A circuit board electrical performance quality testing device

Abstract

This invention discloses a circuit board electrical performance quality testing device, relating to the field of electrical performance testing. It includes a device rack, a circuit board under test (TBT) mounted on the device rack, and a power plug. The device rack is equipped with a testing component for testing the electrical performance of the TDT circuit board, and the testing component includes several flexible probes. The device rack also includes a driving mechanism for synchronously driving the power plug and the flexible probes, so that while the power plug is inserted into the power supply interface of the TDT circuit board, the flexible probes simultaneously contact the pins of the TDT circuit board. The driving mechanism adopts a purely mechanical linkage structure, synchronously driving the power plug and flexible probes through a sliding sleeve, achieving simultaneous insertion of the power plug into the power supply interface of the TDT circuit board and contact between the flexible probes and the pins, reducing operation steps and labor intensity.

Description

Technical Field

[0001] This invention relates to the field of electrical performance testing technology, and more specifically to a circuit board electrical performance quality testing device. Background Technology

[0002] In the process of circuit board manufacturing, electrical performance quality testing is a key step to ensure product qualification. Its core requirement is to accurately test the conductivity, insulation, resistance and capacitance parameters of the circuit board to prevent unqualified products from entering the market.

[0003] The power supply and pin detection actions of the existing testing device are independent of each other, requiring the operator to complete them step by step. First, the power plug is manually inserted into the power supply interface of the circuit board under test, and then the probe assembly is operated separately to make the probe contact the pin of the circuit board. The operation process is cumbersome and labor-intensive.

[0004] Secondly, existing drive structures mostly adopt electric, pneumatic or hydraulic drive methods, which require external power supply, air supply and other auxiliary equipment. Not only are they complex in structure and high in manufacturing cost, but they also have a high failure rate and poor adaptability, making it difficult to adapt to the complex working environment of the workshop with a lot of dust and interference. At the same time, the subsequent maintenance cost is high, which is not conducive to the long-term stable operation of batch production line testing operations. Summary of the Invention

[0005] The purpose of this invention is to provide a circuit board electrical performance quality testing device to solve the above-mentioned problems, as detailed below.

[0006] To achieve the above objectives, the present invention provides the following technical solution: The present invention provides a circuit board electrical performance quality testing device, comprising an equipment rack, a circuit board to be tested mounted on the equipment rack, and a power plug; The equipment rack is equipped with a testing component for testing the electrical performance of the circuit board under test, and the testing component includes several flexible probes. The device rack is also equipped with a drive mechanism for synchronously driving the power plug and the flexible probe, so that while the power plug is plugged into the power supply interface of the circuit board under test, the flexible probe makes contact with the pins of the circuit board under test.

[0007] Preferably, the equipment frame includes a base plate, on which a limit frame is connected by multiple guide posts, and the circuit board to be tested is disposed within the limit frame.

[0008] Preferably, the limiting frame has a notch.

[0009] Preferably, the testing component includes a connecting plate and a PCB electrical tester. The connecting plate is slidably connected along the length of the guide post, and the connecting plate is provided with a plurality of flexible probes corresponding to the pins of the circuit board to be tested. The PCB electrical tester is disposed on the base plate.

[0010] Preferably, there are two connecting plates, and the flexible probes on the two connecting plates correspond to the two sides of the circuit board to be tested, respectively.

[0011] Preferably, the drive mechanism includes a guide rod connected to the equipment frame, a sliding sleeve horizontally slidably connected to the guide rod, and a connecting rod hinged between the sliding sleeve and the connecting plate, with the two connecting rods symmetrically distributed about the sliding sleeve as the central axis.

[0012] Preferably, one end of the connecting rod is hinged to the sliding sleeve, and the other end is hinged to a fixing plate, which is connected to the connecting plate.

[0013] Preferably, the sliding sleeve is provided with a handle, and a tension spring is provided between the sliding sleeve and the guide rod for resetting the sliding sleeve. The sliding sleeve is connected to a power plug through a clamp.

[0014] Preferably, the sliding sleeve has a slot, and the guide rod is provided with a snap-fit ​​component, which is used to fix the position of the sliding sleeve in conjunction with the slot. When the snap-fit ​​component snaps into the slot, the power plug is plugged into the power supply interface of the circuit board under test, and the flexible probe contacts the pins of the circuit board under test.

