Test tool for semiconductor triode production
The test tool addresses inefficient manual transistor testing by enabling simultaneous and accurate testing of multiple transistors with improved contact and display-assisted results, enhancing detection speed and precision.
Patent Information
- Application Number
- CN202420560141.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-03-22
- Publication Date
- 2024-12-24
- Estimated Expiration
- 2034-03-22
AI Technical Summary
Manual testing of transistor pins using a multimeter is cumbersome and prone to poor contact, leading to inefficient and repetitive detection, especially when testing multiple transistors.
A test tool with multiple mounting seats and jacks for simultaneous testing of semiconductor transistors, equipped with a display screen for result visualization, prompt lights, and data transmission for efficient and accurate testing.
Facilitates simultaneous testing of multiple transistors with improved contact and reduced repetitive operations, enhancing test efficiency and accuracy.
Smart Images
Figure CN222232602U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of triode testing tooling, in particular to a testing tooling for producing semiconductor triodes. Background Art
[0002] Transistor, whose full name should be semiconductor triode, also known as bipolar transistor and crystal triode, is a semiconductor device that controls current. Its function is to amplify weak signals into electrical signals with larger amplitude values. It is also used as a contactless switch. Transistor is one of the basic semiconductor components. It has the function of current amplification and is the core component of electronic circuits. Transistor is made of two PN junctions very close to each other on a semiconductor substrate. The two PN junctions divide the entire semiconductor into three parts. The middle part is the base region, and the two side parts are the emitter region and the collector region. There are two arrangements: PNP and NPN.
[0003] At present, when using a multimeter to detect the pins of the transistor, the red and black test pens are manually held to measure the contact of the three pins respectively. When multiple transistors need to be tested, the operation steps are relatively cumbersome, and repeated tests are prone to occur, which is inconvenient for detection. At the same time, due to the small size of the transistor pins during detection, it is easy for the test pens to have poor contact with the pins, and repeated detection is required, which affects the detection speed. Therefore, we propose a test tool for semiconductor transistor production to solve the above problems. Utility Model Content
[0004] The purpose of the utility model is to provide a test tool for producing semiconductor triodes to solve the problems raised in the above-mentioned background technology.
[0005] In order to achieve the above purpose, the utility model provides the following technical solutions:
[0006] A test tool for producing semiconductor triodes, comprising a box, a test box is fixedly installed on the upper surface of the box, mounting seats arranged at equal distances are fixedly installed on the upper surface of the test box, a jack is provided on the upper surface of each mounting seat, and prompt lights arranged at equal distances are provided on the upper surface of the test box, a display screen is fixedly installed on the upper surface of the box, a data analyzer is fixedly installed on the inner bottom wall of the box, an input end of the data analyzer is fixedly connected with a first wire, an end of the first wire away from the data analyzer passes through the inner top wall of the box and is connected with an output end of the test box, a data transmitter is fixedly installed on the inner bottom wall of the box, an output end of the data analyzer is fixedly connected with a second wire, and the output end of the second wire is connected with the input end of the data transmitter, a third wire is fixedly connected to the upper surface of the data transmitter, an output end of the third wire passes through the inner top wall of the box and is connected with the input end of the test box, a threading hole is provided on the back of the box, a fourth wire is fixedly connected with the output end of the data transmitter, and the output end of the fourth wire is connected with the input end of the display screen.
[0007] In a further embodiment, an operation indicator sign is fixedly connected to the front of the box, and a control panel is fixedly connected to the front of the box.
[0008] In a further embodiment, two sets of legs are fixedly connected to the bottom surface of the box, and the bottom end of each of the legs is fixedly connected to a non-slip base.
[0009] In a further embodiment, a blue light protection film is provided on the front side of the display screen, and the back side of the blue light protection film is connected to the front side of the display screen.
[0010] In a further embodiment, a waste collection box is provided on the right side of the box body, and the left side of the waste collection box is connected to the right side of the box body.
[0011] In a further embodiment, a reinforcement plate is fixedly connected to the right side surface of the box body, and the upper surface of the reinforcement plate is connected to the bottom surface of the waste collection box.
