A detection testing device for magneto-optical switches

CN122591208APending Publication Date: 2026-08-18GUILIN GUANGLONG INTEGRATED TECH CO LTD
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Patent Information

Application Number
CN202610794466.6
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2026-06-03
Publication Date
2026-08-18

AI Technical Summary

Technical Problem

[0004]然而,现有磁光开关用的检测测试装置,其测试速度与精度严重受限于红外光电探测器自身的物理特性

Benefits of technology

本发明通过引入非线性光学频率上转换技术,将红外信号光转换为易于处理的可见光,利用高速硅基探测器进行探测,从根本上解决了红外探测器响应速度慢的限制,实现了对磁光开关皮秒级开关时间的高精度测量。

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Abstract

This invention relates to the field of optoelectronic device testing technology, and more particularly to a testing device for magneto-optical switches. The technical solution includes a worktable, a light source connection mechanism, an optical frequency conversion mechanism, an optical domain processing and detection mechanism, and a control console. The light source connection mechanism drives a tunable test laser to connect to the magneto-optical switch; the optical frequency conversion mechanism combines the output light of the magneto-optical switch with the pump light through an optical fiber combiner, and then performs frequency up-conversion via a PPLN waveguide to convert the infrared light into visible light; the optical domain processing and detection mechanism uses an optical beam splitter to branch the signal to an optical modulator group, a polarization decoding mechanism, etc., for parallel processing and detection. This invention overcomes the speed limitation of infrared detection through optical frequency conversion, achieving high-speed, high-precision synchronous comprehensive testing of multiple parameters such as the opening and closing time, insertion loss, isolation, and polarization-related loss of the magneto-optical switch. It features a high degree of automation and stable and reliable test results.
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Description

Technical Field

[0001] This invention relates to the field of optoelectronic device testing technology, and in particular to a testing device for magneto-optical switches. Background Technology

[0002] As a core optical path switching component in optical communication networks and optical sensing systems, the performance of magneto-optical switches directly affects the stability and reliability of the entire system. Therefore, accurate and efficient testing of key parameters of magneto-optical switches, such as insertion loss, isolation, and especially switching time, which reflects their dynamic response speed, is an indispensable part of product development, quality control, and network access verification. Developing a high-performance dedicated testing device is of great significance for improving the technological level of the magneto-optical switch industry.

[0003] Currently, the industry commonly uses a direct detection-based approach for testing magneto-optical switches. This approach typically uses a tunable laser as the light source, whose output optical signal is injected into the magneto-optical switch under test via an optical fiber jumper. The switch's output light is directly guided to an infrared photodetector, which converts the optical signal into an electrical signal. This signal is then acquired and analyzed by a high-speed oscilloscope or a dedicated electrical parameter analyzer to calculate parameters such as switching time and losses.

[0004] However, the testing speed and accuracy of existing magneto-optical switch detection and testing devices are severely limited by the physical characteristics of the infrared photodetectors themselves. Due to physical limitations such as material band gaps, the response time of commercial infrared detectors (such as InGaAs detectors) is typically difficult to reach the picosecond level, and noise increases significantly at high frequencies. This makes it impossible for existing testing devices to accurately and distortion-free capture the transient response process when characterizing high-speed (such as sub-nanosecond) magneto-optical switches, resulting in large errors in the measurement results of switching time, which is difficult to meet the growing demands for high-speed device development and acceptance. Summary of the Invention

[0005] The purpose of this invention is to address the problems existing in the background art by proposing a detection and testing device for magneto-optical switches.

[0006] This application provides a testing and detection device for magneto-optical switches, including a worktable and further comprising: A light source connection mechanism is located on one side of the upper surface of the worktable and is used to drive the light source connector to actively connect. The light source connection mechanism includes a linear moving component. The outer wall of the linear moving component is fixed to the surface of the workbench. A sliding seat is fixed to its output end. A tunable test laser is fixed to the upper surface of the sliding seat, and a guide rail slides on the lower surface for stable and accurate connection. An optical frequency conversion mechanism is located in the middle of the upper surface of the worktable and is used to convert the infrared light output by the magneto-optical switch body into visible light that is easy to measure. The light domain processing and detection mechanism is located on the upper surface of the workbench away from the light source connection mechanism. It is used to perform parallel processing and demodulation of the frequency-converted visible light signal and display it through the control console.

[0007] Optionally, the upper surface of the workbench is provided with a support base for positioning the magneto-optical switch body and a protective cover for protecting the magneto-optical switch body. The support base is fixed on the upper surface of the workbench, the protective cover slides on the upper surface of the workbench, and a fixing member for limiting the movement of the magneto-optical switch body is fixed on its inner side.

