Solid state disk chip test fixture

Abstract

The utility model discloses a solid state disk chip test fixture, which comprises a test fixture main body, the test fixture main body comprises a vertical frame, a test host, a test pressing plate and a test bottom plate, the vertical frame is fixedly installed on the upper surface of the test host through bolts, and the test bottom plate is arranged at the middle position of the upper surface of the test host; by designing a uniform stress down-regulation mechanism, when the test fixture main body is used, two driven wheels and two screw rods can be rotated by a driving assembly, moving blocks are driven to move when the screw rods rotate, and a test pressing plate is driven to press down when the two moving blocks move; the testing pressing plate is stably pressed down to the surface of the testing bottom plate to be in tight contact with the surface of the solid state disk chip for testing, so that the testing pressing plate is uniformly stressed and pressed down conveniently, the pressing contact is more tight during testing, and the uniform stress of the testing jig main body on the pressing adjustment of the testing operation of the solid state disk chip and the testing sensitivity are improved.

Description

Technical Field

[0001] The utility model belongs to the technical field of testing fixtures, and in particular relates to a solid state hard disk chip testing fixture. Background Art

[0002] A solid-state hard disk, also known as a solid-state drive, is a hard disk made of a solid-state electronic storage chip array. The entire solid-state hard disk is composed entirely of electronic chips and circuit boards. During the processing and production of solid-state hard disk chips, they need to be tested and operated. Usually, the solid-state hard disk chips are tested by a test fixture. The existing test fixture is a device used for testing and inspection during the processing and production of solid-state hard disk chips. When the device is used for testing, it is easy to evenly force downward adjustment and compaction test, and the contact is more tightly pressed during the test, thereby improving the uniform force and test sensitivity of the test fixture for the test operation of the solid-state hard disk chip.

[0003] When testing a solid-state hard disk chip, the existing test fixture places the solid-state hard disk chip by pressing the hand-held rod to slide the slide bar, and the slide bar slides down to press the test pressure plate to the surface of the solid-state hard disk chip for testing. Therefore, when testing the solid-state hard disk chip, the slide bar is directly pressed down to the middle position of the test pressure plate for a downward pressure test. The test pressure plate is subjected to force in the middle. The test pressure plate has a certain length, and the force on the end of the test pressure plate is weaker. The end is not easy to press tightly to contact the surface of the solid-state hard disk chip for testing, which makes the test operation insensitive, affecting the uniform force of the test fixture for the downward pressure adjustment of the solid-state hard disk chip test operation and the test sensitivity. For this reason, the utility model proposes a solid-state hard disk chip test fixture. Utility Model Content

[0004] The purpose of the utility model is to provide a solid-state hard disk chip test fixture to solve the problem proposed in the above background technology that when the test fixture tests the solid-state hard disk chip, the middle of the test pressure plate is stressed, the test pressure plate has a certain length, the force on the ends of the test pressure plate is weaker, and the ends are not easy to press tightly to contact the surface of the solid-state hard disk chip for testing, which makes the test operation insensitive and affects the uniform force of the test fixture for the downward pressure adjustment of the solid-state hard disk chip test operation and the test sensitivity.

[0005] To achieve the above object, the utility model provides the following technical solutions: a solid-state hard disk chip test fixture, comprising a test fixture body, the test fixture body comprising a stand, a test host, a test pressure plate and a test bottom plate, the stand is fixedly mounted on the upper surface of the test host by bolts, the test bottom plate is arranged at the middle position of the upper surface of the test host, the test pressure plate is arranged inside the stand, and the test fixture body is also provided with:

[0006] A uniform force downward adjustment mechanism, and the uniform force downward adjustment mechanism includes a moving adjustment component, a driving component and a sliding control component, wherein the moving adjustment component is arranged on both sides of the interior of the stand, the driving component is arranged on the interior top of the stand, and the sliding control component is arranged at the connection between the end of the test platen and the inner side of the stand;

[0007] The protection mechanism comprises a protection component and a rotation fixing component. The protection component is arranged on the surface of the test base plate, and the rotation fixing component is arranged on one end of the upper surface of the test base plate.

