Semiconductor testing machine with calibration structure
By designing calibration structures and electric telescopic rods in semiconductor testing equipment, the problems of loading and unloading difficulties and damage in semiconductor testing are solved, and the accuracy and reliability of test results are improved.
Patent Information
- Application Number
- CN202420786997.7
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-04-16
- Publication Date
- 2024-12-24
- Estimated Expiration
- 2034-04-16
AI Technical Summary
When existing semiconductor testing equipment tests semiconductors, it is difficult to place the semiconductor in a test base, and removing the semiconductor through tweezers will damage the semiconductor, affecting the accuracy and reliability of the test results.
A semiconductor tester with a calibration structure is designed, including a test bench, circuit board, support frame, mounting frame, electric telescopic rod and test limit seat. The accurate loading and calibration of semiconductors is achieved through the flaring groove and the positioning groove. And the operating space is increased through an electric telescopic rod to facilitate the unloading of semiconductors.
The design facilitates the loading and unloading of semiconductors, ensures their position accuracy, reduces the risk of semiconductor damage, and improves the accuracy and reliability of test results.
Smart Images
Figure CN222232604U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of semiconductor testing equipment, in particular to a semiconductor testing machine with a calibration structure. Background Art
[0002] The test socket is a special fixture used to test semiconductor devices. Its quality and performance directly affect the accuracy and reliability of the test results.
[0003] In the prior art, when testing a semiconductor through a semiconductor test, the semiconductor needs to be placed in a test socket. Due to the small size of the semiconductor, it is difficult to place the semiconductor in the test socket, and the semiconductor under test needs to be taken out by tweezers during unloading. Taking out the semiconductor by tweezers will damage the semiconductor. For this reason, we propose a semiconductor testing machine with a calibration structure. Utility Model Content
[0004] 1. Technical issues to be resolved
[0005] In view of the deficiencies in the prior art, the utility model provides a semiconductor testing machine with a calibration structure, which has the advantages of being convenient for loading and unloading semiconductors and calibrating the position of semiconductors, and can effectively solve the problems in the background technology.
[0006] (II) Technical solution
[0007] To achieve the above-mentioned purpose, the technical solution adopted by the utility model is: a semiconductor testing machine with a calibration structure, including a test bench, a circuit board is fixedly installed on the middle part of the outer surface of the upper end of the test bench, a support frame is fixedly installed on the middle part of the outer surface of the rear end of the test bench, a mounting frame is fixedly installed on the upper part of the outer surface of the front end of the support frame, a first electric telescopic rod is fixedly installed on the upper outer surface of the mounting frame, a test head is fixedly installed on the lower outer surface of the piston rod of the first electric telescopic rod, a test limit seat is fixedly installed on the middle part of the outer surface of the upper end of the circuit board, the test limit seat includes a conduction test base, a first semi-rectangular limit frame, a second semi-rectangular limit frame, an expansion groove, a positioning groove, a first slide groove, a second slide groove, a guide rod, a mounting groove, a second electric telescopic rod and a slide rail, and the conduction test base is fixedly installed on the middle part of the outer surface of the upper end of the circuit board.
[0008] Preferably, the first semi-rectangular limiting frame is fixedly mounted on one side of the outer surface of the upper end of the continuity test base, and the second semi-rectangular limiting frame is located on the other side of the outer surface of the upper end of the continuity test base.
[0009] Preferably, the number of the first slide grooves and the slide rails are both two groups, the two groups of the first slide grooves are opened on the left and right sides of the upper end outer surface of the conduction test base away from one end of the first semi-rectangular limit frame, and the two groups of the slide rails are fixedly installed on the left and right sides of the lower end outer surface of the second semi-rectangular limit frame.
[0010] Preferably, the slide rail is located in the first slide groove, and the outer wall of the slide rail is slidably connected to the first slide groove.
[0011] Preferably, the expansion groove is formed at the upper end of the inner wall of the first semi-rectangular limiting frame and the second semi-rectangular limiting frame, and the positioning groove is formed at the lower end of the inner wall of the first semi-rectangular limiting frame and the second semi-rectangular limiting frame.
[0012] Preferably, the mounting groove is opened at one end of the outer surface of one side of the first semi-rectangular limit frame, the second slide groove is opened at the other end of the outer surface of one side of the first semi-rectangular limit frame, the second electric telescopic rod is fixedly installed in the mounting groove, and the outer surface of one end of the piston rod in the second electric telescopic rod is fixedly connected to one end of the outer surface of one side of the second semi-rectangular limit frame, the outer surface of one end of the guide rod is fixedly connected to the other end of the outer surface of one side of the second semi-rectangular limit frame, and one end of the guide rod extends into the second slide groove, and the outer wall of the guide rod and the second slide groove are slidably connected.