[0008] Optionally, the output end of the tunable test laser is disposed inside the protective cover and connected to the input end of the magneto-optical switch body.

[0009] Optionally, the optical frequency conversion mechanism includes an optical fiber combiner that can combine the output light of the magneto-optical switch body with the beam of the tunable pump laser and a PPLN nonlinear waveguide. One input end of the optical fiber combiner is connected to the output end of the magneto-optical switch body via an optical fiber, the other input end of the optical fiber combiner is connected to the output end of the tunable pump laser via an optical fiber, and the output end of the optical fiber combiner is connected to the input end of the PPLN nonlinear waveguide via an optical fiber.

[0010] Optionally, the optical domain processing and detection mechanism includes a fixed base supporting the PPLN nonlinear waveguide and the limiting ring, and an optical beam splitter that can split the optical signal into multiple paths at a certain ratio. The optical beam splitter is connected to the PPLN nonlinear waveguide via the limiting ring and optical fiber. The fixed base is fixed on the upper surface of the worktable near the magneto-optical switch body.

[0011] Optionally, the optical domain processing and detection mechanism further includes an optical modulator group, a polarization decoding mechanism, an optical domain feedback controller, and a photoelectric converter. The multiple output terminals of the optical beam splitter are respectively connected to the input terminals of the optical modulator group, the polarization decoding mechanism, and the optical domain feedback controller via optical fibers. The output terminals of the optical modulator group, the polarization decoding mechanism, and the optical domain feedback controller are all connected to the input terminal of the photoelectric converter.

[0012] Optionally, the electrical signal output terminal of the photoelectric converter is electrically connected to the signal input terminal of the control panel.

[0013] Optionally, the testing apparatus may also include; The drive mechanism is used to drive the movement of the protective cover and the fixed parts; The drive mechanism includes an electric push rod and two racks disposed inside the worktable. The electric push rod is fixedly connected to the outer wall of one of the racks. A gear is rotatably connected inside the worktable. The two racks mesh with the outer walls of the gears on both sides respectively. A connector is fixedly connected to the ends of the two racks. A column is fixedly connected to both ends of the connector. The ends of the columns are fixedly connected to the lower surface of the protective cover.

[0014] Optionally, the driving mechanism further includes a guide rail for guiding the column, wherein the output end of the guide rail slider is fixedly connected to the bottom of the column.

[0015] Optionally, the PPLN nonlinear waveguide is equipped with a temperature controller at the bottom to maintain stable phase matching conditions of the PPLN nonlinear waveguide.

[0016] In summary, this application includes at least one of the following beneficial technical effects: This invention introduces nonlinear optical frequency upconversion technology to convert infrared signal light into easily processed visible light, which is then detected using a high-speed silicon-based detector. This fundamentally solves the limitation of slow response speed of infrared detectors and enables high-precision measurement of picosecond-level switching time of magneto-optical switches.

[0017] Furthermore, by adopting a parallel optical domain processing architecture, the converted optical signal is split and processed for intensity, polarization, and feedback control. Key parameters such as insertion loss, isolation, switching time, and polarization-related loss can be obtained simultaneously through a single measurement using a single device, which greatly improves testing efficiency and data consistency. Through high integration and automated design, the overall usability and testing efficiency of the equipment are improved.

[0018] Finally, by integrating the light source connection mechanism and the drive mechanism, the automatic alignment of the test optical path and the automatic opening and closing of the protective cover are realized, reducing manual intervention. Combined with high-precision temperature control and optical domain feedback control, the stability of the system in long-term operation and the repeatability and accuracy of the measurement results are effectively guaranteed. Attached Figure Description

[0019] Figure 1 A schematic diagram of the overall structure of a detection and testing device for magneto-optical switches according to the present invention is provided. Figure 2 This is a schematic diagram of the protective shield's unfolded structure; Figure 3 This is a schematic diagram of the structure above the workbench; Figure 4 This is a schematic diagram of the light source connection mechanism. Figure 5 This is a schematic diagram of the optical frequency conversion mechanism. Figure 6This is a schematic diagram of the optical domain processing and detection mechanism. Figure 7 This is a schematic diagram of the explosion of the drive mechanism; Figure 8 for Figure 7 Enlarged diagram of point A in the middle.

