Chip PTC efficient test fixture

Abstract

The utility model belongs to the field of clamps, particularly relates to a chip PTC high-efficiency test clamp, and aims to solve the problems that the existing test clamp is unstable in clamping, tedious in operation and the like, affects the test efficiency and quality, and cannot clamp and fix a chip in multiple directions, and provides the following scheme: the chip PTC high-efficiency test clamp comprises a placement table, the upper surface of the placing table is fixedly connected with a placing plate, the placing plate is used for placing a chip body, the upper surface of the placing table is respectively provided with a first clamping plate and a second clamping plate, and the first clamping plate and the second clamping plate are arranged in parallel. The four edges of the chip body are clamped in multiple directions through the first clamping plate, the second clamping plate and the two third clamping plates, good stability can be provided for the chip body, the testing efficiency is improved, the stability and the skid resistance of the clamp are further enhanced through the arrangement of the guide seat and the silica gel pad, and the testing precision and reliability are improved.

Description

Technical Field

[0001] The utility model relates to the technical field of fixtures, in particular to a chip PTC high-efficiency testing fixture. Background Art

[0002] Chip PTC is a polymer resistor element with a positive temperature coefficient, also known as a PTC thermistor. Its resistance value increases with the increase of temperature. At low temperatures, the resistance value of the PTC chip is low, and the current can pass through the chip smoothly. However, when the chip temperature rises, a phase change will occur inside the material, and the polymer structure will change, resulting in a significant increase in resistance. The chip needs to be fixed with a fixture during testing to achieve efficient testing.

[0003] Traditional chip test fixtures have problems such as unstable clamping and cumbersome operation, which affects the test efficiency and quality, and cannot clamp and fix the chip in all directions. Utility Model Content

[0004] The utility model aims to solve the problems in the prior art such as unstable clamping, complicated operation, etc., which affect the test efficiency and quality, and the shortcomings of being unable to clamp and fix the chip in all directions, and proposes a chip PTC efficient test fixture.

[0005] In order to achieve the above purpose, the utility model adopts the following technical solutions:

[0006] A chip PTC high-efficiency test fixture comprises a placement table, a placement plate is fixedly connected to the upper surface of the placement table, the placement plate is used to place the chip body, and a first clamping plate and a second clamping plate are respectively arranged on the upper surface of the placement table, and the first clamping plate and the second clamping plate are arranged in parallel;

[0007] The other two sides of the placement table are respectively provided with third clamping plates, the two third clamping plates are arranged in parallel, and the first clamping plate, the second clamping plate and the two third clamping plates are respectively located at the four sides of the chip body, and are used for clamping and fixing the chip body;

[0008] A sliding column is fixedly connected to one side of the first clamping plate, and the other end of the sliding column is rotatably connected to a connecting frame. An L-shaped rotating rod is rotatably connected to the upper surface of the placement table, and one end of the rotating rod is rotatably connected to one end of the connecting frame.

[0009] In a possible design, four groups of sliding rods are fixedly connected to the upper surface of the placement table, and each group of sliding rods is located at the four sides of the chip body, and the first clamping plate, the second clamping plate and the two third clamping plates are respectively slidably connected to the sliding rods. Springs are provided on the circumference of the sliding rods, and the springs are respectively located between the first clamping plate, the second clamping plate, the two third clamping plates and the placement plate.

[0010] In a possible design, both ends of the first clamping plate are fixedly connected with L-shaped fixing plates, the two fixing plates are symmetrically arranged, the upper surfaces of the two third clamping plates are rotatably connected with rollers, one side of the fixing plates is provided with a bevel, and the rollers respectively contact with the corresponding fixing plates.

[0011] In a possible design, two fixed columns are fixedly connected to the upper surface of the placement table, and the circumference of the fixed columns is rotatably connected to a rotating plate. The two rotating plates are symmetrically arranged, and the other ends of the rotating plates are in contact with the second clamping plate.

[0012] In a possible design, a guide seat is fixedly connected to the upper surface of the placement table, and the sliding column is slidably connected in the guide seat.

[0013] In a possible design, silicone pads are fixedly connected to the four corners of the bottom of the placement table.

