A test machine for final testing of memory chips

Abstract

This invention relates to the field of chip manufacturing technology and discloses a testing machine for the final testing of memory chips. The machine includes a housing with a door on one side. A testing device body is fixedly installed inside the housing. Two sets of base plates, which cooperate with the testing device body, are fixedly installed on the bottom surface of the housing. Arc-shaped first guide plates, matching the base plates, are fixedly installed on both sides of each base plate. Each set of first guide plates has a matching second guide plate. A second electric telescopic rod is fixedly installed at the top of the housing. A top plate is fixedly installed at the output end of the second electric telescopic rod. A substrate is rotatably mounted on the top plate, and a motor that drives the substrate to rotate is installed on the top plate. The beneficial effects of this invention are: the memory chip is constantly swept by filtered air as it moves through the channel towards the testing device body, keeping the contact area between the memory chip and the testing device body clean, thereby ensuring the accuracy of the test results.

Description

Technical Field

[0001] This invention relates to the field of chip manufacturing technology, and more specifically to a testing machine for the final testing of memory chips. Background Technology

[0002] Memory chips are the specific application of the concept of embedded system chips in the storage industry. After the memory chips are manufactured, they need to be tested by testing equipment to see if they can be used normally.

[0003] Currently, memory chip testing equipment is not convenient for dust removal in the working environment, causing important components in the equipment to easily accumulate dust, making it inconvenient to use. To address the above technical problem, the patent with publication number CN220340912U cleans the equipment by extracting air. After each cleaning, the sensor cabinet door needs to be reopened to allow the memory chip to enter the equipment. When the cabinet door is opened, outside air carries impurities into the equipment, reducing the cleaning effect and affecting the accuracy of subsequent testing. Summary of the Invention

[0004] The purpose of this invention is to address the shortcomings of existing technologies by providing a device for testing memory chips, thereby achieving accurate test results.

[0005] The objective of this invention can be achieved through the following technical solutions: A test bench for final testing of memory chips includes a housing with a cabinet door on one side. A test device body is fixedly installed inside the housing. Two sets of base plates that cooperate with the test device body are fixedly installed on the bottom surface of the housing. Arc-shaped first guide plates that match the base plates are fixedly installed on both sides of the base plates. A second guide plate with a matching shape is provided on each set of first guide plates. A second electric telescopic rod is fixedly installed at the top of the housing. A top plate is fixedly installed at the output end of the second electric telescopic rod. A base plate is rotatably installed on the top plate, and a motor that drives the base plate to rotate is provided on the top plate. Multiple sets of adsorption tubes arranged in a circular array around the rotation axis of the base plate are fixedly installed on the base plate. Suction cups are fixedly installed at the ends of the adsorption tubes. The multiple sets of adsorption tubes are connected to the negative pressure device body fixedly installed on the base plate. The multiple sets of adsorption tubes are jointly fixedly installed on an annular sealing plate. A blowing chamber is fixedly installed inside the bottom plate. Multiple sets of blowing pipes are connected to the blowing chamber. The blowing pipes blow towards the opening of the channel. The blowing chamber is connected to a first fan fixedly installed inside the housing through a first air supply pipe.

[0006] As a further aspect of the present invention: the base plate is arc-shaped and its cross-section is U-shaped with the opening facing upward. The base plate is distributed on both sides of the test device body and the end of the base plate is in contact with the side of the test device body. The upper surface of the base plate is flush with the upper surface of the test device body.

[0007] As a further embodiment of the present invention: a first mounting plate is fixedly installed on the first guide plate, and multiple sets of spaced telescopic rods are fixedly installed on the first mounting plate. A second mounting plate is fixedly installed on the end of the telescopic rods away from the first mounting plate. The second mounting plate is fixedly connected to the corresponding second guide plate. A spring distributed around the telescopic rod is fixedly installed on the first mounting plate, and the end of the spring away from the first mounting plate is fixedly connected to the second mounting plate.