[0020] Reference numerals: 1. Workbench; 2. Protective cover; 3. Light source connection mechanism; 301. Linear movement component; 302. Sliding seat; 303. Slide rail; 304. Tunable test laser; 4. Support base; 5. Magneto-optic switch body; 6. Optical frequency conversion mechanism; 601. Fiber optic combiner; 602. Tunable pump laser; 603. PPLN nonlinear waveguide; 7. Optical domain processing and detection mechanism; 701. Fixed seat; 702. Limiting ring; 703. Optical beam splitter; 704. Optical modulator group; 705. Polarization decoding mechanism; 706. Optical domain feedback controller; 707. Photoelectric converter; 8. Control console; 9. Fixing component; 10. Drive mechanism; 1001. Electric push rod; 1002. Rack; 1003. Gear; 1004. Connecting component; 1005. Guide rail; 1006. Column. Detailed Implementation

[0021] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0022] like Figures 1-4 As shown, the present invention proposes a testing device for magneto-optical switches, comprising a base platform and a supporting worktable 1, and a light source connection mechanism 3 disposed on one side of the upper surface of the worktable 1 for actively connecting the light source connector; in one embodiment, the light source connection mechanism 3 includes a linear moving component 301, the outer wall of which is fixed to the upper surface of the worktable 1, a sliding seat 302 fixed to its output end, a tunable test laser 304 fixed to the upper surface of the sliding seat 302, and a guide rail 303 sliding on the lower surface for stable and accurate connection.

[0023] The output end of the tunable test laser 304 is disposed inside the protective cover 2 and connected to the input end of the magneto-optical switch body 5. The test device is described in detail below: First, the linear motion component 301 drives the sliding seat 302 to move precisely linearly along the slide rail 303. The tunable test laser 304 fixed on the sliding seat 302 moves accordingly, so that its output end actively and accurately achieves optical connection with the input end of the magneto-optical switch body 5 located inside the protective cover 2, providing a stable test light source for subsequent tests.

[0024] like Figure 1 , Figure 2 , Figure 3 and Figure 5 As shown, the testing device also includes an optical frequency conversion mechanism 6 disposed in the middle of the upper surface of the worktable 1, used to convert the infrared light output by the magneto-optical switch body 5 into visible light that is easy to measure. In one embodiment, the optical frequency conversion mechanism 6 includes an optical fiber combiner 601 that can combine the output light of the magneto-optical switch body 5 with the beam of the tunable pump laser 602, and a PPLN nonlinear waveguide 603. One input end of the optical fiber combiner 601 is connected to the output end of the magneto-optical switch body 5 via an optical fiber, and the other input end of the optical fiber combiner 601 is connected to the output end of the tunable pump laser 602 via an optical fiber. The output of the optical fiber combiner 601... The input end is connected to the input end of the PPLN nonlinear waveguide 603 via an optical fiber. The PPLN nonlinear waveguide 603 is preferably a periodically polarized lithium niobate strip waveguide. Its polarization period is determined according to the design wavelength. For example, when the tunable test laser 304 outputs infrared light with a center wavelength of 1550nm and the tunable pump laser 602 outputs pump light with a center wavelength of 1064nm, in order to achieve sum-frequency generation and obtain visible light of about 620nm, the polarization period can be designed in the range of 18.5μm to 19.5μm. The length of the waveguide is preferably 20mm to 50mm to achieve a balance between conversion efficiency and device size. The bottom of the PPLN nonlinear waveguide 603 is equipped with a temperature controller to maintain stable phase matching conditions. The optical frequency conversion mechanism 6 is described in detail below: In this embodiment, the infrared light signal output by the magneto-optical switch body 5 and the pump light output by the tunable pump laser 602 are guided into the fiber combiner 601 for beam combining. The beam-combined light is then sent to the PPLN nonlinear waveguide 603 for nonlinear frequency up-conversion, converting the infrared light into visible light. During this process, the temperature controller at the bottom of the PPLN nonlinear waveguide 603 continues to work to maintain precise and stable phase matching conditions inside, ensuring that the frequency conversion process has high efficiency and high stability.

[0025] like Figure 1 , Figure 2 , Figure 3 and Figure 6As shown, the testing device also includes a light domain processing and detection mechanism 7 located on the upper surface of the workbench 1 away from the light source connection mechanism 3, used for parallel processing and demodulation of the frequency-converted visible light signal, and displayed through the control console 8; as one embodiment, the light domain processing and detection mechanism 7 includes a fixed base 701 supporting the PPLN nonlinear waveguide 603 and the limiting ring 702, and an optical beam splitter 703 that can split the light signal into multiple paths according to a certain ratio. The optical beam splitter 703 is connected to the PPLN nonlinear waveguide 603 through the limiting ring 702 and the optical fiber. The fixed base 701 is fixed on the upper surface of the workbench 1 near the magneto-optical switch body 5.

