Information processing system, information processing method, and information processing program

Abstract

Provided is an information processing system, information processing method, and information processing program capable of more easily analyzing defects present in a laminate including an opaque web. The information processing system includes: an acquisition section (511) that acquires first feature point information related to a feature point present in a first web and second feature point information related to a feature point present in a laminate obtained by laminating an opaque second web to the first web; a comparison section (513) that compares the acquired first feature point information and second feature point information; and an output section (514) that outputs comparison information related to the comparison result of the first feature point information and second feature point information.

Description

Technical Field

[0001] This invention relates to information processing systems, information processing methods, and information processing programs. Background Technology

[0002] Optical films are used in displays such as liquid crystal displays (LCDs). The rolls of optical films are composed of multiple layers of rolls. In the manufacturing process of such optical films, it is necessary to strictly manage defects and the like that that arise in the rolls. For example, technology related to defects and the like that that arise in rolls is described in Patent Document 1.

[0003] Existing technical documents

[0004] Patent documents

[0005] Patent Document 1: Japanese Patent Application Publication No. 2022-107419 Summary of the Invention

[0006] Laminates of multiple rolls may include opaque rolls, such as those containing protective films, diaphragms, or anti-glare films. In laminates containing opaque rolls, defect detection can become difficult. Therefore, it is desirable to more easily analyze defects present in laminates containing opaque rolls.

[0007] The present invention was made in view of the above circumstances, and its object is to provide an information processing system, information processing method and information processing program that can more easily analyze defects existing in laminates containing opaque rolls.

[0008] The above-mentioned objectives of the present invention are achieved by the following means.

[0009] (1) An information processing system, comprising:

[0010] The acquisition unit acquires first feature point information related to feature points existing in the first roll material and second feature point information related to feature points existing in the laminate obtained by laminating an opaque second roll material onto the first roll material.

[0011] The comparison unit compares the acquired first feature point information with the second feature point information; and

[0012] The output unit outputs comparison information related to the comparison results of the first feature point information and the second feature point information.

[0013] (2) The information processing system according to (1) above, wherein,

[0014] The comparison unit classifies feature points existing in the first roll and feature points existing in the laminate into: a first type of feature point that exists in the first roll but disappears in the laminate; a second type of feature point that does not exist in the first roll but appears in the laminate; and a third type of feature point that exists in the first roll and remains in the laminate.

[0015] The comparison information includes information related to at least one of the first feature point, the second feature point, and the third feature point.

[0016] (3) The information processing system according to (1) above, wherein,

[0017] The acquisition unit also acquires information about third feature points present in the second roll material.

[0018] The comparison unit compares the acquired first feature point information and third feature point information with the second feature point information.

[0019] (4) The information processing system according to (1) above further includes:

[0020] The positioning alignment section associates feature points existing in the first roll material and feature points existing in the laminate based on their mutual positions.

[0021] The comparison unit uses the corresponding association results to compare the first feature point information and the second feature point information.

[0022] (5) The information processing system according to (1) above, wherein,

[0023] The output unit outputs the comparison information by causing the display unit to display the comparison information.

[0024] (6) The information processing system according to (1) above, wherein,

[0025] The first roll has a stacked structure of multiple rolls.

[0026] (7) The information processing system according to (1) above, wherein,

[0027] The second roll contains at least one of a protective film, a diaphragm, and an anti-glare film.

[0028] (8) The information processing system according to (1) above, wherein,

[0029] The second roll has a haze of 5% or more.

[0030] (9) An information processing method, comprising:

[0031] Acquire first feature point information related to feature points existing in the first roll material and second feature point information related to feature points existing in the laminate obtained by laminating an opaque second roll material onto the first roll material;

[0032] Compare the obtained first feature point information and second feature point information; and

[0033] Output comparison information related to the comparison results of the first feature point information and the second feature point information.

[0034] (10) An information processing program that causes a computer to perform the information processing method described in (9) above.

[0035] In the information processing system, information processing method, and information processing program of the present invention, first feature point information and second feature point information are compared, and comparison information related to the comparison result is output. Thus, for example, manufacturing managers can easily identify feature points remaining from the state of the first roll among the feature points present in the laminate containing the opaque second roll. Therefore, defects present in the laminate containing the opaque roll can be analyzed more easily. Attached Figure Description

[0036] The advantages and features provided by one or more embodiments of the present invention will be more fully understood through the following detailed description and accompanying drawings, but these are for illustrative purposes only and are not intended to define limitations of the invention.

[0037] Figure 1 This is a schematic diagram illustrating an application example of the information processing system according to the first embodiment.

[0038] Figure 2 It means Figure 1 A cross-sectional view of an example of the structure of the first and second laminates shown.

[0039] Figure 3A It means Figure 1 A schematic diagram illustrating an example of the structure of the inspection device.

[0040] Figure 3B It means Figure 3A Other schematic diagrams of the structure of the inspection device shown.

[0041] Figure 3C It means Figure 3A A schematic diagram of other structures of the inspection device shown.

[0042] Figure 4 It means Figure 1 A block diagram showing the schematic structure of the terminal device.

[0043] Figure 5 It is used to explain in Figure 2 The table shows the classification of feature points present in the first and second stacks, respectively.

[0044] Figure 6 It means Figure 1 The diagram shows a schematic outline of the information processing system.

[0045] Figure 7A It is stored in Figure 6 An example of a user list in the storage section is shown.

[0046] Figure 7B It is stored in Figure 6 An example of a batch list in the storage section is shown.

[0047] Figure 8A It is stored in Figure 6 The image shows an example of a data database (DB) being examined within the storage unit.

[0048] Figure 8B It is stored in Figure 6 Other examples of checking the data DB in the storage section are shown.

[0049] Figure 8C It is stored in Figure 6 Other examples of checking the data DB in the storage section are shown.

[0050] Figure 9 It is used to explain by Figure 6 The diagram shows the comparison results of the first feature point information and the second feature point information obtained by the control unit.

[0051] Figure 10 It means Figure 1 The flowchart shown is an example of a process performed by the information processing system.

[0052] Figure 11 yes Figure 10 The flowchart of the subroutine for step S33 is shown.

[0053] Figure 12 This is a flowchart of the subroutine executed by the information processing system in the second embodiment.

[0054] Figure 13 It means through Figure 12 The figure shows an example of a probability density function calculated from kernel density inference.

[0055] Figure 14 This is a cross-sectional view showing an example of the structure of the stack in which the information processing system of the third embodiment is applied.