[0008] Preferably, the movable adjustment component includes a groove opened at the top end of the stand, and a screw rod is rotatably connected at the middle position of both sides of the stand, and the end of the screw rod is located inside the groove and a driven wheel is installed, and a moving block is provided on the outer surface of the screw rod, and the end of the moving block is fixedly connected to the middle position of the end of the test plate by a screw.

[0009] Preferably, the two moving blocks are symmetrically arranged, and the test platen and the interior of the stand are movably connected to the screw rod through the moving blocks.

[0010] Preferably, the driving assembly includes a forward and reverse motor fixedly mounted on the top of the stand by screws, the end of the forward and reverse motor is located inside the groove and a driving wheel is installed therein, a belt is provided on the outer surface of the driving wheel, and the driving wheel and the driven wheel are rotationally connected by the belt.

[0011] Preferably, the sliding control assembly includes two sliding holes opened at the ends of the test pressure plate, a control sliding rod is arranged inside the sliding hole, and the ends of the control sliding rod are fixedly connected to the inner top end of the stand and the surface of the test host by screws.

[0012] Preferably, the protection component includes a mounting groove opened at the end of the test base plate, both sides of the mounting groove are provided with card slots, a guard plate is arranged inside the mounting groove, and both ends of the guard plate are provided with card plates.

[0013] Preferably, the clamping plate is slidably connected to the internal structure of the clamping slot, and the guard plate is clamped and connected to the interior of the mounting slot through the clamping plate and the clamping slot.

[0014] Preferably, the rotation fixing assembly includes two fixing screws screwed together at one end of the upper surface of the test base plate, internal threaded holes are formed at both ends of the clamping plate, and the ends of the fixing screws are consistent with the internal structure of the internal threaded holes.

[0015] Compared with the prior art, the beneficial effects of the utility model are:

[0016] By designing a uniform force downward adjustment mechanism, when the test fixture body is in use, the driving component can rotate the two driven wheels and the two lead screws, and the rotation of the lead screw drives the moving block to move, and the two moving blocks drive the test pressure plate to be pressed down, so that the test pressure plate is stably pressed down to the surface of the test base plate and tightly pressed and contacted with the surface of the solid-state hard disk chip for testing, which facilitates the uniform force downward pressure of the test pressure plate, and more tightly pressed and contacted during testing, thereby improving the uniform force of the test fixture body for the solid-state hard disk chip test operation downward pressure adjustment and the test sensitivity. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 It is a schematic diagram of the structure of the utility model;

[0018] Figure 2 It is a schematic diagram of the cross-sectional structure of the test platen and the stand of the utility model;

[0019] Figure 3 For this utility model Figure 1 The enlarged structural diagram of part A in the middle;

[0020] Figure 4 It is a schematic diagram of the structure of the guard plate, the clamping plate and the fixing screw of the utility model;

[0021] Figure 5 For this utility model Figure 4 The enlarged structural diagram of part B in the middle;

[0022] In the figure: 100, test fixture body; 101, stand; 102, test host; 103, test pressure plate; 1031, forward and reverse motor; 1032, moving block; 1033, control slide rod; 1034, slide hole; 1035, belt; 1036, driven wheel; 1037, driving wheel; 1038, groove; 1039, screw rod; 104, test bottom plate; 1041, guard plate; 1042, mounting groove; 1043, clamping plate; 1044, clamping groove; 1045, fixing screw; 1046, internal threaded hole. DETAILED DESCRIPTION

[0023] The following will be combined with the drawings in the embodiments of the utility model to clearly and completely describe the technical solutions in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all of the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.