[0026] The optical domain processing and detection mechanism 7 also includes an optical modulator group 704, a polarization decoding mechanism 705, an optical domain feedback controller 706, and a photoelectric converter 707. The multiple output terminals of the optical beam splitter 703 are respectively connected to the input terminals of the optical modulator group 704, the polarization decoding mechanism 705, and the optical domain feedback controller 706 via optical fibers. The output terminals of the optical modulator group 704, the polarization decoding mechanism 705, and the electrical signal output terminals of the optical domain feedback controller 706 are all connected to the input terminal of the photoelectric converter 707.

[0027] The electrical signal output terminal of the photoelectric converter 707 is electrically connected to the signal input terminal of the control panel 8. The optical domain processing and detection mechanism 7 is described in detail below: In this embodiment, the visible light signal generated after frequency upconversion is introduced into the optical domain processing and detection mechanism 7. The light signal first enters the optical beam splitter 703, is divided into multiple paths according to a predetermined ratio, and is respectively sent to the optical modulator group 704, the polarization decoding mechanism 705 and the optical domain feedback controller 706 for parallel processing, which are used for signal quantization, polarization information calculation and system optical power monitoring, respectively. The light signals or electrical signals processed by the above components are finally received by the photoelectric converter 707 and converted into electrical signals, and then the electrical signals are transmitted to the control console 8 for data analysis and display.

[0028] like Figures 1-3 As shown, the testing device also includes a support base 4 disposed on the upper surface of the workbench 1 and positioning the magneto-optical switch body 5, and a protective cover 2 protecting the magneto-optical switch body 5. The protective cover 2 provides a sealed environment that provides light protection, dust protection, and physical protection. In one embodiment, the support base 4 is fixed to the upper surface of the workbench 1, and the protective cover 2 slides on the upper surface of the workbench 1. A fixing member 9 is fixed inside the protective cover 2 to limit the movement of the magneto-optical switch body 5. The testing device is described in detail below: In this embodiment, the magneto-optical switch body 5 is precisely fixed to a predetermined position on the upper surface of the workbench 1 by the support base 4, ensuring that it is in a stable testing position. The protective cover 2 covers the workbench 1, forming a relatively enclosed space, which protects and isolates the magneto-optical switch body 5 and its optical path connection parts. The fixing member 9 is set inside the protective cover 2 to assist in limiting and fixing the magneto-optical switch body 5, preventing it from shifting during the test and ensuring the reliability of the test connection.

[0029] like Figure 1 , Figure 2 , Figure 3 , Figure 7 and Figure 8 As shown, the testing device also includes a drive mechanism 10 for moving the protective cover 2 and the fixing member 9. In one embodiment, the drive mechanism 10 includes an electric push rod 1001 and two racks 1002 disposed inside the workbench 1. The electric push rod 1001 is fixedly connected to the outer wall of one of the racks 1002. A gear 1003 is rotatably connected inside the workbench 1. The two racks 1002 are respectively meshed on both sides of the outer wall of the gear 1003. A connector 1004 is fixedly connected to the ends of the two racks 1002. A column 1006 is fixedly connected to both ends of the connector 1004. The end of the column 1006 is fixedly connected to the lower surface of the protective cover 2. The drive mechanism 10 also includes a guide rail 1005 for guiding the column 1006. The slider output end of the guide rail 1005 is fixedly connected to the bottom of the column 1006. The drive mechanism 10 is described in detail below: In this embodiment, after the magneto-optical switch body 5 is placed, the drive mechanism 10 is activated, and the electric push rod 1001 is activated, driving the rack 1002 connected to it to move. Through the gear 1003 meshing with it, the rack 1002 on the other side moves in the opposite direction, so that the column 1006 connected to the ends of the two racks 1002 through the connector 1004 can move synchronously towards or away from each other. Under the guidance of the guide rail 1005, the column 1006 stably drives the protective cover 2 and the fixing part 9 on its inner side to move relative to each other, realizing the opening and closing of the protective cover 2. This facilitates the clamping or maintenance of the magneto-optical switch body 5, and also prevents ambient light from entering the internal optical path and interfering with the high-speed silicon-based detector's acquisition of weak visible light signals, ensuring the test signal-to-noise ratio.

[0030] The above specific embodiments are merely several optional embodiments of the present invention. Based on the technical solutions of the present invention and the relevant teachings of the above embodiments, those skilled in the art can make various alternative improvements and combinations to the above specific embodiments.

