design rules through an adaptive evolutionary process for EMC rules. Based on user adoption and test feedback, it calculates rule accuracy according to preset conditions, automatically identifies deviation factors, and updates the quantitative difference values ​​and level mapping relationships in the essential characteristics of the EMC standard system.

[0064] Eighth, this invention employs an automatic verification step to check whether the recommended devices or solutions conform to the non-EMC attribute constraints of the target domain when generating design rules. If conflicts exist, it automatically retrieves alternative solutions that meet the constraints and outputs conflict flags and alternative suggestions to avoid changes caused by non-EMC attribute constraints.

[0065] Ninth, the present invention automatically generates a design rule file after the design rules are generated through the design rule file generation step, and supports functions such as visual preview, one-click import, and highlighting constrained ICs, networks and areas on the PCB layout interface, thereby improving the configuration efficiency and accuracy of design rules.

[0066] Tenth, this invention can be integrated into EMC intelligent design instruments or implemented as a standalone computer software product or EMC design software plug-in, providing flexible implementation methods for different application scenarios and broadening the application scope of the technical solution. Attached Figure Description

[0067] Figure 1 This is a flowchart of the method of the present invention.

[0068] Figure 2 This is a diagram showing the interaction relationships between modules in the EMC intelligent design instrument of this invention.

[0069] Figure 3 This is a closed-loop diagram of the design rules adaptive evolution and data asset accumulation of the present invention.

[0070] Figure 4 This is a schematic diagram illustrating the construction of a typical basic product and its derivative product case library.

[0071] Figure 5 This is a schematic diagram illustrating the initial EMC design concept of the product.

[0072] Figure 6 This is a schematic diagram of the adaptive mapping relationship of essential parameters.

[0073] Figure 7 This is a schematic diagram of cross-domain reuse adaptability comparison. Detailed Implementation

[0074] The overall process of this invention includes: S1, obtaining the target domain identifier of the target product, the function type of the target product, the IC combination information of the target product, and the product design target parameters; S2, based on the target domain identifier and the function type of the target product, retrieving typical basic products and their derivative product cases that match the function type from a multi-domain EMC adaptation case library; when the IC combination information of the target product contains multiple function types, the system automatically identifies the dominant function type and auxiliary function type in the combination, and simultaneously retrieves multiple corresponding typical basic products and their derivative product cases, and performs feature set fusion based on the coupling relationship between ICs to generate a combined initial reference case as the retrieved case. The typical basic product is a pre-selected standardized product representing a functional type. The derivative product is a variant formed by adjusting the three-layer protection design parameters based on the typical basic product to adapt to the EMC standard system and its level in different application scenarios (including different fields and different product types in the same field). The retrieved cases include at least: (a) the verified EMC design feature set of the corresponding EMC standard system that the derivative product has successfully met in the target application scenario; (b) the verified mapping relationship between the typical basic product and its derivative products in different application scenarios, and the mapping relationship records the quantitative correspondence between the adjustment of design parameters and the change of EMC standard level; S3, based on The IC combination information retrieves corresponding IC intrinsic characteristic data and system coupling prediction data from IC-level EMC data assets and system-level EMC data assets, and combines them with the verified EMC design feature sets in the typical basic products and their derivative product cases to construct an initial EMC design concept for the product. This initial EMC design concept includes at least one or more of the following: IC intrinsic characteristic data, system coupling prediction data, measure sensitivity data, macroscopic law data, and at least one of the following initial schemes: initial shell structure scheme, initial cable routing scheme, and initial PCB layout scheme borrowed from the verified EMC design feature sets. This initial EMC design concept is used to characterize the electromagnetic intrinsic characteristics and initial... S4. Retrieve the essential characteristics of the EMC standard system matching the target field from the multi-domain EMC standard system database. The essential characteristics of the EMC standard system are used to characterize the deep essence of the EMC standard system in this field, and at least include the quantitative feature set of the EMC standard system in this field, the quantitative feature set of non-EMC attribute constraints in this field, and the quantitative difference value between this field and the general reference benchmark; S5. Construct an EMC domain adaptation model, taking the initial EMC design concept of the product and the essential characteristics of the EMC standard system as model input variables, and establishing an adaptive mapping relationship of essential parameters between the two based on the verified mapping relationship stored in the typical basic product and its derivative product cases;The essential parameter adaptive mapping relationship includes quantitatively correcting the parameters in the initial EMC design concept of the product based on the quantitative difference values ​​in the essential characteristics of the EMC standard system, generating design rule parameters that match the target application scenario; wherein, the basis for the quantitative correction comes from the correspondence between the design parameter adjustment amount and the EMC standard level change recorded in the verified mapping relationship; S6, based on the essential parameter adaptive mapping relationship, at least one EMC domain-specific design rule applicable to the target domain is generated, each design rule includes constraint object, constraint type, target value or range, rule source metadata, design complexity assessment indication, and protection level adjustment priority, the priority is divided into mandatory adjustment layer, suggested adjustment layer, and alternative layer, and includes the quantitative cost impact and periodic impact of each layer adjustment; S7, the EMC domain-specific design rule is stored in the form of structured data assets, and the structured data assets are assigned multi-dimensional searchable tags, the multi-dimensional searchable tags include at least one of the following: domain tag, function type tag, IC combination tag, product type tag, function module tag, rule type tag, constraint type tag, and directionality tag.

