A dual-channel differential calibration method for resisting optical window pollution decay of gas detection
By constructing a dual-channel optical measurement system and a three-dimensional associated benchmark model, the problem of optical signal distortion caused by optical window contamination was solved, enabling high-precision online monitoring of the optical measurement system under harsh working conditions, dynamically decoupling optical window contamination interference, and ensuring the continuous reliability of the measurement system.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- HEFEI QINGXIN SENSING TECH CO LTD
- Filing Date
- 2026-06-12
- Publication Date
- 2026-07-17
AI Technical Summary
In existing technologies for optical measurement systems in industrial environments, optical window contamination cannot effectively handle the optical signal distortion caused by it, affecting the accuracy and reliability of the measurement system, and making it difficult to achieve continuous online monitoring, especially under complex working conditions.
A dual-channel optical measurement system is constructed, which acquires optical signals through the main measurement channel and the reference channel respectively. The three-dimensional correlation benchmark model is used to determine the contamination stage and type in real time, and differential calibration and full-dimensional compensation are performed to decouple the interference caused by optical window contamination.
It enables high-precision online monitoring of optical measurement systems in harsh industrial environments, dynamically decouples optical signal distortion caused by optical window contamination, and ensures the continuous reliability and accuracy of the measurement system.
Smart Images
Figure CN122409511A_ABST