Testing device
By designing a test device that includes the first and second crimping modules, the problem of the cumbersome double-sided crimping test process of the chip is solved, and a more efficient testing process and efficiency are achieved.
Patent Information
- Application Number
- CN202323581971.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2023-12-27
- Publication Date
- 2025-01-21
- Estimated Expiration
- 2033-12-27
AI Technical Summary
The double-sided crimping test process of existing chips is too cumbersome, and the chip needs to be repositioned after being flipped, which seriously affects the testing efficiency.
Design a test device, including a test base, a first crimping module and a second crimping module. The first crimping module and the second crimping module perform a crimping test on the two surfaces of the chip respectively. , simplify the testing process and improve efficiency.
It realizes the simplicity of double-sided pressure bonding test of the chip, improves the test efficiency, and reduces the complexity of manual operation and chip positioning.
Smart Images
Figure CN222379738U_ABST
Abstract
Description
Technical Field
[0001] The present application relates to the technical field of product testing, and in particular to a testing device. Background Art
[0002] In the fields of electronic components, chips, digital products, etc., products need to be tested before packaging to detect whether the functions of the tested products are normal. For example, when testing a chip, it is necessary to use a crimping mechanism to crimp the chip onto a tester so that the chip is electrically connected to the tester, and then the chip is powered on for testing. As the types of chips become more and more diverse, the testing requirements for chips will also be different. For example, some chips require crimping tests on both sides of the chip.
[0003] At present, in the process of double-sided compression test of chips, usually one side of the chip to be tested is compressed by a compression module. After the compression test of the chip to be tested is completed, the chip to be tested is turned over manually or by a flipping mechanism, and the other side of the chip to be tested is compressed again by the compression module. However, the double-sided compression test of this chip is too cumbersome, and the chip needs to be repositioned after flipping, which seriously affects the test efficiency of the chip. Summary of the invention
[0004] Based on this, it is necessary to provide a testing device to address the problem that the double-sided testing process of existing chips is too complicated.
[0005] A testing device, comprising:
[0006] A test base, the test base having at least one bearing slot for bearing a product to be tested;
[0007] A first crimping module and a second crimping module, the first crimping module and the second crimping module are respectively arranged on both sides of the test base, the first crimping module is used to move toward the test base, and can abut against a surface of the product to be tested that is close to the first crimping module to complete the test, and the second crimping module is used to move toward the test base, and can abut against another surface of the product to be tested that is close to the second crimping module to complete the test.
[0008] In one embodiment, the first crimping module comprises a first base and a first pressing head disposed on the first base, and the first pressing head abuts against the product to be tested when the first crimping module moves toward the test base; and
[0009] The second crimping module includes a second base and a plurality of second pressing heads disposed on the second base, and the second pressing heads abut against the product to be tested when the second crimping module moves toward the test base.
[0010] In one embodiment, the first crimping module further includes a first electric control board, and the first electric control board is configured to establish an electrical connection with the product to be tested when the first crimping head abuts against the product to be tested;
[0011] The second crimping module further includes a second electric control board, and the second electric control board is configured to establish an electrical connection with the product to be tested when the second crimping head abuts against the product to be tested.
[0012] In one embodiment, the testing device further comprises a first driving member, the first driving member is drivingly connected to the first crimping module, and is used to drive the first crimping module to move toward or away from the testing base;
[0013] The testing device further comprises a second driving member, which is drivingly connected to the second crimping module and is used for driving the second crimping module to move towards or away from the testing base.
[0014] In one of the embodiments, the testing device further includes a shielding mechanism, which is disposed below the bearing slot and is used to shield external signals when the first crimping module abuts against the product to be tested for testing.
[0015] In one embodiment, the shielding mechanism is movably disposed on the test base and is capable of moving in a direction approaching or moving away from a bottom of the carrying slot.