[0075] For ease of understanding, the core terms appearing in this invention are defined as follows:

[0076] A multi-domain EMC adaptation case library: This library stores structured data assets of adaptation cases formed through iterations of EMC standards across different application scenarios for at least two pre-selected typical basic products and their derivative products representing different functional types. Each adaptation case includes the EMC design rules of the basic product in different application scenarios, the corresponding EMC test results, and the corresponding levels and level test results for each test item. The library is organized by functional type and can include product cases for typical functional types such as power supply, control, high-speed signal, data acquisition, RF, interface, isolation, clock, storage, and sensor. Each functional type corresponds to multiple product design examples that have passed EMC standard certifications for different application scenarios, forming a typical basic product and derivative product case library that can be used as a reference for new projects.

[0077] Typical basic products and their derivative product cases: Successful design examples that match the functional type of the target product and are retrieved from a multi-domain EMC adaptation case library. These include verified EMC design feature sets of the derivative products that have successfully met the corresponding EMC standard system in the target application scenario, as well as verified mapping relationships of the typical basic products and their derivative products in different application scenarios.

[0078] Initial EMC Design Concept: Before the detailed design of the target product begins, an initial EMC design scheme is constructed based on IC combination information and a verified EMC design feature set. This includes IC intrinsic characteristic data, system coupling prediction data, measure sensitivity data, macroscopic law data, and at least one of the following initial schemes: housing structure, cable routing, and PCB layout, which are derived from the verified EMC design feature set.

[0079] Essential characteristics of EMC standards system: A set of quantitative features retrieved from a multi-domain EMC standards system database to characterize the deep essence of a specific domain's EMC standards system. It includes at least the quantitative feature set of the domain's EMC standards system, the quantitative feature set of the domain's non-EMC attribute constraints, and the quantitative difference values ​​between the domain and the general reference benchmark.

[0080] Universal reference benchmark: An EMC standard system in a recognized benchmark field (such as the consumer electronics standard system) serves as a reference for calculating differences across application scenarios.

[0081] Quantitative difference value: The quantitative difference between the target domain EMC standard system and the general reference benchmark in the same dimension, including the limit difference at the same frequency point, frequency range offset, immunity level difference, constraint parameter scaling factor, etc.

[0082] Essential parameter adaptive mapping relationship: Based on the quantitative difference value in the essential characteristics of the EMC standard system, the parameters in the initial EMC design concept of the product are quantitatively modified to generate a dynamic mapping relationship of design rule parameters that matches the target application scenario; the modification basis comes from the correspondence between the design parameter adjustment amount and the change of EMC standard level recorded in the verified mapping relationship.

[0083] Design complexity assessment indicators: These are used to characterize the trend (increase or decrease) of design complexity in a target domain relative to a general reference benchmark, as well as to provide information on recommended priority areas (such as structural / casing level, material level, PCB layout and routing level, IC selection / change trend level).

[0084] The essential characteristics of testing: Characterizes the type of electromagnetic phenomenon verified by the EMC test project and the corresponding type of protection measures. For example, conducted emission testing is essentially to verify the port filtering capability, corresponding to the power port filtering design rules; radiated emission testing is essentially to verify the space radiation control capability, corresponding to the shielding and layout design rules.

[0085] Priority weights for non-EMC attribute constraints: When weighing different non-EMC attribute constraints (such as operating temperature range, vibration level, reliability level, etc.), the weight coefficients assigned to each constraint are predefined according to the domain characteristics.

[0086] IC Change Adaptability Characteristics: These characteristics describe the adaptability of a specific field to IC changes, including the influence coefficient of the essential characteristics of the EMC standard system on the intrinsic characteristics of the replacement IC when the IC model is changed to a replacement IC. This is used to correct the parameter adjustment amount in the adaptive mapping relationship of essential parameters.

[0087] Cross-domain reuse adaptability comparison results: When the target application scenario is different from the application scenario of historical design cases stored in the user's local design knowledge base, the system generates a structured comparison report, which includes quantitative comparison between application scenarios, reuse feasibility assessment, and adjustment or alternative suggestions.

[0088] Expected confidence level: The confidence level (high, medium, low) is calculated based on the data completeness of the essential characteristics of the EMC standard system, the sample size of quantitative data, and the similarity between the target application scenario and historical cases in the multi-domain EMC adaptation case library. It is used to characterize the degree of adoptability of the design rules in the target application scenario.

[0089] Predictive Model: A predictive model generated based on the limit curve parameters of the target application scenario, the initial EMC design concept of the product, and the essential test characteristics in the essential characteristics of the EMC standard system. It is used to estimate the pass probability of the target product in each test item and supports calibration based on actual test results.