[0056] Figure 15 It means Figure 14 A schematic diagram illustrating an example of the manufacturing process of the laminated body. Detailed Implementation

[0057] Embodiments of the present invention will now be described with reference to the accompanying drawings. However, the scope of the present invention is not limited to the disclosed embodiments. Furthermore, in the description of the drawings, the same reference numerals are used for the same elements, and repeated descriptions are omitted. Additionally, the scale of the drawings is exaggerated for ease of explanation and may sometimes differ from the actual scale.

[0058] <First Implementation Method>

[0059] Figure 1 This is a schematic diagram illustrating an application example of the information processing system 50 according to the first embodiment. The information processing system 50 is, for example, composed of a server. This information processing system 50 is interconnected with the terminal device 70 of the factory 100 via a network. The network is a communication line such as a data communication network. In some networks, wired LANs, wireless LANs, etc., may also be used. A wireless LAN is, for example, a LAN conforming to the IEEE 802.11 standard. The information processing system 50 can also be connected to other factories via the network. In the factory 100, a manufacturing apparatus 2000 manufactures a first laminate 80A to a second laminate 80B. The second laminate 80B is, for example, wound into a roll shape. Here, the first laminate 80A corresponds to one specific example of the first roll material of the present invention, and the second laminate 80B corresponds to one specific example of the laminate of the present invention.

[0060] Figure 2 This illustrates an example of the cross-sectional structure of a first laminate 80A and a second laminate 80B. The first laminate 80A includes a first roll 81, a second roll 82, and a third roll 83. In the first laminate 80A, the first roll 81, the second roll 82, and the third roll 83 are laminated in this order. An adhesive layer 801 is provided between the first roll 81 and the second roll 82. An adhesive layer 802 is provided between the second roll 82 and the third roll 83. The first roll 81 and the third roll 83 are, for example, TAC films. TAC is an abbreviation for triacetyl cellulose. The second roll 82 is, for example, an optical functional film such as a polarizer. Adhesive layer 801 bonds the first roll 81 and the second roll 82. Adhesive layer 802 bonds the second roll 82 and the third roll 83. The first laminate 80A is an opaque roll, for example, having a haze of 5% or more. This haze refers to the total haze.

[0061] The second laminate 80B includes a first laminate 80A and a fourth roll 84. The fourth roll 84 is bonded to the third roll 83, for example, via an adhesive layer 803. The fourth roll 84 is an opaque roll, for example, having a haze of 5% or more. Irregular light reflection and scattering occur on the surface of this fourth roll 84, for example. Here, the fourth roll 84 corresponds to a specific example of the second roll of the present invention. The fourth roll 84 is, for example, a protective film. After the fourth roll 84 is bonded to the first laminate 80A, for example, a slit treatment is performed on the second laminate 80B. At this time, the surface of the first laminate 80A is protected by the fourth roll 84, which can prevent scratches or the like from occurring on the surface of the first laminate 80A. The fourth roll 84 can also be a diaphragm or the like. In the second laminate 80B, adhesive layers may be provided instead of adhesive layers 801, 802, and 803.

[0062] [Factory 100]

[0063] In factory 100, for example, the second laminate 80B is manufactured by bonding the fourth roll 84 to the first laminate 80A via adhesive layer 803. The first laminate 80A can be manufactured in factory 100 or in another factory. The width of the second laminate 80B is, for example, in the range of 1000 mm to 5000 mm. The thickness of each of the first roll 81, second roll 82, third roll 83, and fourth roll 84 is, for example, set in the range of 15 μm to 500 μm, taking into account quality and processing. When the first roll 81, second roll 82, third roll 83, or fourth roll 84 contains metal such as steel, the thickness of the first roll 81, second roll 82, third roll 83, or fourth roll 84 can also be 1 mm or more. The length of the roll-shaped second laminate 80B is, for example, in the range of 2000 m to 10000 m.

[0064] In factory 100, the second laminate 80B is inspected. For example, the surface of the second laminate 80B is inspected by inspection device 90. Inspection device 90 includes, for example, a camera. Through optical inspection by inspection device 90, inspection data of the second laminate 80B is generated. This inspection data includes second feature point information related to feature points present in the second laminate 80B.

[0065] Here, the feature points existing in the second laminate 80B refer to optical feature points existing in the roll material, specifically, spots that have optical differences from their surroundings. Furthermore, when determining optical differences from their surroundings, a predetermined threshold can be set, and points exceeding this threshold can be considered feature points. Feature points existing in the roll material are sometimes also referred to as defects, flaws, and faults of the roll material. Feature points include, for example, defects caused by poor adhesion when bonding multiple roll materials, and defects caused by uneven axis. In the bonding of multiple roll materials, for example, ultrasonic welding is used. For example, tens to tens of thousands of feature points are detected from image data of a single second laminate 80B. The total length of the second laminate 80B is, for example, several hundred meters to several kilometers. Furthermore, multiple defects, flaws, and faults existing within a predetermined area (e.g., 10 mm square) can also be considered as a single feature point.

[0066] The second feature point information related to the feature points existing in the second stack 80B includes information such as the position and size of each of the multiple feature points existing in the second stack 80B. The position of the feature points can be represented by XY coordinates, for example. Clustering of multiple closely spaced feature points is also possible within the second feature point information.

[0067] The inspection device 90 for detecting feature points present in the second laminate 80B is either a transmission type or a reflection type inspection device. The transmission type inspection device 90 illuminates light onto the second laminate 80B and receives the light transmitted through the second laminate 80B. The reflection type inspection device 90 illuminates light onto the second laminate 80B and receives the light reflected at the second laminate 80B. Both the transmission type and the reflection type inspection devices include bright-field and dark-field inspection devices, respectively. Multiple inspection devices 90 may also be configured in the factory 100.

[0068] Figure 3A and Figure 3B This is an example of the structure of a reflective inspection device 90. Figure 3A This indicates the structure of the inspection device 90 as viewed from the width direction of the second stack 80B. Figure 3B The structure of the inspection device 90 is shown as viewed from the transport direction of the second stack 80B. The inspection device 90 includes, for example, a light source 91, a camera 92, an analysis unit 93, and a storage unit 94.

[0069] In the inspection apparatus 90, the camera 92 captures images of the surface of the second stack 80B and generates image data. The number of cameras 92, the viewing angle, and the distance from the surface of the second stack 80B are appropriately set so that the entire area of ​​the second stack 80B in the width direction is captured. Figure 3B An inspection device 90 with two cameras 92 along the width direction is shown.