[0016] In one embodiment, the testing device further includes a third driving member, which is drivingly connected to the shielding mechanism, and is used to drive the shielding mechanism away to avoid the second crimping module before the second crimping module abuts against the product to be tested for testing.
[0017] In one of the embodiments, the testing device further includes a positioning component, and the positioning component is used to guide the movement direction of the first crimping module and / or the second crimping module.
[0018] In one embodiment, the positioning assembly includes a positioning pin and a positioning sleeve cooperating with the positioning pin, one of the positioning pin and the positioning sleeve is disposed on the test base, and the other of the two is disposed on the first crimping module.
[0019] In one embodiment, the testing device further includes a machine platform, the testing base is disposed on the machine platform, and the first crimping module and the second crimping module are both movably disposed on the machine platform.
[0020] The above-mentioned test device places the product to be tested (such as a chip) in the bearing slot, and the first crimping module and the second crimping module can both move toward the direction close to the test base, and when the first crimping module abuts against the product to be tested, the first crimping module can perform a crimping test on one of the surfaces of the product to be tested, and when the second crimping module abuts against the product to be tested, the second crimping module can perform a crimping test on the other surface of the product to be tested. The test device provided in the present application can perform a double-sided crimping test on the product to be tested through the first crimping module and the second crimping module. The crimping test process of the product to be tested is simple, and the test efficiency of the product to be tested can be improved. BRIEF DESCRIPTION OF THE DRAWINGS
[0021] FIG. 1 is an exploded schematic diagram of a testing device provided in some embodiments.
[0022] FIG. 2 is a front view of a first crimping module provided in some embodiments.
[0023] FIG. 3 is a schematic structural diagram of a first crimping module and a machine component module provided in some embodiments.
[0024] Reference numerals:
[0025] 100. Testing device;
[0026] 110, test base; 111, bearing slot; 120, first crimping module; 121, first base; 122, first pressure head; 123, first electric control board; 130, second crimping module; 131, second base; 132, second pressure head; 133, second electric control board; 140, first driving member; 150, second driving member; 160, shielding mechanism; 161, shielding member; 162, third driving member; 170, positioning assembly; 171, positioning pin; 180, machine platform;
[0027] 200. Product to be tested. DETAILED DESCRIPTION
[0028] In order to make the above-mentioned purposes, features and advantages of the present application more obvious and easy to understand, the specific implementation methods of the present application are described in detail below in conjunction with the accompanying drawings. In the following description, many specific details are set forth to facilitate a full understanding of the present application. However, the present application can be implemented in many other ways different from those described herein, and those skilled in the art can make similar improvements without violating the connotation of the present application, so the present application is not limited by the specific embodiments disclosed below.
[0029] In the description of the present application, it should be understood that if the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise", "axial", "radial", "circumferential", etc. appear, the orientation or position relationship indicated by these terms is based on the orientation or position relationship shown in the accompanying drawings, which is only for the convenience of describing the present application and simplifying the description, and does not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present application.
[0030] In addition, if the terms "first" or "second" appear, these terms are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Therefore, a feature defined as "first" or "second" may explicitly or implicitly include at least one of the features. In the description of this application, if the term "plurality" appears, the meaning of "plurality" is at least two, such as two, three, etc., unless otherwise clearly and specifically defined.
[0031] In this application, unless otherwise clearly specified and limited, if the terms "installed", "connected", "connected", "fixed" and the like appear, these terms should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integrated connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements, unless otherwise clearly defined. For ordinary technicians in this field, the specific meanings of the above terms in this application can be understood according to the specific circumstances.
[0032] In the present application, unless otherwise clearly specified and limited, if there is a description that a first feature is "above" or "below" a second feature, etc., or similar descriptions appear, it may mean that the first and second features are in direct contact, or that the first and second features are in indirect contact through an intermediate medium. Moreover, the first feature being "above", "above" and "above" the second feature may mean that the first feature is directly above or obliquely above the second feature, or simply means that the first feature is higher in level than the second feature. The first feature being "below", "below" and "below" the second feature may mean that the first feature is directly below or obliquely below the second feature, or simply means that the first feature is lower in level than the second feature.