[0090] Rule Application Effect Database: A structured database that records design rule identifiers, adoption status, test results, deviation values, and actual improvement amounts, used to periodically calculate the accuracy of design rules.

[0091] Accuracy: The ratio of the number of times a design rule achieves the expected effect in historical applications to the total number of applications. When the accuracy is lower than a preset threshold, the rule optimization process is triggered.

[0092] Protection layer adjustment priority: This is used to identify the protection layers that need to be adjusted first in order to meet the EMC requirements of the target field. It is divided into mandatory adjustment layers, recommended adjustment layers, and alternative layers. Among them, mandatory adjustment layers refer to design adjustments that must be implemented, recommended adjustment layers refer to design adjustments that are recommended to be implemented, and alternative layers refer to design adjustments that can be used as alternative solutions. This priority also includes the quantification of the cost impact and cycle impact of each layer adjustment.

[0093] Cost impact quantification: The estimated additional cost required to implement a design rule, expressed in monetary units (such as yuan).

[0094] Quantification of cycle impact: An estimated increase in development cycle required to implement a design rule, expressed in time units (e.g., days).

[0095] Feature set fusion: When the target product contains a combination of ICs with multiple functional types, the system merges, optimizes and resolves conflicts of verified EMC design feature sets from multiple typical basic products and their derivative product cases based on the coupling relationship between ICs, and generates an initial reference case suitable for the combined product.

[0096] The following two examples illustrate the specific applications of the present invention in two carriers: intelligent EMC design instruments and independent software tools.

[0097]

Example 1

[0098] This embodiment uses the integration of the method of the present invention into an EMC intelligent design instrument as an example to illustrate its application in cross-application scenario design from industrial robot controllers to automotive electronic vehicle controllers.

[0099] A robotics company already has mature industrial robot controller products that have passed EMC standards certifications for industrial, scientific, and medical devices (GB 4824 emission requirements, GB / T 17626 series immunity requirements). They now plan to migrate this controller technology to automotive controllers, which must meet automotive electronics EMC standards (CISPR 25, ISO 7637-2, ISO 10605, etc.).

[0100] Engineers select the target application scenario as "Automotive Electronics EMC Standards (CISPR25, ISO 7637-2, etc.)" in the EMC intelligent design instrument, the function type as "Control Class", input the IC combination information (main control MCU, power management IC, CAN transceiver), and configure the product design target parameters as "Performance Priority".

[0101] S1: Obtain the target application scenario identifier "Automotive Electronics EMC Standard (CISPR 25, ISO 7637-2, etc.)", function type "Control Class", IC combination information, and product design target parameters "Performance Priority".

[0102] S2: Based on the target application scenario identifier and function type, retrieve typical basic products and their derivative product cases that match the "control category" from the multi-domain EMC adaptation case library.

[0103] The case library stores a design case of an industrial robot controller that has successfully met the EMC standards for industrial, scientific, and medical devices (case identifier: Case_Robot_Industrial).

[0104] This case study includes a validated EMC design feature set, formed by the derivative products successfully meeting the corresponding EMC standards in the target application scenario. Examples include: power port filtering networks, CAN interface transient protection, and PCB partitioning layout.

[0105] This case study also includes verified mappings from EMC standards for industrial, scientific, and medical devices to automotive electronics standards. For example, a +10dB difference in conducted emission limits from GB 4824 to CISPR 25 Class 3 requires doubling the input filter capacitor; the transient requirements of ISO 7637-2 pulse 3a (-220V) and pulse 3b (+150V) require the addition of bidirectional TVS diodes to the corresponding interfaces.

[0106] S3: Based on the IC combination information and the verified EMC design feature set, construct the initial EMC design concept for the product.

[0107] The concept includes the following:

[0108] Intrinsic IC characteristics retrieved from IC-level EMC data assets, such as clock harmonics of MCUs and switching noise of power ICs;

[0109] Coupling coefficients retrieved from system-level EMC data assets;

[0110] Three initial schemes were borrowed from the feature set: PCB layout initial scheme (power and digital partitioning, critical signal grounding), housing structure initial scheme (metal housing grounding, interface filtering reservation), and cable routing initial scheme (shielded wire grounded at both ends).

[0111] S4: Retrieve the essential characteristics of the EMC standard system that match the "Automotive Electronics EMC Standards (CISPR 25, ISO7637-2, etc.)" from the multi-domain EMC standard system database.

[0112] This essential feature includes a quantitative feature set, specifically:

[0113] Peak and average value curves of conducted emission limits from 150 kHz to 108 MHz;

[0114] Quasi-peak curves of radiated emission limits from 30MHz to 1GHz (example frequency band, which can be extended to higher frequencies in practice).

[0115] Transient immunity requirements (ISO 7637-2 Pulse 1, 2a, 3a, 3b, etc.);

[0116] Electrostatic discharge requirements (±8kV contact discharge / ±15kV air discharge), etc.