[0070] Light source 91 illuminates the inspection area of ​​the second laminate 80B. Light source 91 illuminates the roll-shaped second laminate 80B uniformly along its width. Here, uniform illumination means that the illuminance of the illuminated light is approximately the same.

[0071] Camera 92 is an optical sensor that optically reads the inspection area of ​​the second stack 80B. Camera 92 has imaging elements such as CCD and CMOS, as well as lenses. CCD is an abbreviation for Charge Coupled Device. CMOS is an abbreviation for Complementary Metal Oxide Semiconductor. Camera 92 generates two-dimensional image data based on the output signals of each imaging element. Camera 92 detects diffuse light in the light irradiated by light source 91 and reflected from the surface of the second stack 80B. Camera 92 can be a color camera or a monochrome camera. Camera 92 can be a camera that detects light in the visible light region or a camera that detects light in the infrared region.

[0072] Camera 92 can, for example, read the entire width of the second stack 80B at once. Preferably, the contrast of the image data captured by camera 92 is a predetermined value or higher. In other words, it is preferable that the illuminated and unilluminated areas in the second stack 80B from light source 91 have a predetermined contrast or higher. To generate image data with a contrast value of a predetermined value or higher, it is preferable to use a strong and highly direct light source 91.

[0073] Here, "strong" means, for example, when the illuminance at a distance of 50 mm is E50, the illuminance E50 is 50,000 lx or more. In addition, "high direct penetration" means, for example, when the illuminance at a distance of 50 mm is E50 and the illuminance at a distance of 100 mm is E100, (E50 - E100) / E50 < 0.5.

[0074] Camera 92 is positioned, for example, to receive orthogonal reflected light from light source 91. Camera 92 may also be positioned to avoid orthogonal reflected light from light source 91, i.e., to receive diffused light from the second stack 80B.

[0075] The analysis unit 93 consists of a CPU and RAM, etc. The analysis unit 93 reads various processing programs stored in the storage unit 94 and expands them into RAM, performing various processes in cooperation with these programs. The analysis unit 93 processes image data captured by the camera 92 and detects feature points present in the second stack 80B. For example, after performing predetermined image processing on the image data, the analysis unit 93 detects feature points and quantitatively evaluates each detected feature point. In image analysis, known techniques are used, for example. Specifically, pixels whose pixel values ​​deviate from the surrounding average by a predetermined margin are extracted as feature points. The analysis unit 93 may also use the following methods to detect feature points.

[0076] The analysis unit 93 divides the image data captured by the camera 92 into multiple regions. For example, the analysis unit 93 divides the image data into n regions in the width direction. The number of n regions can be several to several dozen. Hereinafter, the n regions will be referred to as regions a1 to an.

[0077] Next, the analysis unit 93 acquires image data for a region a1 and performs mathematical processing on the image data for region a1. Mathematical processing includes, for example, preprocessing, emphasis processing, signal processing, and image feature extraction.

[0078] Preprocessing includes, for example, image cropping, low-pass filtering, high-pass filtering, Gaussian filtering, median filtering, bilateral filtering, morphological transformation, color transformation, contrast adjustment, noise removal, restoration of blurred / jittery images, masking, Hough transform, and projective transform. Color transformations include, for example, L*a*b*, sRGB, HSV, and HSL.

[0079] The emphasis is on processing methods including, for example, the Sobel filter, the Scharr filter, the Laplacian filter, the Gabor filter, and the Canny method.

[0080] Signal processing includes, for example, the calculation of basic statistics, squares and square roots, differences, sums, products, ratios, distance matrices, differentiation and integration, thresholding, Fourier transform, wavelet transform, and peak detection. Basic statistics include, for example, maximum, minimum, mean, median, standard deviation, variance, and quartiles. Thresholding includes, for example, binarization and adaptive binarization. Peak detection includes, for example, the detection of peak value, peak count, or half-width.

[0081] Image feature extraction includes template matching and SIFT features.

[0082] After performing mathematical processing on the image data of region a1, the analysis unit 93 performs thresholding on the values ​​obtained through this processing. Thresholding is a process that determines whether a point is a feature point and the size of the feature point based on a predetermined threshold.

[0083] Analysis unit 93 performs the same processing on regions other than region a1.

[0084] After processing each region a1 to an, the analysis unit 93 integrates the results for each region a1 to an. As a result, feature points present in each region of the second stack 80B are detected, corresponding to their positions and sizes. Then, the analysis unit 93 saves the detection results of the feature points of the second stack 80B to the storage unit 94.

[0085] The analysis unit 93 can, for example, combine multiple images obtained by continuous shooting from a single camera 92. The analysis unit 93 can, for example, generate image data of the entire surface of the second stack 80B and store it in the storage unit 94. Alternatively, the analysis unit 93 can generate multiple image data corresponding to the shooting time and store them in the storage unit 94. The analysis unit 93 can also combine multiple image data obtained by multiple cameras 92 arranged in the width direction. The analysis unit 93 can, for example, determine the position of the second stack 80B in the length direction based on the shooting time by referring to the stored transport speed.

[0086] The storage unit 94 is composed of HDDs and SSDs, etc. SSD is an abbreviation for Solid State Drive. The storage unit 94 stores various processing programs and the data required to execute those programs. For example, the storage unit 94 stores image data captured by the camera 92 in association with the time of capture. The storage unit 94 stores, for example, manufacturing conditions such as the winding speed in the manufacturing apparatus 2000. The manufacturing conditions of the second laminate 80B may also be included in the process list for inspecting the DB described later.

[0087] Figure 3C This illustrates an example of a transmission-type inspection device 90. In this inspection device 90, a light source 91 is positioned opposite a camera 92, separated by a second laminate 80B.

[0088] The inspection device 90 may have multiple inspection sections. For example, the camera 92 may include a camera for detecting scratches on the surface of the second laminate 80B and a camera for detecting foreign objects inside the second laminate 80B. Inspection data may use data from a portion of the multiple inspection sections, or a combination of the results from the multiple inspection sections.

[0089] [Structure of terminal device 70]

[0090] Terminal device 70 is, for example, a computer such as a PC, smartphone, or tablet. PC is an abbreviation for Personal Computer. Terminal device 70 is configured to connect to information processing system 50. Terminal device 70 sends and receives various types of information with information processing system 50. For example, terminal device 70 is a PC used by employees of a manufacturing company operating factory 100.