[0033] It should be noted that if an element is referred to as being "fixed to" or "disposed on" another element, it may be directly on the other element or there may be a central element. If an element is considered to be "connected to" another element, it may be directly connected to the other element or there may be a central element at the same time. If any, the terms "vertical", "horizontal", "upper", "lower", "left", "right" and similar expressions used in this application are for illustrative purposes only and do not represent the only implementation method.
[0034] The technical solution provided by the embodiments of the present application is described below in conjunction with the accompanying drawings.
[0035] 1 and 2 , the present application provides a testing device 100, which includes a testing base 110, a first crimping module 120, and a second crimping module 130. In this embodiment, the testing device 100 is configured to perform a double-sided crimping test on a product to be tested 200 (such as a chip) to detect whether the function of the product to be tested 200 meets the established requirements.
[0036] The test base 110 has at least one bearing slot 111, and the bearing slot 111 is used to bear the product to be tested 200. Preferably, the bearing slot 111 is integrally formed on the test base 110 by injection molding, extrusion, etc., so as to simplify the molding process of the test base 110 to form the bearing slot 111.
[0037] The first crimping module 120 and the second crimping module 130 are respectively arranged on both sides of the test base 110. For example, in this embodiment, as shown in FIG1 , the first crimping module 120 is arranged above the test base 110, and the second crimping module 130 is arranged below the test base 110. The first crimping module 120 is used to move toward the test base 110, and during the movement of the first crimping module 120 toward the test base 110, the first crimping module 120 can abut against a surface of the product to be tested 200 close to the first crimping module 120 to complete the crimping test; the second crimping module 130 is used to move toward the test base 110, and during the movement of the second crimping module 130 toward the test base 110, the second crimping module 130 can abut against another surface of the product to be tested 200 close to the second crimping module 130 to complete the crimping test. Specifically, when a double-sided crimping test is required for the product 200 (such as a chip), the product 200 (such as a chip) is placed in the bearing slot 111, and the first crimping module 120 and the second crimping module 130 can both move toward the direction close to the test base 110, and when the first crimping module 120 abuts against the product 200, the first crimping module 120 can perform a crimping test on one surface of the product 200, and when the second crimping module 130 abuts against the product 200, the second crimping module 130 can perform a crimping test on the other surface of the product 200. On the contrary, after the crimping test of the product 200 is completed, the first crimping module 120 and the second crimping module 130 can both move toward the direction away from the test base 110, so that the operator can pick up and replace the product 200 after the test is completed.
[0038] The above-mentioned testing device 100 can perform crimping tests on two opposite surfaces of the product to be tested 200 in steps through the first crimping module 120 and the second crimping module 130 to complete the double-sided crimping test of the product to be tested 200. The crimping test process of the product to be tested 200 is simple and can improve the testing efficiency of the product to be tested 200.
[0039] In one embodiment, as shown in FIG. 1 and FIG. 2 , there are a plurality of carrying slots 111 , such as a plurality of carrying slots 111 arrayed on the test base 110 , and the plurality of carrying slots 111 can be used for batch carrying of the products 200 to be tested.
[0040] There are multiple first crimping modules 120, and the multiple first crimping modules 120 correspond to the multiple bearing grooves 111. The first crimping module 120 includes a first base 121 and a first press head 122. The first press head 122 is arranged on the first base 121 by welding, screwing, etc. The first press head 122 can abut against the product to be tested 200 when the first crimping module 120 moves toward the direction close to the test base 110. Specifically, when it is necessary to perform a crimping test on one of the surfaces of the multiple products to be tested 200 simultaneously, the multiple first bases 121 are driven to move toward the direction close to the test base 110 at the same time, and the multiple first bases 121 drive the corresponding multiple first press heads 122 to move toward the direction close to the test base 110 at the same time. The multiple first press heads 122 can correspondingly abut against one of the surfaces of the products to be tested 200 carried in the multiple bearing grooves 111, and a batch crimping test is performed on one of the surfaces of the multiple products to be tested 200 simultaneously.