[0014] In the present application, when using the chip PTC high-efficiency test fixture, first place the chip body on the placement plate, rotate the rotating rod, drive the connecting frame to move, so that the sliding column moves in the guide seat, and drive the first clamping plate to slide in one of the sets of sliding rods. At the same time, the movement of the first clamping plate will drive the movement of the fixed plate, and the beveled edge of the fixed plate will push the roller to move toward the middle, so that the two third clamping plates clamp the chip body. At the same time, when the fixed plate moves, one end of the fixed plate will contact the rotating plate, thereby driving the rotating plate to rotate around the fixed column. One end of the rotating plate abuts against the second clamping plate, so that the second clamping plate fixes one side of the chip body. It only needs to push the sliding column to clamp and fix the four sides of the chip body. The guide seat and silicone pad further enhance the stability and anti-slip properties of the fixture.

[0015] Beneficial effects:

[0016] In the utility model, the chip PTC high-efficiency test fixture can clamp the four sides of the chip body in multiple directions through the first clamping plate, the second clamping plate and the two third clamping plates, thereby providing better stability for the chip body and improving the test efficiency;

[0017] In the utility model, the provision of the guide seat and the silicone pad for the chip PTC high-efficiency testing fixture further enhances the stability and anti-slip property of the fixture, and improves the testing accuracy and reliability. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1 This is a schematic diagram of the clamping state structure of a chip PTC high-efficiency test fixture proposed by the utility model;

[0019] Figure 2This is a schematic diagram of the structure of a chip PTC high-efficiency test fixture in a loosened state proposed by the utility model;

[0020] Figure 3 This is a schematic diagram of the disassembled structure of a chip PTC high-efficiency test fixture proposed by the utility model;

[0021] Figure 4 The utility model provides a schematic diagram of the exploded structure of the connection relationship between the sliding column and the rotating rod of the chip PTC high-efficiency test fixture.

[0022] In the figure: 1. placement table; 2. placement plate; 3. chip body; 4. first clamping plate; 5. second clamping plate; 6. third clamping plate; 7. fixed plate; 8. roller; 9. fixed column; 10. rotating plate; 11. bevel; 12. sliding rod; 13. spring; 14. guide seat; 15. sliding column; 16. connecting frame; 17. rotating rod; 18. silicone pad. DETAILED DESCRIPTION

[0023] The technical solutions in the embodiments of the present invention will be described clearly and completely below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, rather than all of the embodiments.

[0024] Example 1

[0025] Reference Figure 1 -

[0026] Figure 4 , an efficient test fixture, comprising: a placement table 1, a placement plate 2 is fixedly connected to the upper surface of which, for placing a chip body 3, a first clamping plate 4 and a second clamping plate 5 are respectively arranged on the upper surface of the placement table 1, which are arranged in parallel to clamp the chip body 3 from both sides, and at the same time, two third clamping plates 6 are arranged on the upper surface of the placement table 1, and the two third clamping plates 6 are also arranged in parallel to form a stable clamping structure;

[0027] In order to realize the flexible movement of the clamping plate, four groups of sliding rods 12 are fixedly connected to the upper surface of the placement table 1, and each group of sliding rods 12 is respectively located at the four sides of the chip body 3. The first clamping plate 4, the second clamping plate 5 and the two third clamping plates 6 are respectively slidably connected to the sliding rods 12, so that they can slide freely along the sliding rods 12. In order to provide a clamping force, a spring 13 is arranged on the circumference of the sliding rod 12. The elastic action of the spring 13 enables the clamping plate to be away from the chip body 3 when no external force is used, so as to facilitate the placement and removal of the chip body 3.

[0028] In order to further improve the stability and convenience of clamping, L-shaped fixing plates 7 are fixedly connected to both ends of the first clamping plate 4, and the two fixing plates 7 are symmetrically arranged. At the same time, the upper surfaces of the two third clamping plates 6 are rotatably connected with rollers 8, and the rollers 8 are in contact with the corresponding fixing plates 7. In this way, when the first clamping plate 4 moves along the sliding rod 12, the rollers 8 roll on the bevel 11 of the fixing plate 7, thereby guiding the movement of the third clamping plates 6, making the clamping more stable;

[0029] In addition, two fixed columns 9 are fixedly connected to the upper surface of the placement table 1, and the circumference of the fixed columns 9 is rotatably connected with a rotating plate 10. The two rotating plates 10 are symmetrically arranged, one end of which is in contact with the fixed plate 7, and the other end is in contact with the second clamping plate 5. The rotating plate 10 is pushed by the fixed plate 7 to adjust the rotation angle of the rotating plate 10, so that the clamping force of the second clamping plate 5 can be controlled to achieve more precise clamping. The four sides of the chip body 3 are clamped in multiple directions by the first clamping plate 4, the second clamping plate 5 and the two third clamping plates 6, which can provide better stability for the chip body 3 and improve the test efficiency.