[0117] This essential characteristic also includes a quantitative feature set of non-EMC attribute constraints, specifically including: operating temperature range -40℃ to 85℃, vibration level 5g, etc.

[0118] In addition, this essential feature also includes quantitative differences from common reference benchmarks (EMC standards for industrial, scientific and medical devices), such as a difference of +10 dB in conducted emission limits, a difference of +8 dB in radiated emission limits, and the addition of transient requirements in ISO 7637-2.

[0119] S5: Construct an EMC domain adaptation model, taking the initial EMC design concept of the product and the essential characteristics of the EMC standard system as input.

[0120] Based on the verified mapping relationship, an adaptive mapping relationship of essential parameters between the two is established. For example, for every 5dB increase in the conducted emission limit, the input filter capacitor value increases by 50%; for every level increase in transient immunity, the current-carrying capacity of the interface protection device increases by 30%.

[0121] Based on the aforementioned quantitative difference values ​​(conducted emission difference +10dB, radiated emission difference +8dB, and the addition of ISO 7637-2 transient requirements), the parameters in the initial design concept were quantitatively corrected to generate design rule parameters that match the target application scenario. The corrected design rule parameters include: increasing the power input filter capacitor from 10μF to 22μF; adding a bidirectional TVS diode (breakdown voltage 24V) to the CAN interface; and grounding the clock trace of the main control MCU and adding a shielding cover for future use.

[0122] S6: Based on the adaptive mapping relationship of the essential parameters, generate EMC-specific design rules suitable for the target application scenario.

[0123] Each rule includes the constraint object, constraint type, target value or range, rule source metadata, design complexity assessment instructions, and protection layer adjustment priority. For example, "power input port filter capacitor ≥22μF" is a mandatory adjustment layer, with a cost impact of +1.2 yuan and a cycle impact of +0.5 days.

[0124] S7: Store the EMC domain-specific design rules in the user's local design knowledge base as a structured data asset.

[0125] Assign multi-dimensional searchable tags to this structured data asset, such as the domain tag "automotive electronics" and the function type tag "control".

[0126] This embodiment demonstrates the key process of how the present invention, in an intelligent EMC design instrument, adaptively generates cross-application scenario design rules from industrial, scientific and medical device EMC standards to automotive electronics, based on the essential characteristics of typical basic products and their derivative product cases and standard systems, and links testing strategies and IC change adaptability.

[0127]

Example 2

[0128] This embodiment uses the method of the present invention to implement an independent software tool for cross-application scenario design from consumer high-speed communication devices to space communication devices.

[0129] An electronics company has extensive experience in mass-producing multiple high-speed communication devices, and its existing products all meet the requirements of consumer electronics EMC standards (GB 9254, GB / T 17626 series). The company plans to upgrade this technology for use in space communication equipment, which must meet aerospace EMC requirements, including: conducted emissions (10kHz–10MHz, peak detector), radiated emissions (10kHz–18GHz, peak detector), cable bundle injected conducted sensitivity (4kHz–400MHz), electric field radiated sensitivity (10kHz–40GHz), electrostatic discharge, voltage sags and short-term interruptions, as well as non-EMC constraints such as special irradiation tests and vacuum environments. However, the company lacks in-depth understanding of aerospace standards. Engineers used an independent software tool developed in this invention to assist in generating design rules for cross-application scenarios.

[0130] In the tool interface, the engineer selects the target application scenario as "Aerospace EMC requirements (including irradiation testing, vacuum environment, etc.)," ​​the function type as "high-speed communication," inputs the FPGA and SerDes combination information, and configures the product design target parameters as "reliability priority."

[0131] S1: Obtain the target application scenario identifier "Aerospace EMC requirements (including irradiation test, vacuum environment, etc.)", function type "high-speed communication", IC combination information (FPGA, SerDes) and product design target parameters "reliability priority".

[0132] S2: Based on the target application scenario identifier and function type, retrieve typical basic products and their derivative product cases that match "high-speed communication" from the multi-domain EMC adaptation case library.

[0133] The case library stores a high-speed communication device design case (case identifier: Case_Com_HighSpeed) that has successfully met consumer electronics EMC standards. This case contains a set of verified EMC design features that have successfully met the corresponding requirements in the target application scenario, such as FPGA power decoupling networks, high-speed differential signal shielding and terminal matching, and overall metal casing sealing.

[0134] This case also includes verified mappings from consumer electronics standards to aerospace requirements. For example, a strict 15dB radiation emission limit requires inner striplines and additional shielding for FPGA clock traces; irradiation testing requires a total dose ≥50krad(Si), requiring the selection of radiation-hardened FPGA models.

[0135] S3: Based on the IC combination information and the verified EMC design feature set, construct the initial EMC design concept for the product.

[0136] The concept includes intrinsic characteristic data such as FPGA clock harmonics and SerDes differential noise retrieved from IC-level EMC data assets, as well as coupling coefficients retrieved from system-level EMC data assets.