[0024] See also Figures 1 to 5The utility model provides a technical solution: a solid-state hard disk chip test fixture, including a test fixture body 100, the test fixture body 100 includes a stand 101, a test host 102, a test plate 103 and a test bottom plate 104, the stand 101 is fixedly installed on the upper surface of the test host 102 by bolts, the test bottom plate 104 is arranged in the middle position of the upper surface of the test host 102, the test plate 103 is arranged inside the stand 101, and the test fixture body 100 is also provided with:

[0025] A uniform force downward adjustment mechanism is provided, and the uniform force downward adjustment mechanism includes a movable adjustment component, a driving component and a sliding control component. The movable adjustment component is arranged on both sides of the interior of the stand 101, the driving component is arranged on the internal top of the stand 101, and the sliding control component is arranged at the connection between the end of the test pressure plate 103 and the inner side of the stand 101. When the test fixture body 100 is testing the solid-state hard disk chip, the uniform force downward adjustment operation can be performed on the end of the test pressure plate 103 by the uniform force downward adjustment mechanism, so that the contact is tighter during the test, thereby improving the uniform force and test sensitivity of the test fixture body 100 in the downward adjustment operation of the solid-state hard disk chip test.

[0026] In order to facilitate the uniform force downward test on the end of the test platen 103 by moving the adjustment component, in the present embodiment, preferably, the adjustment component includes a groove 1038 opened at the top of the inner part of the stand 101, and the middle positions on both sides of the stand 101 are rotatably connected with screw rods 1039, and the ends of the screw rods 1039 are located in the grooves 1038 and driven wheels 1036 are installed inside, so that the driven wheels 1036 can rotate to drive the screw rod 1039 to rotate, and the screw rod 1039 can be rotated in situ for adjustment, and the outer surface of the screw rod 1039 is provided with a moving block 1032, and the ends of the moving block 1032 are connected to the inner part of the grooves 1038. The middle position of the end of the test platen 103 is fixedly connected by screws, and the two moving blocks 1032 are symmetrically arranged, and the test platen 103 is movably connected to the inside of the stand 101 through the moving blocks 1032 and the screw rod 1039. When the screw rod 1039 rotates, the moving blocks 1032 move on the outer surface of the screw rod 1039, so that the two moving blocks 1032 can move to drive the end of the test platen 103 to move and adjust downward pressure, and the downward pressure adjustment is evenly force-bearing, and the contact is tighter during testing, thereby improving the uniform force and test sensitivity of the test fixture main body 100 for the downward pressure adjustment of the solid-state hard disk chip test operation.

[0027] In order to facilitate the rotation of the driven wheel 1036 through the driving component and facilitate the rotation adjustment, in the present embodiment, preferably, the driving component includes a forward and reverse motor 1031 fixedly mounted on the top of the stand 101 by screws, the end of the forward and reverse motor 1031 is located inside the groove 1038 and a driving wheel 1037 is installed, the outer surface of the driving wheel 1037 is provided with a belt 1035, and when the forward and reverse motor 1031 is powered on, it drives the driving wheel 1037 to rotate, and the rotation of the driving wheel 1037 drives the two belts 1035 to rotate, which is convenient for rotation adjustment, the driving wheel 1037 is rotationally connected to the driven wheel 1036 through the belt 1035, and the rotation of the belt 1035 drives the two driven wheels 1036 to rotate and adjust, which is convenient for rotation operation.

[0028] In order to facilitate the stable control of the test platen 103 during movement and adjustment through the sliding control component, in the present embodiment, preferably, the sliding control component includes two sliding holes 1034 opened at the end of the test platen 103, and a control slide rod 1033 is arranged inside the sliding hole 1034. The end of the control slide rod 1033 is fixedly connected to the inner top end of the stand 101 and the surface of the test host 102 by screws. When the test platen 103 moves, it drives the control slide rod 1033 to slide inside the sliding hole 1034, and the test platen 103 is stably slidably controlled to perform a downward pressure test.