[0015] Preferably, the snap-fit ​​assembly includes a limiting block disposed on the guide rod, a snap-fit ​​tooth rotatably connected to the limiting block and capable of snapping into a snap-fit ​​groove, a torsion spring disposed between the snap-fit ​​tooth and the limiting block, the two ends of the torsion spring being connected to the limiting block and the snap-fit ​​tooth respectively, and a rocker plate disposed on the snap-fit ​​tooth.

[0016] The beneficial effects are: 1. The drive mechanism adopts a purely mechanical linkage structure, which synchronously drives the power plug and flexible probe through the sliding sleeve, realizing the synchronous completion of the power plug being plugged into the power supply interface of the circuit board under test and the flexible probe contacting the pin, reducing operation steps and reducing labor intensity. 2. The snap-fit ​​assembly and the slot work together to automatically lock the testing station, ensuring the stability of the component's posture during testing and avoiding testing distortion caused by external interference; the tension spring enables automatic reset after testing, eliminating the need for manual operation and simplifying the operation process; 3. The whole system adopts mechanical linkage, which does not require external electrical control, pneumatic, hydraulic and other auxiliary equipment. It has a simple structure, low manufacturing cost, and is not limited by the power supply and air supply of the workshop. It is suitable for complex working environments with high dust and interference. At the same time, it has fewer parts, reliable transmission structure, low subsequent maintenance cost, and can operate stably for a long time to meet the needs of batch production line testing. Attached Figure Description

[0017] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0018] Figure 1 This is a perspective view of the present invention; Figure 2 This is a front view of the present invention; Figure 3 This is the left view of the present invention; Figure 4 This is a perspective view of the present invention; Figure 5 This is a perspective view of the drive mechanism of the present invention; Figure 6 This is a perspective view of the limiting frame of the present invention; Figure 7 This is a perspective view of the snap-fit ​​assembly of the present invention; Figure 8 This is a perspective view of the equipment frame portion of the present invention.

[0019] The annotations in the attached figures are explained as follows: Equipment frame; 101, base plate; 102, guide column; 103, limiting frame; 1031, notch; 2, detection assembly; 201, connecting plate; 202, flexible probe; 203, PCB electrical tester; 3, circuit board under test; 4, power plug; 5, drive mechanism; 501, guide rod; 502, sliding sleeve; 503, tension spring; 504, handle; 505, fixing plate; 506, connecting rod; 507, snap-fit ​​assembly; 508, clamp; 509, slot; 6, limiting block; 7, locking teeth; 8, rocker; 9, torsion spring. Detailed Implementation

[0020] To make the objectives, technical solutions, and advantages of this invention clearer, the technical solutions of this invention will be described in detail below. Obviously, the described embodiments are merely some embodiments of this invention, and not all embodiments. Based on the embodiments of this invention, all other implementation methods obtained by those skilled in the art without creative effort are within the scope of protection of this invention.

[0021] See Figures 1-8As shown, the present invention provides a circuit board electrical performance quality testing device, which specifically addresses the industry pain points in the existing circuit board electrical inspection process, such as process dispersion, large alignment deviation, easy damage to board edge pins, poor detection consistency, and low batch inspection efficiency caused by manual step-by-step power supply insertion and removal and individual alignment probes. It is suitable for use in all working conditions of large-volume PCB single boards, double-sided circuit boards, and surface mount module circuit boards for factory full inspection, rework testing, and sampling reliability verification. It includes a device rack 1, a circuit board to be tested 3 set on the device rack 1, and a power plug 4. The equipment rack 1 is equipped with a testing component 2 for testing the electrical performance of the circuit board 3 under test, and the testing component 2 includes several flexible probes 202. The device rack 1 is also equipped with a drive mechanism 5, which is used to synchronously drive the power plug 4 and the flexible probe 202, so that while the power plug 4 is plugged into the power supply interface of the circuit board under test 3, the flexible probe 202 makes contact with the pins of the circuit board under test 3.

[0022] See Figure 8 As an optional embodiment, the equipment frame 1 includes a base plate 101, on which a limiting frame 103 is connected by a plurality of guide posts 102. The guide posts 102 are vertically arranged, and the circuit board 3 to be tested is arranged inside the limiting frame 103.