[0008] As a further embodiment of the present invention: the sealing plate, the first guide plate, the second guide plate, and the bottom plate form a channel, and the suction cup moves within the channel.

[0009] As a further aspect of the present invention: gears are fixedly installed on both the output end of the motor and the rotating shaft of the substrate, and the motor drives the substrate to rotate through the meshing gears.

[0010] As a further embodiment of the present invention: two sets of feeding conveyor belts and discharging conveyor belts located at the corresponding ends of the bottom plate are rotatably installed inside the housing, and both the feeding conveyor belts and the discharging conveyor belts extend out of the housing.

[0011] As a further embodiment of the present invention: two sets of second air supply pipes are fixedly installed in the middle of the second guide plate. The second air supply pipes penetrate the second guide plate and the two sets of second air supply pipes are located on both sides of the detection position. The second air supply pipes are connected to the second fan fixedly installed in the housing.

[0012] As a further embodiment of the present invention: a first electric telescopic rod is fixedly installed on the bottom surface of the inner shell, a horizontal plate is fixedly installed on the output end of the first electric telescopic rod, and baffles are fixedly installed on both ends of the horizontal plate, with one side of the baffle being flush with the end face of the corresponding bottom plate.

[0013] The beneficial effects of this invention are: (1) In this invention, the sealing plate, the first guide plate, the second guide plate, the base plate and the main body of the testing device form an arc-shaped channel. When the memory chip moves towards the main body of the testing device in the channel, it can always be blown by filtered air. The air blowing keeps the contact point between the memory chip and the main body of the testing device clean, thereby ensuring the accuracy of the test results. After the test is completed, the memory chip can still be blown by air when it moves in the channel, ensuring the cleanliness of the memory chip itself. The air in the channel continues to flow to the outside, so that there is always air flowing to the outside at the channel opening, thereby preventing outside air and impurities from flowing into the channel, further improving the cleanliness of the channel, thereby ensuring the accuracy of the test results.

[0014] (2) In this invention, the filtered air is delivered to the middle of the channel by the second fan, and then the air flows to both ends of the channel, thereby further restricting the air flow direction in the channel and increasing the air flow speed and flow rate at the channel outlet, thereby further improving the cleaning effect on the memory chip and the interception effect at the channel outlet.

[0015] (3) In this invention, when the memory chip is tested, a gap is made between the sealing plate and the second guide plate, and the end of the channel is sealed by the baffle. At this time, the air in the channel will flow out from the gap between the sealing plate and the second guide plate. The high-speed airflow will blow away the friction surface between the sealing plate and the second guide plate, preventing impurities generated by friction from entering the channel, and further ensuring the test effect of the memory chip. Attached Figure Description

[0016] The invention will now be further described with reference to the accompanying drawings.

[0017] Figure 1 This is a schematic diagram of the overall structure of the present invention.

[0018] Figure 2 This is a schematic diagram of the internal structure of the shell in this invention.

[0019] Figure 3 This is a schematic diagram of the structure of the closed plate in this invention.

[0020] Figure 4 This is a schematic diagram of the baffle structure in this invention.

[0021] Figure 5 This is a schematic diagram of the structure of the base plate in this invention.

[0022] Figure 6 yes Figure 5 Enlarged diagram of point A in the middle.

[0023] In the diagram: 1. Shell; 2. Cabinet door; 3. Test device body; 4. Base plate; 5. First guide plate; 6. Second guide plate; 7. Air chamber; 8. Air pipe; 9. First fan; 10. First air supply pipe; 11. Second fan; 12. Second air supply pipe; 13. First mounting plate; 14. Telescopic rod; 15. Spring; 16. Second mounting plate; 17. Feed conveyor belt; 18. Discharge conveyor belt; 19. First electric telescopic rod; 20. Horizontal plate; 21. Baffle; 22. Second electric telescopic rod; 23. Top plate; 24. Base plate; 25. Motor; 26. Adsorption tube; 27. Suction cup; 28. Sealing plate; 29. ​​Negative pressure equipment body. Detailed Implementation