[0091] Figure 4 This is a block diagram showing the general structure of the terminal device 70. The terminal device 70 includes a CPU 71, ROM 72, RAM 73, memory 74, communication interface 75, display unit 76, and operation receiving unit 77. CPU is an abbreviation for Central Processing Unit. ROM is an abbreviation for Read Only Memory. RAM is an abbreviation for Random Access Memory. All components are communicatively connected to each other via a bus 78.

[0092] CPU 71 executes the control and various arithmetic operations of the above-mentioned structures according to the program recorded in ROM 72 or memory 74.

[0093] ROM 72 stores various programs and data.

[0094] RAM 73 serves as temporary storage for programs and data in the work area.

[0095] The memory 74 stores various programs and data, including those from the operating system. For example, the memory 74 contains applications for displaying various information sent from the information processing system 50.

[0096] Communication interface 75 is an interface used for communicating with other devices. Communication interface 75 uses various communication interfaces based on wired or wireless standards. Communication interface 75 is used, for example, to send inspection data from inspection device 90 to information processing system 50 and to receive comparison information from information processing system 50.

[0097] The display unit 76 may include, for example, a liquid crystal display (LCD) or an organic EL display. The display unit 76 displays various information. The display unit 76 may also be configured with viewer software or a printer, etc.

[0098] The operation receiving unit 77 may include, for example, a touch sensor, a pointer device such as a mouse, or a keyboard. The operation receiving unit 77 accepts various user operations. Furthermore, the display unit 160 and the operation receiving unit 77 can be configured as a touch panel by overlapping the touch sensor, which serves as the operation receiving unit 77, on the display surface of the display unit 76.

[0099] The terminal device 70 can generate second feature point information by performing image analysis on image data of the second stack 80B captured by the inspection device 90. The terminal device 70, for example, sends inspection data containing the second feature point information to the information processing system 50.

[0100] Terminal device 70 may also send inspection data of the first laminate 80A to information processing system 50. This inspection data includes first feature point information relating to feature points present in the first laminate 80A. The feature points present in the first laminate 80A are optically detected, for example, by an inspection device identical to the inspection device 90 described above.

[0101] Inspection data for the first laminate 80A can also be sent to the information processing system 50 from other terminal devices. These other terminal devices could be, for example, terminal devices at the factory that manufactures the first laminate 80A.

[0102] For example, the information processing system 50 classifies each feature point into three types: a first feature point, a second feature point, and a third feature point by comparing the first feature point information and the second feature point information received from the terminal device 70.

[0103] Figure 5 This is a table used to describe the first type of feature point, the second type of feature point, and the third type of feature point. Multiple feature points existing in the first stack 80A can be classified as, for example, the first type of feature point and the third type of feature point. Feature points existing in the second stack 80B can be classified as, for example, the second type of feature point and the third type of feature point.

[0104] The first type of feature point is a feature point that exists only in the first laminate 80A and not in the second laminate 80B. That is, the first type of feature point is a feature point that disappears during the lamination process of the fourth roll 84. This first type of feature point is a feature point that, even if it exists in the first laminate 80A, has a low probability of affecting subsequent processes of the fourth roll 84. Furthermore, in this specification, feature points that do not exist in the roll or disappear do not necessarily need to be completely disappeared; rather, it also includes the concept of feature points that exist as feature points but have a low probability of becoming a problem as a defect.

[0105] The second type of feature point is a feature point that does not exist in the first laminate 80A but exists in the second laminate 80B. That is, the second type of feature point is a feature point newly generated in the lamination process of the fourth roll 84. This second type of feature point is a feature point caused by the lamination process of the fourth roll 84.

[0106] The third type of feature point exists in both the first laminate 80A and the second laminate 80B. That is, the third type of feature point is generated in a process prior to the manufacturing process of the first laminate 80A and remains in the second laminate 80B. This third type of feature point is highly likely to affect processes after the lamination process of the fourth roll 84. Furthermore, the shape or size of the third type of feature point may sometimes change due to the lamination process of the fourth roll 84 compared to when it existed in the first laminate 80A. Depending on the lamination process, other defects may also occur.

[0107] The information processing system 50 classifies and stores feature points existing in the first stack 80A and feature points existing in the second stack 80B as first feature points, second feature points, and third feature points, for example, in this way. By classifying and storing feature points as first feature points and third feature points, it is possible to know whether feature points of the first stack 80A continue to remain in the second stack 80B or have disappeared.

[0108] <Structure of Information Processing System 50>

[0109] Figure 6 This is a block diagram showing the general structure of the information processing system 50. The information processing system 50 includes, for example, a control unit 51, a storage unit 52, and a communication unit 53.

[0110] The control unit 51 includes, for example, a CPU, RAM, and ROM. The CPU is composed of a multi-core processor that executes control or various arithmetic operations of the aforementioned units according to a program. The various functions of the information processing system 50 are performed by the CPU executing its corresponding program. The specific functions of the control unit 51 will be described later.

[0111] Storage unit 52 is a large-capacity auxiliary storage device that stores various programs and data, including the operating system. As the storage device, it may be a hard disk, solid-state drive, flash memory, or ROM. Storage unit 52 may store, for example, user lists, batch lists, and inspection data databases. For example, the manager of factory 100 manages the user lists and batch lists respectively. The manager of factory 100 may be, for example, an employee of the manufacturer operating factory 100.

[0112] Figure 7A This represents an example of a user list. A user list may contain information such as each user's user ID, username, and contact information. Access rights to the database can also be set for each user, for example, allowing each user to access various data related to a specified volume.

[0113] Figure 7BThis is an example of a batch list. A batch list contains information such as the batch ID, product name, delivery destination user ID, manufacturing conditions, dimensions, and manufacturing date for each batch.

[0114] Figures 8A to 8C These represent examples of inspection data DB. Inspection data DB may include, for example, a process list of each manufacturing process of the first laminate 80A and the second laminate 80B, and inspection data for each inspection performed in each manufacturing process.

[0115] Figure 8A This is an example of a process list. The process list includes information related to the batch ID, the width and length of the roll material in each process, the process name, the elongation of the roll material, the number of layers in the roll material, the orientation of the width, and the orientation of the length. The process list also includes information related to inspections performed in each manufacturing process. Information related to each inspection includes, for example, the inspection ID of each inspection, the inspection device ID of the inspection device used in each inspection, the inspection data, and the inspection date and time. Information related to the orientation of the roll material's width and length is represented, for example, by being the same as or reversed from the orientation of the roll material's width and length in the previous process.