[0029] A protective mechanism includes a protective component and a rotating fixed component. The protective component is arranged on the surface of the test base plate 104, and the rotating fixed component is arranged at one end of the upper surface of the test base plate 104. After the test fixture body 100 tests the solid-state hard disk chip, the protective mechanism is used to protect the surface of the test base plate 104, so that dust is not easy to fall into and affect the re-testing effect, thereby improving the protective effect of the test fixture body 100 on the test base plate 104 after the solid-state hard disk chip test operation.

[0030] In order to facilitate the closed protection of the surface of the test base plate 104 through the protection component, in the present embodiment, preferably, the protection component includes a mounting groove 1042 opened at the end of the test base plate 104, and card slots 1044 are opened on both sides of the mounting groove 1042. A protective plate 1041 is arranged inside the mounting groove 1042, so that the protective plate 1041 can be closed on the surface of the test base plate 104 for protection and use, and it is not easy to fall into dust and affect the reuse. Card plates 1043 are arranged at both ends of the protective plate 1041, and the card plate 1043 is slidably connected with the internal structure of the card slot 1044, and the protective plate 1041 is connected to the inside of the mounting groove 1042 through the card plate 1043 and the card slot 1044. The card plate 1043 slides inside the card slot 1044 to adjust the sliding of the protective plate 1041, so as to facilitate the opening or closing of the protective plate 1041.

[0031] In order to facilitate the opening or closing of the guard plate 1041 for fixing and placing it by means of a rotating fixing assembly, in the present embodiment, preferably, the rotating fixing assembly includes two fixing screws 1045 which are screwed together at one end of the upper surface of the test base plate 104, and internal threaded holes 1046 are provided at both ends of the clamping plate 1043, and the end of the fixing screw 1045 is consistent with the internal structure of the internal threaded hole 1046. After the guard plate 1041 is opened or closed on the surface of the test base plate 104, the rotating fixing screw 1045 is embedded in the internal threaded hole 1046 to fix and install the guard plate 1041, making it easy to fix and place it.

[0032] The working principle and use process of the utility model: when using the solid-state hard disk chip test fixture, the solid-state hard disk chip to be tested is placed inside the test base plate 104, the forward and reverse motor 1031 drives the driving wheel 1037 to rotate, the driving wheel 1037 rotates to drive the two belts 1035 to rotate, the belt 1035 rotates to drive the two driven wheels 1036 and the two screw rods 1039 to rotate, the screw rod 1039 rotates to drive the moving block 1032 to move on the outer surface of the screw rod 1039, and the two moving blocks 1032 When moving, the test pressing plate 103 is driven to be pressed down, and the pressing sliding hole 1034 of the test pressing plate 103 slides with the control sliding rod 1033 to stably control the pressing down of the test pressing plate 103, so that the test pressing plate 103 is stably pressed down to the surface of the test bottom plate 104 and tightly pressed and contacted with the surface of the solid-state hard disk chip for testing. Therefore, when the test pressing plate 103 is pressed down for testing, it is convenient to press the test pressing plate 103 evenly, and the contact is more tightly pressed during the test, thereby improving the uniform force of the test fixture body 100 for the pressing adjustment of the solid-state hard disk chip test operation and the test sensitivity;

[0033] Then, after the test fixture body 100 tests the solid-state hard disk chip, the card plate 1043 slides inside the card slot 1044 to slide the protective plate 1041 closed on the surface of the test base plate 104, and the rotating fixing screw 1045 is embedded in the internal threaded hole 1046 to fix the protective plate 1041 to be installed, so that the protective plate 1041 can protect the surface of the test base plate 104 when not in use, and dust is not easy to fall into it to affect the re-testing effect, thereby improving the protective effect of the test fixture body 100 on the test base plate 104 after the solid-state hard disk chip test operation. When the test fixture body 100 is in use, the protective plate 1041 is opened and fixed by the opposite operation, and the test base plate 104 is exposed to the outside for testing.