[0024] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0025] Please see Figures 1-6 As shown, this invention is a testing machine for final testing of memory chips, including a housing 1. A cabinet door 2 is provided on one side of the housing 1. A testing device body 3 is fixedly installed inside the housing 1. Two sets of base plates 4, which cooperate with the testing device body 3, are fixedly installed on the bottom surface of the housing 1. The base plates 4 are arc-shaped with an upward-opening U-shaped cross-section. The base plates 4 are distributed on both sides of the testing device body 3, and the ends of the base plates 4 contact the sides of the testing device body 3. The upper surface of the base plates 4 is flush with the upper surface of the testing device body 3. Arc-shaped first guide plates 5, matching the base plates 4, are fixedly installed on both sides of the base plates 4. A guide plate 5 contacts the upper surface of the test device body 3. Each set of first guide plates 5 is provided with a second guide plate 6 that matches the shape. A first mounting plate 13 is fixedly installed on the first guide plate 5. Multiple sets of telescopic rods 14 are fixedly installed on the first mounting plate 13. The ends of the telescopic rods 14 away from the first mounting plate 13 are fixedly installed with a second mounting plate 16. The second mounting plate 16 is fixedly connected to the corresponding second guide plate 6. Springs 15 are fixedly installed on the first mounting plate 13 and distributed around the telescopic rods 14. The ends of the springs 15 away from the first mounting plate 13 are fixedly connected to the second mounting plate 16.

[0026] A second electric telescopic rod 22 is fixedly installed at the top of the housing 1. A top plate 23 is fixedly installed at the output end of the second electric telescopic rod 22. A base plate 24 is rotatably installed on the top plate 23, and a motor 25 that drives the base plate 24 to rotate is provided on the top plate 23. Gears are fixedly installed on the output end of the motor 25 and on the rotation shaft of the base plate 24. The motor 25 drives the base plate 24 to rotate through the meshing gears. Multiple sets of adsorption tubes 26 arranged in a circumferential array around the rotation axis of the base plate 24 are fixedly installed on the base plate 24. The ends of the adsorption tubes 26 are fixedly... A suction cup 27 is fixedly installed, and multiple sets of suction tubes 26 are connected to the negative pressure device body 29 fixedly installed on the base plate 24. The multiple sets of suction tubes 26 are fixedly installed together with an annular sealing plate 28. The sealing plate 28, the first guide plate 5, the second guide plate 6, and the bottom plate 4 form a channel. The suction cup 27 moves within the channel. A blowing chamber 7 is fixedly installed inside the bottom plate 4. Multiple sets of blowing pipes 8 are connected to the blowing chamber 7. The blowing pipes 8 blow towards the opening of the channel. The blowing chamber 7 is connected to the first fan 9 fixedly installed inside the housing 1 through the first air supply pipe 10. Specifically, two sets of feed conveyor belts 17 and discharge conveyor belts 18 are rotatably installed inside the housing 1 at the corresponding ends of the base plate 4, with both feed conveyor belts 17 and discharge conveyor belts 18 extending out of the housing 1.