[0116] Figure 8B and Figure 8C Each of these represents an example of the inspection data for each inspection included in the process list. Figure 8B This represents an example of inspection data with inspection ID i0101. This inspection data is, for example, the inspection data of the first stack 80A. This inspection data contains information such as the feature point ID, position, area, length, width, maximum brightness, minimum brightness, type, and presence or absence of clustered dots of the feature points present in the first stack 80A. That is, this inspection data contains first feature point information related to the feature points present in the first stack 80A.

[0117] Figure 8C This represents an example of inspection data with inspection ID i0102. This inspection data is, for example, the inspection data of the second stack 80B. This inspection data contains information such as the feature point ID, position, area, length, width, maximum brightness, minimum brightness, type, and presence or absence of clustered dots related to the feature points present in the second stack 80B. That is, this inspection data contains second feature point information related to the feature points present in the second stack 80B.

[0118] The location of the feature points can be represented, for example, by XY coordinates based on a predetermined position of each roll. The X coordinate is, for example, the coordinate in the width direction of each roll, and can be in the range of 0 to 3000 mm. The Y coordinate is, for example, the coordinate in the length direction of each roll, and can be in the range of 0 to 10000 m.

[0119] The type of feature point represents, for example, the shape and brightness distribution of each feature point. Each feature point can be classified into approximately 5 to 20 types based on its shape and brightness distribution. The presence or absence of clustered points indicates, for example, whether multiple feature points exist around a given feature point.

[0120] The inspection data may include inspection data for the fourth roll 84. This inspection data may include, for example, information related to the feature point ID, location, area, length, width, maximum brightness, minimum brightness, type, and presence or absence of clustered dots of the feature points present in the fourth roll 84.

[0121] The communication unit 53 is an interface for network connection with external devices such as the terminal device 70.

[0122] [Functions of Information Processing System 50]

[0123] like Figure 6 As shown, the information processing system 50 functions as an acquisition unit 511, a position alignment unit 512, a comparison unit 513, and an output unit 514 by reading the program stored in the storage unit 52 through the control unit 51 and executing the processing.

[0124] The acquisition unit 511 acquires first feature point information and second feature point information. The first feature point information is information related to the feature points existing in the first stack 80A. The first feature point information includes, for example, information related to the feature point ID, position, area, length, width, maximum brightness, minimum brightness, type, and presence or absence of clustered points for each of the multiple feature points existing in the first stack 80A.

[0125] The second feature point information is information related to the feature points present in the second stack 80B. For example, the second feature point information includes information related to the feature point ID, position, area, length, width, maximum brightness, minimum brightness, type, and presence or absence of clustered points for each of the multiple feature points present in the second stack 80B.

[0126] The first feature point information and the second feature point information preferably include at least information related to the position of each feature point. The position of the feature point is represented, for example, by XY coordinates based on a predetermined position of each roll. The acquisition unit 511 acquires the first feature point information and the second feature point information from the terminal device 70, for example. The acquisition unit 511 may also acquire the first feature point information and the second feature point information from the storage unit 52.

[0127] The acquisition unit 511 can further acquire third feature point information. The third feature point information is information related to the feature points present in the fourth roll 84. The third feature point information includes, for example, information related to the feature point ID, position, area, length, width, maximum brightness, minimum brightness, type, and presence or absence of clustered dots for each of the multiple feature points present in the fourth roll 84.

[0128] The alignment unit 512 matches the XY coordinates of the first laminate 80A with the XY coordinates of the second laminate 80B. For example, the alignment unit 512 correlates predetermined feature points existing in the first laminate 80A with predetermined feature points existing in the second laminate 80B based on their relative positions. This correlation is based on first feature point information and second feature point information acquired by the acquisition unit 511. Through this feature point correlation, the XY coordinates of the first laminate 80A and the second laminate 80B are matched. The alignment unit 512 can also match the XY coordinates of the first laminate 80A, the second laminate 80B, and the fourth roll 84.

[0129] The comparison unit 513 compares the first feature point information acquired by the acquisition unit 511 with the second feature point information. The comparison unit 513 uses the result of the correspondence association performed by the position alignment unit 512 to compare the first feature point information with the second feature point information. Specifically, the comparison unit 513 classifies feature points existing in the first stack 80A and feature points existing in the second stack 80B into first-type feature points, second-type feature points, and third-type feature points through this comparison. The comparison unit 513 classifies the feature points with respect to the first stack 80A and the second stack 80B whose XY coordinates are matched by the position alignment unit 512.

[0130] Figure 9 This is an example of a comparison result between the first feature point information and the second feature point information. For example, the comparison unit 513 integrates feature points existing in the first stack 80A with feature points existing in the second stack 80B for comparison. For example, the comparison unit 513 assigns a new feature point ID to all integrated feature points. For example, for each feature point ID, the comparison unit 513 classifies the feature point into a first type of feature point, a second type of feature point, or a third type of feature point. The comparison result may include information related to the accuracy of the classification of the first, second, and third feature points.

[0131] The comparison unit 513 can also compare the first feature point information and the third feature point information acquired by the acquisition unit 511 with the second feature point information.

[0132] The output unit 514 outputs comparison information related to the comparison result between the first feature point information and the second feature point information obtained by the comparison unit 513. For example, the output unit 514 outputs the comparison information by displaying the comparison information on the display unit 76 of the terminal device 70.

[0133] The output unit 514 displays, for example, feature points present in the first laminate 80A and feature points present in the second laminate 80B on a screen of the display unit 76. On this screen, the first laminate 80A and the second laminate 80B, whose XY coordinates are matched by the positioning alignment unit 512, are displayed. The output unit 514 displays, for example, a predetermined area of ​​the second laminate 80B and a corresponding area of ​​the first laminate 80A. The output unit 514 displays, for example, feature points present in the second laminate 80B and feature points present in the first laminate 80A on the display unit 76 using different colors. The output unit 514 can also display, on the display unit 76, feature points present in each roll of material included in the first laminate 80A.

[0134] For example, on a single screen, a predetermined area of ​​the second overlay 80B and the corresponding area of ​​the first overlay 80A are displayed overlappingly. On a single screen, the predetermined area of ​​the second overlay 80B and the corresponding area of ​​the first overlay 80A can be displayed side by side.

[0135] The comparison information includes, for example, information relating to at least one of the first, second, and third feature points. The output unit 514 preferably outputs the comparison information in a manner that distinguishes the first, second, and third feature points. For example, the output unit 514 displays the first, second, and third feature points on the display unit 76 using different colors. Alternatively, the output unit 514 may also display the first, second, and third feature points on the display unit 76 using different colors.