[0041] The second crimping module 130 includes a second base 131 and a plurality of second press heads 132, and the plurality of second press heads 132 are all arranged on the second base 131 by welding, screwing, etc. The plurality of second press heads 132 correspond to the plurality of bearing slots 111, and the second press heads 132 can abut against the product to be tested 200 when the second crimping module 130 moves toward the direction close to the test base 110. Specifically, when it is necessary to perform a crimping test on another surface of the plurality of products to be tested 200 simultaneously, the second base 131 is driven to move toward the direction close to the test base 110, and the second base 131 drives the plurality of second press heads 132 to move toward the direction close to the test base 110 at the same time, and the plurality of second press heads 132 can correspondingly abut against another surface of the product to be tested 200 carried in the plurality of bearing slots 111, and a batch crimping test is performed on another surface of the plurality of products to be tested 200 simultaneously.
[0042] The above-mentioned testing device 100 can perform batch crimping tests on one side of multiple products to be tested 200 by using multiple first pressing heads 122, and batch crimping tests on the other side of multiple products to be tested 200 by using multiple second pressing heads 132, thereby realizing batch double-sided crimping tests on the products to be tested 200 and improving the double-sided crimping test efficiency of the products to be tested 200.
[0043] Further, referring to FIG. 1 and FIG. 2 , the first crimping module 120 further includes a first electric control board 123. The first electric control board 123 is configured to establish an electrical connection with the product to be tested 200 when the first pressure head 122 abuts against the product to be tested 200. The first electric control board 123 and the product to be tested 200 form a test loop to feed back a crimping test signal of one side of the product to be tested 200, and perform a crimping test on the surface of the product to be tested 200 close to the first crimping module 120. The second crimping module 130 further includes a second electric control board 133. The second electric control board 133 is configured to establish an electrical connection with the product to be tested 200 when the second pressure head 132 abuts against the product to be tested 200. The second electric control board 133 can also form a test loop with the product to be tested 200 to feed back a crimping test signal of the other side of the product to be tested 200, and perform a crimping test on the surface of the product to be tested 200 close to the second crimping module 130. The first electric control board 123 and the second electric control board 133 may be a programmable logic controller (PLC), an integrated chip or a microprocessor.
[0044] In order to realize the crimping test of the product to be tested 200, in one embodiment, referring to FIG. 1 to FIG. 3 , the test device 100 further includes a first driving member 140. The first driving member 140 is drivingly connected to the first crimping module 120, and the first driving member 140 is used to drive the first crimping module 120 to move toward or away from the test base 110. Exemplarily, the first crimping module 120 is connected to the output end of the first driving member 140, and the first driving member 140 can output power to the first base 121, and the first base 121 drives the first pressing head 122 to move toward the direction close to the test base 110, and the first pressing head 122 performs a crimping test on the surface of the product to be tested 200 on the side close to the first crimping module 120. After the crimping test of the product 200 is completed, the first driving member 140 outputs power in reverse to the first base 121, driving the first pressing head 122 to move away from the test base 110 through the first base 121, so that the operator can pick up and replace the product 200 after the test is completed.
[0045] Similarly, the testing device 100 further includes a second driving member 150. The second driving member 150 is drivingly connected to the second crimping module 130, and the second driving member 150 is used to drive the second crimping module 130 to move in a direction close to or away from the test base 110. Exemplarily, the second crimping module 130 is connected to the output end of the second driving member 150, and the second driving member 150 can output power to the second base 131, and drive the second press head 132 to move in a direction close to the test base 110 through the second base 131, and perform a crimping test on the surface of the product 200 to be tested close to the second crimping module 130 through the second press head 132. After the crimping test of the product 200 to be tested is completed, the second driving member 150 outputs power to the second base 131 in the reverse direction, and drives the second press head 132 to move in a direction away from the test base 110 through the second base 131, so that the operator can pick up and replace the product 200 to be tested after the test is completed.