[0023] Specifically, the limiting frame 103 adopts a contoured inner frame limiting structure, accurately positioning the outer contour edge, limiting the circuit board's front-to-back, left-to-right, tilting, and sliding, ensuring that the board position is completely aligned each time, achieving controllable tooling repeatability positioning accuracy, and avoiding probe misalignment and pin skew caused by board position offset from the source.

[0024] Furthermore, a notch 1031 is provided on the limiting frame 103.

[0025] Specifically, the 1031 notch is an integrated obstacle avoidance operation structure, forming an unobstructed operation area for manual insertion, removal and placement of circuit boards, avoiding the enclosed frame from pinching hands, jamming boards, and scratching the solder mask and gold fingers of the circuit board; at the same time, it reserves external leads, temperature measuring accessories, and auxiliary observation channels, making it convenient for operators to visually confirm whether the circuit board is placed flat, whether it is stuck at the edge, or whether it is placed crookedly, intercepting abnormal board placement in advance, and avoiding invalid detection and damage to the board by false detection.

[0026] See Figure 2 and Figure 4As an optional embodiment, the detection component 2 includes a connecting plate 201 and a PCB electrical tester 203. The connecting plate 201 is slidably connected along the length of the guide post 102. The connecting plate 201 is provided with a plurality of flexible probes 202 corresponding to the pins of the circuit board 3 under test. The PCB electrical tester 203 is disposed on the base plate 101. The flexible probes 202 can improve the fault tolerance of the detection and can adapt to circuit boards of different thicknesses. The flexible probes 202 are electrically connected to the PCB electrical tester 203 through flexible ribbon cables.

[0027] Optionally, there are two connecting plates 201, and the flexible probes 202 on the two connecting plates 201 correspond to the two sides of the circuit board 3 under test, respectively.

[0028] This method enables simultaneous double-sided probing of circuit boards without manual flipping, secondary alignment, or secondary power-on testing. It is suitable for full-coverage testing of complex circuit boards with double-sided wiring, double-sided surface mount, and double-sided pin headers, greatly expanding the range of tooling compatibility while avoiding the risks of board surface scratches and component knock-offs caused by multiple flipping. In addition, the two sets of flexible probes 202 simultaneously contact both sides of the circuit board 3 under test, which can clamp it and prevent the circuit board 3 under test from moving when in contact.

[0029] It should be noted that the PCB electrical tester 203 is existing technology, and its specific model, specifications and working principle do not constitute the protection points of this application. This application does not limit its specific type. Any PCB electrical tester that can realize the functions of acquiring, analyzing and judging the electrical performance signals of the circuit board under test 3 can be used with this device.

[0030] See Figure 5 and Figure 7 As an optional embodiment, the drive mechanism 5 includes a guide rod 501 connected to the equipment frame 1, a sliding sleeve 502 is horizontally slidably connected to the guide rod 501, and a connecting rod 506 is hinged between the sliding sleeve 502 and the connecting plate 201. The two connecting rods 506 are symmetrically distributed about the sliding sleeve 502 as the central axis.

[0031] The connecting rod 506 adopts an oblique hinge transmission layout, which accurately converts the horizontal push-pull motion into the vertical parallel pressing motion, with no dead angle of power and no transmission play; the symmetrical double rod layout realizes the balance of force on the left and right sides, eliminates the uneven wear and jamming on one side, and ensures that the two connecting plates press down synchronously and in parallel, with the pressing force evenly distributed throughout the entire area.

[0032] Furthermore, one end of the connecting rod 506 is hinged to the sliding sleeve 502, and the other end is hinged to a fixing plate 505, which is connected to the connecting plate 201.

[0033] The fixed plate 505 serves as a stress-reinforcing transition mounting base, distributing the concentrated load of the connecting rod, preventing local stress cracking, deformation, and warping of the connecting plate, and improving the structural durability and fatigue life; at the same time, it fixes the hinge point, ensuring that the transmission angle remains constant and the transmission efficiency does not decrease over long-term use.

[0034] Furthermore, a handle 504 is provided on the sliding sleeve 502, and a tension spring 503 is provided between the sliding sleeve 502 and the guide rod 501 for resetting the sliding sleeve 502. The sliding sleeve 502 is connected to a power plug 4 through a clamp 508.

