A zero-point positioning device based on topological material gauge invariance scanning and a positioning method thereof

Abstract

The application discloses a zero point positioning device based on topological material gauge invariance scanning and a positioning method thereof. The device comprises a topological material element, an external parameter scanning unit, a multi-channel gauge invariance measuring unit, a ground state value storage unit, a convergence judging unit and a positioning signal output unit. The method realizes zero point positioning by scanning external parameters, simultaneously measuring multiple gauge invariances and judging whether the multiple gauge invariances converge to the ground state value at the same time. The application realizes physical positioning of the zero point, and the output signal can directly trigger a zero point locking device, is compatible with a zero point mapping system and is suitable for application scenarios such as zero point positioning of a sending end of the zero point mapping system and anchor point locking of a sending end of a macroscopic quantum state transmission system.

Description

Technical Field

[0001] This invention relates to the fields of quantum state measurement and topological material application technology, specifically to a zero-point positioning device and method based on topological material gauge invariant scanning. This invention can be applied to applications requiring physical positioning of zero-point locations, such as zero-point positioning at the transmitting end of a zero-point mapping system, anchor point locking at the transmitting end of a macroscopic quantum state transmission system, and zero-point calibration of quantum network nodes. Background Technology

[0002] In geometrically unified field theory, a zero is the topological location where all gauge invariants (including charge, magnetic flux, phase winding number, topological Chern number, etc.) simultaneously take their ground-state values. The zero itself is unobservable, but all observable physical quantities are defined relative to it. Topological mapping methods based on zero mapping rely on zero-point localization at the transmitting end as the first step, but currently there is no device capable of physically locating this zero. The existing related technologies have the following shortcomings: (i) Measurement of topological invariants depends on boundary physics. Existing topological invariant measurement schemes mainly rely on observing boundary modes or filled bands, and cannot directly measure the ground state values ​​of gauge invariants of the bulk state, thus making it impossible to determine the zero-point location. (ii) Lack of scanning and localization mechanism. Existing technology does not provide a device or method for searching for the global minimum of normal invariants by scanning external parameters. (iii) Lack of multi-point convergence judgment. Existing technology cannot simultaneously read multiple normative invariants and determine whether they converge to the ground state value at the same time. (iv) Incompatible with zero-point mapping systems. Existing measuring devices are not designed for the zero-point positioning requirements of the transmitting end of zero-point mapping systems and cannot output the positioning signal required for zero-point locking. Therefore, existing technologies have the problem of being unable to physically locate the zero point, and there is no device that can locate the zero point by scanning the normal invariants and determining that they converge to the ground state value at the same time. To address the aforementioned problems, this invention provides a zero-point positioning device and method based on scanning of topological material gauge invariants. Summary of the Invention