[0027] In practical application, in the initial state, the sealing plate 28 is in contact with the upper surface of the second guide plate 6 without applying pressure to the second guide plate 6. At this time, the sealing plate 28, the first guide plate 5, the second guide plate 6, the base plate 4, and the main body 3 of the detection device form an arc-shaped channel. The memory chip to be tested is placed on the feeding conveyor belt 17. The feeding conveyor belt 17 drives the memory chip to move to the set position inside the housing 1. At this time, the memory chip is located directly below one of the suction cups 27. The first electric telescopic rod 19 drives the substrate 24 to move downward so that the suction cups 27 contact the memory chip. The negative pressure device main body 29 causes the suction cups 27 to adsorb and fix the memory chip. When the substrate 24 moves downward, the sealing plate 28 moves downward synchronously and continues to compress the spring 15. At this time, the second guide plate 6 moves downward synchronously so that the channel is always maintained. After the suction cup 27 adsorbs and fixes the memory chip, the substrate 24 returns to its original position. The second guide plate 6, under the action of the spring 15, always moves with the closing plate 28. The motor 25 drives the substrate 24 to rotate at a set angle through meshing gears, so that the next set of suction cups 27 moves to the loading position. As loading continues, one set of memory chips moves to above the detection position on the test device body 3. As the subsequent loading substrate 24 descends, the memory chip can be placed in the detection area on the test device body 3. After detection, the suction cup 27 descends again to adsorb the memory chip. Subsequently, as the substrate 24 rotates, the memory chip that has completed the detection moves to above the discharge conveyor belt 18. At the same time, the memory chips that have not been detected can move to the detection area for continuous detection. When the substrate 24 descends again, the memory chip that has completed the detection can be placed on the discharge conveyor belt 18. The discharge conveyor belt 18 transports the detected memory chip out of the housing 1. During the movement of the memory chip in the channel... The first fan 9 delivers filtered air to the blowing chamber 7 through the first air supply pipe 10. The air in the blowing chamber 7 is blown towards the opening of the channel through the blowing pipe 8. That is, the air in the channel blows out to both sides from the position of the test device body 3. Due to the tilt angle of the blowing pipe 8, the air blown out by the blowing pipe 8 can blow towards the lower surface of the memory chip during the movement of the memory chip. Thus, the memory chip can always be swept by filtered air as it moves towards the test device body 3 in the channel. The air sweeping keeps the contact point between the memory chip and the test device body 3 clean, thereby ensuring the accuracy of the test results. After the test is completed, the memory chip can still be swept by air as it moves in the channel, ensuring the cleanliness of the memory chip itself. The air in the channel continuously flows to the outside, so that there is always air flowing to the outside at the opening of the channel, thereby preventing outside air and impurities from flowing into the channel, further improving the cleanliness of the channel, and thus ensuring the accuracy of the test results.

[0028] Please see Figure 4 , Figure 5 As shown, the present invention is a test bench for the final testing of memory chips. Two sets of second air supply pipes 12 are fixedly installed in the middle of the second guide plate 6. The second air supply pipes 12 pass through the second guide plate 6 and the two sets of second air supply pipes 12 are located on both sides of the test position. The second air supply pipes 12 are connected to the second fan 11 fixedly installed in the housing 1.

[0029] In practical application, the filtered air is delivered to the middle of the channel by the second fan 11, and then the air flows to both ends of the channel, thereby further restricting the airflow direction in the channel and increasing the airflow speed and flow rate at the channel outlet, thereby further improving the cleaning effect on the memory chip and the interception effect at the channel outlet.

[0030] Please see Figure 4As shown, the present invention is a test bench for final testing of memory chips. A first electric telescopic rod 19 is fixedly installed on the bottom surface of the housing 1. A horizontal plate 20 is fixedly installed on the output end of the first electric telescopic rod 19. Both ends of the horizontal plate 20 are fixedly installed with baffles 21. One side of the baffle 21 is flush with the end face of the corresponding base plate 4.

[0031] In practical application, when the memory chip test sealing plate 28 moves upward, the upward movement distance of the sealing plate 28 is greater than the reset distance, resulting in a gap between the sealing plate 28 and the second guide plate 6. At this time, the first electric telescopic rod 19 drives the two sets of baffles 21 to move upward synchronously through the horizontal plate 20 until they contact the sealing plate 28. The baffles 21 seal the end of the channel. At this time, the air in the channel will flow out from the gap between the sealing plate 28 and the second guide plate 6. The high-speed airflow blows away the friction surfaces of the sealing plate 28 and the second guide plate 6, preventing impurities generated by friction from entering the channel, and further ensuring the testing effect of the memory chip. After a set time, the sealing plate 28 descends and contacts the second guide plate 6 again. After the memory chip test is completed, the baffles 21 descend to release the seal on the end of the channel.