[0136] The output unit 514 can also output comparison information related to the comparison results between the first feature point information and the third feature point information and the second feature point information obtained by the comparison unit 513.

[0137] Figure 10 This is a flowchart illustrating an example of the process of outputting comparative information performed in the information processing system 50. Figure 10 The processing of the information processing system 50 shown in the flowchart is stored as a program in the storage unit 52 of the information processing system 50 and executed by the CPU controlling each part.

[0138] (Step S31)

[0139] Information processing system 50, for example, responds to an instruction from a user via terminal device 70 to acquire inspection data of the first laminate 80A and the second laminate 80B. Thus, information processing system 50 can acquire first feature point information relating to feature points present in the first laminate 80A and second feature point information relating to feature points present in the second laminate 80B. Information processing system 50 can also acquire inspection data of the first laminate 80A and the second laminate 80B at predetermined time intervals.

[0140] (Step S32)

[0141] The information processing system 50 performs preprocessing on the inspection data to align the coordinate systems of the first stack 80A and the second stack 80B. For example, the information processing system 50 matches the XY coordinate system of the first stack 80A with the XY coordinate system of the second stack 80B.

[0142] For example, as a preprocessing step for each inspection data, the information processing system 50 reverses the Y-coordinate of the first stack 80A. The information processing system 50 can also reverse the X-coordinate of the first stack 80A. Furthermore, the information processing system 50 can transform the XY coordinates of the first stack 80A based on factors such as the elongation rate of the first stack 80A and the second stack 80B.

[0143] The information processing system 50 also performs noise removal processing as a preprocessing step for each inspection data. Noise removal processing includes, for example, removing low-intensity feature points, removing extremely small feature points, and removing consecutive dots. Noise removal processing may also include removing concentrated dots in the width direction. Concentrated dots in the width direction are, for example, generated at the front and rear ends of the first laminate 80A and the second laminate 80B.

[0144] (Step S33)

[0145] After performing preprocessing on each inspection data, the information processing system 50 performs position alignment processing between the coordinate system of the first stack 80A and the coordinate system of the second stack 80B.

[0146] Figure 11 This is a flowchart of the subroutine for the position alignment process in step S33.

[0147] (Steps S401 to S403)

[0148] The information processing system 50 first coarsely adjusts the XY coordinates of feature points of the first stack 80A and the second stack 80B in the following manner. For example, the information processing system 50 first offsets the coordinate position of a predetermined feature point of the first stack 80A by a predetermined amount. Next, the information processing system 50 calculates the distances L1 to Lm between the predetermined feature point of the first stack 80A and the corresponding feature point of the second stack 80B, and selects the offset (x1, y1) with the smallest sum. The information processing system 50 may also use an average value instead of a sum. For example, the information processing system 50 determines the feature point of the second stack 80B that has the coordinate position closest to the predetermined feature point of the first stack 80A as the feature point of the second stack 80B corresponding to the predetermined feature point of the first stack 80A. When the information processing system 50 cannot determine the feature point of the second layer 80B corresponding to the predetermined feature point of the first layer 80A, that is, when the predetermined feature point is the first type of feature point, it can exclude the feature point to calculate the sum of distances L1 to Lm.

[0149] Information processing system 50, for example, uses a fixed coarse adjustment offset 'a' as the step size, with the center offset (0, 0) as the center, to sequentially shift the coordinate positions of predetermined feature points of the first stack 80A to (-shift_x, -shift_y) to (+shift_x, +shift_y). It calculates the distances L1 to Lm from the coordinate positions of the predetermined feature points of the first stack 80A to feature points 1 to m of the second stack 80B. Then, it selects the offset (x1, y1) from (-shift_x, -shift_y) to (+shift_x, +shift_y) that minimizes the sum of distances L1 to Lm.

[0150] For example, when the coarse adjustment offset a = 1.0 mm, (-shift_x, -shift_y) = (-10 mm, -10 mm) and (-shift_x, +shift_y) = (+10 mm, +10 mm). The information processing system 50 can also use the coarse adjustment offset a to make the units in the X and Y directions different. For example, the X direction can be set to millimeters and the Y direction to meters, as (-shift_x, -shift_y) = (-10 mm, -10 m) and (-shift_x, +shift_y) = (+10 mm, +10 m).

[0151] (Steps S404 to S406)

[0152] Next, the information processing system 50 fine-tunes the XY coordinates of the feature points of the first stack 80A and the second stack 80B, and selects an offset (x2, y2). The information processing system 50 selects the offset (x2, y2) in almost the same manner as steps S401 to S403 described above. Steps S404 to S406 differ from steps S401 to S403 in the following aspects: The fine-tuning offset b in step S404 is smaller than the coarse-tuning offset a. In addition, the center offset in step S405 uses the offset (x1, y1) selected in step S403. For example, the fine-tuning offset b is sufficiently smaller than the coarse-tuning offset a, for example, by one position less than 0.1 mm.

[0153] (Step S407)

[0154] The information processing system 50 performs coordinate transformation processing on all feature points of the first stack 80A using the offset (x2, y2) selected in step S406.

[0155] (Step S408)

[0156] The information processing system 50 calculates the distances L1 to Lm after the coordinate transformation in step S407, and confirms whether the sum of distances L1 to Lm is less than a predetermined threshold. If it is above the predetermined threshold, the information processing system 50 can also determine that the coordinate transformation process in step S407 is inappropriate.

[0157] (Step S409)

[0158] If the positioning is incorrect (i.e., the condition is "yes"), the information processing system 50 terminates the process. In this case, the information processing system 50 may also display an error message on the display unit 76 or record an inability to calculate in the check data database. Conversely, if the positioning is correct (i.e., the condition is "no"), the information processing system 50 terminates the process. Figure 11 The processing, return to Figure 10 The process is then executed, and the following steps are performed: S34 and below.

[0159] (Step S34)

[0160] The information processing system 50 compares the first feature point information with the second feature point information. Specifically, the information processing system 50 compares the feature points existing in the first stack 80A with the feature points existing in the second stack 80B. For example, the coordinates of the feature points existing in the first stack 80A have undergone coordinate transformation through the processing in step S33. The information processing system 50, for example, classifies the feature points existing in the first stack 80A and the feature points existing in the second stack 80B into any one of the first type of feature point, the second type of feature point, and the third type of feature point through this comparison.

