IO module test frame

Abstract

The utility model discloses an IO module test frame, which belongs to the technical field of test frames and comprises a probe test platform, a first test probe assembly, a second test probe assembly and a third test probe assembly are sequentially mounted on the probe test platform from right to left, and a mounting plate is arranged on the outer side of the probe test platform. A sliding mechanism is mounted between the mounting plate and the probe testing platform, an electric telescopic rod is mounted at the upper end of the mounting plate in an embedded manner, a connecting plate is fixedly connected to the lower end of the electric telescopic rod, a clamping mechanism is mounted on the connecting plate, and an insertion buffer mechanism is mounted between the connecting plate and the mounting plate; according to the scheme, in the process that the electric telescopic rod drives the IO module product and the adapter assembly to be in butt joint with the test probe, buffering can be carried out through the insertion buffering mechanism in the insertion process, the insertion strength is reduced, damage to the IO module product and the adapter assembly or the test probe caused by too large strength is avoided, and the test effect is guaranteed.

Description

Technical Field

[0001] The utility model relates to the technical field of test racks, and more specifically to an IO module test rack. Background Art

[0002] The test stand is a tool used to assist in product performance testing. In the PLC field, IO module products need to undergo multiple performance and functional tests during production. Generally, a series of adapters are selected to connect to the IO module products, and then the IO module products and adapter components are placed on the test stand and connected to the detection probes. Then, the test signals are drawn out through the test connection of multiple lines to achieve module testing.

[0003] At present, during the connection operation of IO module products and adapter components with detection probes, electric equipment is generally used for operation, and the docking interfaces and detection probes of IO module products and adapter components are relatively delicate and small. Excessive force during the docking process can easily cause damage to the docking interfaces or detection probes of IO module products and adapter components, affecting subsequent tests and resulting in poor use effects. Therefore, there is an urgent need to improve the technology of the test frame structure to perfect this equipment.

[0004] To this end, the utility model provides an IO module test rack. Utility Model Content

[0005] 1. Technical issues to be solved

[0006] In view of the problems existing in the prior art, the purpose of the utility model is to provide an IO module test stand, which can realize that in the process of an electric telescopic rod driving an IO module product and an adapter assembly to dock with a test probe, a plug-in buffer mechanism can be used to buffer the plug-in process, thereby reducing the plug-in force and avoiding damage to the IO module product and the adapter assembly or the test probe due to excessive force, thereby ensuring the test effect.

[0007] 2. Technical solution

[0008] To solve the above problems, the utility model adopts the following technical solutions.

[0009] An IO module test stand comprises a probe test platform, on which a first test probe assembly, a second test probe assembly and a third test probe assembly are installed in sequence from right to left, a mounting plate is provided on the outer side of the probe test platform, and a sliding mechanism is installed between the mounting plate and the probe test platform, an electric telescopic rod is embedded and installed on the upper end of the mounting plate, and a connecting plate is fixedly connected to the lower end of the electric telescopic rod, a clamping mechanism is installed on the connecting plate, and a plug-in buffer mechanism is installed between the connecting plate and the mounting plate.

[0010] Furthermore, the sliding mechanism includes a pair of electric slide rails respectively installed on the front and rear ends of the probe test platform, and a driving slider is provided on the pair of electric slide rails, and the driving slider is slidably connected to the pair of electric slide rails, and the upper ends of the pair of driving sliders are fixedly connected to the lower end of the mounting plate.

[0011] Furthermore, the clamping mechanism includes telescopic cylinders respectively embedded in the front and rear ends of the connecting plate, the output ends of a pair of telescopic cylinders are fixedly connected with clamping plates, and the ends of a pair of clamping plates close to each other are fixedly connected with anti-slip rubber pads.

[0012] Furthermore, the plug-in buffer mechanism includes a pair of fixed frames embedded in the upper end of the mounting plate, the lower ends of the pair of fixed frames are each provided with a through hole, the lower sides of the pair of fixed frames are each provided with a downward pressing connecting rod, and the upper ends of the downward pressing connecting rod pass through the through hole and extend into the fixed frame, the upper ends of the downward pressing connecting rod are fixedly connected to a movable plate, and the outer ends of the movable plate are rotatably connected to a pair of gears, the inner walls of the front and rear ends of the fixed frame are fixedly connected to racks, and the gears are meshed with the racks, the outer ends of the downward pressing connecting rods are sleeved with a tension spring, and the upper and lower ends of the tension spring are respectively fixedly connected to the movable plate and the fixed frame.

[0013] Furthermore, two pairs of left-right symmetrical support columns are fixedly connected to the lower end of the probe testing platform.

[0014] 3. Beneficial effects

[0015] Compared with the prior art, the beneficial effects of the present invention are as follows:

[0016] (1) The utility model can clamp and fix the IO module product and adapter assembly to be tested through the clamping mechanism, so that they can remain stable during the subsequent testing process. At the same time, the sliding mechanism can drive the IO module product and the adapter assembly to move horizontally. Different types of test probes can be selected for docking and testing according to test requirements, thereby expanding the scope of test application and improving test practicality.