[0137] The concept also includes three initial schemes borrowed from the feature set: initial PCB layout scheme (high-speed signal stacking, power partitioning), initial housing structure scheme (all-metal sealing, shielding effectiveness ≥60dB), and initial cable routing scheme (double shielding, grounding method).

[0138] S4: Retrieve the essential characteristics of the EMC standard system that match the "EMC requirements in the aerospace field" from the multi-domain EMC standard system database.

[0139] This essential feature includes a quantitative feature set, specifically:

[0140] Peak curves of conducted emission limits (10kHz to 10MHz);

[0141] Peak curves of radiated emission limits (10 kHz to 18 GHz);

[0142] A quantitative feature set of cable bundle injection conduction sensitivity (4kHz~400MHz);

[0143] A quantitative feature set of electric field radiation sensitivity (10kHz–40GHz);

[0144] Electrostatic discharge requirements (±8kV contact discharge / ±15kV air discharge), etc.

[0145] This essential characteristic also includes a quantitative feature set of non-EMC attribute constraints, specifically including: operating temperature range -55℃ to 85℃, vacuum environment (thermal vacuum test), irradiation test (total dose, single-event effect), etc.

[0146] In addition, this essential feature also includes quantitative differences from common reference benchmarks (consumer electronics standards, namely GB 9254, GB / T 17626 series), such as a difference of +15 dB in radiated emission limits, and new irradiation requirements.

[0147] S5: Construct an EMC domain adaptation model, taking the initial EMC design concept of the product and the essential characteristics of the EMC standard system as input.

[0148] Based on the verified mapping relationship, an adaptive mapping relationship of essential parameters between the two is established. For example, for every 5dB increase in the radiated emission limit, the shielding effectiveness of high-speed signals needs to be improved by 10dB; for every increase in the irradiance level, the FPGA needs to be a model with a higher irradiance level.

[0149] Based on the aforementioned quantitative difference values ​​(radiative emission difference +15dB, added irradiance requirements), the parameters in the initial design concept are quantitatively corrected to generate design rule parameters that match the target application scenario. The corrected design rule parameters include:

[0150] FPGA clock routing: changed from surface microstrip lines to inner striplines and added shielding;

[0151] Power input: Two-stage EMI filtering added;

[0152] FPGA selection: changed from commercial grade to radiation-hardened grade (model XC7VX690T-3FFG1927I).

[0153] The casing is made of aluminum alloy with added conductive gaskets.

[0154] S6: Based on the adaptive mapping relationship of the essential parameters, generate EMC-specific design rules suitable for the target application scenario.

[0155] Each rule includes the constraint object, constraint type, target value or range, rule source metadata, design complexity assessment instructions, and protection layer adjustment priority.

[0156] For example, "FPGA selection with a total radiation dose ≥50 krad(Si)" is a mandatory adjustment layer, which has a cost impact of +5000 yuan and a cycle impact of +30 days.

[0157] S7: Store the EMC domain-specific design rules in the user's local design knowledge base as a structured data asset.

[0158] Assign multi-dimensional searchable tags to this structured data asset. For example, the domain tag could be "aerospace" and the function type tag could be "high-speed communication".

[0159] This embodiment demonstrates how the present invention, in a standalone software tool, adaptively generates cross-application scenario design rules from consumer electronics to aerospace, based on the essential characteristics of typical basic products and their derivative product cases and standard systems, and achieves automatic verification and alternative solution retrieval for non-EMC attribute constraints (irradiation, vacuum).

[0160] Application Examples

[0161] The technical effects of the present invention will be explained below in conjunction with three application scenarios.

[0162] 1. Cross-application scenario rule adaptation application in EMC intelligent design instruments

[0163] An industrial control equipment R&D company needs to meet the requirements of multiple EMC standards when designing programmable logic controllers (PLCs) for different export markets, including: North American FCC Part 15, European EN 61000-6-2, and domestic industrial environment EMC standards (GB 17799.4, GB / T 17626 series). Engineers input the target application scenario identifiers "FCC Part 15," "EN 61000-6-2," and "industrial environment EMC standards" into an intelligent EMC design instrument, and input the same IC combination information and function type "control class."

[0164] Based on the identifiers and functional types of each target application scenario, typical basic products and their derivative product cases matching the "control" category are retrieved from a multi-domain EMC adaptation case library. Drawing upon the validated EMC design feature sets within these cases, initial EMC design concepts for each application scenario are constructed. An adaptive mapping relationship of essential parameters is established through an EMC domain adaptation model, generating three sets of EMC domain-specific design rules.

[0165] Engineers compared the constraints, target values, priority of protection layer adjustments, and design complexity assessment indicators of the three sets of rules. For North American standards, the design rules emphasize radiated emission control and require enhanced shielding measures. For European standards, the design rules emphasize improved immunity and increase requirements for power port filtering networks. For domestic industrial environmental standards, the design rules strike a trade-off between radiated emissions and immunity, adopting a balanced approach of shielding and filtering, taking into account cost-priority design objectives.