[0013] (III) Beneficial effects
[0014] Compared with the prior art, the utility model provides a semiconductor tester with a calibration structure, which has the following beneficial effects:
[0015] 1. A semiconductor testing machine with a calibration structure is provided with a first semi-rectangular limit frame and a second semi-rectangular limit frame. The upper parts of the inner walls of the first semi-rectangular limit frame and the second semi-rectangular limit frame are provided with expansion grooves to facilitate loading of semiconductors. The expansion grooves and positioning grooves are provided to facilitate calibration of the position of the semiconductor.
[0016] 2. The semiconductor testing machine with a calibration structure can separate the first semi-rectangular limit frame from the second semi-rectangular limit frame by means of a second electric telescopic rod, thereby increasing the operating space and facilitating the unloading of semiconductors. BRIEF DESCRIPTION OF THE DRAWINGS
[0017] Figure 1 The utility model is a schematic diagram of the overall structure of a semiconductor tester with a calibration structure.
[0018] Figure 2 The utility model is a structural schematic diagram of a test limit seat in a semiconductor test machine with a calibration structure.
[0019] Figure 3The utility model is a structural schematic diagram of a conduction test base in a semiconductor tester with a calibration structure.
[0020] Figure 4 The utility model is a partial structural schematic diagram of a test limit seat in a semiconductor test machine with a calibration structure.
[0021] In the figure: 1. test bench; 2. support frame; 3. mounting frame; 4. first electric telescopic rod; 5. test head; 6. circuit board; 7. test limit seat; 8. conduction test base; 9. first semi-rectangular limit frame; 10. second semi-rectangular limit frame; 11. expansion groove; 12. positioning groove; 13. first slide groove; 14. second slide groove; 15. guide rod; 16. mounting groove; 17. second electric telescopic rod; 18. slide rail. DETAILED DESCRIPTION
[0022] In order to make the technical means, creative features, objectives and effects achieved by the present invention easy to understand, the present invention is further described below in conjunction with specific implementation methods.
[0023] This embodiment is a semiconductor testing machine with a calibration structure.
[0024] like Figure 1-4 As shown, it includes a test bench 1, a circuit board 6 is fixedly installed in the middle of the upper outer surface of the test bench 1, a support frame 2 is fixedly installed in the middle of the outer surface of the rear end of the test bench 1, a mounting frame 3 is fixedly installed on the upper part of the outer surface of the front end of the support frame 2, a first electric telescopic rod 4 is fixedly installed on the upper outer surface of the mounting frame 3, a test head 5 is fixedly installed on the lower outer surface of the piston rod of the first electric telescopic rod 4, a test limit seat 7 is fixedly installed in the middle of the upper outer surface of the circuit board 6, the test limit seat 7 includes a conduction test base 8, a first semi-rectangular limit frame 9, a second semi-rectangular limit frame 10, an expanding groove 11, a positioning groove 12, a first slide groove 13, a second slide groove 14, a guide rod 15, a mounting groove 16, a second electric telescopic rod 17 and a slide rail 18, and the conduction test base 8 is fixedly installed in the middle of the upper outer surface of the circuit board 6.
[0025] The first semi-rectangular limit frame 9 is fixedly installed on one side of the upper outer surface of the conduction test base 8, and the second semi-rectangular limit frame 10 is located on the other side of the upper outer surface of the conduction test base 8; the number of the first slide groove 13 and the slide rail 18 is two groups, and the two groups of first slide grooves 13 are opened on the left and right sides of the upper outer surface of the conduction test base 8 away from one end of the first semi-rectangular limit frame 9, and the two groups of slide rails 18 are fixedly installed on the left and right sides of the lower outer surface of the second semi-rectangular limit frame 10; the slide rail 18 is located in the first slide groove 13, and the outer wall of the slide rail 18 is slidably connected to the first slide groove 13; the flaring groove 11 is opened at the upper end of the inner wall of the first semi-rectangular limit frame 9 and the second semi-rectangular limit frame 10, and the positioning groove 12 is opened at the lower ends of the inner walls of the first semi-rectangular limit frame 9 and the second semi-rectangular limit frame 10; the mounting groove 16 is opened at one end of the outer surface of one side of the first semi-rectangular limit frame 9, and the second slide groove 14 is opened at the other end of the outer surface of one side of the first semi-rectangular limit frame 9, the second electric telescopic rod 17 is fixedly installed in the mounting groove 16, and the outer surface of one end of the piston rod in the second electric telescopic rod 17 is fixedly connected to one end of the outer surface of one side of the second semi-rectangular limit frame 10, the outer surface of one end of the guide rod 15 is fixedly connected to the other end of the outer surface of one side of the second semi-rectangular limit frame 10, and one end of the guide rod 15 extends into the second slide groove 14, and the outer wall of the guide rod 15 and the second slide groove 14 are slidably connected.