[0017] (2) In the present invention, when the electric telescopic rod drives the IO module product and the adapter assembly to dock with the test probe, the plug-in buffer mechanism can provide buffering during the plug-in process, reduce the plug-in force, avoid damage to the IO module product and the adapter assembly or the test probe due to excessive force, and ensure the test effect. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1 It is a schematic diagram of the overall structure of the utility model;

[0019] Figure 2 It is a partial three-dimensional structural schematic diagram of the utility model;

[0020] Figure 3 It is a partial cross-sectional structural schematic diagram of the plug-in buffer mechanism in the utility model.

[0021] Description of the numbers in the figure:

[0022] 1. Probe test platform; 2. First test probe assembly; 3. Second test probe assembly; 4. Third test probe assembly; 5. Sliding mechanism; 501. Electric slide rail; 502. Driving slider; 6. Mounting plate; 7. Electric telescopic rod; 8. Connecting plate; 9. Clamping mechanism; 901. Telescopic cylinder; 902. Clamping plate; 903. Anti-slip rubber pad; 10. Plug-in buffer mechanism; 1001. Fixed frame; 1002. Press-down connecting rod; 1003. Movable plate; 1004. Tension spring; 1005. Gear; 1006. Rack; 11. Support column. DETAILED DESCRIPTION

[0023] The technical solutions in the embodiments of the utility model will be clearly and completely described below in conjunction with the drawings in the embodiments of the utility model; it is obvious that the described embodiments are only part of the embodiments of the utility model, rather than all of the embodiments, and all other embodiments obtained by ordinary technicians in this field based on the embodiments of the utility model without making creative work are within the scope of protection of the utility model.

[0024] Example:

[0025] See also Figure 1-3 A IO module test stand comprises a probe test platform 1, on which a first test probe assembly 2, a second test probe assembly 3 and a third test probe assembly 4 are installed in sequence from right to left, a mounting plate 6 is provided on the outer side of the probe test platform 1, and a sliding mechanism 5 is installed between the mounting plate 6 and the probe test platform 1, an electric telescopic rod 7 is embedded and installed on the upper end of the mounting plate 6, and a connecting plate 8 is fixedly connected to the lower end of the electric telescopic rod 7, a clamping mechanism 9 is installed on the connecting plate 8, and a plug-in buffer mechanism 10 is installed between the connecting plate 8 and the mounting plate 6.

[0026] During use of this solution, the IO module product and the adapter assembly to be tested are first placed on the connecting plate 8, and a pair of telescopic cylinders 901 in the clamping mechanism 9 are driven to work, driving a pair of clamping plates 902 to clamp and fix them, so that they remain stable during subsequent tests. Then, the electric slide rail 501 in the sliding mechanism 5 drives the driving slider 502 to move, so that it drives the mounting plate 6 and the connecting plate 8 to move, prompting the IO module product and the adapter assembly to move as well. According to the test docking requirements, the first test probe assembly 2 or the second test probe assembly 3 or the third test probe assembly 4 is selected for docking. After moving to the corresponding test probe, the electric telescopic rod 7 squeezes the connecting plate 8 to The downward movement drives the IO module product and the adapter assembly to dock with the test probe, and during the downward movement and docking process, a pair of downward pressing connecting rods 1002 in the plug-in buffer mechanism 10 also move downward, and the gear 1005 rolls downward on the rack 1006 along with the downward pressing connecting rod 1002 and slows down its movement. At the same time, the tension spring 1004 is compressed during the downward movement of the downward pressing connecting rod 1002, and the movement of the downward pressing connecting rod 1002 is buffered by elastic action, thereby buffering the docking force between the IO module product and the adapter assembly and the test probe, avoiding damage to the IO module product and the adapter assembly or the test probe due to excessive force, and ensuring the test effect.

[0027] See also Figure 1 The sliding mechanism 5 includes a pair of electric slide rails 501 respectively installed on the front and rear ends of the probe test platform 1, and a driving slider 502 is provided on the pair of electric slide rails 501, and the driving slider 502 is slidably connected with it, and the upper ends of the pair of driving sliders 502 are fixedly connected to the lower end of the mounting plate 6.

[0028] During use of the present solution, a pair of electric slide rails 501 respectively drive a pair of driving sliders 502 to slide, so that the mounting plate 6 and the connecting plate 8 are driven to move, prompting the IO module product and the adapter assembly to also move, and according to the test requirements, move to the first test probe assembly 2 or the second test probe assembly 3 or the third test probe assembly 4 to facilitate subsequent test docking, expand the scope of test application, and improve the practicality of the test.

[0029] See also Figure 1-2 The clamping mechanism 9 includes telescopic cylinders 901 respectively embedded in the front and rear ends of the connecting plate 8, the output ends of a pair of telescopic cylinders 901 are fixedly connected with clamping plates 902, and the ends of a pair of clamping plates 902 close to each other are fixedly connected with anti-slip rubber pads 903.