[0046] In this embodiment, the first driving member 140 and the second driving member 150 may be cylinder modules, which can drive the first pressing head 122 and the second pressing head 132 to move toward or away from the test base 110. Of course, in other feasible embodiments, the first driving member 140 and the second driving member 150 may also be motor modules, hydraulic modules or other driving modules, and the present application does not limit the specific types of the first driving member 140 and the second driving member 150.
[0047] In order to ensure the reliability of the crimping test of the product to be tested 200, in one embodiment, referring to FIG1 and FIG2, the test device 100 further includes a shielding mechanism 160. The shielding mechanism 160 is disposed below the bearing slot 111, and is used to shield external signals when the first crimping module 120 abuts against the product to be tested 200 for testing, so as to shield external signals during the process in which the first crimping module 120 performs a crimping test on the surface of the product to be tested 200 close to the first crimping module 120, thereby preventing external signals from interfering with the crimping test environment of the first crimping module 120 in the product to be tested 200, and ensuring the reliability of the crimping test of the product to be tested 200.
[0048] Specifically, referring to FIG. 1 and FIG. 2 , the shielding mechanism 160 is movably disposed on the test base 110, and the shielding mechanism 160 can move in a direction close to or away from the bottom of the bearing slot 111. Exemplarily, the shielding mechanism 160 includes at least one shielding member 161, which is movably disposed on the test base 110, and the shielding member 161 can move in a direction close to or away from the bearing slot 111. For example, in the present embodiment, the shielding member 161 is a shielding cover, and the shielding member 161 is movably disposed under the test base 110. When the shielding member 161 moves in a direction close to the bearing slot 111, the shielding member 161 can be covered on the outside of the bearing slot 111 to shield the surrounding environment of the bearing slot 111, so as to prevent external signals from interfering with the first crimping module 120 in the crimping test environment of the product to be tested 200, and the shielding member 161 can prevent external water, oxygen, dust, etc. from entering the bearing slot 111 to affect the crimping test of the product to be tested 200. Furthermore, during the process of the second crimping module 130 performing a crimping test on the product to be tested 200, the shielding member 161 moves in a direction away from the supporting slot 111 to provide space for the second crimping module 130 to move in a direction close to the test base 110, thereby preventing the shielding member 161 from interfering with the crimping action of the second crimping module 130 on the product to be tested 200.
[0049] Further, referring to FIG. 1 and FIG. 2 , the test device 100 further includes a third driving member 162, which is drivingly connected to the shielding mechanism 160, and is used to drive the shielding mechanism 160 away from the bearing slot 111 before the second crimping module 130 abuts against the product to be tested for testing, so as to avoid the second crimping module 130. Exemplarily, during the process of the second crimping module 130 performing a crimping test on the test product 200, the third driving member 162 drives the shielding member 161 to move in a direction away from the bearing slot 111, so as to provide a clearance space for the second crimping module 130 to move toward the direction close to the test base 110, so as to prevent the shielding member 161 from interfering with the crimping action of the second crimping module 130 on the product to be tested 200. On the contrary, the third driving member 162 can also drive the shielding member 161 to move in the direction close to the bearing slot 111, so as to be covered on the outside of the bearing slot 111, so as to shield the surrounding environment of the bearing slot 111, and prevent external signals from interfering with the first crimping module 120 in the crimping test environment of the product 200 to be tested. Among them, the third driving member 162 can be a cylinder module, and the shielding mechanism 160 can be driven to move in the direction close to or away from the bearing slot 111 through the cylinder module. Of course, in other feasible embodiments, the third driving member 162 can also be a motor module, a hydraulic module or other driving module, and the specific type of the third driving member 162 is not limited by this application.