[0035] The 504 handle features an ergonomic, non-slip design, allowing for easy one-handed operation of push-pull locking, saving effort and reducing fatigue, making it suitable for long-term assembly line work. The 503 tension spring stores energy throughout the process and automatically rebounds, automatically resetting and disengaging pins upon release after testing, eliminating the need for manual retraction and reducing single-cycle operations, thus improving production efficiency. The 508 clamp allows for fine-tuning of the clamping center and tilt angle, enabling quick replacement of different power plug specifications and adapting to different board end interface position deviations, ensuring smooth insertion without pin jamming or forced insertion that could damage the socket.

[0036] See Figure 5 and Figure 7 The sliding sleeve 502 has a slot 509, and the guide rod 501 is provided with a snap-fit ​​component 507, which is used to fix the position of the sliding sleeve 502 in conjunction with the slot 509. When the snap-fit ​​component 507 snaps into the slot 509, the power plug 4 is plugged into the power supply interface of the circuit board 3 under test, and the flexible probe 202 is in contact with the pins of the circuit board 3 under test.

[0037] The card slot 509 and the card-connecting assembly form a mechanical self-locking station. It automatically locks when the preset standard detection stroke is reached, preventing loosening and displacement caused by operator hand tremors, external force contact, or equipment vibration. The locking position is the optimal working point designed to ensure that the insertion depth and probe pressing stroke are completely consistent every time, and the detection conditions are highly uniform.

[0038] In some optional embodiments, the snap-fit ​​assembly 507 includes a limiting block 6 disposed on the guide rod 501, a snap-fit ​​tooth 7 rotatably connected to the limiting block 6, and the snap-fit ​​tooth 7 can snap-fit ​​with the snap-fit ​​groove 509. A torsion spring 9 is disposed between the snap-fit ​​tooth 7 and the limiting block 6, and the two ends of the torsion spring 9 are respectively connected to the limiting block 6 and the snap-fit ​​tooth 7. A rocker plate 8 is disposed on the snap-fit ​​tooth 7.

[0039] The 7-tooth beveled guide and right-angle locking structure ensure smooth insertion and reliable locking, preventing tooth skipping and disengagement. The torsion spring 9 continuously pre-tightens and stores energy, automatically engaging and locking without manual assistance. It features a passive mechanical self-locking mechanism, eliminating the need for electronic control or induction assistance. The rocker 8 is an external, labor-saving prying structure that allows for quick single-point unlocking and one-button release of all linkage mechanisms.

[0040] Detailed operating steps for drive mechanism 5: By applying a horizontal forward thrust to the sliding sleeve 502 through the handle 504, the sliding sleeve 502 slides horizontally forward along the guide rod 501. At this time, the tension spring 503 is stretched and stores energy. While the sliding sleeve 502 slides forward, it simultaneously drives two symmetrically distributed connecting rods 506 to rotate around the hinge point at the end of the sliding sleeve 502. The other end of the connecting rod 506 pushes the connecting plate 201 to make a vertical linear movement along the guide post 102 towards the circuit board 3 under test through the fixing plate 505, thereby driving the flexible probe 202 on the connecting plate 201 to move closer to the pin of the circuit board 3 under test. At the same time, the sliding sleeve 502 drives the power plug 4 to move forward horizontally synchronously through the clamp 508, moving closer to the power supply interface of the circuit board 3 under test. When the sliding sleeve 502 slides to the preset detection position, the locking teeth 7 of the locking component 507 automatically engage with the slot 509 of the sliding sleeve 502, thereby locking the position of the sliding sleeve 502. At this time, the power plug 4 is just connected to the power supply interface of the circuit board 3 under test, and the flexible probe 202 is just in close contact with the pin of the circuit board 3 under test, completing the precise positioning of the detection station. After the detection is completed, the operator moves the rocker 8, causing the locking teeth 7 to disengage from the slot 509, releasing the lock. The tension spring 503 releases its elastic potential energy, causing the sliding sleeve 502 to return to its horizontal position along the guide rod 501. At the same time as the sliding sleeve 502 returns to its position, the connecting plate 201 is pulled upward by the connecting rod 506, causing the flexible probe 202 to separate from the pin. Simultaneously, the clamp 508 causes the power plug 4 to separate from the power supply interface, completing the entire linkage cycle.