[0161] (Step S35)

[0162] The information processing system 50 outputs the comparison result of step S34 and ends the processing.

[0163] [The effects and benefits of information processing system 50]

[0164] In the information processing system 50 according to the present invention, the first feature point information and the second feature point information are compared, and comparison information related to the comparison result is output. Therefore, for example, manufacturing managers can easily identify feature points remaining from the inspection of the first laminate 80A among the feature points present in the second laminate 80B containing the opaque fourth roll 84. Thus, defects present in the second laminate 80B containing the opaque fourth roll 84 can be analyzed more easily. The effects of this operation will be explained below.

[0165] Strict quality management is required in roll materials such as optical films. This includes rigorously controlling the occurrence of defects, such as foreign objects, scratches, and dents. These roll materials are manufactured through multiple processes, with quality checks conducted at each stage.

[0166] In laminates containing opaque rolls, defect detection becomes more difficult compared to laminates consisting solely of transparent rolls. Opaque rolls may have minute irregularities on their surface or contain light-scattering materials. Consequently, irregular light scattering and reflection occur within opaque rolls. Therefore, using optical methods to inspect laminates containing opaque rolls can easily introduce noise, potentially reducing the sensitivity and accuracy of the inspection.

[0167] In contrast, in the information processing system 50, feature points existing in the second laminate 80B are compared with feature points existing in the first laminate 80A. Therefore, even if the inspection data of the second laminate 80B contains noise, feature points existing in both the first laminate 80A and the second laminate 80B can be easily identified, i.e., a third type of feature point remaining from the first laminate 80A to the second laminate 80B. Therefore, even if the inspection data of the second laminate 80B contains noise, defects existing in the second laminate 80B can be analyzed more easily.

[0168] In particular, after matching the coordinate system of the first stack 80A with the coordinate system of the second stack 80B, the information processing system 50 compares the feature points existing in the first stack 80A with the feature points existing in the second stack 80B. Therefore, it is possible to classify the feature points existing in the first stack 80A and the feature points existing in the second stack 80B into first type feature points, second type feature points, and third type feature points with high accuracy.

[0169] Furthermore, even if both the first stack 80A and the second stack 80B are opaque, the likelihood of overlapping noise between the inspection data of the first stack 80A and the second stack 80B is low. In other words, the feature points whose coordinate positions overlap between the inspection data of the first stack 80A and the second stack 80B are highly likely to be third-type feature points.

[0170] Furthermore, even if the optical films such as polarizers included in the first laminate 80A are opaque, regular transmission, reflection, and scattering of light will still occur. Therefore, unlike the protective films or diaphragms constituting the fourth roll 84, the first laminate 80A can be inspected with high sensitivity and accuracy using optical methods.

[0171] Furthermore, the information processing system 50 preferably uses third feature point information related to the feature points present in the fourth roll 84. This allows for the classification of feature points present in the first laminate 80A and feature points present in the second laminate 80B into first-type feature points, second-type feature points, and third-type feature points with higher accuracy.

[0172] Hereinafter, other embodiments of the information processing system 50 described in the first embodiment will be described. Furthermore, to avoid repetition, detailed descriptions of structures identical to those in the information processing system 50 described in the first embodiment will be omitted.

[0173] <Second Implementation Method>

[0174] Figure 12 This is a flowchart illustrating the subroutine of the position alignment processing of the information processing system 50 in the second embodiment. Figure 12 As described in the first embodiment above Figure 11 Correspondingly, the information processing system 50 uses kernel density inference to align the XY coordinates of the first stack 80A with the XY coordinates of the second stack 80B. In this respect, the information processing system 50 of the second embodiment differs from the information processing system 50 of the first embodiment described above. Apart from this, the information processing system 50 of the second embodiment has the same structure as the information processing system 50 of the first embodiment described above and performs the same function.

[0175] (Step S451)

[0176] The information processing system 50 obtains a probability density function by performing kernel density estimation on the feature points of the first laminate 80A. Kernel density estimation is performed in two dimensions, using a Gaussian kernel as the kernel function. For bandwidth, a predetermined value is used, for example. For instance, a table corresponding to the product name of the roll material and its bandwidth is stored in the storage unit 52. The information processing system 50 can use the bandwidth value corresponding to the product name of the roll material, or it can use different bandwidth values ​​depending on the number of feature points present in the first laminate 80A. When estimating the kernel density of a predetermined feature point, the information processing system 50 considers the data surrounding that feature point. Then, the information processing system 50 sums the densities of each feature point to obtain the probability density function.

[0177] Figure 13 This represents an example of a probability density function calculated using kernel density inference. Figure 13 The vertical and horizontal axes represent the XY coordinates, and the shades of color represent the density.

[0178] (Step S452)

[0179] The information processing system 50 obtains the probability density function of each feature point of the second stack 80B in the same way as the processing in step S451.

[0180] (Steps S453 to S455)

[0181] The information processing system 50 compares the two obtained probability density functions and performs a corresponding correlation based on the density distribution. Then, the information processing system 50 calculates the transformation matrix based on the result of the corresponding correlation and performs a coordinate transformation of the XY coordinates on the feature points of the first stack 80A.

[0182] (Steps S456-S457)

[0183] Information processing system 50 and Figure 11 Steps S406 to S407 are performed in the same way as steps S456 to S457.

[0184] The information processing system 50 can use kernel density inference at all positions of the XY coordinates of the first stack 80A and the XY coordinates of the second stack 80B, or it can use kernel density inference at a portion of the positions.

[0185] The information processing system 50 of this second embodiment, like that described in the first embodiment, compares the first feature point information and the second feature point information, and outputs comparison information related to the comparison result. Therefore, it is easier to analyze defects existing in the second laminate 80B.

[0186] Furthermore, in kernel density estimation, feature points of the first laminate 80A and the second laminate 80B are not determined one-to-one, but rather the presence probability of feature points is utilized using a probability density function. Therefore, even if the fourth roll 84 is opaque and the second feature point information contains a lot of noise, the accuracy of feature point extraction and classification can be guaranteed. Therefore, the information processing system 50 can appropriately use kernel density estimation.

[0187] The information processing system 50 can also align the XY coordinates of the first stack 80A and the second stack 80B before stacking using other methods. For example, the information processing system 50 can perform kernel density estimation of the feature points of one of the first stack 80A and the second stack 80B. In this case, the information processing system 50 compares the obtained probability density function with the feature points of the other stack. Thus, the information processing system 50 can align the XY coordinates of the first stack 80A and the second stack 80B.

