A matching measurement method applied to an image measurement device and the image measurement device

By determining the relative positional relationship between the image matching template and the feature measurement template in the image measurement device, the problem of reduced measurement accuracy caused by inconsistent workpiece placement or deformation is solved, achieving higher measurement accuracy and efficiency.

CN122408602APending Publication Date: 2026-07-17CHOTEST TECH INC

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
CHOTEST TECH INC
Filing Date
2025-12-22
Publication Date
2026-07-17

AI Technical Summary

Technical Problem

The problem of reduced accuracy of measurement results due to inconsistent workpiece placement or deformation in image measurement equipment.

Method used

By determining the relative positional relationship between the image matching template and the feature measurement template in the image measurement device, the image matching area is determined in the scanned image of the target workpiece using the image matching template, and the feature measurement area is determined based on this, thereby improving the accuracy of the measurement results.

Benefits of technology

It improves the accuracy and automation of measurement results when workpieces are misplaced or deformed, reduces the waste of computing resources, and improves measurement efficiency.

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Abstract

本申请涉及一种应用于影像测量设备的匹配测量方法及影像测量设备。所述方法包括:利用扫描装置获取第一待测工件的扫描图像,并于第一待测工件的扫描图像中确定图像匹配模板以及与图像匹配模板关联的第一特征测量模板;确定图像匹配模板以及第一特征测量模板之间的第一相对位置关系;基于多个待测工件的位置,控制扫描装置获取目标待测工件的扫描图像,并基于图像匹配模板在目标待测工件的扫描图像中确定图像匹配区域;基于目标待测工件的扫描图像中的图像匹配区域以及第一相对位置关系,于目标待测工件中确定第一特征测量区域;基于第一特征测量区域得到目标待测工件的测量结果。采用本方法能够提高得到的测量结果的准确度。
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