[0166] Based on the comparison results of the above rules, engineers developed differentiated design solutions for different market demands. These solutions effectively controlled design costs while meeting the standard requirements of each target application scenario. This application example demonstrates the guiding value of this invention in parallel adaptation of standards across multiple application scenarios and in assisting engineers in developing differentiated design solutions.

[0167] 2. User-local design knowledge base accumulation and rule adaptive evolution application

[0168] An electronics design company has long integrated the method of this invention into its EMC design process. Its user-local design knowledge base has accumulated design rules and corresponding EMC test feedback data covering functional types such as power management, high-speed communication, and data acquisition.

[0169] During a new product development process, engineers discovered that when a power management IC was applied to industrial equipment, the measured conducted emissions deviated from the predicted values ​​of the predictive model (the measured values ​​exceeded the limit by 5dB). The system calculates the accuracy of the design rule based on the rule application effect database. When the accuracy falls below a preset threshold, a rule optimization process is triggered.

[0170] The rule optimization process includes: analyzing deviation cases and identifying key factors leading to the deviation. Analysis revealed that the key factor was a discrepancy in the quantitative differences between industry standards and general benchmarks.

[0171] Based on the key factors, the system updates the quantitative difference values ​​in the essential characteristics of the EMC standard system and stores the updated rules and corresponding multi-domain EMC adaptation cases in the user's local design knowledge base.

[0172] Subsequent industrial equipment projects using this IC combination have all benefited from the revised rules, with the accuracy of conducted emission prediction increasing from 70% to 92%.

[0173] This application example demonstrates the knowledge management value of this invention in achieving self-evolving rules and the digital accumulation of experience through long-term use.

[0174] 3. Reuse of design experience across different product types within the same field

[0175] A certain automotive electronics company has completed the development and mass production of a vehicle controller (control type). This product meets automotive electronics EMC standards (CISPR 25, ISO 7637-2, etc.), and its EMC design rules have been accumulated as structured data assets and stored in the user's local design knowledge base. Now, a motor controller (power control type) needs to be developed. The IC combination includes a power drive IC, a current sampling IC, and a main control MCU. The engineer inputs the target application scenario "Automotive electronics EMC standards (CISPR 25, ISO 7637-2, etc.)" into the EMC intelligent design instrument, sets the function type to "power control type," and configures the product design target parameter to "cost priority." The system automatically identifies that this product belongs to the same automotive electronics application scenario as the stored vehicle controller, and that the function types are similar, belonging to an experience reuse scenario for different product types within the same field. The system retrieves derivative product cases of the vehicle controller (which have successfully met automotive electronics standards) from a multi-domain EMC adaptation case library, referencing their verified EMC design feature sets (such as power filter networks, CAN interface protection, and PCB partitioning layout). By combining the intrinsic characteristics of the motor controller IC (power switching noise, sampling circuit sensitivity), EMC-specific design rules for the motor controller are generated through an EMC domain adaptation model.

[0176] The design rules include: adding two stages of filtering (π-type filter + common-mode choke) to the power input port; using differential routing and grounding for the current sampling signal line; and grounding the clock routing of the main control MCU based on the experience of vehicle controllers.

[0177] The above description is merely a specific embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the scope of the technology disclosed in the present invention should be included within the scope of protection of the present invention.