[0050] Preferably, there are multiple shielding members 161, the number of shielding members 161 is the same as the number of supporting slots 111, and the multiple shielding members 161 correspond to the multiple supporting slots 111, so that in the process of batch crimping test on multiple products to be tested 200, the multiple shielding members 161 can be correspondingly covered on the outside of the multiple supporting slots 111 to shield the external environment of the multiple products to be tested 200.
[0051] In order to ensure the accuracy of the crimping position of the first crimping module 120 and / or the second crimping module 130 for the product to be tested 200, in one embodiment, referring to FIG. 1 and FIG. 2 , the testing device 100 further includes a positioning assembly 170. The positioning assembly 170 is used to guide the movement direction of the first crimping module 120 and / or the second crimping module 130. In one embodiment, the positioning assembly 170 is used to guide the movement direction of the first crimping module 120, so as to limit the movement path of the first crimping module 120 during the crimping test of the product to be tested 200 by the first crimping module 120, thereby ensuring the accuracy of the crimping position of the first crimping module 120 for the product to be tested 200. For example, in another embodiment, the positioning assembly 170 is used to guide the movement direction of the second crimping module 130, so as to limit the movement path of the second crimping module 130 during the crimping test of the product 200 by the second crimping module 130, and ensure the accuracy of the crimping position of the second crimping module 130 for the product 200. For example, in yet another embodiment, the positioning assembly 170 is used to guide the movement direction of the first crimping module 120 and the second crimping module 130, so as to limit the movement of the first crimping module 120 during the crimping test of the product 200 by the first crimping module 120, and ensure the accuracy of the crimping position of the first crimping module 120 for the product 200, and limit the movement of the second crimping module 130 during the crimping test of the product 200 by the second crimping module 130, and ensure the accuracy of the crimping position of the second crimping module 130 for the product 200.
[0052] Further, referring to FIG. 1 and FIG. 2 , the positioning assembly 170 includes a positioning pin 171 and a positioning sleeve (not shown), and the positioning sleeve cooperates with the positioning pin 171. One of the positioning pin 171 and the positioning sleeve is disposed on the test base 110, and the other of the positioning pin 171 and the positioning sleeve is disposed on the first crimping module 120. In other words, when the positioning pin 171 is protrudingly disposed on the test base 110, the positioning sleeve is disposed on the first crimping module 120, and when the positioning pin 171 is protrudingly disposed on the first crimping module 120, the positioning sleeve is disposed on the test base 110. The above-mentioned testing device 100, when the first crimping module 120 moves in the direction close to the test base 110 and the first crimping module 120 reaches the area near the test base 110, the first crimping module 120 can be guided to the crimping position of the product to be tested 200 through the mutual cooperation of the positioning pin 171 and the positioning sleeve, so as to ensure the reliability of the crimping position of the first crimping module 120 for the product to be tested 200.
[0053] Preferably, there are multiple positioning components 170, and the number and position of the positioning components 170 correspond to the first crimping modules 120, so that when the multiple first crimping modules 120 perform crimping tests on the multiple products to be tested 200, the multiple positioning components 170 can guide the crimping test movement of the multiple first crimping modules 120 on the products to be tested 200, so that the multiple first crimping modules 120 are correspondingly crimped on the multiple products to be tested 200, and batch crimping tests are performed on one of the surfaces of the multiple products to be tested 200 simultaneously. Of course, in other feasible embodiments, the positioning component 170 is not limited to the combination of the positioning pin 171 and the positioning sleeve provided above, and the positioning component 170 can also be a combination of the positioning pin 171 and the positioning hole, etc. The specific structure of the positioning component 170 is not limited by this application.