Claims

1. A test machine for final testing of memory chips, comprising a housing (1), which is provided on one side with a cabinet door (2), characterized in that The test device body (3) is fixedly installed inside the housing (1). Two sets of base plates (4) that cooperate with the test device body (3) are fixedly installed on the bottom surface of the housing (1). Arc-shaped first guide plates (5) that match the base plate (4) are fixedly installed on both sides of the base plate (4). A second guide plate (6) with the same shape is provided on each set of first guide plates (5). A second electric telescopic rod (22) is fixedly installed at the top of the housing (1). A top plate (23) is fixedly installed at the output end of the second electric telescopic rod (22). A base plate (24) is rotatably installed on the top plate (23), and a motor (25) for driving the base plate (24) to rotate is provided on the top plate (23). Multiple sets of adsorption tubes (26) arranged in a circular array around the rotation axis of the base plate (24) are fixedly installed on the base plate (24). A suction cup (27) is fixedly installed at the end of the adsorption tube (26). Multiple sets of adsorption tubes (26) are connected to the negative pressure device body (29) fixedly installed on the substrate (24). Multiple sets of adsorption tubes (26) are fixedly installed with an annular sealing plate (28). A blowing chamber (7) is fixedly installed in the bottom plate (4). Multiple sets of blowing pipes (8) are connected to the blowing chamber (7). The blowing pipes (8) blow towards the opening of the channel. The blowing chamber (7) is connected to the first fan (9) fixedly installed in the housing (1) through the first air supply pipe (10).

2. The test handler for final testing of memory chips as recited in claim 1, wherein, The base plate (4) is arc-shaped and its cross-section is U-shaped with the opening facing upward. The base plate (4) is distributed on both sides of the test device body (3) and the end of the base plate (4) is in contact with the side of the test device body (3). The upper surface of the base plate (4) is flush with the upper surface of the test device body (3).

3. The testing machine for final testing of memory chips according to claim 1, characterized in that, A first mounting plate (13) is fixedly installed on the first guide plate (5). Multiple sets of telescopic rods (14) are fixedly installed on the first mounting plate (13). A second mounting plate (16) is fixedly installed on the end of the telescopic rods (14) away from the first mounting plate (13). The second mounting plate (16) is fixedly connected to the corresponding second guide plate (6). A spring (15) is fixedly installed on the first mounting plate (13) and distributed around the telescopic rods (14). The end of the spring (15) away from the first mounting plate (13) is fixedly connected to the second mounting plate (16).

4. A testing machine for final testing of memory chips according to claim 1, characterized in that, The enclosed plate (28), the first guide plate (5), the second guide plate (6), and the bottom plate (4) form a channel, and the suction cup (27) moves within the channel.

5. A testing machine for final testing of memory chips according to claim 1, characterized in that, Gears are fixedly installed on the output end of the motor (25) and the rotating shaft of the base plate (24). The motor (25) drives the base plate (24) to rotate through the meshing gears.

6. A testing machine for final testing of memory chips according to claim 1, characterized in that, Two sets of feed conveyor belts (17) and discharge conveyor belts (18) located at the ends of the corresponding base plates (4) are rotatably installed inside the housing (1). Both the feed conveyor belts (17) and discharge conveyor belts (18) extend out of the housing (1).

7. A testing machine for final testing of memory chips according to claim 1, characterized in that, Two sets of second air supply pipes (12) are fixedly installed in the middle of the second guide plate (6). The second air supply pipes (12) pass through the second guide plate (6) and the two sets of second air supply pipes (12) are located on both sides of the detection position. The second air supply pipes (12) are connected to the second fan (11) fixedly installed in the housing (1).

8. A testing machine for final testing of memory chips according to claim 1, characterized in that, The bottom surface of the housing (1) is fixedly installed with a first electric telescopic rod (19), and a horizontal plate (20) is fixedly installed at the output end of the first electric telescopic rod (19). Both ends of the horizontal plate (20) are fixedly installed with baffles (21), and one side of the baffle (21) is flush with the end face of the corresponding bottom plate (4).

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