Claims

1. An adaptive method for multi-domain design rules based on EMC data assets, characterized in that, Includes the following steps: S1. Obtain the target field identifier of the target product, the functional type of the target product, the IC combination information of the target product, and the product design target parameters. The product design target parameters include at least one of the following: cost budget, development cycle, IC iteration adaptability requirements, and product advancement level. S2. Based on the target domain identifier and the functional type of the target product, retrieve typical basic products and their derivative product cases that match the functional type from the multi-domain EMC adaptation case library; when the IC combination information of the target product contains multiple functional types, the system automatically identifies the dominant functional type and auxiliary functional type in the combination, and retrieves multiple corresponding typical basic products and their derivative product cases, and performs feature set fusion based on the coupling relationship between ICs to generate a combined initial reference case as the retrieved case; the typical basic product is a pre-selected standardized product representing a type of functional type, and the derivative product is a derivative variant formed on the basis of the typical basic product by adjusting the three-layer protection design parameters to adapt to the EMC standard system and its level in different application scenarios (including different domains and different product types in the same domain); the retrieved case includes at least: (a) the verified EMC design feature set of the derivative product that has successfully met the corresponding EMC standard system in the target application scenario; (b) the verified mapping relationship of the typical basic product and its derivative product in different application scenarios, and the mapping relationship records the quantitative correspondence between the adjustment of design parameters and the change of EMC standard level; S3. Based on the IC combination information, retrieve the corresponding IC intrinsic characteristic data and system coupling prediction data from the IC-level EMC data assets and system-level EMC data assets, and combine them with the verified EMC design feature set in the typical basic products and their derivative product cases to construct the initial EMC design concept of the product. The initial EMC design concept of the product includes at least one or more of the following: IC intrinsic characteristic data, system coupling prediction data, measure sensitivity data, macroscopic law data, and at least one of the following initial schemes: shell structure initial scheme, cable routing initial scheme, and PCB layout initial scheme borrowed from the verified EMC design feature set. The initial EMC design concept of the product is used to characterize the electromagnetic intrinsic characteristics and initial design constraints of the target product. S4. Retrieve the essential features of the EMC standard system that match the target field from the multi-domain EMC standard system database. The essential features of the EMC standard system are used to characterize the deep essence of the EMC standard system in the field, and include at least the quantitative feature set of the EMC standard system in the field, the quantitative feature set of non-EMC attribute constraints in the field, and the quantitative difference value between the field and the general reference benchmark. S5. Construct an EMC domain adaptation model, using the initial EMC design concept of the product and the essential characteristics of the EMC standard system as model input variables. Based on the verified mapping relationship stored in the typical basic product and its derivative product cases, establish an adaptive mapping relationship of essential parameters between the two. The adaptive mapping relationship of essential parameters includes quantitatively correcting the parameters in the initial EMC design concept of the product according to the quantitative difference value in the essential characteristics of the EMC standard system, generating design rule parameters that match the target application scenario. The basis for the quantitative correction comes from the correspondence between the design parameter adjustment amount and the change of EMC standard level recorded in the verified mapping relationship. S6. Based on the adaptive mapping relationship of the essential parameters, generate at least one EMC domain-specific design rule applicable to the target domain. Each design rule includes constraint object, constraint type, target value or range, rule source metadata, design complexity assessment indication, and protection layer adjustment priority. The priority is divided into mandatory adjustment layer, suggested adjustment layer, and alternative layer, and includes quantification of the cost impact and cycle impact of each layer adjustment. S7. Store the EMC domain-specific design rules in the form of structured data assets, and assign multi-dimensional searchable tags to the structured data assets. The multi-dimensional searchable tags include at least one of the following: domain tag, function type tag, IC combination tag, product type tag, function module tag, rule type tag, constraint type tag, and directionality tag.

2. The method according to claim 1, characterized in that, The multi-domain EMC adaptation case library is constructed in the following ways: At least two typical basic products representing different functional types are pre-selected, and the functional types include at least one of the following: power supply, control, high-speed signal, data acquisition, radio frequency, interface, isolation, clock, storage, and sensor. For each typical basic product, while keeping its core functions unchanged, by adjusting at least one layer of protection design among IC-level protection, PCB-level protection, and system-level external protection, EMC standard systems and their derivative products adapted to different application scenarios (including different fields and different product types within the same field) are formed. Record the three-layer protection design parameters of each derivative product and the EMC standard system level it meets, forming a verified EMC design feature set; By comparing the differences in design parameters and the corresponding differences in EMC standard system levels among different derivative products of the same typical basic product, a verified mapping relationship is extracted. The mapping relationship includes a quantitative correspondence between the adjustment of design parameters and the change of EMC standard level. The typical basic products, derivative products, verified EMC design feature sets, and verified mapping relationships are associated and stored to form the multi-domain EMC adaptation case library.

3. The method according to claim 1, characterized in that, The multi-domain EMC standards database is constructed by pre-analyzing EMC standards from at least two different domains, and the parsing includes: Extract a list of test items for each field, including at least one of conducted emission, radiated emission, conducted immunity, radiated immunity, transient immunity, transient emission, and special test items; Extract the frequency range, limit curves, and level requirements for each test item; test setup requirements, test equipment configuration, and judgment criteria; level classification of each test item; quantitative difference values ​​between levels; and essential test characteristics. The essential test characteristics are used to characterize the type of electromagnetic phenomenon verified by the test item and the corresponding type of protective measures. Extract non-EMC attribute constraint parameters from various fields, including at least one of the following: operating temperature range, vibration level, and reliability level; Establish a database of quantitative difference values ​​between various fields and a general reference benchmark. The quantitative difference values ​​include at least one of the following: limit difference at the same frequency point, frequency range offset, immunity level difference, constraint parameter scaling factor, and quantitative difference values ​​of the same test item at different levels.

4. The method according to claim 1, characterized in that, The essential characteristics of the EMC standard system mentioned in step S4 also include: priority weights for non-EMC attribute constraints in this field, which are predefined according to the characteristics of the field and used to perform weighted correction on multiple non-EMC attribute constraints in the essential parameter adaptive mapping relationship in step S5, so as to prioritize the satisfaction of constraints with higher weights; and the product design target parameters include at least one of cost priority, volume priority, weight priority, performance priority, and cycle priority, which are used as optimization guidance to perform weighted adjustment on the design rule parameters in the essential parameter adaptive mapping relationship.