[0003] This invention aims to solve the technical problem that existing technologies cannot physically locate zero points, and provides a zero-point positioning device and method based on scanning of topological material gauge invariants. Zero-point positioning is achieved by scanning external parameters, measuring multiple gauge invariants, and determining that they converge to the ground state value simultaneously. (I) This invention provides a zero-point positioning device based on topological material gauge invariant scanning, comprising: A topological material element, composed of a crystalline material with nontrivial topological properties, is used to carry gauge invariants. When external parameters (including at least one of temperature, magnetic field, electric field, and stress) change, the gauge invariants (including at least two of charge, magnetic flux, phase winding number, and topological Chern number) of the topological material element undergo measurable changes. An external parameter scanning unit is connected to the topological material element and is used to continuously or incrementally scan at least one external parameter within a preset parameter range, so that the normative invariant of the topological material element traverses its value space as the parameter changes. A multi-channel gauge invariant measurement unit is connected to the topological material element and includes at least two independent measurement channels, each used to simultaneously measure the current values ​​of at least two gauge invariants of the topological material element. A ground state value storage unit is used to store the theoretical ground state values ​​or pre-calibrated ground state values ​​of each specification invariant of the topological material element. A convergence judgment unit is connected to the multi-channel normalized invariant measurement unit and the ground state value storage unit, and is used to determine whether the current values ​​of the normalized invariants measured by each channel converge to their respective ground state values ​​simultaneously. A positioning signal output unit is connected to the convergence judgment unit, and is used to output a zero-point positioning completion signal when the convergence judgment unit determines that all normative invariants have converged to the ground state value at the same time. (II) This invention also provides a zero-point location method based on topological material gauge invariant scanning, comprising the following steps: Step S1: Place the topological material element in the environment to be positioned, and connect the external parameter scanning unit and the multi-channel specification invariant measurement unit. Step S2: Scan at least one external parameter within a preset parameter range using the external parameter scanning unit, and record the norm invariant response of the topological material element under each parameter value. Step S3: The multi-channel gauge invariant measurement unit simultaneously measures the current values ​​of at least two gauge invariants. Step S4: The convergence judgment unit compares the current value measured by each channel with the theoretical ground state value in the ground state value storage unit, and calculates the deviation between each normed invariant and the ground state value. Step S5: When the deviations of all standard invariants are simultaneously less than the preset tolerance, it is determined that the system has been anchored to the zero point. Step S6: The positioning signal output unit outputs a zero-point positioning completion signal, which is used to trigger the start of the zero-point locking device. (III) The present invention has the following beneficial effects: (1) Compared with the prior art which relies on boundary physical measurement of topological invariants, the present invention achieves direct positioning of the volumetric zero point by scanning external parameters and simultaneously measuring multiple normative invariants. (2) Multi-channel parallel measurement ensures the judgment of simultaneous convergence of various normative invariants, avoiding misjudgment of single-variable convergence. (3) The output zero-point positioning completion signal can directly trigger the zero-point locking device and is compatible with the zero-point mapping system. (4) The sensitivity of the topological material element to external parameters ensures the resolution of the scanning positioning. Detailed Implementation

[0004] Example 1: Zero-point positioning device based on MnBi2Te4 magnetic topological insulator. This embodiment applies the zero-point positioning device of the present invention to zero-point positioning based on MnBi2Te4. S1. Material Selection and Preparation. MnBi₂Te₄ single-crystal thin films with a thickness of 10-50 nm were selected as the topological material elements and grown on sapphire substrates via molecular beam epitaxy. MnBi₂Te₄ has a non-zero topological Chern number C=1, and its topological surface states are sensitive to changes in magnetic field and temperature. S2. External parameter scanning unit configuration. Gate electrodes and micro-heaters are integrated on both sides of the MnBi2Te4 thin film to form the external parameter scanning unit. Scanning parameters include: gate voltage (-5V to +5V, in 0.01V steps) and temperature (4K to 300K, in 1K steps). S3. Multi-channel measurement unit configuration. Three independent measurement channels are configured: Channel 1 measures the topological Chern number (measured via anomalous Hall effect), Channel 2 measures the phase winding number (measured via interferometry), and Channel 3 measures the magnetic flux (measured via SQUID). S4. Zero-point scanning and positioning. At a temperature of 4K, the gate voltage is scanned from -5V to +5V, while simultaneously recording the measured values ​​of three channels. When the gate voltage converges to a specific value, the measured values ​​of the three channels simultaneously reach their respective ground state values, and the convergence judgment unit outputs a zero-point positioning completion signal. Implementation results: Zero-point positioning resolution is better than 0.01V (gate voltage), and zero-point positioning repeatability is better than 99.5%. Example 2: Zero-point positioning device based on twisted bilayer graphene. This embodiment applies the zero-point positioning device of the present invention to zero-point positioning based on twisted bilayer graphene. S1. Material Selection and Fabrication. Magic-angle (approximately 1.1°) twisted bilayer graphene was selected as the topological material element, encapsulated at both ends with hexagonal boron nitride. The topological properties of the twisted bilayer graphene can be continuously adjusted by gate voltage and displacement field. S2. External parameter scanning unit configuration. Gate electrodes are integrated on the upper and lower surfaces of the graphene to form the external parameter scanning unit. The scanning parameters are the gate voltage (changing the carrier density) and the vertical electric field (changing the displacement field). S3, Multi-channel measurement and scanning positioning (same as Example 1). Implementation results: Zero-point positioning resolution is better than 0.001V (gate voltage), and zero-point positioning repeatability is better than 99.8%. Attached Figure Description