[0012] Compared with the prior art, the beneficial effects of the utility model are:
[0013] Firstly, the device is provided with a plurality of mounting seats and a plurality of jacks, and a plurality of semiconductor transistors can be inserted by using the plurality of mounting seats and the plurality of jacks, so that the plurality of semiconductor transistors can be tested simultaneously. Meanwhile, the jacks are adapted to the three pins of the semiconductor transistors, so that the three pins of the semiconductor transistors can be prevented from having poor contact. This not only improves the test effect of the semiconductor transistors, but also greatly improves the test efficiency of the semiconductor transistors. BRIEF DESCRIPTION OF THE DRAWINGS
[0014] Figure 1 This is a schematic diagram of the three-dimensional structure of a test tool for producing semiconductor triodes.
[0015] Figure 2 The figure is a schematic diagram of the structure of a top view of a test tooling for producing semiconductor triodes.
[0016] Figure 3 The present invention is a cross-sectional view of a side view of a test tool for producing semiconductor triodes.
[0017] Figure 4 The present invention is a cross-sectional view of a front view of a test tool for producing semiconductor triodes.
[0018] In the figure: 1. Box body; 2. Test box; 3. Mounting base; 4. Socket; 5. Indicator light; 6. Display screen; 7. Data analyzer; 8. First wire; 9. Data transmitter; 10. Second wire; 11. Third wire; 12. Threading hole; 13. Fourth wire; 14. Operation indicator; 15. Control panel; 16. Legs; 17. Anti-slip base; 18. Blue light protective film; 19. Waste collection box; 20. Reinforcement plate. DETAILED DESCRIPTION
[0019] In the description of the present utility model, it should be understood that the terms "center", "longitudinal", "lateral", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside" and the like indicate positions or positional relationships based on the positions or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present utility model and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present utility model. In addition, the terms "first", "second", etc. are only used for descriptive purposes, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Therefore, features defined as "first", "second", etc. may explicitly or implicitly include one or more of the features. In the description of the present utility model, unless otherwise specified, "multiple" means two or more.
[0020] In the description of the present invention, it should be noted that, unless otherwise clearly specified and limited, the terms "installation", "connection" and "connection" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be an indirect connection through an intermediate medium, or it can be the internal communication of two components. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood by specific circumstances.
[0021] The following will be combined with the drawings in the embodiments of the utility model to clearly and completely describe the technical solutions in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all of the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.
[0022] See also Figure 1-4 In the utility model, a test tool for producing semiconductor triodes includes a box body 1, a test box 2 is fixedly installed on the upper surface of the box body 1, and mounting seats 3 arranged at equal distances are fixedly installed on the upper surface of the test box 2. A jack 4 is provided on the upper surface of each mounting seat 3, and prompt lights 5 arranged at equal distances are provided on the upper surface of the test box 2. A display screen 6 is fixedly installed on the upper surface of the box body 1, a data analyzer 7 is fixedly installed on the inner bottom wall of the box body 1, and the input end of the data analyzer 7 is fixedly connected to a first wire 8, and the end of the first wire 8 away from the data analyzer 7 passes through the inner top wall of the box body 1 and is connected to the output end of the test box 2, a data transmitter 9 is fixedly installed on the inner bottom wall of the box body 1, and the output end of the data analyzer 7 is fixedly connected to a second wire 10, The output end of the second wire 10 is connected to the input end of the data transmitter 9. The upper surface of the data transmitter 9 is fixedly connected with a third wire 11. The output end of the third wire 11 passes through the inner top wall of the box body 1 and is connected to the input end of the test box 2. The back of the box body 1 is provided with a threading hole 12. The output end of the data transmitter 9 is fixedly connected with a fourth wire 13. The output end of the fourth wire 13 is connected to the input end of the display screen 6. The use of multiple mounting seats 3 and multiple jacks 4 can facilitate the staff to test multiple semiconductor transistors at the same time. The use of the display screen 6 can facilitate the staff to view the test results of each semiconductor transistor. The use of the prompt light 5 can serve as a prompt effect for the staff after the test of the semiconductor transistor on each mounting seat 3 is completed.
[0023] An operation sign 14 is fixedly connected to the front of the box 1, and a control panel 15 is fixedly connected to the front of the box 1. The operation sign 14 can facilitate the staff to view the specific operation process of the device. Two sets of legs 16 are fixedly connected to the bottom of the box 1, and the bottom end of each leg 16 is fixedly connected to an anti-skid base 17. The anti-skid base 17 can have a good anti-skid effect. A blue light protective film 18 is provided on the front of the display screen 6, and the back of the blue light protective film 18 is connected to the front of the display screen 6. The blue light protective film 18 can provide a good protective effect on the eyes of the staff.