5. The method according to claim 1, characterized in that, The essential characteristics of the EMC standard system mentioned in step S4 also include: the adaptability of this field to IC changes, wherein the adaptability of the IC changes includes the influence coefficient of the essential characteristics of the EMC standard system on the intrinsic characteristics of the replacement IC when the IC model in the IC combination information is changed to a replacement IC; The influence coefficient is calculated based on the difference between the intrinsic characteristic data of the alternative IC and the intrinsic characteristic data of the original IC, and is used to correct the parameter adjustment amount in the intrinsic parameter adaptive mapping relationship in step S5. The IC change adaptability features also include historical application case data of the alternative IC in the target domain. The historical application case data comes from a multi-domain EMC adaptation case library stored in the user's local design knowledge base and is used to evaluate the confidence level of the design rules after the IC change.

6. The method according to claim 1, characterized in that, The construction of the EMC domain adaptation model also includes: retrieving adaptation cases from the multi-domain EMC adaptation case library based on the target domain identifier. These adaptation cases are formed by iterating typical basic products through different application scenario standard systems. The adaptation cases include the design rules of the basic products in different application scenarios, the corresponding EMC test results, and the level corresponding to each test item and the test results under that level. The intrinsic parameter adaptive mapping relationship is further calibrated based on the design rules and test results in the adaptation cases to optimize the correction accuracy of the quantitative difference value and establish a mapping relationship between the same test item level in different application scenarios and a quantitative model of the differences between levels; and the directional label includes a protection level indication, which includes at least one of system-level external protection, PCB-level protection, and IC-level protection. The protection level indication is used to characterize the EMC design levels that need to be prioritized to meet the EMC requirements of the target domain.

7. The method according to claim 4, characterized in that, The EMC-specific design rules mentioned in step S6 also include: The design rule satisfies a list of non-EMC attribute constraints, which includes at least one of temperature adaptability constraints and reliability level constraints, and the priority weight of each constraint in the list of non-EMC attribute constraints is determined according to the priority weight of the corresponding non-EMC attribute constraint in claim 4. The expected confidence level of the design rule in the target domain is calculated based on the data completeness of the essential characteristics of the EMC standard system, the sample size of the quantitative data, and the similarity between the target domain and historical cases in the multi-domain EMC adaptation case library. The expected confidence level is divided into three levels: high, medium, and low, which are used to characterize the adoptability of the design rule in the target domain.

8. The method according to claim 1, characterized in that, Also includes: EMC domain adaptive testing strategy generation steps: Based on the differences in test items and limits in the essential characteristics of the EMC standard system, generate a test priority ranking for the target domain; Based on the test priority and the test method characteristics of the target domain, a recommended sequence of test methods is generated; Based on the limit curve parameters of the target domain, the initial EMC design concept of the product, and the essential test characteristics in the essential characteristics of the EMC standard system, a predictive model is generated to estimate the pass probability of the target product in each test item; based on the differences between the essential test characteristics and the initial EMC design concept of the product, supplementary design rule suggestions are generated. And automatic verification steps: When generating EMC-specific design rules, the system automatically verifies whether the recommended devices or solutions meet the non-EMC attribute constraints of the target domain. If there are conflicts, it automatically retrieves alternative solutions that meet the constraints and outputs conflict flags and alternative suggestions. The EMC domain rule adaptive evolution steps are as follows: Based on user adoption of design rules and subsequent EMC test feedback, a rule application effect database is constructed; based on the rule application effect database, the accuracy of the design rules is calculated; when the accuracy is lower than a preset threshold, the system automatically triggers the rule optimization process: first, deviation cases are analyzed to identify the key factors causing the deviations; then, based on the key factors, the quantitative difference values ​​in the essential characteristics of the EMC standard system are automatically updated, and the updated rules and corresponding multi-domain EMC adaptation cases are stored in the user's local design knowledge base. The design rule file generation process includes: After generating EMC-specific design rules, the design rule file is automatically generated and supports visual preview, one-click import, and highlighting of constrained ICs, networks, and areas on the PCB layout interface.

9. The method according to claim 1, characterized in that, It also includes a cross-domain reuse adaptability comparison step: When the target domain differs from the domain of historical design cases stored in the user's local design knowledge base, the system calls the operation sequence and state snapshot data assets of the historical design cases, generates cross-domain reuse adaptive comparison results, and stores them as data assets. The cross-domain reuse adaptive comparison results include at least the following: A quantitative comparison of the target domain and the historical domain in terms of the essential characteristics of the EMC standard system; Feasibility assessment of the reuse of design rules from the historical design cases in the target domain; If reuse is deemed feasible, provide the parameters and adjustment amounts that need to be adjusted for the design rules, and provide suggestions for the adjusted rule parameters; If reuse is deemed not feasible, alternative design rules and expected effects will be provided.

10. The method according to claim 1, characterized in that, The method is applied to an EMC intelligent design instrument as a domain adaptation module of the instrument; the instrument integrates the multi-domain EMC standard system database and the multi-domain EMC adaptation case library; or, the method is implemented as an independent computer software product or EMC design software plug-in.

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