[0041] Working principle of the invention: The circuit board under test 3 is placed on the limiting frame 103. The limiting frame 103 can support and limit the circuit board under test 3. The power plug 4 keeps supplying power. The power plug 4 is moved by the driving mechanism 5 to connect the power plug 4 to the circuit board under test 3 and power the circuit board under test 3. At the same time, the driving mechanism 5 can also drive the flexible probe 202 of the detection component 2 to contact and hold with the pins of the circuit board under test 3, so that the detection component 2 can detect the circuit board under test 3.

[0042] The above description is merely a specific embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the technical scope disclosed in the present invention should be included within the scope of protection of the present invention. Therefore, the scope of protection of the present invention should be determined by the scope of the claims.

Claims

1. A circuit board electrical performance quality testing apparatus, characterized by: Includes a device rack (1), a circuit board to be tested (3) mounted on the device rack (1), and a power plug (4); The equipment rack (1) is provided with a detection component (2) for detecting the electrical performance of the circuit board (3) under test, and the detection component (2) includes a number of flexible probes (202). The device rack (1) is also provided with a drive mechanism (5) for synchronously driving the power plug (4) and the flexible probe (202), so that while the power plug (4) is plugged into the power supply interface of the circuit board (3) under test, the flexible probe (202) contacts the pins of the circuit board (3) under test.

2. The circuit board electrical performance quality testing apparatus of claim 1, wherein: The equipment frame (1) includes a base plate (101), and a limiting frame (103) is connected to the base plate (101) by a plurality of guide posts (102). The limiting frame (103) contains a circuit board (3) to be tested.

3. The circuit board electrical performance quality testing device according to claim 2, characterized in that: The limiting frame (103) has a notch (1031).

4. The circuit board electrical performance quality testing device according to claim 2, characterized in that: The detection component (2) includes a connecting plate (201) and a PCB electrical tester (203). The connecting plate (201) is slidably connected along the length of the guide post (102). The connecting plate (201) is provided with a plurality of flexible probes (202) corresponding to the pins of the circuit board (3) to be tested. The PCB electrical tester (203) is located on the base plate (101).

5. The circuit board electrical performance quality testing device according to claim 4, characterized in that: There are two connecting plates (201), and the flexible probes (202) on the two connecting plates (201) correspond to the two sides of the circuit board (3) to be tested.

6. The circuit board electrical performance quality testing device according to claim 5, characterized in that: The drive mechanism (5) includes a guide rod (501) connected to the equipment frame (1), a sliding sleeve (502) is horizontally slidably connected to the guide rod (501), and a connecting rod (506) is hinged between the sliding sleeve (502) and the connecting plate (201). The two connecting rods (506) are symmetrically distributed about the sliding sleeve (502) as the central axis.

7. The circuit board electrical performance quality testing device according to claim 6, characterized in that: One end of the connecting rod (506) is hinged to the sliding sleeve (502), and the other end is hinged to a fixing plate (505). The fixing plate (505) is connected to the connecting plate (201).

8. The circuit board electrical performance quality testing device according to claim 6, characterized in that: The sliding sleeve (502) is provided with a handle (504), and a tension spring (503) is provided between the sliding sleeve (502) and the guide rod (501) for resetting the sliding sleeve (502). The sliding sleeve (502) is connected to a power plug (4) through a clamp (508).

9. The circuit board electrical performance quality testing device according to claim 6, characterized in that: The sliding sleeve (502) has a slot (509) and the guide rod (501) is provided with a snap-fit ​​component (507) for fixing the position of the sliding sleeve (502) in conjunction with the slot (509). When the snap-fit ​​component (507) snaps into the slot (509), the power plug (4) is plugged into the power supply interface of the circuit board under test (3) and the flexible probe (202) is in contact with the pins of the circuit board under test (3).

10. The circuit board electrical performance quality testing device according to claim 9, characterized in that: The snap-fit ​​assembly (507) includes a limiting block (6) disposed on a guide rod (501), a snap-fit ​​tooth (7) is rotatably connected to the limiting block (6), and the snap-fit ​​tooth (7) can snap into the snap-fit ​​groove (509). A torsion spring (9) is disposed between the snap-fit ​​tooth (7) and the limiting block (6), and the two ends of the torsion spring (9) are respectively connected to the limiting block (6) and the snap-fit ​​tooth (7). A rocker plate (8) is disposed on the snap-fit ​​tooth (7).

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