[0024] A waste collection box 19 is provided on the right side of the box body 1, and the left side of the waste collection box 19 is connected to the right side of the box body 1. The waste collection box 19 can be used to store products that fail the test. A reinforcement plate 20 is fixedly connected to the right side of the box body 1, and the upper surface of the reinforcement plate 20 is connected to the bottom surface of the waste collection box 19. The reinforcement plate 20 can make the connection between the waste collection box 19 and the box body 1 more firmly.
[0025] The working principle of the utility model is:
[0026] When the device is used, the staff first connects the device to an external power source, and then the staff inserts the semiconductor transistors into the sockets 4 of the mounting seat 3 in turn. At this time, the staff uses the control panel 15 to turn on the display screen 6 and allow the test box 2 to test the inserted semiconductor transistors. At this time, the test results of the semiconductor transistors will be transmitted to the inside of the data analyzer 7 through the first wire 8, and then transmitted to the inside of the data transmitter 9 through the second wire 10, and then the test data will be transmitted to the display screen 6 and the inside of the test box 2 using the third wire 11 and the fourth wire 13. At this time, the products that pass the test will light up green, and the unqualified products will light up red. The staff can then check the specific reasons for the failure from the top of the display screen 6 according to the position of the red light. The above is the entire operation process of the device.
[0027] It is obvious to those skilled in the art that the present invention is not limited to the details of the exemplary embodiments described above, and that the present invention can be implemented in other specific forms without departing from the spirit or essential features of the present invention. Therefore, the embodiments should be regarded as exemplary and non-restrictive from any point of view, and the scope of the present invention is defined by the appended claims rather than the above description, and it is intended that all changes falling within the meaning and scope of the equivalent elements of the claims be included in the present invention. Any reference numeral in a claim should not be regarded as limiting the claim to which it relates.
[0028] In addition, it should be understood that although the present specification is described according to implementation modes, not every implementation mode contains only one independent technical solution. This description of the specification is only for the sake of clarity. Those skilled in the art should regard the specification as a whole. The technical solutions in each embodiment may also be appropriately combined to form other implementation modes that can be understood by those skilled in the art.
Claims
1. A test tool for semiconductor triode production, characterized in that: The invention comprises a box (1), wherein a test box (2) is fixedly mounted on the upper surface of the box (1), mounting seats (3) arranged at equal distances are fixedly mounted on the upper surface of the test box (2), a socket (4) is provided on the upper surface of each mounting seat (3), and prompt lights (5) arranged at equal distances are provided on the upper surface of the test box (2). A display screen (6) is fixedly mounted on the upper surface of the box (1), and a data analyzer (7) is fixedly mounted on the inner bottom wall of the box (1), and an input end of the data analyzer (7) is fixedly connected to a first wire (8), and an end of the first wire (8) away from the data analyzer (7) passes through the inner top wall of the box (1) and is connected to an output end of the test box (2). The inner bottom wall of the box (1) is fixedly mounted with a data transmitter (9); the output end of the data analyzer (7) is fixedly connected with a second wire (10); the output end of the second wire (10) is connected with the input end of the data transmitter (9); the upper surface of the data transmitter (9) is fixedly connected with a third wire (11); the output end of the third wire (11) passes through the inner top wall of the box (1) and is connected with the input end of the test box (2); a threading hole (12) is provided on the back of the box (1); the output end of the data transmitter (9) is fixedly connected with a fourth wire (13); the output end of the fourth wire (13) is connected with the input end of the display screen (6).
2. The semiconductor transistor production test tool according to claim 1, characterized in that: An operation indicator sign (14) is fixedly connected to the front of the box (1), and a control panel (15) is fixedly connected to the front of the box (1).
3. The semiconductor transistor production test tool according to claim 1, characterized in that: Two groups of legs (16) are fixedly connected to the bottom surface of the box body (1), and the bottom end of each leg (16) is fixedly connected to a non-slip base (17).
4. The semiconductor transistor production test tool according to claim 1, characterized in that: A blue light protection film (18) is provided on the front side of the display screen (6), and the back side of the blue light protection film (18) is connected to the front side of the display screen (6).
5. The semiconductor transistor production test tool according to claim 1, characterized in that: A waste collection box (19) is provided on the right side of the box body (1), and the left side of the waste collection box (19) is connected to the right side of the box body (1).
6. The semiconductor transistor production test tool according to claim 1, characterized in that: A reinforcing plate (20) is fixedly connected to the right side surface of the box body (1), and the upper surface of the reinforcing plate (20) is connected to the bottom surface of the waste collection box (19).