[0054] In order to realize the installation and fixation of the first crimping module 120 and the second crimping module 130, in one embodiment, referring to FIG1 and FIG3, the testing device 100 further includes a machine table 180. The testing base 110 is arranged on the machine table 180 by welding, screwing, etc., and the first crimping module 120 and the second crimping module 130 are both movably arranged on the machine table 180, and the first crimping module 120 and the second crimping module 130 are indirectly arranged on opposite sides of the testing base 110 through the machine table 180. By moving the first crimping module 120 on the machine platform 180, the first crimping module 120 can be moved toward or away from the test base 110, so that the first crimping module 120 can perform a crimping test on the surface of the product under test 200 close to the first crimping module 120, and by moving the second crimping module 130 on the machine platform 180, the second crimping module 130 can be moved toward or away from the test base 110, so that the second crimping module 130 can perform a crimping test on the surface of the product under test 200 close to the second crimping module 130.
[0055] The technical features of the above-described embodiments may be arbitrarily combined. To make the description concise, not all possible combinations of the technical features in the above-described embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.
[0056] The above-described embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be construed as limiting the scope of the patent application. It should be pointed out that, for a person of ordinary skill in the art, several variations and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the patent application shall be subject to the attached claims.
Claims
1. A testing device, characterized in that: The testing device comprises: A test base, the test base having at least one bearing slot for bearing a product to be tested; A first crimping module and a second crimping module, the first crimping module and the second crimping module are respectively arranged on both sides of the test base, the first crimping module is used to move toward the test base, and can abut against a surface of the product to be tested that is close to the first crimping module to complete the test, and the second crimping module is used to move toward the test base, and can abut against another surface of the product to be tested that is close to the second crimping module to complete the test.
2. The testing device according to claim 1, characterized in that: The first crimping module comprises a first base and a first pressing head disposed on the first base, wherein the first pressing head abuts against the product to be tested when the first crimping module moves toward the test base; and The second crimping module includes a second base and a plurality of second pressing heads disposed on the second base, and the second pressing heads abut against the product to be tested when the second crimping module moves toward the test base.
3. The testing device according to claim 2, characterized in that: The first crimping module further includes a first electric control board, and the first electric control board is configured to establish an electrical connection with the product to be tested when the first crimping head abuts against the product to be tested; The second crimping module further includes a second electric control board, and the second electric control board is configured to establish an electrical connection with the product to be tested when the second crimping head abuts against the product to be tested.
4. The testing device according to claim 2, characterized in that: The testing device further comprises a first driving member, which is drivingly connected to the first crimping module and is used to drive the first crimping module to move toward or away from the testing base; The testing device further comprises a second driving member, which is drivingly connected to the second crimping module and is used for driving the second crimping module to move towards or away from the testing base.
5. The testing device according to claim 1, characterized in that: The testing device further comprises a shielding mechanism, which is disposed below the bearing slot and is used for shielding external signals when the first crimping module abuts against the product to be tested for testing.
6. The testing device according to claim 5, characterized in that: The shielding mechanism is movably disposed on the test base and can move in a direction approaching or away from the bottom of the carrying slot.
7. The testing device according to claim 6, characterized in that: The testing device further comprises a third driving member, which is drivingly connected to the shielding mechanism and is used for driving the shielding mechanism away from the second crimping module before the second crimping module abuts against the product to be tested for testing, so as to avoid the second crimping module.
8. The testing device according to claim 1, characterized in that: The testing device further comprises a positioning assembly, and the positioning assembly is used to guide the movement direction of the first crimping module and / or the second crimping module.
9. The testing device according to claim 8, characterized in that: The positioning assembly includes a positioning pin and a positioning sleeve matched with the positioning pin. One of the positioning pin and the positioning sleeve is arranged on the test base, and the other of the two is arranged on the first crimping module.
10. The testing device according to claim 1, characterized in that: The testing device further comprises a machine platform, the testing base is arranged on the machine platform, and the first crimping module and the second crimping module are both movably arranged on the machine platform.