[0026] It should be noted that the utility model is a semiconductor tester with a calibration structure. The test table 1, circuit board 6, first electric telescopic rod 4 and test head 5 recorded in the text are all prior arts, which can be effectively known to technicians in the relevant technical field, and the details are not repeated here. The test limit seat 7 is set. When loading, the second semi-rectangular limit frame 10 is driven to move by the operation of the second electric telescopic rod 17, so that the second semi-rectangular limit frame 10 is in contact with the first semi-rectangular limit frame 9, and then the semiconductor is placed in the expansion groove 11, which is convenient for loading the semiconductor, and the expansion groove 11 is set to contact the positioning The groove 12 is convenient for calibrating the position of the semiconductor. After the calibration of the positioning groove 12, the semiconductor can be accurately placed on the upper outer surface of the conduction test base 8, and then tested. After the test is completed, the second semi-rectangular limit frame 10 is driven to move by the operation of the second electric telescopic rod 17, so that the second semi-rectangular limit frame 10 is separated from the first semi-rectangular limit frame 9, and the second semi-rectangular limit frame 10 drives the slide rail 18 to slide along the first slide groove 13, which can improve the stability of the movement of the second semi-rectangular limit frame 10. After the second semi-rectangular limit frame 10 is separated from the first semi-rectangular limit frame 9, it is convenient to take out the semiconductor and facilitate unloading.
[0027] It should be noted that, in this article, relational terms such as first and second (number one, number two), etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, the elements defined by the sentence "including one..." do not exclude the existence of other identical elements in the process, method, article or device including the elements.
[0028] The above shows and describes the basic principle and main features of the utility model and the advantages of the utility model. The technicians in this industry should understand that the utility model is not limited by the above embodiments, and the above embodiments and descriptions are only for explaining the principle of the utility model. Without departing from the spirit and scope of the utility model, the utility model will have various changes and improvements, and these changes and improvements fall within the scope of the utility model to be protected.
Claims
1. A semiconductor tester with a calibration structure, comprising a test bench (1), a circuit board (6) fixedly mounted in the middle of the upper outer surface of the test bench (1), a support frame (2) fixedly mounted in the middle of the rear end outer surface of the test bench (1), a mounting frame (3) fixedly mounted in the upper part of the front end outer surface of the support frame (2), a first electric telescopic rod (4) fixedly mounted on the upper end outer surface of the mounting frame (3), a test head (5) fixedly mounted on the lower end outer surface of the piston rod of the first electric telescopic rod (4), characterized in that: A test limit seat (7) is fixedly mounted in the middle of the outer surface of the upper end of the circuit board (6), and the test limit seat (7) comprises a conduction test base (8), a first semi-rectangular limit frame (9), a second semi-rectangular limit frame (10), an expansion groove (11), a positioning groove (12), a first slide groove (13), a second slide groove (14), a guide rod (15), a mounting groove (16), a second electric telescopic rod (17) and a slide rail (18), and the conduction test base (8) is fixedly mounted in the middle of the outer surface of the upper end of the circuit board (6).
2. A semiconductor tester with a calibration structure according to claim 1, characterized in that: The first semi-rectangular limiting frame (9) is fixedly mounted on one side of the upper outer surface of the conduction test base (8), and the second semi-rectangular limiting frame (10) is located on the other side of the upper outer surface of the conduction test base (8).
3. The semiconductor tester with a calibration structure according to claim 2, characterized in that: The number of the first slide grooves (13) and the number of the slide rails (18) are both two groups. The two groups of the first slide grooves (13) are arranged on the left and right sides of the upper end outer surface of the conduction test base (8) away from one end of the first semi-rectangular limit frame (9), and the two groups of the slide rails (18) are fixedly installed on the left and right sides of the lower end outer surface of the second semi-rectangular limit frame (10).
4. The semiconductor tester with a calibration structure according to claim 3, characterized in that: The slide rail (18) is located in the first slide groove (13), and the outer wall of the slide rail (18) is slidably connected to the first slide groove (13).
5. The semiconductor tester with a calibration structure according to claim 4, characterized in that: The expansion groove (11) is formed at the upper end of the inner wall of the first semi-rectangular limiting frame (9) and the second semi-rectangular limiting frame (10), and the positioning groove (12) is formed at the lower end of the inner wall of the first semi-rectangular limiting frame (9) and the second semi-rectangular limiting frame (10).
6. The semiconductor tester with a calibration structure according to claim 5, characterized in that: The mounting groove (16) is formed at one end of the outer surface of one side of the first semi-rectangular limit frame (9), the second slide groove (14) is formed at the other end of the outer surface of one side of the first semi-rectangular limit frame (9), the second electric telescopic rod (17) is fixedly mounted in the mounting groove (16), and the outer surface of one end of the piston rod in the second electric telescopic rod (17) is fixedly connected to one end of the outer surface of one side of the second semi-rectangular limit frame (10), the outer surface of one end of the guide rod (15) is fixedly connected to the other end of the outer surface of one side of the second semi-rectangular limit frame (10), and one end of the guide rod (15) extends into the second slide groove (14), and the outer wall of the guide rod (15) and the second slide groove (14) are slidably connected.