[0030] The present application can be used in the chip PTC field, and can also be used in other fields applicable to the present application.

[0031] Example 2

[0032] refer to Figure 1-Figure 4 , improved on the basis of Example 1:

[0033] An efficient test fixture, which is used in the field of chip PTC;

[0034] In order to enhance the stability of sliding, a guide seat 14 is fixedly connected to the upper surface of the placement table 1, and the sliding column 15 is slidably connected in the guide seat 14, so as to ensure the stability of the first clamping plate 4 during the movement;

[0035] Finally, in order to prevent the fixture from sliding or vibrating during the test, silicone pads 18 are fixedly connected to the four corners of the bottom of the placement table 1. These silicone pads 18 have good anti-slip and shock-absorbing effects.

[0036] The above description is only a preferred specific implementation manner of the present invention, but the protection scope of the present invention is not limited thereto. Any technician familiar with the technical field can make equivalent replacements or changes within the technical scope disclosed by the present invention according to the technical scheme and the utility model concept of the present invention, which should be covered by the protection scope of the present invention.

Claims

1. A chip PTC high efficiency test fixture, characterized in that: include: A placement table (1), wherein a placement plate (2) is fixedly connected to the upper surface of the placement table (1), wherein the placement plate (2) is used to place a chip body (3), and a first clamping plate (4) and a second clamping plate (5) are respectively provided on the upper surface of the placement table (1), wherein the first clamping plate (4) and the second clamping plate (5) are arranged in parallel; The other two sides of the placement platform (1) are respectively provided with third clamping plates (6), the two third clamping plates (6) are arranged in parallel, and the first clamping plate (4), the second clamping plate (5) and the two third clamping plates (6) are respectively located at the four sides of the chip body (3) for clamping and fixing the chip body (3); A sliding column (15) is fixedly connected to one side of the first clamping plate (4), and the other end of the sliding column (15) is rotatably connected to a connecting frame (16). An L-shaped rotating rod (17) is rotatably connected to the upper surface of the placement table (1), and one end of the rotating rod (17) is rotatably connected to one end of the connecting frame (16).

2. A chip PTC high efficiency test fixture according to claim 1, characterized in that: Four groups of sliding rods (12) are fixedly connected to the upper surface of the placement table (1), and each group of the sliding rods (12) is respectively located on the four sides of the chip body (3); the first clamping plate (4), the second clamping plate (5) and the two third clamping plates (6) are respectively slidably connected to the sliding rods (12); the circumference of the sliding rods (12) is provided with springs (13), and the springs (13) are respectively located between the first clamping plate (4), the second clamping plate (5), the two third clamping plates (6) and the placement plate (2).

3. A chip PTC high efficiency test fixture according to claim 2, characterized in that: Both ends of the first clamping plate (4) are fixedly connected with L-shaped fixing plates (7), the two fixing plates (7) are symmetrically arranged, the upper surfaces of the two third clamping plates (6) are rotatably connected with rollers (8), one side of the fixing plates (7) is provided with a bevel (11), and the rollers (8) respectively contact with the corresponding fixing plates (7).

4. A chip PTC high efficiency test fixture according to claim 2, characterized in that: Two fixed columns (9) are fixedly connected to the upper surface of the placement table (1), and the circumference of the fixed columns (9) is rotatably connected to a rotating plate (10). The two rotating plates (10) are symmetrically arranged, and the other ends of the rotating plates (10) are in contact with the second clamping plate (5).

5. A chip PTC high efficiency test fixture according to claim 4, characterized in that: The upper surface of the placement platform (1) is fixedly connected with a guide seat (14), and the sliding column (15) is slidably connected in the guide seat (14).

6. A chip PTC high efficiency test fixture according to claim 5, characterized in that: Silicone pads (18) are fixedly connected to the four corners of the bottom of the placement table (1).

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