Claims

1. A testing and detection device for magneto-optical switches, comprising a worktable (1), characterized in that, Also includes: The light source connection mechanism (3) is located on one side of the upper surface of the workbench (1) and is used to drive the light source connector to actively connect. The light source connection mechanism (3) includes a linear moving component (301). The outer wall of the linear moving component (301) is fixed to the upper surface of the worktable (1). A sliding seat (302) is fixed at its output end. A tunable test laser (304) is fixed on the upper surface of the sliding seat (302), and a guide rail (303) slides on the lower surface for stable and accurate connection. An optical frequency conversion mechanism (6) is located in the middle of the upper surface of the worktable (1) and is used to convert the infrared light output by the magneto-optical switch body (5) into visible light that is easy to measure. The light domain processing and detection mechanism (7) is located on the upper surface of the workbench (1) away from the light source connection mechanism (3). It is used to perform parallel processing and demodulation of the frequency-converted visible light signal and display it through the control console (8).

2. The detection and testing device for magneto-optical switches according to claim 1, characterized in that, The upper surface of the workbench (1) is provided with a support base (4) for positioning the magneto-optical switch body (5) and a protective cover (2) for protecting the magneto-optical switch body (5). The support base (4) is fixed on the upper surface of the workbench (1), and the protective cover (2) slides on the upper surface of the workbench (1). A fixing member (9) for limiting the magneto-optical switch body (5) is fixed on its inner side.

3. The detection and testing device for magneto-optical switches according to claim 2, characterized in that, The output end of the tunable test laser (304) is disposed inside the protective cover (2) and connected to the input end of the magneto-optical switch body (5).

4. The detection and testing device for magneto-optical switches according to claim 1, characterized in that, The optical frequency conversion mechanism (6) includes an optical fiber combiner (601) that can combine the output light of the magneto-optical switch body (5) with the beam of the tunable pump laser (602) and a PPLN nonlinear waveguide (603). One input end of the optical fiber combiner (601) is connected to the output end of the magneto-optical switch body (5) through an optical fiber, and the other input end of the optical fiber combiner (601) is connected to the output end of the tunable pump laser (602) through an optical fiber. The output end of the optical fiber combiner (601) is connected to the input end of the PPLN nonlinear waveguide (603) through an optical fiber.

5. A detection and testing device for a magneto-optical switch according to claim 1, characterized in that, The optical domain processing and detection mechanism (7) includes a fixed base (701) that supports the PPLN nonlinear waveguide (603) and the limiting ring (702), and an optical beam splitter (703) that can split the optical signal into multiple paths at a certain ratio. The optical beam splitter (703) is connected to the optical fiber and the PPLN nonlinear waveguide (603) through the limiting ring (702). The fixed base (701) is fixed on the upper surface of the worktable (1) near the magneto-optical switch body (5).

6. A detection and testing device for a magneto-optical switch according to claim 5, characterized in that, The optical domain processing and detection mechanism (7) further includes an optical modulator group (704), a polarization decoding mechanism (705), an optical domain feedback controller (706), and a photoelectric converter (707). The multiple output terminals of the optical beam splitter (703) are respectively connected to the input terminals of the optical modulator group (704), the polarization decoding mechanism (705), and the optical domain feedback controller (706) via optical fibers. The output terminals of the optical modulator group (704), the polarization decoding mechanism (705), and the electrical signal output terminals of the optical domain feedback controller (706) are all connected to the input terminal of the photoelectric converter (707).

7. A detection and testing device for a magneto-optical switch according to claim 6, characterized in that, The electrical signal output terminal of the photoelectric converter (707) is electrically connected to the signal input terminal of the control console (8).

8. A detection and testing device for a magneto-optical switch according to claim 2, characterized in that, The testing apparatus also includes; Drive mechanism (10) for driving the protective cover (2) and the fixing part (9) to move; The drive mechanism (10) includes an electric push rod (1001) and two racks (1002) disposed inside the workbench (1). The electric push rod (1001) is fixedly connected to the outer wall of one of the racks (1002). A gear (1003) is rotatably connected inside the workbench (1). The two racks (1002) respectively mesh with the outer walls of the gear (1003). A connector (1004) is fixedly connected to the ends of the two racks (1002). A column (1006) is fixedly connected to both ends of the connector (1004). The end of the column (1006) is fixedly connected to the lower surface of the protective cover (2).

9. A detection and testing device for a magneto-optical switch according to claim 8, characterized in that, The drive mechanism (10) also includes a guide rail (1005) for guiding the column (1006), and the slider output end of the guide rail (1005) is fixedly connected to the bottom of the column (1006).

10. A detection and testing device for a magneto-optical switch according to claim 4, characterized in that, The bottom of the PPLN nonlinear waveguide (603) is equipped with a temperature controller to maintain the phase matching condition of the PPLN nonlinear waveguide (603) stable.