[0034] Although the embodiments of the present invention have been shown and described (see the above detailed description for details), it will be understood by those skilled in the art that various changes, modifications, substitutions and variations may be made to these embodiments without departing from the principles and spirit of the present invention, and the scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. A solid state hard disk chip test fixture, comprising a test fixture body (100), wherein the test fixture body (100) comprises a stand (101), a test host (102), a test pressure plate (103) and a test bottom plate (104), wherein the stand (101) is fixedly mounted on the upper surface of the test host (102) by bolts, the test bottom plate (104) is arranged at the middle position of the upper surface of the test host (102), and the test pressure plate (103) is arranged inside the stand (101), characterized in that: The test fixture body (100) is also provided with: A uniform force downward adjustment mechanism, wherein the uniform force downward adjustment mechanism comprises a movable adjustment component, a drive component and a sliding control component, wherein the movable adjustment component is arranged on both sides of the interior of the stand (101), the drive component is arranged at the top of the interior of the stand (101), and the sliding control component is arranged at the connection between the end of the test pressing plate (103) and the inner side of the stand (101); The protection mechanism comprises a protection component and a rotation fixing component. The protection component is arranged on the surface of a test base plate (104), and the rotation fixing component is arranged on one end of the upper surface of the test base plate (104).

2. A solid state drive chip test fixture according to claim 1, characterized in that: The movable adjustment component includes a groove (1038) opened at the top end of the stand (101), and screw rods (1039) are rotatably connected at the middle positions on both sides of the stand (101). The ends of the screw rods (1039) are located inside the grooves (1038) and are equipped with driven wheels (1036). The outer surface of the screw rod (1039) is provided with a movable block (1032), and the end of the movable block (1032) is fixedly connected to the middle position of the end of the test plate (103) by screws.

3. A solid state drive chip test fixture according to claim 2, characterized in that: The two moving blocks (1032) are symmetrically arranged, and the test platen (103) and the interior of the stand (101) are movably connected to the screw rod (1039) via the moving blocks (1032).

4. A solid state drive chip test fixture according to claim 2, characterized in that: The driving assembly comprises a forward and reverse motor (1031) fixedly mounted on the top of the stand (101) by means of screws, the end of the forward and reverse motor (1031) being located inside a groove (1038) and having a driving wheel (1037) mounted thereon, a belt (1035) being disposed on the outer surface of the driving wheel (1037), and the driving wheel (1037) and the driven wheel (1036) being rotationally connected via the belt (1035).

5. The solid state drive chip test fixture according to claim 1, characterized in that: The sliding control assembly comprises two sliding holes (1034) opened at the ends of the test pressing plate (103), a control sliding rod (1033) is arranged inside the sliding hole (1034), and the ends of the control sliding rod (1033) are fixedly connected to the inner top end of the stand (101) and the surface of the test host (102) by screws.

6. The solid state drive chip test fixture according to claim 1, characterized in that: The protection component comprises a mounting groove (1042) provided at the end of the test base plate (104), a clamping groove (1044) is provided on both sides of the mounting groove (1042), a guard plate (1041) is provided inside the mounting groove (1042), and clamping plates (1043) are provided at both ends of the guard plate (1041).

7. A solid state drive chip test fixture according to claim 6, characterized in that: The clamping plate (1043) is slidably connected to the internal structure of the clamping slot (1044), and the guard plate (1041) and the interior of the installation slot (1042) are clamped and connected with the clamping slot (1044) through the clamping plate (1043).

8. The solid state drive chip test fixture according to claim 6, characterized in that: The rotating fixing assembly comprises two fixing screws (1045) screwed together at one end of the upper surface of the test base plate (104); internal threaded holes (1046) are provided at both ends of the clamping plate (1043); and the ends of the fixing screws (1045) are matched with the internal structure of the internal threaded holes (1046).

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