[0030] During use of the present solution, a pair of telescopic cylinders 901 work to push a pair of clamping plates 902 and anti-skid rubber pads 903 to move toward each other until the pair of anti-skid rubber pads 903 come into contact with the IO module product and the adapter assembly, thereby clamping and fixing the IO module product and the adapter assembly to keep them stable. At the same time, the flexibility of the anti-skid rubber pads 903 can buffer the clamping force of the clamping plates 902, thereby preventing damage to the surface of the IO module product and the adapter assembly due to excessive clamping force, thereby enhancing the protective effect.

[0031] See also Figure 1-3 The plug-in buffer mechanism 10 includes a pair of fixed frames 1001 embedded in the upper end of the mounting plate 6, the lower ends of the pair of fixed frames 1001 are each provided with a through hole, the lower sides of the pair of fixed frames 1001 are each provided with a downward pressing connecting rod 1002, and the upper ends of the downward pressing connecting rod 1002 pass through the through hole and extend into the fixed frame 1001, the upper ends of the downward pressing connecting rod 1002 are fixedly connected to a movable plate 1003, and the outer ends of the movable plate 1003 are rotatably connected to a pair of gears 1005, the inner walls of the front and rear ends of the fixed frame 1001 are fixedly connected to racks 1006, and the gears 1005 are meshed with the racks 1006, the outer ends of the downward pressing connecting rods 1002 are sleeved with a tension spring 1004, and the upper and lower ends of the tension spring 1004 are respectively fixedly connected to the movable plate 1003 and the fixed frame 1001.

[0032] During use of the present solution, the electric telescopic rod 7 squeezes the connecting plate 8 to move downward, and the pair of downward pressing connecting rods 1002 also move downward, driving the movable plate 1003 to move downward, prompting the two pairs of gears 1005 to roll downward along the two pairs of racks 1006 respectively, and the meshing action between the gears 1005 and the racks 1006 can slow down the movement speed of the downward pressing connecting rod 1002. At the same time, the tension spring 1004 is compressed during the downward movement of the downward pressing connecting rod 1002, and the movement of the downward pressing connecting rod 1002 is buffered by elastic action, thereby buffering the docking force between the IO module product and the adapter assembly and the test probe, avoiding damage to the IO module product and the adapter assembly or the test probe due to excessive force, and ensuring the test effect.

[0033] See also Figure 1 The lower end of the probe test platform 1 is fixedly connected with two pairs of left-right symmetrical support columns 11 .

[0034] During use of this solution, the support column 11 can provide a fixed support for the probe test platform 1 .

[0035] Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present invention, and that the scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. An IO module test stand, comprising a probe test platform (1), characterized in that: The probe test platform (1) is provided with a first test probe assembly (2), a second test probe assembly (3) and a third test probe assembly (4) in sequence from right to left. A mounting plate (6) is provided on the outer side of the probe test platform (1), and a sliding mechanism (5) is installed between the mounting plate (6) and the probe test platform (1). An electric telescopic rod (7) is embedded and installed at the upper end of the mounting plate (6), and a connecting plate (8) is fixedly connected to the lower end of the electric telescopic rod (7). A clamping mechanism (9) is installed on the connecting plate (8), and a plug-in buffer mechanism (10) is installed between the connecting plate (8) and the mounting plate (6).

2. An IO module test rack according to claim 1, characterized in that: The sliding mechanism (5) comprises a pair of electric slide rails (501) respectively mounted on the front and rear ends of the probe test platform (1); a driving slider (502) is provided on each of the pair of electric slide rails (501), and the driving slider (502) is slidably connected thereto; the upper ends of the pair of driving sliders (502) are fixedly connected to the lower end of the mounting plate (6).

3. An IO module test rack according to claim 1, characterized in that: The clamping mechanism (9) comprises telescopic cylinders (901) respectively embedded in the front and rear ends of the connecting plate (8), the output ends of a pair of telescopic cylinders (901) are fixedly connected to clamping plates (902), and the adjacent ends of the pair of clamping plates (902) are fixedly connected to anti-slip rubber pads (903).

4. The IO module test rack according to claim 1, characterized in that: The plug-in buffer mechanism (10) comprises a pair of fixed frames (1001) embedded and mounted on the upper end of the mounting plate (6), the lower ends of the pair of fixed frames (1001) are both provided with through holes, the lower sides of the pair of fixed frames (1001) are both provided with downward pressing connecting rods (1002), and the upper ends of the downward pressing connecting rods (1002) pass through the through holes and extend into the fixed frames (1001), and the upper ends of the downward pressing connecting rods (1002) are fixedly connected to the movable plate (1003) ), and the outer end of the movable plate (1003) is rotatably connected to a pair of gears (1005), the inner walls of the front and rear ends of the fixed frame (1001) are fixedly connected to racks (1006), and the gears (1005) are meshingly connected to the racks (1006), and the outer end of the downward pressing connecting rod (1002) is sleeved with a tension spring (1004), and the upper and lower ends of the tension spring (1004) are fixedly connected to the movable plate (1003) and the fixed frame (1001), respectively.

5. The IO module test rack according to claim 1, characterized in that: Two pairs of left-right symmetrical support columns (11) are fixedly connected to the lower end of the probe testing platform (1).

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