[0005] Figure 1 This is a block diagram of the overall architecture of the zero-point positioning device based on topological material specification invariant scanning according to the present invention. Figure 2 Timing plot for external parameter scanning and multi-channel normed invariant measurement. Figure 3 The flowchart shows the process of convergence judgment and zero-point positioning to complete the signal output. Terminology Explanation

[0006] Zero-point location: The operation of determining the physical location of the zero point by scanning external parameters and determining that all standardized invariants converge to the ground state value at the same time. Topological material elements: Crystalline materials with nontrivial topological properties, whose gauge invariants change measurably with changes in external parameters. External parameter scanning unit: A hardware unit that continuously or incrementally scans external parameters within a preset parameter range. Multi-channel gauge invariant measurement unit: A hardware unit containing at least two independent measurement channels for simultaneously measuring multiple gauge invariants. Convergence Judgment Unit: A hardware unit that determines whether the current values ​​of the normed invariants measured by each channel converge to their respective ground state values ​​simultaneously.

Claims

1. A zero-point positioning device based on scanning of topological material gauge invariants, characterized in that, include: Topological material elements are composed of crystalline materials with nontrivial topological properties and are used to carry gauge invariants. An external parameter scanning unit, connected to the topological material element, is used to scan at least one external parameter within a preset parameter range; A multi-channel gauge invariant measurement unit, connected to the topological material element, includes at least two independent measurement channels for simultaneously measuring the current values ​​of at least two gauge invariants; The ground state value storage unit is used to store the theoretical ground state value or the pre-calibrated ground state value of each gauge invariant; The convergence judgment unit is connected to the multi-channel normalized invariant measurement unit and the ground state value storage unit, and is used to determine whether the current values ​​of the normalized invariants measured by each channel converge to their respective ground state values ​​simultaneously. The positioning signal output unit is connected to the convergence judgment unit and is used to output a zero-point positioning completion signal when all normalized invariants converge to the ground state value at the same time.

2. The zero-point positioning device according to claim 1, characterized in that: The topological material element is selected from at least one of MnBi2Te4 thin film, twisted bilayer graphene, and Bi2Se3 topological insulator.

3. The zero-point positioning device according to claim 1, characterized in that: The external parameters include at least one of temperature, magnetic field, electric field, and stress.

4. The zero-point positioning device according to claim 1, characterized in that: The gauge invariants include at least two of the following: charge, magnetic flux, phase winding number, and topological Chern number.

5. The zero-point positioning device according to claim 1, characterized in that: The convergence judgment unit determines that the condition for all standardized invariants to converge to the ground state value at the same time is that the deviations of each standardized invariant from the ground state value are simultaneously less than a preset tolerance.

6. A zero-point localization method based on topological material gauge invariant scanning, characterized in that, Includes the following steps: The topological material element is placed in the environment to be positioned, and the external parameter scanning unit and the multi-channel norm invariant measurement unit are connected. At least one external parameter is scanned within a preset parameter range using the external parameter scanning unit; The multi-channel normalized invariant measurement unit simultaneously measures the current values ​​of at least two normalized invariants; The convergence judgment unit compares the current value measured by each channel with the ground state value and calculates the deviation of each norm invariant from the ground state value; When the deviations of all standard invariants are simultaneously less than the preset tolerance, it is determined that the system has been anchored to the zero point. The positioning signal output unit outputs a zero-point positioning completion signal.

7. The zero-point positioning method according to claim 6, characterized in that: The external parameter scanning can be continuous or step-by-step, with the step resolution determined by the zero-point positioning accuracy requirements.

8. The zero-point positioning method according to claim 6, characterized in that: The zero-point positioning completion signal is used to trigger the activation of the zero-point locking device.

9. The zero-point positioning device according to claim 1, characterized in that: The device works in conjunction with the zero-point mapping system, serving as the front-end hardware module for zero-point positioning at its transmitting end.

10. A zero-point positioning chip, characterized in that: The device includes the zero-point positioning device according to any one of claims 1-5 and 9, wherein the chip is integrated on a topological material substrate.

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