A matching measurement method applied to an image measurement device and the image measurement device
By determining the relative positional relationship between the image matching template and the feature measurement template in the image measurement device, the problem of reduced measurement accuracy caused by inconsistent workpiece placement or deformation is solved, achieving higher measurement accuracy and efficiency.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- CHOTEST TECH INC
- Filing Date
- 2025-12-22
- Publication Date
- 2026-07-17
AI Technical Summary
The problem of reduced accuracy of measurement results due to inconsistent workpiece placement or deformation in image measurement equipment.
By determining the relative positional relationship between the image matching template and the feature measurement template in the image measurement device, the image matching area is determined in the scanned image of the target workpiece using the image matching template, and the feature measurement area is determined based on this, thereby improving the accuracy of the measurement results.
It improves the accuracy and automation of measurement results when workpieces are misplaced or deformed, reduces the waste of computing resources, and improves measurement efficiency.
Smart Images

Figure CN122408602A_ABST