[0188] <Third Implementation Method>

[0189] Figure 14 This is an example of the cross-sectional structure of the laminate 80C to which the information processing system 50 of the third embodiment is applied. Figure 14 As described in the first embodiment Figure 2 Correspondingly, the laminate 80C includes a fifth roll 85 and a sixth roll 86 on the fifth roll 85. The sixth roll 86 is formed by coating the fifth roll 85. In this respect, the information processing system 50 of the third embodiment differs from the information processing system 50 of the first embodiment described above. Apart from this, the information processing system 50 of the third embodiment has the same structure as the information processing system 50 of the first embodiment described above and performs the same function. Here, the fifth roll 85 corresponds to a specific example of the first roll of the present invention, and the sixth roll 86 corresponds to a specific example of the second roll of the present invention.

[0190] The fifth roll 85 is, for example, a substrate film. The fifth roll 85 is, for example, transparent and has a haze of less than 2%. The sixth roll 86 is opaque and has a haze of more than 5%. The sixth roll 86 is, for example, an anti-glare layer.

[0191] Figure 15This illustrates an example of the manufacturing process for laminate 80C. For instance, a fifth roll 85 is manufactured in factory 100A. In factory 100A, feature points present in the fifth roll 85 are inspected by inspection device 90A. The fifth roll 85 is then transported to factory 100B. The fifth roll 85 may also be transported to other factories. In factory 100B, a sixth roll 86 is coated onto the fifth roll 85 to manufacture laminate 80C. In factory 100B, feature points present in laminate 80C are inspected by inspection device 90B. Factory 100A is provided, for example, with manufacturing apparatus 2000A, and factory 100B is provided, for example, with manufacturing apparatus 2000B.

[0192] The information processing system 50 compares the first feature point information related to the feature points existing in the fifth roll 85 with the second feature point information related to the feature points existing in the laminate 80C, and outputs the comparison information.

[0193] The information processing system 50 of this third embodiment, like that described in the first embodiment, compares the first feature point information and the second feature point information, and outputs comparison information related to the comparison result. Therefore, it is easier to analyze defects existing in the laminate 80C.

[0194] Regarding the structure of the information processing system 50 described above, the main structure has been explained when describing the features of the above embodiments, but the system is not limited to the above structure, and various modifications can be made within the scope of the claims. Furthermore, structures typically found in information processing apparatuses or systems are not excluded. For example, the information processing system 50 may include an inspection device 90. Additionally, the control unit 51 of the information processing system 50 may also perform the function of generating feature points for the analysis unit 93 of the inspection device 90.

[0195] For example, in the above embodiments, an example of the first roll of the present invention having an opaque optical film such as a polarizer was described; however, the first roll may also contain other opaque rolls. The first roll may also contain, for example, a steel plate or an anti-glare film. The first roll may also be transparent. A transparent first roll, for example, has a haze of 2% or less. A transparent first roll may be, for example, a transparent optical film, a hard coating, an anti-reflective layer, or a liquid crystal layer. The second roll of the present invention may also contain an opaque optical film such as a polarizer, a plastic film, a steel plate, or paper.

[0196] Furthermore, the means and methods for performing various processes in the information processing system 50 described above can be implemented using either dedicated hardware circuitry or a programmed computer. The program described above can be provided, for example, by a computer-readable recording medium such as a USB memory or DVD-ROM, or it can be provided online via a network such as the Internet. In this case, the program recorded on the computer-readable recording medium is typically transferred and stored in a storage unit such as a hard disk. Furthermore, the program described above can be provided as standalone application software, or it can be embedded as a function of the device in the device's software. DVD is an abbreviation for Digital Versatile Disc.

[0197] Embodiments of the present invention have been described and illustrated in detail; however, the disclosed embodiments are for illustrative and exemplary purposes only and are not intended to be limiting. The scope of the invention should be interpreted by the wording of the appended claims.

[0198] This application is based on Japanese Patent Application No. 2024-59896, filed on April 3, 2024, the disclosure of which is referenced and incorporated herein by reference in its entirety.

[0199] Explanation of reference numerals in the attached figures

[0200] 50 Information Processing System

[0201] 51 Control Department

[0202] 511 Acquisition Department

[0203] 512 Position Alignment Unit

[0204] 513 Comparison Section

[0205] 514 Output Section

[0206] 52 Storage Department

[0207] 90 Inspection device

[0208] 2000 Manufacturing Plant

Claims

1. An information processing system, comprising: The acquisition unit acquires first feature point information related to feature points existing in the first roll and second feature point information related to feature points existing in the laminate, wherein the laminate is obtained by laminating the first roll with an opaque second roll; The comparison unit compares the acquired first feature point information with the second feature point information; as well as The output unit outputs comparison information related to the comparison results of the first feature point information and the second feature point information.

2. The information processing system according to claim 1, wherein, The comparison unit classifies feature points existing in the first roll and feature points existing in the laminate into three categories: first feature points that exist in the first roll but disappear in the laminate; second feature points that do not exist in the first roll but appear in the laminate; and third feature points that exist in the first roll and remain in the laminate. The comparison information includes information related to at least one of the first feature point, the second feature point, and the third feature point.

3. The information processing system according to claim 1, wherein, The acquisition unit also acquires information about third feature points present in the second roll material. The comparison unit compares the acquired first feature point information and third feature point information with the second feature point information.

4. The information processing system according to claim 1, wherein, It also includes a position alignment unit that correlates feature points existing in the first roll and feature points existing in the laminate based on their relative positions. The comparison unit uses the corresponding association results to compare the first feature point information and the second feature point information.

5. The information processing system according to claim 1, wherein, The output unit outputs the comparison information by causing the display unit to display the comparison information.

6. The information processing system according to claim 1, wherein, The first roll has a stacked structure of multiple rolls.

7. The information processing system according to claim 1, wherein, The second roll material includes at least one of a protective film, a diaphragm, or an anti-glare film.

8. The information processing system according to claim 1, wherein, The second roll has a haze of more than 5%.

9. An information processing method, comprising: Acquire first feature point information related to feature points existing in the first roll and second feature point information related to feature points existing in the laminate, wherein the laminate is obtained by laminating the first roll with an opaque second roll; Compare the obtained first feature point information with the second feature point information; as well as Output comparison information related to the comparison results of the first feature point information and the second feature point information.

10. An information processing program for causing a computer to execute the information processing method of claim 9.

Images